AD7949BCPZRL7 [ADI]

14-Bit, 8-Channel, 250 kSPS PulSAR ADC; 14位, 8通道, 250 kSPS时的PulSAR ADC
AD7949BCPZRL7
型号: AD7949BCPZRL7
厂家: ADI    ADI
描述:

14-Bit, 8-Channel, 250 kSPS PulSAR ADC
14位, 8通道, 250 kSPS时的PulSAR ADC

转换器 模数转换器
文件: 总28页 (文件大小:746K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
14-Bit, 8-Channel,  
250 kSPS PulSAR ADC  
AD7949  
FEATURES  
FUNCTIONAL BLOCK DIAGRAM  
2.7V TO 5V  
0.5V TO 4.096V  
0.1µF  
0.5V TO VDD  
22µF  
14-bit resolution with no missing codes  
8-channel multiplexer with choice of inputs  
Unipolar single ended  
REFIN  
REF  
VDD  
Differential (GND sense)  
Pseudobipolar  
Throughput: 250 kSPS  
INL/DNL: 0.5 LSB typical  
SINAD: 85 dB @ 20 kHz  
THD: 100 dB @ 20 kHz  
Analog input range: 0 V to VREF with VREF up to VDD  
Multiple reference types  
1.8V  
TO  
VDD  
BAND GAP  
VIO  
REF  
AD7949  
TEMP  
SENSOR  
CNV  
IN0  
IN1  
IN2  
IN3  
IN4  
IN5  
IN6  
IN7  
SCK  
SDO  
DIN  
SPI SERIAL  
INTERFACE  
16-BIT SAR  
ADC  
MUX  
ONE-POLE  
LPF  
SEQUENCER  
Internal selectable 2.5 V or 4.096 V  
External buffered (up to 4.096 V)  
External (up to VDD)  
COM  
GND  
Internal temperature sensor  
Channel sequencer, selectable 1-pole filter, busy indicator  
No pipeline delay, SAR architecture  
Single-supply 2.7 V to 5.5 V operation with  
1.8 V to 5 V logic interface  
Figure 1.  
Table 1. Multichannel 14-/16-Bit PulSAR® ADC  
Type  
Channels 250 kSPS  
500 kSPS ADC Driver  
14-Bit  
16-Bit  
16-Bit  
8
4
8
AD7949  
AD7682  
AD7689  
ADA4841-x  
ADA4841-x  
Serial interface compatible with SPI, MICROWIRE,  
QSPI, and DSP  
AD7699  
ADA4841-x  
Power dissipation  
2.9 mW @ 2.5 V/200 kSPS  
10.8 mW @ 5 V/250 kSPS  
GENERAL DESCRIPTION  
The AD7949 is an 8-channel, 14-bit, charge redistribution  
successive approximation register (SAR) analog-to-digital  
converter (ADC) that operates from a single power supply, VDD.  
Standby current: 50 nA  
20-lead 4 mm × 4 mm LFCSP package  
APPLICATIONS  
The AD7949 contains all components for use in a multichannel,  
low power data acquisition system, including a true 14-bit SAR  
ADC with no missing codes; an 8-channel, low crosstalk multi-  
plexer useful for configuring the inputs as single ended (with or  
without ground sense), differential, or bipolar; an internal low  
drift reference (selectable 2.5 V or 4.096 V) and buffer; a  
Battery-powered equipment  
Medical instruments: ECG/EKG  
Mobile communications: GPS  
Personal digital assistants  
Power line monitoring  
Data acquisition  
Seismic data acquisition systems  
Instrumentation  
Process control  
temperature sensor; a selectable one-pole filter; and a sequencer  
that is useful when channels are continuously scanned in order.  
The AD7949 uses a simple SPI interface for writing to the  
configuration register and receiving conversion results. The SPI  
interface uses a separate supply, VIO, which is set to the host  
logic level. Power dissipation scales with throughput.  
The AD7949 is housed in a tiny 20-lead LFCSP with operation  
specified from −40°C to +85°C.  
Rev. A  
Information furnished by Analog Devices is believed to be accurate and reliable. However, no  
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other  
rights of third parties that may result from its use. Specifications subject to change without notice. No  
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.  
Trademarks and registeredtrademarks arethe property of their respective owners.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781.329.4700  
Fax: 781.461.3113  
www.analog.com  
©2008 Analog Devices, Inc. All rights reserved.  
 
AD7949  
TABLE OF CONTENTS  
Features .............................................................................................. 1  
Typical Connection Diagrams .................................................. 16  
Analog Inputs ............................................................................. 17  
Driver Amplifier Choice ........................................................... 18  
Voltage Reference Output/Input .............................................. 19  
Power Supply............................................................................... 20  
Supplying the ADC from the Reference.................................. 20  
Digital Interface.............................................................................. 21  
Configuration Register, CFG.................................................... 22  
Applications....................................................................................... 1  
Functional Block Diagram .............................................................. 1  
General Description......................................................................... 1  
Revision History ............................................................................... 2  
Specifications..................................................................................... 3  
Timing Specifications....................................................................... 6  
Absolute Maximum Ratings............................................................ 8  
ESD Caution.................................................................................. 8  
Pin Configuration and Function Descriptions............................. 9  
Typical Performance Characteristics ........................................... 10  
Terminology .................................................................................... 13  
Theory of Operation ...................................................................... 14  
Overview...................................................................................... 14  
Converter Operation.................................................................. 14  
Transfer Functions...................................................................... 15  
Read/Write Spanning Conversion Without a  
Busy Indicator............................................................................. 23  
Read/Write Spanning Conversion with a Busy Indicator..... 24  
Application Hints ........................................................................... 25  
Layout .......................................................................................... 25  
Evaluating AD7949 Performance............................................. 25  
Outline Dimensions....................................................................... 26  
Ordering Guide .......................................................................... 26  
REVISION HISTORY  
5/08—Rev. 0 to Rev. A  
Changes to Ordering Guide .......................................................... 26  
5/08—Revision 0: Initial Version  
Rev. A | Page 2 of 28  
 
AD7949  
SPECIFICATIONS  
VDD = 2.5 V to 5.5 V, VIO = 2.3 V to VDD, VREF = VDD, all specifications TMIN to TMAX, unless otherwise noted.  
Table 2.  
Parameter  
Conditions/Comments  
Min  
Typ  
Max  
Unit  
RESOLUTION  
ANALOG INPUT  
Voltage Range  
14  
Bits  
Unipolar mode  
Bipolar mode  
Positive input, unipolar and bipolar modes  
Negative or COM input, unipolar mode  
Negative or COM input, bipolar mode  
fIN = 250 kHz  
0
+VREF  
V
V
−VREF/2  
−0.1  
−0.1  
+VREF/2  
VREF + 0.1  
+0.1  
Absolute Input Voltage  
VREF/2 − 0.1  
VREF/2  
68  
1
VREF/2 + 0.1  
Analog Input CMRR  
Leakage Current at 25°C  
Input Impedance1  
THROUGHPUT  
dB  
nA  
Acquisition phase  
Conversion Rate  
Full Bandwidth2  
VDD = 4.5 V to 5.5 V  
VDD = 2.3 V to 4.5 V  
VDD = 4.5 V to 5.5 V  
VDD = 2.3 V to 4.5 V  
Full-scale step, full bandwidth  
Full-scale step, ¼ bandwidth  
0
0
0
0
250  
200  
62.5  
50  
1.8  
14.8  
kSPS  
kSPS  
kSPS  
kSPS  
μs  
¼ Bandwidth2  
Transient Response  
μs  
ACCURACY  
No Missing Codes  
Integral Linearity Error  
Differential Linearity Error  
Transition Noise  
14  
−1  
−1  
Bits  
0.5  
0.25  
0.1  
0.5  
0.2  
1
0.5  
0.2  
1
+1  
+1  
LSB3  
LSB  
LSB  
LSB  
LSB  
ppm/°C  
LSB  
LSB  
ppm/°C  
LSB  
REF = VDD = 5 V  
Gain Error4  
−5  
−1  
+5  
+1  
Gain Error Match  
Gain Error Temperature Drift  
Offset Error4  
Offset Error Match  
Offset Error Temperature Drift  
Power Supply Sensitivity  
−1  
+1  
0.2  
VDD = 5 V ± 5%  
Rev. A | Page 3 of 28  
 
 
 
AD7949  
Parameter  
Conditions/Comments  
Min  
84.5  
84  
Typ  
Max  
Unit  
AC ACCURACY5  
Dynamic Range  
Signal-to-Noise  
85.6  
85.5  
85  
84  
85  
33.5  
85  
84  
−100  
108  
−125  
dB6  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
fIN = 20 kHz, VREF = 5 V  
fIN = 20 kHz, VREF = 4.096 V internal REF  
fIN = 20 kHz, VREF = 2.5 V internal REF  
fIN = 20 kHz, VREF = 5 V  
fIN = 20 kHz, VREF = 5 V, −60 dB input  
fIN = 20 kHz, VREF = 4.096 V internal REF  
fIN = 20 kHz, VREF = 2.5 V internal REF  
fIN = 20 kHz  
SINAD  
Total Harmonic Distortion  
Spurious-Free Dynamic Range  
Channel-to-Channel Crosstalk  
SAMPLING DYNAMICS  
−3 dB Input Bandwidth  
Aperture Delay  
fIN = 20 kHz  
fIN = 100 kHz on adjacent channel(s)  
Selectable  
VDD = 5 V  
0.425  
1.7  
2.5  
MHz  
ns  
INTERNAL REFERENCE  
REF Output Voltage  
2.5 V, @ 25°C  
4.096 V, @ 25°C  
2.5 V, @ 25°C  
4.096 V, @ 25°C  
2.490  
4.086  
2.500  
4.096  
1.2  
2.3  
300  
10  
15  
50  
5
2.510  
4.106  
V
V
V
V
REFIN Output Voltage7  
REF Output Current  
Temperature Drift  
Line Regulation  
ꢀA  
ppm/°C  
ppm/V  
ppm  
ms  
VDD = 5 V 5%  
1000 hours  
CREF = 10 ꢀF  
Long-Term Drift  
Turn-On Settling Time  
EXTERNAL REFERENCE  
Voltage Range  
REF input  
REFIN input (buffered)  
250 kSPS, REF = 5 V  
0.5  
0.5  
VDD + 0.3  
VDD − 0.2  
V
V
ꢀA  
Current Drain  
50  
TEMPERATURE SENSOR  
Output Voltage8  
Temperature Sensitivity  
@ 25°C  
283  
1
mV  
mV/°C  
DIGITAL INPUTS  
Logic Levels  
VIL  
VIH  
IIL  
IIH  
−0.3  
0.7 × VIO  
−1  
+0.3 × VIO  
VIO + 0.3  
+1  
V
V
ꢀA  
ꢀA  
−1  
+1  
DIGITAL OUTPUTS  
Data Format9  
Pipeline Delay10  
VOL  
ISINK = +500 ꢀA  
ISOURCE = −500 ꢀA  
0.4  
V
V
VOH  
VIO − 0.3  
Rev. A | Page 4 of 28  
AD7949  
Parameter  
POWER SUPPLIES  
VDD  
Conditions/Comments  
Min  
Typ  
Max  
Unit  
Specified performance  
Specified performance  
Operating range  
2.3  
2.3  
1.8  
5.5  
VDD + 0.3  
VDD + 0.3  
V
V
V
VIO  
Standby Current11, 12  
Power Dissipation  
VDD and VIO = 5 V, @ 25°C  
VDD = 2.5 V, 100 SPS throughput  
VDD = 2.5V, 100 kSPS throughput  
VDD = 2.5 V, 200 kSPS throughput  
VDD = 5 V , 250 kSPS throughput  
50  
1.5  
1.45  
2.9  
10.8  
13.5  
nA  
ꢀW  
mW  
mW  
mW  
mW  
2.0  
4.0  
12.5  
15.5  
VDD = 5 V, 250 kSPS throughput with internal  
reference  
Energy per Conversion  
TEMPERATURE RANGE13  
Specified Performance  
50  
nJ  
°C  
TMIN to TMAX  
−40  
+85  
1 See the Analog Inputs section.  
2 The bandwidth is set with the configuration register  
3 LSB means least significant bit. With the 5 V input range, one LSB = 305 ꢀV.  
4 See the Terminology section. These specifications include full temperature range variation but not the error contribution from the external reference.  
5 With VDD = 5 V, unless otherwise noted.  
6 All specifications expressed in decibels are referred to a full-scale input FSR and tested with an input signal at 0.5 dB below full scale, unless otherwise specified.  
7 This is the output from the internal band gap.  
8 The output voltage is internal and present on a dedicated multiplexer input.  
9 Unipolar mode: serial 14-bit straight binary.  
Bipolar mode: serial 14-bit twos complement.  
10 Conversion results available immediately after completed conversion.  
11 With all digital inputs forced to VIO or GND as required.  
12 During acquisition phase.  
13 Contact an Analog Devices, Inc., sales representative for the extended temperature range.  
Rev. A | Page 5 of 28  
 
 
AD7949  
TIMING SPECIFICATIONS  
VDD = 4.5 V to 5.5 V, VIO = 2.3 V to VDD, all specifications TMIN to TMAX, unless otherwise noted.  
Table 3. 1  
Parameter  
Symbol  
tCONV  
tACQ  
Min  
Typ  
Max  
Unit  
ꢀs  
ꢀs  
ꢀs  
ns  
ꢀs  
ns  
ns  
Conversion Time: CNV Rising Edge to Data Available  
Acquisition Time  
Time Between Conversions  
CNV Pulse Width  
Data Write/Read During Conversion  
SCK Period  
SCK Low Time  
2.2  
1.8  
4
10  
tCYC  
tCNVH  
tDATA  
tSCK  
1.0  
15  
7
tSCKL  
SCK High Time  
tSCKH  
tHSDO  
tDSDO  
7
4
ns  
ns  
SCK Falling Edge to Data Remains Valid  
SCK Falling Edge to Data Valid Delay  
VIO Above 4.5 V  
VIO Above 3 V  
VIO Above 2.7 V  
16  
17  
18  
19  
ns  
ns  
ns  
ns  
VIO Above 2.3 V  
CNV Low to SDO D15 MSB Valid  
VIO Above 4.5 V  
VIO Above 3 V  
VIO Above 2.7 V  
VIO Above 2.3 V  
CNV High or Last SCK Falling Edge to SDO High Impedance  
CNV Low to SCK Rising Edge  
DIN Valid Setup Time from SCK Falling Edge  
DIN Valid Hold Time from SCK Falling Edge  
tEN  
15  
17  
18  
22  
25  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tDIS  
tCLSCK  
tSDIN  
tHDIN  
10  
4
4
1 See Figure 2 and Figure 3 for load conditions.  
Rev. A | Page 6 of 28  
 
 
AD7949  
VDD = 2.3 V to 4.5 V, VIO = 2.3 V to VDD, all specifications TMIN to TMAX, unless otherwise noted.  
Table 4. 1  
Parameter  
Symbol  
tCONV  
tACQ  
Min  
Typ  
Max  
Unit  
ꢀs  
ꢀs  
ꢀs  
ns  
ꢀs  
ns  
ns  
ns  
Conversion Time: CNV Rising Edge to Data Available  
Acquisition Time  
Time Between Conversions  
CNV Pulse Width  
Data Write/Read During Conversion  
SCK Period  
SCK Low Time  
3.2  
1.8  
5
10  
tCYC  
tCNVH  
tDATA  
tSCK  
1.0  
25  
12  
12  
5
tSCKL  
SCK High Time  
tSCKH  
tHSDO  
tDSDO  
SCK Falling Edge to Data Remains Valid  
SCK Falling Edge to Data Valid Delay  
VIO Above 3 V  
VIO Above 2.7 V  
VIO Above 2.3 V  
ns  
24  
30  
37  
ns  
ns  
ns  
CNV Low to SDO D15 MSB Valid  
VIO Above 3 V  
VIO Above 2.7 V  
tEN  
21  
27  
35  
50  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
VIO Above 2.3 V  
CNV High or Last SCK Falling Edge to SDO High Impedance  
CNV Low to SCK Rising Edge  
SDI Valid Setup Time from SCK Falling Edge  
SDI Valid Hold Time from SCK Falling Edge  
tDIS  
tCLSCK  
tSDIN  
tHDIN  
10  
5
5
1 See Figure 2 and Figure 3 for load conditions.  
I
500µA  
OL  
1.4V  
TO SDO  
C
L
50pF  
500µA  
I
OH  
Figure 2. Load Circuit for Digital Interface Timing  
70% VIO  
30% VIO  
tDELAY  
tDELAY  
1
1
2V OR VIO – 0.5V  
2V OR VIO – 0.5V  
2
2
0.8V OR 0.5V  
0.8V OR 0.5V  
1
2V IF VIO ABOVE 2.5V, VIO – 0.5V IF VIO BELOW 2.5V.  
0.8V IF VIO ABOVE 2.5V, 0.5V IF VIO BELOW 2.5V.  
2
Figure 3. Voltage Levels for Timing  
Rev. A | Page 7 of 28  
 
AD7949  
ABSOLUTE MAXIMUM RATINGS  
Table 5.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Parameter  
Analog Inputs  
INx,1 COM1  
Rating  
GND − 0.3 V to VDD + 0.3 V  
or VDD 130 mA  
REF, REFIN  
GND − 0.3 V to VDD + 0.3 V  
Supply Voltages  
VDD, VIO to GND  
VDD to VIO  
DIN, CNV, SCK to GND2  
−0.3 V to +7 V  
7 V  
−0.3 V to VIO + 0.3 V  
−0.3 V to VIO + 0.3 V  
−65°C to +150°C  
150°C  
ESD CAUTION  
SDO to GND  
Storage Temperature Range  
Junction Temperature  
θJA Thermal Impedance (LFCSP)  
θJC Thermal Impedance (LFCSP)  
47.6°C/W  
4.4°C/W  
1 See the Analog Inputs section.  
2 CNV must be low during power up. See the Power Supply section.  
Rev. A | Page 8 of 28  
 
 
 
 
 
AD7949  
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS  
PIN 1  
INDICATOR  
VDD  
REF  
REFIN  
GND  
1
2
3
4
5
15 VIO  
14 SDO  
13 SCK  
12 DIN  
11 CNV  
AD7949  
TOP VIEW  
(Not to Scale)  
GND  
Figure 4. 20-Lead LFCSP Pin Configuration  
Table 6. Pin Function Descriptions  
Pin No.  
Mnemonic  
Type1  
Description  
1, 20  
VDD  
P
Power Supply. Nominally 2.5 V to 5.5 V when using an external reference and decoupled with  
10 μF and 100 nF capacitors.  
When using the internal reference for 2.5 V output, the minimum should be 3.0 V.  
When using the internal reference for 4.096 V output, the minimum should be 4.5 V.  
2
REF  
AI/O  
Reference Input/Output. See the Voltage Reference Output/Input section.  
When the internal reference is enabled, this pin produces a selectable system reference = 2.5 V or  
4.096 V.  
When the internal reference is disabled and the buffer is enabled, REF produces a buffered  
version of the voltage present on the REFIN pin (4.096 V maximum) useful when using low cost,  
low power references.  
For improved drift performance, connect a precision reference to REF (0.5 V to VDD).  
For any reference method, this pin needs decoupling with an external 10 μF capacitor  
connected as close to REF as possible. See the Reference Decoupling section.  
3
REFIN  
AI/O  
Internal Reference Output/Reference Buffer Input. See the Voltage Reference Output/Input  
section.  
When using the internal reference, the internal unbuffered reference voltage is present and  
needs decoupling with a 0.1μF capacitor.  
When using the internal reference buffer, apply a source between 0.5 V and 4.096 V that is  
buffered to the REF pin as described above.  
4, 5  
GND  
P
Power Supply Ground.  
6 to 9  
10  
IN4 to IN7  
COM  
AI  
AI  
Channel 4 through Channel 7 Analog Inputs.  
Common Channel Input. All channels [7:0] can be referenced to a common mode point of 0 V or  
V
REF/2 V.  
11  
12  
13  
14  
CNV  
DIN  
SCK  
SDO  
DI  
Convert Input. On the rising edge, CNV initiates the conversion. During conversion, if CNV is  
held high, the busy indictor is enabled.  
Data Input. This input is used for writing to the 14-bit configuration register. The configuration  
register can be written to during and after conversion.  
Serial Data Clock Input. This input is used to clock out the data on ADO and clock in data on DIN  
in an MSB first fashion.  
Serial Data Output. The conversion result is output on this pin synchronized to SCK. In unipolar  
modes, conversion results are straight binary; in bipolar modes, conversion results are twos  
complement.  
DI  
DI  
DO  
15  
VIO  
P
Input/Output Interface Digital Power. Nominally at the same supply as the host interface (1.8 V,  
2.5 V, 3 V, or 5 V).  
16 to 19 IN0 to IN3  
AI  
Channel 0 through Channel 3 Analog Inputs.  
1AI = analog input, AI/O = analog input/output, DI = digital input, DO = digital output, and P = power.  
Rev. A | Page 9 of 28  
 
 
AD7949  
TYPICAL PERFORMANCE CHARACTERISTICS  
VDD = 2.5 V to 5.5 V, VREF = 2.5 V to 5 V, VIO = 2.3 V to VDD  
1.0  
1.0  
0.5  
0.5  
0
0
–0.5  
–1.0  
–0.5  
–1.0  
0
4,096  
8,192  
0
4,096  
8,192  
12,288  
16,384  
12,288  
16,384  
CODES  
CODES  
Figure 5. Integral Nonlinearity vs. Code, VREF = VDD = 5 V  
Figure 8. Differential Nonlinearity vs. Code, VREF = VDD = 5 V  
300k  
300k  
V
= VDD = 5V  
REF  
261,120  
259,473  
V
= V = 2.5V  
DD  
REF  
250k  
200k  
150k  
100k  
50k  
250k  
200k  
150k  
100k  
50k  
955  
693  
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
1FFC 1FFD 1FFE 1FFF 2000  
CODE IN HEX  
2001  
2002  
2003  
1FFC 1FFD 1FFE 1FFF 2000 2001 2002 2003 2004  
CODE IN HEX  
Figure 6. Histogram of a DC Input at Code Center  
Figure 9. Histogram of a DC Input at Code Center  
0
–20  
–40  
–60  
–80  
0
–20  
V
= VDD = 5V  
V
= VDD = 2.5V  
fSR=EF250kSPS  
fsR=E2F00kSPS  
fIN = 19.9kHz  
SNR = 85.3dB  
SINAD = 85.2dB  
THD = –100dB  
SFDR = 103dB  
fIN = 19.9kHz  
SNR = 84.2dB  
SINAD = 82.4dB  
THD = –84dB  
SFDR = 85dB  
–40  
–60  
SECOND HARMONIC = –110dB  
THIRD HARMONIC = –103dB  
SECOND HARMONIC = –100dB  
THIRD HARMONIC = –85dB  
–80  
–100  
–120  
–140  
–160  
–180  
–100  
–120  
–140  
–160  
0
25  
50  
75  
100  
125  
0
25  
50  
75  
100  
FREQUENCY (kHz)  
FREQUENCY (kHz)  
Figure 7. 20 kHz FFT, VREF = VDD = 5 V  
Figure 10. 20 kHz FFT, VREF = VDD = 2.5 V  
Rev. A | Page 10 of 28  
 
AD7949  
90  
85  
80  
75  
70  
65  
60  
90  
85  
80  
75  
70  
65  
60  
VDD = V  
VDD = V  
VDD = V  
VDD = V  
= 5V, –0.5dB  
= 5V, –10dB  
= 2.5V, –0.5dB  
= 2.5V, –10dB  
VDD = V  
VDD = V  
VDD = V  
VDD = V  
= 5V, –0.5dB  
= 5V, –10dB  
= 2.5V, –0.5dB  
= 2.5V, –10dB  
REF  
REF  
REF  
REF  
REF  
REF  
REF  
REF  
0
50  
100  
150  
200  
0
50  
100  
150  
200  
FREQUENCY (kHz)  
FREQUENCY (kHz)  
Figure 11. SNR vs. Frequency  
Figure 14. SINAD vs. Frequency  
88  
86  
84  
82  
80  
78  
15.5  
15.0  
14.5  
14.0  
13.5  
13.0  
130  
125  
120  
115  
110  
105  
100  
95  
–60  
SNR  
–65  
SINAD  
ENOB  
–70  
–75  
–80  
SFDR  
THD  
–85  
–90  
–95  
90  
–100  
–105  
–110  
–115  
85  
80  
75  
70  
–120  
5.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
4.5  
5.0  
5.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
4.5  
5.0  
REFERENCE VOLTAGE (V)  
REFERENCE VOLTAGE (V)  
Figure 12. SNR, SINAD, and ENOB vs. Reference Voltage  
Figure 15. SFDR and THD vs. Reference Voltage  
90  
85  
80  
75  
70  
65  
60  
–90  
–95  
fIN = 20kHz  
fIN = 20kHz  
VDD = V  
VDD = V  
= 5V  
REF  
= 2.5V  
REF  
VDD = V  
REF  
= 5V  
VDD = V  
REF  
= 2.5V  
–100  
–105  
–110  
125  
125  
–55  
–35  
–15  
5
25  
45  
65  
85  
105  
–55  
–35  
–15  
5
25  
45  
65  
85  
105  
TEMPERATURE (°C)  
TEMPERATURE (°C)  
Figure 13. SNR vs. Temperature  
Figure 16. THD vs. Temperature  
Rev. A | Page 11 of 28  
AD7949  
–60  
2750  
2500  
2250  
2000  
1750  
1500  
1250  
1000  
750  
100  
90  
80  
70  
60  
50  
40  
30  
20  
2.5V INTERNAL REF  
fS = 200kSPS  
4.096V INTERNAL REF  
INTERNAL BUFFER, TEMP ON  
INTERNAL BUFFER, TEMP OFF  
EXTERNAL REF, TEMP ON  
EXTERNAL REF, TEMP OFF  
VIO  
–70  
–80  
–90  
–100  
–110  
VDD = V  
VDD = V  
VDD = V  
VDD = V  
= 5V, –0.5dB  
= 2.5V, –0.5dB  
= 2.5V, –10dB  
= 5V, –10dB  
REF  
REF  
REF  
REF  
–120  
0
50  
100  
FREQUENCY (kHz)  
150  
200  
2.5  
3.0  
3.5  
4.0  
4.5  
5.0  
5.5  
VDD SUPPLY (V)  
Figure 17. THD vs. Frequency  
Figure 20. Operating Currents vs. Supply  
90  
89  
88  
87  
86  
85  
84  
83  
82  
81  
80  
79  
3000  
2750  
2500  
2250  
2000  
1750  
1500  
1250  
1000  
180  
160  
140  
120  
100  
80  
fIN = 20kHz  
fS = 200kSPS  
VDD = V  
REF  
= 5V  
VDD = 5V, INTERNAL 4.096V REF  
VDD = V  
REF  
= 2.5V  
VDD = 5V, EXTERNAL REF  
VDD = 2.5, EXTERNAL REF  
60  
VIO  
85  
40  
20  
125  
78  
–10  
–8  
–6  
–4  
–2  
0
–55  
–35  
–15  
5
25  
45  
65  
105  
INPUT LEVEL (dB)  
TEMPERATURE (°C)  
Figure 18. SNR vs. Input Level  
Figure 21. Operating Currents vs. Temperature  
2
1
25  
20  
15  
10  
5
VDD = 2.5V, 85°C  
VDD = 2.5V, 25°C  
0
VDD = 5V, 85°C  
VDD = 5V, 25°C  
–1  
UNIPOLAR ZERO  
UNIPOLAR GAIN  
BIPOLAR ZERO  
BIPOLAR GAIN  
VDD = 3.3V, 85°C  
VDD = 3.3V, 25°C  
0
–2  
125  
–55  
–35  
–15  
5
25  
45  
65  
85  
105  
0
20  
40  
60  
80  
100  
120  
TEMPERATURE (°C)  
SDO CAPACITIVE LOAD (pF)  
Figure 19. Offset and Gain Errors vs. Temperature  
Figure 22. tDSDO Delay vs. SDO Capacitance Load and Supply  
Rev. A | Page 12 of 28  
 
AD7949  
TERMINOLOGY  
Least Significant Bit (LSB)  
Signal-to-Noise Ratio (SNR)  
The LSB is the smallest increment that can be represented by a  
converter. For an analog-to-digital converter with N bits of  
resolution, the LSB expressed in volts is  
SNR is the ratio of the rms value of the actual input signal to the  
rms sum of all other spectral components below the Nyquist  
frequency, excluding harmonics and dc. The value for SNR is  
expressed in decibels.  
VREF  
2N  
LSB (V) =  
Signal-to-(Noise + Distortion) Ratio (SINAD)  
SINAD is the ratio of the rms value of the actual input signal to  
the rms sum of all other spectral components below the Nyquist  
frequency, including harmonics but excluding dc. The value for  
SINAD is expressed in decibels.  
Integral Nonlinearity Error (INL)  
INL refers to the deviation of each individual code from a line  
drawn from negative full scale through positive full scale. The  
point used as negative full scale occurs ½ LSB before the first  
code transition. Positive full scale is defined as a level 1½ LSB  
beyond the last code transition. The deviation is measured from  
the middle of each code to the true straight line (see Figure 24).  
Total Harmonic Distortion (THD)  
THD is the ratio of the rms sum of the first five harmonic  
components to the rms value of a full-scale input signal and is  
expressed in decibels.  
Differential Nonlinearity Error (DNL)  
Spurious-Free Dynamic Range (SFDR)  
SFDR is the difference, in decibels, between the rms amplitude  
of the input signal and the peak spurious signal.  
In an ideal ADC, code transitions are 1 LSB apart. DNL is the  
maximum deviation from this ideal value. It is often specified in  
terms of resolution for which no missing codes are guaranteed.  
Effective Number of Bits (ENOB)  
ENOB is a measurement of the resolution with a sine wave  
input. It is related to SINAD by the formula  
Offset Error  
The first transition should occur at a level ½ LSB above analog  
ground. The unipolar offset error is the deviation of the actual  
transition from that point.  
ENOB = (SINADdB − 1.76)/6.02  
and is expressed in bits.  
Gain Error  
Channel-to-Channel Crosstalk  
The last transition (from 111 … 10 to 111 … 11) should occur  
for an analog voltage 1½ LSB below the nominal full scale. The  
gain error is the deviation in LSB (or percentage of full-scale  
range) of the actual level of the last transition from the ideal  
level after the offset error is adjusted out. Closely related is the  
full-scale error (also in LSB or percentage of full-scale range),  
which includes the effects of the offset error.  
Channel-to-channel crosstalk is a measure of the level of  
crosstalk between any two adjacent channels. It is measured by  
applying a dc to the channel under test and applying a full-scale,  
100 kHz sine wave signal to the adjacent channel(s). The  
crosstalk is the amount of signal that leaks into the test channel  
and is expressed in decibels.  
Reference Voltage Temperature Coefficient  
Aperture Delay  
Reference voltage temperature coefficient is derived from the  
typical shift of output voltage at 25°C on a sample of parts at the  
maximum and minimum reference output voltage (VREF) meas-  
ured at TMIN, T (25°C), and TMAX. It is expressed in ppm/°C as  
Aperture delay is the measure of the acquisition performance. It  
is the time between the rising edge of the CNV input and the  
point at which the input signal is held for a conversion.  
Transient Response  
Transient response is the time required for the ADC to accurately  
acquire its input after a full-scale step function is applied.  
V
REF (Max) VREF (Min)  
TCVREF (ppm/°C) =  
×106  
V
REF (25°C) × (TMAX TMIN )  
where:  
Dynamic Range  
V
V
V
REF (Max) = maximum VREF at TMIN, T (25°C), or TMAX.  
Dynamic range is the ratio of the rms value of the full scale to  
the total rms noise measured with the inputs shorted together.  
The value for dynamic range is expressed in decibels.  
REF (Min) = minimum VREF at TMIN, T (25°C), or TMAX  
.
REF (25°C) = VREF at 25°C.  
T
T
MAX = +85°C.  
MIN = –40°C.  
Rev. A | Page 13 of 28  
 
 
AD7949  
THEORY OF OPERATION  
INx+  
SWITCHES CONTROL  
CONTROL  
MSB  
LSB  
SW+  
8,192C  
8,192C  
4,096C  
4C  
4C  
2C  
2C  
C
C
C
C
BUSY  
REF  
COMP  
LOGIC  
GND  
OUTPUT CODE  
4,096C  
MSB  
LSB  
SW–  
CNV  
INx– OR  
COM  
Figure 23. ADC Simplified Schematic  
OVERVIEW  
CONVERTER OPERATION  
The AD7949 is an 8-channel, 14-bit, charge redistribution  
successive approximation register (SAR) analog-to-digital  
converter (ADC). The AD7949 is capable of converting 250,000  
samples per second (250 kSPS) and powers down between  
conversions. For example, when operating with an external  
reference at 1 kSPS, it consumes 15 μW typically, ideal for  
battery-powered applications.  
The AD7949 is a successive approximation ADC based on a  
charge redistribution DAC. Figure 23 shows the simplified  
schematic of the ADC. The capacitive DAC consists of two  
identical arrays of 14 binary-weighted capacitors, which are  
connected to the two comparator inputs.  
During the acquisition phase, terminals of the array tied to the  
comparator input are connected to GND via SW+ and SW−. All  
independent switches are connected to the analog inputs.  
The AD7949 contains all of the components for use in a multi-  
channel, low power, data acquisition system, including  
Thus, the capacitor arrays are used as sampling capacitors and  
acquire the analog signal on the INx+ and INx− (or COM)  
inputs. When the acquisition phase is complete and the CNV  
input goes high, a conversion phase is initiated. When the  
conversion phase begins, SW+ and SW− are opened first. The  
two capacitor arrays are then disconnected from the inputs and  
connected to the GND input. Therefore, the differential voltage  
between the INx+ and INx− (or COM) inputs captured at the  
end of the acquisition phase is applied to the comparator inputs,  
causing the comparator to become unbalanced. By switching  
each element of the capacitor array between GND and CAP, the  
comparator input varies by binary-weighted voltage steps  
(VREF/2, VREF/4, ... VREF/16,384). The control logic toggles these  
switches, starting with the MSB, to bring the comparator back  
into a balanced condition. After the completion of this process,  
the part returns to the acquisition phase, and the control logic  
generates the ADC output code and a busy signal indicator.  
14-bit SAR ADC with no missing codes  
8-channel, low crosstalk multiplexer  
Internal low drift reference and buffer  
Temperature sensor  
Selectable one-pole filter  
Channel sequencer  
These components are configured through an SPI-compatible,  
14-bit register. Conversion results, also SPI compatible, can be  
read after or during conversions with the option for reading  
back the current configuration.  
The AD7949 provides the user with an on-chip track-and-hold  
and does not exhibit pipeline delay or latency.  
The AD7949 is specified from 2.3 V to 5.5 V and can be  
interfaced to any 1.8 V to 5 V digital logic family. It is housed in  
a 20-lead, 4 mm × 4 mm LFCSP that combines space savings  
and allows flexible configurations. It is pin-for-pin compatible  
with the 16-bit AD7682, AD7699, and AD7689.  
Because the AD7949 has an on-board conversion clock, the  
serial clock, SCK, is not required for the conversion process.  
Rev. A | Page 14 of 28  
 
 
 
AD7949  
TRANSFER FUNCTIONS  
TWOS  
COMPLEMENT  
STRAIGHT  
BINARY  
With the inputs configured for unipolar range (single ended,  
COM with ground sense, or paired differentially with INx− as  
ground sense), the data output is straight binary.  
011...111 111...111  
011...110 111...110  
011...101 111...101  
With the inputs configured for bipolar range (COM = VREF/2 or  
paired differentially with INx− = VREF/2), the data outputs are  
twos complement.  
The ideal transfer characteristic for the AD7949 is shown in  
Figure 24 and for both unipolar and bipolar ranges with the  
internal 4.096 V reference.  
100...010 000...010  
100...001 000...001  
100...000 000...000  
–FSR  
–FSR + 1LSB  
+FSR – 1LSB  
–FSR + 0.5LSB  
+FSR – 1.5LSB  
ANALOG INPUT  
Figure 24. ADC Ideal Transfer Function  
Table 7. Output Codes and Ideal Input Voltages  
Unipolar Analog Input1  
VREF = 4.096 V  
Digital Output Code  
(Straight Binary Hex)  
Bipolar Analog Input2  
VREF = 4.096 V  
Digital Output Code  
(Twos Complement Hex)  
Description  
FSR − 1 LSB  
Midscale + 1 LSB  
Midscale  
4.095750 V  
2.048250 V  
2.048 V  
0x3FFF  
0x2001  
0x2000  
2.047750 V  
250 μV  
0
0x1FFF  
0x0001  
0x00004  
Midscale − 1 LSB  
−FSR + 1 LSB  
−FSR  
2.04775 V  
250 μV  
0 V  
0x1FFF  
0x0001  
0x0000  
−250 μV  
−2.047750 V  
−2.048 V  
0x3FFF3  
0x2001  
0x2000  
1 With COM or INx− = 0 V or all INx referenced to GND.  
2 With COM or INx− = VREF /2.  
3 This is also the code for an overranged analog input ((INx+) − (INx−), or COM, above VREF − VGND).  
4 This is also the code for an underranged analog input ((INx+) − (INx−), or COM, below VGND).  
Rev. A | Page 15 of 28  
 
 
 
 
AD7949  
TYPICAL CONNECTION DIAGRAMS  
5V  
1.8V TO VDD  
100nF  
100nF  
100nF  
2
10µF  
V+  
REFIN VDD  
REF  
VIO  
0V TO V  
REF  
3
ADA4841-x  
IN0  
INx  
V–  
V+  
AD7949  
DIN  
SCK  
SDO  
CNV  
MOSI  
SCK  
MISO  
SS  
0V TO V  
REF  
3
ADA4841-x  
V–  
0V OR  
COM  
V
/2  
REF  
GND  
NOTES:  
1. INTERNAL REFERENCE SHOWN. SEE VOLTAGE REFERENCE OUTPUT/INPUT SECTION FOR  
REFERENCE SELECTION.  
2. C  
IS USUALLY A 10µF CERAMIC CAPACITOR (X5R).  
REF  
3. SEE DRIVER AMPLIFIER CHOICE SECTION FOR ADDITIONAL RECOMMENDED AMPLIFIERS.  
4. SEE THE DIGITAL INTERFACE SECTION FOR CONFIGURING AND READING CONVERSION DATA.  
Figure 25. Typical Application Diagram with Multiple Supplies  
5V  
1.8V TO VDD  
100nF  
100nF  
100nF  
2
10µF  
V+  
REFIN VDD  
REF  
VIO  
3
ADA4841-x  
IN0  
INx  
AD7949  
V+  
DIN  
SCK  
SDO  
CNV  
MOSI  
SCK  
MISO  
SS  
3
ADA4841-x  
V
p-p  
REF  
COM  
GND  
V
/2  
REF  
NOTES:  
1. INTERNAL REFERENCE SHOWN. SEE VOLTAGE REFERENCE OUTPUT/INPUT SECTION FOR  
REFERENCE SELECTION.  
2. C  
REF  
IS USUALLY A 10µF CERAMIC CAPACITOR (X5R).  
3. SEE DRIVER AMPLIFIER CHOICE SECTION FOR ADDITIONAL RECOMMENDED AMPLIFIERS.  
4. SEE THE DIGITAL INTERFACE SECTION FOR CONFIGURING AND READING CONVERSION DATA.  
Figure 26. Typical Bipolar Application Diagram  
Rev. A | Page 16 of 28  
 
 
 
AD7949  
70  
65  
60  
55  
50  
45  
40  
35  
30  
Unipolar or Bipolar  
Figure 25 shows an example of the recommended connection  
diagram for the AD7949 when multiple supplies are available.  
Bipolar Single Supply  
Figure 26 shows an example of a system with a bipolar input  
using single supplies with the internal reference (optional different  
VIO supply). This circuit is also useful when the amplifier/signal  
conditioning circuit is remotely located with some common mode  
present. Note that for any input configuration, the inputs INx are  
unipolar and always referenced to GND. R1, R2 and R1, and  
R2’ add common mode to the amplifier, A1, and COM,  
respectively.  
1
10  
100  
1k  
10k  
FREQUENCY (kHz)  
For this circuit, a rail-to-rail input/output amplifier can be used;  
however, the offset voltage vs. input common-mode range  
should be noted and taken into consideration (1 LSB = 76.3 ꢀV  
with VREF = 5 V). Note that the conversion results are in twos  
complement format when using the bipolar input configuration.  
Refer to the AN-581 Application Note for additional details  
about using single-supply amplifiers.  
Figure 28. Analog Input CMRR vs. Frequency  
During the acquisition phase, the impedance of the analog  
inputs can be modeled as a parallel combination of the  
capacitor, CPIN, and the network formed by the series  
connection of RIN and CIN. CPIN is primarily the pin capacitance.  
IN is typically 3.5 kΩ and is a lumped component made up of  
serial resistors and the on resistance of the switches. CIN is  
typically 27 pF and is mainly the ADC sampling capacitor.  
R
ANALOG INPUTS  
Input Structure  
Selectable Low Pass Filter  
Figure 27 shows an equivalent circuit of the input structure of  
the AD7949. The two diodes, D1 and D2, provide ESD  
protection for the analog inputs, IN[7:0] and COM. Care must  
be taken to ensure that the analog input signal does not exceed  
the supply rails by more than 0.3 V because this causes the  
diodes to become forward biased and to start conducting  
current.  
During the conversion phase, where the switches are opened,  
the input impedance is limited to CPIN. While the AD7949 is  
acquiring, RIN and CIN make a one-pole, low-pass filter that  
reduces undesirable aliasing effects and limits the noise from  
the driving circuitry. The low pass filter can be programmed for  
the full bandwidth or ¼ of the bandwidth with CFG[6] as shown in  
Table 9. Note that the converters throughout must also be  
reduced by ¼ when using the filter. If the maximum throughput  
is used with the BW set to ¼, the converter acquisition time,  
These diodes can handle a forward-biased current of 130 mA  
maximum. For instance, these conditions may eventually occur  
when the input buffer supplies are different from VDD. In such  
a case, for example, an input buffer with a short circuit, the  
current limitation can be used to protect the part.  
VDD  
tACQ, will be violated, resulting in increased THD.  
Input Configurations  
Figure 29 shows the different methods for configuring the analog  
inputs with the configuration register (CFG[12:10]). Refer to  
the Configuration Register, CFG, section for more details.  
D1  
D2  
INx+  
OR INx–  
OR COM  
C
IN  
R
IN  
C
PIN  
GND  
Figure 27. Equivalent Analog Input Circuit  
This analog input structure allows the sampling of the true  
differential signal between INx+ and COM or INx+ and INx−.  
(COM or INx− = GND 0.1 V or VREF 0.1 V). By using these  
differential inputs, signals common to both inputs are rejected,  
as shown in Figure 28.  
Rev. A | Page 17 of 28  
 
 
 
 
 
 
AD7949  
The sequencer starts with IN0 and finishes with INx set in  
CFG[9:7]. For paired channels, the channels are paired  
depending on the last channel set in CFG[9:7]. Note that the  
channel pairs are always paired IN (even) = INx+ and IN (odd)  
= INx− regardless of CFG[7].  
CH0+  
CH1+  
CH2+  
CH0+  
CH1+  
CH2+  
IN0  
IN1  
IN2  
IN3  
IN0  
IN1  
IN2  
IN3  
CH3+  
CH4+  
CH5+  
CH6+  
CH7+  
CH3+  
CH4+  
CH5+  
CH6+  
CH7+  
COM–  
IN4  
IN5  
IN4  
IN5  
To enable the sequencer, CFG[2:1] are written to for initializing  
the sequencer. After CFG[13:0] is updated, DIN must be held  
low while reading data out (at least for Bit 13), or the CFG will  
begin updating again.  
IN6  
IN6  
IN7  
IN7  
COM  
GND  
COM  
GND  
While operating in a sequence, the CFG can be changed by  
writing 012 to CFG[2:1]. However, if changing CFG11 (paired  
or single channel) or CFG[9:7] (last channel in sequence), the  
sequence reinitializes and converts IN0 (or IN1) after CFG is  
updated.  
B—8 CHANNELS,  
COMMON REFERNCE  
A—8 CHANNELS,  
SINGLE ENDED  
CH0+ (–)  
CH0– (+)  
CH1+ (–)  
CH1– (+)  
CH0+ (–)  
IN0  
IN1  
IN2  
IN3  
IN0  
IN1  
IN2  
IN3  
CH0– (+)  
CH1+ (–)  
CH1– (+)  
Examples  
Only the bits for input and sequencer are highlighted.  
CH2+ (–)  
CH2– (+)  
CH2+  
CH3+  
CH4+  
CH5+  
COM–  
IN4  
IN5  
IN4  
IN5  
IN6  
IN7  
As a first example, scan all IN[7:0] referenced to COM = GND  
with temperature sensor.  
CH3+ (–)  
CH3– (+)  
IN6  
13  
CFG  
-
12 11 10  
9
8
INx  
1
7
6
5
4
REF  
-
3
2
1
0
IN7  
INCC  
BW  
-
SEQ  
1
RB  
-
COM  
GND  
COM  
GND  
1
1
0
1
1
-
-
0
As a second example, scan three paired channels without  
temperature sensor and referenced to VREF/2.  
C—4 CHANNELS,  
DIFFERENTIAL  
D—COMBINATION  
Figure 29. Multiplexed Analog Input Configuraitons  
13  
CFG  
-
12 11 10  
9
8
INx  
0
7
6
5
4
REF  
-
3
2
1
0
INCC  
BW  
-
SEQ  
1
RB  
-
The analog inputs can be configured as  
0
0
X
1
X
-
-
1
Figure 29A, single ended referenced to system ground;  
CFG[12:10] = 1112.  
Source Resistance  
When the source impedance of the driving circuit is low, the  
AD7949 can be driven directly. Large source impedances  
significantly affect the ac performance, especially total harmonic  
distortion (THD). The dc performances are less sensitive to the  
input impedance. The maximum source impedance depends on  
the amount of THD that can be tolerated.  
Figure 29B, bipolar differential with a common reference  
point; COM = VREF/2; CFG[12:10] = 0102.  
Unipolar differential with COM connected to a ground  
sense; CFG[12:10] = 1102.  
Figure 29C, bipolar differential pairs with INx− referenced  
to VREF/2; CFG[12:10] = 00X2.  
Unipolar differential pairs with INx− referenced to a  
ground sense; CFG[12:10] = 10X2.  
DRIVER AMPLIFIER CHOICE  
Although the AD7949 is easy to drive, the driver amplifier must  
meet the following requirements:  
In this configuration, the INx+ is identified by the channel  
in CFG[9:7]. Example: for IN0 = IN1+ and IN1 = IN1−,  
CFG[9:7] = 0002; for IN1 = IN1+ and IN0 = IN1−,  
CFG[9:7] = 0012.  
Figure 29D, inputs configured in any of the above combin-  
ations (showing that the AD7949 can be configured  
dynamically).  
The noise generated by the driver amplifier must be kept as  
low as possible to preserve the SNR and transition noise  
performance of the AD7949. Note that the AD7949 has a  
noise much lower than most of the other 14-bit ADCs and,  
therefore, can be driven by a noisier amplifier to meet a  
given system noise specification. The noise from the  
amplifier is filtered by the AD7949 analog input circuit  
low-pass filter made by RIN and CIN or by an external filter,  
if one is used.  
Sequencer  
The AD7949 includes a channel sequencer useful for scanning  
channels in a IN0 to INx fashion. Channels are scanned as  
singles or pairs, with or without the temperature sensor, after  
the last channel is sequenced.  
For ac applications, the driver should have a THD  
performance commensurate with the AD7949. Figure 17  
shows THD vs. frequency for the AD7949.  
Rev. A | Page 18 of 28  
 
 
 
AD7949  
The internal reference buffer is useful in multiconverter appli-  
cations because a buffer is typically required in these applications.  
In addition, a low power reference can be used because the  
internal buffer provides the necessary performance to drive the  
SAR architecture of the AD7949.  
For multichannel, multiplexed applications on each input  
or input pair, the driver amplifier and the AD7949 analog  
input circuit must settle a full-scale step onto the capacitor  
array at a 14-bit level (0.0015%). In the amplifier data  
sheet, settling at 0.1% to 0.01% is more commonly  
specified. This may differ significantly from the settling  
time at a 14-bit level and should be verified prior to driver  
selection.  
External Reference  
In any of the six voltage reference schemes, an external reference  
can be connected directly on the REF pin because the output  
impedance of REF is >5 kꢁ. To reduce power consumption, the  
reference and buffer can be powered down independently or  
together for the lowest power consumption. However, for  
applications requiring the use of the temperature sensor, the  
reference must be active. Refer to Table 9 for register details.  
Table 8. Recommended Driver Amplifiers  
Amplifier  
ADA4841-x  
AD8655  
AD8021  
AD8022  
OP184  
Typical Application  
Very low noise, small, and low power  
5 V single supply, low noise  
Very low noise and high frequency  
Low noise and high frequency  
Low power, low noise, and low frequency  
For improved drift performance, an external reference such as  
the ADR43x or ADR44x is recommended.  
AD8605, AD8615 5 V single supply, low power  
Reference Decoupling  
Whether using an internal or external reference, the AD7949  
voltage reference output/input, REF, has a dynamic input  
impedance and should therefore be driven by a low impedance  
source with efficient decoupling between the REF and GND pins.  
This decoupling depends on the choice of the voltage reference  
but usually consists of a low ESR capacitor connected to REF  
and GND with minimum parasitic inductance. A 10 μF (X5R,  
1206 size) ceramic chip capacitor is appropriate when using the  
internal reference, the ADR43x /ADR44x external reference, or  
a low impedance buffer such as the AD8031 or the AD8605.  
VOLTAGE REFERENCE OUTPUT/INPUT  
The AD7949 allows the choice of a very low temperature drift  
internal voltage reference, an external reference, or an external  
buffered reference.  
The internal reference of the AD7949 provides excellent perfor-  
mance and can be used in almost all applications. There are six  
possible choices of voltage reference schemes briefly described  
in Table 9 with more details in each of the following sections.  
Internal Reference/Temperature Sensor  
The placement of the reference decoupling capacitor is also  
important to the performance of the AD7949, as explained in the  
Layout section. The decoupling capacitor should be mounted on  
the same side as the ADC at the REF pin with a thick PCB trace.  
The GND should also connect to the reference decoupling  
capacitor with the shortest distance and to the analog ground  
plane with several vias.  
The internal reference can be set for either 2.5 V or a 4.096 V  
output as detailed in Table 9. With the internal reference  
enabled, the band gap voltage is also present on the REFIN pin,  
which requires an external 0.1 ꢀF capacitor. Because the current  
output of REFIN is limited, it can be used as a source if followed  
by a suitable buffer, such as the AD8605.  
Enabling the reference also enables the internal temperature  
sensor, which measures the internal temperature of the AD7949  
and is thus useful for performing a system calibration. Note  
that, when using the temperature sensor, the output is straight  
binary referenced from the AD7949 GND pin.  
If desired, smaller reference decoupling capacitor values down  
to 2.2 μF can be used with a minimal impact on performance,  
especially on DNL.  
Regardless, there is no need for an additional lower value  
ceramic decoupling capacitor (for example, 100 nF) between the  
REF and GND pins.  
The internal reference is temperature-compensated to within  
15 mV. The reference is trimmed to provide a typical drift of  
3 ppm/°C.  
For applications that use multiple AD7949s or other PulSAR  
devices, it is more effective to use the internal reference buffer  
to buffer the external reference voltage, thus reducing SAR  
conversion crosstalk.  
External Reference and Internal Buffer  
For improved drift performance, an external reference can be  
used with the internal buffer. The external reference is con-  
nected to REFIN, and the output is produced on the REF pin.  
An external reference can be used with the internal buffer with  
or without the temperature sensor enabled. Refer to Table 9 for  
the register details. With the buffer enabled, the gain is unity and is  
limited to an input/output of 4.096 V.  
The voltage reference temperature coefficient (TC) directly impacts  
full scale; therefore, in applications where full-scale accuracy  
matters, care must be taken with the TC. For instance, a  
61 ppm/°C TC of the reference changes full scale by 1 LSB/°C.  
Rev. A | Page 19 of 28  
 
 
 
AD7949  
10000  
1000  
100  
POWER SUPPLY  
The AD7949 uses three power supply pins: two core supplies  
(VDD) and a digital input/output interface supply (VIO). VIO  
allows direct interface with any logic between 1.8 V and VDD.  
To reduce the supplies needed, the VIO and VDD pins can be  
tied together. The AD7949 is independent of power supply  
sequencing between VIO and VDD. The only restriction is that  
CNV must be low during power up. Additionally, it is very  
insensitive to power supply variations over a wide frequency  
range, as shown in Figure 30.  
VDD = 5V, INTERNAL REF  
VDD = 5V, EXTERNAL REF  
10  
VDD = 2.5V, EXTERNAL REF  
1
VIO  
0.1  
0.010  
0.001  
75  
70  
65  
60  
55  
50  
45  
40  
35  
30  
10  
100  
1k  
10k  
100k  
1M  
SAMPLING RATE (sps)  
Figure 31. Operating Currents vs. Sampling Rate  
SUPPLYING THE ADC FROM THE REFERENCE  
For simplified applications, the AD7949, with its low operating  
current, can be supplied directly using the reference circuit as  
shown in Figure 32. The reference line can be driven by  
The system power supply directly  
A reference voltage with enough current output capability,  
such as the ADR43x/ADR44x  
A reference buffer, such as the AD8605, which can also  
filter the system power supply, as shown in Figure 32  
1
10  
100  
1k  
10k  
FREQUENCY (kHz)  
Figure 30. PSRR vs. Frequency  
The AD7949 powers down automatically at the end of each  
conversion phase; therefore, the operating currents and power  
scale linearly with the sampling rate. This makes the part ideal  
for low sampling rates (even of a few hertz) and low battery-  
powered applications.  
5V  
5V  
10  
5V 10kΩ  
1µF  
1µF  
0.1µF  
0.1µF  
10µF  
AD8605  
1
REF  
VDD  
VIO  
AD7949  
1
OPTIONAL REFERENCE BUFFER AND FILTER.  
Figure 32. Example of an Application Circuit  
Rev. A | Page 20 of 28  
 
 
 
 
AD7949  
Reading/Writing During Conversion, Fast Hosts  
DIGITAL INTERFACE  
When reading/writing during conversion (n), conversion  
results are for the previous (n − 1) conversion, and writing the  
CFG is for the next (n + 1) acquisition and conversion.  
The AD7949 uses a simple 4-wire interface and is compatible  
with SPI, MICROWIRE™, QSPI™, digital hosts, and DSPs, for  
example, Blackfin® ADSP-BF53x, SHARC®, ADSP-219x, and  
ADSP-218x.  
After the CNV is brought high to initiate conversion, it must be  
brought low again to allow reading/writing during conversion.  
Reading/writing should only occur up to tDATA and, because this  
time is limited, the host must use a fast SCK.  
The interface uses the CNV, DIN, SCK, and SDO signals and  
allows CNV, which initiates the conversion, to be independent  
of the readback timing. This is useful in low jitter sampling or  
simultaneous sampling applications.  
The SCK frequency required is calculated by  
Number _ SCK _ Edges  
A 14-bit register, CFG[13:0], is used to configure the ADC for  
the channel to be converted, the reference selection, and other  
components, which are detailed in the Configuration Register,  
CFG, section.  
f
SCK  
t
DATA  
The time between tDATA and tCONV is a safe time when digital  
activity should not occur, or sensitive bit decisions may be  
corrupt.  
When CNV is low, reading/writing can occur during conversion,  
acquisition, and spanning conversion (acquisition plus conversion),  
as detailed in the following sections. The CFG word is updated  
on the first 14 SCK rising edges, and conversion results are read  
back on the first 13 (or 14 if busy mode is selected) SCK falling  
edges. If the CFG readback is enabled, an additional  
Reading/Writing During Acquisition, Any Speed Hosts  
When reading/writing during acquisition (n), conversion  
results are for the previous (n − 1) conversion, and writing is for  
the (n + 1) acquisition.  
14 SCK falling edges are required to read back the CFG word  
associated with the conversion results with the CFG MSB  
following the LSB of the conversion result.  
For the maximum throughput, the only time restriction is that  
the reading/writing take place during the tACQ (min) time. For  
slow throughputs, the time restriction is dictated by throughput  
required by the user, and the host is free to run at any speed.  
Thus for slow hosts, data access must take place during the  
acquisition phase.  
A discontinuous SCK is recommended because the part is  
selected with CNV low and SCK activity begins to write a new  
configuration word and clock out data.  
Reading/Writing Spanning Conversion, Any Speed Host  
Note that in the following sections, the timing diagrams  
indicate digital activity (SCK, CNV, DIN, SDO) during the  
conversion. However, due to the possibility of performance  
degradation, digital activity should occur only prior to the safe  
data reading/writing time, tDATA, because the AD7949 provides  
error correction circuitry that can correct for an incorrect bit  
during this time. From tDATA to tCONV, there is no error  
correction and conversion results may be corrupted. The user  
should configure the AD7949 and initiate the busy indicator (if  
desired) prior to tDATA. It is also possible to corrupt the sample  
by having SCK or DIN transitions near the sampling instant.  
Therefore, it is recommended to keep the digital pins quiet for  
approximately 30 ns before and 10 ns after the rising edge of  
CNV, using a discontinuous SCK whenever possible to avoid  
any potential performance degradation.  
When reading/writing spanning conversion, the data access  
starts at the current acquisition (n) and spans into the  
conversion (n). Conversion results are for the previous (n − 1)  
conversion, and writing the CFG is for the next (n + 1) acquisition  
and conversion.  
Similar to reading/writing during conversion, reading/writing  
should only occur up to tDATA. For the maximum throughput,  
the only time restriction is that reading/writing take place  
during the tACQ (min) + tDATA time.  
For slow throughputs, the time restriction is dictated by the  
users required throughput, and the host is free to run at any  
speed. Similar to the reading/writing during acquisition, for  
slow hosts, the data access must take place during the  
acquisition phase with additional time into the conversion.  
Note that data access spanning conversion requires the CNV to  
be driven high to initiate a new conversion, and data access is  
not allowed when CNV is high. Thus, the host must perform  
two bursts of data access when using this method.  
Rev. A | Page 21 of 28  
 
 
AD7949  
and two dummy conversions are required to update the register.  
To preload the CFG with a factory setting, hold DIN high for two  
conversions. Thus CFG[13:0] = 0x3FFF. This sets the AD7949 for  
CONFIGURATION REGISTER, CFG  
The AD7949 uses a 14-bit configuration register (CFG[13:0]) as  
detailed in Table 9 for configuring the inputs, channel to be  
converted, one-pole filter bandwidth, reference, and channel  
sequencer. The CFG is latched (MSB first) on DIN with 14 SCK  
rising edges. The CFG update is edge dependent, allowing for  
asynchronous or synchronous hosts.  
IN[7:0] unipolar referenced to GND, sequenced in order  
Full bandwidth for one-pole filter  
Internal reference/temperature sensor disabled, buffer  
enabled  
No readback of CFG  
The register can be written to during conversion, during acquis-  
ition, or spanning acquisition/conversion and is updated at the  
end of conversion, tCONV (max). There is always a one deep delay  
when writing CFG. Note that, at power up, the CFG is undefined,  
Table 9 summarizes the configuration register bit details. See  
the Theory of Operation section for more details.  
13  
12  
11  
10  
9
8
7
6
5
4
3
2
1
0
CFG  
INCC  
INCC  
INCC  
INx  
INx  
INx  
BW  
REF  
REF  
REF  
SEQ  
SEQ  
RB  
Table 9. Configuration Register Description  
Bit(s)  
<13>  
Name Description  
CFG Configuration update.  
0 = Keep current configuration settings.  
1 = Overwrite contents of register.  
<12:10> INCC  
Input channel configuration. Selection of pseudobipolar, pseudodifferential, pairs, single-ended or temperature sensor. Refer to  
the Input Configurations section.  
Bit 12  
Bit 11  
Bit 10  
Function  
0
0
0
1
1
1
0
1
1
0
1
1
X
0
1
X
0
1
Bipolar differential pairs; INx− referenced to VREF/2 0.1 V.  
Bipolar; INx referenced to COM = VREF/2 0.1 V.  
Temperature sensor.  
Unipolar differential pairs; INx− referenced to GND 0.1 mV.  
Unipolar, IN0 to IN7 referenced to COM = GND 0.1 V (GND sense).  
Unipolar, IN0 to IN7 referenced to GND.  
<9:7>  
INx  
Input channel selection in binary fashion.  
Bit 9  
0
Bit 8  
0
Bit 7  
0
Channel  
IN0  
0
0
1
IN1  
1
1
1
IN7  
<6>  
BW  
REF  
Select bandwidth for low-pass filter. Refer to the Selectable Low Pass Filter section.  
0 = ¼ of BW, uses an additional series resistor to further bandwidth limit the noise. Maximum throughout must be reduced to  
¼ also.  
1 = Full BW.  
<5:3>  
Reference/buffer selection. Selection of internal, and external, external buffered, and enabling of the on-chip temperature  
sensor. Refer to the Voltage Reference Output/Input section.  
Bit 5  
Bit 4  
Bit 3  
Function  
0
0
0
0
1
1
0
0
1
1
1
1
0
1
0
1
0
1
Internal reference, REF = 2.5 V output.  
Internal reference, REF = 4.096 V output.  
External reference, temperature enabled.  
External reference, internal buffer, temperature enabled.  
External reference, temperature disabled.  
External reference, internal buffer, temperature disabled.  
<2:1>  
SEQ  
Channel sequencer. Allows for scanning channels in an IN0 to INx fashion. Refer to the Sequencer section.  
Bit 2  
Bit 1  
Function  
0
0
1
1
0
1
0
1
Disable sequencer.  
Update configuration during sequence.  
Scan IN0 to INx (set in CFG[9:7]), then temperature.  
Scan IN0 to INx (set in CFG[9:7]).  
0
RB  
Read back the CFG register.  
0 = Read back current configuration at end of data.  
1 = Do not read back contents of configuration.  
Rev. A | Page 22 of 28  
 
 
 
AD7949  
to begin the CFG update. While CNV is low, both a CFG  
READ/WRITE SPANNING CONVERSION WITHOUT  
A BUSY INDICATOR  
update and a data readback take place. The first 14 SCK rising  
edges are used to update the CFG, and the first 13 SCK falling  
edges clock out the conversion results starting with MSB − 1.  
The restriction for both configuring and reading is that they  
both occur before the tDATA time of the next conversion elapses.  
All 14 bits of CFG[13:0] must be written or they are ignored.  
Also, if the 14-bit conversion result is not read back before tDATA  
elapses, it is lost.  
This mode is used when the AD7949 is connected to any host  
using an SPI, serial port, or FPGA. The connection diagram is  
shown in Figure 33, and the corresponding timing is given in  
Figure 34. For SPI, the host should use CPHA = CPOL = 0.  
Reading/writing spanning conversion is shown, which covers  
all three modes detailed in the Digital Interface section.  
A rising edge on CNV initiates a conversion, forces SDO to  
high impedance, and ignores data present on DIN. After a  
conversion is initiated, it continues until completion  
irrespective of the state of CNV. CNV must be returned high  
before the safe data transfer time, tDATA, and then held high  
beyond the conversion time, tCONV, to avoid generation of the  
busy signal indicator.  
The SDO data is valid on both SCK edges. Although the rising  
edge can be used to capture the data, a digital host using the  
SCK falling edge allows a faster reading rate, provided it has an  
acceptable hold time. After the 14th (or 28th) SCK falling edge, or  
when CNV goes high (whichever occurs first), SDO returns to  
high impedance. If CFG readback is enabled, the CFG associ-  
ated with the conversion result (n − 1) is read back MSB first  
following the LSB of the conversion result. A total of 30 SCK  
falling edges is required to return SDO to high impedance if  
this is enabled.  
After the conversion is complete, the AD7949 enters the  
acquisition phase and powers down. When the host brings  
CNV low after tCONV (max), the MSB is enabled on SDO. The  
host also must enable the MSB of CFG at this time (if necessary)  
DIGITAL HOST  
AD7949  
CNV  
SDO  
SS  
MISO  
MOSI  
DIN  
SCK  
SCK  
FOR SPI USE CPHA = 0, CPOL = 0.  
Figure 33. Connection Diagram for the AD7949 Without a Busy Indicator  
tCYC  
>
tCONV  
tCONV  
tDATA  
tCONV  
tDATA  
tCNVH  
RETURN CNV HIGH  
FOR NO BUSY  
RETURN CNV HIGH  
FOR NO BUSY  
CNV  
tACQ  
(QUIET  
TIME)  
(QUIET  
TIME)  
ACQUISITION  
(n + 1)  
ACQUISITION  
(n - 1)  
CONVERSION (n)  
ACQUISITION (n)  
CONVERSION (n – 1)  
UPDATE (n + 1)  
CFG/SDO  
UPDATE (n)  
SEE NOTE  
CFG/SDO  
tCLSCK  
14/  
28  
14/  
28  
SCK  
DIN  
1
12  
X
13  
X
2
12  
X
13  
X
tSDIN  
tHDIN  
CFG  
MSB – 1  
CFG  
LSB  
CFG  
LSB  
CFG  
MSB  
tHSDO  
tDSDO  
tEN  
tEN  
tEN  
END CFG (n + 1)  
END CFG (n)  
LSB + 1  
BEGIN CFG (n + 1)  
SEE NOTE  
tDIS  
SDO  
LSB  
MSB MSB – 1  
BEGIN DATA (n – 1)  
LSB + 1 LSB  
END DATA (n – 1)  
tDIS  
tDIS  
tDIS  
END DATA (n – 2)  
NOTES:  
1. THE LSB IS FOR CONVERSION RESULTS OR THE CONFIGURATION REGISTER CFG (n – 1) IF  
15 SCK FALLING EDGES = LSB OF CONVERSION RESULTS.  
29 SCK FALLING EDGES = LSB OF CONFIGURATION REGISTER.  
ON THE 16TH OR 30TH SCK FALLING EDGE, SDO IS DRIVEN TO HIGH IMPENDANCE.  
Figure 34. Serial Interface Timing for the AD7949 Without a Busy Indicator  
Rev. A | Page 23 of 28  
 
 
 
AD7949  
MSB of CFG at this time (if necessary) to begin the CFG  
update. While CNV is low, both a CFG update and a data  
readback take place. The first 14 SCK rising edges are used to  
update the CFG, and the first 14 SCK falling edges clock out the  
conversion results starting with the MSB. The restriction for  
both configuring and reading is that they both occur before the  
READ/WRITE SPANNING CONVERSION WITH A  
BUSY INDICATOR  
This mode is used when the AD7949 is connected to any host  
using an SPI, serial port, or FPGA with an interrupt input. The  
connection diagram is shown in Figure 35, and the correspon-  
ding timing is given in Figure 36. For SPI, the host should use  
CPHA = CPOL = 1. Reading/writing spanning conversion is  
shown, which covers all three modes detailed in the Digital  
Interface section.  
tDATA time elapses for the next conversion. All 14 bits of  
CFG[13:0] must be written or they are ignored. Also, if the 14-bit  
conversion result is not read back before tDATA elapses, it is lost.  
The SDO data is valid on both SCK edges. Although the rising  
edge can be used to capture the data, a digital host using the  
SCK falling edge allows a faster reading rate, provided it has an  
acceptable hold time. After the optional 14th (or 28th) SCK  
falling edge or when CNV goes high (whichever occurs first),  
SDO returns to high impedance. If CFG readback is enabled,  
the CFG associated with the conversion result (n − 1) is read  
back MSB first following the LSB of the conversion result.  
A total of 29 SCK falling edges is required to return SDO to  
high impedance if this is enabled.  
A rising edge on CNV initiates a conversion, forces SDO to  
high impedance, and ignores data present on DIN. After a  
conversion is initiated, it continues until completion  
irrespective of the state of CNV. CNV must be returned low  
before the safe data transfer time, tDATA, and then held low  
beyond the conversion time, tCONV, to generate the busy signal  
indicator. When the conversion is complete, SDO transitions  
from high impedance to low with a pull-up to VIO, which can  
be used to interrupt the host to begin data transfer.  
After the conversion is complete, the AD7949 enters the  
acquisition phase and powers down. The host must enable the  
VIO  
DIGITAL HOST  
AD7949  
SDO  
MISO  
IRQ  
SS  
CNV  
MOSI  
SCK  
DIN  
SCK  
FOR SPI USE CPHA = 1, CPOL = 1.  
Figure 35. Connection Diagram for the AD7949 with a Busy Indicator  
tCYC  
tCONV  
tACQ  
tDATA  
tDATA  
tCNVH  
CNV  
CONVERSION  
(n – 1)  
(QUIET  
TIME)  
(QUIET  
ACQUISITION  
(n + 1)  
CONVERSION (n – 1)  
ACQUISITION (n)  
TIME)  
CONVERSION (n)  
UPDATE (n + 1)  
CFG/SDO  
UPDATE (n)  
CFG/SDO  
SEE NOTE  
15/  
15/  
14  
X
13  
X
SCK  
DIN  
1
2
14  
13  
X
29  
29  
tHDIN  
tSDIN  
CFG  
MSB MSB –1  
CFG  
X
X
X
tHSDO  
tDSDO  
tDIS  
BEIGN CFG (n + 1)  
tEN  
tDIS  
END CFG (n)  
END CFG (n + 1)  
MSB  
MSB  
LSB  
+ 1  
LSB  
+ 1  
SDO  
LSB  
LSB  
– 1  
SEE NOTE  
END DATA (n – 2)  
BEGIN DATA (n – 1)  
END DATA (n – 1)  
tEN  
tDIS  
tEN  
NOTES:  
1. THE LSB IS FOR CONVERSION RESULTS OR THE CONFIGURATION REGISTER CFG (n – 1) IF  
16 SCK FALLING EDGES = LSB OF CONVERSION RESULTS.  
30 SCK FALLING EDGES = LSB OF CONFIGURATION REGISTER.  
ON THE 17TH OR 31st SCK FALLING EDGE, SDO IS DRIVEN TO HIGH IMPENDANCE.  
OTHERWISE, THE LSB REMAINS ACTIVE UNTIL THE BUSY INDICATOR IS DRIVEN LOW.  
Figure 36. Serial Interface Timing for the AD7949 with a Busy Indicator  
Rev. A | Page 24 of 28  
 
 
 
AD7949  
APPLICATION HINTS  
inductances. This is done by placing the reference decoupling  
ceramic capacitor close to, ideally right up against, the REF and  
GND pins and connecting them with wide, low impedance traces.  
LAYOUT  
The printed circuit board that houses the AD7949 should be  
designed so that the analog and digital sections are separated  
and confined to certain areas of the board. The pinout of the  
AD7949, with all its analog signals on the left side and all its  
digital signals on the right side, eases this task.  
Finally, the power supplies VDD and VIO of the AD7949  
should be decoupled with ceramic capacitors, typically 100 nF,  
placed close to the AD7949 and connected using short, wide  
traces to provide low impedance paths and reduce the effect of  
glitches on the power supply lines.  
Avoid running digital lines under the device because these  
couple noise onto the die unless a ground plane under the  
AD7949 is used as a shield. Fast switching signals, such as CNV  
or clocks, should not run near analog signal paths. Crossover of  
digital and analog signals should be avoided.  
EVALUATING AD7949 PERFORMANCE  
Other recommended layouts for the AD7949 are outlined in the  
documentation of the evaluation board for the AD7949 (EVAL-  
AD7949CBZ). The evaluation board package includes a fully  
assembled and tested evaluation board, documentation, and  
software for controlling the board from a PC via the evaluation  
controller board, EVAL-CONTROL BRD3.  
At least one ground plane should be used. It can be common or  
split between the digital and analog sections. In the latter case,  
the planes should be joined underneath the AD7949s.  
The AD7949 voltage reference input REF has a dynamic input  
impedance and should be decoupled with minimal parasitic  
Rev. A | Page 25 of 28  
 
 
AD7949  
OUTLINE DIMENSIONS  
0.60 MAX  
4.00  
BSC SQ  
0.60 MAX  
PIN 1  
INDICATOR  
15  
16  
20  
1
5
0.50  
BSC  
2.65  
2.50 SQ  
2.35  
PIN 1  
INDICATOR  
3.75  
BSC SQ  
EXPOSED  
PAD  
(BOTTOM VIEW)  
10  
11  
6
0.50  
0.40  
0.30  
0.25 MIN  
TOP VIEW  
0.80 MAX  
0.65 TYP  
12° MAX  
1.00  
0.85  
0.80  
0.05 MAX  
0.02 NOM  
COPLANARITY  
0.08  
0.20 REF  
0.30  
0.23  
0.18  
SEATING  
PLANE  
COMPLIANT TO JEDEC STANDARDS MO-220-VGGD-1  
Figure 37. 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ)  
4 mm × 4 mm Body, Very Thin Quad  
(CP-20-4)  
Dimensions shown in millimeters  
ORDERING GUIDE  
Temperature  
Range  
Package  
Ordering  
Quantity  
Model  
AD7949BCPZ1  
AD7949BCPZRL71  
EVAL-AD7949CBZ1  
EVAL-CONTROL BRD32  
Package Description  
20-Lead QFN (LFCSP_VQ)  
20-Lead QFN (LFCSP_VQ)  
Evaluation Board  
Option  
CP-20-4  
CP-20-4  
–40°C to +85°C  
–40°C to +85°C  
Tray, 490  
Reel, 1,500  
Controller Board  
1 Z = RoHS Compliant Part.  
2 This controller board allows a PC to control and communicate with all Analog Devices evaluation boards whose model numbers end in CB.  
Rev. A | Page 26 of 28  
 
 
 
AD7949  
NOTES  
Rev. A | Page 27 of 28  
AD7949  
NOTES  
©2008 Analog Devices, Inc. All rights reserved. Trademarks and  
registered trademarks are the property of their respective owners.  
D07351-0-5/08(A)  
Rev. A | Page 28 of 28  
 
 
 
 
 
 
 
 

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