AD9245 [ADI]
14-Bit, 80 MSPS, 3 V A/D Converter; 14位, 80 MSPS , 3 V A / D转换器型号: | AD9245 |
厂家: | ADI |
描述: | 14-Bit, 80 MSPS, 3 V A/D Converter |
文件: | 总28页 (文件大小:1338K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
14-Bit, 80 MSPS, 3 V A/D Converter
AD9245
FUNCTIONAL BLOCK DIAGRAM
FEATURES
AVDD
DRVDD
Single 3 V supply operation (2.7 V to 3.6 V)
SNR = 72.7 dBc to Nyquist
AD9245
SFDR = 87.6 dBc to Nyquist
Low power: 366 mW
VIN+
VIN–
8-STAGE
MDAC1
A/D
3
SHA
1 1/2-BIT PIPELINE
Differential input with 500 MHz bandwidth
On-chip reference and sample-and-hold
DNL = 0.5 LSB
Flexible analog input: 1 V p-p to 2 V p-p range
Offset binary or twos complement data format
Clock duty cycle stabilizer
4
16
A/D
REFT
REFB
CORRECTION LOGIC
OTR
14
OUTPUT BUFFERS
D13 (MSB)
D0 (LSB)
VREF
APPLICATIONS
SENSE
CLOCK
0.5V
MODE
SELECT
DUTY CYCLE
STABILIZER
High end medical imaging equipment
IF sampling in communications receivers:
WCDMA, CDMA-One, CDMA-2000, TDS-CDMA
Battery-powered instruments
REF
SELECT
AGND
CLK
PDWN MODE DGND
03583-B-001
Hand-held scopemeters
Low cost digital oscilloscopes
Figure 1. Functional Block Diagram
Power sensitive military applications
excellent overall ADC performance. The digital output data is
presented in straight binary or twos complement formats. An
out-of-range (OTR) signal indicates an overflow condition that
can be used with the most significant bit to determine low or
high overflow. Fabricated on an advanced CMOS process, the
AD9245 is available in a 32-lead LFCSP and is specified over
the industrial temperature range (–40°C to +85°C).
GENERAL DESCRIPTION
The AD9245 is a monolithic, single 3 V supply, 14-bit, 80 MSPS
analog-to-digital converter featuring a high performance
sample-and-hold amplifier (SHA) and voltage reference. The
AD9245 uses a multistage differential pipelined architecture
with output error correction logic to provide 14-bit accuracy at
80 MSPS and guarantee no missing codes over the full operat-
ing temperature range.
PRODUCT HIGHLIGHTS
1. The AD9245 operates from a single 3 V power supply and
features a separate digital output driver supply to accommo-
date 2.5 V and 3.3 V logic families.
The wide bandwidth, truly differential SHA allows a variety of
user-selectable input ranges and common modes, including
single-ended applications. It is suitable for multiplexed systems
that switch full-scale voltage levels in successive channels, and
for sampling single-channel inputs at frequencies well beyond
the Nyquist rate. Combined with power and cost savings over
previously available analog-to-digital converters, the AD9245 is
suitable for applications in communications, imaging, and
medical ultrasound.
2. Operating at 80 MSPS, the AD9245 consumes a low 366 mW.
3. The patented SHA input maintains excellent performance for
input frequencies up to 100 MHz, and can be configured for
single-ended or differential operation.
4. The AD9245 is pin compatible with the AD9215, AD9235,
and AD9236. This allows a simplified migration from 10 bits
to 14 bits and 20 MSPS to 80 MSPS.
5. The clock DCS maintains overall ADC performance over a
wide range of clock pulsewidths.
A single-ended clock input is used to control all internal con-
version cycles. A duty cycle stabilizer (DCS) compensates for
wide variations in the clock duty cycle while maintaining
6. The OTR output bit indicates when the signal is beyond the
selected input range.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.326.8703
www.analog.com
© 2003 Analog Devices, Inc. All rights reserved.
AD9245
TABLE OF CONTENTS
AD9245–DC Specifications ............................................................ 3
Analog Input and Reference Overview ................................... 14
Clock Input Considerations...................................................... 15
Jitter Considerations .................................................................. 16
Power Dissipation and Standby Mode .................................... 16
Digital Outputs ........................................................................... 16
Timing ......................................................................................... 17
Voltage Reference ....................................................................... 17
Internal Reference Connection ................................................ 17
External Reference Operation .................................................. 18
Operational Mode Selection..................................................... 18
Evaluation Board........................................................................ 18
Outline Dimensions....................................................................... 25
Ordering Guide .......................................................................... 25
AD9245–AC Specifications............................................................. 4
AD9245–Digital Specifications....................................................... 5
AD9245–Switching Specifications ................................................. 6
Explanation of Test Levels........................................................... 6
Absolute Maximum Ratings............................................................ 7
Thermal Resistance ...................................................................... 7
ESD Caution.................................................................................. 7
Definitions of Specifications ........................................................... 8
Pin Configuration and Functional Descriptions.......................... 9
Equivalent Circuits......................................................................... 10
Typical Performance Characteristics ........................................... 11
Theory of Operation ...................................................................... 14
REVISION HISTORY
Revision B
10/03—Data Sheet Changed from REV. A to REV. B
Changes to Figure 33 ..................................................................... 17
5/03—Data Sheet Changed from REV. 0 to REV. A
Changes to Figure 30 .................................................................... 15
Changes to Figure 37 ..................................................................... 19
Changes to Figure 38..................................................................... 20
Changes to Figure 39...................................................................... 21
Changes to Table 10 ....................................................................... 24
Changes to the ORDERING GUIDE........................................... 25
Rev. B | Page 2 of 28
AD9245
AD9245–DC SPECIFICATIONS
Table 1. AVDD = 3 V, DRVDD = 2.5 V, Sample Rate = 80 MSPS, 2 V p-p Differential Input, 1.0 V External Reference, unless
otherwise noted
AD9245BCP
Parameter
Temp
Test Level
Unit
Min
Typ
Max
RESOLUTION
Full
VI
14
Bits
ACCURACY
No Missing Codes
Offset Error1
Gain Error
Gain Error1
Differential Nonlinearity (DNL)2
Integral Nonlinearity (INL)2
TEMPERATURE DRIFT
Offset Error1
Gain Error
Gain Error1
Full
Full
25°C
Full
Full
Full
VI
VI
V
VI
VI
VI
Guaranteed
0.30
0.2ꢀ
0.70
0.5
1.2
% FSR
% FSR
% FSR
LSB
4.16
1.0
5.15
1.4
LSB
Full
Full
Full
V
V
V
10
12
17
ppm/°C
ppm/°C
ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage Error (1 V Mode)
Load Regulation @ 1.0 mA
Output Voltage Error (0.5 V Mode)
Load Regulation @ 0.5 mA
INPUT REFERRED NOISE
VREF = 0.5 V
Full
VI
V
V
3
2
6
1
34
mV
mV
mV
mV
25°C
25°C
25°C
V
25°C
25°C
V
V
1.ꢀ6
1.17
LSB rms
LSB rms
VREF = 1.0 V
ANALOG INPUT
Input Span, VREF = 0.5 V
Input Span, VREF = 1.0 V
Input Capacitance3
REFERENCE INPUT RESISTANCE
POWER SUPPLIES
Supply Voltage
Full
Full
Full
Full
IV
IV
V
1
2
7
7
V p-p
V p-p
pF
V
kΩ
AVDD
DRVDD
Full
Full
IV
IV
2.7
2.25
3.0
2.5
3.6
3.6
V
V
Supply Current
IAVDD2
Full
25°C
25°C
VI
V
V
122
9
0.01
13ꢀ
mA
mA
% FSR
IDRVDD2
PSRR
POWER CONSUMPTION
Low Frequency Input4
Standby Power5
25°C
25°C
V
V
366
1.0
mW
mW
1 With a 1.0 V internal reference.
2 Measured at the maximum clock rate, fIN = 2.4 MHz, full-scale sine wave, with approximately 5 pF loading on each output bit.
3 Input capacitance refers to the effective capacitance between one differential input pin and AGND. Refer to Figure 4 for the equivalent analog input structure.
4 Measured at AC Specification conditions without output drivers.
5 Standby power is measured with a dc input, CLK pin inactive (i.e., set to AVDD or AGND).
Rev. B | Page 3 of 2ꢀ
AD9245
AD9245–AC SPECIFICATIONS
Table 2. AVDD = 3 V, DRVDD = 2.5 V, Sample Rate = 80 MSPS, 2 V p-p Differential Input, 1.0 V External Reference,
AIN = –0.5 dBFS, DCS Off, unless otherwise noted
AD9245BCP
Parameter
Temp
Test Level
Unit
Min
Typ
Max
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 2.4 MHz
Full
VI
V
V
IV
V
V
71.1
dB
dB
dB
dB
dB
dB
25°C
25°C
Full
25°C
25°C
73.3
72.7
fIN = 40 MHz
fIN = 70 MHz
70.5
71.7
70.2
fIN = 100 MHz
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 2.4 MHz
Full
VI
V
V
IV
V
V
70.7
69.9
dB
dB
dB
dB
dB
dB
25°C
25°C
Full
25°C
25°C
73.2
72.5
fIN = 40 MHz
fIN = 70 MHz
71.2
69.6
fIN = 100 MHz
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 2.4 MHz
Full
VI
V
V
IV
V
V
11.5
11.3
Bits
Bits
Bits
Bits
Bits
Bits
25°C
25°C
Full
25°C
25°C
11.9
11.ꢀ
fIN = 40 MHz
fIN = 70 MHz
11.5
11.3
fIN = 100 MHz
WORST SECOND OR THIRD
fIN = 2.4 MHz
Full
VI
V
V
IV
V
V
–76.5
–75.7
dBc
dBc
dBc
dBc
dBc
dBc
25°C
25°C
Full
25°C
25°C
–92.ꢀ
–ꢀ7.6
fIN = 40 MHz
fIN = 70 MHz
–ꢀ1.6
–79.0
fIN = 100 MHz
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 2.4 MHz
Full
VI
V
V
IV
V
V
76.5
75.7
dBc
dBc
dBc
dBc
dBc
dBc
25°C
25°C
Full
25°C
25°C
92.ꢀ
ꢀ7.6
fIN = 40 MHz
fIN = 70 MHz
ꢀ1.6
79.0
fIN = 100 MHz
Rev. B | Page 4 of 2ꢀ
AD9245
AD9245–DIGITAL SPECIFICATIONS
Table 3. AVDD = 3 V, DRVDD = 2.5 V, 1.0 V External Reference, unless otherwise noted
AD9245BCP
Typ
Temp
Test Level
Unit
Parameter
Min
Max
LOGIC INPUTS (CLK, PDWN)
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
Full
Full
Full
Full
Full
IV
IV
IV
IV
V
2.0
V
V
µA
µA
pF
0.ꢀ
+10
+10
–10
–10
Input Capacitance
2
DIGITAL OUTPUT BITS (D0–D13, OTR)1
DRVDD = 3.3 V
High Level Output Voltage (IOH = 50 µA)
High Level Output Voltage (IOH = 0.5 mA)
Low Level Output Voltage (IOH = 1.6 mA)
Low Level Output Voltage (IOH = 50 µA)
DRVDD = 2.5 V
Full
Full
Full
Full
IV
IV
IV
IV
3.29
3.25
V
V
V
V
0.2
0.05
High Level Output Voltage (IOH = 50 µA)
High Level Output Voltage (IOH = 0.5 mA)
Low Level Output Voltage (IOH = 1.6 mA)
Low Level Output Voltage (IOH = 50 µA)
Full
Full
Full
Full
IV
IV
IV
IV
2.49
2.45
V
V
V
V
0.2
0.05
1 Output voltage levels measured with 5 pF load on each output.
Rev. B | Page 5 of 2ꢀ
AD9245
AD9245–SWITCHING SPECIFICATIONS
Table 4. AVDD = 3 V, DRVDD = 2.5 V, unless otherwise noted
AD9245BCP
Typ
Parameter
Temp
Test Level
Unit
Min
Max
CLOCK INPUT PARAMETERS
Maximum Conversion Rate
Minimum Conversion Rate
CLK Period
Full
Full
Full
Full
Full
VI
V
V
V
V
ꢀ0
MSPS
MSPS
ns
ns
ns
1
12.5
4.6
4.6
CLK Pulsewidth High1
CLK Pulsewidth Low1
DATA OUTPUT PARAMETERS
Output Propagation Delay (tPD)2
Pipeline Delay (Latency)
Aperture Delay (tA)
Aperture Uncertainty (Jitter, tJ)
Wake-Up Time3
Full
Full
Full
Full
Full
Full
V
V
V
V
V
V
4.2
7
1
0.3
7
ns
Cycles
ns
ps rms
ms
OUT-OF-RANGE RECOVERY TIME
2
Cycles
1 With duty cycle stabilizer (DCS) enabled.
2 Output propagation delay is measured from CLK 50% transition to DATA 50% transition, with 5 pF load.
3 Wake-up time is dependant on the value of the decoupling capacitors; typical values shown with 0.1 µF and 10 µF capacitors on REFT and REFB.
N+1
N
N+2
N+8
N–1
N+3
tA
ANALOG
INPUT
N+7
N+4
N+6
N+5
CLK
DATA
OUT
N–9
N–8
N–7
N–6
N–5
N–4
N–3
N–2
N–1
N
tPD = 6.0ns MAX
2.0ns MIN
03583-B-002
Figure 2. Timing Diagram
EXPLANATION OF TEST LEVELS
Test Level Definitions
I
100% production tested.
II
100% production tested at 25°C and guaranteed by design and characterization at specified temperatures.
Sample tested only.
Parameter is guaranteed by design and characterization testing.
Parameter is a typical value only.
III
IV
V
VI
100% production tested at 25°C and guaranteed by design and characterization for industrial temperature range.
Rev. B | Page 6 of 2ꢀ
AD9245
ABSOLUTE MAXIMUM RATINGS
Table 5. AD9245 Absolute Maximum Ratings
THERMAL RESISTANCE
Parameter
ELECTRICAL
AVDD
DRVDD
AGND
AVDD
D0–D13
CLK, MODE AGND
VIN+, VIN–
VREF
With Respect to Min Max
Unit
θJA is specified for the worst-case conditions on a 4-layer board
in still air, in accordance with EIA/JESD51-1.
AGND
DGND
DGND
DRVDD
DGND
–0.3 +3.9
–0.3 +3.9
–0.3 +0.3
–3.9 +3.9
–0.3 DRVDD + 0.3
–0.3 AVDD + 0.3
–0.3 AVDD + 0.3
–0.3 AVDD + 0.3
–0.3 AVDD + 0.3
–0.3 AVDD + 0.3
–0.3 AVDD + 0.3
V
V
V
V
V
V
V
V
V
V
V
Table 6. Thermal Resistance
Package Type
Unit
θJA
θJC
CP-32
32.5
32.71
°C/W
Airflow increases heat dissipation, effectively reducing θJA.
Also, more metal directly in contact with the package leads
from metal traces, through holes, ground, and power planes
reduces the θJA. It is recommended that the exposed paddle be
soldered to the ground plane for the LFCSP package. There is an
increased reliability of the solder joints, and maximum thermal
capability of the package is achieved with the exposed paddle
soldered to the customer board.
AGND
AGND
AGND
AGND
AGND
SENSE
REFT, REFB
PDWN
ENVIRONMENTAL
Storage Temperature
Operating Temperature Range
–65 +125
–40 +ꢀ5
°C
°C
Lead Temperature Range
(Soldering 10 sec)
Junction Temperature
300
150
°C
°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. B | Page 7 of 2ꢀ
AD9245
DEFINITIONS OF SPECIFICATIONS
Analog Bandwidth (Full Power Bandwidth)—The analog
input frequency at which the spectral power of the fundamental
frequency (as determined by the FFT analysis) is reduced by 3 dB.
Effective Number of Bits (ENOB)—The effective number of
bits for a sine wave input at a given input frequency can be cal-
culated directly from its measured SINAD using the following
formula:
Aperture Delay (tA)—The delay between the 50% point of the
rising edge of the clock and the instant at which the analog
input is sampled.
(
SINAD −1.76
)
ENOB =
6.02
Signal-to-Noise Ratio (SNR)1 —The ratio of the rms input
signal amplitude to the rms value of the sum of all other spec-
tral components below the Nyquist frequency, excluding the
first six harmonics and dc.
Aperture Uncertainty (Jitter, tJ)—The sample-to-sample varia-
tion in aperture delay.
Integral Nonlinearity (INL)—The deviation of each individual
code from a line drawn from negative full scale through positive
full scale. The point used as negative full scale occurs ½ LSB
before the first code transition. Positive full scale is defined as a
level 1½ LSB beyond the last code transition. The deviation is
measured from the middle of each particular code to the true
straight line.
Spurious-Free Dynamic Range (SFDR)1—The difference in dB
between the rms input signal amplitude and the peak spurious
signal. The peak spurious component may or may not be a
harmonic.
Two-Tone SFDR1—The ratio of the rms value of either input
tone to the rms value of the peak spurious component. The
peak spurious component may or may not be an IMD product.
Differential Nonlinearity (DNL, No Missing Codes)—An
ideal ADC exhibits code transitions that are exactly 1 LSB apart.
DNL is the deviation from this ideal value. Guaranteed no miss-
ing codes to 14-bit resolution indicates that all 16384 codes
must be present over all operating ranges.
Clock Pulsewidth and Duty Cycle—Pulsewidth high is the
minimum amount of time that the clock pulse should be left in
the Logic 1 state to achieve rated performance. Pulsewidth low
is the minimum time the clock pulse should be left in the
Logic 0 state. At a given clock rate, these specifications define an
acceptable clock duty cycle.
Offset Error—The major carry transition should occur for an
analog value ½ LSB below VIN+ = VIN–. Offset error is
defined as the deviation of the actual transition from that point.
Minimum Conversion Rate—The clock rate at which the SNR
of the lowest analog signal frequency drops by no more than
3 dB below the guaranteed limit.
Gain Error—The first code transition should occur at an
analog value ½ LSB above negative full scale. The last transition
should occur at an analog value 1½ LSB below the positive
full scale. Gain error is the deviation of the actual difference
between first and last code transitions and the ideal difference
between first and last code transitions.
Maximum Conversion Rate—The clock rate at which para-
metric testing is performed.
Output Propagation Delay (tPD)—The delay between the clock
rising edge and the time when all bits are within valid logic
levels.
Temperature Drift—The temperature drift for offset error and
gain error specifies the maximum change from the initial
(25°C) value to the value at TMIN or TMAX
.
Out-of-Range Recovery Time—The time it takes for the ADC
to reacquire the analog input after a transition from 10% above
positive full scale to 10% above negative full scale, or from 10%
below negative full scale to 10% below positive full scale.
Power Supply Rejection Ratio—The change in full scale from
the value with the supply at the minimum limit to the value
with the supply at its maximum limit.
Total Harmonic Distortion (THD)1—The ratio of the rms
input signal amplitude to the rms value of the sum of the first
six harmonic components.
1 AC specifications may be reported in dBc (degrades as signal levels are
lowered) or in dBFS (always related back to converter full scale).
Signal-to-Noise and Distortion (SINAD)1—The ratio of the
rms input signal amplitude to the rms value of the sum of all
other spectral components below the Nyquist frequency, includ-
ing harmonics but excluding dc.
Rev. B | Page ꢀ of 2ꢀ
AD9245
PIN CONFIGURATION AND FUNCTIONAL DESCRIPTIONS
DNC 1
CLK 2
DNC 3
PDWN 4
(LSB) D0 5
D1 6
24 VREF
23 SENSE
22 MODE
21 OTR
20 D13 (MSB)
19 D12
AD9245
CSP
TOP VIEW
(Not to Scale)
D2 7
18 D11
D3 8
17 D10
03583-B-022
Figure 3. 32-Lead LFCSP
Table 7. Pin Function Descriptions—32-Lead LFCSP (CP Package)
Pin No.
Mnemonic
DNC
CLK
Description
1, 3
2
Do Not Connect
Clock Input Pin
4
PDWN
D0 (LSB) to D13 (MSB)
DGND
DRVDD
OTR
Power-Down Function Select
Data Output Bits
Digital Output Ground
Digital Output Driver Supply
Out-of-Range Indicator
5 to 14, 17 to 20
15
16
21
22
23
24
25
MODE
SENSE
VREF
REFB
REFT
AVDD
AGND
VIN+
Data Format Select and DCS Mode Selection (see Table 9)
Reference Mode Selection (see Table ꢀ)
Voltage Reference Input/Output
Differential Reference (–)
Differential Reference (+)
Analog Power Supply
26
27, 32
2ꢀ, 31
29
Analog Ground
Analog Input Pin (+)
30
VIN–
Analog Input Pin (–)
Rev. B | Page 9 of 2ꢀ
AD9245
EQUIVALENT CIRCUITS
AVDD
DRVDD
D13-D0,
OTR
VIN+, VIN–
03583-B-005
03583-B-003
Figure 6. Equivalent Digital Output Circuit
Figure 4. Equivalent Analog Input Circuit
AVDD
AVDD
CLK,
MODE
PDWN
20kΩ
03583-B-004
03583-B-006
Figure 5. Equivalent MODE Input Circuit
Figure 7. Equivalent Digital Input Circuit
Rev. B | Page 10 of 2ꢀ
AD9245
TYPICAL PERFORMANCE CHARACTERISTICS
AVDD = 3.0 V, DRVDD = 2.5 V, Sample Rate = 80 MSPS, DCS Disabled, TA = 25°C, 2 V p-p Differential Input, AIN = –0.5 dBFS,
VREF = 1.0 V External, unless otherwise noted
0
–10
100
90
80
70
60
50
40
SFDR (dBFS)
AIN = –0.5dBFS
SNR = 73.2dBc
ENOB = 11.8 BITS
SFDR = 92.8 dBc
–20
SFDR (dBc)
–30
SNR (dBFS)
–40
–50
–60
SFDR = 90dBc
–70
REFERENCE LINE
–80
–90
SNR (dBc)
–100
–110
–120
0
0
0
5
10
15
20
25
30
35
40
–30
–25
–20
–15
–10
–5
0
FREQUENCY (MHz)
INPUT AMPLITUDE (dBFS)
03583-B-032
03583-B-033
Figure 8. Single Tone 8K FFT @ 2.5 MHz
Figure 11. Single Tone SNR/SFDR vs. Input Amplitude (AIN) @ 2.5 MHz
0
–10
100
SFDR (dBFS)
AIN = –0.5dBFS
SNR = 72.7dBc
ENOB = 11.8 BITS
SFDR = 87.6 dBc
–20
90
SFDR (dBc)
–30
SNR (dBFS)
–40
80
70
60
50
40
–50
–60
SFDR = 90dBc
–70
REFERENCE LINE
–80
–90
SNR (dBc)
–100
–110
–120
5
10
15
20
25
30
35
40
–30
–25
–20
–15
–10
–5
0
FREQUENCY (MHz)
INPUT AMPLITUDE (dBFS)
03583-B-023
03583-B-034
Figure 9. Single Tone 8K FFT @ 39 MHz
Figure 12. Single Tone SNR/SFDR vs. Input Amplitude (AIN) @ 39 MHz
0
–10
100
AIN = –0.5dBFS
SNR = 71.7dBc
ENOB = 11.5 BITS
SFDR = 81.6 dBc
SFDR (DIFF)
–20
90
–30
SNR (DIFF)
SFDR (SE)
–40
80
70
–50
–60
–70
–80
SNR (SE)
–90
60
–100
–110
–120
50
5
10
15
20
25
30
35
40
0
20
40
60
80
100
FREQUENCY (MHz)
SAMPLE RATE (MSPS)
03583-B-024
03583-B-025
Figure 10. Single Tone 8K FFT @ 70 MHz
Figure 13. SNR/SFDR vs. Sample Rate @ 40 MHz
Rev. B | Page 11 of 2ꢀ
AD9245
100
90
80
70
60
50
40
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
SFDR (dBFS)
AIN = –6.5dBFS
SNR = 73.4dBFS
SFDR = 86.0dBFS
SFDR (dBc)
SNR (dBFS)
SFDR = 90dBc
REFERENCE LINE
SNR (dBc)
–120
0
–30
–27
–24
–21
–18
–15
–12
–9
–6
5
10
15
20
25
30
35
40
INPUT AMPLITUDE (dBFS)
FREQUENCY (MHz)
03583-B-031
03583-B-029
Figure 17. Two-Tone SNR/SFDR vs. Input Amplitude @ 30 MHz and 31 MHz
Figure 14. Two-Tone 8K FFT @ 30 MHz and 31 MHz
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
100
SFDR (dBFS)
AIN = –6.5dBFS
SNR = 72.7dBFS
SFDR = 78.8dBFS
90
SFDR (dBc)
80
70
SNR (dBFS)
SFDR = 90dBc
60
50
40
REFERENCE LINE
SNR (dBc)
–12
–120
0
–30
–27
–24
–21
–18
–15
–9
–6
5
10
15
20
25
30
35
40
INPUT AMPLITUDE (dBFS)
FREQUENCY (MHz)
03583-B-027
03583-B-030
Figure 15. Two-Tone 8K FFT @ 69 MHz and 70 MHz
Figure 18. Two-Tone SNR/SFDR vs. Input Amplitude @ 69 MHz and 70 MHz
1.0
0.8
1.5
1.0
0.5
0
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.5
–1.0
–1.5
0
0
2048
4096
6144
8192 10240 12288 14336 16384
2048
4096
6144
8192 10240 12288 14336 16384
CODE
CODE
03583-B-028
03583-B-026
Figure 19. Typical DNL
Figure 16. Typical INL
Rev. B | Page 12 of 2ꢀ
AD9245
75
74
73
72
71
70
69
68
67
66
65
100
95
90
85
80
75
70
–40°C
+25°C
+85°C
–40
°
C
+25°C
+85°C
0
25
50
75
100
125
0
25
50
75
100
125
INPUT FREQUENCY (MHz)
INPUT FREQUENCY (MHz)
03583-B-036
03583-B-038
Figure 20. SNR vs. Input Frequency
Figure 23. SFDR vs. Input Frequency
90
0
–10
SFDR (DCS ON)
88
86
84
82
80
78
76
74
72
70
–20
–30
–40
SFDR (DCS OFF)
–50
–60
–70
–80
–90
SNR (DCS OFF)
–100
–110
–120
SNR (DCS ON)
50 55
DUTY CYCLE (%)
30
35
40
45
60
65
70
0
9.6
19.2
28.8
38.4
FREQUENCY (MHz)
03583-B-037
03583-B-060
Figure 21. SNR/SFDR vs. Clock Duty Cycle
Figure 24. Two 32K FFT CDMA-2000 Carriers @
FIN = 46.08 MHz; Sample Rate = 61.44 MSPS
0
–10
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
–110
–120
0
9.6
19.2
28.8
38.4
0
9.6
19.2
28.8
38.4
FREQUENCY (MHz)
FREQUENCY (MHz)
03583-B-059
03583-B-061
Figure 22. 32K FFT WCDMA Carrier @ FIN = 96 MHz; Sample Rate = 76.8 MSPS
Figure 25. Two 32K FFT WCDMA Carriers @
FIN = 76.8 MHz; Sample Rate = 61.44 MSPS
Rev. B | Page 13 of 2ꢀ
AD9245
THEORY OF OPERATION
The AD9245 architecture consists of a front-end sample and
hold amplifier (SHA) followed by a pipelined switched capaci-
tor ADC. The pipelined ADC is divided into three sections,
consisting of a 4-bit first stage followed by eight 1.5-bit stages
and a final 3-bit flash. Each stage provides sufficient overlap to
correct for flash errors in the preceding stages. The quantized
outputs from each stage are combined into a final 14-bit result
in the digital correction logic. The pipelined architecture per-
mits the first stage to operate on a new input sample, while the
remaining stages operate on preceding samples. Sampling
occurs on the rising edge of the clock.
Referring to Figure 27, the clock signal alternately switches the
SHA between sample mode and hold mode. When the SHA is
switched into sample mode, the signal source must be capable
of charging the sample capacitors and settling within one-half
of a clock cycle. A small resistor in series with each input can
help reduce the peak transient current required from the output
stage of the driving source. Also, a small shunt capacitor can be
placed across the inputs to provide dynamic charging currents.
This passive network creates a low-pass filter at the ADC’s
input; therefore, the precise values are dependent upon the
application. In IF undersampling applications, any shunt
capacitors should be reduced or removed. In combination with
the driving source impedance, they would limit the input
bandwidth.
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched capacitor DAC
and interstage residue amplifier (MDAC). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage simply consists of a flash ADC.
H
T
T
5pF
5pF
VIN+
VIN–
C
C
PAR
PAR
The input stage contains a differential SHA that can be ac-
coupled or dc-coupled in differential or single-ended modes.
The output-staging block aligns the data, carries out the error
correction, and passes the data to the output buffers. The output
buffers are powered from a separate supply, allowing adjustment
of the output voltage swing. During power-down, the output
buffers go into a high impedance state.
T
T
H
03583-B-012
Figure 27. Switched-Capacitor SHA Input
ANALOG INPUT AND REFERENCE OVERVIEW
The analog input to the AD9245 is a differential switched-
capacitor SHA that has been designed for optimum perform-
ance while processing a differential input signal. The SHA input
can support a wide common-mode range (VCM) and maintain
excellent performance, as shown in Figure 26. An input
common-mode voltage of midsupply minimizes signal-
dependent errors and provides optimum performance.
For best dynamic performance, the source impedances driving
VIN+ and VIN– should be matched such that common-mode
settling errors are symmetrical. These errors are reduced by the
common-mode rejection of the ADC.
An internal differential reference buffer creates positive and
negative reference voltages, REFT and REFB, that define the
span of the ADC core. The output common mode of the
reference buffer is set to midsupply, and the REFT and REFB
voltages and span are defined as follows:
100
95
SFDR (2.5MHz)
90
1
2
1
85
REFT =
REFB =
AVDD +VREF
( )
SFDR (39MHz)
80
(
AVDD −VREF
)
SNR (2.5MHz)
SNR (39MHz)
75
70
65
60
55
50
2
Span = 2×
(
REFT − REFB
)
= 2×VREF
It can be seen from the equations above that the REFT and
REFB voltages are symmetrical about the midsupply voltage, and,
by definition, the input span is twice the value of the VREF voltage.
0.5
1.0
1.5
2.0
2.5
3.0
The internal voltage reference can be pin strapped to fixed
values of 0.5 V or 1.0 V, or adjusted within the same range as
discussed in the Internal Reference Connection section.
Maximum SNR performance is achieved with the AD9245 set
COMMON-MODE LEVEL (V)
03583-B-039
Figure 26. SNR, SFDR vs. Common-Mode Level
Rev. B | Page 14 of 2ꢀ
AD9245
to the largest input span of 2 V p-p. The relative SNR degradation
is 3 dB when changing from 2 V p-p mode to 1 V p-p mode.
AVDD
VIN+
33Ω
The SHA may be driven from a source that keeps the signal
peaks within the allowable range for the selected reference volt-
age. The minimum and maximum common-mode input levels
are defined as
2V p-p
49.9Ω
10pF
33Ω
AD9245
VIN–
AGND
1kΩ
1kΩ
VREF
0.1µF
VCMMIN
=
03583-B-014
2
Figure 29. Differential Transformer-Coupled Configuration
(
AVDD +VREF
)
VCMMAX
=
2
The signal characteristics must be considered when selecting
a transformer. Most RF transformers saturate at frequencies
below a few MHz, and excessive signal power can also cause
core saturation, which leads to distortion.
The minimum common-mode input level allows the AD9245 to
accommodate ground referenced inputs.
Although optimum performance is achieved with a differential
input, a single-ended source may be applied to VIN+ or VIN–.
In this configuration, one input accepts the signal, while the
opposite input should be set to midscale by connecting it to an
appropriate reference. For example, a 2 V p-p signal may be
applied to VIN+ while a 1 V reference is applied to VIN–. The
AD9245 then accepts an input signal varying between 2 V and
0 V. In the single-ended configuration, distortion performance
may degrade significantly as compared to the differential case.
However, the effect is less noticeable at lower input frequencies.
Single-Ended Input Configuration
A single-ended input may provide adequate performance in
cost-sensitive applications. In this configuration, there is a
degradation in SFDR and distortion performance due to the
large input common-mode swing (see Figure 13). However, if
the source impedances on each input are matched, there should
be little effect on SNR performance. Figure 30 details a typical
single-ended input configuration.
1k
Ω
Differential Input Configurations
AVDD
VIN+
33
Ω
As previously detailed, optimum performance is achieved while
driving the AD9245 in a differential input configuration. For
baseband applications, the AD8138 differential driver provides
excellent performance and a flexible interface to the ADC. The
output common-mode voltage of the AD8138 is easily set to
AVDD/2, and the driver can be configured in a Sallen Key filter
topology to provide band limiting of the input signal.
0.33µF
1k
2V p-p
49.9
Ω
Ω
20pF
33
AD9245
1k
Ω
Ω
Ω
+
VIN–
AGND
10
µF
0.1
µ
F
1k
03583-B-015
Figure 30. Single-Ended Input Configuration
CLOCK INPUT CONSIDERATIONS
1V p-p
49.9Ω
Typical high speed ADCs use both clock edges to generate a
variety of internal timing signals, and as a result may be sensitive
to clock duty cycle. Commonly a 5% tolerance is required on the
clock duty cycle to maintain dynamic performance characteris-
tics. The AD9245 contains a clock duty cycle stabilizer (DCS) that
retimes the nonsampling edge, providing an internal clock signal
with a nominal 50% duty cycle. This allows a wide range of clock
input duty cycles without affecting the performance of the
AD9245. As shown in Figure 21, noise and distortion perform-
ance is nearly flat for a 30% to 70% duty cycle with the DCS on.
499Ω
AVDD
VIN+
33Ω
499Ω
523Ω
20pF
AD8138
499Ω
AD9245
1kΩ
1kΩ
33Ω
VIN–
AGND
0.1µF
03583-B-013
Figure 28. Differential Input Configuration Using the AD8138
At input frequencies in the second Nyquist zone and above, the
performance of most amplifiers is not adequate to achieve the
true performance of the AD9245. This is especially true in IF
undersampling applications where frequencies in the 70 MHz to
100 MHz range are being sampled. For these applications,
differential transformer coupling is the recommended input
configuration. The value of the shunt capacitor is dependent on
the input frequency and source impedance and should be
reduced or removed. An example is shown in Figure 29.
The duty cycle stabilizer uses a delay-locked loop (DLL) to
create the nonsampling edge. As a result, any changes to the
sampling frequency require approximately 100 clock cycles to
allow the DLL to acquire and lock to the new rate.
Rev. B | Page 15 of 2ꢀ
AD9245
425
400
375
350
325
300
140
120
100
80
JITTER CONSIDERATIONS
ANALOG CURRENT
TOTAL POWER
High speed, high resolution ADCs are sensitive to the quality of
the clock input. The degradation in SNR at a given input fre-
quency (fINPUT) due only to aperture jitter (tJ) can be calculated
with the following equation:
SNR= 20log
2πfINPUT ×tJ
60
In the equation, the rms aperture jitter represents the root-mean
square of all jitter sources, which include the clock input, analog
input signal, and ADC aperture jitter specification. IF undersam-
pling applications are particularly sensitive to jitter (see Figure 31).
40
20
DIGITAL CURRENT
0
10
20
30
40
50
60
70
80
90
100
SAMPLE RATE (MSPS)
03583-B-035
The clock input should be treated as an analog signal in cases
where aperture jitter may affect the dynamic range of the
AD9245. Power supplies for clock drivers should be separated
from the ADC output driver supplies to avoid modulating the
clock signal with digital noise. Low jitter, crystal controlled
oscillators make the best clock sources. If the clock is generated
from another type of source (by gating, dividing, or other meth-
ods), it should be retimed by the original clock at the last step.
Figure 32. Power and Current vs. Sample Rate @ 2.5 MHz
Reducing the capacitive load presented to the output drivers can
minimize digital power consumption. The data in Figure 32 was
taken with the same operating conditions as the Typical Per-
formance Characteristics, and with a 5 pF load on each output
driver.
By asserting the PDWN pin high, the AD9245 is placed in
standby mode. In this state, the ADC typically dissipates
1 mW if the CLK and analog inputs are static. During standby,
the output drivers are placed in a high impedance state.
Reasserting the PDWN pin low returns the AD9245 to its
normal operational mode.
75
0.2ps
70
65
MEASURED SNR
0.5ps
60
1.0ps
Low power dissipation in standby mode is achieved by shutting
down the reference, reference buffer, and biasing networks. The
decoupling capacitors on REFT and REFB are discharged when
entering standby mode and then must be recharged when
returning to normal operation. As a result, the wake-up time is
related to the time spent in standby mode, and shorter standby
cycles result in proportionally shorter wake-up times. With the
recommended 0.1 µF and 10 µF decoupling capacitors on REFT
and REFB, it takes approximately 1 second to fully discharge the
reference buffer decoupling capacitors and 7 ms to restore full
operation.
1.5ps
55
50
45
2.0ps
2.5ps
3.0ps
40
1
10
100
1000
INPUT FREQUENCY (MHz)
03583-B-041
Figure 31. SNR vs. Input Frequency and Jitter
POWER DISSIPATION AND STANDBY MODE
As shown in Figure 32, the power dissipated by the AD9245 is
proportional to its sample rate. The digital power dissipation is
determined primarily by the strength of the digital drivers and
the load on each output bit. The maximum DRVDD current
(IDRVDD) can be calculated as
DIGITAL OUTPUTS
The AD9245 output drivers can be configured to interface with
2.5 V or 3.3 V logic families by matching DRVDD to the digital
supply of the interfaced logic. The output drivers are sized to pro-
vide sufficient output current to drive a wide variety of logic
families. However, large drive currents tend to cause current
glitches on the supplies that may affect converter performance.
Applications requiring the ADC to drive large capacitive loads or
large fanouts may require external buffers or latches.
IDRVDD = VDRVDD ×CLOAD × fCLK ×N
where N is the number of output bits, 14 in the case of the
AD9245. This maximum current occurs when every output bit
switches on every clock cycle, i.e., a full-scale square wave at the
Nyquist frequency, fCLK/2. In practice, the DRVDD current will
be established by the average number of output bits switching,
which will be determined by the sample rate and the character-
istics of the analog input signal.
As detailed in Table 9, the data format can be selected for either
offset binary or twos complement.
Rev. B | Page 16 of 28
AD9245
TIMING
In all reference configurations, REFT and REFB drive the A/D
conversion core and establish its input span. The input range of
the ADC always equals twice the voltage at the reference pin for
either an internal or an external reference.
The AD9245 provides latched data outputs with a pipeline delay
of seven clock cycles. Data outputs are available one propaga-
tion delay (tPD) after the rising edge of the clock signal. Refer to
Figure 2 for a detailed timing diagram.
VIN+
The length of the output data lines and the loads placed on
them should be minimized to reduce transients within the
AD9245. These transients can degrade the converter’s dynamic
performance.
VIN–
REFT
0.1µF
+
ADC
0.1µF
REFB
0.1µF
10µF
CORE
The lowest typical conversion rate of the AD9245 is 1 MSPS. At
clock rates below 1 MSPS, dynamic performance may degrade.
VREF
0.1µF
+
10µF
VOLTAGE REFERENCE
SELECT
LOGIC
A stable and accurate 0.5 V voltage reference is built into the
AD9245. The input range can be adjusted by varying the refer-
ence voltage applied to the AD9245 using either the internal
reference or an externally applied reference voltage. The input
span of the ADC tracks reference voltage changes linearly. The
various reference modes are summarized Table 8 and described
in the following sections.
SENSE
0.5V
AD9245
03583-B-017
Figure 33. Internal Reference Configuration
If the ADC is being driven differentially through a transformer,
the reference voltage can be used to bias the center tap (com-
mon-mode voltage).
If the internal reference of the AD9245 is used to drive multiple
converters to improve gain matching, the loading of the refer-
ence by the other converters must be considered. Figure 34
depicts how the internal reference voltage is affected by loading.
INTERNAL REFERENCE CONNECTION
A comparator within the AD9245 detects the potential at the
SENSE pin and configures the reference into one of four
possible states, which are summarized in Table 8. If SENSE is
grounded, the reference amplifier switch is connected to the
internal resistor divider (see Figure 33), setting VREF to 1 V.
Connecting the SENSE pin to VREF switches the reference
amplifier output to the SENSE pin, completing the loop and
providing a 0.5 V reference output. If a resistor divider is
connected as shown in Figure 35, the switch is again set to the
SENSE pin. This puts the reference amplifier in a noninverting
mode with the VREF output defined as follows:
0.05
0
–0.05
0.5V ERROR (%)
–0.10
1.0V ERROR (%)
–0.15
–0.20
–0.25
R2
R1
VREF = 0.5× 1+
0
0.5
1.0
1.5
LOAD (mA)
2.0
2.5
3.0
03583-B-019
Figure 34. VREF Accuracy vs. Load
Table 8. Reference Configuration Summary
Internal Switch
Position
Resulting Differential
Span (V p-p)
Selected Mode
SENSE Voltage
AVDD
VREF
Resulting VREF (V)
External Reference
Internal Fixed Reference
Programmable Reference
N/A
SENSE
SENSE
N/A
0.5
2 × External Reference
1.0
2 × VREF
0.2 V to VREF
R2
R1
(See Figure 35)
0.5 × 1 +
Internal Fixed Reference
AGND to 0.2 V
Internal Divider
1.0
2.0
Rev. B | Page 17 of 2ꢀ
AD9245
OPERATIONAL MODE SELECTION
VIN+
VIN–
As discussed earlier, the AD9245 can output data in either offset
binary or twos complement format. There is also a provision for
enabling or disabling the clock duty cycle stabilizer (DCS). The
MODE pin is a multilevel input that controls the data format
and DCS state. The input threshold values and corresponding
mode selections are outlined in Table 9.
REFT
0.1µF
0.1µF
REFB
0.1µF
+
ADC
10µF
CORE
VREF
+
10µF
0.1µF
SELECT
LOGIC
Table 9. Mode Selection
R2
Duty Cycle
SENSE
MODE Voltage
AVDD
2/3 AVDD
1/3 AVDD
AGND (Default)
Data Format
Stabilizer
Disabled
Enabled
Enabled
Disabled
Twos Complement
Twos Complement
Offset Binary
R1
0.5V
AD9245
Offset Binary
03583-B-018
Figure 35. Programmable Reference Configuration
EVALUATION BOARD
The AD9245 evaluation board provides all of the support
circuitry required to operate the ADC in its various modes and
configurations. Complete schematics and layout plots follow
and demonstrate the proper routing and grounding techniques
that should be applied at the system level.
EXTERNAL REFERENCE OPERATION
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift charac-
teristics. When multiple ADCs track one another, a single
reference (internal or external) may be necessary to reduce gain
matching errors to an acceptable level. Figure 36 shows the typi-
cal drift characteristics of the internal reference in both 1.0 V
and 0.5 V modes.
It is critical that signal sources with very low phase noise (<1 ps
rms jitter) be used to realize the ultimate performance of the
converter. Proper filtering of the input signal, to remove
harmonics and lower the integrated noise at the input, is also
necessary to achieve the specified noise performance.
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
7 kΩ load. The internal buffer still generates the positive and
negative full-scale references, REFT and REFB, for the ADC
core. The input span is always twice the value of the reference
voltage; therefore, the external reference must be limited to a
maximum of 1.0 V.
The AD9245 can be driven single-ended or differentially
through a transformer. Separate power pins are provided to
isolate the DUT from the support circuitry. Each input configu-
ration can be selected by proper connection of various jumpers
(refer to the schematics).
An alternative differential analog input path using an AD8351
op amp is included in the layout, but is not populated in pro-
duction. Designers interested in evaluating the op amp with the
ADC should remove C15, R12, and R3, and populate the op
amp circuit. The passive network between the AD8351 outputs
and the AD9245 allows the user to optimize the frequency
response of the op amp for the application.
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
VREF = 1.0V
0.2
0.1
VREF = 0.5V
0
–40 –30 –20 –10
0
10 20 30 40 50 60 70 80
TEMPERATURE (°C)
03583-B-040
Figure 36. Typical VREF Drift
Rev. B | Page 1ꢀ of 2ꢀ
AD9245
P 2
0 V 5 .
5 V 2 .
M P V A
V D
L
G N D
5 V 2 .
0 V 3 .
D D V D R
G N D
D D A V
D 1 0
D 1 1
D 1 2
D 1 3
O T
M O D
S E S E N
E F V R
D 3
1 7
1 8
1 9
2 0
2 1
2 2
2 3
2 4
8
D 2 7
D 1
6
D 0
5
R
E
N W P D
4
D N C
3
C L K
2
D N C
1
Figure 37. LFCSP Evaluation Board Schematic—Analog Inputs and DUT
Rev. B | Page 19 of 2ꢀ
AD9245
Figure 38. LFCSP Evaluation Board Schematic—Digital Path
Rev. B | Page 20 of 2ꢀ
AD9245
Figure 39. LFCSP Evaluation Board Schematic—Clock Input
Rev. B | Page 21 of 2ꢀ
AD9245
03583-B-055
03583-B-053
Figure 42. LFCSP Evaluation Board Layout, Ground Plane
Figure 40. LFCSP Evaluation Board Layout, Primary Side
03583-B-056
03583-B-054
Figure 43. LFCSP Evaluation Board Layout, Power Plane
Figure 41. LFCSP Evaluation Board Layout, Secondary Side
Rev. B | Page 22 of 2ꢀ
AD9245
03583-B-057
03583-B-058
Figure 44. LFCSP Evaluation Board Layout, Primary Silkscreen
Figure 45. LFCSP Evaluation Board Layout, Secondary Silkscreen
Rev. B | Page 23 of 2ꢀ
AD9245
Table 10. LFCSP Evaluation Board Bill of Materials
Recommended
Package Value Vendor/Part Number by ADI
Supplied
Item Qty. Omit1 Reference Designator
Device
C1, C5, C7, Cꢀ, C9, C11, C12,
1ꢀ
C13, C15, C16, C31, C33, C34,
C36, C37, C41, C43, C47
C6, C1ꢀ, C27, C17,
C2ꢀ, C35, C45, C44
C2, C3, C4, C10, C20, C22,
C25, C29
1
Chip Capacitor
0603
0.1 µF
ꢀ
2
ꢀ
ꢀ
2
3
Tantalum Capacitor
Chip Capacitor
TAJD
0603
10 µF
C46, C24
C14, C30, C32, C3ꢀ,
C39, C40, C4ꢀ, C49
0.001 µF
4
5
3
1
C19, C21, C23
C26
Chip Capacitor
Chip Capacitor
0603
0603
10 pF
10 pF
E31, E35, E43, E44, E50, E51,
E52, E53
9
6
Header
EHOLE
Jumper Blocks
2
1
E1, E45
J1, J2
7
ꢀ
2
SMA Connector/50 Ω
Inductor
SMA
0603
Coilcraft/0603CS-
10NXGBU
L1
P2
10 nH
Wieland/25.602.2653.0,
z5-530-0625-0
9
1
Terminal Block
TB6
10
11
12
1
5
P12
Header Dual 20-Pin RT Angle HEADER40
Digi-Key S2131-20-ND
R3, R12, R23, R2ꢀ, Rx
R16, R17, R22, R27, R42, R37
R4, R15
Chip Resistor
Chip Resistor
0603
0603
0603
0 Ω
6
1
2
33 Ω
1 kΩ
R5, R6, R7, Rꢀ, R13, R20, R21,
R24, R25, R26, R30, R31, R32, Chip Resistor
R36
13
14
14
15
2
1
R10, R11
R29
Chip Resistor
0603
0603
36 Ω
50 Ω
Chip Resistor
R19
Digi-Key
CTS/742C163220JTR
16
2
RP1, RP2
Resistor Pack
ADT1-1WT
R_742
220 Ω
17
1ꢀ
19
20
21
22
23
24
25
26
27
2ꢀ
1
1
1
1
1
T1
AWT1-1T
Mini-Circuits
U1
74LVTH162374 CMOS Register TSSOP-4ꢀ
U4
AD9245BCP ADC (DUT)
74VCXꢀ6M
CSP-32
SOIC-14
PCB
Analog Devices, Inc.
Fairchild
X
U5
PCB
AD92XXBCP/PCB
ADꢀ351 Op Amp
MACOM Transformer
Chip Resistor
Analog Devices, Inc.
Analog Devices, Inc.
X
X
1
1
5
3
2
1
1
U3
MSOP-ꢀ
T2
ETC1-1-13 1-1 TX MACOM/ETC1-1-13
R1, R2, R9, R3ꢀ, R39
R14, R1ꢀ, R35
R40, R41
0603
0603
0603
SELECT
25 Ω
Chip Resistor
Chip Resistor
10 kΩ
1.2 kΩ
100 Ω
R34
Chip Resistor
R33
Chip Resistor
Total ꢀ2 34
1 These items are included in the PCB design, but are omitted at assembly.
Rev. B | Page 24 of 2ꢀ
AD9245
OUTLINE DIMENSIONS
5.00
0.60 MAX
BSC SQ
0.60 MAX
PIN 1
INDICATOR
25
24
32
1
PIN 1
INDICATOR
0.50
BSC
3.25
4.75
TOP
BOTTOM
VIEW
BSC SQ
3.10 SQ
2.95
VIEW
0.50
0.40
0.30
17
16
8
9
0.25 MIN
3.50 REF
0.80 MAX
12° MAX
0.65 TYP
0.05 MAX
0.02 NOM
1.00
0.85
0.80
0.30
0.23
0.18
COPLANARITY
0.08
0.20 REF
SEATING
PLANE
COMPLIANT TO JEDEC STANDARDS MO-220-VHHD-2
Figure 46. 32-Lead Frame Chip Scale Package [LFCSP]
(CP-32-1)
Dimensions shown in millimeters
ORDERING GUIDE
AD9245 Products
AD9245BCP-ꢀ01
AD9245BCPRL7–ꢀ01
AD9245BCPZ-ꢀ01, 2
AD9245BCPZRL7-ꢀ01, 2
AD9245BCP-ꢀ0EB1
Temperature Range
–40°C to +ꢀ5°C
–40°C to +ꢀ5°C
–40°C to +ꢀ5°C
–40°C to +ꢀ5°C
Package Description
Package Outline
Lead Frame Chip Scale Package (LFCSP)
Lead Frame Chip Scale Package (LFCSP)
Lead Frame Chip Scale Package (LFCSP)
Lead Frame Chip Scale Package (LFCSP)
Evaluation Board
CP-32-1
CP-32-1
CP-32-1
CP-32-1
1 It is recommended that the exposed paddle be soldered to the ground plane for the LFCSP package. There is an increased reliability of the solder joints, and the maxi-
mum thermal capability of the package is achieved with the exposed paddle soldered to the customer board.
2 Z = Lead Free.
Rev. B | Page 25 of 2ꢀ
AD9245
NOTES
Rev. B | Page 26 of 2ꢀ
AD9245
NOTES
Rev. B | Page 27 of 2ꢀ
AD9245
NOTES
© 2003 Analog Devices, Inc. All rights reserved. Trademarks and regis-
tered trademarks are the property of their respective owners.
C03583-0-10/03(B)
Rev. B | Page 2ꢀ of 2ꢀ
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