A3942 [ALLEGRO]

Quad High-Side Gate Driver; 四通道高边栅极驱动器
A3942
型号: A3942
厂家: ALLEGRO MICROSYSTEMS    ALLEGRO MICROSYSTEMS
描述:

Quad High-Side Gate Driver
四通道高边栅极驱动器

驱动器 栅极 栅极驱动
文件: 总20页 (文件大小:501K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
A3942  
Quad High-Side Gate Driver  
for Automotive Applications  
Features and Benefits  
Drives four N-channel high-side MOSFETS  
Charge pump for 100% duty cycle operation  
Serial and discrete inputs  
SPI port for control and fault diagnostics  
4.5 to 60 V input voltage range  
Sleep function for minimum power drain  
Thin profile 38-lead TSSOP with internally fused leads for  
enhanced thermal dissipation  
Lead (Pb) free  
Device protection features:  
Short-to-ground detection (latched)  
Short-to-battery protection (latched)  
Open load detection (latched)  
VDD undervoltage lockout  
Description  
The A3942 is a highly-integrated gate driver IC that can drive  
up to four N-Channel MOSFETs in a high-side configuration.  
The device is designed to withstand the harsh environmental  
conditions and high reliability standards of automotive  
applications.  
SerialPeripheralInterface(SPI)compatibilitymakesthedevice  
easily integrated into existing applications. The MOSFETs in  
such applications are typically used to drive gasoline or diesel  
engine management actuators, transmission actuators, body  
control actuators and other general-purpose automotive or  
industrial loads. In particular, the A3942 is suited for driving  
glow plugs, valves, solenoids, and other inductive loads in  
engine management and transmission systems.  
VCP undervoltage lockout  
Thermal monitor  
The device is available in a 38-lead thin (1.20 mm maximum  
overall height) TSSOP package with six pins that are fused  
internally to provide enhanced thermal dissipation (package  
LG). It is lead (Pb) free with 100% matte tin leadframe  
plating.  
Package: 38 pin TSSOP (suffix LG)  
Approximate Scale 1:1  
Typical Application  
CP1 CP2 CP3 CP4  
VCP  
VBB  
VDD  
VBAT  
VDD  
IREF  
VREG  
D1  
FAULTZ  
SDO  
SDI  
A3942  
G1  
S1  
D2  
System  
Control  
Logic  
CSZ  
G2  
S2  
SCLK  
RESETZ  
ENB  
IN1  
D3  
G3  
S3  
IN2  
IN3  
D4  
G4  
IN4  
GNDGNDGNDGNDGNDGND S4  
3942-DS, Rev. 5  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
Selection Guide  
Part Number  
Packing  
A3942KLGTR-T  
4000 pieces per reel  
Absolute Maximum Ratings*  
Characteristic  
Symbol  
Notes  
Rating  
Units  
VBB, CP1, CP3 Pins Voltage  
–0.3 to 60  
V
VBB – 6 V  
to VBB + 0.5 V  
Dx (Drain Detect) Pins Voltage  
VDx  
VSx  
V
Sx (Output Source) Pins Voltage  
VCP, CP2, CP4, Gx Pins Voltage  
All Other Pins  
–10 to 60  
–0.3 to 74  
–0.3 to 7  
–40 to 125  
150  
V
V
V
Operating Ambient Temperature  
Maximum Junction Temperature  
Storage Temperature  
TA  
TJ(max)  
Tstg  
Range K  
ºC  
ºC  
ºC  
V
–55 to 150  
2500  
ESD Rating, Human Body Model  
ESD Rating, Charged Device Model  
AEC-Q100-002, all pins  
AEC-Q100-011, all pins  
1050  
V
*With respect to ground. Exceeding maximum ratings may cause permanent damage. Correct operation is not guaranteed when absolute  
maximum conditions are applied.  
Thermal Characteristics  
Characteristic  
Symbol  
Test Conditions*  
Rating  
Units  
Package Thermal Resistance, Junction  
to Ambient  
4-layer PCB based on JEDEC standard, with no  
thermal vias  
RθJA  
47  
ºC/W  
*For additional information, refer to the Allegro website.  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
2
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
Functional Block Diagram  
CP4  
CP3  
CP2  
CP1  
VCP  
CDD  
C34  
C12  
VDD  
IREF  
Charge  
Pump  
Reference  
Current  
VDD  
UVLO  
Thermal  
Warning  
CREF  
60.4 kΩ  
VCP UVLO  
CCP  
CBB2 CBB1  
FAULTZ  
VBB  
Fault  
Monitor  
U
V
L
Internal  
Regulator  
SDO  
SDI  
VREG  
O
CREG  
VDD  
CSZ  
SCLK  
RESETZ  
ENB  
IN1  
Voltage to VBB pin  
and to Qx MOSFETs  
must come from  
the same supply  
One of Four  
Control  
Logic  
High-Side Drivers  
RDx  
Vds  
Monitor  
Dx  
VCP  
High  
Side  
Driver  
RGx  
Gx  
Sx  
Qx  
IN2  
IN3  
Open  
Load  
Detect  
IN4  
L
L
GND  
GND  
GND  
GND  
GND  
GND  
Name  
Suitable Characteristics  
Representative Device  
C12, C34 0.33 μF or 0.47 μF, 25 V, X7R ceramic  
CBB1  
CBB2  
CCP  
47 μF, 63 V, electrolytic  
EGXE630ELL470MJC5S  
0.22 μF, 100 V, X7R ceramic  
1 μF, 16V, X7R ceramic  
0.47 μF, 16 V, X7R ceramic  
47 pF, 16 V, X7R ceramic  
0.22 μF, 16 V, X7R ceramic  
CDD  
CREF  
CREG  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
3
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
ELECTRICAL CHARACTERISTICS Valid at –40°C TJ 150°C, C12 = C34 = 0.47 μF, CCP = 1 μF, RREF = 60.4 kΩ, and  
VBB within limits, unless otherwise noted  
Characteristics  
Supplies and Regulators  
Operating Voltage  
Symbol  
Test Conditions  
Min. Typ. Max. Units  
VBB  
4.5  
60  
10  
8
V
VBB = 60 V  
mA  
mA  
μA  
μA  
Charge pump on,  
outputs disabled  
VBB = 36 V  
Quiescent Current  
IBB(Q)  
VBB = 36 V  
15  
1
Sleep mode  
VBB = 36 V, TJ = 25°C  
Logic Supply (voltage supplied to  
logic circuits)  
VDD  
IDD  
3
5.5  
V
VDD = 5.5 V, serial port switching  
3
mA  
mA  
Logic Supply Current  
VDD = 5.5 V, device quiescent or in sleep mode  
0.5  
VDD falling, FAULTZ pin held active (low) for  
1.5 V VDD VDDUV  
Logic Supply UVLO Threshold  
VDD(UV)  
2.6  
2.9  
V
Logic Supply UVLO Hysteresis  
VDD(hys)  
fCP  
100  
150  
100  
200  
mV  
kHz  
V
Charge Pump Switching Frequency  
V
BB = 12 V, ICP = 10 mA  
10  
10  
7
13  
13  
11  
Measured relative to  
VBB pin  
Charge Pump Output Voltage  
VCP  
VBB = 6.0 V, ICP = 5 mA  
VBB = 4.5 V, ICP = 5 mA  
V
V
Charge Pump UVLO  
Internal Regulator Voltage  
Regulator Voltage UVLO  
Regulator Voltage UVLO Hysteresis  
Control Circuits  
VCP(UV)  
VREG  
VREG(UV)  
VREG(hys)  
Relative to VBB pin, VCP falling  
CREG = 0.22 μF  
5.1  
5.8  
V
4
V
VREG falling  
3
3.8  
400  
V
100  
mV  
Current Reference Source Voltage  
Master Reset Pulse  
VREF  
tRESET  
tSLEEP  
tWAKE  
1.14  
0.3  
20  
1.2  
1.26  
V
RESETZ pin pulsed low  
5
2
μs  
μs  
ms  
Sleep Command  
RESETZ pin held low  
Wake-Up Delay  
RESETZ pin held high; CCP = 1 μF  
Logic I/O  
0.7 ×  
VDD  
Logic Input Voltage, High  
Logic Input Voltage, Low  
VIH  
VIL  
VDD  
V
V
0.3 ×  
VDD  
0
Continued on the next page...  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
4
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
ELECTRICAL CHARACTERISTICS (continued) Valid at –40°C TJ 150°C, C12 = C34 = 0.47 μF, CCP = 1 μF,  
RREF = 60.4 kΩ, and VBB within limits, unless otherwise noted  
Characteristics  
Logic Input Hysteresis  
Symbol  
Test Conditions  
Min. Typ. Max. Units  
0.1 ×  
Vhys  
V
VDD  
CSZ pin  
10  
5
μA  
μA  
μA  
μA  
μA  
μA  
II(HI)  
SDI and SCLK Pins  
All other pins  
VI = VDD = 5.5 V  
100  
–100  
–5  
Logic Input Current1  
CSZ pin  
II(LO)  
SDI and SCLK Pins  
All other pins  
VI = 0 V  
–10  
VDD  
– 0.5  
VOUT(HI)  
VOUT(LO)  
IOUT = –1 mA  
IOUT = 1 mA  
VDD  
V
Logic Output Voltage, SDO Pin  
(CMOS push-pull circuit)  
0.4  
0.4  
10  
V
V
FAULTZ Pin Active (Low) Voltage  
FAULTZ Pin Inactive (High) Current  
Drivers  
VFAULTZ(LO) IFAULTZ = 1 mA, VDD = 1.5 V, VBB = 4.5 V  
IFAULTZ(HI) VFAULTZ = 5 V  
μA  
Measured relative to Sx pin, capacitive load–fully  
charged  
VCP  
– 1  
Gate Voltage, High  
Gate Voltage, Low  
VG(HI)  
VCP  
0.1  
V
V
Measured relative to Sx pin, capacitive load–fully  
discharged  
VG(LO)  
VBB = 4.5 V, VCP = 9 V  
–10  
–15  
10  
25  
mA  
mA  
mA  
mA  
μs  
RG = 0 Ω, 1 V VGS  
4 V, VSx = VBB  
IG(HI)  
VBB 9 V, VCP = 13 V  
Peak Gate Current1,2  
Propagation Delay  
RG = 0 Ω, VGS = 1 V, VSx = 0 V  
RG = 0 Ω, 2 V VGS 4 V, VSx = 0 V  
From 90% VINx to VGx – VSx = 200 mV  
From 10% VINx to VCP – VGx = 200 mV  
RESETZ pin held low; VGSZ = 10 V  
IG = 2 mA  
IG(LO)  
tp(on)  
tp(off)  
0.6  
0.6  
500  
μs  
Gate-to-Source Resistance  
RGS  
300  
15  
800  
18  
10  
5
kΩ  
V
Gate-to-Source Zener Diode Voltage  
VGS(Z)  
RESETZ pin held low, VBB = VDx = 60 V  
μA  
μA  
μA  
Drain Leakage Current  
IDlkg  
TJ = 150°C  
TJ = 25°C  
RESETZ pin held low,  
BB = VDx = 36 V  
V
1
Continued on the next page...  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
5
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
ELECTRICAL CHARACTERISTICS (continued) Valid at –40°C TJ 150°C, C12 = C34 = 0.47 μF, CCP = 1 μF,  
RREF = 60.4 kΩ, and VBB within limits, unless otherwise noted  
Characteristics  
Symbol  
Test Conditions  
Min. Typ. Max. Units  
Driver Fault Detection  
VBB = 60 V  
VBB = 36 V  
75  
85  
100  
100  
125  
120  
μA  
μA  
Drain Fault Detect Current  
IDx  
VBB  
– 3  
VBB  
+ 0.2  
VBB 9 V  
V
V
V
VBB  
+ 0.2  
Drain Fault Detect Voltage3  
VDx  
VBB = 6 V  
5
4
VBB  
+ 0.2  
V
BB = 4.5 V  
Open Load Detect Source Current1  
Open Load Detect Voltage  
IOL  
VSx = 1.35 V; 4.5 V VBB 36 V  
–48  
1.4  
–82  
1.6  
μA  
VOL  
1.5  
V
Active (when an open load fault is active),  
VBB 36 V  
VCLAMP  
5
V
Open Load VSx Clamp  
ICLAMP  
tON(00)  
tON(01)  
tON(10)  
tON(11)  
tOFF  
Current limit in short-to-battery; VSx =VBB = 36 V  
200  
3.4  
5.9  
11.2  
22.3  
μA  
μs  
μs  
μs  
μs  
μs  
2.5  
3.7  
5.6  
8.9  
Turn-On Blank Time  
Turn-Off Blank Time  
tON(00) is the default, TJ = 150°C  
tON  
Short-to-Ground Fault Detect Filter  
Delay  
tSTG  
From VSx < VDx to 90% VFAULTZ  
1
1.2  
μs  
STB Comparator Offset Voltage  
STG Comparator Offset Voltage  
Temperature Monitor  
VOS(STB)  
VOS(STG)  
60  
45  
mV  
mV  
Thermal Warning Threshold4  
TWARN  
Temperature rising  
155  
165  
15  
175  
°C  
°C  
Thermal Warning Hysteresis  
TWARN(hys)  
1For input and output current specifications, negative current is defined as coming out of (sourcing) the specified device pin.  
2For IG(HI), VCP relative to VBB  
.
3Minimum values of VDx are specified only to avoid short-to-battery nuisance faults. For more information, refer to the Open Load Fault Level topic in  
the Applications Information section.  
4
Minimum and maximum not tested; guaranteed by design.  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
6
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
SERIAL PERIPHERAL INTERFACE (SPI) TIMING CHARACTERISTICS Valid at –40°C TJ 150°C and VBB and VDD within  
limits, unless otherwise noted  
Characteristics  
Transfer Frequency  
Symbol  
f
Test Conditions  
Min. Typ. Max. Units  
375  
50  
15  
8
MHz  
ns  
ns  
ns  
ns  
μs  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Setup Lead Time  
tlead  
Setup Lag Time  
tlag  
Setup Time Before Read  
Access Time Before Write  
Chip Selection Inactive Time  
Delay Before Output Disabled  
Serial Clock Period  
tsu  
ta  
CSDO = 100 pF  
CSDO = 0 pF  
340  
tCSZN  
tdis  
2
100  
TSCLK  
tw(HI)  
tw(LO)  
th(SCLK)  
th(SDI)  
th(SDO)  
125  
50  
50  
300  
20  
0
Serial Clock Pulse Width, High  
Serial Clock Pulse Width, Low  
Serial Clock Hold Time  
Serial Data In Hold Time  
Serial Data Out Hold Time  
CSDO = 0 pF  
CSDO = 100 pF, VDD = 3 V  
120  
80  
Serial Data Out Time Before Valid  
State  
tvs  
CSDO = 100 pF, VDD = 4.75 V  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
7
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
Serial Peripheral Interface (SPI) Timing Diagram  
tCSZN  
CSZ  
TSCLK  
th(SCLK)  
tlag  
tlead  
tw(HI)  
tw(LO)  
SCLK  
SDO  
SDI  
tvs  
tdis  
ta  
th(SDO)  
HI-Z  
DON’T  
CARE  
D7  
D6  
D0  
th(SDI)  
tsu  
D7  
D6  
D0  
Fault System Block Diagram  
VBB  
Short to  
Battery  
Gx Off  
8 V  
FAULTZ  
RDx  
IDx  
Dx  
VCP  
Short to  
Ground  
Gx On  
Gx  
On  
RGx  
Gx  
Logic  
Gx  
On  
VDS  
Delay  
Gx  
Off  
Sport  
OSC  
Mask  
RGS  
IOL  
Clear  
Serial  
Sx  
VBB  
Read  
Port  
Open  
Load  
Write  
L
O
A
D
VOL  
Gx Off  
Vclamp  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
8
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
Input SettingsTiming Chart  
Timer is running for  
turn-on blank time  
Timer is running for  
turn-off blank time  
INx  
IGx  
tp(on)  
tp(off)  
Gate begins  
to charge  
VGS = VTH  
VGSx  
Set blank time to expire  
after VSx nears VBB  
Set blank time to expire  
after VSx nears 0 V  
VBB  
VSx  
Fault Logic Table  
Circled data cells indicate default settings, X indicates “don’t care”, Z indicates high impedance state  
Causes Effects  
Channel-Specific  
Mode of Operation  
Gates actively pulled low  
1
0
0
0
0
0
0
X
0
1
0
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
X
0
0
X
0
0
0
X
X
1
0
1
0
1
0
1
INx  
INx  
INx  
1
1
1
1
1
1
Normal operation  
FAULTZ issued but A3942 fully operational  
Normal operation, OL and STB masked  
1
1
1
X
X
X
0
0
0
0
0
0
0
0
1
0
1
0
1
0
0
X
0
0
X
X
X
0
0
0
0
0
0
1
1
1
1
1
1
STG cannot be masked  
STB  
OL  
1
1
0
X
X
X
0
1
X
1
0
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
0
0
0
0
0
Z
UV  
1
1
1
0
VCP UVLO disables outputs only  
VDD UVLO disables outputs only  
Sleep mode  
0
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
9
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
Serial Port Registers Description  
There are two 8-bit registers served by the serial port,  
the Input register and the Output Fault register. The  
structure of the registers is shown in the table at the  
bottom of this page. The function of each bit in the  
registers is described in this section.  
time for the VDS monitor, according to the following  
table:  
D2  
0
D1  
0
tON Selected  
tON(00)  
*
0
1
tON(01)  
tON(10)  
tON(11)  
Input Register  
1
0
1
1
D0 Gate On/Off Bit This bit is used to control the gate  
drive output. It is logically ORed with the signal on  
the discrete input pin, INx, corresponding to each of  
the four channels, according to the following table:  
*default state at device power-on  
D3 Clear Faults Bit This bit is used to clear a latched  
fault. After the fault is cleared, the gate output can  
again follow the input logic to determine if the fault is  
still present. Faults are cleared on a channel specific  
basis.  
ORed Settings  
Result on  
Gx Pin  
Bit D0  
Pin INx  
0
0
1
1
0
1
0
1
Off  
On  
On  
On  
D4 Mask Off-State Faults Bit [See asterisks (*) in  
the table below.] When the application requires that  
Short-to-Battery (STB) and Open Load (OL) faults be  
checked primarily before output is enabled for the first  
time, this bit can be used to allow STB and Open Load  
faults to be ignored during normal operation (Short-to-  
Ground faults can not be masked). This bit is applied  
D1, D2 Short-to-Ground (STG) Turn-On Blank Time  
MSB and LSB Bits The blank time, ton(xx), delay  
allows switching transients to settle before the A3942  
STG function checks for a short. For each individual  
channel, the combination of these bits sets the wait  
Serial Port Bit Definition All bits active high, except WriteZ  
Bits  
Register  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
Input Read  
Enable  
Mask  
Off-State Faults (*)  
STG Blank  
Time MSB  
STG Blank  
Time LSB  
Gate  
On/Off  
Input  
Address MSB Address LSB  
Clear Faults  
Charge Pump  
UVLO  
Thermal  
Warning  
Open Load  
Fault (*)  
Output Fault Address MSB Address LSB  
WriteZ  
STB Fault (*)  
STG Fault  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
10  
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
on a channel-specific basis, according to the following The A3942 enables monitoring for an STG fault after  
the MOSFET is turned on and the turn-on blank time,  
ON , expires. (The MOSFET is turned on via the Input  
table:  
t
Handling of  
D4 Setting  
register D0 bit, ORed with the INx discrete input pin  
for the channel of the MOSFET, and tON is set by  
Input register D1 and D2 bits). If the MOSFET gate-  
to-source voltage exceeds the VDS threshold, then  
Off-State Faults  
0
1
Registered  
Ignored  
D5 Read Enable Bit This bit enables or disables read- an STG fault will be registered for that channel, the  
MOSFET gate will be discharged, and the FAULTZ  
pin will be set low (active).  
ing on the serial inputs, according to the following  
table:  
An STG fault is latched until cleared (using the Input  
register D3 bit). In the meantime, the other channels  
can continue to operate normally.  
Handling of  
D5 Setting  
Serial Input  
0
1
Ignored  
Registered  
D1 Short to Battery (STB) Fault Bit When a chan-  
nel turns off, STB fault detection is blanked for tOFF  
.
D6, D7 Address MSB and LSB Bits (Input and Out-  
put Fault registers) For channel-specific bits, these  
bits are used to specify which channel is indicated.  
The channel-specific bits are:  
Subsequently, if the Sx pin voltage exceeds the VDS  
threshold voltage for that channel, an STB fault is  
latched. The output for that channel is disabled until  
the fault is either cleared (via the Input register D3 bit)  
or the off-state fault diagnostics are masked (via the  
Input register D4 bit).  
Register  
Input  
Channel-Specific Bits  
D0, D1, D2, D3, D4  
D0, D1, D2  
Output  
Because the output is disabled, there is no active  
pull-down during an STB event. Note that, in general,  
when the voltage on SX is high enough to trip the STB  
comparator, it also trips the OL comparator, and both  
the STB and the OL faults are latched.  
These bits determine the channel, according to the fol-  
lowing table:  
D7  
0
D6  
0
Channel Selected  
1
2
3
4
D2 Open Load (OL) Fault Bit When a channel turns  
off, the OL fault is blanked for tOFF. A small bias  
current, IOL, is sourced to the Sx pin of the channel.  
There it divides between RSx and the load. If the load  
is open, the Sx voltage will rise above the OL fault  
detection threshold. In that case, the output is disabled  
until the fault is cleared (via the Input register D3 bit)  
or the off-state fault diagnostics are masked (via the  
Input register D4 bit).  
0
1
1
0
1
1
Output FAULT Register  
D0 Short-to-Ground (STG) Fault Bit The voltage  
from drain to source for each MOSFET is monitored.  
An internal current source sinks IDx from the Dx pins  
to set the VDS threshold for each channel, the level at  
which an STG fault condition is evaluated.  
D3 Thermal Warning Bit A die temperature monitor  
is integrated on the A3942 chip. If the die temperature  
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IN1 through IN4 Discrete Inputs For each output  
channel, the gate pin, Gx, sources voltage when the  
corresponding INx pin is set high. Gx sinks voltage to  
ground when the corresponding INx pin is set low. The  
INx setting is logically ORed with the Gate On/Off bit  
(Input register bit D0) for the respective output.  
approaches the maximum allowable level, a thermal  
warning signal will be triggered.  
Note that this fault sets the FAULTZ pin low (active),  
but does not disable the outputs or operation of the  
chip.  
D4 Charge Pump UVLO Bit The charge pump must  
maintain a voltage guard band above VBB , in order  
to charge the gates when commanded to turn on the  
MOSFETs. If an undervoltage (UVLO) condition is  
detected on the charge pump, the FAULTZ pin will be  
set low (active), and all outputs will be disabled.  
D1 through D4 Output Drains For each output chan-  
nel, the voltage on the corresponding Dx pin is used  
to evaluate STB and STG fault conditions. The A3942  
compares the Dx voltage level to the VDS threshold of  
the MOSFET to determine if a fault condition exists.  
The trip voltage level is set by selecting an appropriate  
value for the resistor, RDx, connected to the corre-  
sponding current sink. Because both the Dx pins and  
RDx are high impedance, each RDx must be placed  
as close to the corresponding A3942 Dx pin as practi-  
cable.  
D5 WriteZ (Not Write) Bit In a written byte, D5 = 0.  
D6, D7 Address Bits See description, above.  
Pin Descriptions  
In this section, the functions of the individual termi-  
nals of the A3942 are described.  
G1 through G4 Output Gates These pins drive the  
gates of the high-side external MOSFETs. They source  
voltage from VCP and sink to GND. The correspond-  
ing external gate resistors, RGx, should be 2 kΩ  
for consistent switching times between A3942s when  
applicable (see IG(HI) and IG(LO) in the Electrical Char-  
acteristics table).  
VBB Supply Voltage (Power) The A3942 is fully  
operational over the specified range of VBB. The exter-  
nal MOSFETs must be supplied by the same voltage  
source as the A3942. A bypass capacitor should be  
placed as close as practicable to the A3942.  
VDD Supply Voltage (Logic) Logic voltage must be  
supplied to the A3942. The wide allowable range of  
input voltages allows both 3.3 V and 5 V supplies. A  
bypass capacitor should be placed as close as practi-  
cable to the A3942.  
If negative voltages are applied, Gx is clamped to  
GND by internal diodes. Back-to-back Zener diodes  
are internally connected between Gx and Sx.  
Sx Output Sources These are used to measure the  
source terminal of the external MOSFET. The pins  
may be tied directly to the MOSFET. Although the Sx  
pins can survive large negative transients, it is recom-  
mended to connect a clamp diode between the Sx pin  
and ground to limit any negative transients at the Sx  
pin when a load is switched off. This helps to avoid  
false fault detection caused by transient noise coupling  
into adjacent channels which may not be switching  
and therefore have no fault blanking during the tran-  
sient. This is especially recommended when there is  
significant wiring between the load and the Sx pin  
even if the load incorporates a recirculation diode.  
VCP Charge Pump The integrated charge pump is  
used to generate a supply above VBB to drive the gates  
of the external power MOSFETs. This tripler keeps the  
part functional over a wide range of VBB.  
CP1 through CP4 Charge Pump Capacitor Con-  
nections These are the connections for the two exter-  
nal capacitors that level-shift the charge up to VCP.  
VREG Internal Linear Voltage Regulator This pro-  
vides a connection for an external capacitor that sets  
the regulation value for voltage supplied to internal  
logic circuits.  
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RESETZ Master Reset and Sleep Mode Pulsing this be charged at typically 240μA until it reaches VREF  
.
pin low clears all latched faults in the channel-specific The time taken to charge the capacitor will be approxi-  
fault registers. It also clears the serial port registers  
(they return to their default values). When RESETZ is  
held low long enough (t > tSLEEP) the A3942 goes to  
sleep, as described in the Sleep topic in the Functional  
Description section.  
mately:  
tCHARGE = 5 × C  
where tCHARGE is in μs and C is the capacitor value  
in nF. At least twice this time should be allowed, after  
power-on or after coming out of sleep mode, before  
the A3942 is used to switch any loads.  
ENB Enable Set low to actively pull low all outputs.  
FAULTZ Fault Active low open drain output. Signals a  
fault. Allows parallel connection with FAULTZ sig-  
nals from other devices when required.  
GND Ground All GND pins are internally fused to  
the metal die pad to which the chip is soldered. This  
allows for high thermal conductance through the GND  
pins. Connecting to these pins to a PCB ground plane  
improves thermal performance.  
SCLK SPI Clock See Serial Port Operation topic in  
Functional Description section.  
CSZ SPI Chip Select input.  
Functional Description  
Power On When power is applied to either VDD or  
VBB, the Output Fault register is initially loaded with  
default values, all zeros (0). However, as individual  
internal circuits are initially powered on, they may  
latch spurious faults in the fault registers for each  
channel. Therefore, before operating the A3942 all  
fault registers must be cleared by pulsing the RESETZ  
pin.  
SDO SPI Data Output connection.  
SDI SPI Data Input connection.  
IREF Current Reference Defines the current used  
as a reference to set gate drive currents, diagnostic  
currents and internal timers. A resistor, RREF, con-  
nected between the IREF pin and the adjacent GND  
pin is selected to set the reference current to 20μA.  
The IREF pin is a voltage source at a voltage, VREF  
,
Sleep Mode This mode disables various internal cir-  
cuits including the charge pump, VREG, and the logic  
circuits. The serial port also is disabled. All Input and  
Output Fault register bits are cleared.  
of typically 1.2V. The resistor required is therefore  
60.4kOhm, which is the standard resistor value that  
provides a typical current closest to the 20μA target.  
Any variation in RREF will affect the internal settings  
as described in the section below on RREF selection.  
Being a high impedance node, the IREF pin is suscep-  
tible to external sources of noise and transients and  
should be decoupled with a capacitor across RREF  
between the IREF pin and the adjacent GND pin. The  
capacitor value should be less than 100pF to avoid  
any delay when power is first applied to the A3942  
or when coming out of sleep mode. When control-  
ling large load currents a larger capacitor may be  
required to suppress any transient noise. At power-on  
or when coming out of sleep mode this capacitor will  
To leave sleep mode, pull RESETZ high and then  
allow a delay for the charge pump to stabilize. Before  
sending commands, clear any spurious faults as  
described in the Power On topic.  
Faults Faults are categorized either as system faults or  
load faults. All faults are ORed to the FAULTZ pin.  
System faults are VREG UVLO, CP UVLO, VDD  
UVLO, and Thermal Warning. They are not latched in  
the channel-specific self-protection circuit fault reg-  
isters, however, the flags in the Output Fault register  
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bits D3, D4, and D5, are latched. If the fault condition Daisy Chain Connection The master shifts n bytes  
(eight bits each) during n × 8 clock cycles. Regard-  
less of the position of an individual A3942 slave  
in the daisy chain, the slaves shift the output byte  
during the first eight clock cycles after CSZ goes  
low. When CSZ goes high, the eight bits in the Shift  
register are latched into the Input register.  
is resolved, these flags are latched until they are read,  
at which time they are cleared.  
Load faults are OL, STB, and STG. They are latched  
into the channel-specific self-protection circuit fault  
registers, and shifted into Output Fault register bits  
D0, D1, and D2 when called. Thus, load faults may be  
masked or cleared on a channel-specific basis.  
Serial Port Disabling Disable the serial port by set-  
ting the CSZ pin high while in sleep mode. This loads  
the Input register with default values, all zeroes (0).  
Serial Port Operation  
The serial port is compatible with the full duplex  
Serial Peripheral Interface (SPI) conventions. The  
inputs to the SPI port are logically ORed with the  
discrete input pins, INx, settings. This allows indepen-  
dent operation using only the discrete inputs, only the  
serial inputs, or both. Timing is clocked by an on-  
board 4 MHz oscillator.  
Serial Port Error Handling Input data is discarded if  
the number of bits in an input stream are not a mul-  
tiple of eight. Furthermore, unless the number of clock  
cycles is a multiple of eight while CSZ is active, any  
bits shifted in from the SDI pin are discarded.  
Input Register Operation After a valid byte is  
latched into the Input register from the shift register,  
bit D5 is evaluated to determine if the byte is to be  
read. An inactive (0) bit value causes all other bits to  
be ignored.  
When a Chip Select event occurs, the Output Fault  
register loads one eight-bit byte into the shift register,  
and the byte is then shifted out through the SDO pin.  
Simultaneously, bits at the SDI pin are shifted into the  
shift register (full duplex). At the end of a Chip Select  
event, the shift register contents are latched into the  
Input register.  
If bit D5 is active (1) the other bits are read and  
decoded. Bits D6 and D7 are used to determine which  
output channel is updated. Bits D0 through D4 set  
the channel-specific operation, including clearing and  
masking of faults.  
Alternative Configurations Multiple A3942s can be  
configured together.  
Output Fault Register Operation This register is  
loaded with fault data to be shifted out through the  
SDO pin. No handshaking is required.  
Standalone Connection In this configuration, the  
master simultaneously shifts eight bits in through  
the SDI pin and shifts eight bits out of the SDO pin.  
First, the CSZ pin is set low. Then, the Output Fault  
register is loaded with the relevant fault byte (see  
the Output Fault Register topic below). Eight clock  
cycles are used to perform the shifts.  
The Output Fault register contains data on active  
faults. Four internal channel-specific fault registers  
contain any latched fault data for each respective  
channel. The following describes how the A3942  
determines which channel-specific fault register to  
transfer into the Output Fault register.  
Parallel Connection Because each slave has a CSZ  
pin, operation is identical to the Standalone configu-  
ration. When CSZ is inactive, SDI is “don’t care” and  
SDO is high impedance.  
No Faults If there are no current faults, the Output  
Fault register is loaded with all zeros:  
0 0 0 0 0 0 0 0  
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Single Fault If there is only one fault detected, the  
Output Fault register is filled to indicate that fault.  
and the second CSZ writes:  
1 1 0 0 0 0 0 1  
For a load fault, the Address bits are set to indicate  
the affected channel; for example, a short-to-battery  
on channel 3 would be written:  
In summary, all faults are retrieved by issuing con-  
secutive CSZ events until the channel number stops  
increasing.  
1 0 0 0 0 0 1 0  
• If there are no faults, this byte will be shifted out  
each time:  
On the other hand, for system faults, the Address bits  
are irrelevant, and a CP UVLO fault would be loaded  
as:  
0 0 0 0 0 0 0 0  
• If there are only system faults, this byte will be  
shifted out each time:  
0 0 0 1 0 0 0 0  
with the Address bits defaulting to 0 0.  
0 0 [1|0] [1|0] [1|0] 0 0 0  
Multiple System Faults If there are multiple system  
faults, the Output Fault register is loaded with the  
setting for each system fault (the Address bits re-  
main irrelevant, as in the case of a single fault). For  
example, when CP UVLO and Thermal Warning  
faults both have occurred, the Output Fault register is  
loaded with:  
• If there are system faults and only one load fault, one  
byte contains all of the fault data.  
• If there are load faults on more than one channel,  
these bytes would be shifted out in succession, and  
any existing system faults will be indicated. For ex-  
ample, if there were no system faults and load faults  
on channels 2, 3, and 4, the following series of bytes  
would be shifted out:  
0 0 0 1 1 0 0 0  
Multiple System Faults and Single Channel Load  
Fault If one or more system faults and one or more  
load faults from a single channel have occurred, all  
faults are loaded into the Output Fault register, with  
the channel of the load faults indicated in the Address  
bits. For example, a CP UVLO system fault and an  
STG load fault on Channel 2 would be written as:  
0 1 0 0 0 [1|0] [1|0] [1|0]  
1 0 0 0 0 [1|0] [1|0] [1|0]  
1 1 0 0 0 [1|0] [1|0] [1|0]  
0 1 0 0 0 [1|0] [1|0] [1|0]  
. . .  
Applications  
0 1 0 1 0 0 0 1  
Unused Outputs When any of the four output chan-  
nels are not used, the related pins should be connected  
as follows:  
Multiple Channel Load Faults When load faults  
occur on more than one channel, the data cannot be  
signalled in a single SDO byte. However, the data  
can still be retrieved. The A3942 polls each channel-  
specific fault register, in ascending order by channel  
number.  
Unused Channel Pin  
Connection  
GND  
INx  
Sx  
GND  
Dx  
Gx  
VBB  
Each output is delimited by the appropriate CSZ  
event. For example, assume an OL on channel 2 and  
an STG on Channel 4. The first CSZ event writes:  
Floating  
RREF Selection The tolerance on RREF can be  
0 1 0 0 0 1 0 0  
as high as ±4%. Depending on how a specific part  
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changes over temperature changes and lifetime, the  
±4% range generally covers nominal 1% resistors.  
low VBB levels, the only repercussion is a nuisance  
STB fault, and this only occurs when an OL condi-  
tion exists. The limit on VDx can be ignored either if  
the off-state faults are masked or if it is acceptable to  
latch the nuisance fault and clear it when the OL fault  
is cleared.  
The parameters which are affected by changes in  
RREF are listed in the following table:  
Change as RREF Tolerance  
Parameter  
Increases  
Decreases  
Because VOS << VOL , a fault is registered if  
IREF  
tRESET  
+
+
+
+
+
+
+
IOL × RL // RGS > VOL  
.
tSLEEP  
Hence, the trip level, RL(trip) is:  
tWAKE  
1  
1
I
OL  
IG(HI) and IG(LO)  
IOL  
R (trip)  
=
L
VOL RGS  
tON and tOFF  
The OL circuit and its tolerances are designed to  
ensure that external loads above 50 kΩ are identified  
as open load and that loads below 10 kΩ are identified  
as valid. Note that these numbers are valid in steady  
state. As a result, blanking times must be set appropri-  
ately for a given load.  
Setting Fault Circuit Trip Levels The load faults,  
Short-to-Battery (STB), Short-to-Ground (STG), and  
Open Load (OL), are all latched. The thresholds for  
STG and OL faults can be set by the value for the RDx  
resistor.  
Under normal conditions, when the external MOSFET  
is off, and the load is in circuit,  
Open Load Fault Level When the gate is commanded  
off, a commanded current, IOL, is sourced to Sx to  
detect if the load is still in the circuit. VOL is compared  
to  
IOL × RL < VOL.  
Short-to-Battery Fault Level The STB comparator  
compares the load voltage  
IOL × [RL // RGS]  
IOL × RL // RGS]  
to evaluate an OL fault.  
to the voltage set by RDx,  
If the load has been removed, VSx exceeds VOL and  
a fault is registered. VSx would drift to VBB when an  
open load exists and thereby inadvertantly trip a nui-  
sance STB fault. To prevent this, the Sx pin is clamped  
V
BB ID × RD .  
The comparator is active only when the gate is com-  
manded off.  
to VCLAMP  
.
During an STB condition, IOL = 0 because the current  
source has run out of headroom. A fault is registered  
when  
The operating limits specified in the Electrical Char-  
acteristics table allow the fault circuitry to distinguish  
all faults within the operating range of VBB. If, how-  
ever, the specified limits on VDx are too restrictive at  
VL > VBB ID × RD ± VOS.  
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Power Limits  
That is, the load voltage is within V = ID × RD volts  
of VBB.  
Power dissipation, PD, is limited by thermal con-  
straints. The maximum junction temperature, TJ(max),  
and the thermal resistance, RθJA, are given in this  
datasheet. The maximum allowed power is then found  
for a given ambient, TA, from this equation:  
Using VDS = VBB – VL and rearranging, we find that  
VDS < ID × RD ± VOS .  
Therefore,  
RD = (VDS(trip) ±VOS) / ID ,  
TJ = PD × RθJA + TA , or  
PD = (TJ TA) / RθJA  
.
which is also the case for STG faults, described below.  
Note that an STB condition generally latches the OL  
flag as well.  
The three main contributions to power dissipation are:  
• quiescent supply, PBB(Q)  
• driver outputs, PDRV , and  
Under normal conditions RL << RGS and IOL flows  
through the load, given  
• logic level supply, PDD  
.
IOL × (RD + RL ) < VBB ID × RD ± VOS .  
These three terms appear in the following equation:  
Because IOL × (RD + RL ) 0 when the external  
MOSFET is off, no fault is registered.  
PD = PBB(Q) + PDRV + PDD  
.
The quiescent supply current leads to a baseline power  
loss:  
Short-to-Ground Fault Level The effect of the STG  
comparator is to compare the external MOSFET VDS  
(VL) to the set trip voltage VBB ID × RD .  
PBB(Q) = VBB × IBB(Q)  
.
The comparator is active only when the gate is com-  
manded on. Also, the sourced current IOL is deacti-  
vated.  
In general, the losses in a driver can be quantified as  
follows. Given that the driver current leaves Gx to  
charge a gate, and assuming that the external circuit  
is approximately lossless, then the same charge is  
sunk back into Gx. Therefore, all driver current can be  
treated as going to heat the chip.  
If VDS is too large, an STG fault is registered when  
VL < VBB ID × RD ± VOS  
,
or, because the external MOSFET VDS = VBB VL,  
VDS > ID × RD ± VOS .  
Total current into VBB includes the quiescent current,  
IBB(Q) , plus additional current, IBB, to energize the  
gates. The latter is three times the average gate cur-  
rent:  
Therefore, the STG trip level in the on state is the  
same as the STB level in the off state:  
RD = (VDS(trip) ±VOS) / ID .  
Converse to the preceding, in normal operation  
VL > VBB ID × RD ± VOS,  
or  
IBB = 3 × IGx(av).  
The average load current is calculated using the gate  
charge, QG , from the external MOSFET datasheet and  
the switching frequency:  
VDS < ID × RD ± VOS .  
IGx(av) = fsw × QG .  
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If all four outputs are supplying this current,  
IBB = 4 (3 × IGx) = 12 × fSW × QG,  
and  
• Use both bulk storage capacitors (for example, elec-  
trolytic) and low impedance bypass capacitors (for  
example, ceramic) on all supply pins. See the Func-  
tional Block Diagram for recommended values.  
P
DRV = VBB × IBB = 12 × fSW × QG × VBB  
Finally, loss in the logic circuits is  
DD = VDD × IDD.  
.
• Input and output lines should not be in close proxim-  
ity. If they do overlap, it should be at right angles.  
• Use ample copper in the ground and power paths.  
Use planes or fills where possible.  
P
Example:  
• The A3942 ground and VBB supply should be star-  
connected to the power ground and supply.  
Find the junction temperature with one IRFZ44ES  
MOSFET at each output, being switched at 5 kHz, and  
given VBB = 14 V and VDD = 5.5 V.  
• The trace connecting the RDx resistors to the A3942  
Dx pins should be as short as possible.  
Answer: The IRFZ44ES datasheet gives QG(max)  
= 60 nC (note that this parameter depends on circuit  
design constraints, such as VDS). The Electrical Char-  
acteristics table gives the following maximum values  
for the A3942: IBB(Q) = 10 mA, VDD = 5.5 V, and IDD  
= 3 mA.  
• The trace leaving the other side of the RDx resistors  
can be long because it has a low impedance path to  
ground; however, it must run independently to the re-  
spective external MOSFET in order to make a Kelvin  
connection.  
• All support capacitors are to be referenced to the  
A3942 ground plane or ground fill. Minimize loop  
area of traces.  
First, calculate total power loss:  
PD = VBB IBB(Q) + 12 fswQGVBB+VDD DD  
= 14 V × 11 mA  
+ 4 × 3 × 5 kHz ×60 nC × 14 V  
+ 5.5 V × 3 mA  
= 221 mW .  
I
• These traces should be as wide as practicable: VBB,  
VDD, VREG, VCP, and Gx. Secondarily, it is also  
preferred that the traces to the charge pump caps be  
as wide as practicable. In both cases, the number of  
vias should be minimized.  
Then, the junction temperature can be found for a  
given ambient temperature; TA = 125°C is assumed  
here. Thermal resistance depends significantly on the  
board design; RθJA = 100 °C/W is assumed here. Sub-  
stituting these values:  
• Minimize the distance connecting to ground pins in  
order to minimize ground loops.  
TJ = PD × RθJA + TA  
= 221 mW × 100 °C/W + 125°C  
= 147°C .  
Finally, a note about thermals. Because the A3942  
ground pins are internally fused to the die mounting  
pad, they are the main path for heat dissipation. In  
applications producing high junction temperatures,  
care must be given to designing the thermal path. For  
example, multiple thermal vias should be run from  
ground pins down to the ground plane. If space allows,  
wide traces from ground pins to exposed copper fills  
on the top layer efficiently release heat through con-  
vection cooling.  
LAYOUT AND COMPONENTS  
General good practices should be followed. In addi-  
tion, the following are recommended:  
• Locate bypass capacitors (VBB, VDD, VREG, and  
IREF) as close to the A3942 as practicable.  
• Traces to bypass capacitors should be as wide as  
practicable; minimize the number of vias.  
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Terminal List  
No.  
Name  
Pin Description  
1
SDO  
Serial Data Out  
Serial Data In  
Serial Clock  
2
SDI  
3
SCLK  
CSZ  
4
Chip Select – NOT  
Fault – NOT (Open Drain)  
5
FAULTZ  
6
RESETZ Reset – NOT (Discrete)  
7
ENB  
VDD  
IREF  
GND  
IN2  
Enable (Discrete)  
Logic Supply  
8
9
Current Reference Pin  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
Discrete Input Channel 2  
Discrete Input Channel 1  
Channel 2: Drain  
IN1  
D2  
D1  
Channel 1: Drain  
GND  
S1  
Channel 1: Source  
Channel 1: Gate  
Channel 2: Gate  
Channel 2: Source  
Channel 3: Source  
Channel 3: Gate  
Channel 4: Gate  
Channel 4: Source  
G1  
G2  
S2  
S3  
G3  
G4  
S4  
GND  
D3  
Channel 3: Drain  
D4  
Channel 4: Drain  
IN3  
Discrete Input Channel 3  
Discrete Input Channel 4  
Internal Regulator  
Power Supply  
IN4  
VREG  
VBB  
GND  
VCP  
CP1  
CP3  
CP2  
CP4  
GND  
GND  
Reservoir Capacitor Terminal  
Charge Pump Capacitor Terminal  
Charge Pump Capacitor Terminal  
Charge Pump Capacitor Terminal  
Charge Pump Capacitor Terminal  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
19  
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  
Quad High-Side Gate Driver  
for Automotive Applications  
A3942  
LG Package, 38-Pin TSSOP  
1.60  
38  
9.70 ±0.10  
0.50  
4º  
0.30  
38  
+0.06  
–0.05  
0.15  
4.40 ±0.10  
6.40 ±0.20  
6.00  
A
1
2
1
2
0.25  
B
PCB Layout Reference View  
SEATING PLANE  
GAUGE PLANE  
38X  
C
All dimensions nominal, not for tooling use  
(reference JEDEC MO-153 BD-1)  
Dimensions in millimeters  
SEATING  
PLANE  
0.10  
C
Pins 10, 15, 24, 31, 37, and 38 fused internally  
0.22 ±0.05  
0.50  
1.20 MAX  
0.10 ±0.05  
A
B
Terminal #1 mark area  
Reference pad layout (reference IPC SOP50P640X110-38M)  
All pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary  
to meet application process requirements and PCB layout tolerances  
Copyright ©2008-2010, Allegro MicroSystems, Inc.  
The products described here are manufactured under one or more U.S. patents or U.S. patents pending.  
Allegro MicroSystems, Inc. reserves the right to make, from time to time, such departures from the detail specifications as may be required to per-  
mit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the  
information being relied upon is current.  
Allegro’s products are not to be used in life support devices or systems, if a failure of an Allegro product can reasonably be expected to cause the  
failure of that life support device or system, or to affect the safety or effectiveness of that device or system.  
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, Inc. assumes no responsibility for its use;  
nor for any infringement of patents or other rights of third parties which may result from its use.  
For the latest version of this document, visit our website:  
www.allegromicro.com  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff  
20  
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  

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