ADXL001-250 [ADI]
High Performance Wide Bandwidth Accelerometer; 高性能宽带加速度计
| 型号： | ADXL001-250 |
| 厂家： | 
ADI |
| 描述： | High Performance Wide Bandwidth Accelerometer |
| 文件： | 总10页 (文件大小：410K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
High Performance
Wide Bandwidth Accelerometer
Preliminary Technical Data
ADXL001
FEATURES
FUNCTIONAL BLOCK DIAGRAM
High Performance Accelerometer
70g, 2ꢀ0g And ꢀ00g Wideband Ranges Available
22kHz Resonant Frequency Structure
High Linearity (0.2% of Full-scale)
Low-Noise (4 mg/
)
Hz
Sensitive Axis in the Plane of the Chip
Frequency Response Down To DC
MOD
Full Differential Signal Processing
High Resistance to EMI/RFI
Complete Electromechanical Self-test
Output Ratiometric to Supply
Velocity Preservation During Acceleration Input Overload
Low-Power Consumption (2.ꢀmA typ)
ꢀmm LCC Hermetic Ceramic Package
SELF–TEST
Figure 1. Functional Block Diagram
APPLICATIONS
Vibration Monitoring
Shock Detection
Sports Diagnostic Equipment
Medical Instrumentation
Industrial Monitoring
GENERAL DESCRIPTION
The ADXL001 is a major advance over previous generations of
accelerometers - providing high performance and wide
bandwidth. This part is ideal for industrial, medical, and
military applications where wide bandwidth, small size, low
power, and robust performance are essential.
The ADXL001 is available in industry standard 8 pin LCC and
is rated to work over the extended industrial temperature range
(-40 to +125C).
40.0
35.0
30.0
25.0
20.0
15.0
10.0
5.0
Utilizing our proprietary 5th Generation iMEMs process
enables the ADXL001 to provide the desired dynamic range that
extends from +/-70g to +/-500g in combination with 22kHz of
bandwidth. The accelerometer output channel passes through a
wide bandwidth differential to single ended converter, which
allows access to the full mechanical performance of the sensor.
0.0
The part can operate on voltage supplies from 3.3V to 5V.
-5.0
-10.0
1
10
100
1000
10000
100000
The ADXL001 also has a Self-Test (ST) pin that can be asserted
to verify the full electromechanical signal chain for the
accelerometer channel.
Frequency (Hz)
Figure 2. Sensor Frequency Response
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
www.analog.com
©2008 Analog Devices, Inc. All rights reserved.
ADXL001
Preliminary Technical Data
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications........................................................................................8
Application Circuit........................................................................8
Self-Test ..........................................................................................8
Acceleration Sensitive Axis..........................................................8
Operating Voltages Other Than 5V............................................8
Layout, Grounding, and Bypassing Considerations .....................9
Clock Frequency Supply Response .............................................9
Power Supply Decoupling ............................................................9
Electromagnetic Interference ......................................................9
Outline Dimensions....................................................................... 10
Ordering Guide............................................................................... 10
Applications....................................................................................... 1
GENERAL DESCRIPTION ............................................................ 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Absolute Maximum Ratings............................................................ 5
ESD Caution.................................................................................. 5
Pin Configuration and Function Descriptions............................. 6
Theory of Operation ........................................................................ 7
Design Principles.......................................................................... 7
Mechanical Sensor........................................................................ 7
REVISION HISTORY
4/08— Preliminary Technical Data Rev A
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 2 of 10
Preliminary Technical Data
SPECIFICATIONS
ADXL001
Table 1. ADXL001 Specifications
( @ TA = -40°C to +125°C, VS = 3.3V 5ꢀ ꢁC, Acceleration = 0g; unless otherwise noted)
70g
2ꢀ0g
ꢀ00g
Conditions
Min
Typ
Max
2
Min
Typ
Max
2
Min
Typ
Max
2
Units
ꢀ
SENSOR
Nonlinearity
0.2
1
0.2
1
0.2
1
Alignment error
Package resonance
ꢁie in package
degree
kHz
130
2ꢀ
130
2ꢀ
130
2ꢀ
Cross-axis sensitivity Includes
pkg. Alignment
ꢀ
Resonant frequency
Quality factor
SENSITIVITY
22
22
22
kHz
2.5
2.5
2.5
Ratiometric(1)
1
1
1
ꢀ
Full scale range
Sensitivity
Iout<=+/-100µA -70
Vs=3.3V, 100Hz
Vs=5V, 100Hz
70
-250
TBꢁ
250
-500
TBꢁ
500
g
16.0
24.2
4.30
6.5
2.15
3.26
mV/g
mV/g
Sensitivity
OFFSET
Ratiometric(1)
Zero-g output
Zero-g output
Noise
Vs=3.3V
1.35
1.65 1.95
90.9
1.65 TBꢁ
1.65 TBꢁ
V
Vout-Vs/2
-90.9
mV/V
Noise
10Hz-400Hz
10Hz-400Hz
100
4
100
4
100
4
mg rms
Noise density
Frequency Response
-3dB frequency
-3dB frequency drift
Self Test
mg/rt Hz
22
2
22
2
22
2
kHz
ꢀ
ꢁelta V
Vs=3.3V
400
10
TBꢁ
TBꢁ
TBꢁ
TBꢁ
mV
ꢁelta V (cubic vs. Vs)
Logic input high
Logic input low
Input resistance
Output Amplifier
Output swing
Capacitive load
PSRR/CFSR
mV/V^3
Vs=3.3V
2.1
30
2.1
30
2.1
30
V
Vs=3.3V
0.66
50
0.66
50
0.66
50
V
To Ground
kΩ
Iout=+/-100µA
ꢁC-1MHz
0.2
Vs-0.2 0.2
Vs-0.2 0.2
Vs-0.2
V
1000
1000
1000
pF
V/V
0.5
0.5
0.5
Power Supply (Vs)
Functional Range
Isupply
3.135
6
3.135
6
3.135
6
5
V
2.5
5
2.5
5
2.5
mA
ms
Turn-on time
TBꢁ
TBꢁ
TBꢁ
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 3 of 10
ADXL001
Preliminary Technical Data
CRITICAL ZONE
T
TO T
tP
L
P
T
P
RAMP-UP
T
L
tL
T
SMAX
T
SMIN
tS
RAMP-DOWN
PREHEAT
tPEAK
Figure 3. Recommended Soldering Profile
TIME (t)
Table 2. Recommended Soldering Profile
Profile Feature
Sn63/Pb37
Pb-Free
Average Ramp Rate (TL to TP)
Preheat
3°C/s maximum
3°C/s maximum
Minimum Temperature (TSMIN
)
100°C
150°C
60 sec to 120 sec
150°C
200°C
60 sec to 150 sec
Maximum Temperature (TSMAX
Time (TSMIN to TSMAX), ts
TSMAX to TL
)
Ramp-Up Rate
3°C/s
3°C/s
Time Maintained Above Liquidous (tL)
Liquidous Temperature (TL)
Time (tL)
Peak Temperature (TP)
Time Within 5°C of Actual Peak Temperature (tP)
Ramp-ꢁown Rate
183°C
217°C
60 sec to 150 sec
240°C + 0°C/−5°C
10 sec to 30 sec
6°C/s maximum
6 minute maximum
60 sec to 150 sec
260°C + 0°C/−5°C
20 sec to 40 sec
6°C/s maximum
8 minute maximum
Time 25°C to Peak Temperature (tPEAK
)
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 4 of 10
Preliminary Technical Data
ADXL001
ABSOLUTE MAXIMUM RATINGS
Table 3. Absolute Maximum Ratings
Parameter*
ESD CAUTION
Rating
Acceleration
4000 g
(Any Axis, Unpowered and Powered)
Supply Voltage Vs
-0.3 to 7.0V
Indefinite
Output Short Circuit ꢁuration
(Vout, to Ground)
Storage Temperature
-65°C to 150°C
245°C
Soldering Temperature Range
(Soldering 10 sec)
Operating Temperature Range
-55°C to 125°C
*Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Drops onto hard surfaces can cause shocks of greater than
4000 g and can exceed the absolute maximum rating of the
device. Exercise care during handling to avoid damage.
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 5 of 10
ADXL001
Preliminary Technical Data
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 4. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1
2
3
4
5
6
7
8
DNC
DNC
COM
ST
Do Not Connect
Do Not Connect
Common
Self Test Control (Logic Input)
Do Not Connect
DNC
XOUT
VDD
X Axis Acceleration Output
3.135 V to 6 V (Should Be Connected Physically To VDD2
)
VDD2
3.135 V to 6 V (Should Be Connected Physically To VDD
)
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 6 of 10
Preliminary Technical Data
ADXL001
THEORY OF OPERATION
DESIGN PRINCIPLES
MECHANICAL SENSOR
The ADXL001 accelerometer provides a fully differential sensor
structure and circuit path for excellent resistance to EMI/RFI
interference.
The ADXL001 is built using the Analog Devices, Inc., SOIMEMS
sensor process. The sensor device is micromachined in-plane
in the SOI device layer. Trench isolation is used to electrically
isolate, but mechanically couple, the differential sensing ele-
ments. Single-crystal silicon springs suspend the structure over
the handle wafer and provide resistance against acceleration forces.
This latest generation SOIMEMS device takes advantage of
mechanically coupled but electrically isolated differential
sensing cells. This improves sensor performance and size as a
single proof mass generates the fully differential signal. The
sensor signal conditioning also uses electrical feedback with
zero-force feedback for improved accuracy and stability. This
force-feedback cancels out the electrostatic forces contributed
by the sensor circuitry.
ANCHOR
MOVABLE
FRAME
PLATE
CAPACITORS
UNIT
SENSING
CELL
FIXED
PLATES
Figure 5 is a simplified view of one of the differential sensor cell
blocks. Each sensor block includes several differential capacitor
unit cells. Each cell is composed of fixed plates attached to the
device layer and movable plates attached to the sensor frame.
Displacement of the sensor frame changes the differential
capacitance. On-chip circuitry measures the capacitive change.
UNIT
FORCING
CELL
MOVING
PLATE
ANCHOR
Figure 5. Simplified View of Sensor Under Acceleration
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 7 of 10
ADXL001
Preliminary Technical Data
APPLICATIONS
APPLICATION CIRCUIT
ACCELERATION SENSITIVE AXIS
Figure 6 shows the standard application circuit for the
ADXL001. Note that VDD and VDD2 should always be connected.
The output is shown connected to a 1000 pF output capacitor
for improved EMI performance and can be connected directly
to the ADC input of a microcontroller. See the ADC
specifications for proper antialiasing filtering, based on the
user’s sample rate.
The ADXL001 is an X-Axis acceleration and vibration-sensing
device. It produces a positive-going output voltage for vibration
toward its Pin 8 marking.
PIN 8
Figure 7. XOUT Increases with Acceleration in the +X-Axis Direction
OPERATING VOLTAGES OTHER THAN ꢀV
The ADXL001 is specified at VS = 3.3 V and VS = 5 V. Note that
some performance parameters change as the voltage is varied.
In particular, the Xout output exhibits ratiometric offset and
sensitivity with supply. The output sensitivity (or scale factor)
scales proportionally to the supply voltage. At VS = 3.3 V, output
sensitivity is typically 16 mV/g. At VS = 5 V, sensitivity is
nominally 24.2 mV/g. Xout zero g bias is nominally equal to
VS/2 at all supply voltages.
Figure 6. Application Circuit
SELF-TEST
Self-test response in g is roughly proportional to the square of
the supply voltage. However, when one factors ratiometricity of
sensitivity in with supply voltage, the self-test response in
voltage is roughly proportional to the cube of the supply
voltage. For example, the self-test response for the ADXL001-70
at VS = 5 V is approximately 1.4 V. At VS = 3.3 V, the response is
approximately 400 mV.
The fixed fingers in the forcing cells are normally kept at the
same potential as that of the movable frame. When the user
activates the digital self-test input, the ADXL001 changes the
voltage on the fixed fingers in these forcing cells on one side of
the moving plate. This potential creates an attractive electro-
static force, causing the sensor to move towards those fixed
fingers. The entire signal channel is active, so the sensor
displacement causes a change in Xout. The ADXL001 self-test
function verifies proper operation of the sensor, interface
electronics, and accelerometer channel electronics.
The ST pin should never be exposed to voltages greater than
VS + 0.3 V. If this cannot be guaranteed due to the system
design (for instance, if there are multiple supply voltages), then
a low VF clamping diode between ST and VS is recommended.
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 8 of 10
Preliminary Technical Data
ADXL001
LAYOUT, GROUNDING, AND BYPASSING CONSIDERATIONS
CLOCK FREQUENCY SUPPLY RESPONSE
POWER SUPPLY DECOUPLING
In any clocked system, power supply noise near the clock
frequency may have consequences at other frequencies. An
internal clock typically controls the sensor excitation and the
signal demodulator for micromachined accelerometers.
For most applications, a single 0.1 μF capacitor, CDC, adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 1 MHz internal clock frequency (or any harmonic thereof),
noise on the supply can cause interference on the ADXL001
output. If additional decoupling is needed, a 50 Ω (or smaller)
resistor or ferrite bead can be inserted in the supply line.
Additionally, a larger bulk bypass capacitor (in the 1 μF to
If the power supply contains high frequency spikes, they may be
demodulated and interpreted as acceleration signals. A signal
appears at the difference between the noise frequency and the
demodulator frequency. If the power supply noise is 100 Hz
away from the demodulator clock, there will be an output term
at 100 Hz. If the power supply clock is at exactly the same
frequency as the accelerometer clock, the term will appear as
an offset. If the difference frequency is outside the signal
bandwidth, the output filter attenuates it. However, both the
power supply clock and the accelerometer clock may vary with
time or temperature, which can cause the interference signal to
appear in the output filter bandwidth.
4.7 μF range) can be added in parallel to CDC
.
ELECTROMAGNETIC INTERFERENCE
The ADXL001 can be used in areas and applications with
high amounts of EMI or with components susceptible to EMI
emissions. The fully differential circuitry of the ADXL001 is
designed to be robust to such interference. For improved EMI
performance, especially in automotive applications, a 1000 pF
output capacitor is recommended on the XOUT output.
ADXL001 addresses this issue in two ways. First, the high clock
frequency, 125 kHz for the output stage, eases the task of
choosing a power supply clock frequency such that the
difference between it and the accelerometer clock remains well
outside the filter bandwidth. Second, ADXL001 has a fully
differential signal path, including a pair of electrically isolated,
mechanically coupled sensors. The differential sensors
eliminate most of the power supply noise before it reaches the
demodulator. Good high frequency supply bypassing, such as a
ceramic capacitor close to the supply pins, also minimizes the
amount of interference.
Clock frequency supply response (CFSR) is the ratio of the
response at the output to the noise on the power supply near the
accelerometer clock frequency or its harmonics. A CFSR of 0.5
means that the signal at the output is half the amplitude of the
supply noise. This is analogous to power supply rejection ratio
(PSRR), except that the stimulus and the response are at
different frequencies.
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 9 of 10
ADXL001
Preliminary Technical Data
OUTLINE DIMENSIONS
Figure 8. Package Dimensions
ORDERING GUIDE
Table 5. Ordering Guide
Model
Branding
Package
Gee Range
Temperature Range
ADXL001-70
TBD
TBD
TBD
LCC-8
LCC-8
LCC-8
-40°C to 125°C
± 70g
ADXL001-250
ADXL001-500
-40°C to 125°C
-40°C to 125°C
± 250g
± 500g
©2008 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
PR07510-0-5/08(PrA)
This information applies to an ongoing development. Its characteristics and specifications are subject to change without notice.
Analog Devices assumes no obligation regarding future manufacturing unless otherwise agreed to in writing. Patents pending.
Rev. PrA | Page 10 of 10
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