ADL5511 [ADI]

Envelope and TruPwr RMS Detector; 信封和TruPwr RMS检波器
ADL5511
型号: ADL5511
厂家: ADI    ADI
描述:

Envelope and TruPwr RMS Detector
信封和TruPwr RMS检波器

文件: 总28页 (文件大小:2033K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DC to 6 GHz  
Envelope and TruPwr RMS Detector  
Data Sheet  
ADL5511  
FEATURES  
FUNCTIONAL BLOCK DIAGRAM  
VPOS  
Envelope tracking RF detector with output proportional to  
input voltage  
15  
ADL5511  
Separate TruPwr rms output  
20pF  
400  
BIAS AND POWER-  
ENBL  
4
14 FLT4  
DOWN CONTROL  
No balun or external tuning required  
Excellent temperature stability  
Input power dynamic range of 47 dB  
Input frequency range from dc to 6 GHz  
130 MHz envelope bandwidth  
Envelope delay: 2 ns  
100  
11  
G = 1.7  
G = 1.5  
VRMS  
RMS  
2
3
RFIN  
FLT1  
250Ω  
10kΩ  
10  
9
VENV  
EREF  
ENVELOPE  
5pF  
250Ω  
Single-supply operation: 4.75 V to 5.25 V  
Supply current: 21.5 mA  
0.8pF  
VPOS  
400Ω  
0.4pF  
VPOS  
Power-down mode: 130 μW  
13  
6
7
8
12  
16  
1
5
FLT2  
COMM  
FLT3  
NC  
APPLICATIONS  
Figure 1.  
RMS power and envelope detection of W-CDMA, CDMA2000,  
LTE, and other complex waveforms  
Drain modulation based power amplifier linearization  
Power amplifier linearization employing envelope-tracking  
methods  
CH1 HIGH  
20mV  
VRMS  
VENV  
RF INPUT  
CH1 200mV CH2 30.8mV M 100ns  
CH3 200mV CH4 234mV Ω  
A CH4  
1.60V  
T
–68ns  
Figure 2. RMS and Envelope Response to a 20 MHz QPSK-Based LTE Carrier  
(Test Model E-TM1_1_20MHz)  
GENERAL DESCRIPTION  
The ADL5511 is an RF envelope and TruPwr™ rms detector.  
The envelope output voltage is presented as a voltage that is  
proportional to the envelope of the input signal. The rms  
output voltage is independent of the peak-to-average ratio  
of the input signal.  
The ADL5511 can operate from dc to 6 GHz on signals with  
envelope bandwidths up to 130 MHz.  
The extracted envelope can be used for RF power amplifier  
(PA) linearization and efficiency enhancements and the rms  
output can be used for rms power measurement. The high rms  
accuracy and fast envelope response are particularly useful for  
envelope detection and power measurement of broadband, high  
peak-to-average signals that are used in CDMA2000, W-CDMA,  
and LTE systems.  
The rms output is a linear-in-V/V voltage with a conversion  
gain of 1.9 V/V rms at 900 MHz. The envelope output has a  
conversion gain of 1.46 V/V at 900 MHz and is referenced to  
an internal 1.1 V reference voltage, which is available on the  
EREF pin.  
The ADL5511 operates from −40°C to +85°C and is available in  
a 16-lead, 3 mm × 3 mm LFCSP package.  
Rev. A  
Information furnished by Analog Devices is believed to be accurate and reliable. However, no  
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other  
rights of third parties that may result from its use. Specifications subject to change without notice. No  
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.  
Trademarks and registeredtrademarks arethe property of their respective owners.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781.329.4700  
www.analog.com  
Fax: 781.461.3113 ©2011–2012 Analog Devices, Inc. All rights reserved.  
 
 
 
 
ADL5511  
Data Sheet  
TABLE OF CONTENTS  
Features .............................................................................................. 1  
Output Drive Capability and Buffering................................... 18  
Applications Information .............................................................. 19  
Basic Connections...................................................................... 19  
Operation Below 1 GHz/Envelope Filtering........................... 19  
Choosing a Value for the RMS Averaging Capacitor (CFLT4).. 20  
Envelope Tracking Accuracy .................................................... 21  
Time Domain Envelope Tracking Accuracy........................... 21  
VRMS and VENV Output Offset............................................. 22  
Device Calibration and Error Calculation.............................. 22  
Error vs. Frequency.................................................................... 23  
Evaluation Board ........................................................................ 24  
Outline Dimensions....................................................................... 26  
Ordering Guide .......................................................................... 26  
Applications....................................................................................... 1  
Functional Block Diagram .............................................................. 1  
General Description ......................................................................... 1  
Revision History ............................................................................... 2  
Specifications..................................................................................... 3  
Absolute Maximum Ratings............................................................ 7  
ESD Caution.................................................................................. 7  
Pin Configuration and Function Descriptions............................. 8  
Typical Performance Characteristics ............................................. 9  
Circuit Description......................................................................... 17  
Envelope Propagation Delay..................................................... 17  
RMS Circuit Description........................................................... 17  
RMS Filtering.............................................................................. 17  
REVISION HISTORY  
2/12—Rev. 0 to Rev. A  
Changes to Equation 4 ................................................................... 19  
Updated Outline Dimensions....................................................... 26  
7/11—Revision 0: Initial Version  
Rev. A | Page 2 of 28  
 
Data Sheet  
ADL5511  
SPECIFICATIONS  
TA = 25°C, VPOS = 5 V, CFLT4 = 100 nF, 75 Ω shunt termination resistor to ground on (ac-coupled) RFIN, three-point calibration on VENV  
and VRMS at +5 dBm, −15 dBm, and −26 dBm, unless otherwise noted.  
Table 1.  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
FREQUENCY RANGE  
ENVELOPE CONVERSION (100 MHz)  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
Input RFIN  
DC  
6
GHz  
Input RFIN to output (VENV − VEREF  
CW input  
)
46  
17  
dB  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−29  
1.42  
−5  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.00  
26  
V
mV  
RMS Conversion  
Input RFIN to output (VRMS  
CW input  
)
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
46  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−29  
1.92  
11  
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
Input RFIN to output (VENV − VEREF  
CW input  
1.38  
53  
V
mV  
ENVELOPE CONVERSION (900 MHz)  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
)
46  
17  
dB  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−29  
1.46  
−5  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.02  
26  
V
mV  
RMS Conversion  
Input RFIN to output (VRMS  
CW input  
)
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
46  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−29  
1.9  
13  
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.35  
54  
V
mV  
Rev. A | Page 3 of 28  
 
ADL5511  
Data Sheet  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
ENVELOPE CONVERSION (1900 MHz)  
Input Range ( 1 dB Error)  
Input RFIN to output (VENV − VEREF  
CW input  
)
47  
dB  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
1.5  
−5  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.05  
28  
V
Low Power In  
mV  
RMS Conversion  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
Input RFIN to output (VRMS  
CW input  
)
47  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
1.96  
14  
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
Input RFIN to output (VENV − VEREF  
CW Input  
1.40  
56  
V
Low Power In  
mV  
ENVELOPE CONVERSION (2140 MHz)  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
)
47  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
1.53  
−5  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.07  
28  
V
Low Power In  
mV  
RMS Conversion  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
Input RFIN to output (VRMS  
CW input  
)
47  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
1.99  
13  
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.42  
56  
V
Low Power In  
mV  
Rev. A | Page 4 of 28  
Data Sheet  
ADL5511  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
ENVELOPE CONVERSION (2600 MHz)  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
Input RFIN to output (VENV − VEREF  
CW Input  
)
47  
17  
dB  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
1.56  
−3  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.10  
30  
V
mV  
RMS Conversion  
Input RFIN to output (VRMS  
CW input  
)
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
47  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
2.04  
15  
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
Input RFIN to output (VENV − VEREF  
CW Input  
1.46  
58  
V
mV  
ENVELOPE CONVERSION (3500 MHz)  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
)
47  
17  
dB  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
1.56  
−5  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.10  
28  
V
mV  
RMS Conversion  
Input RFIN to output (VRMS  
CW input  
)
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Intercept  
47  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−30  
2.03  
12  
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
1.46  
57  
V
mV  
Rev. A | Page 5 of 28  
ADL5511  
Data Sheet  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
ENVELOPE CONVERSION (6000 MHz)  
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
Input RFIN to output (VENV − VEREF  
CW Input  
)
45  
17  
dB  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−28  
0.85  
−10  
±1 dB error  
VENV = (Gain × VIN) + Intercept  
Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
0.60  
11  
V
mV  
RMS Conversion  
Input RFIN to output (VRMS  
CW input  
)
Input Range ( 1 dB Error)  
Maximum Input Level  
Minimum Input Level  
Conversion Gain  
45  
dB  
17  
dBm  
dBm  
V/V rms  
mV  
±1 dB error  
−28  
1.11  
7
±1 dB error  
VRMS = (Gain × VIN) + Intercept  
Intercept  
Output Voltage  
High Power In  
Low Power In  
PIN = +10 dBm, +707 mV rms  
PIN = −20 dBm, +22.4 mV rms  
Pin VENV  
VPOS = 5 V, RLOAD ≥ 500 Ω, CLOAD ≤ 10 pF  
No signal at RFIN  
3 dB  
0.80  
35  
V
mV  
ENVELOPE OUTPUT  
Maximum Output Voltage  
Output Offset  
Envelope Bandwidth  
Pulse Response Time  
3.5  
2
130  
4
V
mV  
MHz  
ns  
Input level = no signal to 5 dBm, 10% to  
90% response time  
Envelope Delay  
RFIN to VENV  
2
ns  
Output Current Drive  
RMS OUTPUT  
Load = 500 Ω||10 pF  
Pin VRMS  
15  
mA  
Maximum Output Voltage  
Output Offset  
VPOS = 5 V, RLOAD ≥ 10 kΩ  
No signal at RFIN  
Load = 1.3 kΩ  
3.8  
23  
3
V
mV  
mA  
Output Current Drive  
ENABLE INTERFACE  
Logic Level to Enable Power  
Logic Level to Disable Power  
POWER SUPPLIES  
Pin ENBL  
4.75 V ≤ VPOS ≤ 5.25 V  
4.75 V ≤ VPOS ≤ 5.25 V  
3.6  
V
V
2.0  
Operating Range  
−40°C < TA < +85°C  
4.75  
5.25  
V
Quiescent Current  
RFIN < −10 dBm, ENBL high  
RFIN < −10 dBm, ENBL low  
RFIN = 15 dBm, ENBL high  
21.5  
26  
43.8  
mA  
μA  
mA  
Rev. A | Page 6 of 28  
Data Sheet  
ADL5511  
ABSOLUTE MAXIMUM RATINGS  
Table 2.  
Parameter  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Rating  
5.5 V  
0 V, VPOS  
5.6 V p-p  
Supply Voltage, VPOS  
ENBL  
RFIN (RFIN AC-Coupled)  
Equivalent RF Power (Peak Envelope Power or 19 dBm  
CW), re: 50 Ω  
Internal Power Dissipation  
θJA  
580 mW  
68.9°C/W  
17.5°C/W  
125°C  
−40°C to +85°C  
−65°C to +150°C  
1250 V  
θJC  
ESD CAUTION  
Maximum Junction Temperature  
Operating Temperature Range  
Storage Temperature Range  
ESD (FICDM)  
ESD (HBM)  
2000 V  
Rev. A | Page 7 of 28  
 
 
ADL5511  
Data Sheet  
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS  
PIN 1  
INDICATOR  
12 NC  
FLT3 1  
RFIN 2  
FLT1 3  
ENBL 4  
11 VRMS  
10 VENV  
ADL5511  
TOP VIEW  
(Not to Scale)  
9
EREF  
NOTES  
1. NC = NO CONNECT. DO NOT CONNECT TO THIS PIN.  
2. THE EXPOSED PAD SHOULD BE CONNECTED  
TO BOTH THERMAL AND ELECTRICAL GROUNDS.  
Figure 3. Pin Configuration  
Table 3. Pin Function Descriptions  
Pin No.  
Mnemonic Description  
1, 16  
FLT3, FLT2  
External Envelope Filter. With the FLT3 and FLT2 pins not connected, two internal low-pass filters (operating  
in series) with corner frequencies of approximately 1000 MHz and 800 MHz remove the residual RF carrier (at  
two times the original input frequency) from the envelope signal. External, supply-referenced capacitors  
connected to FLT3 and FLT2 can be used to reduce this corner frequency. See the Basic Connections section  
for more information.  
2
3
4
RFIN  
FLT1  
ENBL  
RF Input. RFIN should be externally ac-coupled. RFIN has a nominal input impedance of 250 Ω. To achieve a  
broadband 50 Ω input impedance, an external 75 Ω shunt resistor should be connected between the source  
side of the ac coupling capacitor and ground.  
External Envelope Filter. A capacitor to ground on this pin can be used to reduce the nominal minimum  
input frequency. The capacitance on this pin helps to reduce any residual RF carrier presence on the EREF  
output pin. See the Basic Connections section for more information.  
Device Enable/Disable. A logic high on this pin enables the device. A logic low on this pin disables the  
device.  
5
COMM  
NC  
Device Ground. Connect to a low impedance ground plane.  
Do not connect to these pins.  
6, 7, 8, 12, 13  
9
10  
EREF  
VENV  
Reference Voltage for Envelope Output. The nominal value is 1.1 V.  
Envelope Output. The voltage on this pin represents the envelope of the input signal and is referred to  
EREF. VENV can source a current of up to 15 mA. Capacitive loading should not exceed 10 pF to achieve the  
specified envelope bandwidth. Lighter loads should be chosen when possible. The nominal output voltages  
on EREF and VENV with no signal present track with temperature. For dc-coupled envelope output, EREF  
should be used as a reference giving the true envelope voltage of VENV − VEREF. For ac coupling of the  
envelope output, the VENV pin can drive a 50 Ω load, if maximum current drive capability of 15 mA is not  
exceeded. See the Output Drive Capability and Buffering section for more information.  
11  
VRMS  
RMS Output Pin. This voltage is ground referenced and has a nominal swing of 0 V to 3.8 V. VRMS has a linear-  
in-V/V transfer function with a nominal slope of 2 V/V.  
14  
15  
0
FLT4  
VPOS  
EP  
RMS Averaging Capacitor. Connect between FLT4 and VPOS.  
Supply Voltage Pin. Operational range is 4.75 V to 5.25 V with a supply current of 21.5 mA.  
Exposed Pad. The exposed pad should be connected to both thermal and electrical grounds.  
Rev. A | Page 8 of 28  
 
Data Sheet  
ADL5511  
TYPICAL PERFORMANCE CHARACTERISTICS  
TA = 25°C, VPOS = 5 V, C FLT4 = 100 nF, 75 Ω shunt termination resistor to ground on (ac-coupled) RFIN, TA = +25°C (black), −40°C (blue),  
+85°C (red), three-point calibration on VENV and VRMS at +5 dBm, −15 dBm, and −26 dBm, unless otherwise noted.  
10  
10  
100MHz  
900MHz  
100MHz  
900MHz  
1900MHz  
2140MHz  
2600MHz  
3500MHz  
6000MHz  
1900MHz  
2140MHz  
2600MHz  
3500MHz  
6000MHz  
1
1
0.1  
0.1  
0.01  
0.01  
0.001  
–30 –25 –20 –15 –10  
–5  
0
5
10  
15  
20  
–30 –25 –20 –15 –10  
–5  
0
5
10  
15  
20  
INPUT (dBm)  
INPUT (dBm)  
Figure 7. VRMS Output vs. Input Level, at Various Frequencies at 25°C,  
Supply 5 V  
Figure 4. VENV Output vs. Input Level, at Various Frequencies at 25°C,  
Supply 5 V  
10  
10  
5V, –40°C  
5V, +25°C  
5V, +85°C  
5V, –40°C  
5V, +25°C  
5V, +85°C  
1
0.1  
1
0.1  
0.01  
0.01  
0.001  
–30 –25 –20 –15 –10  
–5  
0
5
10  
15  
20  
–30 –25 –20 –15 –10  
–5  
0
5
10  
15  
20  
INPUT (dBm)  
INPUT (dBm)  
Figure 8. VRMS Output vs. Input Level and Temperature at 1900 MHz,  
Supply 5 V  
Figure 5. VENV Output vs. Input Level and Temperature at 1900 MHz,  
Supply 5 V  
75  
450  
3.0  
2.8  
2.6  
2.4  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0
–40°C  
+25°C  
+85°C  
70  
65  
60  
55  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
400  
350  
300  
250  
200  
150  
100  
50  
SHUNT RESISTANCE  
SHUNT CAPACITANCE  
0
0
–30 –25 –20 –15 –10  
–5  
0
5
10  
15  
20  
0
1
2
3
4
5
6
INPUT (dBm)  
FREQUENCY (GHz)  
Figure 6. Supply Current vs. Input Level and Temperature  
Figure 9. Input Impedance vs. Frequency  
Rev. A | Page 9 of 28  
 
 
 
ADL5511  
Data Sheet  
3
3
2
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 10. VENV Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 100 MHz  
Figure 13. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 100 MHz  
3
3
2
1
0
2
1
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 11. VRMS Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 100 MHz  
Figure 14. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 100 MHz  
3
3
2
1
0
2
1
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30 –25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 12. VENV Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 900 MHz  
Figure 15. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 900 MHz  
Rev. A | Page 10 of 28  
 
Data Sheet  
ADL5511  
3
2
3
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
P
(dBm)  
IN  
P
(dBm)  
IN  
Figure 16. VRMS Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 900 MHz  
Figure 19. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 900 MHz  
3
3
2
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 17. VENV Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 1900 MHz  
Figure 20. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 1900 MHz  
3
2
3
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 18. VRMS Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 1900 MHz  
Figure 21. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 1900 MHz  
Rev. A | Page 11 of 28  
ADL5511  
Data Sheet  
3
3
2
2
1
1
0
0
–1  
–2  
–1  
–2  
–3  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 22. VENV Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 2140 MHz  
Figure 25. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 2140 MHz  
3
2
3
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 23. VRMS Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 2140 MHz  
Figure 26. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 2140 MHz  
3
2
3
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
P
(dBm)  
IN  
P
(dBm)  
IN  
Figure 24. VENV Output Temperature Drift from +25°C, Three-Point  
Calibration for Multiple Devices at −40°C, +25°C, and +85°C at 2600 MHz  
Figure 27. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 2600 MHz  
Rev. A | Page 12 of 28  
Data Sheet  
ADL5511  
3
2
3
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 31. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 2600 MHz  
Figure 28. VRMS Output Temperature Drift from +25°C Linear Reference  
for Multiple Devices at −40°C, +25°C, and +85°C, 2600 MHz Frequency  
3
3
2
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 32. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 3500 MHz  
Figure 29. VENV Output Temperature Drift from +25°C Linear Reference  
for Multiple Devices at −40°C, +25°C, and +85°C, 3500 MHz Frequency  
3
3
2
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
P
–5  
0
5
10  
15  
(dBm)  
(dBm)  
IN  
IN  
Figure 33. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 3500 MHz  
Figure 30. VRMS Output Temperature Drift from +25°C Linear Reference  
for Multiple Devices at −40°C, +25°C, and +85°C, 3500 MHz Frequency  
Rev. A | Page 13 of 28  
ADL5511  
Data Sheet  
3
3
2
2
1
1
0
0
–1  
–2  
–1  
–2  
–3  
–3  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
P
(dBm)  
IN  
P
(dBm)  
IN  
Figure 34. VENV Output Temperature Drift from +25°C Linear Reference  
for Multiple Devices at −40°C, +25°C, and +85°C, 6000 MHz Frequency  
Figure 37. VENV Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 6000 MHz  
3
2
1
0
3
2
1
0
–1  
–2  
–3  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
P
(dBm)  
IN  
P
(dBm)  
IN  
Figure 35. VRMS Output Temperature Drift from +25°C Linear Reference  
for Multiple Devices at −40°C, +25°C, and +85°C, 6000 MHz Frequency  
Figure 38. VRMS Output Delta from +25°C Output Voltage for  
Multiple Devices at −40°C and +85°C at 6000 MHz  
20  
10  
2
–40°C  
+25°C  
0
–2  
+85°C  
0
–10  
–20  
–30  
–40  
–50  
–4  
–6  
–8  
–10  
–12  
–14  
–16  
–60  
THD (dBc)  
–70  
CARRIER SUPPRESSION (dBc)  
ENVELOPE GAIN (dB)  
–80  
–35 –30 –25 –20 –15 –10 –5  
RFIN (dBm)  
0
5
10  
15  
1
10  
100  
1000  
ENVELOPE FREQUENCY (MHz)  
Figure 39. Normalized VENV Frequency Response, VENV AC-Coupled into a  
50 Ω Spectrum Analyzer Load  
Figure 36. THD on VENV vs. RF Input Level; 1900 MHz RF Input, AM Modulated  
by a 20 MHz Sine Wave (Modulation Index = 0.25), VENV Output AC-Coupled  
into a 50 Ω Spectrum Analyzer Load  
Rev. A | Page 14 of 28  
 
Data Sheet  
ADL5511  
PULSED RFIN  
1
V
ENBL  
4
+5dBm  
+1dBm  
–3dBm  
–10dBm  
+5dBm  
+1dBm  
–3dBm  
–10dBm  
2
R1  
CH1 200mV Ω  
CH3 125mV Ω  
REF4 125mV 10ns  
M10ns  
111.6ns  
A CH2  
1.88V  
CH4 7V  
REF1 250mV 1µs  
M1µs  
T
A CH4  
3.78V  
T
3.996µs  
Figure 43. VENV Output Response to Enable Gating at Various RF Input Levels,  
900 MHz Frequency  
Figure 40. VENV Output Response to Various RF Input Pulse Levels  
900 MHz Frequency  
2
V
ENBL  
PULSED RFIN  
+5dBm  
4
+1dBm  
–3dBm  
+5dBm  
+1dBm  
–3dBm  
–10dBm  
–10dBm  
R4  
R1  
CH2 200mV Ω  
REF4 125mV 1µs  
M1µs  
T
A CH4  
2.2V  
CH4 7V  
REF1 220mV 1µs  
M1µs  
T
A CH4  
3.78V  
–824ns  
4.012µs  
Figure 44. VRMS Output Response to Enable Gating at Various RF Input Levels,  
900 MHz Frequency, CFLT4 = Open  
Figure 41. VRMS Output Response to Various RF Input Pulse Levels  
900 MHz Frequency, CFLT4 = Open  
V
2
ENBL  
4
PULSED RFIN  
+5dBm  
+1dBm  
+5dBm  
+1dBm  
–3dBm  
–3dBm  
–10dBm  
–10dBm  
R4  
R4  
CH4 7V  
REF4 220mV 40µs  
M40µs  
160.4µs  
A CH4  
3.78V  
CH2 200mV M100µs  
REF4 125mV 100µs  
A CH4  
2.2V  
T
T
–100.5µs  
Figure 45. VRMS Output Response to Enable Gating at Various RF Input Levels,  
900 MHz Frequency, CFLT4 = 100 nF  
Figure 42. VRMS Output Response to Various RF Input Pulse Levels,  
900 MHz Frequency, CFLT4 = 100 nF  
Rev. A | Page 15 of 28  
ADL5511  
Data Sheet  
3
3
2
CW  
QAM64  
QPSK  
1CWCDMA  
4CWCDMA  
LTE  
CW  
QAM64  
QPSK  
1CWCDMA  
4CWCDMA  
LTE  
2
1
1
0
0
–1  
–2  
–3  
–1  
–2  
–3  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
INPUT (dBm)  
INPUT (dBm)  
Figure 46. VRMS Error from CW Linear Reference vs. Signal Modulation,  
Frequency = 900 MHz, CLPF = 0.1 µF (CW, QPSK, QAM64, 1CW-CDMA,  
4CW-CDMA, LTE Test Model E-TM1_1_20MHz)  
Figure 47. VRMS Error from CW Linear Reference vs. Signal Modulation,  
Frequency = 2140 MHz, CLPF = 0.1 µF (CW, QPSK, QAM64, 1CW-CDMA,  
4CW-CDMA, LTE Test Model E-TM1_1_20MHz)  
Rev. A | Page 16 of 28  
Data Sheet  
ADL5511  
CIRCUIT DESCRIPTION  
The ADL5511 employs a proprietary rectification technique  
to strip off the carrier of an input signal to reveal the true  
envelope. In this first detection stage, the carrier frequency  
is doubled and an on-chip two-pole passive low-pass filter  
accurately preserves the envelope and filters out the carrier.  
The poles of this filter, as defined by the on-chip RC filters  
(0.4 pF, 400 Ω, 0.8 pF, 250 Ω) values allow some carrier  
leakthrough for common RF frequencies. This is to ensure  
that maximum envelope bandwidth can be maintained.  
For more details, see the Basic Connections section.  
RMS CIRCUIT DESCRIPTION  
The rms processing is done using a proprietary translinear  
technique. This method is a mathematically accurate rms  
computing approach and achieves unprecedented rms  
accuracies for complex modulation signals irrespective of  
the crest factor of the input signal. An integrating filter  
capacitor does the square-domain averaging. The VRMS  
output can be expressed as  
T2  
VI2N ×dt  
VPOS  
T1  
VRMS = A×  
15  
T2 T1  
ADL5511  
(1)  
20pF  
400Ω  
BIAS AND POWER-  
DOWN CONTROL  
Note that A is a scaling parameter that is decided on by the on-chip  
resistor ratio, and there are no other scaling parameters involved in  
this computation, which means that the rms output is inherently  
free from any sources of error due to temperature, supply, and  
process variation.  
ENBL  
4
14 FLT4  
100Ω  
11  
G = 1.7  
G = 1.5  
VRMS  
RMS  
2
3
RFIN  
FLT1  
250Ω  
10kΩ  
10  
9
VENV  
EREF  
ENVELOPE  
5pF  
RMS FILTERING  
250Ω  
0.8pF  
VPOS  
400Ω  
The on-chip rms filtering corner is internally set by a 400 Ω resistor  
and a 20 pF capacitor, yielding a corner frequency of approximately  
20 MHz. Whereas this filters out all carrier frequencies, most of the  
modulation envelope is not filtered. For adequate rms filtering,  
connect an external filter capacitor between FLT4 (Pin 14) and  
VPOS (Pin 15). This capacitance acts on the internal 400 Ω  
resistor (see Figure 48) to yield a new corner frequency for the  
rms filter given by  
0.4pF  
VPOS  
13  
6
7
8
12  
16  
1
5
FLT2  
COMM  
FLT3  
NC  
Figure 48. Block Diagram  
The extracted envelope is further processed in two parallel  
channels, one computing the rms value of the envelope and  
the other transferring the envelope with appropriate scaling  
to the envelope output.  
1
CFLT4  
=
20 pF  
(2)  
(2π × fRMS × 400 )  
ENVELOPE PROPAGATION DELAY  
For example, a supply-referenced 0.1 µF capacitor on FLT4  
reduces the corner frequency of the rms averaging circuit to  
approximately 4 kHz.  
The delay specified in this data sheet is with no external  
capacitor at the FLT2 and FLT3 pins. The delay through the  
ADL5511, although very small, depends upon a number of  
factors, notable of which are internal filter component values  
and op amp compensation capacitors. The delay will vary from  
part to part by approximately 15% due to process variations.  
RMS filtering has a direct impact on rms accuracy. For most  
accurate detection, the rms filter corner should be low enough  
to filter out most of the modulation content. This will corre-  
spond to a corner frequency that is significantly lower than the  
bandwidth of the signal being measured. See the Choosing a  
Value for the RMS Averaging Capacitor (CFLT4) section for more  
details and filtering options.  
In addition, the choice of external FLT2 and FLT3 values, as  
well as load on the VNEV pin will increase the delay. In this  
case, the delay variation will be dominated by the part-to-part  
tolerance of the external capacitors.  
Rev. A | Page 17 of 28  
 
 
 
 
 
ADL5511  
Data Sheet  
The VRMS buffered output can source a maximum current of  
3 mA, but is not designed to sink any appreciable amount of  
current. If current sink capability is desired at this pin, a shunt  
resistance to ground can be connected. The VRMS output has  
an on-chip series resistance of 100 Ω, to allow a low-pass  
filtering of the residual ripple using a single shunt capacitor  
at this pin. Large shunt capacitors at this pin may also require  
a shunt resistor to be placed to allow fast discharging of the  
capacitor. The internal shunt resistance on the VRMS pin is  
10 kΩ. Note that any shunt resistance placed on this pin creates  
a resistive divider with the on-chip 100 Ω series resistance.  
OUTPUT DRIVE CAPABILITY AND BUFFERING  
The envelope output of the ADL5511 is presented on the VENV  
pin as a single-ended buffered output with low output imped-  
ance. To achieve high envelope bandwidth, this output is not  
ground referenced, unlike the VRMS output, which is ground  
referenced.  
The VENV output has a no signal dc value of about 1.1 V.  
This dc reference is temperature dependent and is presented  
as a standalone reference voltage on the EREF pin and as a  
buffered output. The true envelope at any instant of time is  
simply (VENV − VEREF), but these two pins do not constitute a  
differential output. EREF is a fixed dc voltage and VENV carries  
all the envelope information.  
The EREF output buffer also has 3 mA current sourcing  
capability. The internal shunt resistance on this pin through  
which any current must be sunk, is 12 kΩ. A capacitor to  
ground can be placed on this pin to eliminate any RF or  
envelope ripple at this pin to ensure that voltage at this pin  
acts as a clean reference for the VENV output for all possible  
carrier and envelope frequencies.  
The VENV output is capable of supporting a parallel load of  
500 Ω and 10 pF at full-scale envelope output and maximum  
bandwidth. Lighter loads (higher R and lower C) are always  
recommended whenever possible to minimize power  
consumption and achieve maximum possible bandwidth.  
The maximum source/sink current capacity of the VNEV  
output is 15 mA peak and load conditions should be such  
that this is not exceeded. The maximum output voltage at  
this pin is approximately (VPOS − 1.5) V.  
Viewing the Envelope on an Oscilloscope  
When viewing the VENV output on an oscilloscope, use a low  
capacitive FET probe. This reduces the capacitance presented to  
the VENV output and avoids the corresponding effects of larger  
capacitive loads.  
For the case of ac coupling only, the VENV output can drive  
a 50 Ω load, as long as the maximum signal swing does not  
exceed an amplitude of approximately 1.5 V p-p. This corre-  
sponds to the peak signal current of 15 mA into the 50 Ω load.  
If a 50 Ω drive capability is desired, the maximum input signal  
to ADL5511 should be adjusted, such that this output swing  
condition is not exceeded. A 50 Ω load should never be dc  
coupled to the VENV output, as it presents a current draw of  
>20 mA even for no-signal condition corresponding to 1.1 V  
nominal dc voltage at the VENV pin.  
Rev. A | Page 18 of 28  
 
Data Sheet  
ADL5511  
APPLICATIONS INFORMATION  
C14  
0.1µF  
+5V  
C13  
100pF  
VPOS  
15  
ADL5511  
C17  
20pF  
400Ω  
0.1µF  
BIAS AND POWER-  
DOWN CONTROL  
FLT4  
ENBL  
4
14  
11  
VPOS  
100Ω  
VRMS  
RMS  
OUTPUT  
C1  
G = 1.7  
G = 1.5  
RMS  
100pF  
RFIN  
FLT1  
2
3
R5  
75Ω  
250Ω  
10kΩ  
VENV  
EREF  
ENVELOPE  
OUTPUT  
10  
9
ENVELOPE  
C2  
100pF  
5pF  
250Ω  
ENVELOPE  
REFERENCE  
0.8pF  
VPOS  
400Ω  
0.4pF  
VPOS  
13  
6
7
8
12  
16  
1
5
FLT2 FLT3  
C6  
COMM  
NC  
(SEE TEXT)  
C10  
(SEE TEXT)  
VPOS  
Figure 49. Basic Connections  
ground referenced capacitor to Pin 3 (FLT1). The value of the  
external capacitance is set using the following equation:  
BASIC CONNECTIONS  
Basic connections for operation of the ADL5511 are shown in  
Figure 49. The ADL5511 requires a single supply of 5 V. The  
supply is connected to the VPOS supply pin. Decouple this  
pin using two capacitors with values equal or similar to those  
shown in Figure 49. Place these capacitors as close as possible  
to the VPOS pin.  
1
CFLT1  
=
5 pF  
(3)  
(2π × f3dB ×10,000 )  
For example, a 100 pF capacitance on FLT1 will reduce the  
corner frequency to 150 kHz. As a general guideline, this  
corner frequency should be set to be at least one tenth of the  
minimum expected carrier frequency. This ensures a flat  
frequency response around the frequency of interest.  
An external 75 Ω resistor combines with the relatively high  
RF input impedance of the ADL5511 to provide a broadband  
50 Ω match. Place an ac coupling capacitor between this resistor  
and RFIN.  
The envelope detection path of the ADL5511 includes internal  
carrier-suppression low-pass filtering. With the FLT2 and FLT3  
pins not connected, two internal 1 GHz and 800 MHz low-pass  
filters (operating in series) remove the RF carrier from the  
envelope output signal.  
The envelope output is available on Pin 10 (VENV) and is  
referenced to the 1.1 V dc voltage on Pin 9 (EREF).  
The rms output voltage is available at the VRMS pin with rms  
averaging provided by the supply-referenced capacitance on  
Pin 14 (FLT4).  
The equations for these filters are as follows:  
1
1GHz  
(4)  
OPERATION BELOW 1 GHZ/ENVELOPE FILTERING  
(2π × 0.4 pF × 400 )  
To operate the ADL5511 at frequencies below 1 GHz, a number  
of external capacitors must be added to the FLT3, FLT2, and  
FLT1 pins. These changes are in addition to the choice of an  
appropriate rms averaging capacitor, see the Choosing a Value  
for the RMS Averaging Capacitor (CFLT4) section.  
and  
1
800 MHz  
(5)  
(2π × 0.8 pF × 250 )  
Because the envelope detection circuitry includes a full-wave  
As part of the internal signal processing algorithm, the RF  
input signal passes through a low-pass filter comprising of a  
10 kΩ resistor and a 5 pF capacitor (see Figure 49). This  
corresponds to a corner frequency of approximately 3.2 MHz.  
If the carrier frequency is less than approximately ten times this  
value (32 MHz), this corner frequency must be reduced. The  
internal 5 pF capacitance can be augmented by connecting a  
rectifier, this filter has to primarily suppress the signal at twice  
the original input frequency.  
Rev. A | Page 19 of 28  
 
 
 
 
ADL5511  
Data Sheet  
For input frequencies in the 900 MHz range, there will still be  
significant carrier content on the envelope output. With the  
two filters providing a combined 6 dB roll-off at approximately  
900 MHz and with the residual carrier at 1.8 GHz, carrier  
filtering of approximately 18 dB can be expected (the two  
single-pole filters provide a combined roll-off of 12 dB per  
octave.  
(Pin 14) and VPOS (Pin 15). This capacitance acts on the  
internal 400 Ω resistor to yield a new corner frequency for the  
rms filter given by the following equation:  
1
CFLT4  
=
20 pF  
(8)  
(2π × fFLT 4 × 400 )  
For example, a supply-referenced 0.1 µF capacitor on FLT4  
reduces the corner frequency of the rms averaging circuit to  
approximately 4 kHz.  
The internal filtering of the carrier in the envelope detection  
path can be augmented by adding additional supply-referenced  
capacitance to the FLT2 and FLT3 pins. The required capaci-  
tance can be calculated using the following equations:  
The size of the rms filtering capacitor has a direct impact on  
the rms accuracy up to a point. For most accurate detection, the  
rms filter corner should be low enough to filter out most of the  
modulation content. This corresponds to a corner frequency  
that is significantly less than the bandwidth of the signal being  
measured.  
1
CFLT2  
=
0.4 pF  
(6)  
(2π × fFLT2 × 400 )  
and  
Table 4 shows recommended minimum values of CFLT4 for  
popular modulation schemes. Using smaller capacitor values  
than these will result in rms measurement errors; using higher  
values will not further improve rms accuracy but will reduce the  
output noise on VRMS at the expense of increased rise and fall  
times. In Table 4, rise and fall times are also shown along with  
residual output noise.  
1
CFLT3  
=
0.8 pF  
(7)  
(2π × fFLT3 ×250 )  
where fLT2 and fLT3 are the desired corner frequencies.  
For example, to set the corner frequency to 200 MHz, CFLT2  
and CFLT3 should be set to 1.6 pF and 2.4 pF, respectively.  
The two corner frequencies should be set so that they are  
approximately equal.  
The recommended minimum values for CFLT4 were experimen-  
tally determined by starting out with a large capacitance value  
on the FLT4 pin (for example, 10 µF). The value of VRMS was  
noted for a fixed input power level (for example, 0 dBm). The  
value of CFLT4 was then progressively reduced (this can be done  
with press-down capacitors) until the value of VRMS started to  
deviate from its original value (this indicates that the accuracy  
of the rms computation is degrading and that CFLT4 is becoming  
too small).  
Care should be taken not to set the corner frequency of this  
carrier suppression filter too low as it will start to degrade  
envelope bandwidth. The ADL5511 has an envelope bandwidth  
of 130 MHz. Thus, if the capacitors on FLT2 and FLT3 are so  
big that the carrier-suppression corner frequency approaches  
130 MHz, the carrier filtering effort will directly impact the  
envelope bandwidth. Thus, the corner frequency should be set  
low enough so that the RF carrier is adequately removed from  
the envelope output while still maintaining the desired envelope  
bandwidth. An alternative option would be to filter the carrier  
at the VENV output using a higher order filter.  
The recommended minimum value for CFLT4 is roughly  
inversely proportional to the bandwidth of the input signal, that  
is, wider bandwidth signals tend to require smaller minimum  
filter capacitances. As already noted, the value of CFLT4 sets up  
an internal low pass corner frequency, which filters the rms  
voltage. As carrier bandwidth increases, a larger proportion  
of the residual noise (which has been effectively mixed down  
to baseband) is filtered away. This results in smaller capaci-  
tances being required as carrier bandwidths increase.  
CHOOSING A VALUE FOR THE RMS AVERAGING  
CAPACITOR (CFLT4  
)
CFLT4 provides the averaging function for the internal rms  
computation, the result of which is available at the VRMS  
output. As already noted, the on-chip rms filtering corner is  
internally set by a 400 Ω resistor and a 20 pF capacitor, yielding a  
corner frequency of approximately 20 MHz. For adequate rms  
filtering, connect an external filter capacitor between FLT4  
Table 4. Recommended Minimum CFLT4 Values for Various Modulation Schemes (Pin = 0 dBm)  
PEP to RMS  
Ratio  
Signal  
Bandwidth (Min)  
CFLT4  
Modulation/Standard  
Output Noise  
98 mV p-p  
140 mV p-p  
Rise/Fall Time (10% to 90%)  
82 µs/310 µs  
40 µs/140 µs  
W-CDMA, One-Carrier, TM1-64  
W-CDMA Four-Carrier, TM1-64, TM1-32,  
TM1-16, TM1-8  
9.83 dB  
12.08 dB  
3.84 MHz  
220 nF  
100 nF  
18.84 MHz  
LTE Test Model E-TM1_1_4MHz  
LTE Test Model E-TM1_1_10MHz  
LTE Test Model E-TM1_1_20MHz  
9.83 dB  
11.99 dB  
11.58 dB  
4 MHz  
10 MHz  
20 MHz  
220 nF  
100 nF  
47 nF  
135 mV p-p  
89 mV p-p  
90 mV p-p  
82 µs/310 µs  
40 µs/140 µs  
20 µs/70 µs  
Rev. A | Page 20 of 28  
 
 
Data Sheet  
ADL5511  
For applications that are not response time critical, a  
relatively large capacitor can be placed on the FLT4.  
improves until it sharply degrades at an input power level of  
approximately 13 dBm. This sharp decrease is caused by the  
clipping of the AM signal’s peak envelope. Figure 51 also shows  
carrier leakage at VENV in dBc with respect to the input carrier  
amplitude.  
There is no maximum capacitance limit for CFLT4  
.
Figure 50 shows how output noise, rise time and fall time  
vary vs. CFLT4 when the ADL5511 is driven by an 1.9 GHz  
LTE carrier with a bandwidth of 10 MHz (LTE Test Model  
E-TM1_1_10MHz, peak-to-average ratio = 11.99 dB).  
This measurement, when conducted over the full input power  
range of the ADL5511, suffers from measurement inaccuracies  
of the input modulated signal due to the spectrum analyzers  
noise floor and therefore does not accurately reveal the ADL5511s  
limitations at the lower end of the measurement range. In  
addition to this, the process of generating an AM signal for this  
test (using the ADL5390 multiplier) is not perfect and resulted  
in a source signal whose envelope was not harmonically pure.  
800  
700  
600  
500  
400  
300  
200  
100  
0
10000000  
OUTPUT NOISE (mV p-p)  
10% TO 90% RISE TIME (µs)  
90% TO 10% FALL TIME (µs)  
1000000  
100000  
10000  
1000  
100  
TIME DOMAIN ENVELOPE TRACKING ACCURACY  
The envelope tracking accuracy of the ADL5511 can also be  
assessed in the time domain by looking at the input peak power  
levels that cause clipping.  
10  
1
The usable rms input power range of the ADL5511 varies  
depending on the desired accuracy level and the peak-to-  
average ratio of the input signal. Figure 4 shows the linear  
operating range of the VENV output when the RF input is  
driven by unmodulated sine waves at various frequencies.  
This shows operation up to rms input levels of approximately  
19 dBm. If the signal has a peak-to-average ratio that is greater  
than the square root of two, the usable input range on RFIN  
will decrease. In general, the maximum input power for linear  
operation should be determined by the peak envelope power  
(PEP) of the input signal. Figure 52 shows the time-domain  
response of the VENV output to a 900 MHz LTE carrier with  
a bandwidth of 20 MHz (Test Model E-TM1_2_20MHz).  
The signal level of the carrier (7 dBm rms, 19 dBm PEP)  
was deliberately increased until clipping was observed at  
the VENV output.  
0.1  
1
10  
100  
1000  
C
(nF)  
FLT4  
Figure 50. Output Noise, Rise and Fall Times vs. CFLT4 Capacitance, 10 MHz  
BW LTE Carrier (LTE Test Model E-TM1_1_10MHz) at 1.9 GHz with PIN = 0 dBm  
ENVELOPE TRACKING ACCURACY  
The envelope tracking accuracy of the ADL5511 is measured in  
terms of the higher order distortion of the envelope output when  
the RF input signal is AM modulated using a low-harmonic  
sinusoid at a given frequency. Such an input sinusoidal envelope  
has been generated using the ADL5390 multiplier modulator.  
This generates a double sideband AM modulated signal of a  
known modulation index. In this measurement, the ADL5511  
acts as free-running AM demodulator without requiring a local  
oscillator to demodulate the signal.  
20  
Note that the peak envelope power of a signal is derived  
based on the rms level of the signal during a peak cycle, that is  
V p-p/2. For example, a signal that achieves a peak voltage of  
10 V (or 20 V p-p) has a PEP of 30 dBm. According to this  
definition, the PEP of a sine wave is equal to its rms power  
level because it has a constant envelope.  
10  
0
–10  
–20  
–30  
–40  
–50  
–60  
THD (dBc)  
–70  
CARRIER SUPPRESSION (dBc)  
ENVELOPE GAIN (dB)  
–80  
–35 –30 –25 –20 –15 –10 –5  
0
5
10  
15  
RFIN (dBm)  
Figure 51. THD on VENV vs. RF Input Level; 1900 MHz RF Input, AM Modulated  
by a 20 MHz Sine Wave (Modulation Index = 0.25), VENV Output AC-Coupled  
into a 50 Ω Spectrum Analyzer Load  
Figure 51 shows such a plot total harmonic distortion (THD)  
of the VENV output vs. RF input power for the modulation  
index of 0.25. As the input power level increases, the THD  
Figure 52. VENV Response to a 20 MHz LTE Carrier with a PEP of 19 dBm that  
has been Triggered to Capture the Envelope’s Peak Level  
Rev. A | Page 21 of 28  
 
 
 
 
 
ADL5511  
Data Sheet  
VRMS AND VENV OUTPUT OFFSET  
DEVICE CALIBRATION AND ERROR CALCULATION  
The 900 MHz RF power sweeps in Figure 53 and Figure 54  
show distributions of the VRMS and VENV outputs voltages  
for multiple devices at 25°C. The VRMS output response  
flattens out at approximately −30 dBm while the various VENV  
response traces begin to fanout unpredictably (Figure 4 and  
Figure 7 show this behavior at other frequencies). While these  
plots suggest that operation at input levels down to −30 dBm is  
feasible, account must also be taken for variations over  
temperature. Figure 10 to Figure 38 show how the linearity  
error starts to increase below input levels of −20 dBm (the  
size of the error varies between VENV and VRMS and with  
frequency).  
Because slope and intercept vary from device to device,  
calibration must be performed to achieve high accuracy.  
In general, calibration is performed by applying two or more  
known input power levels to the ADL5511 and measuring  
the corresponding output voltages. The calibration points  
are generally chosen to be within the linear operating range  
of the device. For a two-point calibration, the conversion gain  
(or slope) and intercept are calculated for VRMS and VENV using the  
following equations:  
Slope = (VOUT2 VOUT1)/(VIN2 VIN1  
Intercept = VOUT1 − (Slope × VIN1  
where:  
)
(9)  
)
(10)  
10000  
V
V
IN is the rms input voltage to RFIN.  
OUT is the voltage output at VRMS or VENV.  
1000  
100  
10  
Because the gain and intercept of the rms and envelope paths  
will be different, both paths should be calibrated, that is, with a  
measured signal applied to RFIN, VENV, and VRMS. To ensure  
that the voltage at VENV and VRMS is a steady-state value, a  
constant envelope signal such as a sine wave should be used as  
the source during calibration.  
Once slope and intercept are calculated, an equation can be  
written that allows calculation of the input rms or envelope level  
using the following equations:  
1
–40  
–30  
–20  
–10  
0
10  
V
INRMS = (VRMS InterceptVRMS)/SlopeRMS  
INENV = (VENV InterceptVENV)/SlopeVENV  
(11)  
(12)  
INPUT (dBm)  
Figure 53. VRMS Output vs. Input Level Distribution of 50 Devices,  
900 MHz Frequency  
V
The law conformance error, that is, the difference between the  
actual input level (VIN_IDEAL) and the measured/calculated input  
level (VMEASURED), of these calculations can be calculated using  
the following equation:  
10000  
1000  
100  
10  
Error (dB) =  
20 × log [(VMEASURED Intercept)/(Slope × VIN_IDEAL)]  
(13)  
1
–40  
–30  
–20  
–10  
0
10  
INPUT (dBm)  
Figure 54. VENV Output vs. Input Level Distribution of 50 Devices,  
900 MHz Frequency  
Rev. A | Page 22 of 28  
 
 
 
 
Data Sheet  
ADL5511  
Figure 55 is a plot of this error for VENV at 1900 MHz for a  
multiple devices at +25°C, +85°C, and −40°C with calibration  
performed at two points, −14 dBm and +5 dBm (notice how  
the error at 25°C at the calibration points is zero). These error  
plots for all temperatures are calculated using the 25°C slope  
and intercept. This is consistent with calibration in a mass  
production environment where calibration at temperature is  
generally not practical.  
ERROR VS. FREQUENCY  
Figure 57 and Figure 58 show how the VRMS and VENV output  
voltages and error vary with input frequency when the  
ADL5511 is calibrated at a single frequency. In this example,  
the ADL5511 has been calibrated at 25°C at 1.9 GHz. The  
plots also show how the output voltage and error vary above  
and below this frequency.  
600  
500  
400  
300  
200  
100  
0
6
3
–40°C  
+25°C  
+85°C  
4
2
1
2
0
0
–2  
–4  
–6  
–1  
–2  
–3  
V
V
V
AT –40°C  
AT +25°C  
AT +85°C  
RMS  
RMS  
RMS  
ERROR AT –40°C  
ERROR AT +25°C  
ERROR AT +85°C  
0
1000  
2000  
3000  
4000  
5000  
6000  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
FREQUENCY (MHz)  
P
(dBm)  
IN  
Figure 57. VRMS Output vs. Frequency for a Fixed Input Power, PIN = 0 dBm,  
Calibration at 1.9 GHz, 25°C  
Figure 55. VENV Linearity Error vs. Input Level and Temperature Using a  
Two-Point Calibration at 1900 MHz  
400  
350  
300  
250  
200  
150  
100  
50  
8
By adding a third calibration point, the linearity of the  
ADL5511 can be enhanced at lower power levels. With  
a three-point calibration, calibration coefficients (slope and  
intercept) are calculated for each segment (thus, there will  
be two slopes and two intercepts).  
6
4
2
0
Figure 56 shows the same data as Figure 55, but with a three-  
point calibration (calibration points at −26 dBm, −15 dBm, and  
+5 dBm. This helps to extend the usable operating range of the  
ADL5511 well below −25 dBm.  
–2  
–4  
–6  
–8  
V
V
V
AT –40°C  
AT +25°C  
AT +85°C  
ENV  
ENV  
ENV  
3
ERROR AT –40°C  
ERROR AT +25°C  
ERROR AT +85°C  
–40°C  
+25°C  
+85°C  
0
2
0
1000  
2000  
3000  
4000  
5000  
6000  
FREQUENCY (MHz)  
1
0
Figure 58. VENV Output vs. Frequency for a Fixed Input Power, PIN = 0 dBm,  
Calibration at 1.9 GHz, 25°C  
–1  
–2  
–3  
–30  
–25  
–20  
–15  
–10  
–5  
0
5
10  
15  
P
(dBm)  
IN  
Figure 56. VENV Linearity Error vs. Input Level and Temperature Using a Three-  
Point Calibration at 1900 MHz  
Rev. A | Page 23 of 28  
 
 
 
 
 
ADL5511  
Data Sheet  
The RF input has a broadband match of 50 Ω using a single  
75 Ω resistor at R5.  
EVALUATION BOARD  
Figure 59 shows the schematic of the ADL5511 evaluation board.  
This 4-layer board is powered by a single supply in the 4.75 V  
to 5.25 V range. The power supply is decoupled by 100 pF and  
0.1 µF capacitors.  
The VRMS output is accessible via a clip lead (a pad is also  
available where an SMA connector is installed). The VENV  
output is accessible via an SMA connector. For response-  
time critical measurements where stray capacitance must  
be minimized, R2 can be removed and a FET probe can be  
attached to JP1 (JP1 must be installed).  
Table 5 details the various configuration options of the evaluation  
board. Figure 60 and Figure 61 show the bottom side and top  
side layouts, respectively.  
Figure 59. Evaluation Board Schematic  
Rev. A | Page 24 of 28  
 
 
Data Sheet  
ADL5511  
Figure 61. Layout of Evaluation Board, Top Side  
Figure 60. Layout of Evaluation Board, Bottom Side  
Table 5. Evaluation Board Configuration Options  
Component  
VPOS, GND  
C13, C14  
Description  
Default Condition  
Ground and supply vector pins.  
Power supply decoupling. Nominal supply decoupling of 0.01 µF and 100 pF.  
Not applicable  
C13 = 100 pF (Size 0402)  
C14 = 0.1 µF (Size 0402)  
C17  
RMS filter capacitor (FLT4). The internal rms averaging capacitor can be augmented by  
placing additional capacitance in C17.  
C17 = 0.1 µF (Size 0402)  
R5, C1  
RF input interface. The 75 Ω resistor at R5 combines with the ADL5511 internal input  
impedance to give a broadband input impedance of around 50 Ω. C1 is an ac coupling  
capacitor, which should be chosen according to nominal carrier frequency.  
R5 = 75 Ω (Size 0402)  
C1 = 100 pF (Size 0402)  
R18, C9  
RMS output and output filtering. The combination of C9 and the internal 100 Ω output  
resistance can be used to form a low-pass filter to reduce the output noise on the VRMS  
output beyond the reduction due to C17 (capacitor on FLT4). The rms output is available  
on the VRMS clip-on test point. To observe VRMS using an SMA cable, an SMA connector  
can be soldered on to the pad labeled VRMS1.  
R18 = 0 Ω (Size 0402)  
C9 = open (Size 0402)  
VRMS clip-on test point =  
installed  
VRMS1 SMA connector =  
open  
R19, C8, R2,  
JP1  
VENV output and output filtering. The VENV output is available on the VENV SMA  
connector. If post-envelope filtering is desired, R19 and C8 can be used to form a low-pass  
filter at the VENV output.  
R2 can be removed to isolate the JP1 jumper from the VENV SMA connector and JP1 can  
be installed and used to interface to a FET probe. This helps to eliminate any excessive  
trace and connector capacitance.  
VENV SMA connector =  
installed  
R19, R2 = 0 Ω (Size 0402)  
C8 = open (Size 0402)  
JP1 = open  
R20, C7  
Envelope reference output and output filtering. The EREF output is available on the EREF  
clip-on test point. The dc reference voltage at Pin EREF can be filtered by the low-pass filter  
formed by the combination of R20 and C7. To observe the EREF voltage using an SMA  
cable, an SMA connector can be soldered onto the pad labeled EREF1.  
R20 = 0 Ω (Size 0402)  
C7 = open (Size 0402)  
EREF clip-on test point =  
installed  
EREF1 SMA connector = open  
R1, SW1  
Device enable. When the switch is set toward the SW1 label, the ENBL pin is connected to VPOS, R1 = 0 Ω (Size 0402)  
which enables the ADL5511. In the opposite switch position, the ENBL pin is grounded which  
disables the ADL5511.  
SW1 = towards SW1 label  
C6, C10  
C2  
Envelope carrier-removal filters (FLT2, FLT3). The corner frequency of the internal VENV two-pole C6, C10 = open (Size 0402)  
carrier-removal filter can be reduced by placing additional capacitors in C6 and C10.  
Envelope reference carrier-removal filter (FLT1). The internal filter that removes the carrier from  
the envelope reference dc voltage can be augmented by placing a capacitor in C2.  
C2 = 100 pF (Size 0402)  
R3, R14, R15,  
R16, R17  
Alternate interface. The P2 edge connector provides an alternate access point to the  
various ADL5511 signals.  
R3, R14, R15, R16, R17 = open  
(Size 0402)  
Rev. A | Page 25 of 28  
 
 
 
ADL5511  
Data Sheet  
OUTLINE DIMENSIONS  
3.10  
3.00 SQ  
2.90  
0.30  
0.23  
0.18  
PIN 1  
INDICATOR  
PIN 1  
INDICATOR  
13  
16  
0.50  
BSC  
1
4
12  
EXPOSED  
PAD  
1.75  
1.60 SQ  
1.45  
9
8
5
0.50  
0.40  
0.30  
0.25 MIN  
TOP VIEW  
BOTTOM VIEW  
FOR PROPER CONNECTION OF  
THE EXPOSED PAD, REFER TO  
THE PIN CONFIGURATION AND  
FUNCTION DESCRIPTIONS  
0.80  
0.75  
0.70  
0.05 MAX  
0.02 NOM  
COPLANARITY  
0.08  
SECTION OF THIS DATA SHEET.  
SEATING  
PLANE  
0.20 REF  
COMPLIANT TO JEDEC STANDARDS MO-220-WEED-6.  
Figure 62. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]  
3 mm × 3 mm Body, Very Thin Quad  
(CP-16-22)  
Dimensions shown in millimeters  
ORDERING GUIDE  
Model1  
Temperature Range Package Description  
Package Option Ordering Quantity  
ADL5511ACPZ-R7 −40°C to +85°C  
ADL5511-EVALZ  
16-Lead Lead Frame Chip Scale Package [LFCSP_WQ] CP-16-22  
Evaluation Board  
1500  
1 Z = RoHS Compliant Part.  
Rev. A | Page 26 of 28  
 
 
 
Data Sheet  
NOTES  
ADL5511  
Rev. A | Page 27 of 28  
ADL5511  
NOTES  
Data Sheet  
©2011–2012 Analog Devices, Inc. All rights reserved. Trademarks and  
registered trademarks are the property of their respective owners.  
D09602-0-2/12(A)  
Rev. A | Page 28 of 28  

相关型号:

ADL5511-EVALZ

Envelope and TruPwr RMS Detector
ADI

ADL5511ACPZ

DC to 6 GHz Envelope and TruPwr RMS Detector
ADI

ADL5511ACPZ-R7

Envelope and TruPwr RMS Detector
ADI

ADL5513

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513-ACPZ-R2

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513-ACPZ-R7

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513-ACPZ-WP

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513-EVALZ

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513ACPZ-R2

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513ACPZ-R7

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513ACPZ-WP

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI

ADL5513_08

1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller
ADI