AD586JNZ [ADI]
High Precision 5 V Reference;型号: | AD586JNZ |
厂家: | ADI |
描述: | High Precision 5 V Reference |
文件: | 总33页 (文件大小:489K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Complete Dual, 16-Bit, High Accuracy,
Serial Input, Bipolar Voltage Output DACs
Preliminary Technical Data
AD5762R
FEATURES
GENERAꢀ DESCRIPTION
Complete dual, 16-bit digital-to-analog
converters (DACs)
Programmable output range: 10 V, 10.2564 V,
or 10.5263 V
1 ꢀSB max INꢀ error, 1 ꢀSB max DNꢀ error
ꢀow noise: 60 nV/√Hz
Settling time: 10 µs max
The AD5762R is a dual, 16-bit, serial input, bipolar voltage
output digital-to-analog converter that operates from supply
voltages of 11ꢀ. ꢁ up to 16ꢀ5 ꢀ Nominal full-scale output
range is 1ꢂ ꢀ The AD5762R provides integrated output
amplifiers, reference buffers and proprietary power-up/power-
down control circuitryꢀ The parts also feature a digital I/O port,
which is programmed via the serial interface and an analog
temperature sensorꢀ The part incorporates digital offset and
gain adjust registers per channelꢀ
Integrated reference buffers
Internal reference: 10 ppm/°C
On-chip die temperature sensor
Output control during power-up/brownout
Programmable short-circuit protection
Simultaneous updating via ꢀDAC
Asynchronous CꢀR to zero code
Digital offset and gain adjust
The AD5762R is a high performance converter that offers
guaranteed monotonicity, integral nonlinearity (INL) of 1 LSB,
low noise, and 1ꢂ µs settling timeꢀ The AD5762R includes an
on-chip 5 ꢁ reference with a reference tempco of 1ꢂ ppm/°C
maximumꢀ During power-up (when the supply voltages are
changing), ꢁOUT is clamped to ꢂ ꢁ via a low impedance pathꢀ
ꢀogic output control pins
DSP-/microcontroller-compatible serial interface
Temperature range: −40°C to +85°C
iCMOS™ process technology1
The AD5762R uses a serial interface that operates at clock rates
of up to 3ꢂ MHz and is compatible with DSP and
microcontroller interface standardsꢀ Double buffering allows
the simultaneous updating of all DACsꢀ The input coding is
programmable to either twos complement or offset binary
formatsꢀ The asynchronous clear function clears all DAC
registers to either bipolar zero or zero scale depending on the
coding usedꢀ The AD5762R is ideal for both closed-loop servo
control and open-loop control applicationsꢀ The AD5762R is
available in a 32-lead TQFP, and offers guaranteed
APPꢀICATIONS
Industrial automation
Open-/closed-loop servo control
Process control
Data acquisition systems
Automatic test equipment
Automotive test and measurement
High accuracy instrumentation
specifications over the −.ꢂ°C to +85°C industrial temperature
rangeꢀ See Figure 1, the functional block diagramꢀ
1 For analog systems designers within industrial/instrumentation equipment
OEMs who need high performance ICs at higher voltage levels, iCMOS is a
technology platform that enables the development of analog ICs capable of
30 V and operating at 15 V supplies while allowing dramatic reductions in
power consumption and package size, and increased AC and DC
performance.
Rev. PrA
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
www.analog.com
©2007 Analog Devices, Inc. All rights reserved.
AD5762R
Preliminary Technical Data
TABLE OF CONTENTS
Features ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1
Data Registerꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 25
Coarse Gain Register ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 25
Fine Gain Registerꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 25
Offset Register ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 25
Offset and Gain Adjustment Worked Exampleꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 27
AD5762R Featuresꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
Analog Output Control ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
Digital Offset and Gain Controlꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
Programmable Short-Circuit Protection ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
Digital I/O Portꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
die Temperature Sensorꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
Local Ground Offset Adjustꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 28
Applications Informationꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 29
Typical Operating Circuit ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 29
Layout Guidelinesꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 3ꢂ
Galvanically Isolated Interface ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 3ꢂ
Microprocessor Interfacingꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 3ꢂ
Evaluation Boardꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 32
Outline Dimensionsꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 33
Ordering Guide ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 33
Applicationsꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1
General Descriptionꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1
Revision History ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 2
Functional Block Diagram ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 3
Specificationsꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ .
AC Performance Characteristicꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 6
Timing Characteristicsꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 7
Absolute Maximum Ratingsꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1ꢂ
ESD Cautionꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1ꢂ
Pin Configuration and Function Descriptionsꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 11
Terminology ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 13
Typical Performance Characteristics ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 15
Theory of Operation ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 21
DAC Architectureꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 21
Reference Buffersꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 21
Serial Interface ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 21
Simultaneous Updating via
ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 22
LDAC
Transfer Functionꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 23
Asynchronous Clear ( )ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 23
CLR
Function Register ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 2.
REVISION HISTORY
Preliminary Revision PrA December 10, 2007
Rev. PrA | Page 2 of 33
Preliminary Technical Data
FUNCTIONAL BLOCK DIAGRAM
AD5762R
REFGND
PGND AV
AV
AV
AV
SS
REFA
RSTOUT
RSTIN
REFOUT
DD
SS
DD
VOLTAGE
MONITOR
AND
DV
CC
+5V
REFERENCE
REFERENCE
BUFFERS
AD5762R
DGND
CONTROL
ISCC
16
G1
G1
16
16
INPUT
REG A
DAC
REG A
DAC A
SDIN
SCLK
SYNC
SDO
VOUTA
INPUT SHIFT
REGISTER
AND
CONTROL
LOGIC
G2
GAIN REG A
AGNDA
OFFSET REG A
INPUT
REG B
DAC
REG B
DAC B
VOUTB
AGNDB
D0
D1
G2
GAIN REG B
OFFSET REG B
REFERENCE
BUFFERS
TEMP
SENSOR
BIN/2SCOMP
REFB
CLR
LDAC
TEMP
Figure 1. Functional Block Diagram
Rev. PrA | Page 3 of 33
AD5762R
Preliminary Technical Data
SPECIFICATIONS
AꢁDD = 11ꢀ. ꢁ to 16ꢀ5 ꢁ, AꢁSS = −11ꢀ. ꢁ to −16ꢀ5 ꢁ, AGND = DGND = REFGND = PGND = ꢂ ꢁ; REFA, REFB = 5 ꢁ external;
DꢁCC = 2ꢀ7 ꢁ to 5ꢀ25 ꢁ, RLOAD = 1ꢂ kΩ, CL = 2ꢂꢂ pFꢀ All specifications TMIN to TMAX, unless otherwise notedꢀ
Table 1.
Parameter
C Grade2
Unit
Test Conditions/Comments
ACCURACY
Outputs unloaded
Resolution
16
1
1
Bits
Relative Accuracy (INL)
Differential Nonlinearity
Bipolar Zero Error
LSB max
LSB max
mV max
Guaranteed monotonic
2
At 25°C; error at other temperatures
obtained using bipolar zero TC
Bipolar Zero TC3
Zero-Scale Error
2
2
ppm FSR/°C max
mV max
At 25°C; error at other temperatures
obtained using zero scale TC
Zero-Scale TC3
Gain Error
2
0.02
ppm FSR/°C max
% FSR max
At 25°C; error at other temperatures
obtained using gain TC
Gain TC3
DC Crosstalk3
2
0.5
ppm FSR/°C max
LSB max
REFERENCE INPUT/OUTPUT
Reference Input3
Reference Input Voltage
DC Input Impedance
Input Current
Reference Range
Reference Output
Output Voltage
Reference TC
5
1
10
1/7
V nominal
MΩ min
µA max
1% for specified performance
Typically 100 MΩ
Typically 30 nA
V min/V max
4.997/5.003
10
1
V min/V max
ppm/°C max
MΩ min
At 25°C
Load3
Output Noise3
18
µV p-p typ
(0.1 Hz to 10 Hz)
Noise Spectral Density3
Output Voltage Drift vs. Time
Output Voltage Drift vs. Time
Line Regulation
Load Regulation
Thermal Hysteresis
75
40
50
TBD
TBD
TBD
nV/√Hz typ
At 10 kHz
ppm/500hr typ
ppm/1000hr typ
ppm/V typ
ppm/mA typ
ppm typ
OUTPUT CHARACTERISTICS3
Output Voltage Range4
10.5263
V min/V max
V min/V max
ppm FSR/500 hours typ
ppm FSR/1000 hours typ
mA typ
AVDD/AVSS
AVDD/AVSS
=
=
11.4 V, REFA, REFB = 5V
16.5 V, REFA, REFB = 7V
14
13
15
10
1
Output Voltage Drift vs. Time
Short Circuit Current
Load Current
RISCC = 6 kΩ, see Figure 31
For specified performance
mA max
Capacitive Load Stability
RL = ∞
RL = 10 kΩ
200
1000
0.3
pF max
pF max
Ω max
DC Output Impedance
Rev. PrA | Page 4 of 33
Preliminary Technical Data
AD5762R
Parameter
DIGITAL INPUTS3
C Grade2
Unit
Test Conditions/Comments
DVCC = 2.7 V to 5.25 V, JEDEC compliant
VIH, Input High Voltage
VIL, Input Low Voltage
Input Current
2
0.8
1
V min
V max
µA max
pF max
Per pin
Per pin
Pin Capacitance
10
DIGITAL OUTPUTS (D0, D1, SDO)3
Output Low Voltage
Output High Voltage
Output Low Voltage
0.4
DVCC − 1
0.4
V max
V min
V max
DVCC = 5 V 5%, sinking 200 µA
DVCC = 5 V 5%, sourcing 200 µA
DVCC = 2.7 V to 3.6 V,
sinking 200 µA
Output High Voltage
DVCC − 0.5
V min
DVCC = 2.7 V to 3.6 V,
sourcing 200 µA
High Impedance Leakage Current
High Impedance Output Capacitance
DIE TEMPERATURE SENSOR3
Output Voltage at 25°C
Output Voltage Scale Factor
Output Voltage Range
Output Load Current
Power-On Time
1
5
µA max
pF typ
SDO only
SDO only
1.4
5
1.175/1.9
200
80
V typ
Die temperature
mV/°C typ
V min/V max
µA max
−40°C to 105°C
Current source only
ms typ
POWER REQUIREMENTS
AVDD/AVSS
11.4/16.5
2.7/5.25
V min/V max
V min/V max
DVCC
Power Supply Sensitivity3
∆VOUT/∆ΑVDD
AIDD
AISS
DICC
−85
3.5
2.75
1.2
dB typ
mA/channel max
mA/channel max
mA max
Outputs unloaded
Outputs unloaded
VIH = DVCC, VIL = DGND, 750 µA typ
12 V operation output unloaded
Power Dissipation
140
mW typ
2 Temperature range : -40°C to +85°C; typical at 25°C. Device functionality is guaranteed to +105°C with degraded performance.
3 Guaranteed by design and characterization; not production tested.
4 Output amplifier headroom requirement is 1.4 V minimum.
Rev. PrA | Page 5 of 33
AD5762R
Preliminary Technical Data
AC PERFORMANCE CHARACTERISTIC
AꢁDD = 11ꢀ. ꢁ to 16ꢀ5 ꢁ, AꢁSS = −11ꢀ. ꢁ to −16ꢀ5 ꢁ, AGND = DGND = REFGND = PGND = ꢂ ꢁ; REFA, REFB= 5 ꢁ external;
DꢁCC = 2ꢀ7 ꢁ to 5ꢀ25 ꢁ, RLOAD = 1ꢂ kΩ, CL = 2ꢂꢂ pFꢀ All specifications TMIN to TMAX, unless otherwise notedꢀ Guaranteed by design and
characterization, not production testedꢀ
Table 2.
Parameter
C Grade
Unit
Test Conditions/Comments
Full-scale step to 1 LSB
512 LSB step settling
DYNAMIC PERFORMANCE1
Output Voltage Settling Time
8
10
2
µs typ
µs max
µs typ
Slew Rate
5
8
25
80
8
2
2
0.1
45
1
V/µs typ
nV-s typ
mV max
dB typ
nV-s typ
nV-s typ
nV-s typ
LSB p-p typ
µV rms max
kHz typ
Digital-to-Analog Glitch Energy
Glitch Impulse Peak Amplitude
Channel-to-Channel Isolation
DAC-to-DAC Crosstalk
Digital Crosstalk
Digital Feedthrough
Output Noise (0.1 Hz to 10 Hz)
Output Noise (0.1 Hz to 100 kHz)
1/f Corner Frequency
Effect of input bus activity on DAC outputs
Output Noise Spectral Density
Complete System Output Noise Spectral Density2
60
80
nV/√Hz typ
nV/√Hz typ
Measured at 10 kHz
Measured at 10 kHz
1 Guaranteed by design and characterization; not production tested.
2 Includes noise contributions from integrated reference buffers,16-bit DAC and output amplifier.
Rev. PrA | Page 6 of 33
Preliminary Technical Data
TIMING CHARACTERISTICS
AD5762R
AꢁDD = 11ꢀ. ꢁ to 16ꢀ5 ꢁ, AꢁSS = −11ꢀ. ꢁ to −16ꢀ5 ꢁ, AGND = DGND = REFGND = PGND = ꢂ ꢁ; REFA, REFB= 5 ꢁ external;
DꢁCC = 2ꢀ7 ꢁ to 5ꢀ25 ꢁ, RLOAD = 1ꢂ kΩ, CL = 2ꢂꢂ pFꢀ All specifications TMIN to TMAX, unless otherwise notedꢀ
Table 3.
Parameter1, 2, 3
ꢀimit at TMIN, TMAX
Unit
Description
t1
t2
t3
t4
33
13
13
13
13
40
2
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
µs min
ns min
ns min
ns max
µs max
ns min
µs max
ns max
ns min
µs min
ns min
SCLK cycle time
SCLK high time
SCLK low time
SYNC falling edge to SCLK falling edge setup time
24th SCLK falling edge to SYNC rising edge
Minimum SYNC high time
4
t5
t6
t7
t8
t9
Data setup time
Data hold time
SYNC rising edge to LDAC falling edge (all DACs updated)
SYNC rising edge to LDAC falling edge (single DAC updated)
LDAC pulse width low
5
1.4
400
10
500
10
10
2
t10
t11
t12
t13
t14
LDAC falling edge to DAC output response time
DAC output settling time
CLR pulse width low
CLR pulse activation time
5, 6
t15
25
13
2
SCLK rising edge to SDO valid
SYNC rising edge to SCLK falling edge
SYNC rising edge to DAC output response time (LDAC = 0)
LDAC falling edge to SYNC rising edge
t16
t17
t18
170
1 Guaranteed by design and characterization; not production tested.
2 All input signals are specified with tr = tf = 5 ns (10% to 90% of DVCC) and timed from a voltage level of 1.2 V.
3 See Figure 2, Figure 3, and Figure 4.
4 Standalone mode only.
5 Measured with the load circuit of Figure 5.
6 Daisy-chain mode only.
Rev. PrA | Page 7 of 33
AD5762R
Preliminary Technical Data
t1
SCLK
SYNC
1
2
24
t3
t2
t6
t4
t5
t8
t7
DB23
SDIN
DB0
t10
t10
t9
LDAC
t18
t12
t11
VOUT
LDAC = 0
t12
t17
VOUT
CLR
t13
t14
VOUT
Figure 2. Serial Interface Timing Diagram
t1
SCLK
24
48
t3
t2
t6
t5
t16
t4
SYNC
SDIN
t8
t7
DB23
DB0
DB23
DB0
INPUT WORD FOR DAC N
INPUT WORD FOR DAC N–1
t15
DB23
DB0
SDO
t9
UNDEFINED
INPUT WORD FOR DAC N
t10
LDAC
Figure 3. Daisy Chain Timing Diagram
Rev. PrA | Page 8 of 33
Preliminary Technical Data
AD5762R
SCLK
24
48
SYNC
DB23
DB0
DB23
DB0
SDIN
SDO
NOP CONDITION
INPUT WORD SPECIFIES
REGISTER TO BE READ
DB23
DB0
UNDEFINED
SELECTED REGISTER DATA
CLOCKED OUT
Figure 4. Readback Timing Diagram
200µA
I
OL
V
V
(MIN) OR
(MAX)
TO OUTPUT
PIN
OH
OL
C
L
50pF
200µA
I
OH
Figure 5. Load Circuit for SDO Timing Diagram
Rev. PrA | Page 9 of 33
AD5762R
Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
TA = 25°C unless otherwise notedꢀ Transient currents of up to
1ꢂꢂ mA do not cause SCR latch-upꢀ
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the deviceꢀ This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not impliedꢀ Exposure to absolute
maximum rating conditions for extended periods may affect
device reliabilityꢀ
Table 4.
Parameter
Rating
AVDD to AGND, DGND
AVSS to AGND, DGND
DVCC to DGND
−0.3 V to +17 V
+0.3 V to −17 V
−0.3 V to +7 V
Digital Inputs to DGND
−0.3 V to DVCC + 0.3 V or 7 V
(whichever is less)
Digital Outputs to DGND
REFA, REFB to AGND, PGND
REFOUT to AGND
−0.3 V to DVCC + 0.3 V
−0.3 V to AVDD + 0.3V
AVSS to AVDD
TEMP
AVSS to AVDD
VOUTA, VOUTB to AGND
AGND to DGND
AVSS to AVDD
−0.3 V to +0.3 V
Operating Temperature Range
Industrial
Storage Temperature Range
Junction Temperature (TJ max)
32-Lead TQFP
−40°C to +85°C
−65°C to +150°C
150°C
θJA Thermal Impedance
θJC Thermal Impedance
Lead Temperature
65°C/W
12°C/W
JEDEC Industry Standard
J-STD-020
Soldering
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. PrA | Page 10 of 33
Preliminary Technical Data
AD5762R
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
32
25
1
24
NC
SYNC
SCLK
SDIN
SDO
CLR
LDAC
D0
PIN 1
NC
INDICATOR
VOUTA
AGNDA
AGNDB
AD5762R
TOP VIEW
(Not to Scale)
VOUTB
NC
D1
NC
8
17
9
16
Figure 6. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1
SYNC
Active Low Input. This is the frame synchronization signal for the serial interface.
While SYNC is low, data is transferred in on the falling edge of SCLK.
2
SCLK
Serial Clock Input. Data is clocked into the shift register on the falling edge of SCLK.
This operates at clock speeds up to 30 MHz.
3
4
SDIN
SDO
Serial Data Input. Data must be valid on the falling edge of SCLK.
Serial Data Output. Used to clock data from the serial register in daisy-chain or
readback mode.
51
6
CLR1
Negative Edge Triggered Input. Asserting this pin sets the DAC registers to 0x0000.
LDAC
Load DAC. Logic input. This is used to update the DAC registers and consequently
the analog outputs. When tied permanently low, the addressed DAC register is
updated on the rising edge of SYNC. If LDAC is held high during the write cycle, the
DAC input register is updated but the output update is held off until the falling edge
of LDAC. In this mode, all analog outputs can be updated simultaneously on the
falling edge of LDAC. The LDAC pin must not be left unconnected.
7, 8
D0, D1
D0 and D1 form a digital I/O port. The user can set up these pins as inputs or outputs
that are configurable and readable over the serial interface. When configured as
inputs, these pins have weak internal pull-ups to DVCC. When programmed as
outputs, D0 and D1 are referenced by DVCC and DGND.
9
RSTOUT
RSTIN
Reset Logic Output. This is the output from the on-chip voltage monitor used in the
reset circuit. If desired, it can be used to control other system components.
Reset Logic Input. This input allows external access to the internal reset logic.
Applying a Logic 0 to this input clamps the DAC outputs to 0 V. In normal operation,
RSTIN should be tied to Logic 1. Register values remain unchanged.
10
11
12
13, 31
14
15, 30
16
DGND
DVCC
AVDD
PGND
AVSS
Digital Ground Pin.
Digital Supply Pin. Voltage ranges from 2.7 V to 5.25 V.
Positive Analog Supply Pins. Voltage ranges from 11.4 V to 16.5 V.
Ground Reference Point for Analog Circuitry.
Negative Analog Supply Pins. Voltage ranges from –11.4 V to –16.5 V.
ISCC
This pin is used in association with an optional external resistor to AGND to program
the short-circuit current of the output amplifiers. Refer to the Features section for
further details.
17
18
NC
NC
No Internal Connection
No Internal Connection
Rev. PrA | Page 11 of 33
AD5762R
Preliminary Technical Data
Pin No. Mnemonic
Description
19
VOUTB
Analog Output Voltage of DAC B. Buffered output with a nominal full-scale output range
of 10 V. The output amplifier is capable of directly driving a 10 kΩ, 200 pF load.
20
21
22
AGNDB
AGNDA
VOUTA
Ground Reference Pin for DAC B Output Amplifier.
Ground Reference Pin for DAC A Output Amplifier.
Analog Output Voltage of DAC A. Buffered output with a nominal full-scale output range
of 10 V. The output amplifier is capable of directly driving a 10 kΩ, 200 pF load.
23
24
25
NC
NC
REFA
Do not connect to this pin
Do not connect to this pin
External Reference Voltage. Reference input range is 1 V to 7 V; programs the full-
scale output voltage. REFA = 5 V for specified performance.
26
27
REFB
External Reference Voltage. Reference input range is 1 V to 7 V; programs the full-
scale output voltage. REFB = 5 V for specified performance.
Reference Output. This is the reference output from the internal voltage reference.
The internal reference is 5 V 3 mV at 25°C, with a reference tempco of 10 ppm/°C.
REFOUT
28
29
REFGND
TEMP
Reference Ground Return for the Reference Generator and Buffers.
This pin provides an output voltage proportional to temperature. The output voltage
is 1.4 V typical at 25°C die temperature; variation with temperature is 5 mV/°C.
32
BIN/2sCOMP
Determines the DAC Coding. This pin should be hardwired to either DVCC or DGND.
When hardwired to DVCC, input coding is offset binary. When hardwired to DGND,
input coding is twos complement (see Table 6).
1 Internal pull-up device on this logic input. Therefore, it can be left floating and defaults to a logic high condition.
Rev. PrA | Page 12 of 33
Preliminary Technical Data
TERMINOLOGY
AD5762R
Relative Accuracy or Integral nonlinearity (INL)
Gain Error
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
functionꢀ A typical INL vsꢀ code plot can be seen in Figure 7ꢀ
Gain error is a measure of the span error of the DACꢀ It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale rangeꢀ A plot of
gain error vsꢀ temperature can be seen in Figure 23ꢀ
Differential Nonlinearity (DNL)
Total Unadjusted Error
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codesꢀ A specified differential nonlinearity of 1 LSB maximum
ensures monotonicityꢀ This DAC is guaranteed monotonicꢀ A
typical DNL vsꢀ code plot can be seen in Figure 9ꢀ
Total unadjusted error (TUE) is a measure of the output error
considering all the various errorsꢀ A plot of total unadjusted
error vsꢀ reference can be seen in Figure 19ꢀ
Zero-Scale Error TC
Zero-scale error TC is a measure of the change in zero-scale
error with a change in temperatureꢀ Zero-scale error TC is
expressed in ppm FSR/°Cꢀ
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input codeꢀ The AD5762R is
monotonic over its full operating temperature rangeꢀ
Gain Error TC
Gain error TC is a measure of the change in gain error with
changes in temperatureꢀ Gain Error TC is expressed in
(ppm of FSR)/°Cꢀ
Bipolar Zero Error
Bipolar zero error is the deviation of the analog output from the
ideal half-scale output of ꢂ ꢁ when the DAC register is loaded with
ꢂx8ꢂꢂꢂ (offset binary coding) or ꢂxꢂꢂꢂꢂ (twos complement
coding)ꢀ A plot of bipolar zero error vsꢀ temperature can be seen in
Figure 22ꢀ
Digital-to-Analog Glitch Energy
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
stateꢀ It is normally specified as the area of the glitch in nꢁ-s and is
measured when the digital input code is changed by 1 LSB at the
major carry transition (ꢂx7FFF to ꢂx8ꢂꢂꢂ) (see Figure 28)ꢀ
Bipolar Zero TC
Bipolar zero TC is the measure of the change in the bipolar zero
error with a change in temperatureꢀ It is expressed in ppm FSR/°Cꢀ
Digital Feedthrough
Full-Scale Error
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC but is measured when the DAC output is not updatedꢀ It is
specified in nꢁ-s and measured with a full-scale code change on
the data bus, that is, from all ꢂs to all 1s and vice versaꢀ
Full-scale error is a measure of the output error when full-scale
code is loaded to the DAC registerꢀ Ideally the output voltage
should be 2 × ꢁREF − 1 LSBꢀ Full-scale error is expressed in
percentage of full-scale rangeꢀ
Negative Full-Scale Error/Zero Scale Error
Power Supply Sensitivity
Negative full-scale error is the error in the DAC output voltage
when ꢂxꢂꢂꢂꢂ (offset binary coding) or ꢂx8ꢂꢂꢂ (twos
complement coding) is loaded to the DAC registerꢀ Ideally, the
output voltage should be −2 × ꢁREFꢀ A plot of zero-scale error vsꢀ
temperature can be seen in Figure 21ꢀ
Power supply sensitivity indicates how the output of the DAC is
affected by changes in the power supply voltageꢀ
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DACꢀ It is
measured with a full-scale output change on one DAC while
monitoring another DAC, and is expressed in LSBsꢀ
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output to settle to a specified level for a full-scale input
changeꢀ
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
output change of another DACꢀ This includes both digital and
analog crosstalkꢀ It is measured by loading one of the DACs
with a full-scale code change (all ꢂs to all 1s and vice versa) with
Slew Rate
The slew rate of a device is a limitation in the rate of change of
the output voltageꢀ The output slewing speed of a voltage-
output D/A converter is usually limited by the slew rate of the
amplifier used at its outputꢀ Slew rate is measured from 1ꢂ% to
9ꢂ% of the output signal and is given in ꢁ/µsꢀ
low and monitoring the output of another DACꢀ The
LDAC
energy of the glitch is expressed in nꢁ-sꢀ
Rev. PrA | Page 13 of 33
AD5762R
Preliminary Technical Data
Channel-to-Channel Isolation
Digital Crosstalk
Channel-to-channel isolation is the ratio of the amplitude of the
signal at the output of one DAC to a sine wave on the reference
input of another DACꢀ It is measured in dBꢀ
Digital crosstalk is a measure of the impulse injected into the
analog output of one DAC from the digital inputs of another
DAC but is measured when the DAC output is not updatedꢀ It is
specified in nꢁ-s and measured with a full-scale code change on
the data bus, that is, from all ꢂs to all 1s and vice versaꢀ
Reference TC
Reference TC is a measure of the change in the reference output
voltage with a change in temperatureꢀ It is expressed in ppm/°Cꢀ
Rev. PrA | Page 14 of 33
Preliminary Technical Data
AD5762R
TYPICAL PERFORMANCE CHARACTERISTICS
1.0
1.0
0.8
T
= 25°C
T
V
= 25°C
/V = ±12V
DD SS
A
A
V
/V = ±15V
0.8
DD SS
REFIN = 5V
REFIN = 5V
0.6
0.6
0.4
0.4
0.2
0.2
0
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.2
–0.4
–0.6
–0.8
–1.0
0
0
0
10000
20000
30000
40000
50000
60000
0
10000
20000
30000
40000
50000
60000
DAC CODE
DAC CODE
Figure 7. Integral Nonlinearity Error vs. Code,
VDD/VSS 15 V
Figure 10. Differential Nonlinearity Error vs. Code,
=
VDD/VSS
=
12 V
1.0
0.8
0.5
0.4
0.3
0.2
0.1
0
T
V
= 25°C
A
T = 25°C
A
/V = ±12V
DD SS
V
/V = ±15V
DD SS
REFIN = 5V
REFIN = 5V
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.1
–0.2
10000
20000
30000
40000
50000
60000
–40
–20
0
20
40
60
80
100
DAC CODE
TEMPERATURE (°C)
Figure 8. Integral Nonlinearity Error vs. Code,
VDD/VSS 12 V
Figure 11. Integral Nonlinearity Error vs. Temperature,
VDD/VSS 15 V
=
=
1.0
0.8
0.5
0.4
0.3
0.2
0.1
0
T
= 25°C
A
T
= 25°C
/V = ±12V
A
V
/V = ±15V
DD SS
V
DD SS
REFIN = 5V
REFIN = 5V
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.1
–40
10000
20000
30000
40000
50000
60000
–20
0
20
40
60
80
100
DAC CODE
TEMPERATURE (°C)
Figure 9. Differential Nonlinearity Error vs. Code,
VDD/VSS 15 V
Figure 12. Integral Nonlinearity Error vs. Temperature,
VDD/VSS 12 V
=
=
Rev. PrA | Page 15 of 33
AD5762R
Preliminary Technical Data
0.15
0.10
0.05
0
0.15
0.10
T
= 25°C
A
REFIN = 5V
0.05
0
–0.05
–0.10
–0.15
–0.20
–0.05
–0.10
–0.15
–0.20
–0.25
T
V
= 25°C
A
/V = ±15V
DD SS
REFIN = 5V
–0.25
–40
–20
0
20
40
60
80
100
11.4
12.4
13.4
14.4
15.4
16.4
TEMPERATURE (°C)
SUPPLY VOLTAGE (V)
Figure 13. Differential Nonlinearity Error vs. Temperature,
VDD/VSS = 15 V
Figure 16. Differential Nonlinearity Error vs. Supply Voltage
0.15
0.8
T
= 25°C
A
0.6
0.4
0.10
0.05
0.2
0
0
–0.05
–0.10
–0.15
–0.20
–0.25
–0.2
–0.4
–0.6
–0.8
–1.0
T
V
= 25°C
A
/V = ±12V
DD SS
REFIN = 5V
–40
–20
0
20
40
60
80
100
1
2
3
4
5
6
7
TEMPERATURE (°C)
REFERENCE VOLTAGE (V)
Figure 14. Differential Nonlinearity Error vs. Temperature,
VDD/VSS = 12 V
Figure 17. Integral Nonlinearity Error vs. Reference Voltage, VDD/VSS
16.5 V
=
0.5
0.4
0.3
0.2
0.1
0
0.4
T
= 25°C
T
= 25°C
A
A
REFIN = 5V
0.3
0.2
0.1
0
–0.1
–0.2
–0.3
–0.4
–0.1
–0.2
11.4
12.4
13.4
14.4
15.4
16.4
1
2
3
4
5
6
7
SUPPLY VOLTAGE (V)
REFERENCE VOLTAGE (V)
Figure 15. Integral Nonlinearity Error vs. Supply Voltage
Figure 18. Differential Nonlinearity Error vs. Reference Voltage, VDD/VSS
16.5 V
=
Rev. PrA | Page 16 of 33
Preliminary Technical Data
AD5762R
0.8
0.8
0.6
0.4
0.2
0
REFIN = 5V
REFIN = 5V
V
/V = ±15V
DD SS
V
/V = ±15V
DD SS
0.6
0.4
0.2
0
V
/V = ±12V
DD SS
V
/V = ±12V
DD SS
–0.2
–0.2
–0.4
–40
–0.4
–40
–20
0
20
40
60
80
100
–20
0
20
40
60
80
100
TEMPERATURE (°C)
TEMPERATURE (°C)
Figure 19. Total Unadjusted Error vs. Reference Voltage,
Figure 22. Bipolar Zero Error vs. Temperature
VDD/VSS
= 16.5 V
14
13
12
11
10
9
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
T
= 25°C
REFIN = 5V
A
REFIN = 5V
|I
DD
|
V
/V = ±12V
DD SS
V
/V = ±15V
DD SS
|I
SS
|
8
11.4
–0.2
–40
12.4
13.4
V
14.4
/V (V)
15.4
16.4
–20
0
20
40
60
80
100
TEMPERATURE (°C)
DD SS
Figure 20. IDD/ISS vs. VDD/VSS
Figure 23. Gain Error vs. Temperature
0.25
0.20
0.15
0.10
0.05
0
0.0014
0.0013
0.0012
0.0011
0.0010
0.0009
0.0008
0.0007
0.0006
T
= 25°C
REFIN = 5V
V
/V = ±15V
DD SS
A
5V
V
/V = ±12V
DD SS
–0.05
–0.10
–0.15
–0.20
–0.25
3V
–40
–20
0
20
40
60
80
100
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
TEMPERATURE (°C)
V
LOGIC
Figure 21. Zero-Scale Error vs. Temperature
Figure 24. DICC vs. Logic Input Voltage
Rev. PrA | Page 17 of 33
AD5762R
Preliminary Technical Data
7000
–4
–6
T
= 25°C
A
REFIN = 5V
RI = 6kΩ
6000
5000
4000
3000
2000
1000
0
SCC
V
/V = ±15V
DD SS
–8
–10
–12
–14
–16
–18
–20
–22
–24
–26
V
/V = ±12V
DD SS
V
/V = ±12V,
DD SS
REFIN = 5V,
= 25°C,
T
A
0x8000 TO 0x7FFF,
500ns/DIV
–1000
–10
–5
0
5
10
–2.0–1.5–1.0–0.5
0
0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
TIME (µs)
SOURCE/SINK CURRENT (mA)
Figure 25. Source and Sink Capability of Output Amplifier with Positive
Full Scale Loaded
Figure 28. Major Code Transition Glitch Energy, VDD/VSS
= 12 V
10000
T
= 25°C
A
REFIN = 5V
RI = 6kΩ
9000
8000
7000
6000
5000
4000
3000
2000
1000
0
V
/V = ±15V
DD SS
SCC
MIDSCALE LOADED
REFIN = 0V
15V SUPPLIES
12V SUPPLIES
4
–1000
–12
–7
–2
3
8
50µV/DIV
CH4
SOURCE/SINK CURRENT (mA)
CH4 50.0µV
M1.00s
26µV
Figure 26. Source and Sink Capability of Output Amplifier with Negative
Full Scale Loaded
Figure 29. Peak-to-Peak Noise (100 kHz Bandwidth)
V
/V = ±12V,
DD SS
T
V
/V = ±15V
= 25°C
DD SS
REFIN = 5V, T = 25°C,
RAMP TIME = 100µs,
LOAD = 200pF||10kꢀ
A
T
A
REFIN = 5V
1
2
3
1
1µs/DIV
CH1 –120mV
B
CH1 3.00V
M1.00µs
CH1 10.0V
CH2 10.0V
M100µs A CH1
29.60%
7.80mV
W
B
CH3 10.0mV
T
W
Figure 27. Full-Scale Settling Time
Figure 30. VOUT vs. VDD/VSS on Power-Up
Rev. PrA | Page 18 of 33
Preliminary Technical Data
AD5762R
10
9
8
7
6
5
4
3
2
1
0
V
/V = ±15V
DD SS
= 25°C
T
V
/V = ±12V
= 25°C
A
DD SS
REFIN = 5V
T
A
1
5µV/DIV
A CH1
0
20
40
60
(kꢀ)
80
100
120
M1.00s
18mV
RI
SCC
Figure 34. REFOUT Output Noise 0.1 Hz to 10 Hz
Figure 31. Short-Circuit Current vs. RISCC
T
V
/V = ±12V
DD SS
T
= 25°C
A
1
2
3
B
B
CH1 10.0V
CH3 5.00V
CH2 10.0V
M400µs A CH1
29.60%
7.80mV
W
W
T
Figure 32. REFOUT Turn-On Transient
Figure 35. REFOUT Load Regulation
V
/V = ±12V
DD SS
T
= 25°C,
A
10µF CAPACITOR ON REF
OUT
1
50µV/DIV
A CH1
CH1 50.0µV
M1.00s
15µV
Figure 36. REFOUT Histogram of Thermal Hysteresis
Figure 33. REFOUT Output Noise 100 kHz Bandwidth
Rev. PrA | Page 19 of 33
AD5762R
Preliminary Technical Data
Figure 37. TEMP Voltage vs. Temperature
Rev. PrA | Page 20 of 33
Preliminary Technical Data
THEORY OF OPERATION
AD5762R
The AD5762R is a dual, 16-bit, serial input, bipolar voltage output
DAC and operates from supply voltages of 11ꢀ. ꢁ to 16ꢀ5 ꢁ and
has a buffered output voltage of up to 1ꢂꢀ5263 ꢀ Data is written to
the AD5762R in a 2.-bit word format, via a 3-wire serial interfaceꢀ
The AD5762R also offers an SDO pin, which is available for daisy
chaining or readbackꢀ
SERIAꢀ INTERFACE
The AD5762R is controlled over a versatile 3-wire serial
interface that operates at clock rates of up to 3ꢂ MHz and is
compatible with SPI®, QSPI™, MICROWIRE™, and DSP
standardsꢀ
Input Shift Register
The AD5762R incorporates a power-on reset circuit, which
ensures that the DAC registers power up loaded with ꢂxꢂꢂꢂꢂꢀ
The AD5762R features a digital I/O port that can be
programmed via the serial interface, an analog die temperature
sensor, on-chip 1ꢂ ppm/°C voltage reference, on-chip reference
buffers and per channel digital gain and offset registersꢀ
The input shift register is 2. bits wideꢀ Data is loaded into the
device MSB first as a 2.-bit word under the control of a serial
clock input, SCLKꢀ The input register consists of a read/write
bit, three register select bits, three DAC address bits and 16 data
bits as shown in Table 7ꢀ The timing diagram for this operation
is shown in Figure 2ꢀ
DAC ARCHITECTURE
Upon power-up, the DAC registers are loaded with zero code
(ꢂxꢂꢂꢂꢂ) and the outputs are clamped to ꢂ ꢁ via a low
impedance pathꢀ The outputs can be updated with the zero code
The DAC architecture of the AD5762R consists of a 16-bit
current mode segmented R-2R DACꢀ The simplified circuit
diagram for the DAC section is shown in Figure 38ꢀ
value by asserting either
or
ꢀ The corresponding
LDAC CLR
output voltage depends on the state of the BIN/ pinꢀ If
2sCOMP
pin is tied to DGND, then the data coding is
The four MSBs of the 16-bit data word are decoded to drive 15
switches, E1 to E15ꢀ Each of these switches connects one of the
15 matched resistors to either AGND or IOUTꢀ The remaining
12 bits of the data word drive switches Sꢂ to S11 of the 12-bit R-
2R ladder networkꢀ
the BIN/
2sCOMP
twos complement and the outputs update to ꢂ ꢀ If the
BIN/ pin is tied to DꢁCC, then the data coding is offset
2sCOMP
binary and the outputs update to negative full scaleꢀ To have the
outputs power-up with zero code loaded to the outputs, the
R
R
R
V
REF
pin should be held low during power-upꢀ
CLR
2R
2R
2R
2R
2R
2R
2R
Standalone Operation
The serial interface works with both a continuous and noncon-
tinuous serial clockꢀ A continuous SCLK source can only be
R/8
E15
E14
E1
S0
S11
S10
I
OUT
used if
is held low for the correct number of clock cyclesꢀ
SYNC
In gated clock mode, a burst clock containing the exact number
of clock cycles must be used and must be taken high after
V
OUT
AGND
SYNC
the final clock to latch the dataꢀ The first falling edge of
4 MSBs DECODED INTO
15 EQUAL SEGMENTS
12-BIT, R-2R LADDER
SYNC
starts the write cycleꢀ Exactly 2. falling clock edges must be
applied to SCLK before is brought back high againꢀ If
Figure 38. DAC Ladder Structure
REFERENCE BUFFERS
SYNC
is brought high before the 2.th falling SCLK edge, then
The AD5762R can operate with either an external or an internal
referenceꢀ The reference input has an input range up to 7 ꢀ This
input voltage is then used to provide a buffered positive and
negative reference for the DAC coresꢀ The positive reference is
given by
SYNC
the data written is invalidꢀ If more than 2. falling SCLK edges
are applied before is brought high, then the input data is
SYNC
also invalidꢀ The input register addressed is updated on the
rising edge of ꢀ In order for another serial transfer to take
SYNC
must be brought low againꢀ After the end of the
+ ꢁREF = 2 × ꢁREFIN
place,
SYNC
serial data transfer, data is automatically transferred from the
input shift register to the addressed registerꢀ
While the negative reference to the DAC cores is given by
−ꢁREF = −2 × ꢁREFIN
When the data has been transferred into the chosen register of
the addressed DAC, all DAC registers and outputs can be
These positive and negative reference voltages (along with the
gain register values) define the output ranges of the DACsꢀ
updated by taking
lowꢀ
LDAC
Rev. PrA | Page 21 of 33
AD5762R
Preliminary Technical Data
AD5762R*
SDIN
68HC11*
MOSI
A continuous SCLK source can only be used if
low for the correct number of clock cyclesꢀ In gated clock mode,
a burst clock containing the exact number of clock cycles must
is held
SYNC
SCK
PC7
PC6
SCLK
SYNC
LDAC
be used and
must be taken high after the final clock to
SYNC
latch the dataꢀ
Readback Operation
MISO
SDO
Before a readback operation is initiated, the SDO pin must be
enabled by writing to the function register and clearing the
SDO DISABLE bit; this bit is cleared by defaultꢀ Readback mode
SDIN
is invoked by setting the R/ bit = 1 in the serial input register
writeꢀ With R/ = 1, Bit A2 to Bit Aꢂ, in association with Bit
W
W
AD5762R*
SCLK
REG2, Bit REG1, and Bit REGꢂ, select the register to be readꢀ
The remaining data bits in the write sequence are don’t careꢀ
During the next SPI write, the data appearing on the SDO
output contain the data from the previously addressed registerꢀ
For a read of a single register, the NOP command can be used
in clocking out the data from the selected register on SDOꢀ The
readback diagram in Figure . shows the readback sequenceꢀ For
example, to read back the fine gain register of Channel A on the
AD5762R, the following sequence should be implemented:
SYNC
LDAC
SDO
SDIN
AD5762R*
SCLK
1ꢀ Write ꢂxAꢂXXXX to the AD5762R input registerꢀ This
configures the AD5762R for read mode with the fine gain
register of Channel A selectedꢀ Note that all the data bits,
DB15 to DBꢂ, are don’t careꢀ
SYNC
LDAC
SDO
2ꢀ Follow this with a second write, a NOP condition,
ꢂxꢂꢂXXXXꢀ During this write, the data from the fine gain
register is clocked out on the SDO line, that is, data clocked
out contains the data from the fine gain register in Bit DB5 to
Bit DBꢂꢀ
*ADDITIONAL PINS OMITTED FOR CLARITY
Figure 39. Daisy Chaining the AD5762R
Daisy-Chain Operation
SIMUꢀTANEOUS UPDATING VIA
ꢀDAC
For systems that contain several devices, the SDO pin can be
used to daisy chain several devices togetherꢀ This daisy-chain
mode can be useful in system diagnostics and in reducing the
Depending on the status of both
and
, and after
LDAC
SYNC
data has been transferred into the input register of the DACs,
there are two ways in which the DAC registers and DAC
outputs can be updatedꢀ
number of serial interface linesꢀ The first falling edge of
SYNC
starts the write cycleꢀ The SCLK is continuously applied to the
input shift register when is lowꢀ If more than 2. clock
SYNC
Individual DAC Updating
pulses are applied, the data ripples out of the shift register and
appears on the SDO lineꢀ This data is clocked out on the rising
edge of SCLK and is valid on the falling edgeꢀ By connecting the
SDO of the first device to the SDIN input of the next device in
the chain, a multidevice interface is constructedꢀ Each device in
the system requires 2. clock pulsesꢀ Therefore, the total number
of clock cycles must equal 2.N, where N is the total number of
AD5762R devices in the chainꢀ When the serial transfer to all
In this mode,
is held low while data is being clocked into
LDAC
the input shift registerꢀ The addressed DAC output is updated
on the rising edge of
ꢀ
SYNC
Simultaneous Updating of All DACs
In this mode, is held high while data is being clocked
LDAC
into the input shift registerꢀ All DAC outputs are updated by
taking low any time after has been taken highꢀ
devices is complete,
is taken highꢀ This latches the input
SYNC
LDAC
SYNC
data in each device in the daisy chain and prevents any further
data from being clocked into the input shift registerꢀ The serial
clock can be a continuous or a gated clockꢀ
The update now occurs on the falling edge of
ꢀ
LDAC
Rev. PrA | Page 22 of 33
Preliminary Technical Data
AD5762R
OUTPUT
I/V AMPLIFIER
The output voltage expression for the AD5762R is given by
16-BIT
DAC
V
REFIN
V
OUT
D
⎡
⎤
VOUT = −2×VREFIN + 4×VREFIN
⎢
⎥
65536
⎣
⎦
DAC
REGISTER
LDAC
where:
D is the decimal equivalent of the code loaded to the DACꢀ
REFIN is the reference voltage applied at the REFA, REFB pinsꢀ
V
INPUT
REGISTER
ASYNCHRONOUS CꢀEAR (
)
CꢀR
SCLK
SYNC
SDIN
INTERFACE
LOGIC
SDO
is a negative edge triggered clear that allows the outputs to
CLR
be cleared to either ꢂ ꢁ (twos complement coding) or negative
Figure 40. Simplified Serial Interface of Input Loading Circuitry
for One DAC Channel
full scale (offset binary coding)ꢀ It is necessary to maintain
low for a minimum amount of time (see Figure 2) for the
CLR
TRANSFER FUNCTION
operation to completeꢀ When the
signal is returned high,
CLR
the output remains at the cleared value until a new value is
programmedꢀ If at power-on is at ꢂ ꢁ, then all DAC
Table 6 shows the ideal input code to output voltage
relationship for the AD5762R for both offset binary and twos
complement data codingꢀ
CLR
outputs are updated with the clear valueꢀ A clear can also be
initiated through software by writing the command ꢂxꢂ.XXXX
to the AD5762Rꢀ
Table 6. Ideal Output Voltage to Input Code Relationship for
the AD5762R
Digital Input
Analog Output
Offset Binary Data Coding
MSB
ꢀSB VOUT
1111 1111
1000 0000
1000 0000
0111 1111
0000 0000
1111
0000
0000
1111
0000
1111
0001
0000
1111
0000
+2 VREFIN × (32767/32768)
+2 VREFIN × (1/32768)
0 V
−2 VREFIN × (1/32768)
−2 VREFIN × (32767/32768)
Twos Complement Data Coding
MSB
ꢀSB VOUT
0111 1111
0000 0000
0000 0000
1111 1111
1000 0000
1111
0000
0000
1111
0000
1111
0001
0000
1111
0000
+2 VREFIN × (32767/32768)
+2 VREFIN × (1/32768)
0 V
−2 VREFIN × (1/32768)
−2 VREFIN × (32767/32768)
Rev. PrA | Page 23 of 33
AD5762R
Preliminary Technical Data
Table 7. AD5762R Input Register Format
MSB
LSB
DB23
DB22
0
DB21
REG2
DB20
REG1
DB19
REG0
DB18
A2
DB17
A1
DB16
A0
DB15
DB14
DB13
DB12
DB11
DB10
DB9
DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
W
R/
DATA
Table 8. Input Register Bit Functions
Register
Function
R/W
Indicates a read from or a write to the addressed register.
REG2, REG1, REG0
Used in association with the address bits to determine if a read or write operation is to the data register, offset
register, gain register, or function register.
REG2
REG1
REG0
Function
0
0
0
1
1
0
1
1
0
0
0
0
1
0
1
Function Register
Data Register
Coarse Gain Register
Fine Gain Register
Offset Register
A2, A1, A0
D15:D0
These bits are used to decode the DAC channels.
A2
A1
0
A0
0
Channel Address
DAC A
0
0
0
1
DAC B
1
0
0
BOTH DACs
Data Bits.
FUNCTION REGISTER
The function register is addressed by setting the three REG bits to ꢂꢂꢂꢀ The values written to the address bits and the data bits determine
the function addressedꢀ The functions available via the function register are outlined in Table 9 and Table 1ꢂꢀ
Table 9. Function Register Options
REG2 REG1 REG0 A2 A1 A0
DB15:DB6
DB5
DB4
DB3
DB2
DB1
DB0
0
0
0
0
0
0
0
0
0
0
0
1
NOP, Data = Don’t Care
Don’t Care
Local-
Ground-
Offset Adjust
D1 Direction D1
Value
D0
Direction
D0
Value
SDO
Disable
0
0
0
0
0
0
1
1
0
0
0
1
CLR, Data = Don’t Care
LOAD, Data = Don’t Care
Table 10. Explanation of Function Register Options
Option
Description
NOP
No operation instruction used in readback operations.
Local-Ground-
Offset Adjust
Set by the user to enable local-ground-offset adjust function. Cleared by the user to disable local-ground-offset adjust
function (default). Refer to Features section for further details.
D0/D1
Direction
Set by the user to enable D0/D1 as outputs. Cleared by the user to enable D0/D1 as inputs (default). Refer to the Features
section for further details.
D0/D1 Value
I/O Port Status Bits. Logic values written to these locations determine the logic outputs on the D0 and D1 pins when
configured as outputs. These bits indicate the status of the D0 and D1 pins when the I/O port is active as an input. When
enabled as inputs, these bits are don’t cares during a write operation.
SDO Disable
CLR
LOAD
Set by the user to disable the SDO output. Cleared by the user to enable the SDO output (default).
Addressing this function resets the DAC outputs to 0 V in twos complement mode and negative full scale in binary mode.
Addressing this function updates the DAC registers and consequently the analog outputs.
Rev. PrA | Page 24 of 33
Preliminary Technical Data
AD5762R
DATA REGISTER
The data register is addressed by setting the three REG bits to ꢂ1ꢂꢀ The DAC address bits select with which DAC channel the data transfer
is to take place (see Table 8)ꢀ The data bits are in positions DB15 to DBꢂ for the AD5762R as shown in Table 11ꢀ
Table 11. Programming the AD5762R Data Register
REG2
REG1
REG0
A2
A1
A0
DB15
DB14
DB13
DB12
DB11
DB10
DB9
DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
0
1
0
DAC Address
16-Bit DAC Data
COARSE GAIN REGISTER
The coarse gain register is addressed by setting the three REG bits to ꢂ11ꢀ The DAC address bits select with which DAC channel the data
transfer is to take place (see Table 8)ꢀ The coarse gain register is a 2-bit register and allows the user to select the output range of each DAC
as shown in Table 13ꢀ
Table 12. Programming the AD5762R Coarse Gain Register
REG2
REG1
REG0
A2
A1
A0
DB15 …. DB2
DB1
DB0
0
1
1
DAC Address
Don’t Care
CG1
CG0
Table 13. Output Range Selection
Output Range
10 V (default)
10.2564 V
CG1
CG0
0
0
1
0
1
0
10.5263 V
FINE GAIN REGISTER
The fine gain register is addressed by setting the three REG bits to 1ꢂꢂꢀ The DAC address bits select with which DAC channel the data
transfer is to take place (see Table 8)ꢀ The AD5762R fine gain register is a 6-bit register and allows the user to adjust the gain of each DAC
channel by −32 LSBs to +31 LSBs in 1 LSB steps as shown in Table 1. and Table 15ꢀ The adjustment is made to both the positive full-scale
points and the negative full-scale points simultaneously, each point being adjusted by ½ of one stepꢀ The fine gain register coding is twos
complementꢀ
Table 14. Programming AD5762R Fine Gain Register
REG2
REG1
REG0
A2
A1
A0
DB15:DB6
DB5
DB4
DB3
DB2
DB1
DB0
1
0
0
DAC Address
Don’t Care
FG5
FG4
FG3
FG2
FG1
FG0
Table 15. AD5762R Fine Gain Register Options
Gain Adjustment
FG5
FG4
FG3
FG2
FG1
FG0
+31 LSBs
+30 LSBs
0
0
-
1
1
-
1
1
-
1
1
-
1
1
-
1
0
-
No Adjustment (default)
0
-
0
-
0
-
0
-
0
-
0
-
−31 LSBs
−32 LSBs
1
1
0
0
0
0
0
0
0
0
1
0
OFFSET REGISTER
The offset register is addressed by setting the three REG bits to 1ꢂ1ꢀ The DAC address bits select with which DAC channel the data
transfer is to take place (see Table 8)ꢀ The AD5762R offset register is an 8-bit register and allows the user to adjust the offset of each
channel by −16 LSBs to +15ꢀ875 LSBs in steps of ⅛ LSB as shown in Table 16 and Table 17ꢀ The offset register coding is twos complementꢀ
Table 16. Programming the AD5762R Offset Register
REG2
REG1
REG0
A2
A1
A0
DB15:DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
1
0
1
DAC Address
Don’t Care
OF7
OF6
OF5
OF4
OF3
OF2
OF1
OF0
Rev. PrA | Page 25 of 33
AD5762R
Preliminary Technical Data
Table 17. AD5762R Offset Register options
Offset Adjustment
OF7
OF6
OF5
OF4
OF3
OF2
OF1
OF0
+15.875 LSBs
+15.75 LSBs
0
0
-
1
1
-
1
1
-
1
1
-
1
1
-
1
1
-
1
1
-
1
0
-
No Adjustment (default)
0
-
0
-
0
-
0
-
0
-
0
-
0
-
0
-
−15.875 LSBs
−16 LSBs
1
1
0
0
0
0
0
0
0
0
0
0
0
0
1
0
Rev. PrA | Page 26 of 33
Preliminary Technical Data
AD5762R
Removing Gain Error
OFFSET AND GAIN ADJUSTMENT WORKED
EXAMPꢀE
The AD5762R can eliminate a gain error at negative full-scale
output in the range of −9ꢀ77 mꢁ to +9ꢀ.6 mꢁ with a step size of
½ of a 16-bit LSBꢀ
Using the information provided in the previous section, the
following worked example demonstrates how the AD5762R
functions can be used to eliminate both offset and gain errorsꢀ
As the AD5762R is factory calibrated, offset and gain errors
should be negligibleꢀ However, errors can be introduced by the
system that the AD5762R is operating within, for example, a
voltage reference value that is not equal to +5 ꢁ introduces a
gain errorꢀ An output range of 1ꢂ ꢁ and twos complement
data coding is assumedꢀ
Calculate the step size of the gain adjustment
20
216 × 2
Gain Adjust Step Size =
=152.59 µV
Measure the gain error by programming ꢂx8ꢂꢂꢂ to the data
register and measuring the resulting output voltageꢀ The gain
error is the difference between this value and −1ꢂ ꢁ, for this
example, the gain error is −1ꢀ2 m ꢀ
Removing Offset Error
The AD5762R can eliminate an offset error in the range of −.ꢀ88
mꢁ to +.ꢀ8. mꢁ with a step size of ⅛ of a 16-bit LSBꢀ
How many gain adjustment steps does this value represent?
Measured Gain Value
Gain Step Size
1.2 mV
Number of Steps =
=
= 8 Steps
152.59 µV
Calculate the step size of the offset adjustment,
2ꢂ
Offset Adjust Step Size =
= 38ꢀ1. µV
16 × 8
The gain error measured is negative (in terms of magnitude);
therefore, a positive adjustment of eight steps is requiredꢀ The
gain register is 6 bits wide and the coding is twos complement,
the required gain register value can be determined as follows:
2
Measure the offset error by programming ꢂxꢂꢂꢂꢂ to the data
register and measuring the resulting output voltage, for this
example the measured value is +61. µ ꢀ
Convert adjustment value to binary; ꢂꢂ1ꢂꢂꢂꢀ
How many offset adjustment steps does this value represent?
The value to be programmed to the gain register is simply this
binary numberꢀ
Measured Offset Value
Offset Step Size
614 µV
Numberof Steps =
=
=16 Steps
38.14 µV
The offset error measured is positive, therefore, a negative
adjustment of 16 steps is requiredꢀ The offset register is 8 bits
wide and the coding is twos complementꢀ The required offset
register value can be calculated as follows:
Convert adjustment value to binary; ꢂꢂꢂ1ꢂꢂꢂꢂꢀ
Convert this to a negative twos complement number by
inverting all bits and adding 1; 1111ꢂꢂꢂꢂꢀ
1111ꢂꢂꢂꢂ is the value that should be programmed to the offset
registerꢀ
Note: This twos complement conversion is not necessary in the
case of a positive offset adjustmentꢀ The value to be
programmed to the offset register is simply the binary
representation of the adjustment valueꢀ
Rev. PrA | Page 27 of 33
AD5762R
Preliminary Technical Data
AD5762R FEATURES
If the ISCC pin is left unconnected, the short circuit current
limit defaults to 5 mAꢀ It should be noted that limiting the short
circuit current to a small value can affect the slew rate of the
output when driving into a capacitive load, therefore, the value
of short-circuit current programmed should take into account
the size of the capacitive load being drivenꢀ
ANAꢀOG OUTPUT CONTROꢀ
In many industrial process control applications, it is vital that
the output voltage be controlled during power-up and during
brownout conditionsꢀ When the supply voltages are changing,
the ꢁOUT pins are clamped to ꢂ ꢁ via a low impedance pathꢀ
To prevent the output amp being shorted to ꢂ ꢁ during this
time, transmission gate G1 is also opened (see Figure .1)ꢀ These
conditions are maintained until the power supplies stabilize and
a valid word is written to the DAC registerꢀ At this time, G2
opens and G1 closesꢀ Both transmission gates are also externally
DIGITAꢀ I/O PORT
The AD5762R contain a 2-bit digital I/O port (D1 and Dꢂ),
these bits can be configured as inputs or outputs independently,
and can be driven or have their values read back via the serial
interfaceꢀ The I/O port signals are referenced to DꢁCC and
DGNDꢀ When configured as outputs, they can be used as
control signals to multiplexers or can be used to control
calibration circuitry elsewhere in the systemꢀ When configured
as inputs, the logic signals from limit switches, for example can
be applied to Dꢂ and D1 and can be read back via the digital
interfaceꢀ
controllable via the Reset In (
) control inputꢀ For
RSTIN
instance, if
is driven from a battery supervisor chip, the
RSTIN
input is driven low to open G1 and close G2 on power-
RSTIN
off or during a brownoutꢀ Conversely, the on-chip voltage
detector output ( ) is also available to the user to
RSTOUT
control other parts of the systemꢀ The basic transmission gate
functionality is shown in Figure .1ꢀ
RSTOUT
RSTIN
DIE TEMPERATURE SENSOR
The on-chip die temperature sensor provides a voltage output
that is linearly proportional to the centigrade temperature scaleꢀ
Its nominal output voltage is 1ꢀ. ꢁ at +25°C die temperature,
varying at 5 mꢁ/°C, giving a typical output range of 1ꢀ175 ꢁ to
1ꢀ9 ꢁ over the full temperature rangeꢀ Its low output impedance,
and linear output simplify interfacing to temperature control
circuitry and A/D convertersꢀ The temperature sensor is
provided as more of a convenience rather than a precise feature;
it is intended for indicating a die temperature change for
recalibration purposesꢀ
VOLTAGE
MONITOR
AND
CONTROL
G1
VOUTA
AGNDA
G2
Figure 41. Analog Output Control Circuitry
DIGITAꢀ OFFSET AND GAIN CONTROꢀ
ꢀOCAꢀ GROUND OFFSET ADJUST
The AD5762R incorporates a digital offset adjust function with
The AD5762R incorporates a local-ground-offset adjust feature
which when enabled in the function register adjusts the DAC
outputs for voltage differences between the individual DAC
ground pins and the REFGND pin ensuring that the DAC
output voltages are always with respect to the local DAC ground
pinꢀ For instance, if pin AGNDA is at +5 mꢁ with respect to the
REFGND pin and ꢁOUTA is measured with respect to
AGNDA then a −5mꢁ error results, enabling the local-ground-
offset adjust feature adjusts ꢁOUTA by +5 mꢁ, eliminating the
errorꢀ
a
16 LSB adjust range and ꢂꢀ125 LSB resolutionꢀ The gain
register allows the user to adjust the AD5762R’s full-scale
output rangeꢀ The full-scale output can be programmed to
achieve full-scale ranges of 1ꢂ ꢁ, 1ꢂꢀ25 ꢁ, and 1ꢂꢀ5 ꢀ A fine
gain trim is also availableꢀ
PROGRAMMABꢀE SHORT-CIRCUIT PROTECTION
The short-circuit current of the output amplifiers can be pro-
grammed by inserting an external resistor between the ISCC
pin and PGNDꢀ The programmable range for the current is
5ꢂꢂ µA to 1ꢂ mA, corresponding to a resistor range of 12ꢂ kΩ
to 6 kΩ ꢀ The resistor value is calculated as follows:
60
R =
Isc
Rev. PrA | Page 28 of 33
Preliminary Technical Data
AD5762R
APPLICATIONS INFORMATION
TYPICAꢀ OPERATING CIRCUIT
Precision Voltage Reference Selection
To achieve the optimum performance from the AD5762R over
its full operating temperature range, an external voltage
reference must be usedꢀ Thought should be given to the
selection of a precision voltage referenceꢀ The voltage applied to
the reference input is used to provide a buffered positive and
negative reference for the DAC coresꢀ Therefore, any error in
the voltage reference is reflected in the outputs of the deviceꢀ
Figure .2 shows the typical operating circuit for the AD5762Rꢀ
The only external components needed for this precision 16-bit
DAC are decoupling capacitors on the supply pins and reference
inputs, and an optional short-circuit current setting resistorꢀ
Because the AD5762R incorporates a voltage reference and
reference buffers, it eliminates the need for an external bipolar
reference and associated buffersꢀ This leads to an overall savings
in both cost and board spaceꢀ
There are four possible sources of error to consider when
choosing a voltage reference for high accuracy applications:
initial accuracy, temperature coefficient of the output voltage,
long term drift, and output voltage noiseꢀ
In Figure .2, ꢁDD and ꢁSS are both connected to 15 ꢁ, but ꢁDD
and ꢁSS can operate with supplies from 11ꢀ. ꢁ to 16ꢀ5 ꢀ In
Figure .2, AGNDA and AGNDB are connected to REFGNDꢀ
+15V –15V
Initial accuracy error on the output voltage of an external refer-
ence could lead to a full-scale error in the DACꢀ Therefore, to
minimize these errors, a reference with low initial accuracy
error specification is preferredꢀ Choosing a reference with an
output trim adjustment, such as the ADR.25, allows a system
designer to trim system errors out by setting the reference
voltage to a voltage other than the nominalꢀ The trim ad-
justment can also be used at temperature to trim out any errorꢀ
10µF
10µF
100nF
100nF
TEMP
+5V
BIN/2sCOMP
32 31 30 29 28 27 26 25
Long term drift is a measure of how much the reference output
voltage drifts over timeꢀ A reference with a tight long-term drift
specification ensures that the overall solution remains relatively
stable over its entire lifetimeꢀ
1
2
3
4
5
6
7
8
24
23
22
21
20
19
18
17
SYNC
SCLK
SDIN
SDO
SYNC
NC
NC
SCLK
SDIN
SDO
CLR
LDAC
D0
VOUTA
AGNDA
AGNDB
VOUTB
NC
VOUTA
VOUTB
AD5762R
LDAC
D0
The temperature coefficient of a reference’s output voltage
affects INL, DNL, and TUEꢀ A reference with a tight
temperature coefficient specification should be chosen to
reduce the dependence of the DAC output voltage on ambient
conditionsꢀ
NC
D1
D1
9
10 11 12 13 14 15 16
RSTOUT
RSTIN
10µF
In high accuracy applications, which have a relatively low noise
budget, reference output voltage noise needs to be consideredꢀ
Choosing a reference with as low an output noise voltage as
practical for the system resolution required is importantꢀ
Precision voltage references such as the ADR.35 (XFET design)
produce low output noise in the ꢂꢀ1 Hz to 1ꢂ Hz regionꢀ
However, as the circuit bandwidth increases, filtering the output
of the reference may be required to minimize the output noiseꢀ
100nF
10µF
+5V
+15V –15V
Figure 42. Typical Operating Circuit
Table 18. Some Precision References Recommended for Use with the AD5762R
Part No. Initial Accuracy(mV Max) ꢀong-Term Drift (ppm Typ) Temp Drift (ppm/°C Max) 0.1 Hz to 10 Hz Noise (µV p-p Typ)
ADR435
ADR425
ADR02
ADR395
AD586
6
6
5
6
30
50
50
50
15
3
3
3
25
10
3.4
3.4
15
5
2.5
4
Rev. PrA | Page 29 of 33
AD5762R
Preliminary Technical Data
LAYOUT GUIDELINES
1
µCONTROLLER
ADuM1400
In any circuit where accuracy is important, careful consider-
ation of the power supply and ground return layout helps to
ensure the rated performanceꢀ The printed circuit board on
which the AD5762R is mounted should be designed so that the
analog and digital sections are separated and confined to
certain areas of the boardꢀ If the AD5762R is in a system where
multiple devices require an AGND-to-DGND connection, the
connection should be made at one point onlyꢀ The star ground
point should be established as close as possible to the deviceꢀ
The AD5762R should have ample supply bypassing of 1ꢂ µF in
parallel with ꢂꢀ1 µF on each supply located as close to the
package as possible, ideally right up against the deviceꢀ The 1ꢂ
µF capacitors are the tantalum bead typeꢀ The ꢂꢀ1 µF capacitor
should have low effective series resistance (ESR) and low
effective series inductance (ESI) such as the common ceramic
types, which provide a low impedance path to ground at high
frequencies to handle transient currents due to internal logic
switchingꢀ
V
V
V
V
V
IA
OA
OB
OC
OD
ENCODE
ENCODE
ENCODE
ENCODE
DECODE
DECODE
DECODE
DECODE
SERIAL CLOCK OUT
TO SCLK
TO SDIN
TO SYNC
TO LDAC
V
V
V
IB
IC
ID
SERIAL DATA OUT
SYNC OUT
CONTROL OUT
1
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 43. Isolated Interface
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5762R is via a serial bus
that uses standard protocol compatible with microcontrollers
and DSP processorsꢀ The communications channel is a 3-wire
(minimum) interface consisting of a clock signal, a data signal,
and a synchronization signalꢀ The AD5762R requires a 2.-bit
data-word with data valid on the falling edge of SCLKꢀ
The power supply lines of the AD5762R should use as large a
trace as possible to provide low impedance paths and reduce
the effects of glitches on the power supply lineꢀ Fast switching
signals, such as clocks, should be shielded with digital ground
to avoid radiating noise to other parts of the board, and should
never be run near the reference inputsꢀ A ground line routed
between the SDIN and SCLK lines helps reduce cross-talk
between them (not required on a multilayer board, which has a
separate ground plane, however, it is helpful to separate the
lines)ꢀ It is essential to minimize noise on the reference inputs,
because it couples through to the DAC outputꢀ Avoid crossover
of digital and analog signalsꢀ Traces on opposite sides of the
board should run at right angles to each otherꢀ This reduces the
effects of feed through on the boardꢀ A microstrip technique is
recommended, but not always possible with a double-sided
boardꢀ In this technique, the component side of the board is
dedicated to ground plane, while signal traces are placed on the
solder sideꢀ
For all the interfaces, the DAC output update can be done
automatically when all the data is clocked in, or it can be done
under the control of LDACꢀ The contents of the DAC register
can be read using the readback functionꢀ
AD5762R to MC68HC11 Interface
Figure .. shows an example of a serial interface between the
AD5762R and the MC68HC11 microcontrollerꢀ The serial
peripheral interface (SPI) on the MC68HC11 is configured for
master mode (MSTR = 1), clock polarity bit (CPOL = ꢂ), and the
clock phase bit (CPHA = 1)ꢀ The SPI is configured by writing to the
SPI control register (SPCR) (see the 68HC11User Manual)ꢀ SCK of
the MC68HC11 drives the SCLK of the AD5762R, the MOSI
output drives the serial data line (DIN) of the AD5762R, and the
MISO input is driven from SDOꢀ The SYNC is driven from one of
the port lines, in this case PC7ꢀ
GAꢀVANICAꢀꢀY ISOꢀATED INTERFACE
In many process control applications, it is necessary to provide
an isolation barrier between the controller and the unit being
controlled to protect and isolate the controlling circuitry from
any hazardous common-mode voltages that might occurꢀ
Isocouplers provide voltage isolation in excess of 2ꢀ5 kꢁꢀ The
serial loading structure of the AD5762R makes it ideal for
isolated interfaces, because the number of interface lines is kept
to a minimumꢀ Figure .3 shows a .-channel isolated interface
to the AD5762R using an ADuM1.ꢂꢂꢀ For more information,
go to wwwꢀanalogꢀcomꢀ
Rev. PrA | Page 30 of 33
Preliminary Technical Data
AD5762R
When data is being transmitted to the AD5762R, the SYNC line
(PC7) is taken low and data is transmitted MSB firstꢀ Data
appearing on the MOSI output is valid on the falling edge of
SCKꢀ Eight falling clock edges occur in the transmit cycle, so, in
order to load the required 2.-bit word, PC7 is not brought high
until the third 8-bit word has been transferred to the DACs
input shift registerꢀ
The 8XC51 transmits data in 8-bit bytes with only eight falling
clock edges occurring in the transmit cycleꢀ Because the DAC
expects a 2.-bit word, SYNC (P3ꢀ3) must be left low after the
first eight bits are transferredꢀ After the third byte has been
transferred, the P3ꢀ3 line is taken highꢀ The DAC can be
LDAC
updated using
via P3ꢀ. of the 8XC51ꢀ
AD5762R to ADSP2101/ADSP2103 Interface
1
MC68HC111
AD5762R
An interface between the AD5762R and the ADSP21ꢂ1/
ADSP21ꢂ3 is shown in Figure .6ꢀ The ADSP21ꢂ1/ ADSP21ꢂ3
should be set up to operate in the SPORT transmit alternate
framing modeꢀ The ADSP21ꢂ1/ADSP21ꢂ3 are programmed
through the SPORT control register and should be configured
as follows: internal clock operation, active low framing, and 2.-
bit word lengthꢀ
MISO
MOSI
SCK
PC7
SDO
SDIN
SCLK
SYNC
Transmission is initiated by writing a word to the TX register
after the SPORT has been enabledꢀ As the data is clocked out of
the DSP on the rising edge of SCLK, no glue logic is required to
interface the DSP to the DACꢀ In the interface shown, the DAC
output is updated using the LDAC pin via the DS ꢀ Alterna-
tively, the LDAC input could be tied permanently low, and then
the update takes place automatically when TFS is taken highꢀ
1
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 44. AD5762R to MC68HC11 Interface
LDAC is controlled by the PC6 port outputꢀ The DAC can be
updated after each 3-byte transfer by bringing LDAC lowꢀ This
example does not show other serial lines for the DACꢀ For
example, if CLR were used, it could be controlled by port
output PC5ꢀ
AD5762R1
ADSP2101/
ADSP21031
AD5762R to 8XC51 Interface
DR
DT
SDO
The AD5762R requires a clock synchronized to the serial dataꢀ
For this reason, the 8XC51 must be operated in Mode ꢂꢀ In this
mode, serial data enters and exits through RXD, and a shift
clock is output on TXDꢀ
SDIN
SCLK
SCLK
TFS
SYNC
LDAC
RFS
FO
P3ꢀ3 and P3ꢀ. are bit programmable pins on the serial port and
SYNC
LDAC
are used to drive
and
, respectivelyꢀ The 8CX51
1
provides the LSB of its SBUF register as the first bit in the data
streamꢀ The user must ensure that the data in the SBUF register
is arranged correctly, because the DAC expects MSB firstꢀ When
data is to be transmitted to the DAC, P3ꢀ3 is taken lowꢀ Data on
RXD is clocked out of the microcontroller on the rising edge of
TXD and is valid on the falling edgeꢀ As a result, no glue logic is
required between this DAC and the microcontroller interfaceꢀ
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 46. AD5762R to ADSP2101/ADSP2103 Interface
AD5762R to PIC16C6x/7x Interface
The PIC16C6x/7x synchronous serial port (SSP) is configured
as an SPI master with the clock polarity bit set to ꢂꢀ This is done
by writing to the synchronous serial port control register
(SSPCON)ꢀ See the PIC16/17 Microcontroller User Manualꢀ In
AD5762R1
8XC511
SYNC
this example, I/O port RA1 is being used to pulse
and
enable the serial port of the AD5762Rꢀ This microcontroller
transfers only eight bits of data during each serial transfer
operation; therefore, three consecutive write operations are
neededꢀ Figure .7 shows the connection diagramꢀ
RxD
SDIN
TxD
P3.3
P3.4
SCLK
SYNC
LDAC
1
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 45. AD5762R to 8XC51 Interface
Rev. PrA | Page 31 of 33
AD5762R
Preliminary Technical Data
AD5762R1
PIC16C6x/7x1
EVAꢀUATION BOARD
The AD5762R performance can be evaluated via the AD576.R
evaluation boardꢀ
SDI/RC4
SDO/RC5
SCLK/RC3
RA1
SDO
SDIN
SCLK
SYNC
The AD576.R comes with a full evaluation board to aid
designers in evaluating the high performance of the part with a
minimum of effortꢀ All that is required with the evaluation
board is a power supply and a PCꢀ The AD576.R evaluation kit
includes a populated, tested AD576.R printed circuit boardꢀ
The evaluation board interfaces to the USB interface of the PCꢀ
Software is available with the evaluation board, which allows
the user to easily program the AD576.Rꢀ The software runs on
any PC that has Microsoft® Windows® 2ꢂꢂꢂ/XP installedꢀ
1
ADDITIONAL PINS OMITTED FOR CLARITY
Figure 47. AD5762R to PIC16C6x/7x Interface
An application note is available that gives full details on
operating the evaluation boardꢀ
Rev. PrA | Page 32 of 33
Preliminary Technical Data
OUTLINE DIMENSIONS
AD5762R
1.20
MAX
0.75
0.60
0.45
9.00 BSC SQ
25
32
1
24
PIN 1
7.00
BSC SQ
TOP VIEW
(PINS DOWN)
0° MIN
1.05
1.00
0.95
0.20
0.09
7°
8
17
3.5°
0.15
0.05
9
16
0°
SEATING
PLANE
0.08 MAX
COPLANARITY
VIEW A
0.80
0.45
0.37
0.30
BSC
LEAD PITCH
VIEW A
ROTATED 90° CCW
COMPLIANT TO JEDEC STANDARDS MS-026ABA
Figure 48. 32-Lead Thin Plastic Dual Flat Package [TQFP]
(SU-32-2)
Dimensions shown in millimeters
ORDERING GUIDE1
Internal
Reference
Package
Option
Model
Function
INꢀ
1 LSB max
1 LSB max
Temperature
−40°C to +85°C
−40°C to +85°C
Package Description
32-lead TQFP
32-lead TQFP
AD5762RCSUZ
AD5762RCSUZ-REEL7
Dual 16-bit DAC
Dual 16-bit DAC
+5V
+5V
SU-32-2
SU-32-2
©2007 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
PR07248-0-12/07(PrA)
Rev. PrA | Page 33 of 33
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