DAC8408GPZ [ADI]

Quad 8-Bit Multiplying CMOS D/A Converter with Memory;
DAC8408GPZ
型号: DAC8408GPZ
厂家: ADI    ADI
描述:

Quad 8-Bit Multiplying CMOS D/A Converter with Memory

光电二极管 转换器
文件: 总13页 (文件大小:97K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
REVISIONS  
LTR  
A
DESCRIPTION  
Drawing updated to reflect current requirements. - lgt  
DATE (YR-MO-DA)  
01-08-03  
APPROVED  
Raymond Monnin  
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.  
REV  
SHEET  
REV  
SHEET  
REV STATUS  
OF SHEETS  
PMIC N/A  
REV  
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
A
9
A
A
A
SHEET  
10  
11  
12  
PREPARED BY  
Rick C. Officer  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216  
CHECKED BY  
STANDARD  
MICROCIRCUIT  
DRAWING  
Charles Reusing  
http://www.dscc.dla.mil  
APPROVED BY  
Michael Frye  
THIS DRAWING IS AVAILABLE  
FOR USE BY ALL  
MICROCIRCUIT, LINEAR, QUAD 8-BIT  
MULTIPLYING CMOS, DIGITAL-TO-ANALOG  
CONVERTER WITH MEMORY, MONOLITHIC  
SILICON  
DEPARTMENTS  
AND AGENCIES OF THE  
DEPARTMENT OF DEFENSE  
DRAWING APPROVAL DATE  
03 November 1989  
AMSC N/A  
REVISION LEVEL  
A
SIZE  
A
CAGE CODE  
5962-89678  
67268  
SHEET  
1
OF  
12  
DSCC FORM 2233  
APR 97  
5962-E543-01  
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.  
1. SCOPE  
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in  
accordance with MIL-PRF-38535, appendix A.  
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:  
5962-89678  
01  
X
X
Drawing number  
Device type  
(see 1.2.1)  
Case outline  
(see 1.2.2)  
Lead finish  
(see 1.2.3)  
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:  
Device type  
Generic number  
DAC-8408A  
DAC-8408B  
Circuit function  
01  
02  
Quad 8-bit multiplying CMOS, digital-to-analog converter with memory  
Quad 8-bit multiplying CMOS, digital-to-analog converter with memory  
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:  
Outline letter  
X
Descriptive designator  
Terminals  
28  
Package style  
Dual-in-line  
GDIP1-T28 or CDIP2-T28  
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.  
1.3 Absolute maximum ratings.  
VDD to IOUT2 (pins 5, 24)........................................................................ 0 V dc to +7.0 V dc  
VDD to DGND........................................................................................ 0 V dc to +7.0 V dc  
I
OUT2 (pins 5, 24) to DGND ................................................................... -0.3 V dc to VDD +0.3 V dc  
Digital input voltage to DGND .............................................................. -0.3 V dc to VDD +0.3 V dc  
Output voltage (pins 4, 6, 23, 25) to DGND.......................................... -0.3 V dc to VDD +0.3 V dc  
VREFA, VREFB, VREFC, VREFD to DGND .................................................... 25 V dc  
Voltage from RFBA, RFBB, RFBC, RFBD to DGND..................................... 25 V dc  
Power dissipation (PD) to +75 C........................................................... 45 mW 1/  
Storage temperature range .................................................................. -65 C to +150 C  
Lead temperature (soldering, 60 seconds)........................................... +300 C  
Thermal resistance, junction-to-case ( JC)........................................... See MIL-STD-1835  
Thermal resistance, junction-to-ambient ( JA)...................................... 120 C/W  
1.4 Recommended operating conditions.  
Ambient operating temperature range (TA) .......................................... -55 C to +125 C  
Reference voltage (VREF)...................................................................... +10 V  
VOUT1 and VOUT2 .................................................................................... 0 V  
VDD .......................................................................................................................................................... +5 V 10%  
Source resistance (RS) ........................................................................ 50  
1/ Derate above +75 C at 6.0 mW/ C.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
2
DSCC FORM 2234  
APR 97  
2. APPLICABLE DOCUMENTS  
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a  
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed  
in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in  
the solicitation.  
SPECIFICATION  
DEPARTMENT OF DEFENSE  
MIL-PRF-38535 -- Integrated Circuits, Manufacturing, General Specification for.  
STANDARDS  
DEPARTMENT OF DEFENSE  
MIL-STD-883  
-
Test Method Standard Microcircuits.  
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.  
HANDBOOKS  
DEPARTMENT OF DEFENSE  
MIL-HDBK-103 -- List of Standard Microcircuit Drawings.  
MIL-HDBK-780 - Standard Microcircuit Drawings.  
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text  
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a  
specific exemption has been obtained.  
3. REQUIREMENTS  
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-  
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer  
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-  
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying  
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan  
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.  
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-  
PRF-38535 is required to identify when the QML flow option is used.  
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as  
specified in MIL-PRF-38535, appendix A and herein.  
3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.  
3.2.2 Truth table. The truth table shall be as specified on figure 2.  
3.2.3 Functional diagram. The functional diagram shall be as specified on figure 3.  
3.2.4 Case outline. The case outline shall be in accordance with 1.2.2 herein.  
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are  
as specified in table I and shall apply over the full ambient operating temperature range.  
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical  
tests for each subgroup are described in table I.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
3
DSCC FORM 2234  
APR 97  
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN  
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For  
packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the  
option of not marking the "5962-" on the device.  
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance  
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in  
accordance with MIL-PRF-38535 to identify when the QML flow option is used.  
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an  
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to  
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-  
38535, appendix A and the requirements herein.  
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided  
with each lot of microcircuits delivered to this drawing.  
3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,  
appendix A.  
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's  
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the  
reviewer.  
4. QUALITY ASSURANCE PROVISIONS  
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,  
appendix A.  
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices  
prior to quality conformance inspection. The following additional criteria shall apply:  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level  
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
test method 1015 of MIL-STD-883.  
(2) TA = +125 C, minimum.  
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter  
tests prior to burn-in are optional at the discretion of the manufacturer.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
4
DSCC FORM 2234  
APR 97  
TABLE I. Electrical performance characteristics.  
Conditions  
-55 C TA +125 C  
VOUT1 = VOUT2 = 0 V  
Group A  
subgroups  
Device  
type  
Limits  
Unit  
Test  
Symbol  
VDD = +5 V;  
VREF = 10 V  
unless otherwise specified  
Min  
Max  
0.25  
Relative accuracy  
INL  
1, 2, 3  
1, 2, 3  
01  
02  
01  
LSB  
LSB  
0.50  
0.50  
Differential  
nonlinearity  
DNL  
02  
All  
All  
1.0  
1.0  
Gain error  
1, 2, 3  
1, 2, 3  
LSB  
GFSE  
DC power supply  
PSRR  
0.001  
%
%
Gain  
rejection  
1/  
VDD  
Output leakage  
current  
1
All  
nA  
ILKG  
30  
2/  
2, 3  
100  
14  
Input resistance  
1, 2, 3  
1, 2, 3  
All  
All  
6
RREF  
RREF  
k
Input resistance  
match  
%
Measuring at VREFA, B, C, D  
pins  
1.0  
Digital input high  
Digital input low  
Input current  
1, 2, 3  
1, 2, 3  
1
All  
All  
All  
2.4  
V
V
A
VIH  
VIL  
IIN  
0.8  
1.0  
VIN = 0 V or VDD  
2, 3  
10.0  
0.4  
Digital output low  
Digital output high  
Supply current  
1, 2, 3  
1, 2, 3  
1
All  
All  
All  
V
V
VOL  
VOH  
IDD  
ISINK = 1.6 mA  
4
ISOURCE = 400 A  
Digital inputs = VIL or VIH  
Digital inputs = 0 V or VDD  
Digital inputs = VIL or VIH  
Digital inputs = 0 V or VDD  
See 4.3.1c  
1.0  
0.05  
1.5  
0.05  
8
mA  
2, 3  
Input capacitance  
Functional test  
4
All  
All  
All  
pF  
ns  
CIN  
See 4.3.1d  
7, 8  
Write to data strobe  
time  
3/  
9, 10, 11  
90  
tDS1  
or  
4/  
tDS2  
tDSU  
Data valid to strobe  
3/  
3/  
9, 10, 11  
9
All  
All  
150  
10  
ns  
ns  
set-up time  
4/  
Data valid to strobe  
hold time  
tDH  
10, 11  
4/  
10  
See footnotes at end of table.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
5
DSCC FORM 2234  
APR 97  
TABLE I. Electrical performance characteristics - Continued.  
Conditions  
-55 C TA +125 C  
VOUT1 = VOUT2 = 0 V  
Group A  
subgroups  
Device  
type  
Limits  
Unit  
Test  
Symbol  
VDD = +5 V;  
VREF = 10 V  
unless otherwise specified  
Min  
Max  
DAC select to strobe  
set-up time  
3/  
3/  
3/  
3/  
3/  
3/  
3/  
3/  
3/  
9
All  
All  
All  
All  
All  
All  
All  
All  
All  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAS  
10, 11  
0
4/  
9
DAC select to strobe  
hold time  
0
0
tAH  
10, 11  
4/  
9
Write select to strobe  
set-up time  
0
0
tWSU  
tWH  
tRDS  
tC0  
10, 11  
4/  
9
Write select to strobe  
hold time  
0
0
10, 11  
4/  
9
Read to data strobe  
width  
220  
350  
10, 11  
4/  
9
Data strobe to output  
valid time  
320  
430  
10, 11  
4/  
9
Output data to  
deselect time  
200  
270  
t0TD  
tRSU  
tRH  
10, 11  
4/  
9
Read select to strobe  
setup time  
0
0
10, 11  
4/  
9
Read select to strobe  
hold time  
0
0
10, 11  
4/  
1/  
VDD = 10%.  
2/ All digital inputs = 0 V.  
3/ See figure 4.  
4/ Subgroups 10 and 11, if not tested, shall be guaranteed to the limits specified in table I.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
SHEET  
A
6
DSCC FORM 2234  
APR 97  
Device type  
Case outline  
01 and 02  
X
Terminal number  
Terminal symbol  
1
2
3
4
5
VDD  
VREFA  
RFBA  
IOUT1A  
OUT2A OUT2B  
I
I
6
IOUT1B  
RFBB  
7
8
VREFB  
DB0(LSB)  
DB1  
9
10  
11  
12  
13  
14  
15  
16  
17  
DB2  
DB3  
DB4  
DB5  
DB6  
DB7(LSB)  
A
B
18  
R
W
19  
20  
DS1  
DS2  
VREFD  
RFBD  
21  
22  
23  
24  
IOUT1D  
OUT2C OUT2D  
I
I
25  
26  
27  
28  
IOUT1C  
RFBC  
VREFC  
DGND  
FIGURE 1. Terminal connections.  
SIZE  
STANDARD  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
7
DSCC FORM 2234  
APR 97  
CONTROL LOGIC  
MODE  
DAC  
DS1  
DS2  
A
B
R
W
L
L
H
H
H
H
L
H
L
H
L
L
WRITE  
WRITE  
WRITE  
WRITE  
A
B
C
D
L
L
L
L
L
L
H
H
H
H
L
H
L
H
L
H
H
H
H
READ  
READ  
READ  
READ  
A
B
C
D
L
L
L
L
L
H
L
L
L
WRITE  
WRITE  
A & C  
B & D  
H
L
L
H
L
L
X
H
L
X
H
H
HOLD  
HOLD  
HOLD  
A/B/C/D  
A/B/C/D  
A/B/C/D  
L = Low  
H = High  
X = Don’t care  
FIGURE 2. Truth table.  
STANDARD  
MICROCIRCUIT DRAWING  
SIZE  
5962-89678  
A
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
8
DSCC FORM 2234  
APR 97  
FIGURE 3. Functional diagram.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
9
DSCC FORM 2234  
APR 97  
FIGURE 4. Timing diagram.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
10  
DSCC FORM 2234  
APR 97  
TABLE II. Electrical test requirements.  
MIL-STD-883 test requirements  
Subgroups  
(in accordance with  
MIL-STD-883, method 5005,  
table I)  
1
Interim electrical parameters  
(method 5004)  
Final electrical test parameters  
(method 5004)  
1*, 2, 3, 7, 8  
Group A test requirements  
(method 5005)  
1, 2, 3, 4, 7, 8, 9, 10**, 11**  
1
Groups C and D end-point  
electrical parameters  
(method 5005)  
* PDA applies to subgroup 1.  
** Subgroups 10, and 11, if not tested shall be  
guaranteed to the limits specified in table I herein.  
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-  
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.  
4.3.1 Group A inspection.  
a. Tests shall be as specified in table II herein.  
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.  
c. Subgroup 4 (CIN measurement) shall be measured only for the initial test and after process or design changes which  
may affect input capacitance.  
d. Subgroups 7 and 8 shall include verification of the truth table.  
4.3.2 Groups C and D inspections.  
a. End-point electrical parameters shall be as specified in table II herein.  
b. Steady-state life test conditions, method 1005 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision  
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit  
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent  
specified in test method 1005 of MIL-STD-883.  
(2) TA = +125 C, minimum.  
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
11  
DSCC FORM 2234  
APR 97  
5. PACKAGING  
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.  
6. NOTES  
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications  
(original equipment), design applications, and logistics purposes.  
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-  
prepared specification or drawing.  
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for  
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.  
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application  
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for  
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)  
should contact DSCC-VA, telephone (614) 692-0544.  
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone  
(614) 692-0547.  
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-  
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted  
by DSCC-VA.  
STANDARD  
SIZE  
5962-89678  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
A
SHEET  
12  
DSCC FORM 2234  
APR 97  
STANDARD MICROCIRCUIT DRAWING BULLETIN  
DATE: 01-08-03  
Approved sources of supply for SMD 5962-89678 are listed below for immediate acquisition information only and  
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be  
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a  
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next  
dated revision of MIL-HDBK-103 and QML-38535.  
Standard  
microcircuit drawing  
PIN 1/  
Vendor  
CAGE  
number  
24355  
24355  
Vendor  
similar  
PIN 2/  
5962-8967801XA  
5962-8967802XA  
DAC8408AT/883  
DAC8408BT/883  
1/ The lead finish shown for each PIN representing  
a hermetic package is the most readily available  
from the manufacturer listed for that part. If the  
desired lead finish is not listed contact the vendor  
to determine its availability.  
2/ Caution. Do not use this number for item  
acquisition. Items acquired to this number may not  
satisfy the performance requirements of this drawing.  
Vendor CAGE  
number  
Vendor name  
and address  
24355  
Analog Devices, Inc.  
Rt. 1 Industrial Park  
P.O. Box 9106  
Norwood, Ma. 02062  
Point of Contact:  
1500 Space Park Dr.  
P.O. Box 58020  
Santa Clara, Ca. 95050-8020  
The information contained herein is disseminated for convenience only and the  
Government assumes no liability whatsoever for any inaccuracies in the  
information bulletin.  

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1.8V to 5.5V, 80mA, 14- and 16-Bit, Low-Power, Single-Channel,DIGITAL-TO-ANALOG CONVERTERS in SC70 Package
TI

DAC8412

Quad, 12-Bit DAC Voltage Output with Readback
ADI

DAC8412AT

Quad, 12-Bit DAC Voltage Output with Readback
ADI

DAC8412AT-883C

Quad, 12-Bit DAC Voltage Output with Readback
ADI

DAC8412AT/883

12-Bit Digital-to-Analog Converter
ETC

DAC8412AT/883C

Quad, 12-Bit DAC Voltage Output with Readback
ADI

DAC8412AT883C

Quad, 12-Bit DAC Voltage Output with Readback
ADI

DAC8412BT-883C

Quad, 12-Bit DAC Voltage Output with Readback
ADI