AOD425_11 [AOS]

P-Channel Enhancement Mode Field Effect Transistor; P沟道增强型场效应晶体管
AOD425_11
型号: AOD425_11
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

P-Channel Enhancement Mode Field Effect Transistor
P沟道增强型场效应晶体管

晶体 晶体管 场效应晶体管
文件: 总6页 (文件大小:258K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOD425  
P-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
The AOD425 uses advanced trench technology to  
provide excellent RDS(ON) and ultra-low low gate charge  
with a 25V gate rating. This device is suitable for use  
as a load switch or in PWM applications. The device is  
ESD protected.  
VDS (V) = -30V  
ID = -50A (VGS = -10V)  
RDS(ON) < 17m(VGS = -10V)  
RDS(ON) < 35m(VGS = -5V)  
-RoHS Compliant  
-Halogen Free*  
ESD Protected!  
100% Rg Tested!  
TO252  
DPAK  
D
Top View  
Bottom View  
D
D
G
S
G
S
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
Drain-Source Voltage  
VDS  
-30  
V
Gate-Source Voltage  
Continuous Drain  
Current F  
VGS  
±25  
-50  
V
A
TC=25°C  
TC=100°C  
ID  
-36  
Pulsed Drain Current C  
IDM  
-70  
T
T
A=25°C  
A=70°C  
-9  
Continuous Drain  
Current  
IDSM  
A
-7  
TC=25°C  
TC=100°C  
TA=25°C  
TA=70°C  
71  
PD  
W
Power Dissipation B  
36  
2.5  
PDSM  
W
°C  
Power Dissipation A  
1.6  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 175  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
16  
Max  
20  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A  
t 10s  
RθJA  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Case B  
Steady-State  
Steady-State  
41  
50  
RθJC  
1.7  
2.1  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD425  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
ID=-250uA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
-30  
V
V
DS=-30V, VGS=0V  
-1  
-5  
IDSS  
Zero Gate Voltage Drain Current  
µA  
TJ=55°C  
VDS=0V, VGS= ±25V  
VDS=VGS ID=-250µA  
VGS=-10V, VDS=-5V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±10  
-3.5  
uA  
V
VGS(th)  
ID(ON)  
-1.5  
-70  
-2.45  
A
V
GS=-10V, ID=-20A  
13.5  
18.5  
27  
17  
24  
35  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
mΩ  
VGS=-5V, ID=-20A  
VDS=-5V, ID=-20A  
IS=-1A,VGS=0V  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
27  
S
V
A
-0.72  
-1  
Maximum Body-Diode Continuous Current  
-50  
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1760  
360  
255  
6.4  
2200  
pF  
pF  
pF  
VGS=0V, VDS=-15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
VGS=0V, VDS=0V, f=1MHz  
8
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
Qg(4.5V) Total Gate Charge  
30  
11  
7
38  
nC  
nC  
nC  
nC  
ns  
VGS=-10V, VDS=-15V, ID=-20A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
8
11.5  
8
V
GS=-10V, VDS=-15V, RL=0.75,  
ns  
RGEN=3Ω  
tD(off)  
tf  
35  
18.5  
24  
16  
ns  
ns  
trr  
IF=-20A, dI/dt=100A/µs  
IF=-20A, dI/dt=100A/µs  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
30  
ns  
Qrr  
nC  
A. The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C. The  
Power dissipation PDSM is based on R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends  
on the user's specific board design, and the maximum temperature of 175°C may be used if the PCB allows it.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=175°C.  
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 us pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of TJ(MAX)=175°C. The SOA curve provides a single pulse rating.  
G. The maximum current rating is limited by bond-wires.  
H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.  
*This device is guaranteed green after data code 8X11 (Sep 1ST 2008).  
Rev3: May. 2010  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD425  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
70  
60  
50  
40  
30  
20  
10  
0
25  
20  
15  
10  
5
VDS=-5V  
125°C  
-10V  
-5V  
-4.5V  
25°C  
VGS=-4V  
4
0
0
1
2
3
5
2
2.5  
3
3.5  
4
4.5  
5
VDS (Volts)  
VGS(Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
40.0  
30.0  
20.0  
10.0  
0.0  
1.8  
1.6  
1.4  
1.2  
1
ID=-20A  
VGS=-10V  
VGS=-5V  
VGS=-5V  
VGS=-10V  
0.8  
0
5
10  
15  
20  
25  
0
50  
100  
150  
200  
ID (A)  
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
Figure 4: On-Resistance vs. Junction Temperature  
50  
40  
30  
20  
10  
0
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
ID=-20A  
125°C  
125°C  
25°C  
1.0E-03  
25°C  
1.0E-04  
1.0E-05  
0
5
10  
15  
20  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
0.6  
0.8  
1.0  
VGS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD425  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
2500  
10  
8
VDS=-15V  
ID=-20A  
Ciss  
2000  
1500  
1000  
500  
0
6
4
Coss  
2
Crss  
0
0
5
10  
15  
20  
25  
30  
35  
0
5
10  
15  
20  
25  
Qg (nC)  
VDS (Volts)  
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
1000  
100  
10  
400  
TJ(Max)=175°C  
TC=25°C  
320  
240  
160  
80  
10µs  
RDS(ON)  
limited  
100µs  
DC  
1ms  
1
10ms  
TJ(Max)=175°C  
TC=25°C  
0.1  
0.01  
0
0.01  
0.1  
1
10  
100  
0.0001  
0.001  
0.01  
Pulse Width (s)  
0.1  
1
10  
VDS (Volts)  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
1
D=Ton/T  
TJ,PK=TA+PDM.ZθJC.RθJC  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
RθJC=2.1°C/W  
PD  
0.1  
0.01  
Ton  
T
Single Pulse  
0.0001  
0.00001  
0.001  
0.01  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
0.1  
1
10  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD425  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
100  
80  
60  
40  
20  
0
50  
40  
30  
20  
10  
0
0
25  
50  
75  
100  
125  
150  
175  
0
25  
50  
75  
TCASE (°C)  
Figure 14: Current De-rating (Note B)  
100  
125  
150  
175  
TCASE (°C)  
Figure 13: Power De-rating (Note B)  
10000  
1000  
100  
10  
1
0.00001  
0.001  
0.1  
10  
1000  
Pulse Width (s)  
Figure 15: Single Pulse Power Rating Junction-to-  
Ambient (Note H)  
10  
1
D=Ton/T  
TJ,PK=TA+PDM.ZθJA.RθJA  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
RθJA=50°C/W  
0.1  
PD  
0.01  
0.001  
Single Pulse  
0.01  
Ton  
T
0.00001  
0.0001  
0.001  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD425  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
-
-10V  
-
VDC  
Qgs  
Qgd  
+
Vds  
VDC  
+
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
toff  
ton  
t
f
td  
(
td(on)  
t
r
Vgs  
-
90%  
10%  
DUT  
Vdd  
Vgs  
VDC  
+
Rg  
Vgs  
Vds  
Diode Recovery Test Circuit & Waveforms  
Qrr = - Idt  
Vds +  
DUT  
Vgs  
trr  
Vds -  
L
-Isd  
-IF  
Isd  
Vgs  
dI/dt  
-IRM  
+
Vdd  
VDC  
Vdd  
-
-Vds  
Ig  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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