AD7528SQ [ADI]
CMOS Dual 8-Bit Buffered Multiplying DAC; CMOS双8位缓冲乘法DAC型号: | AD7528SQ |
厂家: | ADI |
描述: | CMOS Dual 8-Bit Buffered Multiplying DAC |
文件: | 总8页 (文件大小:191K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
CMOS Dual 8-Bit
a
Buffered Multiplying DAC
AD7528
FEATURES
FUNCTIONAL BLOCK DIAGRAM
On-Chip Latches for Both DACs
+5 V to +15 V Operation
V
A
REF
DACs Matched to 1%
R
A
V
FB
DD
Four Quadrant Multiplication
TTL/CMOS Compatible
Latch Free (Protection Schottkys not Required)
DB0
OUT A
DATA
INPUTS
INPUT
BUFFER
LATCH
DAC A
DB7
AGND
APPLICATIONS
AD7528
Digital Control of:
Gain/Attenuation
Filter Parameters
Stereo Audio Circuits
X-Y Graphics
DAC A/
DAC B
R
B
FB
CONTROL
LOGIC
CS
OUT B
WR
LATCH
DAC B
DGND
V
B
REF
GENERAL DESCRIPTION
ORDERING GUIDE1
The AD7528 is a monolithic dual 8-bit digital/analog converter
featuring excellent DAC-to-DAC matching. It is available in
skinny 0.3" wide 20-lead DIPs and in 20-lead surface mount
packages.
Temperature
Ranges
Relative Gain
Accuracy Error
Package
Options3
Model2
AD7528JN –40°C to +85°C
AD7528KN –40°C to +85°C
AD7528LN –40°C to +85°C
±1 LSB
±4 LSB N-20
±1/2 LSB ±2 LSB N-20
±1/2 LSB ±1 LSB N-20
Separate on-chip latches are provided for each DAC to allow
easy microprocessor interface.
AD7528JP
–40°C to +85°C
±1 LSB
±4 LSB P-20A
Data is transferred into either of the two DAC data latches via a
common 8-bit TTL/CMOS compatible input port. Control
input DAC A/DAC B determines which DAC is to be loaded.
The AD7528’s load cycle is similar to the write cycle of a ran-
dom access memory and the device is bus compatible with most
8-bit microprocessors, including 6800, 8080, 8085, Z80.
AD7528KP –40°C to +85°C
AD7528LP –40°C to +85°C
±1/2 LSB ±2 LSB P-20A
±1/2 LSB ±1 LSB P-20A
AD7528JR
–40°C to +85°C
±1 LSB
±4 LSB R-20
AD7528KR –40°C to +85°C
AD7528LR –40°C to +85°C
AD7528AQ –40°C to +85°C
AD7528BQ –40°C to +85°C
AD7528CQ –40°C to +85°C
AD7528SQ –55°C to +125°C ±1 LSB
AD7528TQ –55°C to +125°C ±1/2 LSB ±2 LSB Q-20
AD7528UQ –55°C to +125°C ±1/2 LSB ±1 LSB Q-20
±1/2 LSB ±2 LSB R-20
±1/2 LSB ±1 LSB R-20
±1 LSB
±4 LSB Q-20
±1/2 LSB ±2 LSB Q-20
±1/2 LSB ±1 LSB Q-20
The device operates from a +5 V to +15 V power supply, dis-
sipating only 20 mW of power.
±4 LSB Q-20
Both DACs offer excellent four quadrant multiplication charac-
teristics with a separate reference input and feedback resistor for
each DAC.
NOTES
1Analog Devices reserves the right to ship side-brazed ceramic in lieu of cerdip. Parts
will be marked with cerdip designator “Q.”
2Processing to MIL-STD-883C, Class B is available. To order, add suffix “/883B” to
part number. For further information, see Analog Devices’ 1990 Military Products
Databook.
PRODUCT HIGHLIGHTS
1. DAC-to-DAC matching: since both of the AD7528 DACs are
fabricated at the same time on the same chip, precise match-
ing and tracking between DAC A and DAC B is inherent.
The AD7528’s matched CMOS DACs make a whole new
range of applications circuits possible, particularly in the
audio, graphics and process control areas.
3N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip; R = SOIC.
2. Small package size: combining the inputs to the on-chip DAC
latches into a common data bus and adding a DAC A/DAC B
select line has allowed the AD7528 to be packaged in either a
small 20-lead DIP, SOIC or PLCC.
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
Fax: 781/326-8703
World Wide Web Site: http://www.analog.com
© Analog Devices, Inc., 1998
(VREF A = VREF B = +10 V; OUT A = OUT B = O V unless otherwise noted)
AD7528–SPECIFICATIONS
VDD = +5 V
Version1 TA = +25°C TMIN, TMAX
VDD = +15 V
Parameter
TA= +25°C TMIN, TMAX
Units
Test Conditions/Comments
STATIC PERFORMANCE2
Resolution
Relative Accuracy
All
8
±1
±1/2
±1/2
±1
8
±1
±1/2
±1/2
±1
8
±1
±1/2
±1/2
±1
8
±1
±1/2
±1/2
±1
Bits
J, A, S
K, B, T
L, C, U
All
LSB max
LSB max
LSB max
LSB max
This is an Endpoint Linearity Specification
Differential Nonlinearity
Gain Error
All Grades Guaranteed Monotonic Over
Full Operating Temperature Range
Measured Using Internal RFB A and RFB B
Both DAC Latches Loaded with 11111111
Gain Error is Adjustable Using Circuits
of Figures 4 and 5
J, A, S
K, B, T
L, C, U
±4
±2
±1
±6
±4
±3
±4
±2
±1
±5
±3
±1
LSB max
LSB max
LSB max
Gain Temperature Coefficient3
∆Gain/∆Temperature
All
±0.007
±0.007
±0.0035
±0.0035
%/°C max
Output Leakage Current
OUT A (Pin 2)
OUT B (Pin 20)
All
All
All
±50
±50
8
±400
±400
8
±50
±50
8
±200
±200
8
nA max
nA max
kΩ min
kΩ max
DAC Latches Loaded with 00000000
Input Resistance (VREF A, VREF B)
Input Resistance TC = –300 ppm/°C, Typical
Input Resistance is 11 kΩ
15
15
15
15
VREF A/VREF B Input Resistance
Match
All
±1
±1
±1
±1
% max
DIGITAL INPUTS4
Input High Voltage
VIH
Input Low Voltage
VIL
All
All
All
2.4
0.8
±1
2.4
0.8
±10
13.5
1.5
±1
13.5
1.5
V min
V max
µA max
Input Current
IIN
±10
VIN = 0 or VDD
Input Capacitance
DB0–DB7
WR, CS, DAC A/DAC B
All
All
10
15
10
15
10
15
10
15
pF max
pF max
SWITCHING CHARACTERISTICS3
See Timing Diagram
Chip Select to Write Set Up Time
tCS
Chip Select to Write Hold Time
tCH
DAC Select to Write Set Up Time
tAS
DAC Select to Write Hold Time
tAH
Data Valid to Write Set Up Time
tDS
Data Valid to Write Hold Time
tDH
Write Pulsewidth
tWR
All
All
All
All
All
All
All
90
0
100
0
60
10
60
10
30
0
80
15
80
15
40
0
ns min
ns min
ns min
ns min
ns min
ns min
ns min
90
0
100
0
80
0
90
0
90
100
60
80
POWER SUPPLY
IDD
See Figure 3
All Digital Inputs VIL or VIH
All Digital Inputs 0 V or VDD
All
All
2
100
2
500
2
100
2
500
mA max
µA max
(Measured Using Recommended P.C. Board Layout (Figure 7) and AD644 as
Output Amplifiers)
AC PERFORMANCE CHARACTERISTICS5
VDD = +5 V
VDD = +15 V
Parameter
Version1 TA = +25°C TMIN, TMAX TA= +25°C TMIN, TMAX Units
Test Conditions/Comments
% per % max ∆VDD = ±5%
DC SUPPLY REJECTION (∆GAIN/∆VDD
CURRENT SETTLING TIME2
)
All
All
0.02
350
0.04
400
0.01
180
0.02
200
ns max
To 1/2 LSB. OUT A/OUT B Load = 100 Ω.
WR = CS = 0 V. DB0–DB7 = 0 V to VDD or
VDD to 0 V
PROPAGATION DELAY (From Digital In-
put to 90% of Final Analog Output Current) All
VREF A = VREF B = +10 V
220
160
270
80
100
ns max
OUT A, OUT B Load = 100 Ω CEXT = 13 pF
WR = CS = 0 V DB0–DB7 = 0 V to VDD or
VDD to 0 V
DIGITAL-TO-ANALOG GLITCH IMPULSE All
OUTPUT CAPACITANCE
440
nV sec typ
For Code Transition 00000000 to 11111111
COUT
COUT
COUT
COUT
A
B
A
B
All
50
50
120
120
50
50
120
120
50
50
120
120
50
50
120
120
pF max
pF max
pF max
pF max
DAC Latches Loaded with 00000000
DAC Latches Loaded with 11111111
AC FEEDTHROUGH6
VREF A to OUT A
VREF B to OUT B
All
–70
–70
–65
–65
–70
–70
–65
–65
dB max
dB max
VREF A, VREF B = 20 V p-p Sine Wave
@ 100 kHz
–2–
REV. B
AD7528
VDD = +5 V
VDD = +15 V
Parameter
Version1 TA = +25°C TMIN, TMAX TA= +25°C TMIN, TMAX Units
Test Conditions/Comments
CHANNEL-TO-CHANNEL ISOLATION
VREF A to OUT B
Both DAC Latches Loaded with 11111111.
VREF A = 20 V p-p Sine Wave @ 100 kHz
VREF B = 0 V see Figure 6.
VREF A = 20 V p-p Sine Wave @ 100 kHz
VREF A = 0 V see Figure 6.
All
–77
–77
–77
–77
dB typ
dB typ
VREF B to OUT A
DIGITAL CROSSTALK
All
All
30
60
nV sec typ
dB typ
Measured for Code Transition 00000000 to
11111111
HARMONIC DISTORTlON
NOTES
–85
–85
VIN = 6 V rms @ 1 kHz
1Temperature Ranges are J, K, L Versions: –40°C to +85°C
A, B, C Versions: –40°C to +85°C
AD7528, ideal maximum output is VREF – 1 LSB. Gain error of
both DACs is adjustable to zero with external resistance.
S, T, U Versions: –55°C to +125°C
2Specifications applies to both DACs in AD7528.
3Guaranteed by design but not production tested.
Output Capacitance
Capacitance from OUT A or OUT B to AGND.
4Logic inputs are MOS Gates. Typical input current (+25°C) is less than 1 nA.
5These characteristics are for design guidance only and are not subject to test.
6Feedthrough can be further reduced by connecting the metal lid on the ceramic package
(suffix D) to DGND.
Digital to Analog Glitch lmpulse
The amount of charge injected from the digital inputs to the
analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA-secs or nV-secs
depending upon whether the glitch is measured as a current or
voltage signal. Glitch impulse is measured with VREF A,
VREF B = AGND.
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS
(TA = +25°C unless otherwise noted)
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . VDD + 0.3 V
DGND to AGND . . . . . . . . . . . . . . . . . . . . . . . . VDD + 0.3 V
Digital Input Voltage to DGND . . . . . . . –0.3 V, VDD + 0.3 V
VPIN2, VPIN20 to AGND . . . . . . . . . . . . . . –0.3 V, VDD + 0.3 V
VREF A, VREF B to AGND . . . . . . . . . . . . . . . . . . . . . . . ±25 V
VRFB A, VRFB B to AGND . . . . . . . . . . . . . . . . . . . . . . . ±25 V
Power Dissipation (Any Package) to +75°C . . . . . . . 450 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature Range
Propagation Delay
This is a measure of the internal delays of the circuit and is
defined as the time from a digital input change to the analog
output current reaching 90% of its final value.
Channel-to-Channel Isolation
The proportion of input signal from one DAC’s reference input
which appears at the output of the other DAC, expressed as a
ratio in dB.
Commercial (J, K, L) Grades . . . . . . . . . . . –40°C to +85°C
Industrial (A, B, C) Grades . . . . . . . . . . . . –40°C to +85°C
Extended (S, T, U) Grades . . . . . . . . . . . –55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . .+300°C
Digital Crosstalk
The glitch energy transferred to the output of one converter due
to a change in digital input code to the other converter. Speci-
fied in nV secs.
PIN CONFIGURATIONS
PLCC
CAUTION:
1. ESD sensitive device. The digital control inputs are diode
protected; however, permanent damage may occur on uncon-
nected devices subjected to high energy electrostatic fields.
Unused devices must be stored in conductive foam or shunts.
3
2
1
20 19
2. Do not insert this device into powered sockets. Remove
power before insertion or removal.
PIN 1
IDENTIFIER
4
5
6
7
8
18
17
16
15
14
V
A
V
B
REF
REF
DGND
V
DD
AD7528
TOP VIEW
(Not to Scale)
DAC A/DAC B
(MSB) DB7
DB6
WR
CS
TERMINOLOGY
Relative Accuracy
DB0 (LSB)
Relative accuracy or endpoint nonlinearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero and full scale and is normally expressed in
LSBs or as a percentage of full scale reading.
9
10 11 12 13
DIP, SOIC
1
2
20
19
18
17
16
15
14
13
12
11
OUT B
AGND
OUT A
R
B
FB
Differential Nonlinearity
3
R
A
A
V
V
B
FB
REF
DD
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB max over
the operating temperature range ensures monotonicity.
4
V
REF
5
DGND
WR
CS
AD7528
TOP VIEW
(Not to Scale)
6
DAC A/DAC B
(MSB) DB7
DB6
7
DB0 (LSB)
DB1
Gain Error
8
Gain error or full-scale error is a measure of the output error
between an ideal DAC and the actual device output. For the
9
DB2
DB5
10
DB4
DB3
REV. B
–3–
AD7528
INTERFACE LOGIC INFORMATION
DAC Selection:
Both DAC latches share a common 8-bit input port. The con-
trol input DAC A/DAC B selects which DAC can accept data
from the input port.
Figure 1. An inverted R-2R ladder structure is used, that is, bi-
nary weighted currents are switched between the DAC output
and AGND thus maintaining fixed currents in each ladder leg
independent of switch state.
EQUIVALENT CIRCUIT ANALYSIS
Mode Selection:
Inputs CS and WR control the operating mode of the selected
DAC. See Mode Selection Table below.
Figure 2 shows an approximate equivalent circuit for one of the
AD7528’s D/A converters, in this case DAC A. A similar
equivalent circuit can be drawn for DAC B. Note that AGND
(Pin 1) is common for both DAC A and DAC B.
Write Mode:
When CS and WR are both low the selected DAC is in the write
mode. The input data latches of the selected DAC are transpar-
ent and its analog output responds to activity on DB0–DB7.
The current source ILEAKAGE is composed of surface and junc-
tion leakages and, as with most semiconductor devices, approxi-
mately doubles every 10°C. The resistor RO as shown in Figure
2 is the equivalent output resistance of the device which varies
with input code (excluding all 0s code) from 0.8 R to 2 R. R is
typically 11 kΩ. COUT is the capacitance due to the N-channel
switches and varies from about 50 pF to 120 pF depending
upon the digital input. g(VREF A, N) is the Thevenin equivalent
voltage generator due to the reference input voltage VREF A and
the transfer function of the R-2R ladder.
Hold Mode:
The selected DAC latch retains the data which was present on
DB0–DB7 just prior to CS or WR assuming a high state. Both
analog outputs remain at the values corresponding to the data in
their respective latches.
Mode Selection Table
DAC A/DAC B
CS
WR
DAC A
DAC B
L
H
X
L
L
H
L
L
X
WRITE
HOLD
HOLD
HOLD
WRITE
HOLD
R
R
A
R
O
FB
OUT A
g(V
A, N)
C
OUT
I
REF
X
X
H
HOLD
HOLD
LKG
AGND
L = Low State; H = High State; X = Don’t Care.
Figure 2. Equivalent Analog Output Circuit of DAC A
WRITE CYCLE TIMING DIAGRAM
CIRCUIT INFORMATION–DIGITAL SECTION
tCH
tCS
V
The input buffers are simple CMOS inverters designed such
that when the AD7528 is operated with VDD = 5 V, the buffer
converts TTL input levels (2.4 V and 0.8 V) into CMOS logic
levels. When VIN is in the region of 2.0 volts to 3.5 volts the
input buffers operate in their linear region and pass a quiescent
current, see Figure 3. To minimize power supply currents it is
recommended that the digital input voltages be as close to the
supply rails (VDD and DGND) as is practically possible.
DD
CHIP SELECT
0
tAH
V
tAS
DD
DAC A/DAC B
0
tWR
V
DD
WRITE
0
tDS
tDH
V
0
DD
V
V
DATA IN
(DB0 – DB7)
IH
DATA IN STABLE
The AD7528 may be operated with any supply voltage in the
range 5 ≤ VDD ≤ 15 volts. With VDD = +15 V the input logic
levels are CMOS compatible only, i.e., 1.5 V and 13.5 V.
IL
NOTES:
1. ALL INPUT SIGNAL RISE AND FALL TIMES MEASURED
FROM 10% TO 90% OF V
.
DD
V
V
= +5V, t = t = 20ns;
= +15V, t = t = 40ns;
DD
DD
r f
r
f
V
+ V
2
9
IH
IL
2. TIMING MEASUREMENT REFERENCE LEVEL IS
V
= +15V
800
700
600
500
400
300
200
100
8
7
6
5
4
3
2
1
T
= +25؇C
DD
A
ALL DIGITAL INPUTS
TIED TOGETHER
CIRCUIT INFORMATION—D/A SECTION
The AD7528 contains two identical 8-bit multiplying D/A con-
verters, DAC A and DAC B. Each DAC consists of a highly
stable thin film R-2R ladder and eight N-channel current steer-
ing switches. A simplified D/A circuit for DAC A is shown in
V
= +5V
DD
R
R
R
V
A
REF
2R
S1
2R
S2
2R
S3
2R
S8
2R
0
1
2
3
4
5
6
V
7
8
9
10 11 12 13 14
R
R
A
– Volts
FB
IN
OUT A
AGND
Figure 3. Typical Plots of Supply Current, IDD vs. Logic
Input Voltage VIN, for VDD = +5 V and +15 V
DAC A DATA LATCHES
AND DRIVERS
Figure 1. Simplified Functional Circuit for DAC A
–4–
REV. B
AD7528
V
A
IN
(± 10V)
Table I. Unipolar Binary Code Table
1
R1
DAC Latch Contents Analog Output
1
R2
MSB
LSB
(DAC A or DAC B)
V
DD
2
R
A
C1
FB
255
–VIN
DB0
1 1 1 1 1 1 1 1
1 0 0 0 0 0 0 1
1 0 0 0 0 0 0 0
0 1 1 1 1 1 1 1
0 0 0 0 0 0 0 1
0 0 0 0 0 0 0 0
INPUT
BUFFER
DATA
INPUTS
256
V
A
DAC A
OUTA
AGND
LATCH
OUT
DB7
129
–VIN
AGND
256
AD7528
1
VIN
2
128
256
R4
DAC A/
–VIN
–VIN
–VIN
–VIN
= −
DAC B
2
CONTROL
LOGIC
R
B
C2
FB
CS
127
256
WR
OUT B
LATCH
DAC B
R3
V
B
OUT
DGND
1
256
AGND
1
0
256
= 0
V
B
IN
(± 10V)
NOTES:
1
R1, R2 AND R3, R4 USED ONLY IF GAIN ADJUSTMENT IS REQUIRED.
SEE TABLE III FOR RECOMMENDED VALUES.
C1, C2 PHASE COMPENSATION (10pF–15pF) IS REQUIRED WHEN
USING HIGH SPEED AMPLIFIERS TO PREVENT RINGING OR OSCILLATION.
1
256
2−8
V
(
)
=
V
(
Note: 1 LSB =
)
)
(
IN
IN
2
Figure 4. Dual DAC Unipolar Binary Operation
(2 Quadrant Multiplication); See Table I
V
A
IN
Table II. Bipolar (Offset Binary) Code Table
DAC Latch Contents Analog Output
(± 10V)
R5
20k⍀
2
R6
1
R1
20k⍀
MSB
LSB
(DAC A or DAC B)
2
R7
V
A
A2
OUT
1
R2
10k⍀
127
+VIN
1 1 1 1 1 1 1 1
1 0 0 0 0 0 0 1
1 0 0 0 0 0 0 0
0 1 1 1 1 1 1 1
0 0 0 0 0 0 0 1
0 0 0 0 0 0 0 0
V
3
DD
128
C1
R
A
R11
5k⍀
FB
DB0
INPUT
BUFFER
DATA
INPUTS
A1
AGND
DAC A
OUTA
AGND
LATCH
DB7
0
AGND
AD7528
1
R4
B
DAC A/
1
–VIN
DAC B
3
CONTROL
LOGIC
R
C2
FB
CS
128
WR
R8
20k⍀
LATCH
DAC B
R3
OUT B
AGND
A3
127
–VIN
2
R9
DGND
128
10k⍀
128
–VIN
2
A4
V
B
R10
OUT
1
128
20k⍀
R12
1
128
2−7
V
(
)
=
V
(
5k⍀
V
B
Note: 1 LSB =
)
)
(
IN
IN
IN
AGND
(± 10V)
NOTES:
1
R1, R2 AND R3, R4 USED ONLY IF GAIN ADJUSTMENT IS REQUIRED.
SEE TABLE III FOR RECOMMENDED VALUES.
ADJUST R1 FOR V
ADJUST R3 FOR V
MATCHING AND TRACKING IS ESSENTIAL FOR RESISTOR PAIRS
R6, R7 AND R9, R10.
C1, C2 PHASE COMPENSATION (10pF–15pF) MAY BE REQUIRED
IF A1/A3 IS A HIGH SPEED AMPLIFIER.
A = 0V WITH CODE 10000000 IN DAC A LATCH.
B = 0V WITH CODE 10000000 IN DAC B LATCH.
OUT
OUT
2
3
Table III. Recommended Trim Resistor
Values vs. Grade
Trim
Resistor
Figure 5. Dual DAC Bipolar Operation
(4 Quadrant Multiplication); See Table II
J/A/S
K/B/T
L/C/U
R1; R3
R2; R4
1 k
330
500
150
200
82
REV. B
–5–
AD7528
APPLICATIONS INFORMATION
Application Hints
To ensure system performance consistent with AD7528 specifi-
cations, careful attention must be given to the following points:
ship between input frequency and channel to channel isolation.
Figure 7 shows a printed circuit layout for the AD7528 and the
AD644 dual op amp which minimizes feedthrough and crosstalk.
SINGLE SUPPLY APPLICATIONS
1. GENERAL GROUND MANAGEMENT: AC or transient
voltages between the AD7528 AGND and DGND can cause
noise injection into the analog output. The simplest method
of ensuring that voltages at AGND and DGND are equal is
to tie AGND and DGND together at the AD7528. In more
complex systems where the AGND–DGND intertie is on the
backplane, it is recommended that diodes be connected in
inverse parallel between the AD7528 AGND and DGND
pins (1N914 or equivalent).
2. OUTPUT AMPLIFIER OFFSET: CMOS DACs exhibit a
code-dependent output resistance which in turn causes a
code-dependent amplifier noise gain. The effect is a code-
dependent differential nonlinearity term at the amplifier
output which depends on VOS (VOS is amplifier input offset
voltage). This differential nonlinearity term adds to the R/2R
differential nonlinearity. To maintain monotonic operation, it
is recommended that amplifier VOS be no greater than 10% of
1 LSB over the temperature range of interest.
The AD7528 DAC R-2R ladder termination resistors are con-
nected to AGND within the device. This arrangement is par-
ticularly convenient for single supply operation because AGND
may be biased at any voltage between DGND and VDD. Figure
8 shows a circuit which provides two +5 V to +8 V analog out-
puts by biasing AGND +5 V up from DGND. The two DAC
reference inputs are tied together and a reference input voltage
is obtained without a buffer amplifier by making use of the
constant and matched impedances of the DAC A and DAC B
reference inputs. Current flows through the two DAC R-2R
ladders into R1 and R1 is adjusted until the VREF A and VREF
B
inputs are at +2 V. The two analog output voltages range from
+5 V to +8 V for DAC codes 00000000 to 11111111.
V
= +15V
DD
DAC A
V
A = +5V TO +8V
B = +5V TO +8V
OUT
DB0
DB7
DATA
INPUTS
SUGGESTED
OP AMP:
AD644
CS
3. HIGH FREQUENCY CONSIDERATIONS: The output
capacitance of a CMOS DAC works in conjunction with the
amplifier feedback resistance to add a pole to the open loop
response. This can cause ringing or oscillation. Stability can
be restored by adding a phase compensation capacitor in
parallel with the feedback resistor.
AD7528
DAC B
WR
DAC A/DAC B
V
OUT
2 VOLTS
R1
10k⍀
AD584J
V
R2
1k⍀
DD
GND
DYNAMIC PERFORMANCE
The dynamic performance of the two DACs in the AD7528 will
depend upon the gain and phase characteristics of the output
amplifiers together with the optimum choice of the PC board
layout and decoupling components. Figure 6 shows the relation
Figure 8. AD7528 Single Supply Operation
Figure 9 shows DAC A of the AD7528 connected in a positive
reference, voltage switching mode. This configuration is useful
in that VOUT is the same polarity as VIN allowing single supply
operation. However, to retain specified linearity, VIN must be in
the range 0 V to +2.5 V and the output buffered or loaded with
a high impedance, see Figure 10. Note that the input voltage is
connected to the DAC OUT A and the output voltage is taken
from the DAC VREF A pin.
–100
T
= +25؇C
A
V
V
= +15V
–90
–80
–70
–60
–50
DD
= 20V PEAK TO PEAK
IN
V
OUT
V
(0V TO +2.5V)
IN
V
A
REF
V
DD
DAC A
OUT A
+15V
AD7528
20k
50k
100k
200k
500k
1M
INPUT FREQUENCY – Hz
Figure 9. AD7528 in Single Supply, Voltage Switching Mode
Figure 6. Channel-to-Channel Isolation
3
PIN 8 OF TO-5 CAN (AD644)
AD644
V+
T
= +25؇C
A
V
= +15V
DD
2
1
V–
NONLINEARITY
AGND
AD7528 PIN 1
C1 LOCATION
V
*NOTE
INPUT SCREENS
TO REDUCE
FEEDTHROUGH.
LAYOUT SHOWS
COPPER SIDE
C2 LOCATION
A*
B*
REF
V
DIFFERENTIAL
NONLINEARITY
V
DD
REF
WR
CS
DGND
DAC A/DAC B
MSB
AD7528
(i.e., BOTTOM VIEW).
LSB
2.5
3
3.5
4
4.5
V
5
5.5
6
6.5
7
7.5
A – Volts
IN
Figure 7. Suggested PC Board Layout for AD7528 with
AD644 Dual Op Amp
Figure 10. Typical AD7528 Performance in Single Supply
Voltage Switching Mode (K/B/T, L/C/U Grades)
–6–
REV. B
AD7528
MICROPROCESSOR INTERFACE
ADDRESS BUS
A8–A15
A**
ADDRESS BUS
A0–A15
DAC A/DAC B
ADDRESS
DECODE
LOGIC
CPU
8085
CS
A**
DAC A
DAC A/DAC B
ADDRESS
DECODE
LOGIC
A + 1**
V
MA
WR
WR
DB0
DB7
AD7528*
CS
DAC A
CPU
6800
LATCH
8212
A + 1**
DAC B
ALE
AD7528*
WR
2
DB0
DB7
DAC B
ADDR/DATA BUS
AD0–AD7
*ANALOG CIRCUITRY HAS BEEN OMITTED FOR CLARITY
**A = DECODED 7528 ADDR DAC A
A + 1 = DECODED 7528 ADDR DAC B
D0–D7
DATA BUS
*ANALOG CIRCUITRY HAS BEEN OMITTED FOR CLARITY
**A = DECODED 7528 ADDR DAC A
A + 1 = DECODED 7528 ADDR DAC B
NOTE:
8085 INSTRUCTION SHLD (STORE H & L DIRECT) CAN UPDATE
BOTH DACs WITH DATA FROM H AND L REGISTERS
Figure 11. AD7528 Dual DAC to 6800 CPU Interface
Figure 12. AD7528 Dual DAC to 8085 CPU Interface
PROGRAMMABLE WINDOW COMPARATOR
In the circuit of Figure 13 the AD7528 is used to implement a
programmable window comparator. DACs A and B are loaded
with the required upper and lower voltage limits for the test,
respectively. If the test input is not within the programmed
limits, the pass/fail output will indicate a fail (logic zero).
V
DD
TEST INPUT
V
0 TO –V
CC
REF
R
A
FB
1k⍀
OUT A
V
A
3
2
REF
7
DAC A
DB0
DB7
DATA
INPUTS
AD311
COMPARATOR
CS
AD7528
PASS/ FAIL
OUTPUT
WR
OUT B
2
3
DAC A/DAC B
7
DAC B
+V
REF
V
B
REF
AD311
COMPARATOR
R
B
FB
Figure 13. Digitally Programmable Window Comparator
(Upper and Lower Limit Detector)
PROGRAMMABLE STATE VARIABLE FILTER
In this state variable or universal filter configuration (Figure 14)
DACs A1 and B1 control the gain and Q of the filter character-
istic while DACs A2 and B2 control the cutoff frequency, fC.
DACs A2 and B2 must track accurately for the simple expres-
sion for fC to hold. This is readily accomplished by the AD7528.
Op amps are 2 × AD644. C3 compensates for the effects of op
amp gain bandwidth limitations.
The filter provides low pass, high pass and band pass outputs
and is ideally suited for applications where microprocessor
control of filter parameters is required, e.g., equalizer, tone
controls, etc.
Programmable range for component values shown is fC = 0 kHz
to 15 kHz and Q = 0.3 to 4.5.
R5
30k⍀
CIRCUIT EQUATIONS
C1= C2,R1= R2, R4 = R5
C1
1000pF
C2
1000pF
R4
30k⍀
C3
47pF
R3
10k⍀
1
HIGH
A1
fC =
LOW
A2
PASS
A3
A4
PASS
2 π R1C1
OUTPUT
OUTPUT
BAND
R3 RF
PASS
Q =
×
V
OUTPUT
V
DD
DD
R4 RFBB1
AD7528
DAC A1
RF
RS
AO = –
DAC B1
DAC A2
R1
DAC B2
R2
V
IN
AD7528
R
R
S
F
NOTE
DAC Equivalent Resistance
Equals
DB0–DB7
DATA 1
DB0–DB7
DATA 2
CS WR DAC A/DAC B
CS WR DAC A/DAC B
R
256 ×(DAC Ladder esistance)
DAC Digital Code
Figure 14. Digitally Controlled State Variable Filter
–7–
REV. B
AD7528
DIGITALLY CONTROLLED DUAL TELEPHONE
ATTENUATOR
In this configuration the AD7528 functions as a 2-channel digi-
tally controlled attenuator. Ideal for stereo audio and telephone
signal level control applications. Table IV gives input codes vs.
attenuation for a 0 dB to 15.5 dB range.
Table IV. Attenuation vs. DAC A, DAC B Code for the Circuit
of Figure 15
Attn. DAC Input
Code In Attn. DAC Input
Decimal dB Code
Code In
Decimal
dB
Code
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
6.5
7.0
7.5
1 1 1 1 1 1 1 1
1 1 1 1 0 0 1 0
1 1 1 0 0 1 0 0
1 1 0 1 0 1 1 1
1 1 0 0 1 0 1 1
1 1 0 0 0 0 0 0
1 0 1 1 0 1 0 1
1 0 1 0 1 0 1 1
1 0 1 0 0 0 1 0
1 0 0 1 1 0 0 0
1 0 0 1 0 0 0 0
1 0 0 0 1 0 0 0
1 0 0 0 0 0 0 0
0 1 1 1 1 0 0 1
0 1 1 1 0 0 1 0
0 1 1 0 1 1 0 0
255
242
228
215
203
192
181
171
162
152
144
136
128
121
114
108
88.0 0 1 1 0 0 1 1 0
88.5 0 1 1 0 0 0 0 0
89.0 0 1 0 1 1 0 1 1
89.5 0 1 0 1 0 1 1 0
10.0 0 1 0 1 0 0 0 1
10.5 0 1 0 0 1 1 0 0
11.0 0 1 0 0 1 0 0 0
11.5 0 1 0 0 0 1 0 0
12.0 0 1 0 0 0 0 0 0
12.5 0 0 1 1 1 1 0 1
13.0 0 0 1 1 1 0 0 1
13.5 0 0 1 1 0 1 1 0
14.0 0 0 1 1 0 0 1 1
14.5 0 0 1 1 0 0 0 0
15.0 0 0 1 0 1 1 1 0
15.5 0 0 1 0 1 0 1 1
102
96
91
86
81
76
72
68
64
61
57
54
51
48
46
43
Attenuation, dB
−
Input Code = 256 ϫ 10 exp
20
V
DD
V
A
IN
DAC A
A1
V
A
OUT
DB0
DB7
DATA BUS
CS
WR
DAC A/DAC B
AD7528
V
B
IN
DAC B
A2
V
B
OUT
SUGGESTED
OP AMP: AD644
For further applications information the reader is referred to
Analog Devices Application Note on the AD7528.
Figure 15. Digitally Controlled Dual Telephone Attenuator
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
20-Lead Cerdip (Q-20)
20-Lead Plastic DIP (N-20)
11
1.07 (27.18) MAX
20
1
0.28 (7.11)
20
11
PIN 1
0.255 (6.477)
0.24 (6.1)
10
0.245 (6.223)
10
1
0.32 (8.128)
0.30 (7.62)
0.32 (8.128)
0.29 (7.366)
0.97 (24.64)
0.935 (23.75)
0.14 (3.56)
PIN 1
0.135 (3.429)
0.125 (3.17)
0.145 (3.683)
MIN
0.20 (5.0)
0.14 (3.56)
0.125 (3.17)
0.125 (3.175)
MIN
0.15 (3.8)
0.125 (3.18)
SEATING
PLANE
SEATING
PLANE
0.011 (0.28)
0.009 (0.23)
0.011 (0.28)
0.009 (0.23)
0.11 (2.79)
0.09 (2.28)
0.065 (1.66)
0.045 (1.15)
0.021 (0.533)
0.015 (0.381)
15؇
0؇
0.07 (1.78) 0.02 (0.5) 0.11 (2.79)
0.05 (1.27) 0.016 (0.41) 0.09 (2.28)
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
15؇
0؇
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
LEADS ARE SOLDER OR TIN-PLATED KOVAR OR ALLOY 42
LEADS ARE SOLDER OR TIN-PLATED KOVAR OR ALLOY 42
20-Lead SOIC (R-20)
20-Lead Plastic Leaded Chip Carrier (P-20A)
0.5118 (13.00)
0.4961 (12.60)
0.180 (4.47)
0.165 (4.19)
0.395 (10.02)
0.385 (9.78)
SQ
0.12 (3.05)
0.09 (2.29)
0.020 (0.51) MIN
20
11
10
0.356 (9.04)
0.350 (8.89)
SQ
19
0.2992 (7.60)
0.2914 (7.40)
0.048 (1.21)
0.042 (1.07)
3
0.021 (0.53)
0.013 (0.33)
PIN 1
IDENTIFIER
18
4
8
0.4193 (10.65)
0.3937 (10.00)
0.050
(1.27)
BSC
1
TOP VIEW
(PINS DOWN)
0.032 (0.81)
0.026 (0.66)
14
0.02
(0.51)
MAX
PIN 1
9
13
0.1043 (2.65)
0.0926 (2.35)
0.0291 (0.74)
0.0098 (0.25)
؋
45؇ 0.025 (0.64)
MIN
0.02 (0.51)
MAX
0.060 (1.53)
MIN
8؇
0؇
0.0500 0.0192 (0.49)
0.0118 (0.30)
0.0040 (0.10)
0.0500 (1.27)
0.0157 (0.40)
SEATING
PLANE
0.0125 (0.32)
0.0091 (0.23)
(1.27)
BSC
0.0138 (0.35)
–8–
REV. B
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