OP271BIGS [ADI]

IC DUAL OP-AMP, 700 uV OFFSET-MAX, 5 MHz BAND WIDTH, PDSO16, PLASTIC, SOL-16, Operational Amplifier;


型号：	OP271BIGS
厂家：	ADI
描述：	IC DUAL OP-AMP, 700 uV OFFSET-MAX, 5 MHz BAND WIDTH, PDSO16, PLASTIC, SOL-16, Operational Amplifier 放大器光电二极管
文件：	总13页 (文件大小：88K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

REVISIONS

LTR

DESCRIPTION

Add radiation hardened and class V requirements. - ro

DATE (YR-MO-DA)

00-04-13

APPROVED

R. MONNIN

Make change to A

table I. - ro

radiation hardened test limit as specified under

00-10-05

03-03-21

R. MONNIN

Add case outline D. Make changes to 1.2.4, 3.2.3, figure 1, and table IIA.

Delete figure 2. - ro

Drawing updated to reflect current requirements. - rrp

Make changes to 4.4.4 and add 4.4.4.1. - ro

05-11-09

06-12-21

13-01-09

R. MONNIN

C. SAFFLE

Update drawing to current MIL-PRF-38535 requirements. –rrp

THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

CHARLES E. BESORE

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

http://www.landandmaritime.dla.mil

CHECKED BY

WILLIAM J. JOHNSON

STANDARD

MICROCIRCUIT

DRAWING

APPROVED BY

MICHAEL A. FRYE

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

MICROCIRCUIT, LINEAR, DUAL, LOW NOISE,

OPERATIONAL AMPLIFIERS, MONOLITHIC

SILICON

DRAWING APPROVAL DATE

88-10-17

AMSC N/A

REVISION LEVEL

SIZE

CAGE CODE

5962-88721

67268

SHEET

DSCC FORM 2233

APR 97

5962-E147-13

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and

M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the

Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the

PIN.

1.2 PIN. The PIN is as shown in the following examples.

For device classes M and Q:

5962

88721

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

Drawing number

For device class V:

5962

88721

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

(see 1.2.3)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and

are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type

Generic number

Circuit function

OP-270A

OP-271A

Dual, low-noise, precision, operational amplifier

Dual, low-noise, high speed, operational amplifier

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed

below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q

designators will not be included in the PIN and will not be marked on the device.

Device class

Device requirements documentation

Vendor self-certification to the requirements for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V

Certification and qualification to MIL-PRF-38535

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter

Descriptive designator

Terminals

Package style

GDFP1-F14

GDIP1-T8 or CDIP2-T8

CQCC1-N20

Flat pack

Dual-in-line

Square leadless chip carrier

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

1.3 Absolute maximum ratings. 1/

Supply voltage (V ) ..................................................................................... ±18 V

Differential input voltage 2/ ........................................................................ ±1 V

Differential input current 2/ ......................................................................... ±25 mA

Input voltage (V ) ...................................................................................... Supply voltage

Output short-circuit ...................................................................................... Continuous

Storage temperature range.......................................................................... -65°C to +150°C

Lead temperature (soldering, 60 seconds) ................................................. +300°C

Junction temperature (T ) ........................................................................... +150°C

Thermal resistance, junction-to-case (θ ) ................................................. See MIL-STD-1835

Thermal resistance, junction-to-ambient (θ ):

Case D .................................................................................................... 150°C/W

Case P ..................................................................................................... 45°C/W

Case 2 ..................................................................................................... 35°C/W

1.4 Recommended operating conditions.

Supply voltage (V ) ..................................................................................... ±15 V

Source resistance (R ) ............................................................................... 50 Ω

Ambient operating temperature range (T ) ................................................. -55°C to +125°C

1.5 Radiation features.

Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ................ 100 Krads(Si) 3/

______

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ The inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise

performance. If the differential input voltage exceeds ±1.0 V, the input current should be limited to ±25 mA.

3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,

method 1019, condition A.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in

the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883

Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents are available online at https://assist.dla.mil/quicksearch/ or from the Standardization Document

Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document

revision level control and shall be made available to the preparing and acquiring activity upon request.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be

marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be

in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics.

Conditions 1/ 2/ 3/

-55°C ≤ T ≤ +125°C

unless otherwise specified

Group A

subgroups

Device

type

Limits

Unit

Test

Symbol

Min

Max

Input offset voltage

2,3

µV

175

200

400

M,D,P,L,R

2,3

Input offset current

All

= 0 V

2,3

100

M,D,P,L,R

All

Input bias current

2,3

1000

Input noise voltage 4/

f = 1 Hz to 100 Hz,

RMS

T = +25°C

Input noise voltage 4/ 5/

density

nV /

f = 1 kHz, T = 25°C

O A

Large signal voltage

gain

1500

V/mV

= ±10 V, R = 10 kΩ

5,6

750

100

750

400

300

200

M,D,P,L,R

= ±10 V, R = 2 kΩ

5,6

= ±10 V, R = 10 kΩ

5,6

= ±10 V, R = 2 kΩ

5,6

See footnotes at end of table.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Conditions 1/ 2/ 3/

-55°C ≤ T ≤ +125°C

unless otherwise specified

Group A

subgroups

Device

type

Limits

Unit

Test

Symbol

Min

Max

Output voltage swing 4/

4,5,6

2,3

All

±12

R = 2 kΩ

Average input offset 4/

voltage drift

1.0

2.0

µV/°C

TCV

T = –55°C, +125°C

All

Common mode rejection 4/ CMR

106

100

= ±12 V

2,3

Power supply rejection 4/

ratio

PSRR

All

3.2

µV/V

V = ±4.5 V to ±18 V

2,3

5.6

6.5

7.5

6.5

Supply current 6/

No load

2,3

M,D,P,L,R

= +20, R = 10 kΩ,

Slew rate 4/

±1.7

±5.5

V/µs

VCL

T = +25°C

1/ Unless otherwise specified V = ±15 V, R = 50 Ω.

2/ Devices supplied to this drawing meet all levels M, D, P, L, and R of irradiation however this device is only tested at the

R level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post

irradiation electrical measurements for any RHA level, T = +25°C.

3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,

method 1019.

4/ Not tested post irradiation.

5/ Guaranteed if not tested to the limit specified.

6/ I limit = total for both amplifiers.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

Device types

Case outlines

01 and 02

Terminal

number

Terminal symbol

OUT A

-IN A

+IN A

OUT A

-IN A

+IN A

-V

+IN B

-IN B

-IN A

OUT B

+IN A

-V

+IN B

-IN B

OUT B

---

-V

+IN B

---

-IN B

OUT B

NC = No connection

FIGURE 1. Terminal connections.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of

supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-

PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of

product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.

3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's

agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation.

Offshore documentation shall be made available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number 49 (see MIL-PRF-38535, appendix A).

4. VERIFICATION

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be

in accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015.

(2) T_A= +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

TABLE IIA. Electrical test requirements.

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

MIL-PRF-38535, table III)

method 5005, table I)

Device

class M

Device

class Q

Device

class V

Interim electrical

parameters (see 4.2)

Final electrical

parameters (see 4.2)

Group A test

1,2,3,4,5,6 1/

1,2,3, 1/ 2/

4,5,6

1,2,3,4,5,6,7

requirements (see 4.4)

Group C end-point electrical

parameters (see 4.4)

Group D end-point electrical

parameters (see 4.4)

Group E end-point electrical

parameters (see 4.4)

1 2/

---

1,4

1/ PDA applies to subgroup 1.

2/ Delta limits as specified in table IIB herein shall be required where specified, and the delta

values shall be computed with reference to the zero hour electrical parameters (see table I).

TABLE IIB. Delta limits at +25°C.

Parameter

Device type

Max limit

±75

Delta

±35

±10

±5

Units

µV

±20

±10

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for

groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device

class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for

device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table IIA herein.

b. Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method

1005 of MIL-STD-883.

b. T_A= +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness

assured (see 3.5 herein). RHA levels for device classes M, Q and V shall be as specified in MIL-PRF-38535. End-point

electrical parameters shall be as specified in table IIA herein.

4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883

method 1019, condition A and as specified herein.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device

classes Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-

prepared specification or drawing.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires

configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users

and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering

microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,

or telephone (614) 692-0540.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in

MIL-HDBK-103 and QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein)

to DLA Land and Maritime-VA and have agreed to this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DLA Land and Maritime-VA.

SIZE

STANDARD

5962-88721

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 13-01-09

Approved sources of supply for SMD 5962-88721 are listed below for immediate acquisition information only and

shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be

revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a

certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information

bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime

maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-8872101PA

5962-88721012A

5962-8872102PA

5962-88721022A

5962-8872101VDA

5962-8872101VPA

5962-8872101V2A

5962R8872101VDA

5962R8872101VPA

5962R8872101V2A

24355 (2)

OP270AZ/883C

OP-270ARC/883C

OP-271AZ/883C

OP-271ARC/883C

OP270AM/QMLV

OP270AZ/QMLV

OP270ARC/QMLV

OP270AM/QMLR

OP270AZ/QMLR

OP270ARC/QMLR

24355 (4)

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item

acquisition. Items acquired to this number may not

satisfy the performance requirements of this drawing.

3/ Not available from an approved source of supply.

1 of 2

STANDARD MICROCIRCUIT DRAWING BULLETIN – Continued

DATE: 13-01-09

Vendor CAGE

number

Vendor name

and address

24355

Analog Devices (2)

Route 1 Industrial Park

P.O. Box 9106

Norwood, MA 02062

Point of contact: 804 Woburn Street

Wilmington, MA 01887-3462

24355

Analog Devices (4)

Route 1 Industrial Park

P.O. Box 9106

Norwood, MA 02062

Point of contact: 7910 Triad Drive

Greensboro, NC 27409-9605

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.

2 of 2

OP271BIGS [ADI]

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