AD684SQ [ADI]

Four-Channel Sample-and-Hold Amplifier; 四通道采样保持放大器
AD684SQ
型号: AD684SQ
厂家: ADI    ADI
描述:

Four-Channel Sample-and-Hold Amplifier
四通道采样保持放大器

采样保持电路 放大器 放大器电路 信息通信管理
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中文:  中文翻译
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Four-Channel  
Sample-and-Hold Amplifier  
a
AD684*  
FEATURES  
FUNCTIONAL BLOCK DIAGRAM  
Four Matched Sample-and-Hold Amplifiers  
Independent Inputs, Outputs and Control Pins  
500 ns Hold Mode Settling  
1 s Maximum Acquisition Time to 0.01%  
Low Droop Rate: 0.01 V/s  
Internal Hold Capacitors  
75 ps Maximum Aperture Jitter  
Low Power Dissipation: 430 mW  
0.3" Skinny DIP Package  
MIL-STD-883 Compliant Versions Available  
PRODUCT DESCRIPTION  
PRODUCT HIGHLIGHTS  
The AD684 is a monolithic quad sample-and-hold amplifier  
(SHA). It features four complete sampling channels, each  
controlled by an independent hold command. Each SHA is  
complete with an internal hold capacitor. The high accuracy  
SHA channels are self-contained and require no external  
components or adjustments. The AD684 is manufactured on a  
BiMOS process which provides a merger of high performance  
bipolar circuitry and low power CMOS logic.  
1. Fast acquisition time (1 µs) and low aperture jitter (75 ps)  
make the AD684 the best choice for multiple channel data  
acquisition systems.  
2. Monolithic construction insures excellent interchannel  
matching in terms of timing and accuracy, as well as high  
reliability.  
3. Independent inputs, outputs and sample-and-hold controls  
allow user flexibility in system architecture.  
The AD684 is ideal for high performance, multichannel data  
acquisition systems. Each SHA channel can acquire a signal in  
less than 1 µs and retain the held value with a droop rate of less  
than 0.01 µV/µs. Excellent linearity and ac performance make  
the AD684 an ideal front end for high speed 12- and 14-bit  
ADCs.  
4. Low droop (0.01 µV/µs) and internally compensated hold  
mode error results in superior system accuracy.  
5. The AD684’s fast settling time and low output impedance  
make it ideal for driving high speed analog to digital  
converters such as the AD578, AD674, AD7572 and the  
AD7672.  
The AD684 has a self-correcting architecture that minimizes  
hold mode errors and insures accuracy over temperature. Each  
channel of the AD684 is capable of sourcing 5 mA and  
incorporates output short circuit protection.  
6. The AD684 is available in versions compliant with MIL-  
STD-883. Refer to the Analog Devices Military Products  
Databook or current AD684/883B data sheet for detailed  
specifications.  
The AD684 is specified for three temperature ranges. The J  
grade device is specified for operation from 0 to +70°C, the A  
grade from –40°C to +85°C and the S grade from –55°C to  
+125°C.  
*Protected by U.S. Patent Number 4,962,325.  
REV. A  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, nor for any infringements of patents or other rights of third parties  
which may result from its use. No license is granted by implication or  
otherwise under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 617/329-4700  
Fax: 617/326-8703  
(TMIN to TMAX with VCC = +12 V ؎ 10%, VEE = –12 V ؎ 10%, unless otherwise noted)  
AD684–SPECIFICATIONS  
AD684J  
AD684A  
Typ  
AD684S  
Typ  
Parameter  
Min  
Typ  
Max  
Min  
Max  
Min  
Max  
Units  
SAMPLING CHARACTERISTICS  
Acquisition Time  
10 V Step to 0.01%  
10 V Step to 0.1%  
Small Signal Bandwidth  
Full Power Bandwidth  
0.75  
0.5  
4
1.0  
0.6  
0.75  
0.5  
4
1.0  
0.6  
0.75  
0.5  
4
1.0  
0.6  
µs  
µs  
MHz  
MHz  
1
1
1
HOLD CHARACTERISTICS  
Effective Aperture Delay  
Aperture Jitter  
–35  
–25  
50  
–15  
75  
–35  
–25  
50  
–15  
75  
–35  
–25  
50  
–15  
75  
ns  
ps  
Hold Settling Time (to 1 mV)  
250  
0.01  
500  
1
250  
0.01  
500  
1
250  
0.01  
500  
1
ns  
µV/µs  
Droop Ratel  
Feedthrough  
(VIN = ± 5 V, 100 kHz)  
–90  
–90  
–90  
dB  
ACCURACY CHARACTERISTICS1  
Hold Mode Offset  
Hold Mode Offset Drift  
Sample Mode Offset  
Nonlinearity  
–4  
–1  
10  
50  
+3  
–4  
1
10  
50  
±0.002  
±0.03  
+3  
–4  
–1  
10  
50  
+3  
mV  
µV/°C  
mV  
% FS  
% FS  
200  
200  
±0.003  
؎0.05  
200  
±0.002 ±0.003  
±0.03  
±0.003 ±0.005  
±0.03  
Gain Error  
؎0.05  
؎0.05  
INTERCHANNEL CHARACTERISTICS  
Interchannel Isolation  
(VIN = ±5 V, 100 kHz)  
Interchannel Aperture Offset  
Interchannel Offset  
80  
86  
150  
0.4  
80  
86  
150  
0.4  
80  
86  
150  
0.4  
dB  
ps  
mV  
300  
1.5  
300  
2.0  
300  
2.0  
OUTPUT CHARACTERISTICS  
Output Drive Current2  
Output Resistance, dc  
Total Output Noise  
(dc to 5 MHz)  
–5  
+5  
0.5  
–5  
+5  
0.5  
–5  
+5  
0.5  
mA  
0.3  
0.3  
0.3  
150  
85  
150  
85  
150  
85  
µV rms  
µV rms  
Sampled dc Uncertainty  
Hold Mode Noise  
(dc to 5 MHz)  
125  
125  
125  
µV rms  
Short Circuit Current3  
Source  
20  
10  
20  
10  
20  
10  
mA  
mA  
Sink  
INPUT CHARACTERISTICS  
Input Voltage Range  
Bias Current4  
–5  
+5  
250  
400  
–5  
+5  
250  
500  
–5  
+5  
250  
500  
V
100  
100  
100  
nA  
nA  
MΩ  
pF  
Input Impedance  
Input Capacitance  
50  
2
50  
2
50  
2
DIGITAL CHARACTERISTICS  
Input Voltage Low  
Input Voltage High  
0.8  
10  
0.8  
10  
0.8  
10  
V
V
µA  
2.0  
2.0  
2.0  
Input Current (VIN = 5 V)  
2
2
2
POWER SUPPLY CHARACTERISTICS  
Operating Voltage Range (VCC, VEE  
Supply Current  
)
±10.8  
±12  
18  
70  
65  
430  
±13.2  
25  
±10.8 ±12  
±13.2  
25  
±10.8  
±12  
18  
70  
65  
430  
±13.2  
26  
V
18  
70  
65  
mA  
dB  
dB  
mW  
+PSRR  
–PSRR  
Power Consumption  
65  
60  
65  
60  
65  
60  
600  
+70  
430  
600  
+85  
625  
TEMPERATURE RANGE  
Specified Performance  
0
–40  
–55  
+125  
°C  
PACKAGE OPTIONS  
16-Pin Cerdip (Q)  
AD684JQ  
AD684AQ  
AD684SQ  
NOTES  
1Specified and tested over an input range of ±5 V.  
2Maximum current the AD684 can source (or sink). Testing guarantees that the accuracy of the held signal remains within 2.5 mV of its initial value.  
3The output is protected for a short circuit to common, VCC and VEE  
4VCC and VEE at nominal voltage levels.  
.
Specifications shown in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and max  
specifications are guaranteed, although only those shown in boldface are tested on all production units.  
Specifications subject to change without notice.  
–2–  
REV. A  
AD684  
PIN CONFIGURATION  
ABSOLUTE MAXIMUM RATINGS*  
With  
Spec  
Respect to Min  
Max  
Unit  
VCC  
VEE  
Common  
Common  
Common  
Common  
–0.3  
–15  
–0.5  
–12  
+15  
+0.3  
+7  
V
V
V
V
Control Inputs  
Analog Inputs  
Output Short Circuit to  
Ground, VCC or VEE  
Max Junction  
Temperature  
Storage  
+12  
Indefinite  
+175 °C  
+150 °C  
–65  
Lead Temperature  
(10 sec max)  
Power Dissipation  
+300 °C  
640 mW  
*Stresses above those listed under “Absolute Maximum Ratings” may cause  
permanent damage to the device. This is a stress rating only and functional  
operation of the device at these or any other conditions above those indicated in the  
operational section of this specification is not implied.  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD684 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
ORDERING GUIDE  
Package  
Temperature Range  
Model1  
Option2  
AD684JQ  
AD684AQ  
AD684SQ  
0 to +70°C  
–40°C to +85°C  
–55°C to +125°C  
Q-16  
Q-16  
Q-16  
NOTES  
1For details on grade and package offerings screened in accordance  
with MIL-STD-883, refer to the Analog Devices Military Prod-  
ucts Databook or current AD684/883B data sheet.  
2Q = Cerdip.  
REV. A  
–3–  
AD684–Typical Characteristics  
Power Supply Rejection Ratio  
vs. Frequency  
Droop Rate vs. Temperature, VIN= 0 V  
Interchannel Isolation vs. Frequency  
Supply Current vs. Temperature  
Bias Current vs. Input Voltage  
Effective Aperture Delay vs. Frequency  
Supply Current vs. Supply Voltage  
Acquisition Time (to 0.01 %) vs. Input Step Size  
–4–  
REV. A  
AD684  
DEFINITIONS OF SPECIFICATIONS  
Tracking Mode Offset — The difference between the input  
and output signals when the SHA is in the track mode.  
Acquisition Time — The length of time that the SHA must  
remain in the sample mode in order to acquire a full-scale input  
step to a given level of accuracy.  
Nonlinearity — The deviation from a straight line on a plot of  
input vs. (held) output as referenced to a straight line drawn  
between endpoints, over an input range of –5 V and +5 V.  
Small Signal Bandwidth — The frequency at which the held  
output amplitude is 3 dB below the input amplitude, under an  
input condition of a 100 mV p-p sine wave.  
Gain Error — Deviation from a gain of +1 on the transfer  
function of input vs. held output.  
Full Power Bandwidth — The frequency at which the held  
output amplitude is 3 dB below the input amplitude, under an  
input condition of a 10 V p-p sine wave.  
Interchannel Isolation — The level of crosstalk between  
adjacent channels while in the sample (track) mode with a full  
scale 100 kHz input signal.  
Effective Aperture Delay — The difference between the  
switch delay and the analog delay of the SHA channel. A  
negative number indicates that the analog portion of the overall  
delay is greater than the switch portion. This effective delay  
represents the point in time, relative to the hold command, that  
the input signal will be sampled.  
Interchannel Aperture Offset — The variation in aperture  
time between the four channels for a simultaneous hold  
command.  
Differential Offset — The difference in hold mode offset  
between the four SHA channels.  
Power Supply Rejection Ratio — A measure of change in the  
held output voltage for a specified change in the positive or  
negative supply.  
Aperture Jitter — The variations in aperture delay for  
successive samples. Aperture jitter puts an upper limit on the  
maximum frequency that can be accurately sampled.  
Sampled dc Uncertainty — The internal rms SHA noise that  
is sampled onto the hold capacitor.  
Hold Settling Time —The time required for the output to  
settle to within a specified level of accuracy of its final held  
value after the hold command has been given.  
Hold Mode Noise — The rms noise at the output of the SHA  
while in the hold mode, specified over a given bandwidth.  
Droop Rate — The drift in output voltage while in the hold  
mode.  
Total Output Noise — The total rms noise that is seen at the  
output of the SHA while in the hold mode. It is the rms  
summation of the sampled dc uncertainty and the hold mode  
noise.  
Feedthrough — The attenuated version of a changing input  
signal that appears at the output when the SHA is in the hold  
mode.  
Output Drive Current — The maximum current the SHA can  
source (or sink) while maintaining a change in hold mode offset  
of less than 2.5 mV.  
Hold Mode Offset — The difference between the input signal  
and the held output. This offset term applies only in the hold  
mode and includes the error caused by charge injection and all  
other internal offsets. It is specified for an input of 0 V.  
FUNCTIONAL DESCRIPTION  
The AD684 is a complete quad sample-and-hold amplifier that  
provides high speed sampling to 12-bit accuracy in less than 1µs.  
The AD684 is completely self-contained, including on-chip  
hold capacitors, and requires no external components or  
adjustments to perform the sampling function. Each SHA  
channel can operate independently, having its own input, output  
and sample/hold command. Both inputs and outputs are treated  
as single ended signals, referred to common.  
The AD684 utilizes a proprietary circuit design which includes a  
self-correcting architecture. This sample-and-hold circuit  
corrects for internal errors after the hold command has been  
given, by compensating for amplifier gain and offset errors, and  
charge injection errors. Due to the nature of the design, the  
SHA output in the sample mode is not intended to provide an  
accurate representation of the input. However, in hold mode,  
the internal circuitry is reconfigured to produce an accurately  
held version of the input signal. To the right is a block diagram  
of the AD684.  
Functional Block Diagram  
REV. A  
–5–  
AD684  
DYNAMIC PERFORMANCE  
The AD684 is compatible with 12-bit A-to-D converters in  
terms of both accuracy and speed. The fast acquisition time, fast  
hold settling time and good output drive capability allow the  
AD684 to be used with high speed, high resolution A-to-D  
converters like the AD674 and AD7672. The AD684’s fast  
acquisition time provides high throughput rates for multichannel  
Odata Pacqu4isit8ion4systems. Typically, the sample and hold can  
acquire a 10 V step in less than 750 ns. Figure 1 shows the  
settling accuracy as a function of acquisition time.  
Figure 3. Hold Mode Offset, Gain Error and Nonlinearity  
For applications where it is important to obtain zero offset, the  
hold mode offset may be nulled externally at the input to the  
A-to-D converter. Adjustment of the offset may be accom-  
plished through the A-to-D itself or by an external amplifier  
with offset nulling capability (e.g., AD711). Only a single  
adjustment of the offset is necessary for the four SHA channels as a  
result of the excellent matching among them. The offset will  
change less than 0.5 mV over the specified temperature range.  
Figure 1. VOUT Settling vs. Acquisition Time  
The hold settling determines the required time, after the hold  
command is given, for the output to settle to its final specified  
accuracy. The typical settling behavior of the AD684 is shown  
in Figure 2. The settling time of the AD684 is sufficiently fast to  
allow the SHA, in most cases, to directly drive an A-to-D  
converter without the need for an added “start convert” delay.  
SUPPLY DECOUPLING AND GROUNDING  
CONSIDERATIONS  
As with any high speed, high resolution data acquisition system,  
the power supplies should be well regulated and free from  
excessive high frequency noise (ripple). The supply connection  
to the AD684 should also be capable of delivering transient  
currents to the device. To achieve the specified accuracy and  
dynamic performance, decoupling capacitors must be placed  
directly at both the positive and negative supply pins to common.  
Ceramic type 0.1 µF capacitors should be connected from VCC  
and VEE to common.  
Figure 2. Typical AD684 Hold Mode  
HOLD MODE OFFSET  
The dc accuracy of the AD684 is determined primarily by the  
hold mode offset. The hold mode offset refers to the difference  
between the final held output voltage and the input signal at the  
time the hold command is given. The hold mode offset arises from  
a voltage error introduced onto the hold capacitor by charge injec-  
tion of the internal switches. The nominal hold mode offset is  
specified for a 0 V input condition. Over the input range of  
–5 V to +5 V, the AD684 is also characterized for an effective gain  
error and nonlinearity of the held value, as shown in Figure 3.  
As indicated by the AD684 specifications, the hold mode offset is  
very well matched between channels and stable overtemperature.  
Figure 4. Basic Grounding and Decoupling Diagram  
–6–  
REV. A  
AD684  
The AD684 does not provide separate analog and digital ground  
leads as is the case with most A-to-D converters. The common  
pin is the single ground terminal for the device. It is the refer-  
ence point for the sampled input voltage and the held output  
voltage and also the digital ground return path. The common  
pin should be connected to the reference (analog) ground of the  
A-to-D converter with a separate ground lead. Since the analog  
and digital grounds in the 684 are connected internally, the  
common pin should also be connected to the digital ground,  
which is usually tied to analog common at the A-to-D converter.  
Figure 4 illustrates the recommended decoupling and grounding  
practice.  
A graph showing the magnitude of the jitter induced error vs.  
frequency of the input signal is given in Figure 6.  
The accuracy in sampling high frequency signals is also con-  
strained by the distortion and noise created by the sample-and-  
hold. The level of distortion increases with frequency and  
reduces the “effective number of bits” of the conversion.  
Measurements of Figures 7 and 8 were made using a 14-bit  
A-to-D converter with VIN = 10 V p-p and a sample frequency  
of 100 kSPS.  
NOISE CHARACTERISTICS  
Designers of data conversion circuits must also consider the  
effect of noise sources on the accuracy for the data acquisition  
system. A sample-and-hold amplifier that precedes the A-to-D  
converter introduces some noise and represents another source  
of uncertainty in the conversion process. The noise from the  
AD684 is specified as the total output noise, which includes  
both the sampled wideband noise of the SHA in addition to the  
band limited output noise. The total output noise is the rms  
sum of the sampled dc uncertainty and the hold mode noise. A  
plot of the total output noise vs. the equivalent input bandwidth  
of the converter being used is given in Figure 5.  
Figure 6. Error Magnitude vs. Frequency  
Figure 7. Total Harmonic Distortion vs. Frequency  
Figure 8. Signal/(Noise and Distortion) vs. Frequency  
Figure 5. RMS Noise vs. Input Bandwidth of ADC  
DRIVING THE ANALOG INPUTS  
For best performance, it is important to drive the AD684 analog  
inputs from a low impedance signal source. This enhances the  
sampling accuracy by minimizing the analog and digital  
crosstalk. Signals which come from higher impedance sources  
(e.g., over 5k ohms) will have a relatively higher level of  
crosstalk. For applications where signals have high source  
impedance, an operational amplifier buffer in front of the  
AD684 is required. The AD713 (precision quad BiFET op  
amp) is recommended for these applications.  
HIGH FREQUENCY SAMPLING  
Aperture jitter and distortion are the primary factors which limit  
frequency domain performance of a sample-and-hold amplifier.  
Aperture jitter modulates the phase of the hold command and  
produces an effective noise on the sampled analog input. The  
magnitude of the jitter induced noise is directly related to the  
frequency of the input signal.  
REV. A  
–7–  
AD684  
DATA ACQUISITION APPLICATIONS  
outputs is selected by the ADG201, quad CMOS switch, and  
buffered by the AD711. The AD588 provides the reference  
voltage with switches A-B and C-D selecting a –5 V to +5 V or  
0 to +5 V input range.  
Figure 9 shows a typical data acquisition circuit using the  
AD684 and the high speed 12-bit A-to-D converter, the  
AD7672. Four input signals are simultaneously sampled by the  
AD684 as the HOLD command is given. One of the four held  
Figure 9. Data Acquisition System Using the AD684 and the AD7672  
OUTLINE DIMENSIONS  
Dimensions shown in inches and (mm).  
Q-16  
16-Lead Cerdip  
–8–  
REV. A  

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