ADXL210AE [ADI]

Low-Cost 10 g Dual-Axis Accelerometer with Duty Cycle; 低成本10克双轴加速度计与占空比
ADXL210AE
型号: ADXL210AE
厂家: ADI    ADI
描述:

Low-Cost 10 g Dual-Axis Accelerometer with Duty Cycle
低成本10克双轴加速度计与占空比

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Low-Cost 10 g Dual-Axis  
Accelerometer with Duty Cycle  
a
ADXL210E  
FEATURES  
FUNCTIONAL BLOCK DIAGRAM  
2-Axis Acceleration Sensor on a Single IC Chip  
5 mm 5 mm 2 mm Ultrasmall Chip Scale Package  
2 mg Resolution at 60 Hz  
3V TO 5.25V  
C
X
V
X
FILT  
SELF-TEST  
DD  
Low Power < 0.6 mA  
Direct Interface to Low-Cost Microcontrollers via  
Duty Cycle Output  
BW Adjustment with a Single Capacitor  
3 V to 5.25 V Single-Supply Operation  
1000 g Shock Survival  
R
32kꢂ  
X SENSOR  
FILT  
X
OUT  
C
O
U
N
T
E
R
DEMOD  
ANALOG  
TO  
DUTY  
CYCLE  
(ADC)  
C
DC  
OSCILLATOR  
P  
ADXL210E  
DEMOD  
R
32kꢂ  
Y
FILT  
OUT  
APPLICATIONS  
Y SENSOR  
COM  
Y
T2  
R
FILT  
2-Axis Tilt Sensing with Faster Response than  
Electrolytic, Mercury, or Thermal Sensors  
Computer Peripherals  
C
Y
SET  
Information Appliances  
Alarms and Motion Detectors  
Disk Drives  
T2  
T1  
A(g) = (T1/T2 – 0.5)/4%  
0g = 50% DUTY CYCLE  
Vehicle Security  
T2 = R  
/125Mꢂ  
SET  
GENERAL DESCRIPTION  
The typical noise floor is 200 gHz, allowing signals below  
2 mg (at 60 Hz bandwidth) to be resolved.  
The ADXL210E is a low-cost, low-power, complete 2-axis acceler-  
ometer with a digital output, all on a single monolithic IC. It is an  
improved version of the ADXL210AQC/JQC. The ADXL210E  
will measure accelerations with a full-scale range of 10 g. The  
ADXL210E can measure both dynamic acceleration (e.g., vibra-  
tion) and static acceleration (e.g., gravity).  
The bandwidth of the accelerometer is set with capacitors CX and  
CY at the XFILT and YFILT pins. An analog output can be recon-  
structed by filtering the duty cycle output.  
The ADXL210E is available in a 5 mm ϫ 5 mm ϫ 2 mm 8-lead  
hermetic LCC package.  
The outputs are analog voltage or digital signals whose duty cycles  
(ratio of pulsewidth to period) are proportional to acceleration.  
The duty cycle outputs can be directly measured by a micro-  
processor counter without an A/D converter or glue logic. The  
duty cycle period is adjustable from 0.5 ms to 10 ms via a single  
resistor (RSET).  
REV. 0  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, norforanyinfringementsofpatentsorotherrightsofthirdpartiesthat  
may result from its use. No license is granted by implication or otherwise  
under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
www.analog.com  
© Analog Devices, Inc., 2002  
MIN to TMAX, TA = 25C for J Grade only, VDD = 5 V, RSET = 125 k, Acceleration = 0 g,  
ADXL210E–SPECIFICATIONS (uTnle=ssT otherwise noted.)  
A
ADXL210JE  
ADXL210AE  
Typ  
Parameter  
Conditions  
Min  
Typ  
Max  
Min  
Max  
Unit  
SENSOR INPUT  
Measurement Range1  
Nonlinearity  
Each Axis  
8
10  
0.2  
1
0.01  
2
8
10  
0.2  
1
0.01  
2
g
Best Fit Straight Line  
X Sensor to Y Sensor  
% of FS  
Degrees  
Degrees  
%
Alignment Error2, 3  
Alignment Error  
Cross-Axis Sensitivity2, 4  
SENSITIVITY  
Duty Cycle per g2  
Duty Cycle per g2  
Each Axis  
T1/T2, VDD = 5 V  
T1/T2, VDD = 3 V  
VDD = 5 V  
VDD = 3 V  
Delta from 25ЊC  
3.3  
3.2  
85  
4.0  
3.8  
100  
55  
4.9  
4.4  
125  
65  
3.2  
3.0  
80  
4.0  
3.8  
100  
55  
5
%/g  
%/g  
mV/g  
mV/g  
%
4.6  
130  
70  
2
Sensitivity XFILT, YFILT  
2
Sensitivity XFILT, YFILT  
45  
40  
Temperature Drift2, 5  
0.5  
0.5  
ZERO g BIAS LEVEL  
0 g Duty Cycle2  
Each Axis  
T1/T2, VDD = 5 V  
T1/T2, VDD = 3 V  
VDD = 5 V  
44  
40  
2.3  
1.35  
50  
50  
2.5  
1.5  
1.0  
2.0  
56  
60  
2.7  
1.65  
4.0  
42  
38  
2.3  
1.3  
50  
50  
2.5  
1.5  
1.0  
2.0  
58  
62  
2.7  
1.7  
4.0  
%
%
V
V
%/V  
mg/ЊC  
0 g Duty Cycle2  
2
0 g Voltage XFILT, YFILT  
2
0 g Voltage XFILT, YFILT  
VDD = 3 V  
0 g Duty Cycle vs. Supply2  
0 g Offset vs. Temperature2, 5 Delta from 25ЊC  
NOISE PERFORMANCE  
Noise Density2  
@ 25ЊC  
200  
200  
1000  
µgHz rms  
FREQUENCY RESPONSE  
3 dB Bandwidth  
Sensor Resonant Frequency  
At Pins XFILT, YFILT  
6
10  
6
10  
kHz  
kHz  
FILTER  
RFILT Tolerance  
Minimum Capacitance  
32 kNominal  
15  
3
15  
3
%
pF  
At Pins XFILT, YFILT  
1000  
1000  
0.7  
SELF-TEST  
Duty Cycle Change  
Self-Test “0” to “1”  
%
DUTY CYCLE OUTPUT STAGE  
FSET  
Output High Voltage  
Output Low Voltage  
T2 Drift vs. Temperature  
Rise/Fall Time  
RSET = 125 kΩ  
I = 25 µA  
I = 25 µA  
0.7  
VS – 200 mV  
1.3  
1.3  
kHz  
V
mV  
ppm/ЊC  
ns  
VS – 200 mV  
200  
200  
50  
200  
50  
200  
POWER SUPPLY  
Operating Voltage Range  
Quiescent Supply Current  
Turn-On Time  
3
5.25  
1.0  
3.0  
5.25  
1.0  
V
mA  
ms  
0.6  
0.6  
CFILT in µF  
160 ϫ CFILT + 0.3  
160 ϫ CFILT + 0.3  
TEMPERATURE RANGE  
Specified Performance AE  
Operating Range  
–40  
–40  
+85  
+85  
ЊC  
ЊC  
0
70  
NOTES  
1Guaranteed by measurement of initial offset and sensitivity.  
2See Typical Performance Characteristics.  
3Alignment error is specified as the angle between the true and indicated axis of sensitivity (see TPC 15).  
4Cross-axis sensitivity is the algebraic sum of the alignment and the inherent sensitivity errors.  
5Defined as the output change from ambient to maximum temperature or ambient to minimum temperature.  
Specifications subject to change without notice.  
–2–  
REV. 0  
ADXL210E  
PIN CONFIGURATION  
ABSOLUTE MAXIMUM RATINGS*  
Acceleration (Any Axis, Unpowered for 0.5 ms) . . . . . . 1000 g  
Acceleration (Any Axis, Powered for 0.5 ms) . . . . . . . . . . 500 g  
+VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6.0 V  
Output Short Circuit Duration, (Any Pin to Common)  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Indefinite  
Operating Temperature . . . . . . . . . . . . . . . . –55ЊC to +125ЊC  
Storage Temperature . . . . . . . . . . . . . . . . . . –65ЊC to +150ЊC  
V
DD  
8
1
2
3
7
6
5
ST  
X
Y
FILT  
T2  
FILT  
OUT  
X
COM  
4
Y
OUT  
BOTTOM VIEW  
*Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device reliability.  
PIN FUNCTION DESCRIPTIONS  
Drops onto hard surfaces can cause shocks of greater than 1000 g and exceed the  
absolute maximum rating of the device. Care should be exercised in handling to  
avoid damage.  
Pin  
No.  
Mnemonic  
Description  
1
2
3
4
5
6
7
8
ST  
T2  
Self-Test  
Connect RSET to Set T2 Period  
Common  
Y-Channel Duty Cycle Output  
X-Channel Duty Cycle Output  
Y-Channel Filter Pin  
X-Channel Filter Pin  
3 V to 5.25 V  
PACKAGE CHARACTERISTICS  
Package  
COM  
YOUT  
XOUT  
YFILT  
XFILT  
VDD  
Weight  
JA  
JC  
Device  
8-Lead LCC  
120°C/W  
TBD°C/W  
<1.0 grams  
ORDERING GUIDE  
Temperature  
No. of  
Axes  
Specified  
Voltage  
Package  
Description  
Package  
Option  
Model  
Range  
ADXL210JE  
ADXL210AE*  
2
2
3 V to 5 V  
3 V to 5 V  
0 to 70ЊC  
–40ЊC to +85ЊC  
8-Lead LCC  
8-Lead LCC  
E-8  
E-8  
*Available Soon  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection. Although  
the ADXL210E features proprietary ESD protection circuitry, permanent damage may occur on  
devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are  
recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. 0  
–3–  
*
ADXL210ETypical Performance Characteristics  
VDD = 3 V  
VDD = 5 V  
35  
30  
25  
20  
15  
10  
5
35  
30  
25  
20  
15  
10  
5
0
0
1.42 1.44 1.46 1.48 1.50 1.52 1.54 1.56 1.58 1.60  
VOLTS  
2.38 2.40 2.43 2.45 2.48 2.50 2.53 2.55 2.58 2.60 2.63  
VOLTS  
TPC 1. X-Axis Zero g Bias Distribution at XFILT, VDD = 3 V  
TPC 4. X-Axis Zero g Bias Distribution at XFILT, VDD = 5 V  
35  
30  
25  
20  
15  
10  
5
35  
30  
25  
20  
15  
10  
5
0
0
1.40 1.42 1.44 1.46 1.48 1.50 1.52 1.54 1.56 1.58 1.60  
2.38 2.40 2.43 2.45 2.48 2.50 2.53 2.55 2.58 2.60 2.63  
VOLTS  
VOLTS  
TPC 2. Y-Axis Zero g Bias Distribution at YFILT, VDD = 3 V  
TPC 5. Y-Axis Zero g Bias Distribution at YFILT, VDD = 5 V  
35  
30  
25  
20  
15  
10  
5
70  
60  
50  
40  
30  
20  
10  
0
0
52.5 53.3 54.2 55.0 55.8 56.7 57.5 58.3 59.2 60.0  
97.5  
100.0  
103.0  
105.0  
108.0  
110.0  
113.0  
mV/g  
mV/g  
TPC 3. X-Axis Sensitivity Distribution at XFILT, VDD = 3 V  
TPC 6. X-Axis Sensitivity Distribution at XFILT, VDD = 5 V  
*Data taken from 14,500 parts over 3 lots minimum.  
–4–  
REV. 0  
ADXL210E  
VDD = 3 V  
VDD = 3 V  
70  
60  
50  
40  
30  
20  
10  
0
35  
30  
25  
20  
15  
10  
5
0
95.0  
97.5  
100.0 103.0 105.0 108.0 110.0 113.0  
52.5 53.3 54.2 55.0 55.8 56.7 57.5 58.3 59.2 60.0  
mV/g  
mV/g  
TPC 7. Y-Axis Sensitivity Distribution at YFILT, VDD = 3 V  
TPC 10. Y-Axis Sensitivity Distribution at YFILT, VDD = 5 V  
70  
60  
50  
40  
30  
20  
10  
0
70  
60  
50  
40  
30  
20  
10  
0
3.5  
3.6  
3.7  
3.8  
3.9  
4.0  
4.1  
3.9  
4.0  
4.1  
4.2  
4.3  
4.4  
PERCENT DUTY CYCLE PER g  
PERCENT DUTY CYCLE PER g  
TPC 8. X-Axis Sensitivity Distribution at XOUT, VDD = 3 V  
TPC 11. X-Axis Sensitivity Distribution at XOUT, VDD = 5 V  
70  
60  
50  
40  
30  
20  
10  
0
70  
60  
50  
40  
30  
20  
10  
0
3.4  
3.5  
3.6  
3.7  
3.8  
3.9  
4.0  
4.1  
3.8  
3.9  
4.0  
4.1  
4.2  
4.3  
4.4  
PERCENT DUTY CYCLE PER g  
PERCENT DUTY CYCLE PER g  
TPC 9. Y-Axis Sensitivity Distribution at YOUT, VDD = 3 V  
TPC 12. Y-Axis Sensitivity Distribution at YOUT, VDD = 5 V  
REV. 0  
–5–  
ADXL210E  
35  
30  
25  
20  
15  
10  
5
25  
20  
15  
10  
5
0
0
230 250 270 290 310 330 350 370 390 410  
150  
170  
190  
210  
230  
250  
270  
290  
310  
NOISE DENSITY g Hz rms  
NOISE DENSITY g Hz rms  
TPC 13. Noise Density Distribution, VDD = 3 V  
TPC 16. Noise Density Distribution, VDD = 5 V  
40  
35  
30  
25  
20  
15  
10  
5
0.7  
0.6  
V
V
= 5 VDC  
S
0.5  
0.4  
0.3  
0.2  
0.1  
0
= 3.5 VDC  
S
0
40  
20  
0
20  
40  
60  
80  
100  
3  
2  
1  
0
1
2
3
PERCENT  
TEMPERATURE C  
TPC 14. Typical Supply Current vs. Temperature  
TPC 17. Cross-Axis Sensitivity Distribution  
20  
18  
16  
14  
12  
10  
8
V
DD  
3
2
1
0
C
= 0.01F  
X
FILT  
OUT  
6
4
2
0
0
0.4  
0.8  
1.2  
1.4  
TIME ms  
DEGREES OF MISALIGNMENT  
TPC 15. Rotational Die Alignment  
TPC 18. Typical Turn-On Time  
–6–  
REV. 0  
ADXL210E  
20  
18  
16  
14  
12  
10  
8
20  
18  
16  
14  
12  
10  
8
6
6
4
4
2
2
0
0
mg/C  
mg/C  
TPC 19. X-Axis Zero g Drift Due to Temperature  
TPC 22. Y-Axis Zero g Drift Due to Temperature  
Distribution, –40°C to +85°C  
Distribution, –40°C to +85°C  
60  
50  
40  
30  
20  
10  
60  
50  
40  
30  
20  
10  
0
0
0.0292 0.0245 0.0198 0.0152 0.0105 0.0058 0.0012  
0.0156 0.0123 0.0090 0.0056 0.0023 0.0010 0.0043 0.0077  
PERCENT/C  
PERCENT/C  
TPC 20. X-Axis Sensitivity Drift at XFILT Due to  
TPC 23. Y-Axis Sensitivity Drift at XFILT Due to  
Temperature Distribution, –40°C to +85°C  
Temperature Distribution, –40°C to +85°C  
2.60  
2.58  
2.56  
2.54  
2.52  
2.50  
2.48  
2.46  
2.44  
2.57  
2.55  
2.53  
2.51  
2.49  
2.47  
2.45  
2.43  
2.41  
40 30 20 10  
0
10 20 30 40 50 60 70 80 90  
40 30 20 10  
0
10 20 30 40 50 60 70 80 90  
TEMPERATURE C  
TEMPERATURE C  
TPC 21. Typical X-Axis Zero g Output vs. Tempera-  
ture for 16 Parts  
TPC 24. Typical Y-Axis Zero g Output vs. Tempera-  
ture for 16 Parts  
REV. 0  
–7–  
ADXL210E  
1.06  
1.04  
1.02  
1.00  
0.98  
0.96  
0.94  
45  
30  
15  
0
15  
30  
45  
60  
75  
90  
TEMPERATURE C  
TPC 25. Normalized DCM Period (T2) vs. Temperature  
DEFINITIONS  
nominally 50% duty cycle. The acceleration signal can be deter-  
T1  
T2  
Length of the “on” portion of the cycle.  
Length of the total cycle.  
mined by measuring the length of the T1 and T2 pulses with  
a counter/timer or with a polling loop using a low cost micro-  
controller.  
Duty Cycle Ratio of the “on” time (T1) of the cycle to the total  
cycle (T2). Defined as T1/T2 for the ADXL210E/  
ADXL210.  
Pulsewidth Time period of the “on” pulse. Defined as T1 for  
the ADXL210E/ADXL210.  
An analog output voltage can be obtained either by buffering the  
signal from the XFILT and YFILT pin, or by passing the duty cycle  
signal through an RC filter to reconstruct the dc value.  
The ADXL210E will operate with supply voltages as low as 3.0 V  
or as high as 5.25 V.  
THEORY OF OPERATION  
T2  
The ADXL210E is a complete, dual-axis acceleration measure-  
ment system on a single monolithic IC. It contains a polysilicon  
surface-micromachined sensor and signal conditioning circuitry  
to implement an open loop acceleration measurement architec-  
ture. For each axis, an output circuit converts the analog signal to  
a duty cycle modulated (DCM) digital signal that can be decoded  
with a counter/timer port on a microprocessor. The ADXL210E  
is capable of measuring both positive and negative accelerations  
to 10 g. The accelerometer can measure static acceleration  
forces such as gravity, allowing it to be used as a tilt sensor.  
T1  
A(g) = (T1/T2 0.5)/4%  
0g = 50% DUTY CYCLE  
T2(s) = R  
()/125Mꢂ  
SET  
Figure 1. Typical Output Duty Cycle  
APPLICATIONS  
POWER SUPPLY DECOUPLING  
For most applications a single 0.1 µF capacitor, CDC, will  
adequately decouple the accelerometer from signal and noise  
on the power supply. However, in some cases, especially where  
digital devices such as microcontrollers share the same power  
supply, digital noise on the supply may cause interference on  
the ADXL210E output. This may be observed as a slowly  
undulating fluctuation of voltage at XFILT and YFILT. If additional  
decoupling is needed, a 100 (or smaller) resistor or ferrite  
beads, may be inserted in the supply line of the ADXL210E.  
The sensor is a surface micromachined polysilicon structure  
built on top of the silicon wafer. Polysilicon springs suspend the  
structure over the surface of the wafer and provide a resistance  
against acceleration forces. Deflection of the structure is mea-  
sured using a differential capacitor that consists of independent  
fixed plates and central plates attached to the moving mass. The  
fixed plates are driven by 180° out of phase square waves. An  
acceleration will deflect the beam and unbalance the differential  
capacitor, resulting in an output square wave whose amplitude  
is proportional to acceleration. Phase sensitive demodulation  
techniques are then used to rectify the signal and determine the  
direction of the acceleration.  
FERRITE BEAD  
100ꢂ  
V
V
X
OUT  
DD  
DD  
C
DC  
ADXL210E  
The output of the demodulator drives a duty cycle modulator  
(DCM) stage through a 32 kresistor. At this point a pin is  
available on each channel to allow the user to set the signal band-  
width of the device by adding a capacitor. This filtering improves  
measurement resolution and helps prevent aliasing.  
COM  
ST  
Y
X
Y
OUT  
FILT  
FILT  
X
FILT  
T2  
After being low-pass filtered, the analog signal is converted to a  
duty cycle modulated signal by the DCM stage. A single resistor  
sets the period for a complete cycle (T2), which can be set between  
0.5 ms and 10 ms (see TPC 12). A 0 g acceleration produces a  
R
SET  
Y
FILT  
Figure 2.  
–8–  
REV. 0  
ADXL210E  
DESIGN PROCEDURE FOR THE ADXL210E  
Setting the Bandwidth Using CX and CY  
The ADXL210E has provisions for bandlimiting the XFILT and  
FILT pins. Capacitors must be added at these pins to implement  
low-pass filtering for antialiasing and noise reduction. The equa-  
tion for the 3 dB bandwidth is:  
The design procedure for using the ADXL210E with a duty cycle  
output involves selecting a duty cycle period and a filter capacitor.  
A proper design will take into account the application requirements  
for bandwidth, signal resolution and acquisition time, as discussed  
in the following sections.  
Y
1
F3 dB  
=
Decoupling Capacitor CDC  
A 0.1 µF capacitor is recommended from VDD to COM for power  
supply decoupling.  
2 π (32 k)× C(x, y)  
(
)
or, more simply,  
ST  
5µF  
C(X,Y )  
F3dB  
=
The ST pin controls the self-test feature. When this pin is set to VDD  
,
an electrostatic force is exerted on the beam of the accelerometer.  
The resulting movement of the beam allows the user to test if the  
accelerometer is functional. The typical change in output will be 3%  
at the duty cycle outputs (corresponding to 800 mg). This pin  
may be left open circuit or connected to common in normal use.  
The tolerance of the internal resistor (RFILT), can vary typically as  
much as 15% of its nominal value of 32 k; so the bandwidth  
will vary accordingly. A minimum capacitance of 1000 pF for  
C(X, Y) is required in all cases.  
Duty Cycle Decoding  
Table I. Filter Capacitor Selection, CX and CY  
Capacitor  
The ADXL210Es digital output is a duty cycle modulator.  
Acceleration is proportional to the ratio T1/T2. The nominal  
output of the ADXL210E is:  
Bandwidth  
Value  
0 g = 50% Duty Cycle  
10 Hz  
50 Hz  
100 Hz  
200 Hz  
500 Hz  
5 kHz  
0.47 µF  
0.10 µF  
0.05 µF  
0.027 µF  
0.01 µF  
0.001 µF  
Scale factor is 4% Duty Cycle Change per g  
These nominal values are affected by the initial tolerance of the  
device including zero g offset error and sensitivity error.  
T2 does not have to be measured for every measurement cycle.  
It need only be updated to account for changes due to tempera-  
ture (a relatively slow process). Since the T2 time period is shared  
by both X and Y channels, it is necessary only to measure it on  
one channel of the ADXL210E. Decoding algorithms for various  
microcontrollers have been developed. Consult the appropriate  
Application Note.  
Setting the DCM Period with RSET  
The period of the DCM output is set for both channels by a single  
resistor from RSET to ground. The equation for the period is:  
R
SET ()  
125 MΩ  
T2 =  
3V TO 5.25V  
C
X
A 125 kresistor will set the duty cycle repetition rate to approxi-  
mately 1 kHz, or 1 ms. The device is designed to operate at duty  
cycle periods between 0.5 ms and 10 ms.  
V
X
FILT  
SELF-TEST  
X
DD  
R
X SENSOR  
FILT  
32kꢂ  
OUT  
C
O
U
N
T
E
R
DEMOD  
ANALOG  
TO  
DUTY  
CYCLE  
(ADC)  
Table II. Resistor Values to Set T2  
C
DC  
OSCILLATOR  
P  
ADXL210E  
T2  
RSET  
DEMOD  
R
1 ms  
2 ms  
5 ms  
10 ms  
125 kΩ  
250 kΩ  
625 kΩ  
1.25 MΩ  
Y
FILT  
32kꢂ  
OUT  
Y SENSOR  
COM  
Y
T2  
R
FILT  
C
Y
SET  
Note that the RSET should always be included, even if only an  
analog output is desired. Use an RSET value between 500 kΩ  
and 2 Mwhen taking the output from XFILT or YFILT. The RSET  
resistor should be placed close to the T2 Pin to minimize parasitic  
capacitance at this node.  
T2  
T1  
A(g) = (T1/T2 0.5)/4%  
0g = 50% DUTY CYCLE  
T2 = R  
/125Mꢂ  
SET  
Selecting the Right Accelerometer  
Figure 3. Block Diagram  
For most tilt sensing applications the ADXL202E is the most  
appropriate accelerometer. Its higher sensitivity (12.5%/g) allows  
the user to use a lower speed counter for PWM decoding while  
maintaining high resolution. The ADXL210E should be used in  
applications where accelerations of greater than 2 g are expected.  
REV. 0  
–9–  
ADXL210E  
MICROCOMPUTER INTERFACES  
With the single pole roll-off characteristic, the typical noise of  
the ADXL210E is determined by the following equation:  
The ADXL210E is specifically designed to work with low-cost  
microcontrollers. Specific code sets, reference designs, and applica-  
tion notes are available from the factory. This section will outline a  
general design procedure and discuss the various trade-offs that  
need to be considered.  
Noise rms = 200 µg/ Hz × BW ×1.6  
(
)
(
)
(
)
At 100 Hz the noise will be:  
The designer should have some idea of the required performance  
of the system in terms of:  
Noise rms = 200 µg/ Hz  
×
100 × 1.6 = 2.53 mg  
(
)
(
)
(
)
Resolution: the smallest signal change that needs to be detected.  
Bandwidth: the highest frequency that needs to be detected.  
Acquisition Time: the time that will be available to acquire the signal  
Often the peak value of the noise is desired. Peak-to-peak noise  
can only be estimated by statistical methods. Table III is useful  
for estimating the probabilities of exceeding various peak values,  
given the rms value.  
on each axis.  
These requirements will help to determine the accelerometer band-  
width, the speed of the microcontroller clock and the length of  
the T2 period.  
Table III. Estimation of Peak-to-Peak Noise  
% of Time that Noise  
When selecting a microcontroller it is helpful to have a counter  
timer port available. The microcontroller should have provisions  
for software calibration. While the ADXL210E is a highly accurate  
accelerometer, it has a wide tolerance for initial offset. The  
easiest way to null this offset is with a calibration factor saved on  
the microcontroller or by a user calibration for zero g. In the  
case where the offset is calibrated during manufacture, there are  
several options, including external EEPROM and microcontrol-  
lers with one-time programmablefeatures.  
Nominal Peak-to-Peak Will Exceed Nominal  
Value  
Peak-to-Peak Value  
2.0 × rms  
4.0 × rms  
6.0 × rms  
8.0 × rms  
32%  
4.6%  
0.27%  
0.006%  
The peak-to-peak noise value will give the best estimate of the  
uncertainty in a single measurement.  
Table IV gives typical noise output of the ADXL210E for various  
DESIGN TRADE-OFFS FOR SELECTING FILTER  
CHARACTERISTICS: THE NOISE/BW TRADE-OFF  
The accelerometer bandwidth selected will determine the measure-  
ment resolution (smallest detectable acceleration). Filtering can be  
used to lower the noise floor and improve the resolution of the  
accelerometer. Resolution is dependent on both the analog filter  
bandwidth at XFILT and YFILT and on the speed of the micro-  
controller counter.  
C
X and CY values.  
Table IV. Filter Capacitor Selection, CX and CY  
Peak-to-Peak Noise  
Estimate 95%  
rms Noise Probability (rms 4)  
Bandwidth CX, CY  
The analog output of the ADXL210E has a typical bandwidth  
of 5 kHz, while the duty cycle modulatorsbandwidth is 500 Hz.  
The user must filter the signal at this point to limit aliasing  
errors. To minimize DCM errors the analog bandwidth should be  
less than one-tenth the DCM frequency. Analog bandwidth  
may be increased to up to half the DCM frequency in many  
applications. This will result in greater dynamic error generated  
at the DCM.  
10 Hz  
50 Hz  
100 Hz  
200 Hz  
500 Hz  
0.47 µF  
0.10 µF  
0.05 µF  
0.8 mg  
1.8 mg  
2.5 mg  
3.2 mg  
7.2 mg  
10.1 mg  
14.3 mg  
22.6 mg  
0.027 µF 3.6 mg  
0.01 µF 5.7 mg  
CHOOSING T2 AND COUNTER FREQUENCY: DESIGN  
TRADE-OFFS  
The noise level is one determinant of accelerometer resolution.  
The second relates to the measurement resolution of the counter  
when decoding the duty cycle output.  
The analog bandwidth may be further decreased to reduce noise  
and improve resolution. The ADXL210E noise has the character-  
istics of white Gaussian noise that contributes equally at all  
frequencies and is described in terms of µg per root Hz; i.e., the  
noise is proportional to the square root of the bandwidth of the  
accelerometer. It is recommended that the user limit bandwidth to  
the lowest frequency needed by the application to maximize the  
resolution and dynamic range of the accelerometer.  
The ADXL210Es duty cycle converter has a resolution of  
approximately 14 bits; better resolution than the accelerometer  
itself. The actual resolution of the acceleration signal is, how-  
ever, limited by the time resolution of the counting devices used  
to decode the duty cycle. The faster the counter clock, the higher  
the resolution of the duty cycle and the shorter the T2 period  
can be for a given resolution. The following table shows some of  
the trade-offs. It is important to note that this is the resolution  
due to the microprocessorscounter. It is probable that the  
accelerometers noise floor may set the lower limit on the resolu-  
tion, as discussed in the previous section.  
–10–  
REV. 0  
ADXL210E  
Table V. Trade-Offs Between Microcontroller Counter Rate,  
T2 Period, and Resolution of Duty Cycle Modulator  
Power Cycling with an External A/D  
Depending on the value of the XFILT capacitor, the ADXL210E  
is capable of turning on and giving a good reading in 1.6 ms.  
Most microcontroller-based A/Ds can acquire a reading in  
another 25 µs. Thus it is possible to turn on the ADXL210E  
and take a reading in <2 ms. If we assume that a 20 Hz sample  
rate is sufficient, the total current required to take 20 samples is:  
Counter-  
ADXL210E Clock  
Counts  
RSET Sample  
Rate  
per T2 Counts Resolution  
T2 (ms) (k) Rate  
(MHz)  
Cycle  
per g  
(mg)  
1.0  
1.0  
1.0  
5.0  
5.0  
5.0  
10.0  
10.0  
10.0  
124 1000  
124 1000  
124 1000  
625 200  
625 200  
625 200  
1250 100  
1250 100  
1250 100  
2.0  
1.0  
0.5  
2.0  
1.0  
0.5  
2.0  
1.0  
0.5  
2000  
1000  
500  
10000  
5000  
2500  
20000  
10000  
5000  
80  
40  
20  
400  
200  
100  
800  
400  
200  
12.50  
25.00  
50.00  
2.50  
5.00  
10.00  
1.25  
2 ms ϫ 20 Samples/s ϫ 0.6 mA = 24 µA  
Running the part at 3 V will reduce the supply current from  
0.6 mA to 0.4 mA, bringing the average current down to 16 µA.  
The A/D should read the analog output of the ADXL210E at  
the XFILT and YFILT pins. A buffer amplifier is recommended, and  
may be required in any case to amplify the analog output to give  
enough resolution with an 8-bit to 10-bit converter.  
2.50  
5.00  
Power Cycling When Using the Digital Output  
An alternative is to run the microcontroller at a higher clock rate  
and put it into shutdown between readings, allowing the use of the  
digital output. In this approach the ADXL210E should be set at  
its fastest sample rate (T2 = 0.5 ms), with a 500 Hz filter at XFILT  
and YFILT. The concept is to acquire a reading as quickly as  
possible and then shut down the ADXL210E and the microcon-  
troller until the next sample is needed.  
USING THE ANALOG OUTPUT  
The ADXL210E was specifically designed for use with its digital  
outputs, but has provisions to provide analog outputs as well.  
Duty Cycle Filtering  
An analog output can be reconstructed by filtering the duty cycle  
output. This technique requires only passive components. The  
duty cycle period (T2) should be set to <1 ms. An RC filter with a  
3 dB point at least a factor of >10 less than the duty cycle fre-  
quency is connected to the duty cycle output. The filter resistor  
should be no less than 100 kto prevent loading of the output  
stage. The analog output signal will be ratiometric to the supply  
voltage. The advantage of this method is an output scale factor of  
approximately double the analog output. Its disadvantage is that  
In either of the above approaches, the ADXL210E can be turned  
on and off directly using a digital port pin on the microcontroller to  
power the accelerometer without additional components.  
CALIBRATING THE ADXL210E  
The initial value of the offset and scale factor for the ADXL210E will  
require calibration for applications such as tilt measurement. The  
ADXL210E architecture has been designed so that these calibra-  
tions take place in the software of the microcontroller used to decode  
the duty cycle signal. Calibration factors can be stored in EEPROM  
or determined at turn-on and saved in dynamic memory.  
the frequency response will be lower than when using the XFILT  
,
YFILT output.  
XFILT, YFILT Output  
The second method is to use the analog output present at the  
XFILT and YFILT pin. Unfortunately, these pins have a 32 kΩ  
output impedance and are not designed to drive a load directly.  
An op amp follower may be required to buffer this pin. The  
advantage of this method is that the full 5 kHz bandwidth of the  
accelerometer is available to the user. A capacitor still must be  
added at this point for filtering. The duty cycle converter should  
be kept running by using RSET <10 M. Note that the acceler-  
ometer offset and sensitivity are ratiometric to the supply voltage.  
The offset and sensitivity are nominally:  
For low g applications, the force of gravity is the most stable,  
accurate and convenient acceleration reference available. A reading  
of the 0 g point can be determined by orientating the device  
parallel to the earths surface and then reading the output.  
A more accurate calibration method is to make measurements at  
+1 g and 1 g. The sensitivity can be determined by the two  
measurements.  
To calibrate, the accelerometers measurement axis is pointed  
directly at the earth. The 1 g reading is saved and the sensor is  
turned 180° to measure 1 g. Using the two readings, the sensi-  
tivity is:  
0 g Offset = VDD/2  
ADXL210E Sensitivity = (20 mV ϫ VS)/g  
Let A = Accelerometer output with axis oriented to +1 g  
Let B = Accelerometer output with axis oriented to 1 g then:  
Sensitivity = [A B]/2 g  
USING THE ADXL210E IN VERY LOW POWER  
APPLICATIONS  
An application note outlining low power strategies for the  
ADXL210E is available. Some key points are presented here.  
It is possible to reduce the ADXL210Es average current from  
0.6 mA to less than 20 µA by using the following techniques:  
For example, if the +1 g reading (A) is 55% duty cycle and the  
1 g reading (B) is 47% duty cycle, then:  
Sensitivity = [55% 47%]/2 g = 4%/g  
These equations apply whether the output is analog or duty cycle.  
1. Power cycle the accelerometer.  
Application notes outlining algorithms for calculating accelera-  
tion from duty cycle and automated calibration routines are  
available from the factory.  
2. Run the accelerometer at a lower voltage (down to 3 V).  
REV. 0  
–11–  
ADXL210E  
OUTLINE DIMENSIONS  
Dimensions shown in inches and (mm).  
8-Terminal Ceramic Leadless Chip Carrier  
(E-8)  
0.050 (1.27)  
7
0.070 (1.78)  
0.197 (5.00)  
SQ  
0.015 (0.38)  
1
0.075  
0.099  
(2.50)  
(1.91)  
0.177  
(4.50)  
SQ  
0.050 (1.27)  
TOP VIEW  
0.050 (1.27)  
0.025  
0.099  
(2.50)  
(0.64)  
3
5
R0.008  
(0.20)  
0.015 (0.38)  
R0.028 (0.70)  
0.008  
(0.20)  
BOTTOM VIEW  
CONTROLLING DIMENSIONS ARE IN MILLIMETERS  
–12–  
REV. 0  

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