AD7703BRZ [ADI]

20-Bit A/D Converter;
AD7703BRZ
型号: AD7703BRZ
厂家: ADI    ADI
描述:

20-Bit A/D Converter

转换器
文件: 总16页 (文件大小:253K)
中文:  中文翻译
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2
LC MOS  
20-Bit A/D Converter  
a
AD7703  
FEATURES  
FUNCTIO NAL BLO CK D IAGRAM  
Monolithic 20-Bit ADC  
0.0003% Linearity Error  
AVSS  
DVSS  
SC1  
SC2  
17  
20-Bit No Missed Codes  
On-Chip Self-Calibration Circuitry  
Program m able Low -Pass Filter  
0.1 Hz to 10 Hz Corner Frequency  
0 to +2.5 V or +2.5 V Analog Input Range  
4 kSPS Output Data Rate  
Flexible Serial Interface  
Ultralow Pow er  
7
6
4
AD7703  
15  
14  
DVDD  
AVDD  
CALIBRATION  
MICROCONTROLLER  
CALIBRATION  
SRAM  
13  
CAL  
20-BIT CHARGE BALANCE A/D  
CONVERTER  
AIN  
9
12  
11  
BP/UP  
SLEEP  
6-POLE GAUSSIAN  
ANALOG  
MODULATOR  
VREF  
10  
LOW-PASS  
DIGITAL FILTER  
APPLICATIONS  
Industrial Process Control  
Weigh Scales  
Portable Instrum entation  
Rem ote Data Acquisition  
AGND  
DGND  
8
5
20 SDATA  
19  
CLOCK  
SERIAL INTERFACE  
GENERATOR  
LOGIC  
SCLK  
3
2
1
16  
18  
MODE  
CLKIN CLKOUT  
CS  
DRDY  
GENERAL D ESCRIP TIO N  
P RO D UCT H IGH LIGH TS  
T he AD7703 is a 20-bit ADC which uses a sigma delta conver-  
sion technique. T he analog input is continuously sampled by an  
analog modulator whose mean output duty cycle is proportional  
to the input signal. T he modulator output is processed by an  
on-chip digital filter with a six-pole Gaussian response, which  
updates the output data register with 20-bit binary words at  
word rates up to 4 kHz. T he sampling rate, filter corner fre-  
quency and output word rate are set by a master clock input  
that may be supplied externally, or by an on-chip gate oscillator.  
1. T he AD7703 offers 20-bit resolution coupled with  
outstanding 0.0003% accuracy.  
2. No missing codes ensures true, usable, 20-bit dynamic range,  
removing the need for programmable gain and level-setting  
circuitry.  
3. T he effects of temperature drift are eliminated by on-chip  
self-calibration, which removes zero and gain error. External  
circuits can also be included in the calibration loop to remove  
system offsets and gain errors.  
T he inherent linearity of the ADC is excellent, and endpoint  
accuracy is ensured by self-calibration of zero and full scale  
which may be initiated at any time. T he self-calibration scheme  
can also be extended to null system offset and gain errors in the  
input channel.  
4. A flexible synchronization allows the AD7703 to interface  
directly to the serial ports of industry standard  
microcontrollers and DSP processors.  
5. Low operating power consumption and an ultralow power  
standby mode make the AD7703 ideal for loop powered  
remote sensing applications, or battery-powered portable  
instruments.  
T he output data is accessed through a serial port, which has two  
synchronous modes suitable for interfacing to shift registers or  
the serial ports of industry standard microcontrollers.  
CMOS construction ensures low power dissipation, and a power  
down mode reduces the idle power consumption to only 10 W.  
REV. D  
Inform ation furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assum ed by Analog Devices for its  
use, nor for any infringem ents of patents or other rights of third parties  
which m ay result from its use. No license is granted by im plication or  
otherwise under any patent or patent rights of Analog Devices.  
© Analog Devices, Inc., 1996  
One Technology Way, P.O. Box 9106, Norw ood, MA 02062-9106, U.S.A.  
Tel: 617/ 329-4700  
Fax: 617/ 326-8703  
(T = +25؇C; AV = DV = +5 V; AV = DV = 5 V; V = +2.5 V; fCLKIN = 4.096 MHz;  
AD7703–SPECIFICATIONS  
A
DD  
DD  
SS  
SS  
REF  
BP/UP = +5 V; MODE = +5 V; A Source Resistance = 1 k1 with 1 nF to AGND at A unless otherwise noted.)  
IN  
IN  
P aram eter  
A/S Versions2  
B Version 2  
C Version2  
Units  
Test Conditions/Com m ents  
ST AT IC PERFORMANCE  
Resolution  
20  
20  
20  
Bits  
Integral Nonlinearity, T MIN to T MAX  
+25°C  
T MIN to T MAX  
±0.0015  
±0.003  
±0.003  
±0.0007  
±0.0015  
±0.0015  
±0.5  
±4  
±0.0003  
±0.0008  
±0.0012  
±0.5  
±4  
% FSR typ  
% FSR max  
% FSR max  
LSB typ  
Differential Nonlinearity, TMIN to TMAX ± 0.5  
Guaranteed No Missing Codes  
Positive Full-Scale Error3  
±4  
LSB typ  
±16  
±19/±37  
±4  
±16  
±19  
±4  
±16  
±19  
±4  
LSB max  
LSB typ  
LSB typ  
Full-Scale Drift4  
Unipolar Offset Error3  
±16  
±26  
±67 +48/–400  
±4  
±16  
±26  
±67  
±4  
±16  
±26  
±67  
±4  
LSB max  
LSB typ  
LSB typ  
Unipolar Offset Drift4  
Bipolar Zero Error3  
T emp Range: 0°C to +70°C  
Specified T emp Range  
LSB typ  
±16  
±13  
±34 +24/–200  
±8  
±16  
±13  
±34  
±8  
±16  
±13  
±34  
±8  
LSB max  
LSB typ  
LSB typ  
Bipolar Zero Drift4  
T emp Range: 0°C to +70°C  
Specified T emp Range  
Bipolar Negative Full-Scale Errors3  
LSB typ  
±32  
±10/±20  
1.6  
±32  
±10  
1.6  
±32  
±10  
1.6  
LSB max  
LSB typ  
LSB rms typ  
Bipolar Negative Full-Scale Drift4  
Noise (Referred to Output)  
DYNAMIC PERFORMANCE  
Sampling Frequency, fS  
Output Update Rate, fOUT  
Filter Corner Frequency, f–3 dB  
Settling T ime to ±0.0007% FS  
fCLKIN/256  
fCLKIN/256  
fCLKIN/256  
Hz  
Hz  
Hz  
sec  
fCLKIN/1024  
fCLKIN/409,600  
507904/fCLKIN  
fCLKIN/1024  
fCLKIN/409,600  
507904/fCLKIN  
fCLKIN/1024  
fCLKIN/409,600  
507904/fCLKIN  
For Full-Scale Input Step  
SYST EM CALIBRAT ION  
Positive Full-Scale Calibration Range  
Positive Full-Scale Overrange  
VREF + 0.1  
VREF + 0.1  
VREF + 0.1  
VREF + 0.1  
VREF + 0.1  
VREF + 0.1  
V max  
V max  
System Calibration Applies to  
Unipolar and Bipolar Ranges.  
Negative Full-Scale Overrange  
Maximum Offset Calibration Ranges5, 6  
Unipolar Input Range  
–(VREF + 0.1)  
–(VREF + 0.1)  
–(VREF + 0.1)  
–(VREF + 0.1)  
–(VREF + 0.1)  
–(VREF + 0.1)  
V max  
V max  
After Calibration, if AIN > VREF  
the Device Will Output All 1s.  
If AIN < 0 (Unipolar) or –VREF  
(Bipolar), the Device Will  
Output all 0s  
,
Bipolar Input Range  
–0.4 VREF to +0.4 VREF –0.4 VREF to +0.4 VREF –0.4 VREF to +0.4 VREF V max  
0.8 VREF  
2 VREF + 0.2  
Input Span7  
0.8 VREF  
2 VREF + 0.2  
0.8 VREF  
2 VREF + 0.2  
V min  
V max  
ANALOG INPUT  
Unipolar Input Range  
Bipolar Input Range  
Input Capacitance  
Input Bias Current1  
0 to +2.5  
±2.5  
20  
0 to +2.5  
±2.5  
20  
0 to +2.5  
±2.5  
20  
Volts  
Volts  
pF typ  
nA typ  
1
1
1
LOGIC INPUT S  
All Inputs except CLKIN  
VINL, Input Low Voltage  
VINH , Input High Voltage  
CLKIN  
0.8  
2.0  
0.8  
2.0  
0.8  
2.0  
V max  
V min  
V
INL, Input Low Voltage  
0.8  
3.5  
10  
0.8  
3.5  
10  
0.8  
3.5  
10  
V max  
V min  
µA max  
VINH , Input High Voltage  
IIN, Input Current  
LOGIC OUT PUT S  
VOL, Output Low Voltage  
VOH, Output High Voltage  
Floating State Leakage Current  
Floating State Output Capacitance  
0.4  
DVDD –1  
±10  
9
0.4  
DVDD –1  
±10  
9
0.4  
DVDD –1  
±10  
9
V max  
V min  
µA max  
pF typ  
ISINK = 1.6 mA  
ISOURCE = 100 µA  
POWER REQUIREMENT S  
Power Supply Voltages  
Analog Positive Supply (AVDD  
Digital Positive Supply (DVDD  
Analog Negative Supply (AVSS  
Digital Negative Supply (DVSS  
Calibration Memory Retention  
Power Supply Voltage  
)
)
)
)
4.5/5.5  
4.5/5.5  
4.5/5.5  
V min/V max For Specified Performance  
V min/V max  
V min/V max  
4.5/AVDD  
–4.5/–5.5  
–4.5/–5.5  
4.5/AVDD  
–4.5/–5.5  
–4.5/–5.5  
4.5/AVDD  
–4.5/–5.5  
–4.5/–5.5  
V min/V max  
2.0  
2.0  
2.0  
V min  
–2–  
REV. D  
AD7703  
P aram eter  
A/S Versions2  
B Version2  
C Version2  
Units  
Test Conditions/Com m ents  
ST AT IC PERFORMANCE  
DC Power Supply Currents8  
Analog Positive Supply (AIDD  
Digital Positive Supply (DIDD  
Analog Negative Supply (AISS  
Digital Negative Supply (DISS  
Power Supply Rejection9  
Positive Supplies  
)
)
)
)
3.2  
1.5  
3.2  
0.1  
3.2  
1.5  
3.2  
0.1  
3.2  
1.5  
3.2  
0.1  
mA max  
mA max  
mA max  
mA max  
T ypically 2 mA  
T ypically 1 mA  
T ypically 2 mA  
T ypically 0.03 mA  
70  
75  
70  
75  
70  
75  
dB typ  
dB typ  
Negative Supplies  
Power Dissipation  
Normal Operation  
40  
40  
40  
mW rnax  
SLEEP = Logic 1,  
T ypically 25 mW  
SLEEP = Logic 0,  
T ypically 10 µW  
Standby Operations10  
A, B, C  
S
20  
40  
20  
40  
20  
40  
µW max  
µW max  
NOT ES  
1T he AIN pin presents a very high impedance dynamic load which varies with clock frequency. A ceramic 1 nF capacitor from the A IN to AGND is necessary. Source  
resistance should be 750 or less.  
2T emperature Ranges are as follows: A, B, C Versions: –40°C to +85°C; S Version: –55°C to +125°C.  
3Applies after calibration at the temperature of interest. Full-Scale Error applies for both unipolar and bipolar input ranges.  
4T otal drift over the specified temperature range after calibration at power-up at +25 °C. T his is guaranteed by design and/or characterization. Recalibration at any  
temperature will remove these errors.  
5In unipolar mode the offset can have a negative value (–VREF) such that the unipolar mode can mimic bipolar mode operation.  
6T he specifications for input overrange and for input span apply additional constraints on the offset calibration range.  
7For unipolar mode, input span is the difference between full scale and zero scale. For bipolar mode, input span is the difference between positive and negative  
full-scale points. When using less than the maximum input span, the span range may be placed anywhere within the range of ±(VREF + 0.1).  
8All digital outputs unloaded. All digital inputs at 5 V CMOS levels.  
9Applies in 0.1 Hz to 10 Hz bandwidth. PSRR at 60 Hz will exceed 120 dB due to the digital filter.  
10CLKIN is stopped. All digital inputs are grounded.  
Specifications subject to change without notice.  
ABSO LUTE MAXIMUM RATINGS*  
(T A = +25°C unless otherwise noted)  
O RD ERING GUID E  
Linearity  
DVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V  
DVDD to AVDD . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V  
DVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V  
AVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V  
AVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V  
AGND to DGND . . . . . . . . . . . . . . . . . . . . . 0.3 V to +0.3 V  
Digital Input Voltage to DGND . . . . 0.3 V to DVDD + 0.3 V  
Analog Input Voltage to AGND . . . . . . . . . . . AVSS – 0.3 V to  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . AVDD + 0.3 V  
Input Current to Any Pin Except Supplies1 . . . . . . . . ±10 mA  
Operating T emperature Range  
Industrial (A, B, C Versions) . . . . . . . . . . . –40°C to +85°C  
Extended (S Version) . . . . . . . . . . . . . . . . –55°C to +125°C  
Storage T emperature Range . . . . . . . . . . . . –65°C to +150°C  
Lead T emperature (Soldering, 10 secs) . . . . . . . . . . . +300°C  
Power Dissipation (DIP Package) to +75°C . . . . . . . 450 mW  
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 10 mW/°C  
Power Dissipation (SOIC Package) to +75°C . . . . . . 250 mW  
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 15 mW/°C  
Tem perature  
Range  
Error  
(% FSR)  
P ackage  
O ptions*  
Model  
AD7703AN  
AD7703BN  
AD7703CN  
AD7703AR  
AD7703BR  
AD7703CR  
AD7703AQ  
AD7703BQ  
AD7703CQ  
AD7703SQ  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–55°C to +125°C  
0.003  
N-20  
N-20  
N-20  
R-20  
R-20  
R-20  
Q-20  
Q-20  
Q-20  
Q-20  
0.0015  
0.0012  
0.003  
0.0015  
0.0012  
0.003  
0.0015  
0.0012  
0.003  
*N = Plastic DIP; R = SOIC; Q = Cerdip.  
NOT ES  
*Stresses above those listed under “Absolute Maximum Ratings” may cause  
permanent damage to the device. T his is a stress rating only and functional  
operation of the device at these or any other conditions above those listed in the  
operational sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect device reliability.  
1T ransient currents of up to 100 mA will not cause SCR latch-up.  
CAUTIO N  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although this device features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. D  
–3–  
AD7703  
TIMING CHARACTERISTICS  
(AV = DV = +5 V ؎ 10%; AV = DV = 5 V ؎ 10%; AGND = DGND = 0 V; fCLKIN  
=
1, 2  
DD  
DD  
SS  
SS  
4.096 MHz; Input Levels: Logic 0 = 0 V, Logic 1 = DV ; unless otherwise noted.)  
DD  
Lim it at TMIN, TMAX Lim it at TMIN, TMAX  
P aram eter  
(A, B, C Versions)  
(S Version)  
Units  
Conditions/Com m ent6  
Master Clock Frequency: Internal Gate Oscillator  
3, 4  
fCLKIN  
200  
5
200  
5
kHz min  
MHz max T ypically 4096 kHz  
200  
5
50  
50  
0
200  
5
50  
50  
0
kHz min  
MHz max  
ns max  
ns max  
ns min  
Master Clock Frequency: Externally Supplied  
5
tr  
Digital Output Rise T ime. T ypically 20 ns  
Digital Output Fall T ime. T ypically 20 ns  
SC1, SC2 to CAL High Setup T ime  
tf5  
t1  
t26  
50  
1000  
50  
1000  
ns min  
ns min  
SC1, SC2 Hold T ime After CAL Goes High  
SLEEP High to CLKIN High Setup T ime  
t3  
SSC MODE  
7
t4  
3/fCLKIN  
100  
250  
300  
790  
3/fCLKIN  
100  
250  
300  
790  
ns max  
ns max  
ns min  
ns max  
ns max  
ns max  
ns max  
Data Access T ime (CS Low to Data Valid)  
SCLK Falling Edge to Data Valid Delay (25 ns typ)  
MSB Data Setup T ime. T ypically 380 ns  
SCLK High Pulse Width. T ypically 240 ns  
SCLK Low Pulse Width. T ypically 730 ns  
SCLK Rising Edge to Hi-Z Delay (1/fCLKIN + 100 ns typ)  
CS High to Hi-Z Delay  
t5  
t6  
t7  
t8  
t9  
l/fCLKIN + 200  
4/fCLKIN + 200  
l/fCLKIN + 200  
4/fCLKIN + 200  
8, 9  
t10  
SEC MODE  
fSCLK  
t11  
5
35  
5
35  
MHz max Serial Clock Input Frequency  
ns min  
ns min  
ns max  
ns max  
ns max  
ns max  
SCLK High Pulse Width  
SCLK Low Pulse Width  
Data Access Time (CS Low to Data Valid). Typically 80 ns  
SCLK Falling Edge to Data Valid Delay. Typically 75 ns  
CS High to Hi-Z Delay  
t12  
t13  
t14  
t15  
160  
160  
150  
250  
200  
160  
160  
150  
250  
200  
7, 10  
11  
8
8
t16  
SCLK Falling Edge to Hi-Z Delay. T ypically 100 ns  
NOT ES  
1Sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.  
2See Figures 1 to 6.  
3CLKIN duty cycle range is 20% to 80%. CLKIN must be supplied whenever the AD7703 is not in SLEEP mode. If no clock is present in this case, the device can  
draw higher current than specified and possibly become uncalibrated.  
4T he AD7703 is production tested with fCLKIN at 4.096 MHz. It is guaranteed by characterization to operate at 200 kHz.  
5Specified using 10% and 90% points on waveform of interest.  
6In order to synchronize several AD7703s together using the SLEEP pin, this specification must be met.  
7t4 and t13 are measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.  
8t9, t10, t15 and t16 are derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. T he measured number is  
then extrapolated back to remove the effects of charging or discharging the 100 pF capacitor. T his means that the tune quoted in the T iming Characteristics is the  
true bus relinquish time of the part and as such is independent of external bus loading capacitances.  
9If CS is returned high before all 20 bits are output, the SDAT A and SCLK outputs will complete the current data bit and then go to high impedance.  
10If CS is activated asynchronously to DRDY, CS will not be recognized if it occurs when DRDY is high for four clock cycles. T he propagation delay time may be as  
great as 4 CLKIN cycles plus 160 ns. T o guarantee proper clocking of SDAT A when using asynchronous CS, the SCLK input should not be taken high sooner than  
4 CLKIN cycles plus 160 ns after CS goes low.  
11SDAT A is clocked out on the falling edge of the SCLK input.  
CAL  
I
OL  
1.6mA  
t2  
SC1,SC2 VALID  
t1  
TO  
OUTPUT  
PIN  
SC1, SC2  
+2.1V  
C
L
100pF  
Figure 2. Calibration Control Tim ing  
I
OH  
200µA  
CLKIN  
t3  
Figure 1. Load Circuit for Access Tim e and Bus Relinquish  
Tim e  
SLEEP  
Figure 3. Sleep Mode Tim ing  
–4–  
REV. D  
AD7703  
CS  
CS  
t15  
t10  
HI-Z  
HI-Z  
DATA  
VALID  
DATA  
VALID  
SDATA  
SDATA  
Figure 4. SSC Mode Data Hold Tim e  
Figure 5a. SEC Mode Data Hold Tim e  
CLKIN  
CS  
DRDY  
CS  
t7  
t12  
t8  
t11  
HI-Z  
HI-Z  
HI-Z  
SCLK  
SCLK  
t9  
t4  
t13  
t8  
t16  
DB0  
t14  
DB18  
t5  
HI-Z  
HI-Z  
DB19  
SDATA  
DB1  
HI-Z  
DB19  
SDATA  
DB18  
DB1  
DB0  
Figure 6. SSC Mode Tim ing Diagram  
Figure 5b. SEC Mode Tim ing Diagram  
P O SITIVE FULL-SCALE O VERRANGE  
TERMINO LO GY  
LINEARITY ERRO R  
Positive full-scale overrange is the amount of overhead available  
to handle input voltages greater than +VREF (for example, noise  
peaks or excess voltages due to system gain errors in system cali-  
bration routines) without introducing errors due to overloading  
the analog modulator or overflowing the digital filter.  
T his is the maximum deviation of any code from a straight line  
passing through the endpoints of the transfer function. T he end-  
points of the transfer function are zero-scale (not to be confused  
with bipolar zero), a point 0.5 LSB below the first code transi-  
tion (000 . . . 000 to 000 . . . 001) and full scale, a point 1.5 LSB  
above the last code transition (111 . . . 110 to 111 . . . 111).  
T he error is expressed as a percentage of full scale.  
NEGATIVE FULL-SCALE O VERRANGE  
T his is the amount of overhead available to handle voltages be-  
low –VREF without overloading the analog modulator or over-  
flowing the digital filter. Note that the analog input will accept  
negative voltage peaks even in the unipolar mode.  
D IFFERENTIAL LINEARITY ERRO R  
T his is the difference between any code’s actual width and the  
ideal (1 LSB) width. Differential linearity error is expressed in  
LSBs. A differential linearity specification of ±1 LSB or less  
guarantees monotonicity.  
O FFSET CALIBRATIO N RANGE  
In the system calibration modes (SC2 Low) the AD7703 cali-  
brates its offset with respect to the AIN pin. T he offset calibra-  
tion range specification defines the range of voltages that the  
AD7701 can accept and still calibrate offset accurately.  
P O SITIVE FULL-SCALE ERRO R  
Positive full-scale error is the deviation of the last code transition  
(111 . . . 110 to 111 . . . 111) from the ideal (VREF –3/2 LSBs).  
It applies to both positive and negative analog input ranges.  
FULL-SCALE CALIBRATIO N RANGE  
T his is the range of voltages that the AD7703 can accept in the  
system calibration mode and still calibrate full scale correctly.  
UNIP O LAR O FFSET ERRO R  
Unipolar offset error is the deviation of the first code transition  
from the ideal (AGND + 0.5 LSB) when operating in the uni-  
polar mode.  
INP UT SP AN  
In system calibration schemes, two voltages applied in sequence  
to the AD7703s analog input define the analog input range.  
T he input span specification defines the minimum and maxi-  
mum input voltages from zero to full scale that the AD7703 can  
accept and still calibrate gain accurately.  
BIP O LAR ZERO ERRO R  
T his is the deviation of the midscale transition (0111 . . . 111 to  
1000 . . . 000) from the ideal (AGND – 0.5 LSB) when operat-  
ing in the bipolar mode.  
BIP O LAR NEGATIVE FULL-SCALE ERRO R  
T his is the deviation of the first code transition from the ideal  
(–VREF + 0.5 LSB), when operating in the bipolar mode.  
REV. D  
–5–  
AD7703  
P IN FUNCTIO N D ESCRIP TIO N  
P in  
Mnem onic D escription  
1
MODE  
Selects the Serial Interface Mode. If MODE is tied to DGND, the Synchronous External Clocking (SEC)  
mode is selected. SCLK is configured as an input, and the output appears without formatting, the MSB com-  
ing first. If MODE is tied to +5 V, the AD7703 operates in the Synchronous Self-Clocking (SSC) mode.  
SCLK is configured as an output, with a clock frequency for fCLKIN/4 and 25% duty cycle.  
2
CLKOUT  
Clock Output to generate an Internal Master Clock by connecting a crystal between CLKOUT and CLKIN.  
If an external clock is used, CLKOUT is not connected.  
3
CLKIN  
Clock Input for External Clock.  
4, 17  
SC1, SC2  
System Calibration Pins. T he state of these pins, when CAL is taken high, determines the type of calibration  
performed.  
5
DGND  
DVSS  
AVSS  
AGND  
AIN  
Digital Ground. Ground reference for all digital signals.  
Digital Negative Supply, –5 V nominal.  
Analog Negative Supply, –5 V nominal.  
Analog Ground. Ground reference for all analog signals.  
Analog Input.  
6
7
8
9
10  
VREF  
Voltage Reference Input, +2.5 V nominal. T his determines the value of positive full-scale in the unipolar  
mode and of both positive and negative full-scale in the Bipolar Mode.  
11  
12  
13  
SLEEP  
BP/UP  
CAL  
Sleep mode pin. When this pin is taken low, the AD7703 goes into a low-power mode with typically 10 µW  
power consumption.  
Bipolar/Unipolar mode pin. When this pin is Low, the AD7703 is configured for a unipolar input range going  
from AGND to VREF. When Pin 12 is High, the AD7703 is configured for a bipolar input range, ±VREF  
.
Calibration mode pin. When CAL is taken High for more than 4 cycles, the AD7703 is reset and performs a  
calibration cycle when CAL is brought Low again. T he CAL pin can also be used as a strobe to synchronize  
the operation of several AD7703s.  
14  
15  
16  
AVDD  
DVDD  
CS  
Analog Positive Supply, +5 V nominal.  
Digital Positive Supply, +5 V nominal.  
Chip Select Input. When CS is brought low, the AD7703 will begin to transmit serial data in a format deter-  
mined by the state of the MODE pin.  
18  
DRDY  
Data Ready Output. DRDY is low when valid data is available in the output register. It goes high after trans-  
mission of a word is completed. It also goes high for four clock cycles when a new data word is being loaded  
into the output register, to indicate that valid data is not available, irrespective of whether data transmission is  
complete or not.  
19  
20  
SCLK  
Serial Clock Input/Output. T he SCLK pin in configured as an input or output, dependent on the type of se-  
rial data transmission that has been selected by the MODE pin. When configured as an output in the Syn-  
chronous Self-Clocking mode, it has a frequency of fCLKIN/4 and a duty cycle of 25%.  
SDAT A  
Serial Data Output. T he AD7703s output data is available at this pin as a 20-bit serial word.  
Table I. Bit Weight Table (2.5 V Reference Voltage)  
P IN CO NFIGURATIO N  
D IP , Cer dip, SO IC  
UNIP O LAR MO D E  
LSBs % FS ppm FS LSBs % FS  
BIP O LAR MO D E  
ppm FS  
V  
20  
1
2
MODE  
SDATA  
19 SCLK  
CLKOUT  
0.596  
1.192  
2.384  
4.768  
9.537  
0.25  
0.5  
1.00  
2.00  
4.00  
0.0000238 0.24  
0.13  
0.26  
0.5  
1.00  
2.00  
0.0000119  
0.0000238  
0.0000477  
0.0000954  
0.0001907  
0.12  
0.24  
0.48  
0.95  
1.91  
3
18  
17  
16  
15  
DRDY  
SC2  
CLKIN  
SC1  
0.0000477 0.48  
0.0000954 0.95  
0.0001907 1.91  
0.0003814 3.81  
4
AD7703  
TOP VIEW  
5
CS  
DGND  
DVSS  
AVSS  
6
DVDD  
(Not to Scale)  
14 AVDD  
7
13  
8
CAL  
AGND  
AIN  
12  
9
BP/UP  
11  
VREF  
10  
SLEEP  
–6–  
REV. D  
AD7703  
GENERAL D ESCRIP TIO N  
TH EO RY O F O P ERATIO N  
T he AD7703 is a 20-bit A/D converter with on-chip digital  
filtering, intended for the measurement of wide dynamic range,  
low frequency signals such as those representing chemical,  
physical or biological processes. It contains a charge-balancing  
(sigma-delta) ADC, calibration microcontroller with on-chip  
static RAM, a clock oscillator and a serial communications port.  
T he general block diagram of a sigma-delta ADC is shown in  
Figure 8. It contains the following elements:  
1. A sample-hold amplifier  
2. A differential amplifier or subtracter  
3. An analog low-pass filter  
4. A 1-bit A/D converter (comparator)  
5. A 1-bit DAC  
T he analog input signal to the AD7703 is continuously sampled  
at a rate determined by the frequency of the master clock,  
CLKIN. A charge-balancing A/D converter (sigma-delta modu-  
lator) converts the sampled signal into a digital pulse train  
whose duty cycle contains the digital information. A six-pole  
Gaussian digital low-pass filter processes the output of the  
sigma-delta modulator and updates the 20-bit output register at  
a 4 kHz rate. T he output data can be read from the serial port  
randomly or periodically at any rate up to 4 kHz.  
6. A digital low-pass filter  
S/H AMP  
COMPARATOR  
ANALOG  
LOW-PASS  
DIGITAL  
FILTER  
FILTER  
DIGITAL DATA  
DAC  
+5V  
ANALOG  
SUPPLY  
AV  
DV  
DD  
DD  
0.1µF  
0.1µF  
10µF  
SLEEP  
MODE  
Figure 8. General Sigm a-Delta ADC  
DATA  
DRDY  
CS  
2.5V  
READY  
VOLTAGE  
REFERENCE  
V
REF  
READ  
(TRANSMIT)  
In operation, the sampled analog signal is fed to the subtracter,  
along with the output of the 1-bit DAC. T he filtered difference  
signal is fed to the comparator, whose output samples the  
difference signal at a frequency many times that of the analog  
signal frequency (oversampling).  
AD7703  
SERIAL  
CLOCK  
SCLK  
RANGE  
SELECT  
BP/UP  
CAL  
SERIAL  
DATA  
SDATA  
CALIBRATE  
CLKIN  
ANALOG  
INPUT  
A
CLKOUT  
IN  
Oversampling is fundamental to the operation of sigma-delta  
ADCs. Using the quantization noise formula for an ADC:  
SC1  
SC2  
ANALOG  
GROUND  
AGND  
DGND  
0.1µF  
SNR =(6.02 × number of bits +1.76) dB,  
0.1µF  
AV  
SS  
DV  
SS  
–5V  
ANALOG  
SUPPLY  
a 1-bit ADC or comparator yields an SNR of 7.78 dB.  
10µF  
T he AD7703 samples the input signal at 16 kHz, which spreads  
the quantization noise from 0 kHz to 8 kHz. Since the specified  
analog input bandwidth of the AD7703 is only 0 Hz to 10 Hz,  
the noise energy in this bandwidth would be only 1/800 of the  
total quantization noise, assuming that the noise energy was  
spread evenly throughout the spectrum. It is reduced still  
further by analog filtering in the modulator loop, which shapes  
the quantization noise spectrum to move most of the noise  
energy to frequencies above 10 Hz. T he SNR performance in  
the 0 Hz to 10 Hz range is conditioned to the 20-bit level in this  
fashion.  
Figure 7. Typical System Connection Diagram  
T he AD7703 can perform self-calibration using the on-chip  
calibration microcontroller and SRAM to store calibration  
parameters. A calibration cycle may be initiated at any time  
using the CAL control input.  
Other system components may also be included in the  
calibration loop to remove offset and gain errors in the input  
channel.  
For battery operation, the AD7703 also offers a standby mode  
that reduces idle power consumption to typically 10 µW.  
T he output of the comparator provides the digital input for the  
1-bit DAC, so the system functions as a negative feedback loop  
which minimizes the difference signal. T he digital data that  
represents the analog input voltage is in the duty cycle of the  
pulse train appearing at the output of the comparator. It can be  
retrieved as a parallel binary data word using a digital filter.  
Sigma-delta ADCs are generally described by the order of the  
analog low-pass filter. A simple example of a first order sigma-  
delta ADC is shown in Figure 8. T his contains only a first-order  
low-pass filter or integrator.  
T he AD7703 uses a second-order sigma-delta modulator and a  
digital filter that provides a rolling average of the sampled  
output. After power-up or if there is a step change in the input  
voltage, there is a settling time before valid data is obtained.  
REV. D  
–7–  
AD7703  
D IGITAL FILTERING  
T he AD7703s digital filter behaves like an analog filter, with a  
few minor differences.  
T he output settling of the AD7703 in response to a step input  
change is shown in Figure 10. T he Gaussian response has fast  
settling with no overshoot, and the worst-case settling time to  
±0.0007% is 125 ms with a 4.096 MHz master clock frequency.  
First, since digital filtering occurs after the A to D conversion  
process, it can remove noise injected during the conversion  
process. Analog filtering cannot do this.  
On the other hand, analog filtering can remove noise superim-  
posed on the analog signal before it reaches the ADC. Digital  
filtering cannot do this and noise peaks riding on signals near  
full scale have the potential to saturate the analog modulator  
and digital filter, even though the average value of the signal is  
within limits. T o alleviate this problem, the AD7703 has over-  
range headroom built into the sigma-delta modulator and digital  
filter which allows overrange excursions of 100 mV. If noise sig-  
nals are larger than this, consideration should be given to analog  
input filtering, or to reducing the gain in the input channel so  
that a full-scale input (2.5 V) gives only a half-scale input to the  
AD7703 (1.25 V). T his will provide an overrange capability  
greater than 100% at the expense of reducing the dynamic range  
by 1 bit (50%).  
100  
80  
60  
40  
20  
0
0
40  
80  
120  
160  
TIME – ms  
Figure 10. AD7703 Step Response  
FILTER CH ARACTERISTICS  
T he cutoff frequency of the digital filter is fCLK/409600. At the  
maximum clock frequency of 4.096 MHz, the cutoff frequency  
of the filter is 10 Hz and the data update rate is 4 kHz.  
USING TH E AD 7703  
SYSTEM D ESIGN CO NSID ERATIO NS  
T he AD7703 operates differently from successive approxima-  
tion ADCs or integrating ADCs. Since it samples the signal con-  
tinuously, like a tracking ADC, there is no need for a start convert  
command. T he 20-bit output register is updated at a 4 kHz rate,  
and the output can be read at any time, either synchronously or  
asynchronously.  
Figure 9 shows the filter frequency response. T his is a 6-pole  
Gaussian response that provides 55 dB of 60 Hz rejection for a  
10 Hz cutoff frequency. If the clock frequency is halved to give a  
5 Hz cutoff, 60 Hz rejection is better than 90 dB.  
20  
CLO CKING  
0
f
= 4MHz  
CLK  
T he AD7703 requires a master clock input, which may be an  
external T T L/CMOS compatible clock signal applied to the  
CLKIN pin (CLKOUT not used). Alternatively, a crystal of the  
correct frequency can be connected between CLKIN and  
CLKOUT , when the clock circuit will function as a crystal  
controlled oscillator.  
–20  
–40  
–60  
f
= 2MHz  
CLK  
–80  
–100  
–120  
Figure 11 shows a simple model of the on-chip gate oscillator  
and T able II gives some typical capacitor values to be used with  
various resonators.  
f
= 1MHz  
CLK  
–140  
–160  
R1  
5MΩ  
1
100  
10  
FREQUENCY – Hz  
2
Figure 9. Frequency Response of AD7703 Filter  
C2*  
10pF  
X1  
gm = 1500µMHO  
Since the AD7703 contains this low-pass filtering, there is a set-  
tling time associated with step function inputs, and data will be  
invalid after a step change until the settling time has elapsed.  
T he AD7703 is, therefore, unsuitable for high speed multiplex-  
ing, where channels are switched and converted sequentially at  
high rates, as switching between channels can cause a step  
change in the input. However, slow multiplexing of the AD7703  
is possible, provided that the settling time is allowed to elapse  
before data for the new channel is accessed.  
3
C1*  
10pF  
AD7703  
*SEE TABLE II  
Figure 11. On-Chip Gate Oscillator  
–8–  
REV. D  
AD7703  
Table II. Resonator Loading Capacitors  
low capacitance/voltage coefficient. T he device also achieves low  
input drift through the use of chopper-stabilized techniques in  
its input stage. T o ensure excellent performance over time and  
temperature, the AD7703 uses digital calibration techniques  
which minimize offset and gain error to typically ±4 LSBs.  
Resonators  
C1  
C2  
Ceramic  
200 kHz  
455 kHz  
1.0 MHz  
2.0 MHz  
Crystals  
330 pF  
100 pF  
50 pF  
470 pF  
100 pF  
50 pF  
AUTO CALIBRATIO N  
T he AD7703 offers both self-calibration and system-calibration  
facilities. For calibration to occur, the on-chip microcontroller  
must record the modulator output for two different input condi-  
tions. T hese are the “zero scale” and “full scale” points. In uni-  
polar self-calibration mode, the zero scale point is VAGND and  
the full-scale point is VREF. With these readings the microcon-  
troller can calculate the gain slope for the input to output trans-  
fer function of the converter. In unipolar mode the slope factor  
is determined by dividing the span between zero and full scale  
by 220. In bipolar mode it is determined by dividing the span by  
219 since the inputs applied represent only half the total codes.  
In both unipolar and bipolar modes the slope factor is saved and  
used to calculate the binary output code when an analog input is  
applied to the device. T able IV gives the output code size after  
calibration.  
20 pF  
20 pF  
2.000 MHz  
3.579 MHz  
4.096 MHz  
30 pF  
20 pF  
None  
30 pF  
20 pF  
None  
T he input sampling frequency, output data rate, filter character-  
istics and calibration time are all directly related to the master  
clock frequency fCLKIN by the ratios given in the specification  
table under Dynamic Performance. T herefore, the first step in  
system design with the AD7703 is to select a master clock fre-  
quency suitable for the bandwidth and output data rate required  
by the application.  
ANALO G INP UT RANGES  
System calibration allows the AD7703 to compensate for system  
gain and offset errors. A typical circuit where this might be used  
is shown in Figure 12.  
T he AD7703 performs conversion relative to an externally sup-  
plied reference voltage, which allows easy interfacing to ratio-  
metric systems. In addition, either unipolar or bipolar input  
voltage ranges may be selected using the BP/UP input. With  
BP/UP tied low, the input range is unipolar and the span is  
(VREF–VAGND), where VAGND is the voltage at the device AGND  
pin. With BP/UP tied high, the input range is bipolar and the  
span is 2 VREF. In the bipolar mode both positive and negative  
full scale are directly determined by VREF. T his offers superior  
tracking of positive and negative full scale and better midscale  
(bipolar zero) stability than bipolar schemes that simply scale  
and offset the input range.  
System calibration performs the same slope factor calculations  
as self-calibration but uses voltage values presented by the  
system to the AIN pin for the zero and full-scale points. T here  
are two system calibration modes.  
T he first mode offers system level calibration for system offset  
and system gain. T his is a two step operation. T he zero-scale  
point must be presented to the converter first. It must be  
applied to the converter before the calibration step is initiated  
and remain stable until the step is complete. T he DRDY output  
from the device will signal when the step is complete by going  
low. After the zero-scale point is calibrated the full-scale point is  
applied and the second calibration step is initiated. Again the  
voltage must remain stable throughout the calibration step.  
T he digital output coding for the unipolar range is unipolar  
binary and for the bipolar range it is offset binary. Bit weights  
for the unipolar and bipolar modes are shown in T able I.  
ACCURACY  
T he two step calibration mode offers another feature. After the  
sequence has been completed, additional offset calibrations can  
be performed by themselves to adjust the zero reference point to  
a new system zero reference value. T his second system  
Sigma-delta ADCs, like VFCs and other integrating ADCs, do  
not contain any source of nonmonotonicity and inherently offer  
no missing codes performance.  
calibration mode uses an input voltage for the zero-scale  
calibration point but uses the VREF value for the full-scale point.  
T he AD7703 achieves excellent linearity by the use of high  
quality, on-chip silicon dioxide capacitors, which have a very  
SCLK  
SYSTEM  
REF HI  
SDATA  
SIGNAL  
CONDITIONING  
ANALOG  
MUX  
CAL  
SC1  
A
A
IN  
IN  
MICRO  
COMPUTER  
SYSTEM  
REF LO  
SC2  
A0  
A1  
AD7703  
Figure 12. Typical Connections for System Calibration  
REV. D  
–9–  
AD7703  
Initiating Calibr ation  
When self-calibration is completed, DRDY falls and the output  
port is updated with a data word that represents the analog  
input signal. When a system calibration step is completed,  
DRDY will fall and the output port will be updated with the  
appropriate data value (all 0s for the zero-scale point and all 1s  
for the full-scale point). In the system calibration mode, the  
digital filter must settle before the output code will represent the  
value of the analog input signal. T ables IV and V indicate the  
output code size and output coding of the AD7703 in its  
various modes. In these tables, SOFF is the measured system  
offset in volts and SGAIN is the measured system gain at the  
full-scale point in volts.  
T able III illustrates the calibration modes available in the  
AD7703. Not shown in the table is the function of the BP/UP  
pin which determines whether the converter has been calibrated  
to measure bipolar or unipolar signals. A calibration step is  
initiated by bringing the CAL pin high for at least 4 CLKIN  
cycles and then bringing it low again. T he states of SC1 and  
SC2 along with the BP/UP pin will determine the type of  
calibration to be performed. All three signals should be stable  
before the CAL pin is taken positive. T he SC1 and SC2 inputs  
are latched when CAL goes high. T he BP/UP input is not  
latched and therefore must remain in a fixed state throughout  
the calibration and measurement cycles. Any time the state of  
the BP/UP is changed, a new calibration cycle must be  
performed to enable the AD7703 to function properly in the  
new mode.  
Span and O ffset Lim its  
Whenever a system calibration mode is used, there are limits on  
the amount of offset and span which can be accommodated.  
T he range of input span in both the unipolar and bipolar modes  
has a minimum value of 0.8 VREF and a maximum value of  
2 (VREF + 0.1 V).  
When a calibration step is initiated, the DRDY signal will go  
high and remain high until the step is finished. T able III shows  
the number of clock cycles each calibration requires. Once a  
calibration step is initiated it must finish before a new calibra-  
tion step can be executed. In the two step system calibration  
mode, the offset calibration step must be initiated before initiat-  
ing the gain calibration step.  
T he amount of offset which can be accommodated depends on  
whether the unipolar or bipolar mode is being used. In unipolar  
mode, the system calibration modes can handle a maximum  
offset of 0.2 VREF and a minimum offset of –(VREF + 0.1 V).  
T hus the AD7703 in the unipolar mode can be calibrated to  
mimic bipolar operation.  
Table III. Calibration Truth Table  
ZERO -SCALE CAL FULL-SCALE CAL SEQUENCE  
CAL  
SC1  
SC2  
CAL TYP E  
CALIBRATIO N TIME  
0
1
0
1
0
1
1
0
Self-Cal  
VAGND  
AIN  
_
VREF  
_
AIN  
VREF  
One Step  
1st Step  
2nd Step  
One Step  
3,145,655 Clock Cycles  
1,052,599 Clock Cycles  
1,068,813 Clock Cycles  
2,117,389 Clock Cycles  
System Offset  
System Gain  
System Offset  
AIN  
NOT E  
DRDY remains high throughout the calibration sequence. In the Self-Cal mode, DRDY falls once the AD7703 has settled to the analog input. In all other modes  
DRDY falls as the device begins to settle.  
Table IV. O utput Code Size After Calibration  
1 LSB  
CAL MO D E  
ZERO -SCALE  
GAIN FACTO R  
UNIP O LAR  
BIP O LAR  
(VREF VAGND  
)
2(VREF VAGND )  
Self-Cal  
VAGND  
VREF  
1048576  
1048576  
(SGAIN SOFF  
)
2(SGAIN SOFF )  
System Cal  
SOFF  
SGAIN  
1048576  
1048576  
–10–  
REV. D  
AD7703  
Table V. AD 7703 O utput Coding  
I
NP UT VO LTAGE, UNIP O LAR MO D E INP UT VO LTAGE, BIP O LAR MO D E  
System Cal  
Self Cal  
O utput Codes  
Self-Cal  
System Cal  
>(SGAIN –1.5 LSB)  
>(VREF – 1.5 LSB)  
FFFFF  
>(VREF –1.5 LSB)  
>(SGAIN – 1.5 LSB)  
FFFFF  
FFFFE  
SGAIN – 1.5 LSB  
VREF – 1.5 LSB  
VREF – 1.5 LSB  
SGAIN – 1.5 LSB  
80000  
(SGAIN – SOFF)/2 – 0.5 LSB  
(VREF – VAGND)/2 – 0.5 LSB  
VAGND – 0.5 LSB  
SOFF – 0.5 LSB  
7FFFF  
00001  
00000  
SOFF + 0.5 LSB  
VAGND + 0.5 LSB  
–VREF + 0.5 LSB  
–SGAIN + 2 SOFF + 0.5 LSB  
<(–SGAIN +2 SOFF + 0.5 LSB)  
<(SOFF + 0.5 LSB)  
<(VAGND + 0.5 LSB)  
00000  
<(–VREF + 0.5 LSB)  
In the bipolar mode the system offset calibration range is  
restricted to ±0.4 VREF. It should be noted that the span  
restrictions limit the amount of offset which can be calibrated.  
T he span range of the converter in bipolar mode is equidistant  
around the voltage used for the zero scale point. When the zero-  
scale point is calibrated it must not cause either of the two  
endpoints of the bipolar transfer function to exceed the positive  
or the negative input overrange points (+VREF + 0.1) V or  
updated at a rate determined by the master clock, therefore the  
amount of offset drift which occurs will be proportional to the  
elapsed time between samples. T hus, to minimize offset drift at  
higher temperatures, higher CLKIN rates are recommended.  
Gain drift within the converter depends mainly upon the tem-  
perature tracking of the internal capacitors. It is not affected by  
leakage currents so that it is significantly less than offset drift.  
T he typical gain drift of the AD7703 is less than 40 LSBs over  
the specified temperature range.  
–VREF + 0.1) V. If the span range is set to a minimum (0.8 VREF  
)
the offset voltage can move +0.4 VREF without causing the end  
points of the transfer function to exceed the overrange points.  
Alternatively, if the span range is set to 2 VREF, the input offset  
cannot move more than +0.1 V or –0.1 V before an endpoint of  
the transfer function exceeds the input overrange limit.  
Measurement errors due to offset drift or gain drift can be elimi-  
nated at any time by recalibrating the converter. Using the sys-  
tem calibration mode can also minimize offset and gain errors in  
the signal conditioning circuitry. Integral and differential linear-  
ity are not significantly affected by temperature changes.  
P O WER-UP AND CALIBRATIO N  
160  
A calibration cycle must be carried out after power-up to  
initialize the device to a consistent starting condition and correct  
calibration. T he CAL pin must be held high for at least four  
clock cycles, after which calibration is initiated on the falling  
edge of CAL and takes a maximum of 3,145,655 clock cycles  
(approximately 768 ms with a 4.096 MHz clock). See T able III.  
CLKIN = 4.096MHz  
80  
0
–80  
T he type of calibration cycle initiated by CAL is determined by  
the SC1 and SC2 inputs, in accordance with T able III.  
–160  
–240  
–320  
D r ift Consider ations  
T he AD7703 uses chopper stabilization techniques to minimize  
input offset drift. Charge injection in the analog switches and  
leakage currents at the sampling node are the primary sources of  
offset voltage drift in the converter. Figure 13 indicates the typi-  
cal offset due to temperature changes after calibration at 25°C.  
Drift is relatively flat up to 75°C. Above this temperature, leak-  
age current becomes the main source of offset drift. Since leak-  
age current doubles approximately every 10°C, the offset drifts  
accordingly. T he value of the voltage on the sample capacitor is  
–55  
–35  
–15  
5
25  
45  
65  
85  
105  
125  
TEMPERATURE – °C  
Figure 13. Typical Bipolar Offset vs. Tem perature after  
Calibration at +25°C  
REV. D  
–11–  
AD7703  
INP UT SIGNAL CO ND ITIO NING  
An RC filter may be added in front of the AD7703 to reduce  
high frequency noise. With an external capacitor added from  
AIN to AGND, the following equation will specify the maximum  
allowable source resistance:  
Reference voltages from +1 V to +3 V may be used with the  
AD7703, with little degradation in performance. Input ranges  
that cannot be accommodated by this range of reference voltages  
may be achieved by input signal conditioning. T his may take the  
form of gain to accommodate a smaller signal range, or passive  
attenuation to reduce a larger input voltage range.  
62  
RS(MAX )  
=
CIN  
(CIN + CEXT  
VE  
100 mV •  
Sour ce Resistance  
)
fCLKIN •(CIN + CEXT ) ln  
If passive attenuators are used in front of the AD7703, care  
must be taken to ensure that the source impedance is suffi-  
ciently low. T he dc input resistance for the AD7703 is over  
1 G. In parallel with this there as a small dynamic load which  
varies with the clock frequency (see Figure 14). Each time the  
T he practical limit to the maximum value of source resistance is  
thermal (Johnson) noise. A practical resistor may be modeled as  
an ideal (noiseless) resistor in series with a noise voltage source  
or in parallel with a noise current source.  
R1  
A
AD7703  
IN  
V
IN  
Vn = 4 kTRf Volts  
1GΩ  
R2  
C
EXT  
in = 4 kTf /R Amperes  
C
10pF  
IN  
where k is Boltzmann’s constant (1.38 ϫ 10–23 J/K), and T is  
temperature in degrees Kelvin (°C + 273).  
V
100mV  
OS  
AGND  
Active signal conditioning circuits such as op amps generally do  
not suffer from problems of high source impedance. T heir open  
loop output resistance is normally only tens of ohms and, in any  
case, most modern general purpose op amps have sufficiently  
fast closed loop settling time for this not to be a problem. Offset  
voltage in op amps can be eliminated in a system calibration  
routine.  
Figure 14. Equivalent Input Circuit and Input Attenuator  
analog input is sampled, a 10 pF capacitor draws a charge  
packet of maximum 1 pC (10 pF ϫ 100 mV) from the analog  
source with a frequency fCLKIN/256. For a 4.096 MHz CLKIN,  
this yields an average current draw of 16 nA. After each sample  
the AD7703 allows 62 clock periods for the input voltage to  
settle. T he equation which defines settling time is:  
Antialias Consider ations  
T he digital filter of the AD7703 does not provide any rejection  
at integer multiples of the sampling frequency (nfCLKIN/256,  
where n = 1, 2, 3 . . . ).  
VO =VIN [1et / RC  
]
where VO, is the final settled value, VIN, is the value of the input  
signal, R is the value of the input source resistance, C is the  
With a 4.096 MHz master clock there are narrow (±10 Hz)  
bands at 16 kHz, 32 kHz, 48 kHz, etc., where noise passes  
unattenuated to the output.  
10 pF sample capacitor. T he value of t is equal to 62/fCLKIN  
.
T he following equation can be developed which gives the max-  
imum allowable source resistance, RS(MAX) for an error of VE.  
However, due to the AD7703’s high oversampling ratio of 800  
(16 kHz to 20 Hz) these bands occupy only a small fraction of  
the spectrum, and most broadband noise is filtered.  
62  
RS(MAX )  
=
T he reduction in broadband noise is given by:  
fCLKIN •(10 pF )•ln (100 mV /VE )  
Provided the source resistance is less than this value, the analog  
input will settle within the desired error band in the requisite 62  
clock periods. Insufficient settling leads to offset errors. T hese  
can be calibrated in system calibration schemes.  
eout = e 2 fC /f S = 0.035 e  
in  
in  
where ein and eout are rms noise terms referred to the input and fC  
is the filter –3 dB corner frequency (fCLKIN/409600) and fS is the  
sampling frequency (fCLKIN/256).  
If a limit of 600 nV (0.25 LSB at 20 bits) is set for the maxi-  
mum offset voltage, then the maximum allowable source resis-  
tance is 125 kfrom the above equation, assuming that there is  
no external stray capacitance.  
Since the ratio of fS to fCLKIN is fixed, the digital filter reduces  
broadband white noise by 96.5% independent of the master  
clock frequency.  
–12–  
REV. D  
AD7703  
T herefore, the two analog supplies should be individually  
decoupled to AGND using 100 nF ceramic capacitors to  
provide power supply noise rejection at these frequencies. T he  
two digital supplies should similarly be decoupled to DGND.  
VO LTAGE REFERENCE CO NNECTIO NS  
T he voltage applied to the VREF pin defines the analog input  
range. T he specified reference voltage is 2.5 V, but the AD7703  
will operate with reference voltages from 1 V to 3 V with little  
degradation in performance.  
T he positive digital supply (DVDD) must never exceed the  
positive analog supply (AVDD) by more than 0.3 V. Power  
supply sequencing is therefore important. If separate analog and  
digital supplies are used, care must be taken to ensure that the  
analog supply is powered up first.  
T he reference input presents exactly the same dynamic load as  
the analog input, but in the case of the reference input, source  
resistance and long settling time introduce gain errors rather  
than offset errors. Fortunately, most precision references have  
sufficiently low output impedance and wide enough bandwidth  
to settle to the required accuracy within 62 clock cycles.  
It is also important that power is applied to the AD7703 before  
signals at VREF, AIN or the logic input pins in order to avoid any  
possibility of latch-up. If separate supplies are used for the  
AD7703 and the system digital circuitry, then the AD7703  
should be powered up first.  
T he digital filter of the AD7703 removes noise from the refer-  
ence input, just as it does with noise at the analog input, and  
the same limitations apply regarding lack of noise rejection at  
integer multiples of the sampling frequency. Note that the refer-  
ence should be chosen to minimize noise below 10 Hz. T he  
AD7703 typically exhibits 1.6 LSB rms noise in its measure-  
ments. T his specification assumes a clean reference. Many  
monolithic bandgap references are available which can supply  
the 2.5 V needed for the AD7703. However, some of these are  
not specified for noise especially in the 0.1 Hz to 10 Hz band-  
width. If the reference noise in this bandwidth is excessive, it  
can degrade the performance of the AD7703. Recommended  
references are the AD580 and the LT 1019. Both of these 2.5 V  
references typically have less than 10 V p-p noise in the 0.1 Hz  
to 10 Hz band.  
A typical scheme for powering the AD7703 from a single set of  
±5 V rails is shown Figure 7. In this circuit AVDD and DVDD are  
brought along separate tracks from the same +5 V supply.  
T hus, there is no possibility of the digital supply coming up  
before the analog supply.  
SLEEP MO D E  
T he low power standby mode is initiated by taking the SLEEP  
input low, which shuts down all analog and digital circuits and  
reduces power consumption to 10 µW. When coming out of  
SLEEP mode it is sometimes possible (when using a crystal to  
generate CLKIN, for example) to lose the calibration coeffi-  
cients. T herefore, it is advisable as a safeguard to always do a  
calibration cycle after coming out of SLEEP mode.  
P O WER SUP P LIES AND GRO UND ING  
AGND is the ground reference voltage for the AD7703, and is  
completely independent of DGND. Any noise riding on the  
AGND input with respect to the system analog ground will  
cause conversion errors. AGND should therefore be used as the  
system ground and also as the ground for the analog input and  
the reference voltage.  
D IGITAL INTERFACE  
T he AD7703s serial communications port allows easy  
interfacing to industry standard microprocessors. T wo different  
modes of operation are available, optimized for different types  
of interface.  
T he analog and digital power supplies to the AD7703 are  
independent and separately pinned out, to minimize coupling  
between analog and digital sections of the device. T he digital  
filter will provide rejection of broadband noise on the power  
supplies, except at integer multiples of the sampling frequency.  
REV. D  
–13–  
AD7703  
SYNCH RO NO US SELF-CLO CKING MO D E (SSC)  
T he SSC mode (MODE pin high) allows easy interfacing to  
serial-parallel conversion circuits in systems with parallel data  
communication. T his mode allows interfacing to 74XX299  
Universal Shift registers without any additional decoding. T he  
SSC mode can also be used with microprocessors such as the  
68HC11 and 68HC05, which allow an external device to clock  
their serial port.  
SCLK will become active and the data word currently in the  
output register will be transmitted, MSB first. After the LSB has  
been transmitted DRDY will go high until the new data word  
becomes available. If CS, having been brought low, is taken  
high again at any time during data transmission, SDAT A and  
SCLK will go three-state after the current bit finishes. If CS is  
subsequently brought low, transmission will resume with the  
next bit during the subsequent digital computation period. If  
transmission has not been initiated and completed by the time  
the next data word is available, DRDY will go high for four  
clock cycles then low again as the new word is loaded into the  
output register.  
Figure 15 shows the timing diagram for the SSC mode. Data is  
clocked out by an internally generated serial clock. T he  
AD7703 divides each sampling interval into sixteen distinct  
periods. Eight periods of 64 clock pulses are for analog settling  
and eight periods of 64 clock pulses are for digital computation.  
T he status of CS is polled at the beginning of each digital  
computation period. If it is low at any of these times, then  
A more detailed diagram of the data transmission in the SSC  
mode is shown in Figure 16. Data bits change on the falling  
edge of SCLK and are valid on the rising edge of SCLK.  
1024 CLKIN CYCLES  
64 CLKIN  
CYCLES  
64 CLKIN  
CYCLES  
INTERNAL  
STATUS  
ANALOG TIME 0  
DIGITAL TIME 0  
DIGITAL TIME 7  
72 CLKIN CYCLES  
DRDY (O)  
CS POLLED  
CS (I)  
HI-Z  
HI-Z  
SCLK (O)  
MSB  
LSB  
HI-Z  
HI-Z  
SDATA (O)  
Figure 15. Tim ing Diagram for SSC Data Transm ission Mode  
CLKIN (I)  
72  
CLKIN  
CYCLES  
DRDY (O)  
CS (I)  
HI-Z  
HI-Z  
HI-Z  
HI-Z  
SDATA (O)  
DB18  
DB19 (MSB)  
DB17  
DB2  
DB1  
DB0 (LSB)  
SCLK (O)  
Figure 16. SSC Mode Showing Data Tim ing Relative to SCLK  
–14–  
REV. D  
AD7703  
SYNCH RO NO US EXTERNAL CLO CK MO D E (SEC)  
T he SEC mode (MODE pin grounded) is designed for direct  
interface to the synchronous serial ports of industry standard  
microprocessors such as the 68HC11 and 68HC05. T he SEC  
mode also allows customized interfaces, using I/O port pins, to  
microprocessors that do not have a direct fit with the AD7703’s  
other mode.  
D IGITAL NO ISE AND O UTP UT LO AD ING  
As mentioned earlier, the AD7703 divides its internal timing  
into two distinct phases, analog sampling and settling and digital  
computation. In the SSC mode, data is transmitted only during  
the digital computation periods, to minimize the effects of  
digital noise on analog performance. In the SEC mode data  
transmission is externally controlled, so this automatic safeguard  
does not exist. T o compensate, the AD7703 should be  
synchronized to the digital system clock via CLKIN when used  
in the SEC mode.  
As shown in Figure 17, a falling edge on CS enables the serial  
data output with the MSB initially valid. Subsequent data bits  
change on the falling edge of an externally supplied SCLK.  
After the LSB has been transmitted, DRDY and SDAT A go  
three-state. If CS is low and the AD7703 is still transmitting  
data when a new data word becomes available, the old data  
word continues to be transmitted and the new data is lost.  
Whatever mode of operation is used, resistive and capacitive  
loads on digital outputs should be minimized in order to reduce  
crosstalk between analog and digital portions of the circuit. For  
this reason connection to low-power CMOS logic such as one of  
the 4000 series or 74C families is recommended.  
If CS is taken high at any time during data transmission,  
SDAT A will go three-state immediately. If CS returns low, the  
AD7703 will continue transmission with the same data bit. If  
transmission has not been initiated and completed by the time  
the next data word becomes available, and if CS is high, DRDY  
will return high for four clock cycles, then fall as the new word is  
loaded into the output register.  
DRDY (O)  
CS (I)  
SCLK (O)  
HI-Z  
HI-Z  
SDATA (O)  
DB18  
DB19 (MSB)  
DB17  
DB2  
DB1  
DB0 (LSB)  
Figure 17. Tim ing Diagram for the SEC Mode  
REV. D  
–15–  
AD7703  
MECH ANICAL INFO RMATIO N  
D imensions shown in inches and (mm)  
20-P in P lastic D IP (Suffix N)  
20-P in Cer dip (Suffix Q)  
20-Lead SO IC (Suffix R)  
–16–  
REV. D  

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