AM29DL164DB120PCI [AMD]
16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory; 16兆位（2M ×8位/ 1的M× 16位） CMOS 3.0伏只，同时操作闪存
| 型号： | AM29DL164DB120PCI |
| 厂家： | 
AMD |
| 描述： | 16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory |
| 文件： | 总57页 (文件大小：1258K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Am29DL16xD
Data Sheet
July 2003
The following document specifies Spansion memory products that are now offered by both Advanced
Micro Devices and Fujitsu. Although the document is marked with the name of the company that orig-
inally developed the specification, these products will be offered to customers of both AMD and
Fujitsu.
Continuity of Specifications
There is no change to this datasheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal datasheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appropriate,
and changes will be noted in a revision summary.
Continuity of Ordering Part Numbers
AMD and Fujitsu continue to support existing part numbers beginning with “Am” and “MBM”. To order
these products, please use only the Ordering Part Numbers listed in this document.
For More Information
Please contact your local AMD or Fujitsu sales office for additional information about Spansion
memory solutions.
Publication Number 21533 Revision E Amendment +4 Issue Date May 26, 2004
THIS PAGE LEFT INTENTIONALLY BLANK.
Am29DL16xD
16 Megabit (2 M x 8-Bit/1 M x 16-Bit)
CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory
DISTINCTIVE CHARACTERISTICS
ARCHITECTURAL ADVANTAGES
— 10 mA active read current at 5 MHz
— 200 nA in standby or automatic sleep mode
■ Simultaneous Read/Write operations
— Data can be continuously read from one bank while
executing erase/program functions in other bank
■ Minimum 1 million write cycles guaranteed per sector
■ 20 Year data retention at 125°C
— Zero latency between read and write operations
— Reliable operation for the life of the system
■ Multiple bank architectures
SOFTWARE FEATURES
— Four devices available with different bank sizes (refer
to Table 2)
■ Data Management Software (DMS)
— AMD-supplied software manages data programming
and erasing, enabling EEPROM emulation
■ SecSi™ (Secured Silicon) Sector
— Current version of device has 64 Kbytes; future
versions will have 256 bytes
— Eases sector erase limitations
■ Supports Common Flash Memory Interface (CFI)
— Factory locked and identifiable: 16 bytes available for
secure, random factory Electronic Serial Number;
verifiable as factory locked through autoselect
function. ExpressFlash option allows entire sector to
be available for factory-secured data
■ Erase Suspend/Erase Resume
— Suspends erase operations to allow programming in
same bank
■ Data# Polling and Toggle Bits
— Provides a software method of detecting the status of
program or erase cycles
— Customer lockable: Can be read, programmed, or
erased just like other sectors. Once locked, data
cannot be changed
■ Unlock Bypass Program command
— Reduces overall programming time when issuing
multiple program command sequences
■ Zero Power Operation
— Sophisticated power management circuits reduce
power consumed during inactive periods to nearly
zero
HARDWARE FEATURES
■ Package options
■ Any combination of sectors can be erased
— 48-ball Very Thin Profile Fine-pitch BGA
— 48-ball Fine-pitch BGA
— 64-ball Fortified BGA
— 48-pin TSOP
■ Ready/Busy# output (RY/BY#)
— Hardware method for detecting program or erase
cycle completion
■ Hardware reset pin (RESET#)
■ Top or bottom boot block
— Hardware method of resetting the internal state
machine to reading array data
■ Manufactured on 0.23 µm process technology
— Compatible with Am29DL16xC devices
■ Compatible with JEDEC standards
■ WP#/ACC input pin
— Write protect (WP#) function allows protection of two
outermost boot sectors, regardless of sector protect status
— Pinout and software compatible with
single-power-supply flash standard
— Acceleration (ACC) function accelerates program
timing
■ Sector protection
PERFORMANCE CHARACTERISTICS
— Hardware method of locking a sector, either
in-system or using programming equipment, to
prevent any program or erase operation within that
sector
■ High performance
— Access time as fast 70 ns
— Program time: 7 µs/word typical utilizing Accelerate function
■ Ultra low power consumption (typical values)
— Temporary Sector Unprotect allows changing data in
protected sectors in-system
— 2 mA active read current at 1 MHz
Publication# 21533 Rev: E Amendment/+4
Issue Date: May 26, 2004
This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data
Sheet may be revised by subsequent versions or modifications due to changes in technical specifications.
Refer to AMD’s Website (www.amd.com) for the latest information.
GENERAL DESCRIPTION
The Am29DL16xD family consists of 16 megabit, 3.0
volt-only flash memory devices, organized as 1,048,576
words of 16 bits each or 2,097,152 bytes of 8 bits each.
Word mode data appears on DQ0–DQ15; byte mode
data appears on DQ0–DQ7. The device is designed to
be programmed in-system with the standard 3.0 volt
VCC supply, and can also be programmed in standard
EPROM programmers.
both. Customer Lockable parts may utilize the SecSi
Sector as bonus space, reading and writing like any
other flash sector, or may permanently lock their own
code there.
DMS (Data Management Software) allows systems
to easily take advantage of the advanced architecture
of the simultaneous read/write product line by allowing
removal of EEPROM devices. DMS will also allow the
system software to be simplified, as it will perform all
functions necessary to modify data in file structures,
as opposed to single-byte modifications. To write or
update a particular piece of data (a phone number or
configuration data, for example), the user only needs
to state which piece of data is to be updated, and
where the updated data is located in the system. This
is an advantage compared to systems where
user-written software must keep track of the old data
location, status, logical to physical translation of the
data onto the Flash memory device (or memory de-
vices), and more. Using DMS, user-written software
does not need to interface with the Flash memory di-
rectly. Instead, the user's software accesses the Flash
memory by calling one of only six functions. AMD pro-
vides this software to simplify system design and
software integration efforts.
The device is available with an access time of 70, 90,
or 120 ns. The devices are offered in 48-pin TSOP,
48-ball Fine-pitch BGA, 48-ball Very Thin Profile
Fine-pitch BGA, and 64-ball Fortified BGA packages.
Standard control pins—chip enable (CE#), write en-
able (WE#), and output enable (OE#)—control normal
read and write operations, and avoid bus contention
issues.
The device requires only a single 3.0 volt power sup-
ply for both read and write functions. Internally
generated and regulated voltages are provided for the
program and erase operations.
Simultaneous Read/Write Operations with
Zero Latency
The Simultaneous Read/Write architecture provides
simultaneous operation by dividing the memory
space into two banks. The device can improve overall
system performance by allowing a host system to pro-
gram or erase in one bank, then immediately and
simultaneously read from the other bank, with zero la-
tency. This releases the system from waiting for the
completion of program or erase operations.
The device offers complete compatibility with the
JEDEC single-power-supply Flash command set
standard. Commands are written to the command
register using standard microprocessor write timings.
Reading data out of the device is similar to reading
from other Flash or EPROM devices.
The host system can detect whether a program or
erase operation is complete by using the device sta-
tus bits: RY/BY# pin, DQ7 (Data# Polling) and
DQ6/DQ2 (toggle bits). After a program or erase cycle
has been completed, the device automatically returns
to reading array data.
The Am29DL16xD devices uses multiple bank archi-
tectures to provide flexibility for different applications.
Four devices are available with these bank sizes:
Device
DL161
DL162
DL163
DL164
Bank 1
0.5 Mb
2 Mb
Bank 2
15.5 Mb
14 Mb
12 Mb
8 Mb
The sector erase architecture allows memory sec-
tors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is fully
erased when shipped from the factory.
4 Mb
8 Mb
Am29DL16xD Features
Hardware data protection measures include a low
VCC detector that automatically inhibits write opera-
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of the sectors of mem-
ory. This can be achieved in-system or via
programming equipment.
The SecSi™ (Secured Silicon) Sector is an extra sec-
tor capable of being permanently locked by AMD or
customers. The SecSi Sector Indicator Bit (DQ7) is
permanently set to a 1 if the part is factory locked,
and set to a 0 if customer lockable. This way, cus-
tomer lockable parts can never be used to replace a
factory locked part. Current version of device has 64
Kbytes; future versions will have only 256 bytes.
This should be considered during system design.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep mode.
The system can also place the device into the
standby mode. Power consumption is greatly re-
duced in both modes.
Factory locked parts provide several options. The
SecSi Sector may store a secure, random 16 byte
ESN (Electronic Serial Number), customer code (pro-
grammed through AMD’s ExpressFlash service), or
4
Am29DL16xD
May 26, 2004
TABLE OF CONTENTS
Sector Erase Command Sequence .............................................. 27
Erase Suspend/Erase Resume Commands ................................ 28
Figure 4. Erase Operation .................................................................... 28
Command Definitions ................................................................... 29
Table 14. Am29DL16xD Command Definitions .................................... 29
Write Operation Status . . . . . . . . . . . . . . . . . . . . 30
DQ7: Data# Polling ......................................................................30
Figure 5. Data# Polling Algorithm ......................................................... 30
RY/BY#: Ready/Busy# ................................................................. 31
DQ6: Toggle Bit I ..........................................................................31
Figure 6. Toggle Bit Algorithm .............................................................. 31
DQ2: Toggle Bit II .........................................................................32
Reading Toggle Bits DQ6/DQ2 .................................................... 32
DQ5: Exceeded Timing Limits ...................................................... 32
DQ3: Sector Erase Timer .............................................................32
Table 15. Write Operation Status ......................................................... 33
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 6
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 7
Special Package Handling Instructions ..........................................9
Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Ordering Information . . . . . . . . . . . . . . . . . . . . . . 11
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 12
Table 1. Am29DL16xD Device Bus Operations ....................................12
Word/Byte Configuration .............................................................. 12
Requirements for Reading Array Data .........................................12
Writing Commands/Command Sequences ..................................13
Accelerated Program Operation ...............................................13
Autoselect Functions .................................................................13
Simultaneous Read/Write Operations with Zero Latency ............13
Standby Mode .............................................................................. 13
Automatic Sleep Mode .................................................................13
RESET#: Hardware Reset Pin .....................................................14
Output Disable Mode ...................................................................14
Table 2. Am29DL16xD Device Bank Divisions .....................................14
Table 3. Sector Addresses for Top Boot Sector Devices ......................15
Absolute Maximum Ratings . . . . . . . . . . . . . . . . 34
Figure 7. Maximum Negative Overshoot Waveform............................. 34
Figure 8. Maximum Positive Overshoot Waveform ............................. 34
Operating Ranges. . . . . . . . . . . . . . . . . . . . . . . . . 34
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 9. ICC1 Current vs. Time (Showing Active and Automatic
Table 4. SecSi
Table 5. Sector Addresses for Bottom Boot Sector Devices .................16
Table 6. SecSi Addresses for Bottom Boot Devices ........................ 16
™ Sector Addresses for Top Boot Devices .................. 15
Sleep Currents)..................................................................................... 36
Figure 10. Typical ICC1 vs. Frequency................................................... 36
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 11. Test Setup .......................................................................... 37
Table 16. Test Specifications ................................................................ 37
Key To Switching Waveforms ...................................................... 37
Figure 12. Input Waveforms and Measurement Levels........................ 37
™
Autoselect Mode .......................................................................... 17
Table 7. Am29DL16xD Autoselect Codes, (High Voltage Method) ......17
Sector/Sector Block Protection and Unprotection ........................ 18
Table 8. Top Boot Sector/Sector Block Addresses
for Protection/Unprotection ...................................................................18
Table 9. Bottom Boot Sector/Sector Block Addresses
for Protection/Unprotection ...................................................................18
Write Protect (WP#) .....................................................................19
Temporary Sector/Sector Block Unprotect ...................................19
Figure 1. Temporary Sector Unprotect Operation................................. 19
Figure 2. In-System Sector/Sector Block Protection and
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 13. Read Operation Timings...................................................... 38
Figure 14. Reset Timings...................................................................... 39
Word/Byte Configuration (BYTE#) ...............................................40
Figure 15. BYTE# Timings for Read Operations .................................. 40
Figure 16. BYTE# Timings for Write Operations .................................. 40
Erase and Program Operations ...................................................41
Figure 17. Program Operation Timings ................................................ 42
Figure 18. Accelerated Program Timing Diagram ................................ 42
Figure 19. Chip/Sector Erase Operation Timings................................. 43
Figure 20. Back-to-back Read/Write Cycle Timings ............................. 44
Figure 21. Data# Polling Timings (During Embedded Algorithms) ....... 44
Figure 22. Toggle Bit Timings (During Embedded Algorithms) ............ 45
Figure 23. DQ2 vs. DQ6 ....................................................................... 45
Temporary Sector/Sector Block Unprotect ...................................46
Figure 24. Temporary Sector/Sector Block Unprotect Timing Diagram 46
Figure 25. Sector/Sector Block Protect and Unprotect Timing Diagram 47
Alternate CE# Controlled Erase and Program Operations ...........48
Figure 26. Alternate CE# Controlled Write (Erase/Program)
Unprotection Algorithms........................................................................ 20
SecSi™ (Secured Silicon) Sector Flash Memory Region ............21
Factory Locked: SecSi Sector Programmed and Protected At the
Factory ......................................................................................21
Customer Lockable: SecSi Sector NOT Programmed or
Protected At the Factory ...........................................................21
Hardware Data Protection ............................................................21
Low VCC Write Inhibit ...............................................................22
Write Pulse “Glitch” Protection ..................................................22
Logical Inhibit ............................................................................22
Power-Up Write Inhibit ..............................................................22
Common Flash Memory Interface (CFI) . . . . . . . 22
Table 10. CFI Query Identification String.............................................. 22
Table 11. System Interface String......................................................... 23
Table 12. Device Geometry Definition .................................................. 23
Table 13. Primary Vendor-Specific Extended Query ............................ 24
Command Definitions . . . . . . . . . . . . . . . . . . . . . . 25
Reading Array Data ......................................................................25
Reset Command ..........................................................................25
Autoselect Command Sequence ..................................................25
Operation Timings ................................................................................ 49
Erase And Programming Performance . . . . . . . 50
Latchup Characteristics. . . . . . . . . . . . . . . . . . . . 50
Package and Pin Capacitance . . . . . . . . . . . . . . . 50
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
FBC048—48-Ball Fine-Pitch Ball Grid Array
8 x 9 mm package ........................................................................51
LAA064—64-Ball Fortified Ball Grid Array,
13 x 11 mm package ....................................................................52
TS 048—48-Pin Standard TSOP .................................................53
VBF048—48-Ball Very Thin Profile Fine-Pitch Ball Grid Array .... 54
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 55
Enter SecSi™ Sector/Exit SecSi Sector Command Sequence ....26
Byte/Word Program Command Sequence ...................................26
Unlock Bypass Command Sequence .......................................26
Figure 3. Program Operation ................................................................ 27
Chip Erase Command Sequence .................................................27
May 26, 2004
Am29DL16xD
5
PRODUCT SELECTOR GUIDE
Part Number
Am29DL16xD
Speed Option
Standard Voltage Range: VCC = 2.7–3.6 V
70
70
70
30
90
90
90
40
120
120
120
50
Max Access Time (ns)
CE# Access (ns)
OE# Access (ns)
BLOCK DIAGRAM
OE# BYTE#
V
V
CC
SS
Upper Bank Address
A0–A19
Upper Bank
X-Decoder
RY/BY#
A0–A19
RESET#
STATE
CONTROL
&
COMMAND
REGISTER
WE#
CE#
Status
DQ0–DQ15
BYTE#
Control
WP#/ACC
DQ0–DQ15
X-Decoder
Lower Bank
A0–A19
Lower Bank Address
OE# BYTE#
6
Am29DL16xD
May 26, 2004
CONNECTION DIAGRAMS
A15
A14
A13
A12
A11
A10
A9
1
2
3
4
5
6
7
8
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A16
BYTE#
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
A8
A19
NC
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48-Pin Standard TSOP
WE#
RESET#
NC
WP#/ACC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
48-Ball Fine-pitch BGA
Top View, Balls Facing Down
A6
B6
C6
D6
E6
F6
G6
H6
VSS
A13
A12
A14
A15
A16
BYTE# DQ15/A-1
A5
A9
B5
A8
C5
D5
E5
F5
G5
H5
A10
A11
DQ7
DQ14
DQ13
DQ6
A4
B4
C4
D4
E4
F4
G4
H4
WE# RESET#
NC
A19
DQ5
DQ12
VCC
DQ4
A3 B3
C3
D3
E3
F3
G3
H3
RY/BY# WP#/ACC A18
NC
DQ2
DQ10
DQ11
DQ3
A2
A7
B2
C2
A6
D2
A5
E2
F2
G2
H2
A17
DQ0
DQ8
DQ9
DQ1
A1
A3
B1
A4
C1
A2
D1
A1
E1
A0
F1
G1
H1
VSS
CE#
OE#
May 26, 2004
Am29DL16xD
7
CONNECTION DIAGRAMS
64-Ball Fortified BGA
Top View, Balls Facing Down
A8
B8
C8
D8
E8
F8
G8
NC
H8
NC
NC
NC
NC
VSS
NC
NC
A7
B7
C7
D7
E7
F7
G7
H7
A13
A12
A14
A15
A16
BYTE# DQ15/A-1 VSS
A6
A9
B6
A8
C6
D6
E6
F6
G6
H6
DQ6
A10
A11
DQ7
DQ14
DQ13
A5
B5
C5
D5
E5
F5
G5
H5
WE# RESET#
NC
A19
DQ5
DQ12
VCC
DQ4
A4 B4
C4
D4
E4
F4
G4
H4
RY/BY# WP#/ACC A18
NC
DQ2
DQ10
DQ11
DQ3
A3
A7
B3
C3
A6
D3
A5
E3
F3
G3
H3
A17
DQ0
DQ8
DQ9
DQ1
A2
A3
B2
A4
C2
A2
D2
A1
E2
A0
F2
G2
H2
CE#
OE#
VSS
A1
B1
C1
D1
E1
F1
G1
NC
H1
NC
NC
NC
NC
NC
NC
NC
8
Am29DL16xD
May 26, 2004
48-Ball Very Thin Profile Fine-pitch BGA
Top View, Balls Facing Down
A6
B6
C6
D6
E6
F6
G6
H6
VSS
A13
A12
A14
A15
A16
BYTE# DQ15/A-1
A5
A9
B5
A8
C5
D5
E5
F5
G5
H5
A10
A11
DQ7
DQ14
DQ13
DQ6
A4
B4
C4
D4
E4
F4
G4
H4
WE# RESET#
NC
A19
DQ5
DQ12
VCC
DQ4
A3 B3
C3
D3
E3
F3
G3
H3
RY/BY# WP#/ACC A18
NC
DQ2
DQ10
DQ11
DQ3
A2
A7
B2
C2
A6
D2
A5
E2
F2
G2
H2
A17
DQ0
DQ8
DQ9
DQ1
A1
A3
B1
A4
C1
A2
D1
A1
E1
A0
F1
G1
H1
VSS
CE#
OE#
Special Package Handling Instructions
Special handling is required for Flash Memory prod-
ucts in molded packages (BGA, TSOP, SO, PLCC,
PDIP). The package and/or data integrity may be com-
promised if the package body is exposed to
temperatures above 150°C for prolonged periods of
time.
May 26, 2004
Am29DL16xD
9
PIN DESCRIPTION
LOGIC SYMBOL
A0–A19
= 20 Addresses
20
DQ0–DQ14 = 15 Data Inputs/Outputs
A0–A19
16 or 8
DQ15/A-1
= DQ15 (Data Input/Output, word
mode), A-1 (LSB Address Input, byte
mode)
DQ0–DQ15
(A-1)
CE#
OE#
CE#
= Chip Enable
= Output Enable
= Write Enable
OE#
WE#
WE#
WP#/ACC
RESET#
BYTE#
WP#/ACC
= Hardware Write Protect/
Acceleration Pin
RY/BY#
RESET#
BYTE#
RY/BY#
VCC
= Hardware Reset Pin, Active Low
= Selects 8-bit or 16-bit mode
= Ready/Busy Output
= 3.0 volt-only single power supply
(see Product Selector Guide for speed
options and voltage supply tolerances)
VSS
NC
= Device Ground
= Pin Not Connected Internally
10
Am29DL16xD
May 26, 2004
ORDERING INFORMATION
Standard Products
AMD standard products are available in several packages and operating ranges. The order number (Valid
Combination) is formed by a combination of the following:
Am29DL16xD
T
70
E
I
OPTIONAL PROCESSING
Blank = Standard Processing
N
=
16-byte ESN devices
TEMPERATURE RANGE
F
I
=
=
Industrial (–40°C to +85°C) with Pb-Free Package
Industrial (–40°C to +85°C)
PACKAGE TYPE
E
=
=
48-Pin Thin Small Outline Package (TSOP) Standard Pinout (TS 048)
PC
64-Ball Fortified Ball Grid Array
1.0 mm pitch, 13 x 11 mm package (LAA064)
WC
VR
=
=
48-Ball Fine-Pitch Ball Grid Array
0.80 mm pitch, 8 x 9 mm package (FBC048)
48-Ball Very Thin Profile Ball Grid Array
0.80 mm pitch, 8.15 x 6.15 mm package (VBF048)
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T
B
=
=
Top sector
Bottom sector
DEVICE NUMBER/DESCRIPTION
Am29DL16xD
16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS Flash Memory, 3.0 Volt-only Read, Program, and Erase
Valid Combinations for TSOP Packages
Order Number
Valid Combinations for FBGA Packages
Order Number
Package Marking
AM29DL161DT70, AM29DL161DB70
AM29DL162DT70, AM29DL162DB70
AM29DL163DT70, AM29DL163DB70
AM29DL164DT70, AM29DL164DB70
AM29DL161DT90, AM29DL161DB90
AM29DL161DT70, AM29DL161DB70
AM29DL162DT70, AM29DL162DB70
AM29DL163DT70, AM29DL163DB70
AM29DL164DT70, AM29DL164DB70
AM29DL161DT90, AM29DL161DB90
AM29DL162DT90, AM29DL162DB90
AM29DL163DT90, AM29DL163DB90
AM29DL164DT90, AM29DL164DB90
AM29DL161DT120, AM29DL161DB120
AM29DL162DT120, AM29DL162DB120
AM29DL163DT120, AM29DL163DB120
AM29DL164DT120, AM29DL164DB120
D161DT70, D161DB70
D162DT70, D162DB70
D163DT70, D163DB70
D164DT70, D164DB70
D161DT90, D161DB90
D162DT90, D162DB90
D163DT90, D163DB90
D164DT90, D164DB90
D161DT12, D161DB12
D162DT12, D162DB12
D163DT12, D163DB12
D164DT12, D164DB12
PCI,
WCI,
VRI,
PCF,
WCF,
VRF
PI,
VI,
UI,
PF,
VF,
UF
AM29DL162DT90, AM29DL162DB90
AM29DL163DT90, AM29DL163DB90
AM29DL164DT90, AM29DL164DB90
AM29DL161DT120, AM29DL161DB120
AM29DL162DT120, AM29DL162DB120
AM29DL163DT120, AM29DL163DB120
AM29DL164DT120, AM29DL164DB120
EI,
EF
Note: Ordering numbers containing PCI are identified on device packages with PI. The same
applies to WCI and VI, as well as VRI and UI.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales office to confirm availability
of specific valid combinations and to check on newly released combinations.
May 26, 2004
Am29DL16xD
11
DEVICE BUS OPERATIONS
This section describes the requirements and use of
the device bus operations, which are initiated through
the internal command register. The command register
itself does not occupy any addressable memory loca-
tion. The register is a latch used to store the
commands, along with the address and data informa-
tion needed to execute the command. The contents of
the register serve as inputs to the internal state ma-
chine. The state machine outputs dictate the function
of the device. Table 1 lists the device bus operations,
the inputs and control levels they require, and the re-
sulting output. The following subsections describe
each of these operations in further detail.
Table 1. Am29DL16xD Device Bus Operations
DQ8–DQ15
Addresses
(Note 2)
DQ0– BYTE# BYTE#
Operation
CE# OE# WE# RESET# WP#/ACC
DQ7
DOUT
DIN
= VIH
DOUT
DIN
= VIL
Read
Write
L
L
L
H
L
H
H
L/H
AIN
AIN
DQ8–DQ14=High-Z,
DQ15 = A-1
H
(Note 3)
VCC
0.3 V
VCC
0.3 V
Standby
X
X
H
X
High-Z High-Z
High-Z
Output Disable
Reset
L
H
X
H
X
H
L
L/H
L/H
X
X
High-Z High-Z
High-Z High-Z
High-Z
High-Z
X
SA, A6 = L,
A1 = H, A0 = L
Sector Protect (Note 2)
L
H
L
VID
L/H
DIN
X
X
SA, A6 = H,
A1 = H, A0 = L
Sector Unprotect (Note 2)
Temporary Sector Unprotect
L
H
X
L
VID
VID
(Note 3)
(Note 3)
DIN
DIN
X
X
X
X
AIN
DIN
High-Z
Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 8.5–12.5 V, VHH = 9.0 0.5 V, X = Don’t Care, SA = Sector Address,
IN = Address In, DIN = Data In, DOUT = Data Out
A
Notes:
1. Addresses are A19:A0 in word mode (BYTE# = VIH), A19:A-1 in byte mode (BYTE# = VIL).
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector/Sector
Block Protection and Unprotection” section.
3. If WP#/ACC = VIL, the two outermost boot sectors remain protected. If WP#/ACC = VIH, the two outermost boot sector
protection depends on whether they were last protected or unprotected using the method described in “Sector/Sector Block
Protection and Unprotection”. If WP#/ACC = VHH, all sectors will be unprotected.
Word/Byte Configuration
Requirements for Reading Array Data
The BYTE# pin controls whether the device data I/O
pins operate in the byte or word configuration. If the
BYTE# pin is set at logic ‘1’, the device is in word con-
figuration, DQ0–DQ15 are active and controlled by
CE# and OE#.
To read array data from the outputs, the system must
drive the CE# and OE# pins to VIL. CE# is the power
control and selects the device. OE# is the output con-
trol and gates array data to the output pins. WE#
should remain at VIH. The BYTE# pin determines
whether the device outputs array data in words or
bytes.
If the BYTE# pin is set at logic ‘0’, the device is in byte
configuration, and only data I/O pins DQ0–DQ7 are
active and controlled by CE# and OE#. The data I/O
pins DQ8–DQ14 are tri-stated, and the DQ15 pin is
used as an input for the LSB (A-1) address function.
The internal state machine is set for reading array data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory
content occurs during the power transition. No com-
mand is necessary in this mode to obtain array data.
Standard microprocessor read cycles that assert valid
12
Am29DL16xD
May 26, 2004
addresses on the device address inputs produce valid
data on the device data outputs. Each bank remains
enabled for read access until the command register
contents are altered.
VHH from the WP#/ACC pin returns the device to nor-
mal operation. Note that the WP#/ACC pin must not be
at VHH for operations other than accelerated program-
ming, or device damage may result. In addition, the
WP#/ACC pin must not be left floating or unconnected;
inconsistent behavior of the device may result.
See “Requirements for Reading Array Data” for more
information. Refer to the AC Read-Only Operations
table for timing specifications and to Figure 13 for the
timing diagram. ICC1 in the DC Characteristics table
represents the active current specification for reading
array data.
Autoselect Functions
If the system writes the autoselect command se-
quence, the device enters the autoselect mode. The
system can then read autoselect codes from the inter-
nal register (which is separate from the memory array)
on DQ7–DQ0. Standard read cycle timings apply in
this mode. Refer to the Autoselect Mode and Autose-
lect Command Sequence sections for more
information.
Writing Commands/Command Sequences
To write a command or command sequence (which in-
cludes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to VIL, and OE# to VIH.
Simultaneous Read/Write Operations with
Zero Latency
For program operations, the BYTE# pin determines
whether the device accepts program data in bytes or
words. Refer to “Word/Byte Configuration” for more
information.
This device is capable of reading data from one bank
of memory while programming or erasing in the other
bank of memory. An erase operation may also be sus-
pended to read from or program to another location
within the same bank (except the sector being
erased). Figure 20 shows how read and write cycles
may be initiated for simultaneous operation with zero
latency. ICC6 and ICC7 in the DC Characteristics table
represent the current specifications for read-while-pro-
gram and read-while-erase, respectively.
The device features an Unlock Bypass mode to facili-
tate faster programming. Once a bank enters the
Unlock Bypass mode, only two write cycles are re-
quired to program a word or byte, instead of four. The
“Word/Byte Configuration” section has details on pro-
gramming data to the device using both standard and
Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sec-
tors, or the entire device. Tables 3–6 indicate the
address space that each sector occupies. The device
address space is divided into two banks: Bank 1 con-
tains the boot/parameter sectors, and Bank 2 contains
the larger, code sectors of uniform size. A “bank ad-
dress” is the address bits required to uniquely select a
bank. Similarly, a “sector address” is the address bits
required to uniquely select a sector.
Standby Mode
When the system is not reading or writing to the de-
vice, it can place the device in the standby mode. In
this mode, current consumption is greatly reduced,
and the outputs are placed in the high impedance
state, independent of the OE# input.
The device enters the CMOS standby mode when the
CE# and RESET# pins are both held at VCC 0.3 V.
(Note that this is a more restricted voltage range than
VIH.) If CE# and RESET# are held at VIH, but not within
VCC 0.3 V, the device will be in the standby mode,
but the standby current will be greater. The device re-
quires standard access time (tCE) for read access
when the device is in either of these standby modes,
before it is ready to read data.
ICC2 in the DC Characteristics table represents the ac-
tive current specification for the write mode. The AC
Characteristics section contains timing specification
tables and timing diagrams for write operations.
Accelerated Program Operation
The device offers accelerated program operations
through the ACC function. This is one of two functions
provided by the WP#/ACC pin. This function is prima-
rily intended to allow faster manufacturing throughput
at the factory.
If the device is deselected during erasure or program-
ming, the device draws active current until the
operation is completed.
If the system asserts VHH on this pin, the device auto-
matically enters the aforementioned Unlock Bypass
mode, temporarily unprotects any protected sectors,
and uses the higher voltage on the pin to reduce the
time required for program operations. The system
would use a two-cycle program command sequence
as required by the Unlock Bypass mode. Removing
ICC3 in the DC Characteristics table represents the
standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device en-
ergy consumption. The device automatically enables
this mode when addresses remain stable for tACC
+
May 26, 2004
Am29DL16xD
13
30 ns. The automatic sleep mode is independent of
the CE#, WE#, and OE# control signals. Standard ad-
dress access timings provide new data when
addresses are changed. While in sleep mode, output
data is latched and always available to the system.
ICC4 in the DC Characteristics table represents the
automatic sleep mode current specification.
The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
memory, enabling the system to read the boot-up firm-
ware from the Flash memory.
If RESET# is asserted during a program or erase op-
eration, the RY/BY# pin remains a “0” (busy) until the
internal reset operation is complete, which requires a
time of tREADY (during Embedded Algorithms). The sys-
tem can thus monitor RY/BY# to determine whether
the reset operation is complete. If RESET# is asserted
when a program or erase operation is not executing
(RY/BY# pin is “1”), the reset operation is completed
within a time of tREADY (not during Embedded Algo-
rithms). The system can read data tRH after the
RESET# pin returns to VIH.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of re-
setting the device to reading array data. When the
RESET# pin is driven low for at least a period of tRP,
the device immediately terminates any operation in
progress, tristates all output pins, and ignores all
read/write commands for the duration of the RESET#
pulse. The device also resets the internal state ma-
chine to reading array data. The operation that was
interrupted should be reinitiated once the device is
ready to accept another command sequence, to en-
sure data integrity.
Refer to the AC Characteristics tables for RESET# pa-
rameters and to Figure 14 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in the high
impedance state.
Current is reduced for the duration of the RESET#
pulse. When RESET# is held at VSS 0.3 V, the device
draws CMOS standby current (ICC4). If RESET# is held
at VIL but not within VSS 0.3 V, the standby current will
be greater.
Table 2. Am29DL16xD Device Bank Divisions
Bank 1
Sector Sizes
Bank 2
Device
Part Number
Megabits
Megabits
Sector Sizes
Thirty-one
64 Kbyte/32 Kword
Am29DL161D
Am29DL162D
0.5 Mbit
Eight 8 Kbyte/4 Kword
15.5 Mbit
Eight 8 Kbyte/4 Kword,
three 64 Kbyte/32 Kword
Twenty-eight
64 Kbyte/32 Kword
2 Mbit
14 Mbit
Eight 8 Kbyte/4 Kword,
seven 64 Kbyte/32 Kword
Twenty-four
64 Kbyte/32 Kword
Am29DL163D
Am29DL164D
4 Mbit
8 Mbit
12 Mbit
8 Mbit
Eight 8 Kbyte/4 Kword,
fifteen 64 Kbyte/32 Kword
Sixteen
64 Kbyte/32 Kword
14
Am29DL16xD
May 26, 2004
Table 3. Sector Addresses for Top Boot Sector Devices
Sector Address
A19–A12
Sector Size
(Kbytes/Kwords)
(x8)
(x16)
Address Range
Sector
Address Range
SA0
SA1
00000xxx
00001xxx
00010xxx
00011xxx
00100xxx
00101xxx
00110xxx
00111xxx
01000xxx
01001xxx
01010xxx
01011xxx
01100xxx
01101xxx
01110xxx
01111xxx
10000xxx
10001xxx
10010xxx
10011xxx
10100xxx
10101xxx
10110xxx
10111xxx
11000xxx
11001xxx
11010xxx
11011xxx
11100xxx
11101xxx
11110xxx
11111000
11111001
11111010
11111011
11111100
11111101
11111110
11111111
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
8/4
000000h-00FFFFh
010000h-01FFFFh
020000h-02FFFFh
030000h-03FFFFh
040000h-04FFFFh
050000h-05FFFFh
060000h-06FFFFh
070000h-07FFFFh
080000h-08FFFFh
090000h-09FFFFh
0A0000h-0AFFFFh
0B0000h-0BFFFFh
0C0000h-0CFFFFh
0D0000h-0DFFFFh
0E0000h-0EFFFFh
0F0000h-0FFFFFh
100000h-10FFFFh
110000h-11FFFFh
120000h-12FFFFh
130000h-13FFFFh
140000h-14FFFFh
150000h-15FFFFh
160000h-16FFFFh
170000h-17FFFFh
180000h-18FFFFh
190000h-19FFFFh
1A0000h-1AFFFFh
1B0000h-1BFFFFh
1C0000h-1CFFFFh
1D0000h-1DFFFFh
1E0000h-1EFFFFh
1F0000h-1F1FFFh
1F2000h-1F3FFFh
1F4000h-1F5FFFh
1F6000h-1F7FFFh
1F8000h-1F9FFFh
1FA000h-1FBFFFh
1FC000h-1FDFFFh
1FE000h-1FFFFFh
00000h–07FFFh
08000h–0FFFFh
10000h–17FFFh
18000h–1FFFFh
20000h–27FFFh
28000h–2FFFFh
30000h–37FFFh
38000h–3FFFFh
40000h–47FFFh
48000h–4FFFFh
50000h–57FFFh
58000h–5FFFFh
60000h–67FFFh
68000h–6FFFFh
70000h–77FFFh
78000h–7FFFFh
80000h–87FFFh
88000h–8FFFFh
90000h–97FFFh
98000h–9FFFFh
A0000h–A7FFFh
A8000h–AFFFFh
B0000h–B7FFFh
B8000h–BFFFFh
C0000h–C7FFFh
C8000h–CFFFFh
D0000h–D7FFFh
D8000h–DFFFFh
E0000h–E7FFFh
E8000h–EFFFFh
F0000h–F7FFFh
F8000h–F8FFFh
F9000h–F9FFFh
FA000h–FAFFFh
FB000h–FBFFFh
FC000h–FCFFFh
FD000h–FDFFFh
FE000h–FEFFFh
FF000h–FFFFFh
SA2
SA3
SA4
SA5
SA6
SA7
SA8
SA9
SA10
SA11
SA12
SA13
SA14
SA15
SA16
SA17
SA18
SA19
SA20
SA21
SA22
SA23
SA24
SA25
SA26
SA27
SA28
SA29
SA30
SA31
SA32
SA33
SA34
SA35
SA36
SA37
SA38
8/4
8/4
8/4
8/4
8/4
8/4
8/4
Note: The address range is A19:A-1 in byte mode (BYTE#=VIL) or A19:A0 in word mode (BYTE#=VIH). The bank address bits are A19–A15 for
Am29DL161DT, A19–A17 for Am29DL162DT, A19 and A18 for Am29DL163DT, and A19 for Am29DL164DT.
Table 4. SecSi™ Sector Addresses for Top Boot Devices
Sector Address
A19–A12
Sector
Size
(x8)
(x16)
Address Range
Device
Address Range
Am29DL16xDT
11111xxx
64/32
1F0000h-1FFFFFh F8000h–FFFFFh
May 26, 2004
Am29DL16xD
15
Table 5. Sector Addresses for Bottom Boot Sector Devices
Sector Address
A19–A12
Sector Size
(Kbytes/Kwords)
(x8)
(x16)
Address Range
Sector
Address Range
SA0
SA1
00000000
00000001
00000010
00000011
00000100
00000101
00000110
00000111
00001XXX
00010XXX
00011XXX
00100XXX
00101XXX
00110XXX
00111XXX
01000XXX
01001XXX
01010XXX
01011XXX
01100XXX
01101XXX
01110XXX
01111XXX
10000XXX
10001XXX
10010XXX
10011XXX
10100XXX
10101XXX
10110XXX
10111XXX
11000XXX
11001XXX
11010XXX
11011XXX
11100XXX
11101XXX
11110XXX
11111XXX
8/4
000000h-001FFFh
002000h-003FFFh
004000h-005FFFh
006000h-007FFFh
008000h-009FFFh
00A000h-00BFFFh
00C000h-00DFFFh
00E000h-00FFFFh
010000h-01FFFFh
020000h-02FFFFh
030000h-03FFFFh
040000h-04FFFFh
050000h-05FFFFh
060000h-06FFFFh
070000h-07FFFFh
080000h-08FFFFh
090000h-09FFFFh
0A0000h-0AFFFFh
0B0000h-0BFFFFh
0C0000h-0CFFFFh
0D0000h-0DFFFFh
0E0000h-0EFFFFh
0F0000h-0FFFFFh
100000h-10FFFFh
110000h-11FFFFh
120000h-12FFFFh
130000h-13FFFFh
140000h-14FFFFh
150000h-15FFFFh
160000h-16FFFFh
170000h-17FFFFh
180000h-18FFFFh
190000h-19FFFFh
1A0000h-1AFFFFh
1B0000h-1BFFFFh
1C0000h-1CFFFFh
1D0000h-1DFFFFh
1E0000h-1EFFFFh
1F0000h-1FFFFFh
00000h-00FFFh
01000h-01FFFh
02000h-02FFFh
03000h-03FFFh
04000h-04FFFh
05000h-05FFFh
06000h-06FFFh
07000h-07FFFh
08000h-0FFFFh
10000h-17FFFh
18000h-1FFFFh
20000h-27FFFh
28000h-2FFFFh
30000h-37FFFh
38000h-3FFFFh
40000h-47FFFh
48000h-4FFFFh
50000h-57FFFh
58000h-5FFFFh
60000h-67FFFh
68000h-6FFFFh
70000h-77FFFh
78000h-7FFFFh
80000h-87FFFh
88000h-8FFFFh
90000h-97FFFh
98000h-9FFFFh
A0000h-A7FFFh
A8000h-AFFFFh
B0000h-B7FFFh
B8000h-BFFFFh
C0000h-C7FFFh
C8000h-CFFFFh
D0000h-D7FFFh
D8000h-DFFFFh
E0000h-E7FFFh
E8000h-EFFFFh
F0000h-F7FFFh
F8000h-FFFFFh
8/4
SA2
8/4
SA3
8/4
SA4
8/4
SA5
8/4
SA6
8/4
SA7
8/4
SA8
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
64/32
SA9
SA10
SA11
SA12
SA13
SA14
SA15
SA16
SA17
SA18
SA19
SA20
SA21
SA22
SA23
SA24
SA25
SA26
SA27
SA28
SA29
SA30
SA31
SA32
SA33
SA34
SA35
SA36
SA37
SA38
Note: The address range is A19:A-1 in byte mode (BYTE#=VIL) or A19:A0 in word mode (BYTE#=VIH). The bank address bits are A19–A15 for
Am29DL161DB, A19–A17 for Am29DL162DB, A19 and A18 for Am29DL163DB, and A19 for Am29DL164DB.
Table 6. SecSi™ Addresses for Bottom Boot Devices
Sector Address
A19–A12
Sector
Size
(x8)
(x16)
Address Range
Device
Address Range
Am29DL16xDB
00000XXX
64/32 000000h-00FFFFh 00000h-07FFFh
16
Am29DL16xD
May 26, 2004
Table 7. In addition, when verifying sector protection,
the sector address must appear on the appropriate
highest order address bits (see Tables 3–6). Table 7
shows the remaining address bits that are don’t care.
When all necessary bits have been set as required,
the programming equipment may then read the corre-
sponding identifier code on DQ7–DQ0.
Autoselect Mode
The autoselect mode provides manufacturer and de-
vice identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for programming equip-
ment to automatically match a device to be
programmed with its corresponding programming al-
gorithm. However, the autoselect codes can also be
accessed in-system through the command register.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in Table 14. This method
does not require VID. Refer to the Autoselect Com-
mand Sequence section for more information.
When using programming equipment, the autoselect
mode requires VID (8.5 V to 12.5 V) on address pin A9.
Address pins A6, A1, and A0 must be as shown in
Table 7. Am29DL16xD Autoselect Codes, (High Voltage Method)
DQ8 to DQ15
A19
to
A11
to
A8
to
A5
to
DQ7
to
BYTE# BYTE#
Description
CE# OE# WE# A12
A10 A9 A7 A6 A2 A1 A0
= VIH
= VIL
DQ0
VID
VID
VID
VID
VID
Manufacturer ID: AMD
Device ID: Am29DL161D
Device ID: Am29DL162D
Device ID: Am29DL163D
Device ID: Am29DL164D
L
L
L
L
L
L
L
L
L
L
H
H
H
H
H
BA
BA
BA
BA
BA
X
X
X
X
X
X
X
X
X
X
L
L
L
L
L
X
X
X
X
X
L
L
L
L
L
L
X
X
01h
H
H
H
H
22h
22h
22h
22h
X
36h (T), 39h (B)
2Dh (T), 2Eh (B)
28h (T), 2Bh (B)
33h (T), 35h (B)
X
X
X
Sector Protection
Verification
01h (protected),
00h (unprotected)
VID
VID
L
L
L
L
H
H
SA
BA
X
X
X
X
L
L
X
X
H
H
L
X
X
X
X
81h (factory locked),
01h (not factory
locked)
SecSi™ Indicator Bit
(DQ7)
H
Legend: T = Top Boot Block, B = Bottom Boot Block, L = Logic Low = VIL, H = Logic High = VIH, BA = Bank Address, SA =
Sector Address, X = Don’t care.
May 26, 2004
Am29DL16xD
17
Table 9. Bottom Boot Sector/Sector Block
Addresses for Protection/Unprotection
Sector/Sector Block Protection and
Unprotection
(Note: For the following discussion, the term “sector”
applies to both sectors and sector blocks. A sector
block consists of two or more adjacent sectors that are
protected or unprotected at the same time (see Tables
8 and 9).
Sector / Sector
Block
A19–A12
Sector / Sector Block Size
SA38
11111XXX
64 Kbytes
11110XXX,
11101XXX,
11100XXX
SA37-SA35
192 (3x64) Kbytes
SA34-SA31
SA30-SA27
SA26-SA23
SA22-SA19
SA18-SA15
SA14-SA11
110XXXXX
101XXXXX
100XXXXX
011XXXXX
010XXXXX
001XXXXX
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
Table 8. Top Boot Sector/Sector Block Addresses
for Protection/Unprotection
Sector / Sector
Block
A19–A12
Sector / Sector Block Size
SA0
00000XXX
64 Kbytes
00001XXX,
00010XXX,
00011XXX
SA1-SA3
192 (3x64) Kbytes
00001XXX,
00010XXX,
00011XXX
SA10-SA8
192 (3x64) Kbytes
SA4-SA7
SA8-SA11
SA12-SA15
SA16-SA19
SA20-SA23
SA24-SA27
001XXXXX
010XXXXX
011XXXXX
100XXXXX
101XXXXX
110XXXXX
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
256 (4x64) Kbytes
SA7
SA6
SA5
SA4
SA3
SA2
SA1
SA0
00000111
00000110
00000101
00000100
00000011
00000010
00000001
00000000
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
11100XXX,
11101XXX,
11110XXX
SA28-SA30
192 (3x64) Kbytes
SA31
SA32
SA33
SA34
SA35
SA36
SA37
SA38
11111000
11111001
11111010
11111011
11111100
11111101
11111110
11111111
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
8 Kbytes
The hardware sector protection feature disables both
program and erase operations in any sector. The hard-
ware sector unprotection feature re-enables both
program and erase operations in previously protected
sectors. Sector protection and unprotection can be im-
plemented via two methods.
The primary method requires VID on the RESET# pin
only, and can be implemented either in-system or via
programming equipment. Figure 2 shows the algo-
rithms and Figure 25 shows the timing diagram. This
method uses standard microprocessor bus cycle tim-
ing. For sector unprotect, all unprotected sectors must
first be protected prior to the first sector unprotect
write cycle.
The sector unprotect algorithm unprotects all sectors
in parallel. All previously protected sectors must be in-
dividually re-protected. To change data in protected
sectors efficiently, the temporary sector unprotect
function is available. See “Temporary Sector/Sector
Block Unprotect”.
The alternate method intended only for programming
equipment requires VID on address pin A9 and OE#.
This method is compatible with programmer routines
written for earlier 3.0 volt-only AMD flash devices.
Publication number 22243 contains further details;
contact an AMD representative to request a copy.
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
18
Am29DL16xD
May 26, 2004
through AMD’s ExpressFlash™ Service. Contact an
AMD representative for details.
This feature allows temporary unprotection of previ-
ously protected sectors to change data in-system. The
Sector Unprotect mode is activated by setting the RE-
SET# pin to VID (8.5 V – 12.5 V). During this mode,
formerly protected sectors can be programmed or
erased by selecting the sector addresses. Once VID is
removed from the RESET# pin, all the previously pro-
tected sectors are protected again. Figure 1 shows the
algorithm, and Figure 24 shows the timing diagrams,
for this feature.
It is possible to determine whether a sector is pro-
tected or unprotected. See the Autoselect Mode
section for details.
Write Protect (WP#)
The Write Protect function provides a hardware
method of protecting certain boot sectors without
using VID. This function is one of two provided by the
WP#/ACC pin.
If the system asserts VIL on the WP#/ACC pin, the de-
vice disables program and erase functions in the two
“outermost” 8 Kbyte boot sectors independently of
whether those sectors were protected or unprotected
using the method described in “Sector/Sector Block
Protection and Unprotection”. The two outermost 8
Kbyte boot sectors are the two sectors containing the
lowest addresses in a bottom-boot-configured device,
or the two sectors containing the highest addresses in
a top-boot-configured device.
START
RESET# = VID
(Note 1)
Perform Erase or
Program Operations
If the system asserts VIH on the WP#/ACC pin, the de-
vice reverts to whether the two outermost 8 Kbyte boot
sectors were last set to be protected or unprotected.
That is, sector protection or unprotection for these two
sectors depends on whether they were last protected
or unprotected using the method described in “Sec-
tor/Sector Block Protection and Unprotection”.
RESET# = VIH
Temporary Sector
Unprotect Completed
(Note 2)
Note that the WP#/ACC pin must not be left floating or
unconnected; inconsistent behavior of the device may
result.
Notes:
1. All protected sectors unprotected (If WP#/ACC = VIL,
outermost boot sectors will remain protected).
Temporary Sector/Sector Block Unprotect
(Note: For the following discussion, the term “sector”
applies to both sectors and sector blocks. A sector
block consists of two or more adjacent sectors that are
protected or unprotected at the same time (see Tables
8 and 9).
2. All previously protected sectors are protected once
again.
Figure 1. Temporary Sector Unprotect Operation
May 26, 2004
Am29DL16xD
19
START
START
Protect all sectors:
The indicated portion
of the sector protect
algorithm must be
performed for all
PLSCNT = 1
PLSCNT = 1
RESET# = VID
RESET# = VID
unprotected sectors
prior to issuing the
first sector
Wait 1 µs
Wait 1 µs
unprotect address
No
First Write
Cycle = 60h?
No
First Write
Cycle = 60h?
Temporary Sector
Unprotect Mode
Temporary Sector
Unprotect Mode
Yes
Yes
Set up sector
address
No
All sectors
protected?
Sector Protect:
Write 60h to sector
address with
A6 = 0, A1 = 1,
A0 = 0
Yes
Set up first sector
address
Sector Unprotect:
Wait 150 µs
Write 60h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Verify Sector
Protect: Write 40h
to sector address
with A6 = 0,
Reset
PLSCNT = 1
Increment
PLSCNT
Wait 15 ms
A1 = 1, A0 = 0
Verify Sector
Unprotect: Write
40h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Read from
sector address
with A6 = 0,
A1 = 1, A0 = 0
Increment
PLSCNT
No
No
PLSCNT
= 25?
Read from
sector address
with A6 = 1,
Data = 01h?
Yes
A1 = 1, A0 = 0
No
Yes
Set up
next sector
address
Yes
No
PLSCNT
= 1000?
Protect another
sector?
Data = 00h?
Yes
Device failed
No
Yes
Remove VID
from RESET#
No
Last sector
verified?
Device failed
Write reset
command
Yes
Remove VID
Sector Unprotect
Algorithm
from RESET#
Sector Protect
Algorithm
Sector Protect
complete
Write reset
command
Sector Unprotect
complete
Note: The term “sector” in the figure applies to both sectors and sector blocks.
Figure 2. In-System Sector/Sector Block Protection and Unprotection Algorithms
20
Am29DL16xD
May 26, 2004
bottom of the lowest 8 Kbyte boot sector at addresses
F8000h–F8007h in word mode (or 1F0000h–1F000Fh
in byte mode).
SecSi™ (Secured Silicon) Sector Flash
Memory Region
The SecSi (Secured Silicon) Sector feature provides a
Flash memory region that enables permanent part
identification through an Electronic Serial Number
(ESN). The SecSi Sector uses an Indicator Bit (DQ7)
to indicate whether or not the sector is locked when
shipped from the factory. This bit is permanently set at
the factory and cannot be changed, which prevents
cloning of a factory locked part. This ensures the secu-
rity of the ESN once the product is shipped to the field.
Current version of device has 64 Kbytes; future
versions will have only 256 bytes. This should be
considered during system design.
Customers may opt to have their code programmed by
AMD through the AMD ExpressFlash service. AMD
programs the customer’s code, with or without the ran-
dom ESN. The devices are then shipped from AMD’s
factory with the SecSi Sector permanently locked.
Contact an AMD representative for details on using
AMD’s ExpressFlash service.
Customer Lockable: SecSi Sector NOT
Programmed or Protected At the Factory
If the security feature is not required, the SecSi Sector
can be treated as an additional Flash memory space,
expanding the size of the available Flash array. Current
version of device has 64 Kbytes; future versions
will have only 256 bytes. This should be consid-
ered during system design. The SecSi Sector can be
read, programmed, and erased as often as required.
(Note that in upcoming versions of this device, the
SecSi Sector erase function will not be available.) Note
that the accelerated programming (ACC) and unlock
bypass functions are not available when programming
the SecSi Sector.
AMD offers the device with the SecSi Sector either
factory locked or customer lockable. The fac-
tory-locked version is always protected when shipped
from the factory, and has the SecSi Sector Indicator
Bit permanently set to a “1.” The customer-lockable
version is shipped with the unprotected, allowing cus-
tomers to utilize the that sector in any manner they
choose. The customer-lockable version has the SecSi
Sector Indicator Bit permanently set to a “0.” Thus, the
SecSi Sector Indicator Bit prevents customer-lockable
devices from being used to replace devices that are
factory locked.
The SecSi Sector area can be protected using one of the
following procedures:
The system accesses the SecSi Sector through a
command sequence (see “Enter SecSi Sector/Exit
SecSi Sector Command Sequence”). After the system
has written the Enter SecSi Sector command se-
quence, it may read the SecSi Sector by using the
addresses normally occupied by the boot sectors. This
mode of operation continues until the system issues
the Exit SecSi Sector command sequence, or until
power is removed from the device. On power-up, or
following a hardware reset, the device reverts to send-
ing commands to the boot sectors.
■ Write the three-cycle Enter SecSi Sector Region
command sequence, and then follow the in-system
sector protect algorithm as shown in Figure 2, ex-
cept that RESET# may be at either VIH or VID. This
allows in-system protection of the without raising
any device pin to a high voltage. Note that this
method is only applicable to the SecSi Sector.
■ Write the three-cycle Enter SecSi Sector Region
command sequence, and then use the alternate
method of sector protection described in the “Sec-
tor/Sector Block Protection and Unprotection”.
Factory Locked: SecSi Sector Programmed and
Protected At the Factory
Once the SecSi Sector is locked and verified, the sys-
tem must write the Exit SecSi Sector Region
command sequence to return to reading and writing
the remainder of the array.
In a factory locked device, the SecSi Sector is pro-
tected when the device is shipped from the factory.
The SecSi Sector cannot be modified in any way. The
device is available preprogrammed with one of the
following:
The SecSi Sector protection must be used with cau-
tion since, once protected, there is no procedure
available for unprotecting the SecSi Sector area and
none of the bits in the SecSi Sector memory space
can be modified in any way.
■ A random, secure ESN only
■ Customer code through the ExpressFlash service
■ Both a random, secure ESN and customer code
Hardware Data Protection
through the ExpressFlash service.
The command sequence requirement of unlock cycles
for programming or erasing provides data protection
against inadvertent writes (refer to Table 14 for com-
mand definitions). In addition, the following hardware
data protection measures prevent accidental erasure
or programming, which might otherwise be caused by
In devices that have an ESN, a Bottom Boot device will
have the 16-byte ESN in the lowest addressable mem-
ory area at addresses 00000h–00007h in word mode
(or 000000h–00000Fh in byte mode). In the Top Boot
device the starting address of the ESN will be at the
May 26, 2004
Am29DL16xD
21
spurious system level signals during VCC power-up
and power-down transitions, or from system noise.
COMMON FLASH MEMORY INTERFACE
(CFI)
The Common Flash Interface (CFI) specification out-
lines device and host system software interrogation
handshake, which allows specific vendor-specified
software algorithms to be used for entire families of
devices. Software support can then be device-inde-
pendent, JEDEC ID-independent, and forward- and
backward-compatible for the specified flash device
families. Flash vendors can standardize their existing
interfaces for long-term compatibility.
Low VCC Write Inhibit
When VCC is less than VLKO, the device does not ac-
cept any write cycles. This protects data during VCC
power-up and power-down. The command register
and all internal program/erase circuits are disabled,
and the device resets to reading array data. Subse-
quent writes are ignored until VCC is greater than VLKO
The system must provide the proper signals to the
control pins to prevent unintentional writes when VCC
.
is greater than VLKO
.
This device enters the CFI Query mode when the sys-
tem writes the CFI Query command, 98h, to address
55h in word mode (or address AAh in byte mode), any
time the device is ready to read array data. The sys-
tem can read CFI information at the addresses given
in Tables 10–13. To terminate reading CFI data, the
system must write the reset command.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#, CE#
or WE# do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE# =
VIL, CE# = VIH or WE# = VIH. To initiate a write cycle,
CE# and WE# must be a logical zero while OE# is a
logical one.
The system can also write the CFI query command
when the device is in the autoselect mode. The device
enters the CFI query mode, and the system can read
CFI data at the addresses given in Tables 10–13. The
system must write the reset command to return the
device to the autoselect mode.
Power-Up Write Inhibit
If WE# = CE# = VIL and OE# = VIH during power up,
the device does not accept commands on the rising
edge of WE#. The internal state machine is automati-
cally reset to reading array data on power-up.
For further information, please refer to the CFI Specifi-
cation and CFI Publication 100, available via the World
Wide Web at http://www.amd.com/products/nvd/over-
view/cfi.html. Alternatively, contact an AMD
representative for copies of these documents.
Table 10. CFI Query Identification String
Addresses
Addresses
(Word Mode)
(Byte Mode)
Data
Description
10h
11h
12h
20h
22h
24h
0051h
0052h
0059h
Query Unique ASCII string “QRY”
13h
14h
26h
28h
0002h
0000h
Primary OEM Command Set
15h
16h
2Ah
2Ch
0040h
0000h
Address for Primary Extended Table
17h
18h
2Eh
30h
0000h
0000h
Alternate OEM Command Set (00h = none exists)
Address for Alternate OEM Extended Table (00h = none exists)
19h
1Ah
32h
34h
0000h
0000h
22
Am29DL16xD
May 26, 2004
Table 11. System Interface String
Data Description
Addresses
(Word Mode)
Addresses
(Byte Mode)
VCC Min. (write/erase)
0027h
1Bh
1Ch
36h
38h
D7–D4: volt, D3–D0: 100 millivolt
VCC Max. (write/erase)
0036h
D7–D4: volt, D3–D0: 100 millivolt
1Dh
1Eh
1Fh
20h
21h
22h
23h
24h
25h
26h
3Ah
3Ch
3Eh
40h
42h
44h
46h
48h
4Ah
4Ch
0000h
0000h
0004h
0000h
000Ah
0000h
0005h
0000h
0004h
0000h
VPP Min. voltage (00h = no VPP pin present)
VPP Max. voltage (00h = no VPP pin present)
Typical timeout per single byte/word write 2N µs
Typical timeout for Min. size buffer write 2N µs (00h = not supported)
Typical timeout per individual block erase 2N ms
Typical timeout for full chip erase 2N ms (00h = not supported)
Max. timeout for byte/word write 2N times typical
Max. timeout for buffer write 2N times typical
Max. timeout per individual block erase 2N times typical
Max. timeout for full chip erase 2N times typical (00h = not supported)
Table 12. Device Geometry Definition
Addresses
Addresses
(Word Mode)
(Byte Mode)
Data
Description
27h
4Eh
0015h
Device Size = 2N byte
28h
29h
50h
52h
0002h
0000h
Flash Device Interface description (refer to CFI publication 100)
2Ah
2Bh
54h
56h
0000h
0000h
Max. number of bytes in multi-byte write = 2N
(00h = not supported)
2Ch
58h
0002h
Number of Erase Block Regions within device
2Dh
2Eh
2Fh
30h
5Ah
5Ch
5Eh
60h
0007h
0000h
0020h
0000h
Erase Block Region 1 Information
(refer to the CFI specification or CFI publication 100)
31h
32h
33h
34h
62h
64h
66h
68h
001Eh
0000h
0000h
0001h
Erase Block Region 2 Information
Erase Block Region 3 Information
Erase Block Region 4 Information
35h
36h
37h
38h
6Ah
6Ch
6Eh
70h
0000h
0000h
0000h
0000h
39h
3Ah
3Bh
3Ch
72h
74h
76h
78h
0000h
0000h
0000h
0000h
May 26, 2004
Am29DL16xD
23
Table 13. Primary Vendor-Specific Extended Query
Addresses
Addresses
(Word Mode)
(Byte Mode)
Data
Description
40h
41h
42h
80h
82h
84h
0050h
0052h
0049h
Query-unique ASCII string “PRI”
43h
44h
86h
88h
0031h
0031h
Major version number, ASCII
Minor version number, ASCII
Address Sensitive Unlock (Bits 1-0)
0 = Required, 1 = Not Required
45h
8Ah
0000h
Silicon Revision Number (Bits 7-2)
Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
46h
47h
48h
49h
4Ah
4Bh
4Ch
8Ch
8Eh
90h
92h
94h
96h
98h
0002h
0001h
0001h
0004h
Sector Protect
0 = Not Supported, X = Number of sectors in per group
Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
Sector Protect/Unprotect scheme
04 = 29LV800 mode
00XXh
(See Note)
Simultaneous Operation
00 = Not Supported, X= Number of Sectors in Bank 2 (Uniform Bank)
Burst Mode Type
00 = Not Supported, 01 = Supported
0000h
0000h
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
ACC (Acceleration) Supply Minimum
4Dh
4Eh
4Fh
9Ah
9Ch
9Eh
0085h
0095h
000Xh
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
ACC (Acceleration) Supply Maximum
00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV
Top/Bottom Boot Sector Flag
02h = Bottom Boot Device, 03h = Top Boot Device
Note:
The number of sectors in Bank 2 is device dependent.
Am29DL161 = 1Fh
Am29DL162 = 1Ch
Am29DL163 = 18h
Am29DL164 = 10h
24
Am29DL16xD
May 26, 2004
COMMAND DEFINITIONS
Writing specific address and data commands or se-
quences into the command register initiates device
operations. Table 14 defines the valid register com-
mand sequences. Writing incorrect address and
data values or writing them in the improper se-
quence may place the device in an unknown state. A
reset command is then required to return the device to
reading array data.
the program command sequence is written to a bank
that is in the Erase Suspend mode, writing the reset
command returns that bank to the erase-sus-
pend-read mode. Once programming begins, however,
the device ignores reset commands until the operation
is complete.
The reset command may be written between the se-
quence cycles in an autoselect command sequence.
Once in the autoselect mode, the reset command
must be written to return to reading array data. If a
bank entered the autoselect mode while in the Erase
Suspend mode, writing the reset command returns
that bank to the erase-suspend-read mode.
All addresses are latched on the falling edge of WE#
or CE#, whichever happens later. All data is latched on
the rising edge of WE# or CE#, whichever happens
first. Refer to the AC Characteristics section for timing
diagrams.
If DQ5 goes high during a program or erase operation,
writing the reset command returns the banks to read-
ing array data (or erase-suspend-read mode if that
bank was in Erase Suspend).
Reading Array Data
The device is automatically set to reading array data
after device power-up. No commands are required to
retrieve data. Each bank is ready to read array data
after completing an Embedded Program or Embedded
Erase algorithm.
Autoselect Command Sequence
The autoselect command sequence allows the host
system to access the manufacturer and device codes,
and determine whether or not a sector is protected.
Table 14 shows the address and data requirements.
This method is an alternative to that shown in Table 7,
which is intended for PROM programmers and re-
quires VID on address pin A9. The autoselect
command sequence may be written to an address
within a bank that is either in the read or
erase-suspend-read mode. The autoselect command
may not be written while the device is actively pro-
gramming or erasing in the other bank.
After the device accepts an Erase Suspend command,
the corresponding bank enters the erase-sus-
pend-read mode, after which the system can read
data from any non-erase-suspended sector within the
same bank. After completing a programming operation
in the Erase Suspend mode, the system may once
again read array data with the same exception. See
the Erase Suspend/Erase Resume Commands sec-
tion for more information.
The system must issue the reset command to return a
bank to the read (or erase-suspend-read) mode if DQ5
goes high during an active program or erase opera-
tion, or if the bank is in the autoselect mode. See the
next section, Reset Command, for more information.
The autoselect command sequence is initiated by first
writing two unlock cycles. This is followed by a third
write cycle that contains the bank address and the au-
toselect command. The bank then enters the
autoselect mode. The system may read at any ad-
dress within the same bank any number of times
without initiating another autoselect command
sequence:
See also Requirements for Reading Array Data in the
Device Bus Operations section for more information.
The Read-Only Operations table provides the read pa-
rameters, and Figure 13 shows the timing diagram.
Reset Command
Writing the reset command resets the banks to the
read or erase-suspend-read mode. Address bits are
don’t cares for this command.
■ A read cycle at address (BA)XX00h (where BA is
the bank address) returns the manufacturer code.
■ A read cycle at address (BA)XX01h in word mode
(or (BA)XX02h in byte mode) returns the device
code.
The reset command may be written between the se-
quence cycles in an erase command sequence before
erasing begins. This resets the bank to which the sys-
tem was writing to reading array data. Once erasure
begins, however, the device ignores reset commands
until the operation is complete.
■ A read cycle to an address containing a sector ad-
dress (SA) within the same bank, and the address
02h on A7–A0 in word mode (or the address 04h on
A6–A-1 in byte mode) returns 01h if the sector is
protected, or 00h if it is unprotected. (Refer to Ta-
bles 3–6 for valid sector addresses).
The reset command may be written between the
sequence cycles in a program command sequence
before programming begins. This resets the bank to
which the system was writing to reading array data. If
The system must write the reset command to return to
reading array data (or erase-suspend-read mode if the
bank was previously in Erase Suspend).
May 26, 2004
Am29DL16xD
25
DQ6 status bits to indicate the operation was success-
ful. However, a succeeding read will show that the
data is still “0.” Only erase operations can convert a “0”
to a “1.”
Enter SecSi™ Sector/Exit SecSi Sector
Command Sequence
The system can access the SecSi Sector region by is-
suing the three-cycle Enter SecSi Sector command
sequence. The device continues to access the SecSi
Sector region until the system issues the four-cycle
Exit SecSi Sector command sequence. The Exit SecSi
Sector command sequence returns the device to nor-
mal operation. Table 14 shows the address and data
requirements for both command sequences. See also
“SecSi Sector Flash Memory Region” for further infor-
mation. Note that a hardware reset (RESET#=VIL) will
reset the device to reading array data.
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to pro-
gram bytes or words to a bank faster than using the
standard program command sequence. The unlock
bypass command sequence is initiated by first writing
two unlock cycles. This is followed by a third write
cycle containing the unlock bypass command, 20h.
The device then enters the unlock bypass mode. A
two-cycle unlock bypass program command sequence
is all that is required to program in this mode. The first
cycle in this sequence contains the unlock bypass pro-
gram command, A0h; the second cycle contains the
program address and data. Additional data is pro-
grammed in the same manner. This mode dispenses
with the initial two unlock cycles required in the stan-
dard program command sequence, resulting in faster
total programming time. Table 14 shows the require-
ments for the command sequence.
Byte/Word Program Command Sequence
The system may program the device by word or byte,
depending on the state of the BYTE# pin. Program-
ming is a four-bus-cycle operation. The program
command sequence is initiated by writing two unlock
write cycles, followed by the program set-up com-
mand. The program address and data are written next,
which in turn initiate the Embedded Program algo-
rithm. The system is not required to provide further
controls or timings. The device automatically provides
internally generated program pulses and verifies the
programmed cell margin. Table 14 shows the address
and data requirements for the byte program command
sequence.
During the unlock bypass mode, only the Unlock By-
pass Program and Unlock Bypass Reset commands
are valid. To exit the unlock bypass mode, the system
must issue the two-cycle unlock bypass reset com-
mand sequence. The device then returns to reading
array data.
When the Embedded Program algorithm is complete,
that bank then returns to reading array data and ad-
dresses are no longer latched. The system can
determine the status of the program operation by
using DQ7, DQ6, or RY/BY#. Refer to the Write Oper-
ation Status section for information on these status
bits.
The device offers accelerated program operations
through the WP#/ACC pin. When the system asserts
VHH on the WP#/ACC pin, the device automatically en-
ters the Unlock Bypass mode. The system may then
write the two-cycle Unlock Bypass program command
sequence. The device uses the higher voltage on the
WP#/ACC pin to accelerate the operation. Note that
the WP#/ACC pin must not be at VHH any operation
other than accelerated programming, or device dam-
age may result. In addition, the WP#/ACC pin must not
be left floating or unconnected; inconsistent behavior
of the device may result.
Any commands written to the device during the Em-
bedded Program Algorithm are ignored. Note that a
hardware reset immediately terminates the program
operation. The program command sequence should
be reinitiated once that bank has returned to reading
array data, to ensure data integrity.
Figure 3 illustrates the algorithm for the program oper-
ation. Refer to the Erase and Program Operations
table in the AC Characteristics section for parameters,
and Figure 17 for timing diagrams.
Programming is allowed in any sequence and across
sector boundaries. A bit cannot be programmed
from “0” back to a “1.” Attempting to do so may
cause that bank to set DQ5 = 1, or cause the DQ7 and
26
Am29DL16xD
May 26, 2004
mediately terminates the erase operation. If that
occurs, the chip erase command sequence should be
reinitiated once that bank has returned to reading
array data, to ensure data integrity.
START
Figure 4 illustrates the algorithm for the erase opera-
tion. Refer to the Erase and Program Operations
tables in the AC Characteristics section for parame-
ters, and Figure 19 section for timing diagrams.
Write Program
Command Sequence
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector
erase command sequence is initiated by writing two
unlock cycles, followed by a set-up command. Two ad-
ditional unlock cycles are written, and are then
followed by the address of the sector to be erased, and
the sector erase command. Table 14 shows the ad-
dress and data requirements for the sector erase
command sequence.
Data Poll
from System
Embedded
Program
algorithm
in progress
Verify Data?
Yes
No
The device does not require the system to preprogram
prior to erase. The Embedded Erase algorithm auto-
matically programs and verifies the entire memory for
an all zero data pattern prior to electrical erase. The
system is not required to provide any controls or tim-
ings during these operations.
No
Increment Address
Last Address?
Yes
After the command sequence is written, a sector erase
time-out of 50 µs occurs. During the time-out period,
additional sector addresses and sector erase com-
mands within the bank may be written. Loading the
sector erase buffer may be done in any sequence, and
the number of sectors may be from one sector to all
sectors. The time between these additional cycles
must be less than 50 µs, otherwise erasure may begin.
Any sector erase address and command following the
exceeded time-out may or may not be accepted. It is
recommended that processor interrupts be disabled
during this time to ensure all commands are accepted.
The interrupts can be re-enabled after the last Sector
Erase command is written. Any command other than
Sector Erase or Erase Suspend during the
time-out period resets that bank to reading array
data. The system must rewrite the command se-
quence and any additional addresses and commands.
Programming
Completed
Note: See Table 14 for program command sequence.
Figure 3. Program Operation
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase
command sequence is initiated by writing two unlock
cycles, followed by a set-up command. Two additional
unlock write cycles are then followed by the chip erase
command, which in turn invokes the Embedded Erase
algorithm. The device does not require the system to
preprogram prior to erase. The Embedded Erase algo-
rithm automatically preprograms and verifies the entire
memory for an all zero data pattern prior to electrical
erase. The system is not required to provide any con-
trols or timings during these operations. Table 14
shows the address and data requirements for the chip
erase command sequence.
The system can monitor DQ3 to determine if the sec-
tor erase timer has timed out (See the section on DQ3:
Sector Erase Timer.). The time-out begins from the ris-
ing edge of the final WE# pulse in the command
sequence.
When the Embedded Erase algorithm is complete,
that bank returns to reading array data and addresses
are no longer latched. The system can determine the
status of the erase operation by using DQ7, DQ6,
DQ2, or RY/BY#. Refer to the Write Operation Status
section for information on these status bits.
When the Embedded Erase algorithm is complete, the
bank returns to reading array data and addresses are
no longer latched. Note that while the Embedded
Erase operation is in progress, the system can read
data from the non-erasing bank. The system can de-
termine the status of the erase operation by reading
DQ7, DQ6, DQ2, or RY/BY# in the erasing bank. Refer
Any commands written during the chip erase operation
are ignored. However, note that a hardware reset im-
May 26, 2004
Am29DL16xD
27
to the Write Operation Status section for information
on these status bits.
program operation using the DQ7 or DQ6 status bits,
just as in the standard Byte Program operation.
Refer to the Write Operation Status section for more
information.
Once the sector erase operation has begun, only the
Erase Suspend command is valid. All other com-
mands are ignored. However, note that a hardware
reset immediately terminates the erase operation. If
that occurs, the sector erase command sequence
should be reinitiated once that bank has returned to
reading array data, to ensure data integrity.
In the erase-suspend-read mode, the system can also
issue the autoselect command sequence. Refer to the
Autoselect Mode and Autoselect Command Sequence
sections for details.
To resume the sector erase operation, the system
must write the Erase Resume command. The bank
address of the erase-suspended bank is required
when writing this command. Further writes of the Re-
sume command are ignored. Another Erase Suspend
command can be written after the chip has resumed
erasing.
Figure 4 illustrates the algorithm for the erase opera-
tion. Refer to the Erase and Program Operations
tables in the AC Characteristics section for parame-
ters, and Figure 19 section for timing diagrams.
Erase Suspend/Erase Resume
Commands
The Erase Suspend command, B0h, allows the sys-
tem to interrupt a sector erase operation and then read
data from, or program data to, any sector not selected
for erasure. The bank address is required when writing
this command. This command is valid only during the
sector erase operation, including the 50 µs time-out
period during the sector erase command sequence.
The Erase Suspend command is ignored if written dur-
ing the chip erase operation or Embedded Program
algorithm.
START
Write Erase
Command Sequence
(Notes 1, 2)
When the Erase Suspend command is written during
the sector erase operation, the device requires a max-
imum of 20 µs to suspend the erase operation.
However, when the Erase Suspend command is writ-
ten during the sector erase time-out, the device
immediately terminates the time-out period and sus-
pends the erase operation.
Data Poll to Erasing
Bank from System
Embedded
Erase
algorithm
in progress
No
Data = FFh?
After the erase operation has been suspended, the
bank enters the erase-suspend-read mode. The sys-
tem can read data from or program data to any sector
not selected for erasure. (The device “erase sus-
pends” all sectors selected for erasure.) Reading at
any address within erase-suspended sectors pro-
duces status information on DQ7–DQ0. The system
can use DQ7, or DQ6 and DQ2 together, to determine
if a sector is actively erasing or is erase-suspended.
Refer to the Write Operation Status section for infor-
mation on these status bits.
Yes
Erasure Completed
Notes:
1. See Table 14 for erase command sequence.
2. See the section on DQ3 for information on the sector
erase timer.
After an erase-suspended program operation is com-
plete, the bank returns to the erase-suspend-read
mode. The system can determine the status of the
Figure 4. Erase Operation
28
Am29DL16xD
May 26, 2004
Command Definitions
Table 14. Am29DL16xD Command Definitions
Bus Cycles (Notes 2–5)
Command
Sequence
(Note 1)
First
Second
Third
Addr
Fourth
Fifth
Sixth
Addr Data Addr Data
Data
Addr
Data
Addr Data Addr Data
Read (Note 6)
Reset (Note 7)
1
1
RA
XXX
555
AAA
555
AAA
555
AAA
555
AAA
555
AAA
555
AAA
555
AAA
555
AAA
XXX
XXX
555
AAA
555
AAA
BA
RD
F0
Word
Manufacturer ID
Byte
2AA
555
2AA
555
2AA
555
2AA
555
2AA
555
2AA
555
2AA
555
2AA
555
PA
(BA)555
(BA)AAA
(BA)555
(BA)AAA
(BA)555
(BA)AAA
(BA)555
(BA)AAA
555
4
4
4
4
3
4
4
3
AA
AA
AA
AA
AA
AA
AA
AA
55
55
55
55
55
55
55
55
90 (BA)X00
01
Word
(BA)X01
90
(see
Table 7)
Device ID
Byte
(BA)X02
Word
Byte
Word
Byte
Word
Byte
Word
Byte
Word
Byte
Word
Byte
(BA)X03
90
SecSi™ Factory
Protect (Note 9)
81/01
00/01
(BA)X06
(SA)X02
90
Sector Protect Verify
(Note 10)
(SA)X04
Enter SecSi Sector Region
Exit SecSi Sector Region
Program
88
AAA
555
90
A0
20
XXX
PA
00
AAA
555
PD
AAA
555
Unlock Bypass
AAA
Unlock Bypass Program (Note 11)
Unlock Bypass Reset (Note 12)
2
2
A0
90
PD
00
XXX
2AA
555
2AA
555
Word
555
AAA
555
555
AAA
555
2AA
555
2AA
555
555
Chip Erase
Byte
6
6
AA
AA
55
55
80
80
AA
AA
55
55
10
30
AAA
Word
Sector Erase
Byte
SA
AAA
AAA
Erase Suspend (Note 13)
Erase Resume (Note 14)
1
1
B0
30
BA
Word
CFI Query (Note 15)
Byte
55
1
98
AA
Legend:
X = Don’t care
RA = Address of the memory location to be read.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed. Addresses
latch on the falling edge of the WE# or CE# pulse, whichever happens
later.
PD = Data to be programmed at location PA. Data latches on the rising
edge of WE# or CE# pulse, whichever happens first.
SA = Address of the sector to be verified (in autoselect mode) or
erased. Address bits A19–A12 uniquely select any sector.
BA = Address of the bank that is being switched to autoselect mode, is
in bypass mode, or is being erased.
Notes:
1. See Table 1 for description of bus operations.
8. The fourth cycle of the autoselect command sequence is a read
cycle. The system must provide the bank address to obtain the
manufacturer ID, device ID, or SecSi Sector factory protect
information. Data bits DQ15–DQ8 are don’t care. See the
Autoselect Command Sequence section for more information.
2. All values are in hexadecimal.
3. Except for the read cycle and the fourth cycle of the autoselect
command sequence, all bus cycles are write cycles.
4. Data bits DQ15–DQ8 are don’t care in command sequences,
except for RD and PD.
9. The data is 81h for factory locked and 01h for not factory locked.
10. The data is 00h for an unprotected sector/sector block and 01h for
a protected sector/sector block.
5. Unless otherwise noted, address bits A19–A11 are don’t cares.
6. No unlock or command cycles required when bank is reading
array data.
11. The Unlock Bypass command is required prior to the Unlock
Bypass Program command.
7. The Reset command is required to return to reading array data
(or to the erase-suspend-read mode if previously in Erase
Suspend) when a bank is in the autoselect mode, or if DQ5 goes
high (while the bank is providing status information).
12. The Unlock Bypass Reset command is required to return to
reading array data when the bank is in the unlock bypass mode.
13. The system may read and program in non-erasing sectors, or
enter the autoselect mode, when in the Erase Suspend mode.
The Erase Suspend command is valid only during a sector erase
operation, and requires the bank address.
14. The Erase Resume command is valid only during the Erase
May 26, 2004
Am29DL16xD
29
WRITE OPERATION STATUS
The device provides several bits to determine the sta-
tus of a program or erase operation: DQ2, DQ3, DQ5,
DQ6, and DQ7. Table 15 and the following subsec-
tions describe the function of these bits. DQ7 and DQ6
each offer a method for determining whether a pro-
gram or erase operation is complete or in progress.
The device also provides a hardware-based output
signal, RY/BY#, to determine whether an Embedded
Program or Erase operation is in progress or has been
completed.
pleted the program or erase operation and DQ7 has
valid data, the data outputs on DQ0–DQ6 may be still
invalid. Valid data on DQ0–DQ7 will appear on suc-
cessive read cycles.
Table 15 shows the outputs for Data# Polling on DQ7.
Figure 5 shows the Data# Polling algorithm. Figure 21
in the AC Characteristics section shows the Data#
Polling timing diagram.
DQ7: Data# Polling
START
The Data# Polling bit, DQ7, indicates to the host sys-
tem whether an Embedded Program or Erase
algorithm is in progress or completed, or whether a
bank is in Erase Suspend. Data# Polling is valid after
the rising edge of the final WE# pulse in the command
sequence.
Read DQ7–DQ0
Addr = VA
During the Embedded Program algorithm, the device
outputs on DQ7 the complement of the datum pro-
grammed to DQ7. This DQ7 status also applies to
programming during Erase Suspend. When the Em-
bedded Program algorithm is complete, the device
outputs the datum programmed to DQ7. The system
must provide the program address to read valid status
information on DQ7. If a program address falls within a
protected sector, Data# Polling on DQ7 is active for
approximately 1 µs, then that bank returns to reading
array data.
Yes
DQ7 = Data?
No
No
DQ5 = 1?
Yes
During the Embedded Erase algorithm, Data# Polling
produces a “0” on DQ7. When the Embedded Erase
algorithm is complete, or if the bank enters the Erase
Suspend mode, Data# Polling produces a “1” on DQ7.
The system must provide an address within any of the
sectors selected for erasure to read valid status infor-
mation on DQ7.
Read DQ7–DQ0
Addr = VA
Yes
DQ7 = Data?
After an erase command sequence is written, if all
sectors selected for erasing are protected, Data# Poll-
ing on DQ7 is active for approximately 100 µs, then the
bank returns to reading array data. If not all selected
sectors are protected, the Embedded Erase algorithm
erases the unprotected sectors, and ignores the se-
lected sectors that are protected. However, if the
system reads DQ7 at an address within a protected
sector, the status may not be valid.
No
PASS
FAIL
Notes:
1. VA = Valid address for programming. During a sector
erase operation, a valid address is any sector address
within the sector being erased. During chip erase, a
valid address is any non-protected sector address.
Just prior to the completion of an Embedded Program
or Erase operation, DQ7 may change asynchronously
with DQ0–DQ6 while Output Enable (OE#) is asserted
low. That is, the device may change from providing
status information to valid data on DQ7. Depending on
when the system samples the DQ7 output, it may read
the status or valid data. Even if the device has com-
2. DQ7 should be rechecked even if DQ5 = “1” because
DQ7 may change simultaneously with DQ5.
Figure 5. Data# Polling Algorithm
30
Am29DL16xD
May 26, 2004
DQ6 also toggles during the erase-suspend-program
mode, and stops toggling once the Embedded Pro-
gram algorithm is complete.
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output pin
which indicates whether an Embedded Algorithm is in
progress or complete. The RY/BY# status is valid after
the rising edge of the final WE# pulse in the command
sequence. Since RY/BY# is an open-drain output, sev-
eral RY/BY# pins can be tied together in parallel with a
Table 15 shows the outputs for Toggle Bit I on DQ6.
Figure 6 shows the toggle bit algorithm. Figure 22 in
the “AC Characteristics” section shows the toggle bit
timing diagrams. Figure 23 shows the differences be-
tween DQ2 and DQ6 in graphical form. See also the
subsection on DQ2: Toggle Bit II.
pull-up resistor to VCC
.
If the output is low (Busy), the device is actively eras-
ing or programming. (This includes programming in
the Erase Suspend mode.) If the output is high
(Ready), the device is reading array data, the standby
mode, or one of the banks is in the erase-sus-
pend-read mode.
START
Table 15 shows the outputs for RY/BY#.
Read DQ7–DQ0
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded
Program or Erase algorithm is in progress or com-
plete, or whether the device has entered the Erase
Suspend mode. Toggle Bit I may be read at any ad-
dress, and is valid after the rising edge of the final
WE# pulse in the command sequence (prior to the
program or erase operation), and during the sector
erase time-out.
Read DQ7–DQ0
No
Toggle Bit
= Toggle?
During an Embedded Program or Erase algorithm op-
eration, successive read cycles to any address cause
DQ6 to toggle. The system may use either OE# or
CE# to control the read cycles. When the operation is
complete, DQ6 stops toggling.
Yes
No
DQ5 = 1?
Yes
After an erase command sequence is written, if all
sectors selected for erasing are protected, DQ6 tog-
gles for approximately 100 µs, then returns to reading
array data. If not all selected sectors are protected, the
Embedded Erase algorithm erases the unprotected
sectors, and ignores the selected sectors that are
protected.
Read DQ7–DQ0
Twice
The system can use DQ6 and DQ2 together to deter-
mine whether a sector is actively erasing or is
erase-suspended. When the device is actively erasing
(that is, the Embedded Erase algorithm is in progress),
DQ6 toggles. When the device enters the Erase Sus-
pend mode, DQ6 stops toggling. However, the system
must also use DQ2 to determine which sectors are
erasing or erase-suspended. Alternatively, the system
can use DQ7 (see the subsection on DQ7: Data#
Polling).
Toggle Bit
= Toggle?
No
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
Program/Erase
Operation Complete
Note: The system should recheck the toggle bit even if DQ5
= “1” because the toggle bit may stop toggling as DQ5
changes to “1.” See the subsections on DQ6 and DQ2 for
more information.
If a program address falls within a protected sector,
DQ6 toggles for approximately 1 µs after the program
command sequence is written, then returns to reading
array data.
Figure 6. Toggle Bit Algorithm
May 26, 2004
Am29DL16xD
31
cles, determining the status as described in the
previous paragraph. Alternatively, it may choose to
perform other system tasks. In this case, the system
must start at the beginning of the algorithm when it re-
turns to determine the status of the operation (top of
Figure 6).
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with DQ6, indi-
cates whether a particular sector is actively erasing
(that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit
II is valid after the rising edge of the final WE# pulse in
the command sequence.
DQ5: Exceeded Timing Limits
DQ2 toggles when the system reads at addresses
within those sectors that have been selected for era-
sure. (The system may use either OE# or CE# to
control the read cycles.) But DQ2 cannot distinguish
whether the sector is actively erasing or is erase-sus-
pended. DQ6, by comparison, indicates whether the
device is actively erasing, or is in Erase Suspend, but
cannot distinguish which sectors are selected for era-
sure. Thus, both status bits are required for sector and
mode information. Refer to Table 15 to compare out-
puts for DQ2 and DQ6.
DQ5 indicates whether the program or erase time
has exceeded a specified internal pulse count limit.
Under these conditions DQ5 produces a “1,” indicating
that the program or erase cycle was not successfully
completed.
The device may output a “1” on DQ5 if the system tries
to program a “1” to a location that was previously pro-
grammed to “0.” Only an erase operation can
change a “0” back to a “1.” Under this condition, the
device halts the operation, and when the timing limit
has been exceeded, DQ5 produces a “1.”
Figure 6 shows the toggle bit algorithm in flowchart
form, and the section “DQ2: Toggle Bit II” explains the
algorithm. See also the DQ6: Toggle Bit I subsection.
Figure 22 shows the toggle bit timing diagram. Figure
23 shows the differences between DQ2 and DQ6 in
graphical form.
Under both these conditions, the system must write
the reset command to return to reading array data (or
to the erase-suspend-read mode if a bank was previ-
ously in the erase-suspend-program mode).
DQ3: Sector Erase Timer
Reading Toggle Bits DQ6/DQ2
After writing a sector erase command sequence, the
system may read DQ3 to determine whether or not
erasure has begun. (The sector erase timer does not
apply to the chip erase command.) If additional
sectors are selected for erasure, the entire time-out
also applies after each additional sector erase com-
mand. When the time-out period is complete, DQ3
switches from a “0” to a “1.” If the time between addi-
tional sector erase commands from the system can be
assumed to be less than 50 µs, the system need not
monitor DQ3. See also the Sector Erase Command
Sequence section.
Refer to Figure 6 for the following discussion. When-
ever the system initially begins reading toggle bit
status, it must read DQ7–DQ0 at least twice in a row
to determine whether a toggle bit is toggling. Typically,
the system would note and store the value of the tog-
gle bit after the first read. After the second read, the
system would compare the new value of the toggle bit
with the first. If the toggle bit is not toggling, the device
has completed the program or erase operation. The
system can read array data on DQ7–DQ0 on the fol-
lowing read cycle.
After the sector erase command is written, the system
should read the status of DQ7 (Data# Polling) or DQ6
(Toggle Bit I) to ensure that the device has accepted
the command sequence, and then read DQ3. If DQ3 is
“1,” the Embedded Erase algorithm has begun; all fur-
ther commands (except Erase Suspend) are ignored
until the erase operation is complete. If DQ3 is “0,” the
device will accept additional sector erase commands.
To ensure the command has been accepted, the sys-
tem software should check the status of DQ3 prior to
and following each subsequent sector erase com-
mand. If DQ3 is high on the second status check, the
last command might not have been accepted.
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the sys-
tem also should note whether the value of DQ5 is high
(see the section on DQ5). If it is, the system should
then determine again whether the toggle bit is tog-
gling, since the toggle bit may have stopped toggling
just as DQ5 went high. If the toggle bit is no longer
toggling, the device has successfully completed the
program or erase operation. If it is still toggling, the de-
vice did not completed the operation successfully, and
the system must write the reset command to return to
reading array data.
The remaining scenario is that the system initially de-
termines that the toggle bit is toggling and DQ5 has
not gone high. The system may continue to monitor
the toggle bit and DQ5 through successive read cy-
Table 15 shows the status of DQ3 relative to the other
status bits.
32
Am29DL16xD
May 26, 2004
Table 15. Write Operation Status
DQ7
DQ5
DQ2
Status
(Note 2)
DQ6
(Note 1)
DQ3
N/A
1
(Note 2)
RY/BY#
Embedded Program Algorithm
Embedded Erase Algorithm
Erase
Erase-Suspend-
Read
DQ7#
0
Toggle
Toggle
0
0
No toggle
Toggle
0
0
Standard
Mode
1
No toggle
0
N/A
Toggle
1
Suspended Sector
Erase
Suspend
Mode
Non-Erase
Suspended Sector
Data
Data
Data
0
Data
N/A
Data
N/A
1
0
Erase-Suspend-Program
DQ7#
Toggle
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits.
Refer to the section on DQ5 for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further
details.
3. When reading write operation status bits, the system must always provide the bank address where the Embedded Algorithm
is in progress. The device outputs array data if the system addresses a non-busy bank.
May 26, 2004
Am29DL16xD
33
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C
20 ns
20 ns
Ambient Temperature
with Power Applied. . . . . . . . . . . . . . –65°C to +125°C
+0.8 V
Voltage with Respect to Ground
–0.5 V
–2.0 V
V
CC (Note 1) . . . . . . . . . . . . . . . . .–0.5 V to +4.0 V
A9, OE#, and RESET#
(Note 2). . . . . . . . . . . . . . . . . . . .–0.5 V to +12.5 V
20 ns
WP#/ACC . . . . . . . . . . . . . . . . . .–0.5 V to +10.5 V
All other pins (Note 1) . . . . . . –0.5 V to VCC +0.5 V
Output Short Circuit Current (Note 3) . . . . . . 200 mA
Figure 7. Maximum Negative
Overshoot Waveform
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V.
During voltage transitions, input or I/O pins may
overshoot VSS to –2.0 V for periods of up to 20 ns.
Maximum DC voltage on input or I/O pins is VCC +0.5 V.
See Figure 7. During voltage transitions, input or I/O pins
may overshoot to VCC +2.0 V for periods up to 20 ns. See
Figure 8.
20 ns
VCC
+2.0 V
VCC
+0.5 V
2. Minimum DC input voltage on pins A9, OE#, RESET#,
and WP#/ACC is –0.5 V. During voltage transitions, A9,
OE#, WP#/ACC, and RESET# may overshoot VSS to
–2.0 V for periods of up to 20 ns. See Figure 7. Maximum
DC input voltage on pin A9 is +12.5 V which may
overshoot to +14.0 V for periods up to 20 ns. Maximum
DC input voltage on WP#/ACC is +9.5 V which may
overshoot to +12.0 V for periods up to 20 ns.
2.0 V
20 ns
20 ns
Figure 8. Maximum Positive
Overshoot Waveform
3. No more than one output may be shorted to ground at a
time. Duration of the short circuit should not be greater
than one second.
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This
is a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the
operational sections of this data sheet is not implied.
Exposure of the device to absolute maximum rating
conditions for extended periods may affect device reliability.
OPERATING RANGES
Industrial (I) Devices
Ambient Temperature (TA) . . . . . . . . . –40°C to +85°C
VCC Supply Voltages
VCC for standard voltage range . . . . . . .2.7 V to 3.6 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
34
Am29DL16xD
May 26, 2004
DC CHARACTERISTICS
CMOS Compatible
Parameter
Symbol
Parameter Description
Test Conditions
VIN = VSS to VCC
CC = VCC max
VCC = VCC max; A9 = 12.5 V
Min
Typ
Max
1.0
35
Unit
µA
,
ILI
Input Load Current
V
ILIT
A9 Input Load Current
Output Leakage Current
µA
V
OUT = VSS to VCC
,
ILO
1.0
µA
VCC = VCC max
5 MHz
1 MHz
5 MHz
1 MHz
10
2
16
4
CE# = VIL, OE# = VIH,
Byte Mode
VCC Active Read Current
(Notes 1, 2)
ICC1
mA
10
2
16
4
CE# = VIL, OE# = VIH,
Word Mode
ICC2
ICC3
ICC4
VCC Active Write Current (Notes 2, 3) CE# = VIL, OE# = VIH, WE# = VIL
15
0.2
0.2
30
5
mA
µA
µA
VCC Standby Current (Note 2)
VCC Reset Current (Note 2)
CE#, RESET# = VCC 0.3 V
RESET# = VSS 0.3 V
5
VIH = VCC 0.3 V;
VIL = VSS 0.3 V
ICC5
Automatic Sleep Mode (Notes 2, 4)
0.2
5
µA
Byte
21
21
21
21
45
45
45
45
VCC Active Read-While-Program
Current (Notes 1, 2)
ICC6
CE# = VIL, OE# = VIH
CE# = VIL, OE# = VIH
mA
Word
Byte
VCC Active Read-While-Erase
Current (Notes 1, 2)
ICC7
ICC8
IACC
mA
mA
Word
VCC Active
Program-While-Erase-Suspended
Current (Notes 2, 5)
CE# = VIL, OE# = VIH
CE# = VIL, OE# = VIH
17
35
ACC pin
5
10
30
mA
mA
V
ACC Accelerated Program Current,
Word or Byte
V
CC pin
15
VIL
VIH
Input Low Voltage
Input High Voltage
–0.5
0.8
0.7 x VCC
VCC + 0.3
V
Voltage for WP#/ACC Sector
Protect/Unprotect and Program
Acceleration
VHH
V
CC = 3.0 V 10%
CC = 3.0 V 10%
8.5
8.5
9.5
V
V
Voltage for Autoselect and Temporary
Sector Unprotect
VID
V
12.5
0.45
VOL
VOH1
VOH2
VLKO
Output Low Voltage
IOL = 4.0 mA, VCC = VCC min
OH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
V
V
I
0.85 VCC
VCC–0.4
2.3
Output High Voltage
Low VCC Lock-Out Voltage (Note 5)
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode current is
200 nA.
5. Not 100% tested.
May 26, 2004
Am29DL16xD
35
DC CHARACTERISTICS
Zero-Power Flash
25
20
15
10
5
0
0
500
1000
1500
2000
2500
3000
3500
4000
Time in ns
Note: Addresses are switching at 1 MHz
Figure 9. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents)
12
10
8
3.6 V
2.7 V
6
4
2
0
1
2
3
4
5
Frequency in MHz
Note: T = 25 °C
Figure 10. Typical ICC1 vs. Frequency
36
Am29DL16xD
May 26, 2004
TEST CONDITIONS
Table 16. Test Specifications
3.3 V
Test Condition
70, 80
90, 120 Unit
Output Load
1 TTL gate
2.7 kΩ
Device
Under
Test
Output Load Capacitance, CL
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
Input Pulse Levels
5
0.0–3.0
ns
V
C
L
6.2 kΩ
Input timing measurement
reference levels
1.5
1.5
V
V
Output timing measurement
reference levels
Note: Diodes are IN3064 or equivalent
Figure 11. Test Setup
Key To Switching Waveforms
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Does Not Apply
Changing, State Unknown
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
1.5 V
1.5 V
Input
Measurement Level
Output
Figure 12. Input Waveforms and Measurement Levels
May 26, 2004
Am29DL16xD
37
AC CHARACTERISTICS
Read-Only Operations
Parameter
Speed Options
JEDEC Std Description
Test Setup
70
70
70
70
30
16
16
80
80
80
80
30
16
16
90
90
90
90
40
16
16
120 Unit
tAVAV
tAVQV
tELQV
tGLQV
tEHQZ
tGHQZ
tRC Read Cycle Time (Note 1)
Min
Max
Max
Max
Max
Max
120
120
120
50
ns
ns
ns
ns
ns
ns
tACC Address to Output Delay
CE#, OE# = VIL
OE# = VIL
tCE Chip Enable to Output Delay
tOE Output Enable to Output Delay
tDF Chip Enable to Output High Z (Notes 1, 3)
tDF Output Enable to Output High Z (Notes 1, 3)
16
16
Output Hold Time From Addresses, CE# or
OE#, Whichever Occurs First
tAXQX
tOH
Min
Min
Min
0
0
ns
ns
ns
Read
Output Enable Hold
tOEH
Toggle and
Data# Polling
Time (Note 1)
10
Notes:
1. Not 100% tested.
2. See Figure 11 and Table 16 for test specifications.
3. Measurements performed by placing a 50-ohm termination on the data pin with a bias of VCC/2. The time from OE# high to
the data bus driven to VCC/2 is taken as tDF.
tRC
Addresses Stable
tACC
Addresses
CE#
tRH
tRH
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Output Valid
Outputs
RESET#
RY/BY#
0 V
Figure 13. Read Operation Timings
38
Am29DL16xD
May 26, 2004
AC CHARACTERISTICS
Hardware Reset (RESET#)
Parameter
JEDEC
Std
Description
All Speed Options
Unit
RESET# Pin Low (During Embedded Algorithms)
to Read Mode (See Note)
tReady
Max
Max
20
µs
RESET# Pin Low (NOT During Embedded
Algorithms) to Read Mode (See Note)
tReady
500
ns
tRP
tRH
tRPD
tRB
RESET# Pulse Width
Min
Min
Min
Min
500
50
20
0
ns
ns
µs
ns
Reset High Time Before Read (See Note)
RESET# Low to Standby Mode
RY/BY# Recovery Time
Note: Not 100% tested.
RY/BY#
CE#, OE#
RESET#
tRH
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
tReady
RY/BY#
tRB
CE#, OE#
RESET#
tRP
Figure 14. Reset Timings
May 26, 2004
Am29DL16xD
39
AC CHARACTERISTICS
Word/Byte Configuration (BYTE#)
Parameter
Speed Options
JEDEC
Std
tELFL/ ELFH
tFLQZ
tFHQV
Description
70
80
90
120
Unit
ns
t
CE# to BYTE# Switching Low or High
BYTE# Switching Low to Output HIGH Z
BYTE# Switching High to Output Active
Max
Max
Min
5
25
70
25
80
30
90
30
ns
120
ns
CE#
OE#
BYTE#
tELFL
Data Output
(DQ0–DQ14)
Data Output
(DQ0–DQ7)
BYTE#
Switching
from word
to byte
DQ0–DQ14
Address
Input
DQ15
Output
mode
DQ15/A-1
tFLQZ
tELFH
BYTE#
BYTE#
Switching
from byte
to word
Data Output
(DQ0–DQ7)
Data Output
(DQ0–DQ14)
DQ0–DQ14
DQ15/A-1
mode
Address
Input
DQ15
Output
tFHQV
Figure 15. BYTE# Timings for Read Operations
CE#
The falling edge of the last WE# signal
WE#
BYTE#
tSET
(tAS
)
tHOLD (tAH
)
Note: Refer to the Erase/Program Operations table for tAS and tAH specifications.
Figure 16. BYTE# Timings for Write Operations
Am29DL16xD
40
May 26, 2004
AC CHARACTERISTICS
Erase and Program Operations
Parameter
Speed Options
JEDEC
tAVAV
Std
tWC
tAS
Description
70
80
90
120
Unit
ns
Write Cycle Time (Note 1)
Address Setup Time
Min
Min
70
80
90
120
tAVWL
0
ns
Address Setup Time to OE# low during toggle bit
polling
tASO
tAH
Min
Min
Min
15
45
15
45
15
45
15
50
ns
ns
ns
tWLAX
Address Hold Time
Address Hold Time From CE# or OE# high
during toggle bit polling
tAHT
0
0
0
tDVWH
tWHDX
tDS
tDH
Data Setup Time
Min
Min
Min
35
20
35
20
45
20
50
20
ns
ns
ns
Data Hold Time
tOEPH
Output Enable High during toggle bit polling
Read Recovery Time Before Write
(OE# High to WE# Low)
tGHWL
tGHWL
Min
ns
tELWL
tWHEH
tWLWH
tWHDL
tCS
tCH
CE# Setup Time
Min
Min
Min
Min
Min
Typ
Typ
0
0
ns
ns
ns
ns
ns
CE# Hold Time
tWP
Write Pulse Width
30
30
30
30
35
30
50
30
tWPH
tSR/W
Write Pulse Width High
Latency Between Read and Write Operations
Byte
0
5
7
tWHWH1
tWHWH1 Programming Operation (Note 2)
µs
µs
Word
Accelerated Programming Operation,
Word or Byte (Note 2)
tWHWH1
tWHWH2
tWHWH1
Typ
4
tWHWH2 Sector Erase Operation (Note 2)
Typ
Min
Min
Min
0.7
50
0
sec
µs
tVCS
tRB
VCC Setup Time (Note 1)
Write Recovery Time from RY/BY#
Program/Erase Valid to RY/BY# Delay
ns
tBUSY
90
ns
Notes:
1. Not 100% tested.
2. See the “Erase And Programming Performance” section for more information.
May 26, 2004
Am29DL16xD
41
AC CHARACTERISTICS
Program Command Sequence (last two cycles)
Read Status Data (last two cycles)
tAS
PA
tWC
Addresses
555h
PA
PA
tAH
CE#
OE#
tCH
tWHWH1
tWP
WE#
Data
tWPH
tCS
tDS
tDH
PD
DOUT
A0h
Status
tBUSY
tRB
RY/BY#
VCC
tVCS
Notes:
1. PA = program address, PD = program data, DOUT is the true data at the program address.
2. Illustration shows device in word mode.
Figure 17. Program Operation Timings
VHH
VIL or VIH
WP#/ACC
VIL or VIH
tVHH
tVHH
Figure 18. Accelerated Program Timing Diagram
42
Am29DL16xD
May 26, 2004
AC CHARACTERISTICS
Erase Command Sequence (last two cycles)
Read Status Data
VA
tAS
SA
tWC
VA
Addresses
CE#
2AAh
555h for chip erase
tAH
tCH
OE#
tWP
WE#
tWPH
tWHWH2
tCS
tDS
tDH
In
Data
Complete
55h
30h
Progress
10 for Chip Erase
tBUSY
tRB
RY/BY#
VCC
tVCS
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”).
2. These waveforms are for the word mode.
Figure 19. Chip/Sector Erase Operation Timings
May 26, 2004
Am29DL16xD
43
AC CHARACTERISTICS
tWC
Valid PA
tWC
tRC
tWC
Valid PA
Valid RA
Valid PA
Addresses
tAH
tCPH
tACC
tCE
CE#
tCP
tOE
OE#
tOEH
tGHWL
tWP
WE#
tDF
tWPH
tDS
tOH
tDH
Valid
Out
Valid
In
Valid
In
Valid
In
Data
tSR/W
WE# Controlled Write Cycle
Read Cycle
CE# Controlled Write Cycles
Figure 20. Back-to-back Read/Write Cycle Timings
tRC
Addresses
CE#
VA
tACC
tCE
VA
VA
tCH
tOE
OE#
WE#
tOEH
tDF
tOH
High Z
High Z
DQ7
Valid Data
Complement
Complement
True
DQ0–DQ6
Valid Data
Status Data
True
Status Data
tBUSY
RY/BY#
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data
read cycle.
Figure 21. Data# Polling Timings (During Embedded Algorithms)
44
Am29DL16xD
May 26, 2004
AC CHARACTERISTICS
tAHT
tAS
Addresses
tAHT
tASO
CE#
tOEH
WE#
tCEPH
tOEPH
OE#
tDH
Valid Data
tOE
Valid
Status
Valid
Status
Valid
Status
DQ6/DQ2
Valid Data
(first read)
(second read)
(stops toggling)
RY/BY#
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read
cycle, and array data read cycle
Figure 22. Toggle Bit Timings (During Embedded Algorithms)
Enter
Embedded
Erasing
Erase
Suspend
Enter Erase
Suspend Program
Erase
Resume
Erase
Erase Suspend
Read
Erase
Suspend
Program
Erase
Complete
WE#
Erase
Erase Suspend
Read
DQ6
DQ2
Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE# or CE# to toggle
DQ2 and DQ6.
Figure 23. DQ2 vs. DQ6
May 26, 2004
Am29DL16xD
45
AC CHARACTERISTICS
Temporary Sector/Sector Block Unprotect
Parameter
JEDEC
Std
tVIDR
tVHH
Description
All Speed Options
Unit
ns
VID Rise and Fall Time (See Note)
VHH Rise and Fall Time (See Note)
Min
Min
500
250
ns
RESET# Setup Time for Temporary
Sector/Sector Block Unprotect
tRSP
Min
Min
4
4
µs
µs
RESET# Hold Time from RY/BY# High for
Temporary Sector/Sector Block Unprotect
tRRB
Note: Not 100% tested.
VID
VID
RESET#
VSS, VIL,
or VIH
VSS, VIL,
or VIH
tVIDR
tVIDR
Program or Erase Command Sequence
CE#
WE#
tRRB
tRSP
RY/BY#
Figure 24. Temporary Sector/Sector Block Unprotect Timing Diagram
46
Am29DL16xD
May 26, 2004
AC CHARACTERISTICS
VID
VIH
RESET#
SA, A6,
A1, A0
Valid*
Valid*
Valid*
Status
Sector/Sector Block Protect or Unprotect
60h 60h
Verify
40h
Data
Sector/Sector Block Protect: 150 µs,
Sector/Sector Block Unprotect: 15 ms
1 µs
CE#
WE#
OE#
* For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.
Figure 25. Sector/Sector Block Protect and Unprotect Timing Diagram
May 26, 2004
Am29DL16xD
47
AC CHARACTERISTICS
Alternate CE# Controlled Erase and Program Operations
Parameter
Speed Options
JEDEC
tAVAV
Std
tWC
tAS
Description
70
80
90
120
Unit
ns
Write Cycle Time (Note 1)
Address Setup Time
Address Hold Time
Data Setup Time
Data Hold Time
Min
Min
Min
Min
Min
70
80
90
120
tAVWL
tELAX
tDVEH
tEHDX
0
ns
tAH
tDS
tDH
45
35
45
35
45
45
50
50
ns
ns
0
0
ns
Read Recovery Time Before Write
(OE# High to WE# Low)
tGHEL
tGHEL
Min
ns
tWLEL
tEHWH
tELEH
tEHEL
tWS
tWH
tCP
WE# Setup Time
WE# Hold Time
Min
Min
Min
Min
Typ
Typ
0
0
ns
ns
ns
ns
CE# Pulse Width
CE# Pulse Width High
30
30
30
30
45
30
50
30
tCPH
Byte
5
7
Programming Operation
(Note 2)
tWHWH1
tWHWH1
µs
Word
Accelerated Programming Operation,
Word or Byte (Note 2)
tWHWH1
tWHWH2
Notes:
tWHWH1
Typ
Typ
4
µs
tWHWH2 Sector Erase Operation (Note 2)
0.7
sec
1. Not 100% tested.
2. See the “Erase And Programming Performance” section for more information.
48
Am29DL16xD
May 26, 2004
AC CHARACTERISTICS
555 for program
PA for program
2AA for erase
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tWH
tAS
tAH
WE#
OE#
tGHEL
tWHWH1 or 2
tCP
CE#
Data
tWS
tCPH
tDS
tBUSY
tDH
DQ7#
DOUT
tRH
A0 for program
55 for erase
PD for program
30 for sector erase
10 for chip erase
RESET#
RY/BY#
Notes:
1. Figure indicates last two bus cycles of a program or erase operation.
2. PA = program address, SA = sector address, PD = program data.
3. DQ7# is the complement of the data written to the device. DOUT is the data written to the device.
4. Waveforms are for the word mode.
Figure 26. Alternate CE# Controlled Write (Erase/Program) Operation Timings
May 26, 2004
Am29DL16xD
49
ERASE AND PROGRAMMING PERFORMANCE
Parameter
Typ (Note 1) Max (Note 2)
Unit
sec
sec
µs
Comments
Sector Erase Time
0.7
27
5
15
Excludes 00h programming
prior to erasure (Note 4)
Chip Erase Time
Byte Program Time
Word Program Time
Accelerated Byte/Word Program Time
150
210
120
27
7
µs
Excludes system level
overhead (Note 5)
4
µs
Byte Mode
Word Mode
9
Chip Program Time
(Note 3)
sec
6
18
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 1,000,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table
14 for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.
LATCHUP CHARACTERISTICS
Description
Min
Max
Input voltage with respect to VSS on all pins except I/O pins
(including A9, OE#, and RESET#)
–1.0 V
12.5 V
Input voltage with respect to VSS on all I/O pins
–1.0 V
VCC + 1.0 V
+100 mA
V
CC Current
–100 mA
Note: Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time.
PACKAGE AND PIN CAPACITANCE
Parameter Symbol
Parameter Description
Test Setup
TSOP/SO
Typ
6
Max
7.5
5
Unit
pF
pF
pF
pF
pF
pF
CIN
Input Capacitance
VIN = 0
VOUT = 0
VIN = 0
BGA
TSOP/SO
BGA
4.2
8.5
5.4
7.5
3.9
12
6.5
9
COUT
Output Capacitance
TSOP/SO
BGA
CIN2
Control Pin Capacitance
4.7
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
DATA RETENTION
Parameter Description
Test Conditions
150°C
Min
10
Unit
Years
Years
Minimum Pattern Data Retention Time
125°C
20
50
Am29DL16xD
May 26, 2004
PHYSICAL DIMENSIONS
FBC048—48-Ball Fine-Pitch Ball Grid Array
8 x 9 mm package
Dwg rev AF; 10/99
May 26, 2004
Am29DL16xD
51
PHYSICAL DIMENSIONS
LAA064—64-Ball Fortified Ball Grid Array,
13 x 11 mm package
52
Am29DL16xD
May 26, 2004
PHYSICAL DIMENSIONS
TS 048—48-Pin Standard TSOP
Dwg rev AA; 10/99
May 26, 2004
Am29DL16xD
53
PHYSICAL DIMENSIONS
VBF048—48-Ball Very Thin Profile Fine-Pitch Ball Grid Array
54
Am29DL16xD
May 26, 2004
REVISION SUMMARY
Ordering Information
Revision A (September 1998)
Added 70, 90R, and 120R speed options to the valid
combination table. Reverted FBGA designator back to
WC.
Initial release.
Revision B (October 1998)
SecSi (Secured Silicon) Sector Flash Memory
Region
Global
Deleted the 90R and 120R speed options. Expanded
the full voltage range to 2.7–3.6 V.
Factory Locked: SecSi Sector Programmed and Pro-
tected at the Factory: Corrected the address range of
the ESN and distinguished between word and byte
modes.
Distinctive Characteristics
Added 125°C to 20-year data retention bullet.
Operating Ranges
Connection Diagrams
VCC Supply Voltages: Replaced single voltage range
with voltage ranges for standard and regulated
devices.
Changed the FBGA diagram from bottom view to top view.
Ordering Information
Changed the FBGA ordering nomenclature to “YC.”
The package designation is now FBC048. Reverted to
WC in Revision C.
Revision C+1 (March 19, 1999)
SecSi (Secured Silicon) Sector Flash Memory
Region
DC Characteristics
Customer Lockable subsection: In the bullets, text
should refer to “Enter SecSi Sector Region command
sequence.”
Changed maximum ILI current to 3.0 µA.
Physical Dimensions
Updated the FBGA drawing, table, and notes. The
package designation is now FBC048. Deleted 40-pin
TSOP drawing.
Revision C+2 (June 14, 1999)
Changed data sheet status to Preliminary.
Revision C+3 (August 9, 1999)
Revision B+1 (October 1998)
Global
Command Definitions table
Added Am29DL164 specifications to the document.
Added the term “sector block” to the notes
where appropriate.
Ordering Information
DC Characteristics
Added the 70R speed option for the DL163, deleted
the SSOP for the DL162.
Changed maximum ILI current to 1.0 µA.
Test Specifications table
AC Characteristics
The 90 ns speed option is tested at 100 pF loading.
Temporary Sector Unprotect: Moved the accelerated
program timing diagram to follow the program opera-
tions timings. Added the term “sector block” where
appropriate elsewhere on the page.
Revision C+4 (August 23, 1999)
Ordering Information
Temperature Range: Added “C = Commercial (0°C to
+70°C)”.
Revision C (January 1998)
Global
Operating Ranges
Changed data sheet title.
Added commercial device.
Product Selector Guide
Revision C+5 (October 18, 1999)
Replaced “Full Voltage Range: VCC = 2.7–3.6 V” with
“Standard Voltage Range: VCC = 2.7–3.3 V.” Each part
number now has a separate set of speed options.
Device Bus Operations
Autoselect Mode: Added Am29DL164 device IDs to
the Autoselect Codes table.
May 26, 2004
Am29DL16xD
55
Command Definitions
Revision D (February 22, 2000)
Table 14, Command Definitions: The SecSi Sector In-
dicator Bit values have changed from 80h and 00h to
81h and 01h, respectively.
Global
The Am29DL16x family has migrated to a new 0.23
µm process technology, which is indicated by a “D” in
the ordering part number. All references in this docu-
ment have been changed to reflect the new process.
AC Characteristics
Read-only Operations table: Changed parameter tDF to
16 ns for all speed options. Added Note 3.
Distinctive Characteristics
Revision D+2 (September 4, 2000)
Under “Performance Characteristics,” the typical accel-
erated programming time was changed to match the
AC tables.
Deleted remaining references to 80 ns speed option,
which was officially removed in Revision D+1. Cor-
rected references to Am29DL16xC, which officially
changed to Am29DL16xD in Revision D.
AC Characteristics
Figure 17, Program Operations Timing; Figure 19,
Chip/Sector Erase Operations: Deleted tGHWL and
changed OE# waveform to start at high.
Revision D+3 (November 22, 2000)
Global
Erase and Program Operations table; Alternate CE#
Controlled Erase and Program Operations table:
Changed the typical and maximum specifications for
programming time.
Deleted Preliminary status from document. Added
table of contents.
Revision E (July 2, 2001)
Erase and Programming Performance
Added Am29DL161D device to data sheet. Deleted
extended temperature range devices.
In the table, changed the typical and maximum specifi-
cations for programming time. The typical and maxi-
mum chip programming times in both byte and word
modes are reduced.
Sector/Sector Block Protection and Unprotection
Noted that sectors are unprotected in parallel.
Physical Dimensions
SecSi‰ (Secured Silicon) Sector Flash
Memory Region
Replaced figures with more detailed illustrations.
Noted changes for upcoming versions of these de-
vices: reduced SecSi Sector size and deletion of
SecSi Sector erase functionality. Current versions of
these devices remain unaffected.
Revision D+1 (June 21, 2000)
Global
Data sheet designation has changed from “Advance
Information” to “Preliminary.”
Revision E+1 (July 29, 2002)
Deleted references to the 56-pin SSOP and the corre-
sponding 70R speed option.
Global
Added 64-ball Fortified BGA package.
Ordering Information
Command Definitions
Added valid combinations for the Am29DL164D device
in TSOP. Added valid combinations for the
Am29DL162D devices in TSOP and FBGA packages.
Deleted valid combinations for the 80 ns
Am29DL164D device in FBGA package.
Modified caution to state that incorrect command/se-
quences may place device in unknown state, upon
which device must be reset.
Unlock Bypass Command Sequence; Command
Definitions table
Device Bus Operations
Table 3, Sector Addresses for Top Boot Sector De-
vices: In note below table, corrected last device part
number to top boot.
Corrected table and description to indicated that bank
address is not required for unlock bypass reset.
Package Capacitance
Table 7, Autoselect Codes: The SecSi Sector Indicator
Bit values have changed from 80h and 00h to 81h and
01h, respectively.
Added BGA capacitance specifications.
56
Am29DL16xD
May 26, 2004
Revision E + 2 (February 14, 2003)
Revision E+3 (February 25, 2004)
Global
AC Characteristics
Added VBF048 package, Very Thin Profile Fine Pitch
Ball Grid Array, to Distinctive Characteristics, General
Description, Ordering Information, Connection Dia-
grams, and Physical Dimensions sections.
Corrected tSR/W in Figure 20, Back-to-back Read/Write
Cycle Timings.
Revision E+4 (May 26, 2004)
Ordering Information
Added Pb-Free OPNs.
Trademarks
Copyright © 2004 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
ExpressFlash is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
May 26, 2004
Am29DL16xD
57
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