E6835A [AGILENT]
TD-SCDMA Calibration Application; TD- SCDMA应用校准
| 型号： | E6835A |
| 厂家： | 
AGILENT TECHNOLOGIES, LTD. |
| 描述： | TD-SCDMA Calibration Application |
| 文件： | 总4页 (文件大小：219K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Agilent
E6835A TD-SCDMA Calibration Application
For the E6601A Wireless Communications Test Set
Data Sheet
The next generation of mobile phone
E6601A Features
manufacturing test.
• CW, AM, FM, DSB-SC source modulation
• RF analyzer
• Spectrum monitor
• Transmitter power measurements
• Power versus time measurement
• Frequency error measurement
• Optional IQ capture waveform sampling
• Internal OCXO time base
• Built-in open Windows XP PC
• Built-in help system
• Run test programs with internal or external PC
• GPIB, USB, and LAN connectivity and control
The E6601A is the newest test set from Agilent Technologies,
designed especially for high-volume, test-mode manufacturing.
Combining industry-leading measurement speed, selectable
formats, flexible licensing, and an integrated open Windows®
XP PC, the E6601A helps you achieve the lowest cost of test in
mobile phone manufacturing.
The E6601A and its available technology-specific software
applications deliver industry leading measurement speed and
accuracy for your mobile phone test needs.
The Agilent E6835A TD-SCDMA Calibration Application is
a non-signaling application optimized for TD-SCDMA user
equipment calibration. The E6835A also provides a choice of
perpetual, transportable, or term licenses for maximizing asset
utilization and your cost per test.
E6835A Features
Source modulation
• CW, AM, FM, DSB-SC source modulation
• TD-SCDMA source modulation
Because it’s Agilent, you can be confident—it operates using
trusted, proven measurement methodology that ensures
measurement integrity that is never compromised.
Power measurements
• Mean power
• Root-raised cosine (RRC) filtered mean power
Spectral measurements
• Adjacent channel leakage ratio (ACLR)
• Spectrum emission mask (SEM)
• Spectrum monitor
Modulation quality
• CW frequency error
• DPCH error vector magnitude (EVM)
• DPCH peak code domain error (PCDE)
• DPCH frequency error
Dynamic power measurement
Technical Specifications
DPCH Measurement Suite
These specifications apply to an Agilent E6601A Wireless
Communications Test Set mainframe and the E6835A
TD-SCDMA Calibration Application firmware revision A.05
or higher. Only feature additions beyond the Agilent E6890A
General Purpose Application are included in this document.
Specifications describe the test set’s warranted performance
and are valid for the unit’s operation within 10 °C of the last
self alignment. All specifications are valid after a 30-minute
warm-up period of continuous operation with valid self
alignment. If the instrument has been off for longer than
48 hours, a 48-hour warm-up period followed by self
alignment is required.
Includes mean power, RRC filtered mean power, ACLR, EVM,
frequency error, PCDE, and SEM measurements.
Trigger setup
Delay
–20 to +20 ms
External, immediate, RF rise
Sources
Mean and RRC-filtered mean power measurements
Input level range
Average power
–65 to +28 dBm/1.28 MHz
Measurement accuracy
–61 to +28 dBm/1.28 MHz
< 0.65 dB, typically < 0.3 dB
With < 48 hours warm-up before self alignment initiated
Supplemental characteristics are intended to provide typical,
but non-warranted, performance parameters that may be
useful in applying the instrument. These characteristics are
shown in italics and labeled as “typical.” All units shipped
from the factory meet these typical numbers at +25 °C ambient
temperature without including measurement uncertainty.
–61 to +28 dBm/1.28 MHz
< 0.8 dB, typically < 0.3 dB
Measurement repeatability
Typically < 0.05 dB
Filter
Mean power
Mean power-compliant filter
1.28 MHz
RRC-filtered mean power
Adjacent channel leakage ratio (ACLR) measurement
RF Generator
This measurement provides a ratio of the RRC filtered mean
power centered on an adjacent channel to the RRC filtered
mean power centered on the assigned channel frequency.
The RRC filter has an RRC response with roll-off α = 0.22
and a bandwidth equal to the chip rate.
Frequency
Frequency range
TD-SCDMA cellular bands
380 to 2700 MHz
2010 to 2025 MHz
Input level range
Output level
Average power
+5 to +28 dBm/1.28 MHz
Output level ranges
RF IN/OUT port
Measurement accuracy
1.6 MHz offsets at –33 dB
3.2 MHz offsets at –43 dB
–120 to –15 dBm/1.28 MHz
–120 to –5 dBm/1.28 MHz
<
<
0.8 dB, typically < 0.4 dB
0.8 dB, typically < 0.4 dB
RF OUT ONLY port
Composite signal absolute level accuracy
Residual noise floor
<
10 °C and < 24 hours from last self alignment
1.6 MHz offsets
Typically < –53 dBc
Typically < –63 dBc
1.28 MHz (RRC)
RF IN/OUT port
3.2 MHz offsets
–108 to –28 dBm/1.28 MHz < 1 dB, typically < 0.45 dB
–28 to –15 dBm/1.28 MHz < 1 dB, typically < 0.39 dB
RF OUT ONLY port
Filter
–108 to –28 dBm/1.28 MHz < 1 dB, typically < 0.45 dB
Spectrum emission mask (SEM) measurement
–28 to –5 dBm/1.28 MHz
< 1 dB, typically < 0.39 dB
This measurement provides the out of channel emission for
the offset frequencies, which are between 0.8 and 4 MHz away
from the UE carrier frequency. The out of channel emission is
specified relative to the RRC filtered mean power of the UE
carrier. The RRC filter has an RRC response with roll-off
α = 0.22 and a bandwidth equal to the chip rate.
QPSK modulation
Residual EVM
Typically < 2.5% (rms)
RF Analyzer
Frequency
Input level range
Average power
Measurement accuracy
Frequency range
380 to 2700 MHz
2010 to 2025 MHz
+5 to +28 dBm/1.28 MHz
(0.8 to 4.0) MHz < 1.5 dB
TD-SCDMA cellular bands
Input level ranges
Average power
Peak power
Filter
–65 to +28 dBm/1.28 MHz
In band
1.28 MHz (RRC)
30 kHz (Gaussian)
1 MHz (Gaussian)
–65 to +37 dBm/1.28 MHz (5 W)
0.8 to 2.4 MHz
2.4 to 4.0 MHz
Measurement results
Self alignment validity
≤
10 °C change and ≤ 30 days
from last self alignment
Pass/fail, in-channel power (dBm/1.28 MHz), average power
level relative to in-channel power for each offset range (dBc),
the power level vectors relative to in-channel power for all
points tested in each offset range, as well as the worst case
results
2
Error vector magnitude (EVM) measurement
Dynamic Power Measurement
This measurement calculates composite EVM and several other
results relating to UE modulation quality.
This measurement provides a fast and flexible method for
calibrating the power accuracy of a wireless device by providing
multiple Tx power measurements at a single frequency. It tracks
and reports the power result for each step. To take advantage
of this measurement capability, the wireless device must have
a test mode that outputs an appropriate power ramp at each
frequency with the expected number of steps and dwell time
at each step (step length).
Input level range
Average power
–25 to +28 dBm/1.28 MHz
≤ 20% rms
UE ranges
EVM
Frequency error
Timing error
<
<
20 kHz
25 chips
EVM measurement accuracy
Input level range
(Includes residual EVM)
<
2.5% rms
Average power
–65 to +28 dBm/1.28 MHz
Filter
1.28 MHz (RRC)
EVM, magnitude error, phase
error, origin offset
Amplitude capture range
Measurement results
With 7 dB crest factor
<
2 dB of expected power
Measurement accuracy1
+2 to –42 dB of expected power
–54 to +28 dBm/1.28 MHz
–61 to < –54 dBm/1.28 MHz
+2 to –42 dB of expected power
Frequency error measurement
<
<
0.6 dB, typically < 0.3 dB
0.7 dB, typically < 0.4 dB
This measurement measures the difference between the carrier
frequency transmitted from the UE and the expected frequency.
The UE uses the same frequency source for both RF frequency
generation and the chip clock.
With < 48 hours warm-up before self alignment initiated
–54 to +28 dBm/1.28 MHz
–61 to < –54 dBm/1.28 MHz
Measurement repeatability
Trigger setup
Sources
<
<
0.7 dB, typically < 0.3 dB
0.8 dB, typically < 0.4 dB
Input level range
Average power
–25 to +28 dBm/1.28 MHz
≤ 20% rms
Typically < 0.05 dB
UE ranges
EVM
Frequency error
Timing error
External, fall, rise
<
<
20 kHz
Step Length and Number of Steps parameters are coupled to
the setting of the Filter:
25 chips
Measurement accuracy
Filter
< ( 10 Hz + timebase accuracy)
1.28 MHz (RRC)
Filter
Step length (SL)
0.5 to 180 ms
0.25 to 180 ms
0.1 to 20 ms
0.1 to 20 ms
0.1 to 20 ms
0.1 to 20 ms
0.1 to 20 ms
0.1 to 20 ms
0.1 to 20 ms
0.1 to 20 ms
0.575 to 20 ms
Number of steps
1 kHz
1 to (1048000/(21973 x SL))
1 to (1048000/(60e3 x SL))
1 to (1048000/(250e3 x SL))
1 to (1048000/(600e3 x SL))
1 to (1048000/(1.28e6 x SL))
1 to (1048000/(2.46e6 x SL))
1 to (1048000/(2.56e6 x SL))
1 to (1048000/(3.2e6 x SL))
0.1 to (1048000/(7.68e6 x SL))
0.1 to (1048000/(10e6 x SL))
1 to 1047800/(1.0833e6 x SL)
Measurement results
Frequency error
30 kHz
Peak code domain error (PCDE) measurement
100 kHz
300 kHz
640 kHz
1.23 MHz
1.28 MHz
1.6 MHz
3.84 MHz
5.0 MHz
This measurement is computed by projecting power of the
error vector onto the code domain at a specific spreading
factor. The code domain error for every code in the domain
is defined as the ratio of the mean power of the projection
onto that code, to the mean power of the composite reference
waveform. This ratio is expressed in dB. The PCDE is defined
as the maximum value for the code domain error for all codes.
Input level range
Average power
–25 to +28 dBm/1.28 MHz
≤ 20% rms
8PSK estimated
carrier power
UE ranges
EVM
Frequency error
Timing error
GSM Tx power
0.1 to 20 ms
0.1 to 20 ms
1 to (1048000/(320e3 x SL))
1 to (1048000/(5.25e6 x SL))
<
<
20 kHz
25 chips
W-CDMA
mean power)
Measurement accuracy
Filter
<
0.3 dB
1.28 MHz (RRC)
Measurement result
A graph displaying the discrete power at each power step along
with numeric power results for each step
Measurement results
Maximum value of CDE
1. Additional accuracy error when using RF OUT ONLY port is < ±±.1 dꢀ.
3
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Printed in USA, December 5, 2007
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