ACS772ECB-250U-PSF-T [ALLEGRO]
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 μΩ Current Conductor;
| 型号： | ACS772ECB-250U-PSF-T |
| 厂家： | 
ALLEGRO MICROSYSTEMS |
| 描述： | High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 μΩ Current Conductor |
| 文件： | 总41页 (文件大小：2982K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
ACS772
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
DESCRIPTION
FEATURES AND BENEFITS
• AEC-Q100 Grade 1 qualified
The Allegro™ ACS772 family of current sensor ICs provide
economicalandprecisesolutionsforACorDCcurrentsensing,
idealformotorcontrol,loaddetectionandmanagement,power
supply and DC-to-DC converter control, and inverter control.
The 2.5 µs response time enables overcurrent fault detection
in safety-critical applications.
• Typical of 2.5 μs output response time
• 5 V supply operation
• Ultra-low power loss: 100 μΩ internal conductor resistance
• Reinforced galvanic isolation allows use in economical,
high-side current sensing in high-voltage systems
• 4800 Vrms dielectric strength certified under UL60950-1
• Industry-leading noise performance with greatly
improved bandwidth through proprietary amplifier and
filter design techniques
• Integrated shield greatly reduces capacitive coupling
from current conductor to die due to high dV/dt signals,
and prevents offset drift in high-side, high-voltage
applications
• Greatly improved total output error through digitally
programmed and compensated gain and offset over the
full operating temperature range
• Small package size, with easy mounting capability
• Monolithic Hall IC for high reliability
• Output voltage proportional to AC or DC currents
• Factory-trimmed for accuracy
The device consists of a precision, low-offset linear Hall
circuit with a copper conduction path located near the die.
Applied current flowing through this copper conduction path
generates a magnetic field which the Hall IC converts into a
proportionalvoltage.Deviceaccuracyisoptimizedthroughthe
close proximity of the magnetic signal to the Hall transducer.
A precise, proportional output voltage is provided by the
low-offset, chopper-stabilized BiCMOS Hall IC, which is
programmed for accuracy at the factory. Proprietary digital
temperature compensation technology greatly improves the
IC accuracy and temperature stability.
High-level immunity to current conductor dV/dt and stray
electricfieldsisofferedbyAllegroproprietaryintegratedshield
technology for low output voltage ripple and low offset drift
in high-side, high-voltage applications.
• Extremely stable output offset voltage
The output of the device increases when an increasing current
flows through the primary copper conduction path (from
terminal 4 to terminal 5), which is the path used for current
sampling. The internal resistance of this conductive path is
100 μΩ typical, providing low power loss.
CB Certificate Number:
US-29755-UL
PACKAGE: 5-pin package (suffix CB)
The thickness of the copper conductor allows survival of the
device at high overcurrent conditions. The terminals of the
conductive path are electrically isolated from the signal leads
(pins1through3).ThisallowstheACS772familyofsensorICs
to be used in applications requiring electrical isolation without
the use of opto-isolators or other costly isolation techniques.
PFF
PSS
Leadform
Leadform
Leadform
Continued on the next page…
Not to scale
5 ꢀ
1
5
4
ꢀCC
ꢂP–
ꢂPꢃ
CBꢁP
0.1 µF
Application 1: the ACS772 outputs an analog
signal, VOUT, that varies linearly with the
bidirectional AC or DC primary sensed cur-
rent, IP, within the range specified. RF and
CF are for optimal noise management, with
values that depend on the application.
ACS772
2
3
ꢂP
GꢄD
CF
ꢀꢂOUT
ꢀOUT
RF
Typical Application
ACS772-DS, Rev. 8
MCO-0000363
March 14, 2019
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
DESCRIPTION (continued)
The device is fully calibrated prior to shipment from the factory. matte tin, and there is no Pb inside the package. The heavy gauge
TheACS772 family is lead (Pb) free.All leads are plated with 100% leadframe is made of oxygen-free copper.
SELECTION GUIDE
Package
Sensitivity
Sens (Typ.)
(mV/A) [2]
Primary Sampled
Current , IP
(A)
[3]
Nominal TA
(°C)
Part Number [1]
Packing [4]
Terminals Signal Pins
ACS772LCB-050U-PFF-T
ACS772LCB-050B-PFF-T
ACS772LCB-050B-PSS-T
ACS772LCB-100U-PFF-T
ACS772LCB-100B-PFF-T
ACS772KCB-150U-PFF-T
ACS772KCB-150B-PFF-T
ACS772ECB-200U-PFF-T
ACS772ECB-200B-PFF-T
ACS772ECB-250U-PFF-T
ACS772ECB-250U-PSF-T
ACS772ECB-250B-PFF-T
ACS772ECB-250B-PSF-T
ACS772ECB-300B-PFF-T
ACS772ECB-400B-PFF-T
Formed
Formed
Straight
Formed
Formed
Formed
Formed
Formed
Formed
Formed
Straight
Formed
Straight
Formed
Formed
Formed
Formed
Straight
Formed
Formed
Formed
Formed
Formed
Formed
Formed
Formed
Formed
Formed
Formed
Formed
50
80
±50
40
–40 to 150
–40 to 125
100
±100
150
40
20
26.66
13.33
20
±150
200
34 pieces
per tube
±200
10
250
16
8
–40 to 85
±250
±300
±400
6.66
5
[1] Additional leadform and Sensitivity options available for qualified volumes.
[2] Measured at VCC = 5 V.
[3] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded.
See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information.
[4] Contact Allegro for additional packing options.
ACS
772
L
CB
- 050 B - PFF - T
Lead (Pb) Free
Lead Form
Output Directionality:
B – Bidirectional (positive and negative current)
U – Unidirectional (only positive current)
Current Sensing Range (A)
Package Designator
Operating Temperature Range
3 Digit Part Number
Allegro Current Sensor
2
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
ABSOLUTE MAXIMUM RATINGS
Characteristic
Symbol
VCC
Notes
Rating
6.5
Unit
V
Supply Voltage
Reverse Supply Voltage
Output Voltage
VRCC
–0.5
V
VIOUT
6.5
V
Reverse Output Voltage
Output Source Current
Output Sink Current
VRIOUT
IOUT(Source)
IOUT(Sink)
TA
–0.5
V
VIOUT to GND
3
mA
mA
°C
°C
°C
Minimum pull-up resistor of 500 Ω from VCC to VIOUT
Range E, K, and L
10
Operating Ambient Temperature [1]
Maximum Junction Temperature
Storage Temperature
–40 to 150
165
TJ(max)
Tstg
–65 to 165
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Thermal
Application section of this datasheet for more information.
ISOLATION CHARACTERISTICS
Characteristic
Symbol
Notes
Rating
Unit
Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5
1.2 µs (rise) / 50 µs (width)
Dielectric Surge Strength Test Voltage
VSURGE
8000
V
Agency type-tested for 60 seconds per UL standard
60950-1, 2nd Edition. Tested at 3000 VRMS for 1 second
in production.
Dielectric Strength Test Voltage [2]
VISO
4800
VRMS
990
700
636
450
VPK or VDC
VRMS
For basic (single) isolation per UL standard 60950-1, 2nd
Edition
Working Voltage for Basic Isolation
VWVBI
VPK or VDC
VRMS
For reinforced (double) isolation per UL standard 60950-1,
2nd Edition
Working Voltage for Reinforced Isolation
VWFRI
[2] Allegro does not conduct 60-second testing. It is done only during the UL certification process.
THERMAL CHARACTERISTICS: May require derating at maximum conditions
Characteristic
Symbol
Test Conditions [3]
Value
Unit
Mounted on the Allegro evaluation board with 2800 mm2
(1400 mm2 on component side and 1400 mm2 on opposite
side) of 4 oz. copper connected to the primary leadframe
and with thermal vias connecting the copper layers.
Performance is based on current flowing through the
primary leadframe and includes the power consumed by
the PCB.
Package Thermal Resistance
RθJA
7
°C/W
[3] Additional thermal information available on the Allegro website.
TYPICAL OVERCURRENT CAPABILITIES [4][5]
Characteristic
Symbol
Notes
Rating
Unit
TA = 25°C; current is on for 1 second and off for
99 seconds, 100 pulses applied
1200
A
TA = 85°C; current is on for 1 second and off for
99 seconds, 100 pulses applied
Overcurrent
IPOC
900
600
A
A
TA = 150°C; current is on for 1 second and off for
99 seconds, 100 pulses applied
[4] Test was done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only.
[5] For more overcurrent profiles, please see FAQ on the Allegro website, www.allegromicro.com.
3
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
IP+
VCC
To all subcircuits
CBYPASS
Programming
Control
Charge Pump Pulse
Generator
Undervoltage
Detection
Temperature
Sensor
EEPROM and
Control Logic
Active Temperature
Compensation
Sensitivity Control
Offset Control
Output Clamps
VIOUT
CL
Signal Recovery
IP–
GND
Functional Block Diagram
Terminal List Table
5
ꢈ
ꢀPꢁ
ꢀPꢂ
ꢃCC
ꢄNꢅ
1
ꢉ
3
Number
Name
VCC
GND
VIOUT
IP+
Description
1
2
3
4
5
Device power supply terminal
ꢃꢀꢆUꢇ
Signal ground terminal
Analog output signal
Pinout Diagram
Terminal for current being sampled
Terminal for current being sampled
IP–
4
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
COMMON OPERATING CHARACTERISTICS: Valid at TA = –40°C to 150°C, CBYP = 0.1 µF, and VCC = 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
ELECTRICAL CHARACTERISTICS
Supply Voltage
VCC
ICC
4.5
–
5
10
64
4
5.5
15
–
V
mA
µs
V
Supply Current
VCC = 5 V, no load on output
Power-On Delay
tPOD
TA = 25°C
–
VUVLOH
VUVLOL
VCC rising at 1 V/ms and device functions enabled
VCC falling at 1 V/ms and device functions enabled
–
–
Undervoltage Lockout (UVLO)
Threshold[1]
–
3.5
–
–
V
UVLO Hysteresis
VHYS(UVLO)
250
–
mV
Time measured from falling VCC < VUVLOH to UVLO
enabled
tUVLOE
–
–
64
7
–
–
µs
µs
UVLO Enable/Disable Delay
Time [1]
Time measured from rising VCC > VUVLOH to UVLO
disabled
tUVLOD
VPORH
VPORL
VCC rising at 1 V/ms
VCC falling at 1 V/ms
–
–
2.9
2.5
–
–
–
–
–
V
V
Power-On Reset Voltage
POR Hysteresis
VHYS(POR)
BWi
250
–
mV
kHz
Internal Bandwidth
Small signal –3 dB, CL = 0.47 nF
200
IP step = 50% of IP+, 10% to 90% rise time, TA = 25°C,
COUT = 470 pF
Rise Time
tr
–
–
–
2.4
1.2
2.5
–
–
–
µs
µs
µs
Propagation Delay Time
Response Time
tPROP
TA = 25°C, CL = 470 pF, IP step = 50% of IP+
TA = 25°C, CL = 470 pF, IP step = 50% of IP+,
90% input to 90% output
tRESPONSE
DC Output Impedance
ROUT
TA = 25°C
–
3.3
–
–
–
Ω
kΩ
nF
µΩ
V
Output Load Resistance
Output Load Capacitance
Primary Conductor Resistance
RLOAD(MIN)
CLOAD(MAX)
RPRIMARY
VSAT(HIGH)
VSAT(LOW)
VIOUT to GND, VIOUT to VCC
VIOUT to GND
4.7
–
1
10
–
TA = 25°C
–
VCC – 0.2
–
100
–
TA = 25°C, RL(PULLDWN) = 10 kΩ to GND
TA = 25°C, RL(PULLUP) = 10 kΩ to VCC
–
Output Saturation Voltage
–
200
mV
ERROR COMPONENTS
QVO Ratiometry Error [2]
Sens Ratiometry Error [2]
RatERRQVO
RatERRSens
VCC = 4.75 to 5.25 V
–
–
±0.15
±0.3
0.15
85
–
–
%
%
VCC = 4.75 to 5.25 V
Input referenced noise density; TA = 25°C, CL = 1 nF
Input referenced noise at 200 kHz; TA = 25°C, CL = 1 nF
Up to full scale of IP
–
–
mA/ √¯(Hz)
mARMS
%
Noise
IN
–
–
Nonlinearity [2]
Symmetry [2]
ELIN
–0.9
–0.8
±0.5
±0.4
0.9
0.8
ESYM
Over half-scale IP
%
[1] UVLO feature is only available on part numbers programmed to work at VCC = 5 V.
[2] See Characteristic Definitions section of this datasheet.
5
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X050U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
0
–
–
–
50
–
A
mV/A
V
80 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
Zero Current Output Voltage
VIOUT(Q)
Unidirectional; IP = 0 A
VCC / 10
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
20.4
3.4
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.7
±0.8
±1.7
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
250
1.5
3.5
Magnetic Offset Error
Total Output Error
120
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
6
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X050B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–50
–
–
50
–
A
mV/A
V
40 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
–
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
20.4
3.4
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.7
±0.8
±1.7
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
250
1.5
3.5
Magnetic Offset Error
Total Output Error
210
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
7
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X100U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
0
–
–
–
100
–
A
mV/A
V
40 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
Zero Current Output Voltage
VIOUT(Q)
Unidirectional; IP = 0 A
VCC / 10
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
20.4
3.4
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.7
±0.8
±1.7
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
400
1.5
3.5
Magnetic Offset Error
Total Output Error
280
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
8
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X100B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–100
–
100
–
A
mV/A
V
20 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
–
–
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
20.4
3.4
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.7
±0.8
±1.7
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
400
1.5
3.5
Magnetic Offset Error
Total Output Error
175
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
9
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X150U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
0
–
–
–
150
–
A
mV/A
V
26.66 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
Zero Current Output Voltage
VIOUT(Q)
Unidirectional; IP = 0 A
VCC / 10
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
20.4
3.4
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.7
±0.8
±1.7
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
400
1.5
3.5
Magnetic Offset Error
Total Output Error
280
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
10
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X150B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–150
–
150
–
A
mV/A
V
13.33 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
–
–
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
7.2
1.2
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.7
±0.8
±1.7
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
400
1.5
3.5
Magnetic Offset Error
Total Output Error
280
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
11
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X200U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
0
–
–
–
200
–
A
mV/A
V
20 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
Zero Current Output Voltage
VIOUT(Q)
Unidirectional; IP = 0 A
VCC / 10
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
7.2
1.2
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
±0.5
±0.7
±1.5
±4
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–20
–20
–
±6
20
20
400
1.5
3.5
±6
Magnetic Offset Error
Total Output Error
160
±0.9
±1.7
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
12
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X200B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–200
–
200
–
A
mV/A
V
10 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
–
–
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
5.1
0.85
±0.5
±0.7
±1.5
±4
–
–
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
Full scale of IP, TA = 25°C
–1
1
Sensitivity Error
ESens
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
IP = 0 A, TA = 25°C
–1.25
–3.5
–8
1.25
3.5
8
%
%
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
mV
mV
mV
mA
%
Electrical Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
Full scale of IP, TA = 25°C to 150°C
Full scale of IP, TA = –40°C to 25°C
–8
±4
8
–20
–
±6
20
400
1.5
3.5
Magnetic Offset Error
Total Output Error
380
±0.7
±1.5
ETOT(HT)
ETOT(LT)
–1.5
–3.5
%
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
13
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X250U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
0
–
–
–
250
–
A
mV/A
V
16 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
Zero Current Output Voltage
VIOUT(Q)
Unidirectional; IP = 0 A
VCC / 10
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
5.1
–
–
1
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
0.85
±0.7
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
–3.5
±0.8
±1.7
1.25
3.5
%
%
Sensitivity Error
ESens
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
IP = 0 A, TA = 25°C
–8
–8
–20
–
±4
±4
8
8
mV
mV
mV
mA
Electrical Offset Error
Magnetic Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
±6
20
400
200
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
ETOT(HT)
–1.5
–3.5
±0.9
±1.7
1.5
3.5
%
%
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT)
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
14
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X250B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–250
–
250
–
A
mV/A
V
8 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
–
–
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
5.1
–
–
1
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
0.85
±0.7
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
–3.5
±0.8
±1.7
1.25
3.5
%
%
Sensitivity Error
ESens
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
IP = 0 A, TA = 25°C
–8
–8
–20
–
±4
±4
8
8
mV
mV
mV
mA
Electrical Offset Error
Magnetic Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
±6
20
400
175
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
ETOT(HT)
–1.5
–3.5
±0.9
±1.7
1.5
3.5
%
%
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT)
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
15
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X300B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–300
–
300
–
A
mV/A
V
6.66 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
–
–
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
5.1
–
–
1
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
0.85
±0.7
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
–3.5
±0.8
±1.7
1.25
3.5
%
%
Sensitivity Error
ESens
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
IP = 0 A, TA = 25°C
–8
–8
–20
–
±4
±4
8
8
mV
mV
mV
mA
Electrical Offset Error
Magnetic Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
±6
20
400
175
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
ETOT(HT)
–1.5
–3.5
±0.9
±1.7
1.5
3.5
%
%
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT)
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
16
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
X400B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC= 5 V, unless otherwise specified
Characteristic
NOMINAL PERFORMANCE
Current Sensing Range
Symbol
Test Conditions
Min.
Typ. [2]
Max.
Unit
IPR
–400
–
400
–
A
mV/A
V
5 ×
VCC / 5
Sensitivity
Sens
IPR(min) < IP < IPR(max)
–
–
Zero Current Output Voltage
VIOUT(Q)
Bidirectional; IP = 0 A
VCC / 2
–
ACCURACY PERFORMANCE
TA = 25°C, CL = 1 nF
–
–
5.1
–
–
1
mVp-p
mVRMS
%
Noise
VN
TA = 25°C, CL = 1 nF
0.85
±0.7
IP = 200 A, not tested at full scale IP; TA = 25°C
–1
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
–1.25
–3.5
±0.8
±1.7
1.25
3.5
%
%
Sensitivity Error
ESens
IP = 200 A, not tested at full scale IP;
TA = –40°C to 25°C
VOE(TA)
VOE(TA)HT
VOE(TA)LT
IERROM
IP = 0 A, TA = 25°C
–8
–8
–20
–
±4
±4
8
8
mV
mV
mV
mA
Electrical Offset Error
Magnetic Offset Error
IP = 0 A, TA = 25°C to 150°C
IP = 0 A, TA = –40°C to 25°C
IP = 0 A, TA = 25°C, after excursion of IPR(max)
±6
20
400
175
IP = 200 A, not tested at full scale IP;
TA = 25°C to 150°C
ETOT(HT)
–1.5
–3.5
±0.9
±1.7
1.5
3.5
%
%
Total Output Error
IP = 200 A, not tested at full scale IP;
ETOT(LT)
LIFETIME ACCURACY CHARACTERISTICS [3]
ESens(LIFE)(HT) TA = 25°C to 150°C
ESens(LIFE)(LT) TA = –40°C to 25°C
TA = –40°C to 25°C
–2.1
–3.5
–2.1
–3.5
–10
±1.6
±2.5
±1.7
±2.6
±7
2.1
3.5
2.1
3.5
10
%
%
Sensitivity Error Including Lifetime
Total Output Error Including Lifetime
Electric Offset Error Including Lifetime
ETOT(LIFE)(HT) TA = 25°C to 150°C
ETOT(LIFE)(LT) TA = –40°C to 25°C
EOFF(LIFE)(HT) TA = 25°C to 150°C
EOFF(LIFE)(LT) TA = –40°C to 25°C
%
%
mV
mV
–20
±8.9
20
[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum
Ratings and Thermal Application section of this datasheet for more information.
[2] Typical values are ±3 sigma values.
[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.
17
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-050U-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
10
8
82
81.5
81
6
4
2
80.5
80
0
-2
-4
-6
-8
-10
79.5
79
78.5
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
2.5
2
Avg-3σ
Avg
Avg+3σ
1.5
1
0.5
0
-0.5
-1
-0.1
-0.2
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
180
160
140
120
100
80
60
Avg-3σ
40
Avg
20
Avg+3σ
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
18
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-050B-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
8
6
40.6
40.4
40.2
40
4
2
0
39.8
39.6
39.4
-2
-4
-6
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
1.5
1
0.5
0
-0.5
-1
-1.5
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
180
160
140
120
100
80
60
40
20
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
19
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-100U-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
10
8
40.6
40.4
40.2
40
6
4
2
39.8
39.6
39.4
0
-2
-4
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
2.5
2
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
Avg-3σ
Avg
Avg+3σ
1.5
1
0.5
0
-0.5
-1
Avg-3σ
Avg
Avg+3σ
-1.5
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
250
200
150
100
50
Avg-3σ
Avg
Avg+3σ
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
20
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772LCB-100B-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
20.5
20.4
20.3
20.2
20.1
20
6
4
2
0
19.9
19.8
19.7
19.6
-2
-4
-6
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
2.5
2
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
1.5
1
0.5
0
-0.5
-1
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
300
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772KCB-150U-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
27.2
27.1
27
6
5
4
26.9
26.8
26.7
26.6
26.5
26.4
26.3
26.2
3
2
1
0
-1
-2
-3
-4
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
2.5
2
0.6
0.5
0.4
0.3
0.2
0.1
0
1.5
1
0.5
0
-0.5
-1
-1.5
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
300
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772KCB-150B-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
13.7
13.6
13.5
13.4
13.3
13.2
13.1
8
6
4
2
0
-2
-4
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
3
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
2.5
2
1.5
1
0.5
0
-0.5
-1
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-200U-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
8
6
20.5
20.4
20.3
20.2
20.1
20
4
2
19.9
19.8
19.7
19.6
19.5
19.4
0
-2
-4
-6
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.4
0.35
0.3
3
2
1
0.25
0.2
0
0.15
0.1
-1
-2
-3
0.05
0
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
24
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-200B-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
10.15
10.1
10.05
10
5
4
3
2
1
0
-1
-2
-3
-4
-5
-6
9.95
9.9
9.85
9.8
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Total Output Error versus Ambient Temperature
Nonlinearity versus Ambient Temperature
2
1.5
1
0.6
0.5
0.4
0.3
0.2
0.1
0
0.5
0
-0.5
-1
-1.5
-2
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
250
200
150
100
50
Avg-3σ
Avg
Avg+3σ
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-250U-PFF-T
Sensitivity versus Ambient Temperature
Electrical Offset Voltage versus Ambient Temperature
16.25
16.2
12
10
8
16.15
16.1
16.05
16
6
4
15.95
15.9
2
15.85
15.8
0
-2
-4
15.75
15.7
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.5
0.45
0.4
2
1.5
1
0.35
0.3
0.5
0
0.25
0.2
-0.5
-1
0.15
0.1
-1.5
-2
0.05
0
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
300
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
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ACS772
CHARACTERISTIC PERFORMANCE DATA
ACS772ECB-250B-PFF-T
Electrical Offset Voltage versus Ambient Temperature
Sensitivity versus Ambient Temperature
6
4
8.15
8.1
8.05
8
2
0
7.95
7.9
-2
-4
-6
7.85
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Nonlinearity versus Ambient Temperature
Total Output Error versus Ambient Temperature
0.6
0.5
0.4
0.3
0.2
0.1
0
2
1.5
1
0.5
0
-0.5
-1
-1.5
-50
-25
0
25
50
75
100
125
150
-50
-25
0
25
50
75
100
125
150
Ta(℃)
Ta(℃)
Magnetic Offset Error versus Ambient Temperature
350
300
250
200
150
100
50
0
-50
-25
0
25
50
75
100
125
150
Ta(℃)
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
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ACS772
CHARACTERISTIC PERFORMANCE DATA
Response Time (tRESPONSE
)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
Propagation Delay (tPROP
)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
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ACS772
Rise Time (tR)
70 A excitation signal with 10%-90% rise time = 1 µs
Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF
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ACS772
UVLO Enable Time (tUVLOE
)
VCC 5 V to 3 V fall time = 1.5 µs, CL = 1 nF
UVLO Disble Time (tUVLOD
)
VCC 3 V to 5 V recovery time = 1.5 µs, CL = 1 nF
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ACS772
CHARACTERISTIC DEFINITIONS
Definitions of Accuracy Characteristics
ies in proportion to either a positive or negative half-scale primary
current. The following equation is used to derive symmetry:
SENSITIVITY (Sens)
The change in sensor IC output in response to a 1A change
through the primary conductor. The sensitivity is the product
of the magnetic circuit sensitivity (G/A; 1 G = 0.1 mT) and the
linear IC amplifier gain (mV/G). The linear IC amplifier gain is
programmed at the factory to optimize the sensitivity (mV/A) for
the full-scale current of the device.
VIOUT_+half-scale amperes – VIOUT(Q)
100 ×
(
)
VIOUT(Q) – VIOUT_–half-scale amperes
RATIOMETRY ERROR
The device features a ratiometric output. This means that the
quiescent voltage output, VIOUTQ, and the magnetic sensitivity,
Sens, are proportional to the supply voltage, VCC.The ratiometric
change (%) in the quiescent voltage output is defined as:
SENSITIVITY ERROR (ESens
)
The sensitivity error is the percent difference between the mea-
sured sensitivity and the ideal sensitivity. For example, in the case
of VCC = 5 V:
SensMeas(5V) – SensIdeal(5V)
ESens
× 100 (%)
=
(VIOUTQ(VCC) / VIOUTQ(5V))
SensIDEAL(5V)
RatErrQVO
=
1 –
× 100%
[
]
VCC / 5 V
NOISE (VN)
and the ratiometric change (%) in sensitivity is defined as:
The noise floor is derived from the thermal and shot noise
observed in Hall elements. Dividing the noise (mV) by the sensi-
tivity (mV/A) provides the smallest current that the device is able
to resolve.
(Sens(VCC) / Sense(5V)
)
RatErrSens = 1 –
× 100%
[
]
V
CC / 5 V
ZERO CURRENT OUTPUT VOLTAGE (V
)
IOUT(Q)
NONLINEARITY (ELIN
)
The output of the sensor when the primary current is zero. It
nominally remains at 0.5 × VCC for a bidirectional device and 0.1
× VCC for a unidirectional device. For example, in the case of a
The ACS772 is designed to provide a linear output in response
to a ramping current. Consider two current levels: I1 and I2. Ide-
ally, the sensitivity of a device is the same for both currents, for
a given supply voltage and temperature. Nonlinearity is present
when there is a difference between the sensitivities measured at
I1 and I2. Nonlinearity is calculated separately for the positive
(ELINpos ) and negative (ELINneg ) applied currents as follows:
bidirectional output device, VCC = 5 V translates into VIOUT(Q)
=
2.5 V. Variation in VIOUT(Q) can be attributed to the resolution of
the Allegro linear IC quiescent voltage trim and thermal drift.
ELECTRICAL OFFSET VOLTAGE (VOE
)
ELINpos = 100 (%) × {1 – (SensIPOS2 / SensIPOS1) }
The deviation of the device output from its ideal quiescent value
of 0.5 × VCC (bidirectional) or 0.1 × VCC (unidirectional) due to
nonmagnetic causes. To convert this voltage to amperes, divide by
the device sensitivity, Sens.
ELINneg = 100 (%) × {1 – (SensINEG2 / SensINEG1)}
where:
SensIx = (VIOUT(Ix) – VIOUT(Q))/ Ix
MAGNETIC OFFSET ERROR (IERROM
)
and IPOSx and INEGx are positive and negative currents and IPOS2
The magnetic offset is due to the residual magnetism (remnant
field) of the core material. The magnetic offset error is highest
when the magnetic circuit has been saturated, usually when the
device has been subjected to a full-scale or high-current overload
condition. The magnetic offset is largely dependent on the mate-
rial used as a flux concentrator. The larger magnetic offsets are
observed at the lower operating temperatures.
= 2 × IPOS1 and INEG2 = 2 × INEG1
.
Then:
ELIN = max( ELINpos , ELINneg
SYMMETRY (ESYM
The degree to which the absolute voltage output from the IC var-
)
)
31
Allegro MicroSystems, LLC
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
TOTAL OUTPUT ERROR (ETOT
)
The difference between the current measurement from the sensor
IC and the actual current (IP), relative to the actual current. This
is equivalent to the difference between the ideal output voltage
and the actual output voltage, divided by the ideal sensitivity,
relative to the current flowing through the primary conduction
path:
The Total Output Error incorporates all sources of error and is a
function of IP.
At relatively high currents, ETOT will be mostly due to sensitiv-
ity error, and at relatively low currents, ETOT will be mostly due
to Offset Voltage (VOE). In fact, as IP approaches zero, ETOT
approaches infinity due to the offset voltage. This is illustrated
in Figure 1 and Figure 2. Figure 1 shows a distribution of output
voltages versus IP at 25°C and across temperature. Figure 2
shows the corresponding ETOT versus IP.
VIOUT(IP) – VIOUT(ideal)(IP)
× 100(%)
ETOT(IP) =
Sensideal × IP
where
VIOUT(ideal)(IP) = VIOUT(Q) + (SensIDEAL × IP )
Accuracy Across
Temperature
Increasing
V
(V)
IOUT
Accuracy at
25°C Only
+E
TOT
Ideal V
IOUT
Accuracy Across
Temperature
Accuracy at
25°C Only
Across Temperature
25°C Only
I
(min)
PR
+I (A)
P
V
IOUT(Q)
–I (A)
P
–I
P
+I
P
Full Scale I
P
I (max)
PR
0 A
Accuracy at
25°C Only
Decreasing
(V)
V
Accuracy Across
Temperature
IOUT
–E
TOT
Figure 2: Total Output Error versus Sensed Current
Figure 1: Output Voltage versus Sensed Current
32
Allegro MicroSystems, LLC
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
Definitions of Dynamic Response Characteristics
POWER-ON DELAY (tPOD
)
V
When the supply is ramped to its operating voltage, the device
requires a finite time to power its internal components before
responding to an input magnetic field. Power-On Delay, tPOD, is
defined as the time it takes for the output voltage to settle within
±10% of its steady-state value under an applied magnetic field,
after the power supply has reached its minimum specified operat-
ing voltage, VCC(min), as shown in the chart at right.
VCC
VCC(typ)
V
IOUT
90% V
IOUT
VCC(min)
tPOD
t1
t2
RISE TIME (tr)
The time interval between a) when the sensor reaches 10% of
its full-scale value, and b) when it reaches 90% of its full-scale
value.
t1= time at which power supply reaches
minimum specified operating voltage
t2= time at which output voltage settles
within ±10% of its steady-state value
under an applied magnetic field
PROPAGATION DELAY (tPROP
)
0
The time interval between a) when the sensed current reaches
20% of its full-scale value, and b) when the sensor output reaches
20% of its full-scale value.
+t
Figure 3: Power-On Delay (tPOD
)
RESPONSE TIME (tRESPONSE
)
Primary Current
(%)
90
The time interval between a) when the applied current reaches
90% of its final value, and b) when the sensor reaches 90% of its
output corresponding to the applied current.
V
IOUT
Rise Time, t
r
20
10
0
t
Propagation Delay, t
PROP
Figure 4: Rise Time (tr) and Propagation Delay (tPROP
)
Primary Current
(%)
90
V
IOUT
Response Time, t
RESPONSE
0
t
Figure 5: Response Time (tRESPONSE
)
33
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
FUNCTIONAL DESCRIPTION
Power-On Reset (POR) and Undervoltage
Lockout (UVLO) Operation
The descriptions in this section assume: temperature = 25°C, no
output load (RL, CL), and no significant magnetic field is present.
ouput will be pulled near GND [6]. If VCC exceeds VUVLOL
before the UVLO Enable Counter reaches tUVLOE [5′], the output
will continue to be VCC / 2.
Power-Up
Coming Out of UVLO
At power-up, as VCC ramps up, the output is in a high-impedance
state. When VCC crosses VPORH (location [1] in Figure 6 and [1′] While UVLO is enabled [6], if VCC exceeds VUVLOH [7],
in Figure 7), the POR Release counter starts counting for tPORR
At this point, if VCC exceeds VUVLOH [2′], the output will go to
VCC / 2 after tUVLOD [3′].
.
UVLO will be disabled after tUVLOD , and the output will be
VCC / 2 [8].
Power-Down
If VCC does not exceed VUVLOH [2], the output will stay in the
high-impedance state until VCC reaches VUVLOH [3] and then will
go to VCC / 2 after tUVLOD [4].
As VCC ramps down below VUVLOL [6′, 9], the UVLO Enable
Counter will start counting. If VCC is higher than VPORL when
the counter reaches tUVLOE , the UVLO function will be enabled
and the output will be pulled near GND [10]. The output will
enter a high-impedance state as VCC goes below VPORL [11]. If
VCC falls below VPORL before the UVLO Enable Counter reaches
tUVLOE , the output will transition directly into a high-impedance
state [7′].
VCC drops below VCC(min) = 4.5 V
If VCC drops below VUVLOL [4′, 5], the UVLO Enable Counter
starts counting. If VCC is still below VUVLOL when the counter
reaches tUVLOE, the UVLO function will be enabled and the
EEPROM Error Checking And Correction
Hamming code methodology is implemented for EEPROM
checking and correction. The device has ECC enabled after
power-up. If an uncorrectable error has occurred, the VOUT pin
will go to high impedance and the device will not respond to
applied magnetic field.
34
Allegro MicroSystems, LLC
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High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
V
CC
11
10
9
1
2
3
6
5
7
4
8
5.0
VUVLOH
VUVLOL
VPORH
VPORL
tUVLOE
tUVLOE
GND
Time
Time
V
Slope =
VCC /2
OUT
2.5
tPORR
tUVLOD
tUVLOD
GND
High Impedance
High Impedance
Figure 6: POR and UVLO Operation: Slow Rise Time Case
V
CC
1’ 2’
3’
4’ 5’
7’
6’
5.0
VUVLOH
VUVLOL
VPORH
VPORL
<tUVLOE
GND
Time
Time
V
OUT
tPORR
< tUVLOE
Slope =
CC /2
Slope =
VCC /2
V
2.5
tUVLOD
GND
High Impedance
High Impedance
Figure 7: POR and UVLO Operation: Fast Rise Time Case
35
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
Chopper Stabilization Technique
When using Hall-effect technology, a limiting factor for
switchpoint accuracy is the small signal voltage developed across
the Hall element. This voltage is disproportionally small relative to
the offset that can be produced at the output of the Hall sensor IC.
This makes it difficult to process the signal while maintaining an
accurate, reliable output over the specified operating temperature
and voltage ranges.
sourced signal then can pass through a low-pass filter, while the
modulated DC offset is suppressed.
In addition to the removal of the thermal and stress related offset,
this novel technique also reduces the amount of thermal noise
in the Hall sensor IC while completely removing the modulated
residue resulting from the chopper operation. The chopper sta-
bilization technique uses a high-frequency sampling clock. For
demodulation process, a sample-and-hold technique is used. This
high-frequency operation allows a greater sampling rate, which
results in higher accuracy and faster signal-processing capability.
This approach desensitizes the chip to the effects of thermal and
mechanical stresses, and produces devices that have extremely
Chopper stabilization is a unique approach used to minimize
Hall offset on the chip. Allegro employs a technique to remove
key sources of the output drift induced by thermal and mechani-
cal stresses. This offset reduction technique is based on a signal
modulation-demodulation process. The undesired offset signal is
separated from the magnetic field-induced signal in the frequency stable quiescent Hall output voltages and precise recoverabil-
domain, through modulation. The subsequent demodulation acts ity after temperature cycling. This technique is made possible
as a modulation process for the offset, causing the magnetic field- through the use of a BiCMOS process, which allows the use of
induced signal to recover its original spectrum at baseband, while low-offset, low-noise amplifiers in combination with high-density
the DC offset becomes a high-frequency signal. The magnetic-
logic integration and sample-and-hold circuits.
Regulator
Clock/Logic
Hall Element
Amp
Anti-Aliasing
LP Filter
Tuned
Filter
Figure 8: Concept of Chopper Stabilization Technique
36
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
APPLICATION INFORMATION
Thermal Rise vs. Primary Current
ASEK772 Evaluation Board Layout
Self-heating due to the flow of current should be considered dur-
ing the design of any current sensing system. The sensor, printed
circuit board (PCB), and contacts to the PCB will generate heat
as current moves through the system.
Thermal data shown in Figure 9 was collected using the
ASEK772 Evaluation Board (TED-85-0385-001). This board
includes 1500 mm2 of 2 oz. (0.0694 mm) copper connected to
pins 4 and 5, with thermal vias connecting the layers. Top and
bottom layers of the PCB are shown below in Figure 10.
The thermal response is highly dependent on PCB layout, copper
thickness, cooling techniques, and the profile of the injected cur-
rent. The current profile includes peak current, current “on-time”,
and duty cycle. While the data presented in this section was
collected with direct current (DC), these numbers may be used
to approximate thermal response for both AC signals and current
pulses.
The plot in Figure 9 shows the measured rise in steady-state die
temperature of the ACS772 versus DC input current at an ambi-
ent temperature, TA, of 25°C. The thermal offset curves may be
directly applied to other values of TA.
Figure 9: Self-Heating in the CB Package
Due to Current Flow
The thermal capacity of the ACS772 should be verified by the
end user in the application’s specific conditions. The maximum
junction temperature, TJ(max), should not be exceeded. Further
information on this application testing is available in the DC
Current Capability and Fuse Characteristics of Current Sensor
ICs with 50 to 200 A Measurement Capability application note on
the Allegro website (https://www.allegromicro.com/en/Design-
Center/Technical-Documents/Hall-Effect-Sensor-IC-Publications/
DC-Current-Capability-Fuse-Characteristics-Current-Sensor-ICs-
50-200-A.aspx).
Figure 10: Top and Bottom Layers
for ASEK772 Evaluation Board
Gerber files for the ASEK772 evaluation board are available for
download from the Allegro website; see the technical documents
section of the ACS772 webpage (https://www.allegromicro.com/
en/Products/Current-Sensor-ICs/Fifty-To-Two-Hundred-Amp-
Integrated-Conductor-Sensor-ICs/ACS772.aspx).
37
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
PACKAGE OUTLINE DRAWING
For Reference Only – Not for Tooling Use
(Reference DWG-9111 & DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
14.0 0.2
0.5
3.5 0.2
1° 2°
R1 = 1.0
4.0 0.2
R2 = 2.05
3.0 0.2
R3 = 3.0
1.50 0.10
5
4
A
Ø
0.5
0.8
B
3
4
17.5 0.2
21.4
13.00 0.10
4.40 0.10
Branded
Face
Ø
1.9 0.2
0.51 0.10
Ø
1.5
2.9 0.2
1
2
3
+0.060
1.91
0.381
–0.030
5° 5°
3.5 0.2
10.00 0.10
B
PCB Layout Reference View
7.00 0.10
XXXXXXX
XXX-XXX
XXXXXXX
XXXX
A
B
C
Dambar removal intrusion
Perimeter through-holes recommended
Branding scale and appearance at supplier discretion
C
Standard1Branding Reference View
Lines 1, 2, 3, 4 = 7 characters.
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
Creepage distance, current terminals to signal pins: 7.25 mm
Clearance distance, current terminals to signal pins: 7.25 mm
Package mass: 4.63 g typical
Figure 11: Package CB, 5-Pin, Leadform PFF
38
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
For Reference Only – Not for Tooling Use
(Reference DWG-9111, DWG-9110)
Dimensions in millimeters – NOT TO SCALE
Dimensions exclusive of mold flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
14.0 0.2
4.0 0.2
3.0 0.2
∅ 0.8
∅ 1.5
5
4
1.50 0.10
1.91
B
PCB Layout Reference View
2.75 0.10
A
23.50 0.5
XXXXXXX
XXX-XXX
13.00 0.10
4.40 0.10
Branded
Face
XXXXXXX
XXXX
1.9 0.2
0.51 0.10
2.9 0.2
1
2
3
C
Standard1Branding Reference View
+0.060
–0.030
0.381
Lines 1, 2, 3, 4 = 7 characters.
5º 5ꢀ
3.5 0.2
Line 1: Part Number
Line 2: Package Temperature - Amperes
Line 3: Lot Number
Line 4: Date Code, Logo A
10.00 0.10
7.00 0.10
A
B
C
Dambar removal intrusion
Perimeter through-holes recommended
Branding scale and appearance at supplier discretion
Figure 12: Package CB, 5-Pin, Leadform PSF
39
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
For Reference Only – Not for Tooling Use
ꢀꢁꢂꢃꢂꢄꢂꢅꢆꢂ ꢇꢈꢉꢊꢋꢌꢌꢌꢍ ꢇꢈꢉꢊꢋꢌꢌ0ꢎ
ꢇꢏꢐꢂꢅꢑꢏꢒꢅꢑ ꢏꢅ ꢐꢏꢓꢓꢏꢐꢂꢔꢂꢄꢑ – ꢕꢖꢗ ꢗꢖ ꢘCꢙꢚꢛ
ꢇꢏꢐꢂꢅꢑꢏꢒꢅꢑ ꢂꢜꢆꢓꢝꢑꢏꢞꢂ ꢒꢃ ꢐꢒꢓꢟ flash, gate burs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
ꢌꢡ.0 ꢤ0.2
∅ 0.ꢥ
ꢡ.0 ꢤ0.2
ꢠ.0 ꢤ0.2
∅ ꢌ.ꢢ
ꢢ
ꢡ
ꢌ.ꢋꢌ
ꢨ
PCB Layout Reference Vꢏew
ꢌ.ꢢ0 ꢤ0.ꢌ0
2.ꢣꢢ ꢤ0.ꢌ0
ꢙ
ꢩꢩꢩꢩꢩꢩꢩ
ꢩꢩꢩꢊꢩꢩꢩ
2ꢠ.ꢢ0 ꢤ0.ꢢ
ꢩꢩꢩꢩꢩꢩꢩ
ꢩꢩꢩꢩ
ꢌꢠ.00 ꢤ0.ꢌ0
ꢡ.ꢡ0 ꢤ0.ꢌ0
ꢌ
Branded
Face
C
Standard Branding Reference Vꢏew
Lines 1, ꢀ, 3, ꢁ ꢂ ꢃ characters.
ꢌ
2
ꢠ
ꢠ.ꢌꢥ ꢤ0.ꢌ0
ꢦ0.0ꢧ0
Line 1ꢄ Part Nꢅmꢆer
Line ꢀꢄ Pacꢇage ꢈemꢉeratꢅre - Amꢉeres
Line 3ꢄ Lot Nꢅmꢆer
ꢌ.ꢋ ꢤ0.2
0.ꢢꢌ ꢤ0.ꢌ0
ꢌꢌ.0 ꢤ0.0ꢢ
0.ꢠꢥꢌ
–0.0ꢠ0
Line ꢁꢄ ꢊate Code, Logo A
ꢌ0.00 ꢤ0.ꢌ0
ꢣ.00 ꢤ0.ꢌ0
ꢙ
ꢨ
C
Dambar removal intrusion
Perimeter through-holes recommended
Branding scale and appearance at supplier discretioꢅ
Figure 13: Package CB, 5-Pin, Leadform PSS
40
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,
Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor
ACS772
Revision History
Number
Date
Description
–
December 12, 2017
January 30, 2018
May 14, 2018
Initial release
Added Dielectric Surge Strength Test Voltage characteristic (page 3) and EEPROM Error Checking
and Correction section (page 16)
1
2
3
Added -050U, -100B, -150U, -200U, -250U, and -250B part options
Added -PSF leadform option; updated Magnetic Offset Error value (page 13) and Characteristic
Performance Data charts (pages 26 to 28)
September 24, 2018
Added -300B part option (page 2 and 16); added -PSS leadform option (pages 1, 2, and 39) and
Applications Information section (page 36); updated Typical Application (page 1), pinout diagram
(page 4), and TOP to TA (pages 2 and 5-15).
4
November 12, 2018
5
6
7
8
December 13, 2018
January 7, 2019
January 24, 2019
March 14, 2019
Added UL certificate; updated package outline drawing PCB layouts and branding (pages 37-39)
Corrected Sensitivity Error values for -200U part option (page 12)
Added -400B part option (page 2 and 17)
Updated package branding (pages 38-40) and Temperature ratings (pages 2-3, 6-17)
Copyright 2019, Allegro MicroSystems, LLC
Allegro MicroSystems, LLC reserves the right to make, from time to time, such departures from the detail specifications as may be required to
permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that
the information being relied upon is current.
Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of
Allegro’s product can reasonably be expected to cause bodily harm.
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, LLC assumes no responsibility for its
use; nor for any infringement of patents or other rights of third parties which may result from its use.
Copies of this document are considered uncontrolled documents.
For the latest version of this document, visit our website:
www.allegromicro.com
41
Allegro MicroSystems, LLC
955 Perimeter Road
Manchester, NH 03103-3353 U.S.A.
www.allegromicro.com
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