AT25DF641-S3H-B [ATMEL]

64-Megabit 2.7-volt Minimum SPI Serial Flash Memory; 64兆位2.7伏最小的SPI串行闪存
AT25DF641-S3H-B
型号: AT25DF641-S3H-B
厂家: ATMEL    ATMEL
描述:

64-Megabit 2.7-volt Minimum SPI Serial Flash Memory
64兆位2.7伏最小的SPI串行闪存

闪存
文件: 总59页 (文件大小:1167K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Single 2.7V - 3.6V Supply  
Serial Peripheral Interface (SPI) Compatible  
– Supports SPI Modes 0 and 3  
– Supports RapidS® Operation  
– Supports Dual-Input Program and Dual-Output Read  
Very High Operating Frequencies  
– 100 MHz for RapidS  
– 85 MHz for SPI  
64-Megabit  
2.7-volt  
Minimum  
SPI Serial Flash  
Memory  
– Clock-to-Output (tV) of 5 ns Maximum  
Flexible, Optimized Erase Architecture for Code + Data Storage Applications  
– Uniform 4-Kbyte Block Erase  
– Uniform 32-Kbyte Block Erase  
– Uniform 64-Kbyte Block Erase  
– Full Chip Erase  
Individual Sector Protection with Global Protect/Unprotect Feature  
– 128 Sectors of 64-Kbytes Each  
Hardware Controlled Locking of Protected Sectors via WP Pin  
Sector Lockdown  
– Make Any Combination of 64-Kbyte Sectors Permanently Read-Only  
128-Byte Programmable OTP Security Register  
Flexible Programming  
– Byte/Page Program (1 to 256 Bytes)  
Fast Program and Erase Times  
– 1.0 ms Typical Page Program (256 Bytes) Time  
– 50 ms Typical 4-Kbyte Block Erase Time  
– 250 ms Typical 32-Kbyte Block Erase Time  
– 400 ms Typical 64-Kbyte Block Erase Time  
Program and Erase Suspend/Resume  
Automatic Checking and Reporting of Erase/Program Failures  
Software Controlled Reset  
AT25DF641  
Preliminary  
See applicable errata  
in Section 18.  
JEDEC Standard Manufacturer and Device ID Read Methodology  
Low Power Dissipation  
– 5 mA Active Read Current (Typical at 20 MHz)  
– 5 µA Deep Power-Down Current (Typical)  
Endurance: 100,000 Program/Erase Cycles  
Data Retention: 20 Years  
Complies with Full Industrial Temperature Range  
Industry Standard Green (Pb/Halide-free/RoHS Compliant) Package Options  
– 16-Lead SOIC (300-mil wide)  
– 8-Contact Very Thin DFN (6 x 8 mm)  
1. Description  
The AT25DF641 is a serial interface Flash memory device designed for use in a wide  
variety of high-volume consumer based applications in which program code is shad-  
owed from Flash memory into embedded or external RAM for execution. The flexible  
erase architecture of the AT25DF641, with its erase granularity as small as 4-Kbytes,  
makes it ideal for data storage as well, eliminating the need for additional data storage  
EEPROM devices.  
3680E–DFLASH–12/08  
The physical sectoring and the erase block sizes of the AT25DF641 have been optimized to  
meet the needs of today's code and data storage applications. By optimizing the size of the  
physical sectors and erase blocks, the memory space can be used much more efficiently.  
Because certain code modules and data storage segments must reside by themselves in their  
own protected sectors, the wasted and unused memory space that occurs with large sectored  
and large block erase Flash memory devices can be greatly reduced. This increased memory  
space efficiency allows additional code routines and data storage segments to be added while  
still maintaining the same overall device density.  
The AT25DF641 also offers a sophisticated method for protecting individual sectors against  
erroneous or malicious program and erase operations. By providing the ability to individually pro-  
tect and unprotect sectors, a system can unprotect a specific sector to modify its contents while  
keeping the remaining sectors of the memory array securely protected. This is useful in applica-  
tions where program code is patched or updated on a subroutine or module basis, or in  
applications where data storage segments need to be modified without running the risk of errant  
modifications to the program code segments. In addition to individual sector protection capabili-  
ties, the AT25DF641 incorporates Global Protect and Global Unprotect features that allow the  
entire memory array to be either protected or unprotected all at once. This reduces overhead  
during the manufacturing process since sectors do not have to be unprotected one-by-one prior  
to initial programming.  
To take code and data protection to the next level, the AT25DF641 incorporates a sector lock-  
down mechanism that allows any combination of individual 64-Kbyte sectors to be locked down  
and become permanently read-only. This addresses the need of certain secure applications that  
require portions of the Flash memory array to be permanently protected against malicious  
attempts at altering program code, data modules, security information, or encryption/decryption  
algorithms, keys, and routines. The device also contains a specialized OTP (One-Time Pro-  
grammable) Security Register that can be used for purposes such as unique device  
serialization, system-level Electronic Serial Number (ESN) storage, locked key storage, etc.  
Specifically designed for use in 3-volt systems, the AT25DF641 supports read, program, and  
erase operations with a supply voltage range of 2.7V to 3.6V. No separate voltage is required for  
programming and erasing.  
2
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
2. Pin Descriptions and Pinouts  
Table 2-1.  
Pin Descriptions  
Asserted  
Symbol  
Name and Function  
State  
Type  
CHIP SELECT: Asserting the CS pin selects the device. When the CS pin is deasserted,  
the device will be deselected and normally be placed in standby mode (not Deep Power-  
Down mode), and the SO pin will be in a high-impedance state. When the device is  
deselected, data will not be accepted on the SI pin.  
CS  
Low  
Input  
A high-to-low transition on the CS pin is required to start an operation, and a low-to-high  
transition is required to end an operation. When ending an internally self-timed operation  
such as a program or erase cycle, the device will not enter the standby mode until the  
completion of the operation.  
SERIAL CLOCK: This pin is used to provide a clock to the device and is used to control the  
flow of data to and from the device. Command, address, and input data present on the SI pin  
is always latched in on the rising edge of SCK, while output data on the SO pin is always  
clocked out on the falling edge of SCK.  
SCK  
-
-
Input  
SERIAL INPUT (SERIAL INPUT/OUTPUT): The SI pin is used to shift data into the device.  
The SI pin is used for all data input including command and address sequences. Data on the  
SI pin is always latched in on the rising edge of SCK.  
With the Dual-Output Read Array command, the SI pin becomes an output pin (SIO) to allow  
two bits of data (on the SO and SIO pins) to be clocked out on every falling edge of SCK. To  
maintain consistency with SPI nomenclature, the SIO pin will be referenced as SI throughout  
the document with exception to sections dealing with the Dual-Output Read Array command  
in which it will be referenced as SIO.  
SI (SIO)  
Input/Output  
Data present on the SI pin will be ignored whenever the device is deselected (CS is  
deasserted).  
SERIAL OUTPUT (SERIAL OUTPUT/INPUT): The SO pin is used to shift data out from the  
device. Data on the SO pin is always clocked out on the falling edge of SCK.  
With the Dual-Input Byte/Page Program command, the SO pin becomes an input pin (SOI)  
to allow two bits of data (on the SOI and SI pins) to be clocked in on every rising edge of  
SO (SOI) SCK. To maintain consistency with SPI nomenclature, the SOI pin will be referenced as SO  
throughout the document with exception to sections dealing with the Dual-Input Byte/Page  
Program command in which it will be referenced as SOI.  
-
Output/Input  
The SO pin will be in a high-impedance state whenever the device is deselected (CS is  
deasserted).  
WRITE PROTECT: The WP pin controls the hardware locking feature of the device. Please  
refer to “Protection Commands and Features” on page 21 for more details on protection  
features and the WP pin.  
WP  
Low  
Input  
The WP pin is internally pulled-high and may be left floating if hardware controlled protection  
will not be used. However, it is recommended that the WP pin also be externally connected  
to VCC whenever possible.  
3
3680E–DFLASH–12/08  
Table 2-1.  
Symbol  
Pin Descriptions (Continued)  
Asserted  
State  
Name and Function  
Type  
HOLD: The HOLD pin is used to temporarily pause serial communication without  
deselecting or resetting the device. While the HOLD pin is asserted, transitions on the SCK  
pin and data on the SI pin will be ignored, and the SO pin will be in a high-impedance state.  
The CS pin must be asserted, and the SCK pin must be in the low state in order for a Hold  
condition to start. A Hold condition pauses serial communication only and does not have an  
effect on internally self-timed operations such as a program or erase cycle. Please refer to  
“Hold” on page 46 for additional details on the Hold operation.  
HOLD  
Low  
Input  
The HOLD pin is internally pulled-high and may be left floating if the Hold function will not be  
used. However, it is recommended that the HOLD pin also be externally connected to VCC  
whenever possible.  
DEVICE POWER SUPPLY: The VCC pin is used to supply the source voltage to the device.  
VCC  
-
-
Power  
Power  
Operations at invalid VCC voltages may produce spurious results and should not be  
attempted.  
GROUND: The ground reference for the power supply. GND should be connected to the  
system ground.  
GND  
Figure 2-1. 8-VDFN (Top View)  
Figure 2-2. 16-SOIC (Top View)  
1
8
7
6
5
CS  
VCC  
HOLD  
VCC  
NC  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
SCK  
SI (SIO)  
2
SO (SOI)  
HOLD  
SCK  
3
WP  
NC  
4
GND  
SI (SIO)  
NC  
NC  
NC  
NC  
NC  
NC  
CS  
GND  
WP  
SO (SOI)  
4
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
3. Block Diagram  
Figure 3-1. Block Diagram  
CONTROL AND  
I/O BUFFERS  
PROTECTION LOGIC  
AND LATCHES  
CS  
SRAM  
DATA BUFFER  
SCK  
INTERFACE  
CONTROL  
AND  
LOGIC  
SI (SIO)  
Y-DECODER  
Y-GATING  
SO (SOI)  
FLASH  
MEMORY  
ARRAY  
WP  
X-DECODER  
HOLD  
4. Memory Array  
To provide the greatest flexibility, the memory array of the AT25DF641 can be erased in four lev-  
els of granularity including a full chip erase. In addition, the array has been divided into physical  
sectors of uniform size, of which each sector can be individually protected from program and  
erase operations. The size of the physical sectors is optimized for both code and data storage  
applications, allowing both code and data segments to reside in their own isolated regions. The  
Memory Architecture Diagram illustrates the breakdown of each erase level as well as the  
breakdown of each physical sector.  
5
3680E–DFLASH–12/08  
Figure 4-1. Memory Architecture Diagram  
Block Erase Detail  
Page Program Detail  
Internal Sectoring for  
Protection, Lockdown,  
and Suspend Functions  
64KB  
Block Erase  
32KB  
Block Erase  
4KB  
Block Erase  
1-256 Byte  
Page Program  
(02h Command)  
Block Address  
Range  
Page Address  
Range  
(D8h Command) (52h Command) (20h Command)  
4KB  
4KB  
4KB  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
7FFFFFh – 7FF000h  
7FEFFFh– 7FE000h  
7FDFFFh – 7FD000h  
7FCFFFh– 7FC000h  
7FBFFFh – 7FB000h  
7FAFFFh – 7FA000h  
7F9FFFh – 7F9000h  
7F8FFFh – 7F8000h  
7F7FFFh – 7F7000h  
7F6FFFh – 7F6000h  
7F5FFFh – 7F5000h  
7F4FFFh – 7F4000h  
7F3FFFh – 7F3000h  
7F2FFFh – 7F2000h  
7F1FFFh – 7F1000h  
7F0FFFh – 7F0000h  
7EFFFFh– 7EF000h  
7EEFFFh– 7EE000h  
7EDFFFh – 7ED000h  
7ECFFFh– 7EC000h  
7EBFFFh– 7EB000h  
7EAFFFh – 7EA000h  
7E9FFFh – 7E9000h  
7E8FFFh – 7E8000h  
7E7FFFh – 7E7000h  
7E6FFFh – 7E6000h  
7E5FFFh – 7E5000h  
7E4FFFh – 7E4000h  
7E3FFFh – 7E3000h  
7E2FFFh – 7E2000h  
7E1FFFh – 7E1000h  
7E0FFFh – 7E0000h  
7FFFFFh – 7FFF00h  
7FFEFFh– 7FFE00h  
7FFDFFh – 7FFD00h  
7FFCFFh– 7FFC00h  
7FFBFFh – 7FFB00h  
7FFAFFh – 7FFA00h  
7FF9FFh – 7FF900h  
7FF8FFh – 7FF800h  
7FF7FFh – 7FF700h  
7FF6FFh – 7FF600h  
7FF5FFh – 7FF500h  
7FF4FFh – 7FF400h  
7FF3FFh – 7FF300h  
7FF2FFh – 7FF200h  
7FF1FFh – 7FF100h  
7FF0FFh – 7FF000h  
7FEFFFh– 7FEF00h  
7FEEFFh– 7FEE00h  
7FEDFFh – 7FED00h  
7FECFFh– 7FEC00h  
7FEBFFh– 7FEB00h  
7FEAFFh – 7FEA00h  
7FE9FFh – 7FE900h  
7FE8FFh – 7FE800h  
4KB  
32KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
64KB  
(Sector 127)  
64KB  
4KB  
32KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
32KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
64KB  
(Sector 126)  
64KB  
4KB  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
256 Bytes  
0017FFh – 001700h  
0016FFh – 001600h  
0015FFh – 001500h  
0014FFh – 001400h  
0013FFh – 001300h  
0012FFh – 001200h  
0011FFh – 001100h  
0010FFh – 001000h  
000FFFh – 000F00h  
000EFFh – 000E00h  
000DFFh – 000D00h  
000CFFh – 000C00h  
000BFFh – 000B00h  
000AFFh – 000A00h  
0009FFh – 000900h  
0008FFh – 000800h  
0007FFh – 000700h  
0006FFh – 000600h  
0005FFh – 000500h  
0004FFh – 000400h  
0003FFh – 000300h  
0002FFh – 000200h  
0001FFh – 000100h  
0000FFh – 000000h  
32KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
00FFFFh – 00F000h  
00EFFFh – 00E000h  
00DFFFh – 00D000h  
00CFFFh – 00C000h  
00BFFFh – 00B000h  
00AFFFh – 00A000h  
009FFFh – 009000h  
008FFFh – 008000h  
007FFFh – 007000h  
006FFFh – 006000h  
005FFFh – 005000h  
004FFFh – 004000h  
003FFFh – 003000h  
002FFFh – 002000h  
001FFFh – 001000h  
000FFFh – 000000h  
4KB  
32KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
4KB  
64KB  
(Sector 0)  
64KB  
4KB  
32KB  
4KB  
4KB  
4KB  
4KB  
6
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
5. Device Operation  
The AT25DF641 is controlled by a set of instructions that are sent from a host controller, com-  
monly referred to as the SPI Master. The SPI Master communicates with the AT25DF641 via the  
SPI bus which is comprised of four signal lines: Chip Select (CS), Serial Clock (SCK), Serial  
Input (SI), and Serial Output (SO).  
The AT25DF641 features a dual-input program mode in which the SO pin becomes an input.  
Similarly, the device also features a dual-output read mode in which the SI pin becomes an out-  
put. In the Dual-Input Byte/Page Program command description, the SO pin will be referred to as  
the SOI (Serial Output/Input) pin, and in the Dual-Output Read Array command, the SI pin will be  
referenced as the SIO (Serial Input/Output) pin.  
The SPI protocol defines a total of four modes of operation (mode 0, 1, 2, or 3) with each mode  
differing in respect to the SCK polarity and phase and how the polarity and phase control the  
flow of data on the SPI bus. The AT25DF641 supports the two most common modes, SPI  
Modes 0 and 3. The only difference between SPI Modes 0 and 3 is the polarity of the SCK signal  
when in the inactive state (when the SPI Master is in standby mode and not transferring any  
data). With SPI Modes 0 and 3, data is always latched in on the rising edge of SCK and always  
output on the falling edge of SCK.  
Figure 5-1. SPI Mode 0 and 3  
CS  
SCK  
MSB  
LSB  
SI  
MSB  
LSB  
SO  
6. Commands and Addressing  
A valid instruction or operation must always be started by first asserting the CS pin. After the CS  
pin has been asserted, the host controller must then clock out a valid 8-bit opcode on the SPI  
bus. Following the opcode, instruction dependent information such as address and data bytes  
would then be clocked out by the host controller. All opcode, address, and data bytes are trans-  
ferred with the most-significant bit (MSB) first. An operation is ended by deasserting the CS pin.  
Opcodes not supported by the AT25DF641 will be ignored by the device and no operation will be  
started. The device will continue to ignore any data presented on the SI pin until the start of the  
next operation (CS pin being deasserted and then reasserted). In addition, if the CS pin is deas-  
serted before complete opcode and address information is sent to the device, then no operation  
will be performed and the device will simply return to the idle state and wait for the next  
operation.  
Addressing of the device requires a total of three bytes of information to be sent, representing  
address bits A23-A0. Since the upper address limit of the AT25DF641 memory array is  
7FFFFFh, address bit A23 is always ignored by the device.  
7
3680E–DFLASH–12/08  
Table 6-1.  
Command  
Command Listing  
Clock  
Frequency  
Address  
Bytes  
Dummy  
Bytes  
Data  
Bytes  
Opcode  
Read Commands  
1Bh  
0Bh  
03h  
3Bh  
0001 1011  
Up to 100 MHz  
Up to 85 MHz  
Up to 50 MHz  
Up to 85 MHz  
3
3
3
3
2
1
0
1
1+  
1+  
1+  
1+  
Read Array  
0000 1011  
0000 0011  
0011 1011  
Dual-Output Read Array  
Program and Erase Commands  
Block Erase (4-KBytes)  
20h  
52h  
D8h  
60h  
C7h  
02h  
A2h  
B0h  
D0h  
0010 0000  
0101 0010  
1101 1000  
0110 0000  
1100 0111  
0000 0010  
1010 0010  
1011 0000  
1101 0000  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
3
3
3
0
0
3
3
0
0
0
0
0
0
0
0
0
0
0
0
0
Block Erase (32-KBytes)  
Block Erase (64-KBytes)  
0
0
Chip Erase  
0
Byte/Page Program (1 to 256 Bytes)  
Dual-Input Byte/Page Program (1 to 256 Bytes)  
Program/Erase Suspend  
Program/Erase Resume  
Protection Commands  
Write Enable  
1+  
1+  
0
0
06h  
04h  
36h  
39h  
0000 0110  
0000 0100  
0011 0110  
0011 1001  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
0
0
3
3
0
0
0
0
0
0
0
0
Write Disable  
Protect Sector  
Unprotect Sector  
Global Protect/Unprotect  
Read Sector Protection Registers  
Security Commands  
Use Write Status Register Byte 1 Command  
3Ch  
0011 1100  
Up to 100 MHz  
3
0
1+  
Sector Lockdown  
33h  
34h  
35h  
9Bh  
77h  
0011 0011  
0011 0100  
0011 0101  
1001 1011  
0111 0111  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
3
3
3
3
3
0
0
0
0
2
1
Freeze Sector Lockdown State  
Read Sector Lockdown Registers  
Program OTP Security Register  
Read OTP Security Register  
Status Register Commands  
Read Status Register  
1
1+  
1+  
1+  
05h  
01h  
31h  
0000 0101  
0000 0001  
0011 0001  
Up to 100 MHz  
Up to 100 MHz  
Up to 100 MHz  
0
0
0
0
0
0
1+  
1
Write Status Register Byte 1  
Write Status Register Byte 2  
Miscellaneous Commands  
Reset  
1
F0h  
9Fh  
B9h  
ABh  
1111 0000  
1001 1111  
1011 1001  
1010 1011  
Up to 100 MHz  
Up to 85 MHz  
Up to 100 MHz  
Up to 100 MHz  
0
0
0
0
0
0
0
0
1
1 to 4  
0
Read Manufacturer and Device ID  
Deep Power-Down  
Resume from Deep Power-Down  
0
8
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
7. Read Commands  
7.1  
Read Array  
The Read Array command can be used to sequentially read a continuous stream of data from  
the device by simply providing the clock signal once the initial starting address has been speci-  
fied. The device incorporates an internal address counter that automatically increments on every  
clock cycle.  
Three opcodes (1Bh, 0Bh, and 03h) can be used for the Read Array command. The use of each  
opcode depends on the maximum clock frequency that will be used to read data from the device.  
The 0Bh opcode can be used at any clock frequency up to the maximum specified by fCLK, and  
the 03h opcode can be used for lower frequency read operations up to the maximum specified  
by fRDLF. The 1Bh opcode allows the highest read performance possible and can be used at any  
clock frequency up to the maximum specified by fMAX; however, use of the 1Bh opcode at clock  
frequencies above fCLK should be reserved to systems employing the RapidS protocol.  
To perform the Read Array operation, the CS pin must first be asserted and the appropriate  
opcode (1Bh, 0Bh, or 03h) must be clocked into the device. After the opcode has been clocked  
in, the three address bytes must be clocked in to specify the starting address location of the first  
byte to read within the memory array. Following the three address bytes, additional dummy  
bytes may need to be clocked into the device depending on which opcode is used for the Read  
Array operation. If the 1Bh opcode is used, then two dummy bytes must be clocked into the  
device after the three address bytes. If the 0Bh opcode is used, then a single dummy byte must  
be clocked in after the address bytes.  
After the three address bytes (and the dummy bytes or byte if using opcodes 1Bh or 0Bh) have  
been clocked in, additional clock cycles will result in data being output on the SO pin. The data is  
always output with the MSB of a byte first. When the last byte (7FFFFFh) of the memory array  
has been read, the device will continue reading back at the beginning of the array (000000h). No  
delays will be incurred when wrapping around from the end of the array to the beginning of the  
array.  
Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-  
ance state. The CS pin can be deasserted at any time and does not require that a full byte of  
data be read.  
Figure 7-1. Read Array - 1Bh Opcode  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
DON'T CARE  
DON'T CARE  
0
0
0
1
1
0
1
1
A
A
A
A
A
A
A
A
A
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
MSB  
MSB  
MSB  
MSB  
DATA BYTE 1  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
9
3680E–DFLASH–12/08  
Figure 7-2. Read Array - 0Bh Opcode  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
DON'T CARE  
0
0
0
0
1
0
1
1
A
A
A
A
A
A
A
A
A
X
X
X
X
X
X
X
X
MSB  
MSB  
MSB  
DATA BYTE 1  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
Figure 7-3. Read Array - 03h Opcode  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39 40  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
0
0
0
0
0
0
1
1
A
A
A
A
A
A
A
A
A
MSB  
MSB  
DATA BYTE 1  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
7.2  
Dual-Output Read Array  
The Dual-Output Read Array command is similar to the standard Read Array command and can  
be used to sequentially read a continuous stream of data from the device by simply providing the  
clock signal once the initial starting address has been specified. Unlike the standard Read Array  
command, however, the Dual-Output Read Array command allows two bits of data to be clocked  
out of the device on every clock cycle rather than just one.  
The Dual-Output Read Array command can be used at any clock frequency up to the maximum  
specified by fRDDO. To perform the Dual-Output Read Array operation, the CS pin must first be  
asserted and the opcode of 3Bh must be clocked into the device. After the opcode has been  
clocked in, the three address bytes must be clocked in to specify the starting address location of  
the first byte to read within the memory array. Following the three address bytes, a single  
dummy byte must also be clocked into the device.  
After the three address bytes and the dummy byte have been clocked in, additional clock cycles  
will result in data being output on both the SO and SIO pins. The data is always output with the  
MSB of a byte first, and the MSB is always output on the SO pin. During the first clock cycle, bit  
7 of the first data byte will be output on the SO pin while bit 6 of the same data byte will be output  
on the SIO pin. During the next clock cycle, bits 5 and 4 of the first data byte will be output on the  
SO and SIO pins, respectively. The sequence continues with each byte of data being output  
after every four clock cycles. When the last byte (7FFFFFh) of the memory array has been read,  
10  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
the device will continue reading back at the beginning of the array (000000h). No delays will be  
incurred when wrapping around from the end of the array to the beginning of the array.  
Deasserting the CS pin will terminate the read operation and put the SO and SIO pins into a  
high-impedance state. The CS pin can be deasserted at any time and does not require that a full  
byte of data be read.  
Figure 7-4. Dual-Output Read Array  
CS  
SCK  
SIO  
SO  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48  
OUTPUT  
DATA BYTE 1  
OUTPUT  
DATA BYTE 2  
OPCODE  
ADDRESS BITS A23-A0  
DON'T CARE  
D
D
D
D
D
D
D
D
D
D
D
D
D
D
0
0
1
1
1
0
1
1
A
A
A
A
A
A
A
A
A
X
X
X
X
X
X
X
X
6
4
2
0
1
6
4
2
0
1
6
7
4
5
MSB  
MSB  
MSB  
HIGH-IMPEDANCE  
D
D
D
D
D
5
D
7
5
3
7
3
MSB  
MSB  
MSB  
11  
3680E–DFLASH–12/08  
8. Program and Erase Commands  
8.1  
Byte/Page Program  
The Byte/Page Program command allows anywhere from a single byte of data to 256 bytes of  
data to be programmed into previously erased memory locations. An erased memory location is  
one that has all eight bits set to the logical “1” state (a byte value of FFh). Before a Byte/Page  
Program command can be started, the Write Enable command must have been previously  
issued to the device (see “Write Enable” on page 21) to set the Write Enable Latch (WEL) bit of  
the Status Register to a logical “1” state.  
To perform a Byte/Page Program command, an opcode of 02h must be clocked into the device  
followed by the three address bytes denoting the first byte location of the memory array to begin  
programming at. After the address bytes have been clocked in, data can then be clocked into the  
device and will be stored in an internal buffer.  
If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page  
boundary (A7-A0 are not all 0), then special circumstances regarding which memory locations to  
be programmed will apply. In this situation, any data that is sent to the device that goes beyond  
the end of the page will wrap around back to the beginning of the same page. For example, if the  
starting address denoted by A23-A0 is 0000FEh, and three bytes of data are sent to the device,  
then the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh while  
the last byte of data will be programmed at address 000000h. The remaining bytes in the page  
(addresses 000001h through 0000FDh) will not be programmed and will remain in the erased  
state (FFh). In addition, if more than 256 bytes of data are sent to the device, then only the last  
256 bytes sent will be latched into the internal buffer.  
When the CS pin is deasserted, the device will take the data stored in the internal buffer and pro-  
gram it into the appropriate memory array locations based on the starting address specified by  
A23-A0 and the number of data bytes sent to the device. If less than 256 bytes of data were sent  
to the device, then the remaining bytes within the page will not be programmed and will remain  
in the erased state (FFh). The programming of the data bytes is internally self-timed and should  
take place in a time of tPP or tBP if only programming a single byte.  
The three address bytes and at least one complete byte of data must be clocked into the device  
before the CS pin is deasserted, and the CS pin must be deasserted on even byte boundaries  
(multiples of eight bits); otherwise, the device will abort the operation and no data will be pro-  
grammed into the memory array. In addition, if the address specified by A23-A0 points to a  
memory location within a sector that is in the protected state (see “Protect Sector” on page 22)  
or locked down (see “Sector Lockdown” on page 29), then the Byte/Page Program command will  
not be executed, and the device will return to the idle state once the CS pin has been deas-  
serted. The WEL bit in the Status Register will be reset back to the logical “0” state if the  
program cycle aborts due to an incomplete address being sent, an incomplete byte of data being  
sent, the CS pin being deasserted on uneven byte boundaries, or because the memory location  
to be programmed is protected or locked down.  
While the device is programming, the Status Register can be read and will indicate that the  
device is busy. For faster throughput, it is recommended that the Status Register be polled  
rather than waiting the tBP or tPP time to determine if the data bytes have finished programming.  
At some point before the program cycle completes, the WEL bit in the Status Register will be  
reset back to the logical “0” state.  
The device also incorporates an intelligent programming algorithm that can detect when a byte  
location fails to program properly. If a programming error arises, it will be indicated by the EPE  
bit in the Status Register.  
12  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 8-1. Byte Program  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
DATA IN  
0
0
0
0
0
0
1
0
A
A
A
A
A
A
A
A
A
D
D
D
D
D
D
D
D
MSB  
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
Figure 8-2. Page Program  
CS  
0
1
2
3
4
5
6
7
8
9
29 30 31 32 33 34 35 36 37 38 39  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
DATA IN BYTE 1  
DATA IN BYTE n  
0
0
0
0
0
0
1
0
A
A
A
A
A
A
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
MSB  
MSB  
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
8.2  
Dual-Input Byte/Page Program  
The Dual-Input Byte/Page Program command is similar to the standard Byte/Page Program  
command and can be used to program anywhere from a single byte of data up to 256 bytes of  
data into previously erased memory locations. Unlike the standard Byte/Page Program com-  
mand, however, the Dual-Input Byte/Page Program command allows two bits of data to be  
clocked into the device on every clock cycle rather than just one.  
Before the Dual-Input Byte/Page Program command can be started, the Write Enable command  
must have been previously issued to the device (see “Write Enable” on page 21) to set the Write  
Enable Latch (WEL) bit of the Status Register to a logical “1” state. To perform a Dual-Input  
Byte/Page Program command, an opcode of A2h must be clocked into the device followed by  
the three address bytes denoting the first byte location of the memory array to begin program-  
ming at. After the address bytes have been clocked in, data can then be clocked into the device  
two bits at a time on both the SOI and SI pins.  
The data is always input with the MSB of a byte first, and the MSB is always input on the SOI  
pin. During the first clock cycle, bit 7 of the first data byte would be input on the SOI pin while bit  
6 of the same data byte would be input on the SI pin. During the next clock cycle, bits 5 and 4 of  
the first data byte would be input on the SOI and SI pins, respectively. The sequence would con-  
tinue with each byte of data being input after every four clock cycles. Like the standard  
Byte/Page Program command, all data clocked into the device is stored in an internal buffer.  
If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page  
boundary (A7-A0 are not all 0), then special circumstances regarding which memory locations to  
13  
3680E–DFLASH–12/08  
be programmed will apply. In this situation, any data that is sent to the device that goes beyond  
the end of the page will wrap around back to the beginning of the same page. For example, if the  
starting address denoted by A23-A0 is 0000FEh, and three bytes of data are sent to the device,  
then the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh while  
the last byte of data will be programmed at address 000000h. The remaining bytes in the page  
(addresses 000001h through 0000FDh) will not be programmed and will remain in the erased  
state (FFh). In addition, if more than 256 bytes of data are sent to the device, then only the last  
256 bytes sent will be latched into the internal buffer.  
When the CS pin is deasserted, the device will take the data stored in the internal buffer and pro-  
gram it into the appropriate memory array locations based on the starting address specified by  
A23-A0 and the number of data bytes sent to the device. If less than 256 bytes of data were sent  
to the device, then the remaining bytes within the page will not be programmed and will remain  
in the erased state (FFh). The programming of the data bytes is internally self-timed and should  
take place in a time of tPP or tBP if only programming a single byte.  
The three address bytes and at least one complete byte of data must be clocked into the device  
before the CS pin is deasserted, and the CS pin must be deasserted on even byte boundaries  
(multiples of eight bits); otherwise, the device will abort the operation and no data will be pro-  
grammed into the memory array. In addition, if the address specified by A23-A0 points to a  
memory location within a sector that is in the protected state (see “Protect Sector” on page 22)  
or locked down (see “Sector Lockdown” on page 29), then the Byte/Page Program command will  
not be executed, and the device will return to the idle state once the CS pin has been deas-  
serted. The WEL bit in the Status Register will be reset back to the logical “0” state if the  
program cycle aborts due to an incomplete address being sent, an incomplete byte of data being  
sent, the CS pin being deasserted on uneven byte boundaries, or because the memory location  
to be programmed is protected or locked down.  
While the device is programming, the Status Register can be read and will indicate that the  
device is busy. For faster throughput, it is recommended that the Status Register be polled  
rather than waiting the tBP or tPP time to determine if the data bytes have finished programming.  
At some point before the program cycle completes, the WEL bit in the Status Register will be  
reset back to the logical “0” state.  
The device also incorporates an intelligent programming algorithm that can detect when a byte  
location fails to program properly. If a programming error arises, it will be indicated by the EPE  
bit in the Status Register.  
Figure 8-3. Dual-Input Byte Program  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35  
SCK  
SI  
INPUT  
DATA BYTE  
OPCODE  
ADDRESS BITS A23-A0  
D
D
D
D
2 0  
1
0
1
0
0
0
1
0
A
A
A
A
A
A
A
A
A
6
4
MSB  
MSB  
HIGH-IMPEDANCE  
D
D
D
D
3 1  
7
5
SOI  
MSB  
14  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 8-4. Dual-Input Page Program  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39  
SCK  
SI  
INPUT  
INPUT  
INPUT  
DATA BYTE n  
OPCODE  
ADDRESS BITS A23-A0  
DATA BYTE 1 DATA BYTE 2  
D
D
D
D
D
D
D
D
D
D
D
D
2 0  
1
0
1
0
0
0
1
0
A
A
A
A
A
A
A
A
A
6
4
2
0
6
4
2
0
6
4
MSB  
MSB  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
D
D
3 1  
7
5
3
1
7
5
3
1
7
5
SOI  
MSB  
MSB  
MSB  
8.3  
Block Erase  
A block of 4, 32, or 64 Kbytes can be erased (all bits set to the logical “1” state) in a single oper-  
ation by using one of three different opcodes for the Block Erase command. An opcode of 20h is  
used for a 4-Kbyte erase, an opcode of 52h is used for a 32-Kbyte erase, and an opcode of D8h  
is used for a 64-Kbyte erase. Before a Block Erase command can be started, the Write Enable  
command must have been previously issued to the device to set the WEL bit of the Status Reg-  
ister to a logical “1” state.  
To perform a Block Erase, the CS pin must first be asserted and the appropriate opcode (20h,  
52h, or D8h) must be clocked into the device. After the opcode has been clocked in, the three  
address bytes specifying an address within the 4-, 32-, or 64-Kbyte block to be erased must be  
clocked in. Any additional data clocked into the device will be ignored. When the CS pin is deas-  
serted, the device will erase the appropriate block. The erasing of the block is internally self-  
timed and should take place in a time of tBLKE  
.
Since the Block Erase command erases a region of bytes, the lower order address bits do not  
need to be decoded by the device. Therefore, for a 4-Kbyte erase, address bits A11-A0 will be  
ignored by the device and their values can be either a logical “1” or “0”. For a 32-Kbyte erase,  
address bits A14-A0 will be ignored, and for a 64-Kbyte erase, address bits A15-A0 will be  
ignored by the device. Despite the lower order address bits not being decoded by the device, the  
complete three address bytes must still be clocked into the device before the CS pin is deas-  
serted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits);  
otherwise, the device will abort the operation and no erase operation will be performed.  
If the address specified by A23-A0 points to a memory location within a sector that is in the pro-  
tected or locked down state, then the Block Erase command will not be executed, and the device  
will return to the idle state once the CS pin has been deasserted.  
The WEL bit in the Status Register will be reset back to the logical “0” state if the erase cycle  
aborts due to an incomplete address being sent, the CS pin being deasserted on uneven byte  
boundaries, or because a memory location within the region to be erased is protected or locked  
down.  
While the device is executing a successful erase cycle, the Status Register can be read and will  
indicate that the device is busy. For faster throughput, it is recommended that the Status Regis-  
ter be polled rather than waiting the tBLKE time to determine if the device has finished erasing. At  
some point before the erase cycle completes, the WEL bit in the Status Register will be reset  
back to the logical “0” state.  
15  
3680E–DFLASH–12/08  
The device also incorporates an intelligent erase algorithm that can detect when a byte location  
fails to erase properly. If an erase error occurs, it will be indicated by the EPE bit in the Status  
Register.  
Figure 8-5. Block Erase  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
26 27 28 29 30 31  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
C
C
C
C
C
C
C
C
A
A
A
A
A
A
A
A
A
A
A
A
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
8.4  
Chip Erase  
The entire memory array can be erased in a single operation by using the Chip Erase command.  
Before a Chip Erase command can be started, the Write Enable command must have been pre-  
viously issued to the device to set the WEL bit of the Status Register to a logical “1” state.  
Two opcodes, 60h and C7h, can be used for the Chip Erase command. There is no difference in  
device functionality when utilizing the two opcodes, so they can be used interchangeably. To  
perform a Chip Erase, one of the two opcodes (60h or C7h) must be clocked into the device.  
Since the entire memory array is to be erased, no address bytes need to be clocked into the  
device, and any data clocked in after the opcode will be ignored. When the CS pin is deas-  
serted, the device will erase the entire memory array. The erasing of the device is internally self-  
timed and should take place in a time of tCHPE  
.
The complete opcode must be clocked into the device before the CS pin is deasserted, and the  
CS pin must be deasserted on an even byte boundary (multiples of eight bits); otherwise, no  
erase will be performed. In addition, if any sector of the memory array is in the protected or  
locked down state, then the Chip Erase command will not be executed, and the device will return  
to the idle state once the CS pin has been deasserted. The WEL bit in the Status Register will be  
reset back to the logical “0” state if the CS pin is deasserted on uneven byte boundaries or if a  
sector is in the protected or locked down state.  
While the device is executing a successful erase cycle, the Status Register can be read and will  
indicate that the device is busy. For faster throughput, it is recommended that the Status Regis-  
ter be polled rather than waiting the tCHPE time to determine if the device has finished erasing. At  
some point before the erase cycle completes, the WEL bit in the Status Register will be reset  
back to the logical “0” state.  
The device also incorporates an intelligent erase algorithm that can detect when a byte location  
fails to erase properly. If an erase error occurs, it will be indicated by the EPE bit in the Status  
Register.  
16  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 8-6. Chip Erase  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
OPCODE  
C
C
C
C
C
C
C
C
MSB  
HIGH-IMPEDANCE  
SO  
8.5  
Program/Erase Suspend  
In some code plus data storage applications, it is often necessary to process certain high-level  
system interrupts that require relatively immediate reading of code or data from the Flash mem-  
ory. In such an instance, it may not be possible for the system to wait the microseconds or  
milliseconds required for the Flash memory to complete a program or erase cycle. The Pro-  
gram/Erase Suspend command allows a program or erase operation in progress to a particular  
64-Kbyte sector of the Flash memory array to be suspended so that other device operations can  
be performed. For example, by suspending an erase operation to a particular sector, the system  
can perform functions such as a program or read operation within another 64-Kbyte sector in the  
device. Other device operations, such as a Read Status Register, can also be performed while a  
program or erase operation is suspended. Table 8-1 outlines the operations that are allowed and  
not allowed during a program or erase suspend.  
Since the need to suspend a program or erase operation is immediate, the Write Enable com-  
mand does not need to be issued prior to the Program/Erase Suspend command being issued.  
Therefore, the Program/Erase Suspend command operates independently of the state of the  
WEL bit in the Status Register.  
To perform a Program/Erase Suspend, the CS pin must first be asserted and the opcode of B0h  
must be clocked into the device. No address bytes need to be clocked into the device, and any  
data clocked in after the opcode will be ignored. When the CS pin is deasserted, the program or  
erase operation currently in progress will be suspended within a time of tSUSP. The Program Sus-  
pend (PS) bit or the Erase Suspend (ES) bit in the Status Register will then be set to the logical  
“1” state to indicate that the program or erase operation has been suspended. In addition, the  
RDY/BSY bit in the Status Register will indicate that the device is ready for another operation.  
The complete opcode must be clocked into the device before the CS pin is deasserted, and the  
CS pin must be deasserted on an even byte boundary (multiples of eight bits); otherwise, no  
suspend operation will be performed.  
Read operations are not allowed to a 64-Kbyte sector that has had its program or erase opera-  
tion suspended. If a read is attempted to a suspended sector, then the device will output  
undefined data. Therefore, when performing a Read Array operation to an unsuspended sector  
and the device’s internal address counter increments and crosses the sector boundary to a sus-  
pended sector, the device will then start outputting undefined data continuously until the address  
counter increments and crosses a sector boundary to an unsuspended sector.  
A program operation is not allowed to a sector that has been erase suspended. If a program  
operation is attempted to an erase suspended sector, then the program operation will abort and  
the WEL bit in the Status Register will be reset back to the logical “0” state. Likewise, an erase  
17  
3680E–DFLASH–12/08  
operation is not allowed to a sector that has been program suspended. If attempted, the erase  
operation will abort and the WEL bit in the Status Register will be reset to a logical “0” state.  
During an Erase Suspend, a program operation to a different 64-Kbyte sector can be started and  
subsequently suspended. This results in a simultaneous Erase Suspend/Program Suspend con-  
dition and will be indicated by the states of both the ES and PS bits in the Status Register being  
set to the logical “1” state.  
If a Reset operation (see “Reset” on page 42) is performed while a sector is erase suspended,  
the suspend operation will abort and the contents of the block in the suspended sector will be left  
in an undefined state. However, if a Reset is performed while a sector is program suspended,  
the suspend operation will abort but only the contents of the page that was being programmed  
and subsequently suspended will be undefined. The remaining pages in the 64-Kbyte sector will  
retain their previous contents.  
If an attempt is made to perform an operation that is not allowed during a program or erase sus-  
pend, such as a Protect Sector operation, then the device will simply ignore the opcode and no  
operation will be performed. The state of the WEL bit in the Status Register, as well as the SPRL  
(Sector Protection Registers Locked) and SLE (Sector Lockdown Enabled) bits, will not be  
affected.  
18  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
.
Table 8-1.  
Operations Allowed and Not Allowed During a Program or Erase Suspend  
Operation During  
Program Suspend  
Operation During  
Erase Suspend  
Command  
Read Commands  
Read Array (All Opcodes)  
Allowed  
Allowed  
Program and Erase Commands  
Block Erase  
Not Allowed  
Not Allowed  
Not Allowed  
Not Allowed  
Allowed  
Not Allowed  
Not Allowed  
Allowed  
Chip Erase  
Byte/Page Program (All Opcodes)  
Program/Erase Suspend  
Program/Erase Resume  
Protection Commands  
Write Enable  
Allowed  
Allowed  
Not Allowed  
Not Allowed  
Not Allowed  
Not Allowed  
Not Allowed  
Allowed  
Allowed  
Allowed  
Write Disable  
Protect Sector  
Not Allowed  
Not Allowed  
Not Allowed  
Allowed  
Unprotect Sector  
Global Protect/Unprotect  
Read Sector Protection Registers  
Security Commands  
Sector Lockdown  
Not Allowed  
Not Allowed  
Allowed  
Not Allowed  
Not Allowed  
Allowed  
Freeze Sector Lockdown State  
Read Sector Lockdown Registers  
Program OTP Security Register  
Read OTP Security Register  
Status Register Commands  
Read Status Register  
Not Allowed  
Allowed  
Not Allowed  
Allowed  
Allowed  
Allowed  
Write Status Register (All Opcodes)  
Miscellaneous Commands  
Reset  
Not Allowed  
Not Allowed  
Allowed  
Allowed  
Allowed  
Allowed  
Read Manufacturer and Device ID  
Deep Power-Down  
Not Allowed  
Not Allowed  
Not Allowed  
Not Allowed  
Resume from Deep Power-Down  
19  
3680E–DFLASH–12/08  
Figure 8-7. Program/Erase Suspend  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
OPCODE  
1
0
1
1
0
0
0
0
MSB  
HIGH-IMPEDANCE  
SO  
8.6  
Program/Erase Resume  
The Program/Erase Resume command allows a suspended program or erase operation to be  
resumed and continue programming a Flash page or erasing a Flash memory block where it left  
off. As with the Program/Erase Suspend command, the Write Enable command does not need  
to be issued prior to the Program/Erase Resume command being issued. Therefore, the Pro-  
gram/Erase Resume command operates independently of the state of the WEL bit in the Status  
Register.  
To perform a Program/Erase Resume, the CS pin must first be asserted and the opcode of D0h  
must be clocked into the device. No address bytes need to be clocked into the device, and any  
data clocked in after the opcode will be ignored. When the CS pin is deasserted, the program or  
erase operation currently suspended will be resumed within a time of tRES. The PS bit or the ES  
bit in the Status Register will then be reset back to the logical “0” state to indicate that the pro-  
gram or erase operation is no longer suspended. In addition, the RDY/BSY bit in the Status  
Register will indicate that the device is busy performing a program or erase operation. The com-  
plete opcode must be clocked into the device before the CS pin is deasserted, and the CS pin  
must be deasserted on an even byte boundary (multiples of eight bits); otherwise, no resume  
operation will be performed.  
During a simultaneous Erase Suspend/Program Suspend condition, issuing the Program/Erase  
Resume command will result in the program operation resuming first. After the program opera-  
tion has been completed, the Program/Erase Resume command must be issued again in order  
for the erase operation to be resumed.  
While the device is busy resuming a program or erase operation, any attempts at issuing the  
Program/Erase Suspend command will be ignored. Therefore, if a resumed program or erase  
operation needs to be subsequently suspended again, the system must either wait the entire  
t
RES time before issuing the Program/Erase Suspend command, or it must check the status of  
the RDY/BSY bit or the appropriate PS or ES bit in the Status Register to determine if the previ-  
ously suspended program or erase operation has resumed.  
20  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 8-8. Program/Erase Resume  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
OPCODE  
1
1
0
1
0
0
0
0
MSB  
HIGH-IMPEDANCE  
SO  
9. Protection Commands and Features  
9.1  
Write Enable  
The Write Enable command is used to set the Write Enable Latch (WEL) bit in the Status Regis-  
ter to a logical “1” state. The WEL bit must be set before a Byte/Page Program, erase, Protect  
Sector, Unprotect Sector, Sector Lockdown, Freeze Sector Lockdown State, Program OTP  
Security Register, or Write Status Register command can be executed. This makes the issuance  
of these commands a two step process, thereby reducing the chances of a command being  
accidentally or erroneously executed. If the WEL bit in the Status Register is not set prior to the  
issuance of one of these commands, then the command will not be executed.  
To issue the Write Enable command, the CS pin must first be asserted and the opcode of 06h  
must be clocked into the device. No address bytes need to be clocked into the device, and any  
data clocked in after the opcode will be ignored. When the CS pin is deasserted, the WEL bit in  
the Status Register will be set to a logical “1”. The complete opcode must be clocked into the  
device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte  
boundary (multiples of eight bits); otherwise, the device will abort the operation and the state of  
the WEL bit will not change.  
Figure 9-1. Write Enable  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
OPCODE  
0
0
0
0
0
1
1
0
MSB  
HIGH-IMPEDANCE  
SO  
21  
3680E–DFLASH–12/08  
9.2  
Write Disable  
The Write Disable command is used to reset the Write Enable Latch (WEL) bit in the Status Reg-  
ister to the logical "0" state. With the WEL bit reset, all Byte/Page Program, erase, Protect  
Sector, Unprotect Sector, Sector Lockdown, Freeze Sector Lockdown State, Program OTP  
Security Register, and Write Status Register commands will not be executed. Other conditions  
can also cause the WEL bit to be reset; for more details, refer to the WEL bit section of the Sta-  
tus Register description.  
To issue the Write Disable command, the CS pin must first be asserted and the opcode of 04h  
must be clocked into the device. No address bytes need to be clocked into the device, and any  
data clocked in after the opcode will be ignored. When the CS pin is deasserted, the WEL bit in  
the Status Register will be reset to a logical “0”. The complete opcode must be clocked into the  
device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte  
boundary (multiples of eight bits); otherwise, the device will abort the operation and the state of  
the WEL bit will not change.  
Figure 9-2. Write Disable  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
OPCODE  
0
0
0
0
0
1
0
0
MSB  
HIGH-IMPEDANCE  
SO  
9.3  
Protect Sector  
Every physical 64-Kbyte sector of the device has a corresponding single-bit Sector Protection  
Register that is used to control the software protection of a sector. Upon device power-up, each  
Sector Protection Register will default to the logical “1” state indicating that all sectors are pro-  
tected and cannot be programmed or erased.  
Issuing the Protect Sector command to a particular sector address will set the corresponding  
Sector Protection Register to the logical “1” state. The following table outlines the two states of  
the Sector Protection Registers.  
Table 9-1.  
Sector Protection Register Values  
Value  
Sector Protection Status  
0
1
Sector is unprotected and can be programmed and erased.  
Sector is protected and cannot be programmed or erased. This is the default state.  
Before the Protect Sector command can be issued, the Write Enable command must have been  
previously issued to set the WEL bit in the Status Register to a logical “1”. To issue the Protect  
Sector command, the CS pin must first be asserted and the opcode of 36h must be clocked into  
the device followed by three address bytes designating any address within the sector to be pro-  
tected. Any additional data clocked into the device will be ignored. When the CS pin is  
deasserted, the Sector Protection Register corresponding to the physical sector addressed by  
22  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
A23-A0 will be set to the logical “1” state, and the sector itself will then be protected from pro-  
gram and erase operations. In addition, the WEL bit in the Status Register will be reset back to  
the logical “0” state.  
The complete three address bytes must be clocked into the device before the CS pin is deas-  
serted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits);  
otherwise, the device will abort the operation. When the device aborts the Protect Sector opera-  
tion, the state of the Sector Protection Register will be unchanged, and the WEL bit in the Status  
Register will be reset to a logical “0”.  
As a safeguard against accidental or erroneous protecting or unprotecting of sectors, the Sector  
Protection Registers can themselves be locked from updates by using the SPRL (Sector Protec-  
tion Registers Locked) bit of the Status Register (please refer to the Status Register description  
for more details). If the Sector Protection Registers are locked, then any attempts to issue the  
Protect Sector command will be ignored, and the device will reset the WEL bit in the Status Reg-  
ister back to a logical “0” and return to the idle state once the CS pin has been deasserted.  
Figure 9-3. Protect Sector  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
26 27 28 29 30 31  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
0
0
1
1
0
1
1
0
A
A
A
A
A
A
A
A
A
A
A
A
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
9.4  
Unprotect Sector  
Issuing the Unprotect Sector command to a particular sector address will reset the correspond-  
ing Sector Protection Register to the logical “0” state (see Table 9-1 for Sector Protection  
Register values). Every physical sector of the device has a corresponding single-bit Sector Pro-  
tection Register that is used to control the software protection of a sector.  
Before the Unprotect Sector command can be issued, the Write Enable command must have  
been previously issued to set the WEL bit in the Status Register to a logical “1”. To issue the  
Unprotect Sector command, the CS pin must first be asserted and the opcode of 39h must be  
clocked into the device. After the opcode has been clocked in, the three address bytes designat-  
ing any address within the sector to be unprotected must be clocked in. Any additional data  
clocked into the device after the address bytes will be ignored. When the CS pin is deasserted,  
the Sector Protection Register corresponding to the sector addressed by A23-A0 will be reset to  
the logical “0” state, and the sector itself will be unprotected. In addition, the WEL bit in the Sta-  
tus Register will be reset back to the logical “0” state.  
The complete three address bytes must be clocked into the device before the CS pin is deas-  
serted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits);  
otherwise, the device will abort the operation, the state of the Sector Protection Register will be  
unchanged, and the WEL bit in the Status Register will be reset to a logical “0”.  
23  
3680E–DFLASH–12/08  
As a safeguard against accidental or erroneous locking or unlocking of sectors, the Sector Pro-  
tection Registers can themselves be locked from updates by using the SPRL (Sector Protection  
Registers Locked) bit of the Status Register (please refer to the Status Register description for  
more details). If the Sector Protection Registers are locked, then any attempts to issue the  
Unprotect Sector command will be ignored, and the device will reset the WEL bit in the Status  
Register back to a logical “0” and return to the idle state once the CS pin has been deasserted.  
Figure 9-4. Unprotect Sector  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
26 27 28 29 30 31  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
0
0
1
1
1
0
0
1
A
A
A
A
A
A
A
A
A
A
A
A
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
9.5  
Global Protect/Unprotect  
The Global Protect and Global Unprotect features can work in conjunction with the Protect Sec-  
tor and Unprotect Sector functions. For example, a system can globally protect the entire  
memory array and then use the Unprotect Sector command to individually unprotect certain sec-  
tors and individually reprotect them later by using the Protect Sector command. Likewise, a  
system can globally unprotect the entire memory array and then individually protect certain sec-  
tors as needed.  
Performing a Global Protect or Global Unprotect is accomplished by writing a certain combina-  
tion of data to the Status Register using the Write Status Register Byte 1 command (see “Write  
Status Register Byte 1” on page 40 for command execution details). The Write Status Register  
command is also used to modify the SPRL (Sector Protection Registers Locked) bit to control  
hardware and software locking.  
To perform a Global Protect, the appropriate WP pin and SPRL conditions must be met, and the  
system must write a logical “1” to bits 5, 4, 3, and 2 of the first byte of the Status Register. Con-  
versely, to perform a Global Unprotect, the same WP and SPRL conditions must be met but the  
system must write a logical “0” to bits 5, 4, 3, and 2 of the first byte of the Status Register. Table  
9-2 details the conditions necessary for a Global Protect or Global Unprotect to be performed.  
Sectors that have been erase or program suspended must remain in the unprotected state. If a  
Global Protect operation is attempted while a sector is erase or program suspended, the protec-  
tion operation will abort, the protection states of all sectors in the Flash memory array will not  
change, and WEL bit in the Status Register will be reset back to a logical “0”.  
24  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Table 9-2.  
Valid SPRL and Global Protect/Unprotect Conditions  
New Write Status  
Register Byte 1  
Data  
Current  
SPRL  
Value  
New  
SPRL  
Value  
WP  
State  
Bit  
7 6 5 4 3 2 1 0  
Protection Operation  
0 x 0 0 0 0 x x  
0 x 0 0 0 1 x x  
Global Unprotect – all Sector Protection Registers reset to 0  
No change to current protection.  
No change to current protection.  
No change to current protection.  
Global Protect – all Sector Protection Registers set to 1  
0
0
0
0
0
0 x 1 1 1 0 x x  
0 x 1 1 1 1 x x  
0
0
1
0
1
0
1 x 0 0 0 0 x x  
1 x 0 0 0 1 x x  
Global Unprotect – all Sector Protection Registers reset to 0  
No change to current protection.  
No change to current protection.  
No change to current protection.  
Global Protect – all Sector Protection Registers set to 1  
1
1
1
1
1
1 x 1 1 1 0 x x  
1 x 1 1 1 1 x x  
No change to the current protection level. All sectors currently  
protected will remain protected and all sectors currently unprotected  
will remain unprotected.  
x x x x x x x x  
The Sector Protection Registers are hard-locked and cannot be  
changed when the WP pin is LOW and the current state of SPRL is 1.  
Therefore, a Global Protect/Unprotect will not occur. In addition, the  
SPRL bit cannot be changed (the WP pin must be HIGH in order to  
change SPRL back to a 0).  
0 x 0 0 0 0 x x  
0 x 0 0 0 1 x x  
Global Unprotect – all Sector Protection Registers reset to 0  
No change to current protection.  
No change to current protection.  
No change to current protection.  
Global Protect – all Sector Protection Registers set to 1  
0
0
0
0
0
0 x 1 1 1 0 x x  
0 x 1 1 1 1 x x  
1 x 0 0 0 0 x x  
1 x 0 0 0 1 x x  
Global Unprotect – all Sector Protection Registers reset to 0  
No change to current protection.  
No change to current protection.  
No change to current protection.  
Global Protect – all Sector Protection Registers set to 1  
1
1
1
1
1
1 x 1 1 1 0 x x  
1 x 1 1 1 1 x x  
0 x 0 0 0 0 x x  
0 x 0 0 0 1 x x  
No change to the current protection level. All sectors  
currently protected will remain protected, and all sectors  
currently unprotected will remain unprotected.  
0
0
0
0
0
0 x 1 1 1 0 x x  
0 x 1 1 1 1 x x  
The Sector Protection Registers are soft-locked and cannot  
be changed when the current state of SPRL is 1. Therefore,  
a Global Protect/Unprotect will not occur. However, the  
SPRL bit can be changed back to a 0 from a 1 since the WP  
pin is HIGH. To perform a Global Protect/Unprotect, the  
Write Status Register command must be issued again after  
the SPRL bit has been changed from a 1 to a 0.  
1
1
1 x 0 0 0 0 x x  
1 x 0 0 0 1 x x  
1
1
1
1
1
1 x 1 1 1 0 x x  
1 x 1 1 1 1 x x  
Essentially, if the SPRL bit of the Status Register is in the logical “0” state (Sector Protection  
Registers are not locked), then writing a 00h to the first byte of the Status Register will perform a  
Global Unprotect without changing the state of the SPRL bit. Similarly, writing a 7Fh to the first  
byte of the Status Register will perform a Global Protect and keep the SPRL bit in the logical “0”  
state. The SPRL bit can, of course, be changed to a logical “1” by writing an FFh if software-lock-  
ing or hardware-locking is desired along with the Global Protect.  
25  
3680E–DFLASH–12/08  
If the desire is to only change the SPRL bit without performing a Global Protect or Global Unpro-  
tect, then the system can simply write a 0Fh to the first byte of the Status Register to change the  
SPRL bit from a logical “1” to a logical “0” provided the WP pin is deasserted. Likewise, the sys-  
tem can write an F0h to change the SPRL bit from a logical “0” to a logical “1” without affecting  
the current sector protection status (no changes will be made to the Sector Protection  
Registers).  
When writing to the first byte of the Status Register, bits 5, 4, 3, and 2 will not actually be modi-  
fied but will be decoded by the device for the purposes of the Global Protect and Global  
Unprotect functions. Only bit 7, the SPRL bit, will actually be modified. Therefore, when reading  
the first byte of the Status Register, bits 5, 4, 3, and 2 will not reflect the values written to them  
but will instead indicate the status of the WP pin and the sector protection status. Please refer to  
“Read Status Register” on page 35 and Table 11-1 on page 36 for details on the Status Register  
format and what values can be read for bits 5, 4, 3, and 2.  
9.6  
Read Sector Protection Registers  
The Sector Protection Registers can be read to determine the current software protection status  
of each sector. Reading the Sector Protection Registers, however, will not determine the status  
of the WP pin.  
To read the Sector Protection Register for a particular sector, the CS pin must first be asserted  
and the opcode of 3Ch must be clocked in. Once the opcode has been clocked in, three address  
bytes designating any address within the sector must be clocked in. After the last address byte  
has been clocked in, the device will begin outputting data on the SO pin during every subse-  
quent clock cycle. The data being output will be a repeating byte of either FFh or 00h to denote  
the value of the appropriate Sector Protection Register.  
At clock frequencies above fCLK, the first byte of data output will not be valid. Therefore, if operat-  
ing at clock frequencies above fCLK, at least two bytes of data must be clocked out from the  
device in order to determine the correct status of the appropriate Sector Protection Register.  
Table 9-3.  
Output Data  
Read Sector Protection Register - Output Data  
Sector Protection Register Value  
00h  
FFh  
Sector Protection Register value is 0 (sector is unprotected).  
Sector Protection Register value is 1 (sector is protected).  
Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-  
ance state. The CS pin can be deasserted at any time and does not require that a full byte of  
data be read.  
In addition to reading the individual Sector Protection Registers, the Software Protection Status  
(SWP) bits in the Status Register can be read to determine if all, some, or none of the sectors  
are software protected (refer to “Read Status Register” on page 35 for more details).  
26  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 9-5. Read Sector Protection Register  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39 40  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0  
0
0
1
1
1
1
0
0
A
A
A
A
A
A
A
A
A
MSB  
MSB  
DATA BYTE  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
9.7  
Protected States and the Write Protect (WP) Pin  
The WP pin is not linked to the memory array itself and has no direct effect on the protection sta-  
tus or lockdown status of the memory array. Instead, the WP pin, in conjunction with the SPRL  
(Sector Protection Registers Locked) bit in the Status Register, is used to control the hardware  
locking mechanism of the device. For hardware locking to be active, two conditions must be met-  
the WP pin must be asserted and the SPRL bit must be in the logical “1” state.  
When hardware locking is active, the Sector Protection Registers are locked and the SPRL bit  
itself is also locked. Therefore, sectors that are protected will be locked in the protected state,  
and sectors that are unprotected will be locked in the unprotected state. These states cannot be  
changed as long as hardware locking is active, so the Protect Sector, Unprotect Sector, and  
Write Status Register commands will be ignored. In order to modify the protection status of a  
sector, the WP pin must first be deasserted, and the SPRL bit in the Status Register must be  
reset back to the logical “0” state using the Write Status Register command. When resetting the  
SPRL bit back to a logical “0”, it is not possible to perform a Global Protect or Global Unprotect  
at the same time since the Sector Protection Registers remain soft-locked until after the Write  
Status Register command has been executed.  
If the WP pin is permanently connected to GND, then once the SPRL bit is set to a logical “1”,  
the only way to reset the bit back to the logical “0” state is to power-cycle the device. This allows  
a system to power-up with all sectors software protected but not hardware locked. Therefore,  
sectors can be unprotected and protected as needed and then hardware locked at a later time  
by simply setting the SPRL bit in the Status Register.  
When the WP pin is deasserted, or if the WP pin is permanently connected to VCC, the SPRL bit  
in the Status Register can still be set to a logical “1” to lock the Sector Protection Registers. This  
provides a software locking ability to prevent erroneous Protect Sector or Unprotect Sector com-  
mands from being processed. When changing the SPRL bit to a logical “1” from a logical “0”, it is  
also possible to perform a Global Protect or Global Unprotect at the same time by writing the  
appropriate values into bits 5, 4, 3, and 2 of the first byte of the Status Register.  
Tables 9-4 and 9-5 detail the various protection and locking states of the device.  
27  
3680E–DFLASH–12/08  
Table 9-4.  
Sector Protection Register States  
Sector Protection Register  
Sector  
n(1)  
WP  
n(1)  
0
Unprotected  
Protected  
X
(Don't Care)  
1
Note:  
1. “n” represents a sector number  
Table 9-5.  
Hardware and Software Locking  
WP  
SPRL  
Locking  
SPRL Change Allowed  
Sector Protection Registers  
Unlocked and modifiable using the  
Protect and Unprotect Sector commands.  
Global Protect and Unprotect can also be  
performed.  
0
0
1
0
1
Can be modified from 0 to 1  
Locked in current state. Protect and  
Unprotect Sector commands will be  
ignored. Global Protect and Unprotect  
cannot be performed.  
Hardware  
Locked  
0
1
1
Locked  
Unlocked and modifiable using the  
Protect and Unprotect Sector commands.  
Global Protect and Unprotect can also be  
performed.  
Can be modified from 0 to 1  
Can be modified from 1 to 0  
Locked in current state. Protect and  
Unprotect Sector commands will be  
ignored. Global Protect and Unprotect  
cannot be performed.  
Software  
Locked  
28  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
10. Security Commands  
10.1 Sector Lockdown  
Certain applications require that portions of the Flash memory array be permanently protected  
against malicious attempts at altering program code, data modules, security information, or  
encryption/decryption algorithms, keys, and routines. To address these applications, the device  
incorporates a sector lockdown mechanism that allows any combination of individual 64-Kbyte  
sectors to be permanently locked so that they become read only. Once a sector is locked down,  
it can never be erased or programmed again, and it can never be unlocked from the locked  
down state.  
Each 64-Kbyte physical sector has a corresponding single-bit Sector Lockdown Register that is  
used to control the lockdown status of that sector. These registers are nonvolatile and will retain  
their state even after a device power-cycle or reset operation. The following table outlines the  
two states of the Sector Lockdown Registers.  
Table 10-1. Sector Lockdown Register Values  
Value  
Sector Lockdown Status  
0
1
Sector is not locked down and can be programmed and erased. This is the default state.  
Sector is permanently locked down and can never be programmed or erased again.  
Issuing the Sector Lockdown command to a particular sector address will set the corresponding  
Sector Lockdown Register to the logical “1” state. Each Sector Lockdown Register can only be  
set once; therefore, once set to the logical “1” state, a Sector Lockdown Register cannot be reset  
back to the logical “0” state.  
Before the Sector Lockdown command can be issued, the Write Enable command must have  
been previously issued to set the WEL bit in the Status Register to a logical “1”. In addition, the  
Sector Lockdown Enabled (SLE) bit in the Status Register must have also been previously set to  
the logical “1” state by using the Write Status Register Byte 2 command (see “Write Status Reg-  
ister Byte 2” on page 41). To issue the Sector Lockdown command, the CS pin must first be  
asserted and the opcode of 33h must be clocked into the device followed by three address bytes  
designating any address within the 64-Kbyte sector to be locked down. After the three address  
bytes have been clocked in, a confirmation byte of D0h must also be clocked in immediately fol-  
lowing the three address bytes. Any additional data clocked into the device after the first byte of  
data will be ignored. When the CS pin is deasserted, the Sector Lockdown Register correspond-  
ing to the sector addressed by A23-A0 will be set to the logical “1” state, and the sector itself will  
then be permanently locked down from program and erase operations within a time of tLOCK. In  
addition, the WEL bit in the Status Register will be reset back to the logical “0” state.  
The complete three address bytes and the correct confirmation byte value of D0h must be  
clocked into the device before the CS pin is deasserted, and the CS pin must be deasserted on  
an even byte boundary (multiples of eight bits); otherwise, the device will abort the operation.  
When the device aborts the Sector Lockdown operation, the state of the corresponding Sector  
Lockdown Register as well as the SLE bit in the Status Register will be unchanged; however, the  
WEL bit in the Status Register will be reset to a logical “0”.  
As a safeguard against accidental or erroneous locking down of sectors, the Sector Lockdown  
command can be enabled and disabled as needed by using the SLE bit in the Status Register.  
In addition, the current sector lockdown state can be frozen so that no further modifications to  
29  
3680E–DFLASH–12/08  
the Sector Lockdown Registers can be made (see “Freeze Sector Lockdown State” below). If  
the Sector Lockdown command is disabled or if the sector lockdown state is frozen, then any  
attempts to issue the Sector Lockdown command will be ignored, and the device will reset the  
WEL bit in the Status Register back to a logical “0” and return to the idle state once the CS pin  
has been deasserted.  
Figure 10-1. Sector Lockdown  
CS  
0
1
2
3
4
5
6
7
8
9
29 30 31 32 33 34 35 36 37 38 39  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0 CONFIRMATION BYTE IN  
0
0
1
1
0
0
1
1
A
A
A
A
A
A
1
1
0
1
0
0
0
0
MSB  
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
10.2 Freeze Sector Lockdown State  
The current sector lockdown state can be permanently frozen so that no further modifications to  
the Sector Lockdown Registers can be made; therefore, the Sector Lockdown command will be  
permanently disabled, and no additional sectors can be locked down aside from those already  
locked down. Any attempts to issue the Sector Lockdown command after the sector lockdown  
state has been frozen will be ignored.  
Before the Freeze Sector Lockdown State command can be issued, the Write Enable command  
must have been previously issued to set the WEL bit in the Status Register to a logical “1”. In  
addition, the Sector Lockdown Enabled (SLE) bit in the Status Register must have also been  
previously set to the logical “1” state. To issue the Freeze Sector Lockdown State command, the  
CS pin must first be asserted and the opcode of 34h must be clocked into the device followed by  
three command specific address bytes of 55AA40h. After the three address bytes have been  
clocked in, a confirmation byte of D0h must be clocked in immediately following the three  
address bytes. Any additional data clocked into the device will be ignored. When the CS pin is  
deasserted, the current sector lockdown state will be permanently frozen within a time of tLOCK  
.
In addition, the WEL bit in the Status Register will be reset back to the logical “0” state, and the  
SLE bit will be permanently reset to a logical “0” to indicate that the Sector Lockdown command  
is permanently disabled.  
The complete and correct three address bytes and the confirmation byte must be clocked into  
the device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte  
boundary (multiples of eight bits); otherwise, the device will abort the operation. When the  
device aborts the Freeze Sector Lockdown State operation, the WEL bit in the Status Register  
will be reset to a logical “0”; however, the state of the SLE bit will be unchanged.  
30  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 10-2. Freeze Sector Lockdown State  
CS  
0
1
2
3
4
5
6
7
8
9
29 30 31 32 33 34 35 36 37 38 39  
SCK  
SI  
OPCODE  
ADDRESS BITS A23-A0 CONFIRMATION BYTE IN  
0
0
1
1
0
1
0
0
0
1
0
0
0
0
1
1
0
1
0
0
0
0
MSB  
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
10.3 Read Sector Lockdown Registers  
The Sector Lockdown Registers can be read to determine the current lockdown status of each  
physical 64-Kbyte sector. To read the Sector Lockdown Register for a particular 64-Kbyte sec-  
tor, the CS pin must first be asserted and the opcode of 35h must be clocked in. Once the  
opcode has been clocked in, three address bytes designating any address within the 64-Kbyte  
sector must be clocked in. After the address bytes have been clocked in, data will be output on  
the SO pin during every subsequent clock cycle. The data being output will be a repeating byte  
of either FFh or 00h to denote the value of the appropriate Sector Lockdown Register.  
At clock frequencies above fCLK, the first byte of data output will not be valid. Therefore, if operat-  
ing at clock frequencies above fCLK, at least two bytes of data must be clocked out from the  
device in order to determine the correct status of the appropriate Sector Lockdown Register.  
Table 10-2. Read Sector Lockdown Register – Output Data  
Output Data  
00h  
Sector Lockdown Register Value  
Sector Lockdown Register value is 0 (sector is not locked down).  
Sector Lockdown Register value is 1 (sector is permanently locked down).  
FFh  
Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-  
ance state. The CS pin can be deasserted at any time and does not require that a full byte of  
data be read.  
Figure 10-3. Read Sector Lockdown Register  
CS  
SCK  
SI  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48  
OPCODE  
ADDRESS BITS A23-A0  
DON'T CARE  
0
0
1
1
0
1
0
1
A
A
A
A
A
A
A
A
A
X
X
X
X
X
X
X
X
MSB  
MSB  
MSB  
DATA BYTE  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
31  
3680E–DFLASH–12/08  
10.4 Program OTP Security Register  
The device contains a specialized OTP (One-Time Programmable) Security Register that can be  
used for purposes such as unique device serialization, system-level Electronic Serial Number  
(ESN) storage, locked key storage, etc. The OTP Security Register is independent of the main  
Flash memory array and is comprised of a total of 128 bytes of memory divided into two por-  
tions. The first 64 bytes (byte locations 0 through 63) of the OTP Security Register are allocated  
as a one-time user-programmable space. Once these 64 bytes have been programmed, they  
cannot be erased or reprogrammed. The remaining 64 bytes of the OTP Security Register (byte  
locations 64 through 127) are factory programmed by Atmel and will contain a unique value for  
each device. The factory programmed data is fixed and cannot be changed.  
Table 10-3. OTP Security Register  
Security Register  
Byte Number  
0
1
. . .  
62  
63  
64  
65  
. . .  
126  
127  
One-Time User Programmable  
Factory Programmed by Atmel  
The user-programmable portion of the OTP Security Register does not need to be erased before  
it is programmed. In addition, the Program OTP Security Register command operates on the  
entire 64-byte user-programmable portion of the OTP Security Register at one time. Once the  
user-programmable space has been programmed with any number of bytes, the user-program-  
mable space cannot be programmed again; therefore, it is not possible to only program the first  
two bytes of the register and then program the remaining 62 bytes at a later time.  
Before the Program OTP Security Register command can be issued, the Write Enable command  
must have been previously issued to set the WEL bit in the Status Register to a logical “1”. To  
program the OTP Security Register, the CS pin must first be asserted and an opcode of 9Bh  
must be clocked into the device followed by the three address bytes denoting the first byte loca-  
tion of the OTP Security Register to begin programming at. Since the size of the user-  
programmable portion of the OTP Security Register is 64 bytes, the upper order address bits do  
not need to be decoded by the device. Therefore, address bits A23-A6 will be ignored by the  
device and their values can be either a logical “1” or “0”. After the address bytes have been  
clocked in, data can then be clocked into the device and will be stored in the internal buffer.  
If the starting memory address denoted by A23-A0 does not start at the beginning of the OTP  
Security Register memory space (A5-A0 are not all 0), then special circumstances regarding  
which OTP Security Register locations to be programmed will apply. In this situation, any data  
that is sent to the device that goes beyond the end of the 64-byte user-programmable space will  
wrap around back to the beginning of the OTP Security Register. For example, if the starting  
address denoted by A23-A0 is 00003Eh, and three bytes of data are sent to the device, then the  
first two bytes of data will be programmed at OTP Security Register addresses 00003Eh and  
00003Fh while the last byte of data will be programmed at address 000000h. The remaining  
bytes in the OTP Security Register (addresses 000001h through 00003Dh) will not be pro-  
grammed and will remain in the erased state (FFh). In addition, if more than 64 bytes of data are  
sent to the device, then only the last 64 bytes sent will be latched into the internal buffer.  
When the CS pin is deasserted, the device will take the data stored in the internal buffer and pro-  
gram it into the appropriate OTP Security Register locations based on the starting address  
specified by A23-A0 and the number of data bytes sent to the device. If less than 64 bytes of  
data were sent to the device, then the remaining bytes within the OTP Security Register will not  
32  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
be programmed and will remain in the erased state (FFh). The programming of the data bytes is  
internally self-timed and should take place in a time of tOTPP. It is not possible to suspend the  
programming of the OTP Security Register.  
The three address bytes and at least one complete byte of data must be clocked into the device  
before the CS pin is deasserted, and the CS pin must be deasserted on even byte boundaries  
(multiples of eight bits); otherwise, the device will abort the operation and the user-programma-  
ble portion of the OTP Security Register will not be programmed. The WEL bit in the Status  
Register will be reset back to the logical “0” state if the OTP Security Register program cycle  
aborts due to an incomplete address being sent, an incomplete byte of data being sent, the CS  
pin being deasserted on uneven byte boundaries, or because the user-programmable portion of  
the OTP Security Register was previously programmed.  
While the device is programming the OTP Security Register, the Status Register can be read  
and will indicate that the device is busy. For faster throughput, it is recommended that the Status  
Register be polled rather than waiting the tOTPP time to determine if the data bytes have finished  
programming. At some point before the OTP Security Register programming completes, the  
WEL bit in the Status Register will be reset back to the logical “0” state.  
If the device is powered-down during the OTP Security Register program cycle, then the con-  
tents of the 64-byte user programmable portion of the OTP Security Register cannot be  
guaranteed and cannot be programmed again.  
The Program OTP Security Register command utilizes the internal 256-buffer for processing.  
Therefore, the contents of the buffer will be altered from its previous state when this command is  
issued.  
Figure 10-4. Program OTP Security Register  
CS  
SCK  
SI  
0
1
2
3
4
5
6
7
8
9
29 30 31 32 33 34 35 36 37 38 39  
OPCODE  
ADDRESS BITS A23-A0  
DATA IN BYTE 1  
DATA IN BYTE n  
1
0
0
1
1
0
1
1
A
A
A
A
A
A
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
MSB  
MSB  
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
33  
3680E–DFLASH–12/08  
10.5 Read OTP Security Register  
The OTP Security Register can be sequentially read in a similar fashion to the Read Array oper-  
ation up to the maximum clock frequency specified by fMAX. To read the OTP Security Register,  
the CS pin must first be asserted and the opcode of 77h must be clocked into the device. After  
the opcode has been clocked in, the three address bytes must be clocked in to specify the start-  
ing address location of the first byte to read within the OTP Security Register. Following the  
three address bytes, two dummy bytes must be clocked into the device before data can be  
output.  
After the three address bytes and the dummy bytes have been clocked in, additional clock  
cycles will result in OTP Security Register data being output on the SO pin. When the last byte  
(00007Fh) of the OTP Security Register has been read, the device will continue reading back at  
the beginning of the register (000000h). No delays will be incurred when wrapping around from  
the end of the register to the beginning of the register.  
Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-  
ance state. The CS pin can be deasserted at any time and does not require that a full byte of  
data be read.  
Figure 10-5. Read OTP Security Register  
CS  
SCK  
SI  
0
1
2
3
4
5
6
7
8
9
10 11 12  
29 30 31 32 33 34 35 36  
OPCODE  
ADDRESS BITS A23-A0  
DON'T CARE  
0
1
1
1
0
1
1
1
A
A
A
A
A
A
A
A
A
X
X
X
X
X
X
X
X
X
MSB  
MSB  
MSB  
DATA BYTE 1  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
34  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
11. Status Register Commands  
11.1 Read Status Register  
The two-byte Status Register can be read to determine the device’s ready/busy status, as well  
as the status of many other functions such as Hardware Locking and Software Protection. The  
Status Register can be read at any time, including during an internally self-timed program or  
erase operation.  
To read the Status Register, the CS pin must first be asserted and the opcode of 05h must be  
clocked into the device. After the opcode has been clocked in, the device will begin outputting  
Status Register data on the SO pin during every subsequent clock cycle. After the second byte  
of the Status Register has been clocked out, the sequence will repeat itself starting again with  
the first byte of the Status Register as long as the CS pin remains asserted and the clock pin is  
being pulsed. The data in the Status Register is constantly being updated, so each repeating  
sequence will output new data. The RDY/BSY status is available for both bytes of the Status  
Register and is updated for each byte.  
At clock frequencies above fCLK, the first two bytes of data output from the Status Register will  
not be valid. Therefore, if operating at clock frequencies above fCLK, at least four bytes of data  
must be clocked out from the device in order to read the correct values of both bytes of the Sta-  
tus Register.  
Deasserting the CS pin will terminate the Read Status Register operation and put the SO pin  
into a high-impedance state. The CS pin can be deasserted at any time and does not require  
that a full byte of data be read.  
35  
3680E–DFLASH–12/08  
Table 11-1. Status Register Format – Byte 1  
Bit(1)  
Name  
Type(2)  
R/W  
R
Description  
0
1
0
0
1
0
1
Sector Protection Registers are unlocked (default).  
Sector Protection Registers are locked.  
Reserved for future use.  
7
6
5
SPRL  
RES  
EPE  
Sector Protection Registers Locked  
Reserved for future use  
Erase/Program Error  
Erase or program operation was successful.  
Erase or program error detected.  
WP is asserted.  
R
4
WPP  
SWP  
WEL  
Write Protect (WP) Pin Status  
Software Protection Status  
Write Enable Latch Status  
R
R
WP is deasserted.  
All sectors are software unprotected (all Sector  
Protection Registers are 0).  
00  
01  
Some sectors are software protected. Read  
individual Sector Protection Registers to determine  
which sectors are protected.  
3:2  
10  
11  
Reserved for future use.  
All sectors are software protected (all Sector  
Protection Registers are 1 – default).  
0
1
0
1
Device is not write enabled (default).  
Device is write enabled.  
1
0
R
R
Device is ready.  
RDY/BSY Ready/Busy Status  
Device is busy with an internal operation.  
Notes: 1. Only bit 7 of Status Register Byte 1 will be modified when using the Write Status Register Byte 1 command.  
2. R/W = Readable and writeable  
R = Readable only  
36  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Table 11-2. Status Register Format – Byte 2  
Bit(1)  
Name  
Type(2)  
Description  
Reserved for future use.  
7
6
5
RES  
RES  
RES  
Reserved for future use  
Reserved for future use  
Reserved for future use  
R
R
R
0
0
0
0
1
Reserved for future use.  
Reserved for future use.  
Reset command is disabled (default).  
Reset command is enabled.  
4
RSTE  
Reset Enabled  
R/W  
Sector Lockdown and Freeze Sector Lockdown State  
commands are disabled (default).  
0
1
3
SLE  
Sector Lockdown Enabled  
R/W  
Sector Lockdown and Freeze Sector Lockdown State  
commands are enabled.  
0
1
0
1
0
1
No sectors are program suspended (default).  
A sector is program suspended.  
No sectors are erase suspended (default).  
A sector is erase suspended.  
2
1
0
PS  
ES  
Program Suspend Status  
Erase Suspend Status  
R
R
R
Device is ready.  
RDY/BSY Ready/Busy Status  
Device is busy with an internal operation.  
Notes: 1. Only bits 4 and 3 of Status Register Byte 2 will be modified when using the Write Status Register Byte 2 command.  
2. R/W = Readable and writeable  
R = Readable only  
11.1.1  
SPRL Bit  
The SPRL bit is used to control whether the Sector Protection Registers can be modified or not.  
When the SPRL bit is in the logical “1” state, all Sector Protection Registers are locked and can-  
not be modified with the Protect Sector and Unprotect Sector commands (the device will ignore  
these commands). In addition, the Global Protect and Global Unprotect features cannot be per-  
formed. Any sectors that are presently protected will remain protected, and any sectors that are  
presently unprotected will remain unprotected.  
When the SPRL bit is in the logical “0” state, all Sector Protection Registers are unlocked and  
can be modified (the Protect Sector and Unprotect Sector commands, as well as the Global Pro-  
tect and Global Unprotect features, will be processed as normal). The SPRL bit defaults to the  
logical “0” state after device power-up. The Reset command has no effect on the SPRL bit.  
The SPRL bit can be modified freely whenever the WP pin is deasserted. However, if the WP pin  
is asserted, then the SPRL bit may only be changed from a logical “0” (Sector Protection Regis-  
ters are unlocked) to a logical “1” (Sector Protection Registers are locked). In order to reset the  
SPRL bit back to a logical “0” using the Write Status Register Byte 1 command, the WP pin will  
have to first be deasserted.  
The SPRL bit is the only bit of Status Register Byte 1 that can be user modified via the Write Sta-  
tus Register Byte 1 command.  
11.1.2  
EPE Bit  
The EPE bit indicates whether the last erase or program operation completed successfully or  
not. If at least one byte during the erase or program operation did not erase or program properly,  
then the EPE bit will be set to the logical “1” state. The EPE bit will not be set if an erase or pro-  
37  
3680E–DFLASH–12/08  
gram operation aborts for any reason such as an attempt to erase or program a protected region  
or a locked down sector, an attempt to erase or program a suspended sector, or if the WEL bit is  
not set prior to an erase or program operation. The EPE bit will be updated after every erase and  
program operation.  
11.1.3  
11.1.4  
WPP Bit  
The WPP bit can be read to determine if the WP pin has been asserted or not.  
SWP Bits  
The SWP bits provide feedback on the software protection status for the device. There are three  
possible combinations of the SWP bits that indicate whether none, some, or all of the sectors  
have been protected using the Protect Sector command or the Global Protect feature. If the  
SWP bits indicate that some of the sectors have been protected, then the individual Sector Pro-  
tection Registers can be read with the Read Sector Protection Registers command to determine  
which sectors are in fact protected.  
11.1.5  
WEL Bit  
The WEL bit indicates the current status of the internal Write Enable Latch. When the WEL bit is  
in the logical “0” state, the device will not accept any Byte/Page Program, erase, Protect Sector,  
Unprotect Sector, Sector Lockdown, Freeze Sector Lockdown State, Program OTP Security  
Register, or Write Status Register commands. The WEL bit defaults to the logical “0” state after  
a device power-up or reset operation. In addition, the WEL bit will be reset to the logical “0” state  
automatically under the following conditions:  
• Write Disable operation completes successfully  
• Write Status Register operation completes successfully or aborts  
• Protect Sector operation completes successfully or aborts  
• Unprotect Sector operation completes successfully or aborts  
• Sector Lockdown operation completes successfully or aborts  
• Freeze Sector Lockdown State operation completes successfully or aborts  
• Program OTP Security Register operation completes successfully or aborts  
• Byte/Page Program operation completes successfully or aborts  
• Block Erase operation completes successfully or aborts  
• Chip Erase operation completes successfully or aborts  
• Hold condition aborts  
If the WEL bit is in the logical “1” state, it will not be reset to a logical “0” if an operation aborts  
due to an incomplete or unrecognized opcode being clocked into the device before the CS pin is  
deasserted. In order for the WEL bit to be reset when an operation aborts prematurely, the entire  
opcode for a Byte/Page Program, erase, Protect Sector, Unprotect Sector, Sector Lockdown,  
Freeze Sector Lockdown State, Program OTP Security Register, or Write Status Register com-  
mand must have been clocked into the device.  
11.1.6  
RSTE Bit  
The RSTE bit is used to enable or disable the Reset command. When the RSTE bit is in the log-  
ical “0” state (the default state after power-up), the Reset command is disabled and any attempts  
to reset the device using the Reset command will be ignored. When the RSTE bit is in the logical  
“1” state, the Reset command is enabled.  
38  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
The RSTE bit will retain its state as long as power is applied to the device. Once set to the logi-  
cal “1” state, the RSTE bit will remain in that state until it is modified using the Write Status  
Register Byte 2 command or until the device has been power cycled. The Reset command itself  
will not change the state of the RSTE bit.  
11.1.7  
SLE Bit  
The SLE bit is used to enable and disable the Sector Lockdown and Freeze Sector Lockdown  
State commands. When the SLE bit is in the logical “0” state (the default state after power-up),  
the Sector Lockdown and Freeze Sector Lockdown commands are disabled. If the Sector Lock-  
down and Freeze Sector Lockdown commands are disabled, then any attempts to issue the  
commands will be ignored. This provides a safeguard for these commands against accidental or  
erroneous execution. When the SLE bit is in the logical “1” state, the Sector Lockdown and  
Freeze Sector Lockdown State commands are enabled.  
Unlike the WEL bit, the SLE bit does not automatically reset after certain device operations.  
Therefore, once set, the SLE bit will remain in the logical “1” state until it is modified using the  
Write Status Register Byte 2 command or until the device has been power cycled. The Reset  
command has no effect on the SLE bit.  
If the Freeze Sector Lockdown State command has been issued, then the SLE bit will be perma-  
nently reset in the logical “0” state to indicate that the Sector Lockdown command has been  
disabled.  
11.1.8  
11.1.9  
PS Bit  
ES Bit  
The PS bit indicates whether or not a sector is in the Program Suspend state.  
The ES bit indicates whether or not a sector is in the Erase Suspend state.  
11.1.10 RDY/BSY Bit  
The RDY/BSY bit is used to determine whether or not an internal operation, such as a program  
or erase, is in progress. To poll the RDY/BSY bit to detect the completion of a program or erase  
cycle, new Status Register data must be continually clocked out of the device until the state of  
the RDY/BSY bit changes from a logical “1” to a logical “0”.  
Figure 11-1. Read Status Register  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30  
SCK  
SI  
OPCODE  
0
0
0
0
0
1
0
1
MSB  
STATUS REGISTER  
BYTE 1  
STATUS REGISTER  
BYTE 2  
STATUS REGISTER  
BYTE 1  
HIGH-IMPEDANCE  
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
SO  
MSB  
MSB  
MSB  
39  
3680E–DFLASH–12/08  
11.2 Write Status Register Byte 1  
The Write Status Register Byte 1 command is used to modify the SPRL bit of the Status Regis-  
ter and/or to perform a Global Protect or Global Unprotect operation. Before the Write Status  
Register Byte 1 command can be issued, the Write Enable command must have been previ-  
ously issued to set the WEL bit in the Status Register to a logical “1”.  
To issue the Write Status Register Byte 1 command, the CS pin must first be asserted and the  
opcode of 01h must be clocked into the device followed by one byte of data. The one byte of  
data consists of the SPRL bit value, a don’t care bit, four data bits to denote whether a Global  
Protect or Unprotect should be performed, and two additional don’t care bits (see Table 11-3).  
Any additional data bytes that are sent to the device will be ignored. When the CS pin is deas-  
serted, the SPRL bit in the Status Register will be modified, and the WEL bit in the Status  
Register will be reset back to a logical “0”. The values of bits 5, 4, 3, and 2 and the state of the  
SPRL bit before the Write Status Register Byte 1 command was executed (the prior state of the  
SPRL bit) will determine whether or not a Global Protect or Global Unprotect will be performed.  
Please refer to “Global Protect/Unprotect” on page 24 for more details.  
The complete one byte of data must be clocked into the device before the CS pin is deasserted,  
and the CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise,  
the device will abort the operation, the state of the SPRL bit will not change, no potential Global  
Protect or Unprotect will be performed, and the WEL bit in the Status Register will be reset back  
to the logical “0” state.  
If the WP pin is asserted, then the SPRL bit can only be set to a logical “1”. If an attempt is made  
to reset the SPRL bit to a logical “0” while the WP pin is asserted, then the Write Status Register  
Byte 1 command will be ignored, and the WEL bit in the Status Register will be reset back to the  
logical “0” state. In order to reset the SPRL bit to a logical “0”, the WP pin must be deasserted.  
Table 11-3. Write Status Register Byte 1 Format  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
SPRL  
X
Global Protect/Unprotect  
X
X
Figure 11-2. Write Status Register Byte 1  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
SCK  
SI  
STATUS REGISTER IN  
BYTE 1  
OPCODE  
0
0
0
0
0
0
0
1
D
X
D
D
D
D
X
X
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
40  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
11.3 Write Status Register Byte 2  
The Write Status Register Byte 2 command is used to modify the RSTE and SLE bits of the Sta-  
tus Register. Using the Write Status Register Byte 2 command is the only way to modify the  
RSTE and SLE bits in the Status Register during normal device operation, and the SLE bit can  
only be modified if the sector lockdown state has not been frozen. Before the Write Status Reg-  
ister Byte 2 command can be issued, the Write Enable command must have been previously  
issued to set the WEL bit in the Status Register to a logical “1”.  
To issue the Write Status Register Byte 2 command, the CS pin must first be asserted and the  
opcode of 31h must be clocked into the device followed by one byte of data. The one byte of  
data consists of three don’t care bits, the RSTE bit value, the SLE bit value, and three additional  
don’t care bits (see Table 11-4). Any additional data bytes that are sent to the device will be  
ignored. When the CS pin is deasserted, the RSTE and SLE bits in the Status Register will be  
modified, and the WEL bit in the Status Register will be reset back to a logical “0”. The SLE bit  
will only be modified if the Freeze Sector Lockdown State command has not been previously  
issued.  
The complete one byte of data must be clocked into the device before the CS pin is deasserted,  
and the CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise,  
the device will abort the operation, the state of the RSTE and SLE bits will not change, and the  
WEL bit in the Status Register will be reset back to the logical “0” state.  
Table 11-4. Write Status Register Byte 2 Format  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
X
X
X
RSTE  
SLE  
X
X
X
Figure 11-3. Write Status Register Byte 2  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
SCK  
SI  
STATUS REGISTER IN  
BYTE 2  
OPCODE  
0
0
1
1
0
0
0
1
X
X
X
D
D
X
X
X
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
41  
3680E–DFLASH–12/08  
12. Other Commands and Functions  
12.1 Reset  
In some applications, it may be necessary to prematurely terminate a program or erase cycle  
early rather than wait the hundreds of microseconds or milliseconds necessary for the program  
or erase operation to complete normally. The Reset command allows a program or erase opera-  
tion in progress to be ended abruptly and returns the device to an idle state. Since the need to  
reset the device is immediate, the Write Enable command does not need to be issued prior to  
the Reset command being issued. Therefore, the Reset command operates independently of  
the state of the WEL bit in the Status Register.  
The Reset command can only be executed if the command has been enabled by setting the  
Reset Enabled (RSTE) bit in the Status Register to a logical “1”. If the Reset command has not  
been enabled (the RSTE bit is in the logical “0” state), then any attempts at executing the Reset  
command will be ignored.  
To perform a Reset, the CS pin must first be asserted and the opcode of F0h must be clocked  
into the device. No address bytes need to be clocked in, but a confirmation byte of D0h must be  
clocked into the device immediately after the opcode. Any additional data clocked into the device  
after the confirmation byte will be ignored. When the CS pin is deasserted, the program or erase  
operation currently in progress will be terminated within a time of tRST. Since the program or  
erase operation may not complete before the device is reset, the contents of the page being pro-  
grammed or the block being erased cannot be guaranteed to be valid.  
The Reset command has no effect on the states of the Sector Protection Registers, the Sector  
Lockdown Registers, or the SPRL, RSTE, and SLE bits in the Status Register. The WEL, PS,  
and ES bits, however, will be reset back to their default states. If a Reset operation is performed  
while a sector is erase suspended, the suspend operation will abort, and the contents of the  
block being erased in the suspended sector will be left in an undefined state. If a Reset is per-  
formed while a sector is program suspended, the suspend operation will abort, and the contents  
of the page that was being programmed and subsequently suspended will be undefined. The  
remaining pages in the 64-Kbyte sector will retain their previous contents.  
The complete opcode and confirmation byte must be clocked into the device before the CS pin is  
deasserted, and the CS pin must be deasserted on an even byte boundary (multiples of eight  
bits); otherwise, no Reset operation will be performed.  
Figure 12-1. Reset  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
SCK  
SI  
OPCODE  
CONFIRMATION BYTE IN  
1
1
1
1
0
0
0
0
1
1
0
1
0
0
0
0
MSB  
MSB  
HIGH-IMPEDANCE  
SO  
42  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
12.2 Read Manufacturer and Device ID  
Identification information can be read from the device to enable systems to electronically query  
and identify the device while it is in system. The identification method and the command opcode  
comply with the JEDEC standard for “Manufacturer and Device ID Read Methodology for SPI  
Compatible Serial Interface Memory Devices”. The type of information that can be read from the  
device includes the JEDEC defined Manufacturer ID, the vendor specific Device ID, and the ven-  
dor specific Extended Device Information.  
The Read Manufacturer and Device ID command is limited to a maximum clock frequency of  
fCLK. Since not all Flash devices are capable of operating at very high clock frequencies, applica-  
tions should be designed to read the identification information from the devices at a reasonably  
low clock frequency to ensure that all devices to be used in the application can be identified  
properly. Once the identification process is complete, the application can then increase the clock  
frequency to accommodate specific Flash devices that are capable of operating at the higher  
clock frequencies.  
To read the identification information, the CS pin must first be asserted and the opcode of 9Fh  
must be clocked into the device. After the opcode has been clocked in, the device will begin out-  
putting the identification data on the SO pin during the subsequent clock cycles. The first byte  
that will be output will be the Manufacturer ID followed by two bytes of Device ID information.  
The fourth byte output will be the Extended Device Information String Length, which will be 00h  
indicating that no Extended Device Information follows. After the Extended Device Information  
String Length byte is output, the SO pin will go into a high-impedance state; therefore, additional  
clock cycles will have no affect on the SO pin and no data will be output. As indicated in the  
JEDEC standard, reading the Extended Device Information String Length and any subsequent  
data is optional.  
Deasserting the CS pin will terminate the Manufacturer and Device ID read operation and put  
the SO pin into a high-impedance state. The CS pin can be deasserted at any time and does not  
require that a full byte of data be read.  
Table 12-1. Manufacturer and Device ID Information  
Byte No.  
Data Type  
Value  
1Fh  
48h  
1
2
3
4
Manufacturer ID  
Device ID (Part 1)  
Device ID (Part 2)  
00h  
Extended Device Information String Length  
00h  
Table 12-2. Manufacturer and Device ID Details  
Hex  
Data Type  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0 Value Details  
JEDEC Assigned Code  
Manufacturer ID  
1Fh  
48h  
00h  
JEDEC Code:  
0001 1111 (1Fh for Atmel)  
0
0
0
0
0
0
0
1
0
0
1
1
1
1
0
0
Family Code  
Density Code  
0
Family Code:  
Density Code:  
010 (AT25DF/26DFxxx series)  
01000 (64-Mbit)  
Device ID (Part 1)  
Device ID (Part 2)  
1
Sub Code  
0
1
0
Product Version Code  
Sub Code:  
Product Version: 00000 (Initial version)  
000 (Standard series)  
0
0
0
43  
3680E–DFLASH–12/08  
Figure 12-2. Read Manufacturer and Device ID  
CS  
0
6
7
8
14 15 16  
22 23 24  
30 31 32  
38  
SCK  
SI  
OPCODE  
9Fh  
HIGH-IMPEDANCE  
1Fh  
48h  
00h  
00h  
SO  
MANUFACTURER ID  
DEVICE ID  
BYTE 1  
DEVICE ID  
BYTE 2  
EXTENDED  
DEVICE  
INFORMATION  
STRING LENGTH  
Note: Each transition  
shown for SI and SO represents one byte (8 bits)  
12.3 Deep Power-Down  
During normal operation, the device will be placed in the standby mode to consume less power  
as long as the CS pin remains deasserted and no internal operation is in progress. The Deep  
Power-Down command offers the ability to place the device into an even lower power consump-  
tion state called the Deep Power-Down mode.  
When the device is in the Deep Power-Down mode, all commands including the Read Status  
Register command will be ignored with the exception of the Resume from Deep Power-Down  
command. Since all commands will be ignored, the mode can be used as an extra protection  
mechanism against program and erase operations.  
Entering the Deep Power-Down mode is accomplished by simply asserting the CS pin, clocking  
in the opcode of B9h, and then deasserting the CS pin. Any additional data clocked into the  
device after the opcode will be ignored. When the CS pin is deasserted, the device will enter the  
Deep Power-Down mode within the maximum time of tEDPD  
.
The complete opcode must be clocked in before the CS pin is deasserted, and the CS pin must  
be deasserted on an even byte boundary (multiples of eight bits); otherwise, the device will abort  
the operation and return to the standby mode once the CS pin is deasserted. In addition, the  
device will default to the standby mode after a power-cycle.  
The Deep Power-Down command will be ignored if an internally self-timed operation such as a  
program or erase cycle is in progress. The Deep Power-Down command must be reissued after  
the internally self-timed operation has been completed in order for the device to enter the Deep  
Power-Down mode.  
44  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 12-3. Deep Power-Down  
CS  
tEDPD  
0
1
2
3
4
5
6
7
SCK  
OPCODE  
1
0
1
1
1
0
0
1
SI  
MSB  
HIGH-IMPEDANCE  
Active Current  
SO  
ICC  
Standby Mode Current  
Deep Power-Down Mode Current  
12.4 Resume from Deep Power-Down  
In order to exit the Deep Power-Down mode and resume normal device operation, the Resume  
from Deep Power-Down command must be issued. The Resume from Deep Power-Down com-  
mand is the only command that the device will recognized while in the Deep Power-Down mode.  
To resume from the Deep Power-Down mode, the CS pin must first be asserted and opcode of  
ABh must be clocked into the device. Any additional data clocked into the device after the  
opcode will be ignored. When the CS pin is deasserted, the device will exit the Deep Power-  
Down mode within the maximum time of tRDPD and return to the standby mode. After the device  
has returned to the standby mode, normal command operations such as Read Array can be  
resumed.  
If the complete opcode is not clocked in before the CS pin is deasserted, or if the CS pin is not  
deasserted on an even byte boundary (multiples of eight bits), then the device will abort the  
operation and return to the Deep Power-Down mode.  
Figure 12-4. Resume from Deep Power-Down  
CS  
tRDPD  
0
1
2
3
4
5
6
7
SCK  
SI  
OPCODE  
1
0
1
0
1
0
1
1
MSB  
HIGH-IMPEDANCE  
Active Current  
SO  
ICC  
Standby Mode Current  
Deep Power-Down Mode Current  
45  
3680E–DFLASH–12/08  
12.5 Hold  
The HOLD pin is used to pause the serial communication with the device without having to stop  
or reset the clock sequence. The Hold mode, however, does not have an affect on any internally  
self-timed operations such as a program or erase cycle. Therefore, if an erase cycle is in prog-  
ress, asserting the HOLD pin will not pause the operation, and the erase cycle will continue until  
it is finished.  
The Hold mode can only be entered while the CS pin is asserted. The Hold mode is activated  
simply by asserting the HOLD pin during the SCK low pulse. If the HOLD pin is asserted during  
the SCK high pulse, then the Hold mode won’t be started until the beginning of the next SCK low  
pulse. The device will remain in the Hold mode as long as the HOLD pin and CS pin are  
asserted.  
While in the Hold mode, the SO pin will be in a high-impedance state. In addition, both the SI pin  
and the SCK pin will be ignored. The WP pin, however, can still be asserted or deasserted while  
in the Hold mode.  
To end the Hold mode and resume serial communication, the HOLD pin must be deasserted  
during the SCK low pulse. If the HOLD pin is deasserted during the SCK high pulse, then the  
Hold mode won’t end until the beginning of the next SCK low pulse.  
If the CS pin is deasserted while the HOLD pin is still asserted, then any operation that may  
have been started will be aborted, and the device will reset the WEL bit in the Status Register  
back to the logical “0” state.  
Figure 12-5. Hold Mode  
CS  
SCK  
HOLD  
Hold  
Hold  
Hold  
46  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
13. RapidS Implementation  
To implement RapidS and operate at clock frequencies higher than what can be achieved in a  
viable SPI implementation, a full clock cycle can be used to transmit data back and forth across  
the serial bus. The AT25DF641 is designed to always clock its data out on the falling edge of the  
SCK signal and clock data in on the rising edge of SCK.  
For full clock cycle operation to be achieved, when the AT25DF641 is clocking data out on the  
falling edge of SCK, the host controller should wait until the next falling edge of SCK to latch the  
data in. Similarly, the host controller should clock its data out on the rising edge of SCK in order  
to give the AT25DF641 a full clock cycle to latch the incoming data in on the next rising edge of  
SCK.  
Implementing RapidS allows a system to run at higher clock frequencies since a full clock cycle  
is used to accommodate a device’s clock-to-output time, input setup time, and associated  
rise/fall times. For example, if the system clock frequency is 100 MHz (10 ns cycle time) with a  
50% duty cycle, and the host controller has an input setup time of 2 ns, then a standard SPI  
implementation would require that the slave device be capable of outputting its data in less than  
3 ns to meet the 2 ns host controller setup time [(10 ns x 50%) - 2 ns] not accounting for rise/fall  
times. In an SPI mode 0 or 3 implementation, the SPI master is designed to clock in data on the  
next immediate rising edge of SCK after the SPI slave has clocked its data out on the preceding  
falling edge. This essentially makes SPI a half-clock cycle protocol and requires extremely fast  
clock-to-output times and input setup times in order to run at high clock frequencies. With  
a RapidS implementation of this example, however, the full 10 ns cycle time is available which  
gives the slave device up to 8 ns, not accounting for rise/fall times, to clock its data out. Like-  
wise, with RapidS, the host controller has more time available to output its data to the slave  
since the slave device would be clocking that data in a full clock cycle later.  
Figure 13-1. RapidS Operation  
Slave CS  
1
8
1
8
1
2
3
4
5
6
7
2
3
4
5
6
7
SCK  
B
E
tV  
A
C
D
MSB  
LSB  
MOSI  
MISO  
BYTE A  
H
G
I
F
MSB  
LSB  
BYTE B  
MOSI = Master Out, Slave In  
MISO = Master In, Slave Out  
The Master is the ASIC/MCU and the Slave is the memory device.  
The Master always clocks data out on the rising edge of SCK and always clocks data in on the falling edge of SCK.  
The Slave always clocks data out on the falling edge of SCK and always clocks data in on the rising edge of SCK.  
A. Master clocks out first bit of BYTE A on the rising edge of SCK.  
B. Slave clocks in first bit of BYTE A on the next rising edge of SCK.  
C. Master clocks out second bit of BYTE A on the same rising edge of SCK.  
D. Last bit of BYTE A is clocked out from the Master.  
E. Last bit of BYTE A is clocked into the slave.  
F. Slave clocks out first bit of BYTE B.  
G. Master clocks in first bit of BYTE B.  
H. Slave clocks out second bit of BYTE B.  
I. Master clocks in last bit of BYTE B.  
47  
3680E–DFLASH–12/08  
14. Electrical Specifications  
14.1 Absolute Maximum Ratings*  
Temperature under Bias ............................... -55°C to +125° C  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device  
reliability.  
Storage Temperature.................................... -65°C to +150° C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground.....................................-0.6V to +4.1V  
All Output Voltages  
with Respect to Ground.............................-0.6V to VCC + 0.5V  
14.2 DC and AC Operating Range  
AT25DF641  
-40°C to 85° C  
2.7V to 3.6V  
Operating Temperature (Case)  
CC Power Supply  
Ind.  
V
14.3 DC Characteristics  
Symbol  
Parameter  
Condition  
CS, WP, HOLD = VCC  
all inputs at CMOS levels  
CS, WP, HOLD = VCC  
Min  
Typ  
Max  
Units  
,
ISB  
Standby Current  
25  
50  
µA  
,
IDPD  
Deep Power-down Current  
5
12  
10  
8
10  
19  
17  
14  
12  
10  
8
µA  
all inputs at CMOS levels  
f = 100 MHz; IOUT = 0 mA;  
CS = VIL, VCC = Max  
f = 85 MHz; IOUT = 0 mA;  
CS = VIL, VCC = Max  
f = 66 MHz; IOUT = 0 mA;  
CS = VIL, VCC = Max  
ICC1  
Active Current, Read Operation  
mA  
f = 50 MHz; IOUT = 0 mA;  
CS = VIL, VCC = Max  
7
f = 33 MHz; IOUT = 0 mA;  
CS = VIL, VCC = Max  
6
f = 20 MHz; IOUT = 0 mA;  
CS = VIL, VCC = Max  
5
ICC2  
ICC3  
ILI  
Active Current, Program Operation  
Active Current, Erase Operation  
Input Leakage Current  
Output Leakage Current  
Input Low Voltage  
CS = VCC, VCC = Max  
CS = VCC, VCC = Max  
VIN = CMOS levels  
VOUT = CMOS levels  
12  
12  
18  
mA  
mA  
µA  
µA  
V
18  
1
1
ILO  
VIL  
0.3 x VCC  
VIH  
VOL  
VOH  
Input High Voltage  
0.7 x VCC  
V
Output Low Voltage  
IOL = 1.6 mA; VCC = Min  
IOH = -100 µA; VCC = Min  
0.4  
V
Output High Voltage  
VCC - 0.2V  
V
48  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
14.4 AC Characteristics - Maximum Clock Frequencies  
Symbol  
RapidS and SPI Operation  
Maximum Clock Frequency for All Operations – RapidS Operation Only  
Parameter  
Min  
Max  
Units  
fMAX  
100  
85  
MHz  
MHz  
(excluding 0Bh, 03h, 3Bh, and 9F opcodes)  
Maximum Clock Frequency for All Operations  
(excluding 03h and 3Bh opcodes)  
fCLK  
fRDLF  
Maximum Clock Frequency for 03h Opcode (Read Array – Low Frequency)  
Maximum Clock Frequency for 3Bh Opcode (Dual-Output Read)  
50  
85  
MHz  
MHz  
fRDDO  
14.5 AC Characteristics – All Other Parameters  
Symbol  
tCLKH  
Parameter  
Min  
4.3  
4.3  
0.1  
0.1  
50  
5
Max  
Units  
ns  
Clock High Time  
tCLKL  
Clock Low Time  
ns  
(1)  
tCLKR  
Clock Rise Time, Peak-to-Peak (Slew Rate)  
Clock Fall Time, Peak-to-Peak (Slew Rate)  
Chip Select High Time  
V/ns  
V/ns  
ns  
(1)  
tCLKF  
tCSH  
tCSLS  
tCSLH  
tCSHS  
tCSHH  
tDS  
Chip Select Low Setup Time (relative to Clock)  
Chip Select Low Hold Time (relative to Clock)  
Chip Select High Setup Time (relative to Clock)  
Chip Select High Hold Time (relative to Clock)  
Data In Setup Time  
ns  
5
ns  
5
ns  
5
ns  
2
ns  
tDH  
Data In Hold Time  
1
ns  
(1)  
tDIS  
Output Disable Time  
5
5
ns  
(2)  
tV  
Output Valid Time  
ns  
tOH  
Output Hold Time  
2
5
5
5
5
ns  
tHLS  
tHLH  
tHHS  
tHHH  
HOLD Low Setup Time (relative to Clock)  
HOLD Low Hold Time (relative to Clock)  
HOLD High Setup Time (relative to Clock)  
HOLD High Hold Time (relative to Clock)  
HOLD Low to Output High-Z  
ns  
ns  
ns  
ns  
(1)  
tHLQZ  
5
5
ns  
(1)  
tHHQX  
HOLD High to Output Low-Z  
ns  
(1)(3)  
tWPS  
Write Protect Setup Time  
20  
ns  
(1)(3)  
tWPH  
Write Protect Hold Time  
100  
ns  
(1)  
tSECP  
Sector Protect Time (from Chip Select High)  
Sector Unprotect Time (from Chip Select High)  
Sector Lockdown and Freeze Sector Lockdown State Time (from Chip Select High)  
20  
20  
ns  
(1)  
tSECUP  
ns  
(1)  
tLOCK  
200  
µs  
49  
3680E–DFLASH–12/08  
14.5 AC Characteristics – All Other Parameters (Continued)  
Symbol  
Parameter  
Min  
Max  
1
Units  
µs  
(1)  
tEDPD  
Chip Select High to Deep Power-Down  
Chip Select High to Standby Mode  
Reset Time  
(1)  
tRDPD  
30  
30  
µs  
tRST  
µs  
Notes: 1. Not 100% tested (value guaranteed by design and characterization).  
2. 15 pF load at frequencies above 70 MHz, 30 pF otherwise.  
3. Only applicable as a constraint for the Write Status Register Byte 1 command when SPRL = 1.  
14.6 Program and Erase Characteristics  
Symbol  
Parameter  
Min  
Typ  
1.0  
7
Max  
Units  
ms  
(1)  
tPP  
Page Program Time (256 Bytes)  
Byte Program Time  
3.0  
tBP  
µs  
4 Kbytes  
32 Kbytes  
64 Kbytes  
50  
200  
600  
950  
112  
20  
(1)  
tBLKE  
Block Erase Time  
250  
400  
64  
ms  
(1)(2)  
tCHPE  
Chip Erase Time  
sec  
µs  
µs  
µs  
ns  
tSUSP  
tRES  
Program/Erase Suspend Time  
Program/Erase Resume Time  
OTP Security Register Program Time  
Write Status Register Time  
10  
10  
20  
(1)  
tOTPP  
200  
500  
200  
(2)  
tWRSR  
Note:  
1. Maximum values indicate worst-case performance after 100,000 erase/program cycles.  
2. Not 100% tested (value guaranteed by design and characterization).  
14.7 Power-up Conditions  
Symbol  
tVCSL  
Parameter  
Min  
Max  
Units  
µs  
Minimum VCC to Chip Select Low Time  
Power-up Device Delay Before Program or Erase Allowed  
Power-on Reset Voltage  
50  
tPUW  
10  
ms  
V
VPOR  
1.5  
2.5  
50  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
14.8 Input Test Waveforms and Measurement Levels  
0.9VCC  
AC  
AC  
DRIVING  
LEVELS  
VCC/2  
MEASUREMENT  
LEVEL  
0.1VCC  
tR, tF < 2 ns (10% to 90%)  
14.9 Output Test Load  
DEVICE  
UNDER  
TEST  
15 pF (frequencies above 70 MHz)  
or  
30pF  
51  
3680E–DFLASH–12/08  
15. AC Waveforms  
Figure 15-1. Serial Input Timing  
tCSH  
CS  
tCSLS  
tCSLH  
tCLKL  
tCSHH  
tCLKH  
tCSHS  
SCK  
tDS  
tDH  
MSB  
LSB  
MSB  
SI  
HIGH-IMPEDANCE  
SO  
Figure 15-2. Serial Output Timing  
CS  
tCLKH  
tCLKL  
tDIS  
SCK  
SI  
tOH  
tV  
tV  
SO  
Figure 15-3. WP Timing for Write Status Register Byte 1 Command When SPRL = 1  
CS  
tWPS  
tWPH  
WP  
SCK  
SI  
0
0
0
X
MSB  
MSB OF  
LSB OF  
WRITE STATUS REGISTER  
DATA BYTE  
MSB OF  
WRITE STATUS REGISTER  
BYTE 1 OPCODE  
NEXT OPCODE  
HIGH-IMPEDANCE  
SO  
52  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
Figure 15-4. HOLD Timing – Serial Input  
CS  
SCK  
tHHH  
tHLS  
tHLH  
tHHS  
HOLD  
SI  
HIGH-IMPEDANCE  
SO  
Figure 15-5. HOLD Timing – Serial Output  
CS  
SCK  
tHHH  
tHLS  
tHLH  
tHHS  
HOLD  
SI  
tHLQZ  
SO  
tHHQX  
53  
3680E–DFLASH–12/08  
16. Ordering Information  
16.1 Ordering Code Detail  
A T 2 5 D F 6 4 1 S 3 H B  
Atmel Designator  
Product Family  
Shipping Carrier Option  
B = Bulk (tubes)  
Y = Bulk (trays)  
T = Tape and reel  
Device Grade  
H = Green, NiPdAu lead finish, industrial  
temperature range (–40°C to +85°C)  
Device Density  
Package Option  
64 = 64-megabit  
S3 = 16-lead, 0.300" wide SOIC  
MW = 8-contact, 6 mm x 8 mm VDFN  
Interface  
1 = Serial  
16.2 Green Package Options (Pb/Halide-free/RoHS Compliant)  
Max. Freq.  
Ordering Code  
Package  
Lead Finish  
Operating Voltage  
(MHz)  
Operation Range  
AT25DF641-S3H-B  
AT25DF641-S3H-T  
16S  
Industrial  
NiPdAu  
2.7V to 3.6V  
100  
(-40°C to +85°C)  
AT25DF641-MWH-Y  
AT25DF641-MWH-T  
8MW1  
Note:  
The shipping carrier option code is not marked on the devices.  
Package Type  
16S  
16-lead, 0.300" Wide, Plastic Gull Wing Small Outline Package (SOIC)  
8-contact, 6 x 8 mm, Very Thin Dual Flat No Lead Package (VDFN)  
8MW1  
54  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
17. Packaging Information  
17.1 16S – SOIC  
1
E
H
E
End View  
N
L
C
Top View  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
e
b
MIN  
2.35  
0.10  
0.31  
MAX  
2.65  
0.30  
0.51  
NOM  
NOTE  
SYMBOL  
A
A1  
b
A1  
A
D
E
H
L
10.30 BSC  
7.50 BSC  
10.30 BSC  
2
D
3
Side View  
0.40  
0.20  
1.27  
4
e
1.27 BSC  
C
0.33  
Notes:  
1. This drawing is for general information only; refer to JEDEC Drawing MS-013, Variation AA for additional information.  
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusion and gate burrs shall not  
exceed 0.15 mm (0.006") per side.  
3. Dimension E does not include inter-lead Flash or protrusion. Inter-lead flash and protrusions shall not exceed 0.25 mm  
(0.010") per side.  
4. L is the length of the terminal for soldering to a substrate.  
11/02/05  
TITLE  
DRAWING NO.  
16S  
REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
16S, 16-lead, 0.300" Wide Body, Plastic Gull  
Wing Small Outline Package (SOIC)  
A
R
55  
3680E–DFLASH–12/08  
17.2 8MW1 – VDFN  
C
E
Pin 1 ID  
D
SIDE VIEW  
A1  
TOP VIEW  
A
E1  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
8
7
6
5
1
Pin #1 ID  
MIN  
0.80  
MAX  
1.00  
0.05  
0.48  
NOM  
NOTE  
SYMBOL  
Option A  
Option B  
Pin #1  
A
Chamfer  
(C 0.30)  
2
A1  
b
D1  
0.35  
0.40  
3
C
0.203 REF  
6.00  
e
D
5.90  
4.70  
7.90  
4.80  
6.10  
4.90  
8.10  
5.00  
4
D1  
E
4.80  
b
8.00  
Pin #1  
Notch  
E1  
e
4.90  
L
K
(0.20 R)  
1.27  
BOTTOM VIEW  
L
0.45  
0.50  
0.55  
K
0.30 REF  
4/15/08  
GPC  
YKL  
DRAWING NO.  
TITLE  
REV.  
8MW1, 8-pad (6 x 8 x 1.0 mm Body), Thermally  
Enhanced Plastic Very Thin Dual Flat No Lead  
Package (VDFN)  
Package Drawing Contact:  
packagedrawings@atmel.com  
8MW1  
D
56  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
AT25DF641 [Preliminary]  
18. Errata  
18.1 Erase Suspend  
Issue: Parts may not program correctly if a device is in the Erase Suspend state.  
Workaround: None. It is recommended to not use the Byte/Page Program commands (opcodes  
02h and A2h) during an Erase Suspend state. Systems should resume from Erase Suspend first  
before attempting to program a device.  
Resolution: The Erase Suspend feature is being fixed with a new revision of the device. Please  
contact Atmel for the estimated availability of devices with the fix.  
18.2 AC Characteristics – Maximum Clock Frequencies for Read Operations  
Issue: Devices currently do not meet the maximum specified clock frequency for the following  
read operations: Read Array, Read Sector Protection Registers, Read Sector Lockdown Regis-  
ters, Read OTP Security Register, Read Status Register, and Read Manufacturer and Device  
ID. Reading at clock frequencies higher than those listed below could cause read errors.  
Symbol  
fMAX  
Opcodes Affected  
Datasheet Specification  
100 MHz  
Errata Specification  
66 MHz  
1Bh, 3Ch, 35h, 77h, 05h  
fCLK  
0Bh, 9Fh  
03h  
85 MHz  
66 MHz  
fRDLF  
fRDDO  
50 MHz  
33 MHz  
3Bh  
85 MHz  
66 MHz  
Workaround: None. Devices are limited to the clock frequencies specified above.  
Resolution: The clock frequency issues are being fixed with a new revision of the device.  
Please contact Atmel for the estimated availability of devices with the fix.  
57  
3680E–DFLASH–12/08  
19. Revision History  
Revision Level – Release Date History  
A – December 2007  
Initial release.  
Minor text edits throughout document  
Changed Standby Current values  
– Increased typical value from 10 µA to 25 µA  
– Increased maximum value from 20 µA to 35 µA  
B – February 2008  
Changed minimum Clock High Time and minimum Clock Low Time  
from 3.7 ns to 4.3 ns  
Replaced the technical illustration (16S2) with the correct one (16S)  
on page 55.  
C – June 2008  
Added Errata (Section 18) regarding Erase Suspend and AC  
Characteristics.  
D – November 2008  
Corrected clock frequency values in Table 6-1.  
Changed Standby Current value  
– Increased maximum value from 35 µA to 50 µA  
Changed Deep Power-Down Current values  
– Increased typical value from 1 µA to 5 µA  
– Increased maximum value from 5 µA to 10 µA  
E – December 2008  
58  
AT25DF641 [Preliminary]  
3680E–DFLASH–12/08  
Headquarters  
International  
Atmel Corporation  
2325 Orchard Parkway  
San Jose, CA 95131  
USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 487-2600  
Atmel Asia  
Atmel Europe  
Le Krebs  
Atmel Japan  
9F, Tonetsu Shinkawa Bldg.  
1-24-8 Shinkawa  
Chuo-ku, Tokyo 104-0033  
Japan  
Tel: (81) 3-3523-3551  
Fax: (81) 3-3523-7581  
Unit 1-5 & 16, 19/F  
BEA Tower, Millennium City 5  
418 Kwun Tong Road  
Kwun Tong, Kowloon  
Hong Kong  
8, Rue Jean-Pierre Timbaud  
BP 309  
78054 Saint-Quentin-en-  
Yvelines Cedex  
France  
Tel: (852) 2245-6100  
Fax: (852) 2722-1369  
Tel: (33) 1-30-60-70-00  
Fax: (33) 1-30-60-71-11  
Product Contact  
Web Site  
Technical Support  
Sales Contact  
www.atmel.com  
dataflash@atmel.com  
www.atmel.com/contacts  
Literature Requests  
www.atmel.com/literature  
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any  
intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN ATMELS TERMS AND CONDI-  
TIONS OF SALE LOCATED ON ATMELS WEB SITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY  
WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR  
PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDEN-  
TAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS OF PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF  
THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no  
representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications  
and product descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided  
otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel’s products are not intended, authorized, or warranted for use  
as components in applications intended to support or sustain life.  
© 2008 Atmel Corporation. All rights reserved. Atmel®, logo and combinations thereof, DataFlash®, RapidS®, and others are registered trade-  
marks or trademarks of Atmel Corporation or its subsidiaries. Other terms and product names may be trademarks of others.  
3680E–DFLASH–12/08  

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