AT27C512R-45 [ATMEL]

512K 64K x 8 OTP CMOS EPROM; 512K 64K ×8 OTP EPROM CMOS


型号：	AT27C512R-45
厂家：	ATMEL
描述：	512K 64K x 8 OTP CMOS EPROM 512K 64K ×8 OTP EPROM CMOS 可编程只读存储器电动程控只读存储器
文件：	总9页 (文件大小：252K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

AT27C512R

Features

Fast Read Access Time - 45 ns

Low Power CMOS Operation

•

100 µA max. Standby

20 mA max. Active at 5 MHz

JEDEC Standard Packages

•

28-Lead 600-mil PDIP

32-Lead PLCC

28-Lead TSOP and SOIC

5V ± 10% Supply

High Reliability CMOS Technology

2,000V ESD Protection

200 mA Latchup Immunity

Rapid Programming Algorithm - 100 µs/byte (typical)

CMOS and TTL Compatible Inputs and Outputs

•

512K (64K x 8)

OTP

CMOS

•

Integrated Product Identification Code

Commercial and Industrial Temperature Ranges

•

EPROM

•

Description

The AT27C512R is a low-power, high performance 524,288 bit one-time program-

mable read only memory (OTP EPROM) organized 64K by 8 bits. It requires only

one 5V power supply in normal read mode operation. Any byte can be accessed in

less than 45 ns, eliminating the need for speed reducing WAIT states on high per-

formance microprocessor systems.

Atmel’s scaled CMOS technology provides high speed, lower active power con-

sumption, and significantly faster programming. Power consumption is typically only

8 mA in Active Mode and less than 10 µA in Standby.

(continued)

Pin Configurations

Pin Name Function

AT27C512R

PDIP, SOIC Top View

A0 - A15

O0 - O7

Addresses

Outputs

Chip Enable

Output Enable/V_PP

No Connect

OE /V_PP

PLCC Top View

TSOP Top View

Type 1

Note: PLCC Package Pins 1 and

17 are DON’T CONNECT.

0015H

3-135

Description (Continued)

System Considerations

The AT27C512R is available in a choice of industry stand-

ard JEDEC-approved one-time programmable (OTP)

plastic PDIP, PLCC, SOIC, and TSOP packages. All de-

vices feature two-line control (CE, OE) to give designers

the flexibility to prevent bus contention.

Switching between active and standby conditions via the

Chip Enable pin may produce transient voltage excur-

sions. Unless accommodated by the system design, these

transients may exceed data sheet limits, resulting in de-

vice non-conformance. At a minimum, a 0.1 µF high fre-

quency, low inherent inductance, ceramic capacitor

should be utilized for each device. This capacitor should

With 64K byte storage capability, the AT27C512R allows

firmware to be stored reliably and to be accessed by the

system without the delays of mass storage media.

be connected between the V and Ground terminals of

the device, as close to the device as possible. Additionally,

to stabilize the supply voltage level on printed circuit

boards with large EPROM arrays, a 4.7 µF bulk electrolytic

capacitor should be utilized, again connected between the

Atmel’s 27C512R has additional features to ensure high

quality and efficient production use. The Rapid Program-

ming Algorithm reduces the time required to program the

part and guarantees reliable programming. Programming

time is typically only 100 µs/byte. The Integrated Product

Identification Code electronically identifies the device and

manufacturer. This feature is used by industry standard

programming equipment to select the proper program-

ming algorithms and voltages.

and Ground terminals. This capacitor should be posi-

tioned as close as possible to the point where the power

supply is connected to the array.

3-136

AT27C512R

Absolute Maximum Ratings*

Block Diagram

Temperature Under Bias ................ -55°C to +125°C

Storage Temperature...................... -65°C to +150°C

Voltage on Any Pin with

(1)

Respect to Ground......................... -2.0V to +7.0V

Voltage on A9 with

Respect to Ground ......................-2.0V to +14.0V

(1)

Supply Voltage with

(1)

Respect to Ground.......................-2.0V to +14.0V

*NOTICE: Stresses beyond those listed under “Absolute Maxi-

mum Ratings” may cause permanent damage to the device.

This is a stress rating only and functional operation of the

device at these or any other conditions beyond those indi-

cated in the operational sections of this specification is not

implied. Exposure to absolute maximum rating conditions

for extended periods may affect device reliability.

Note: 1. Minimum voltage is -0.6V dc which may undershoot

to -2.0V for pulses of less than 20 ns. Maximum out-

put pin voltage is V_CC+ 0.75V dc which may over-

shoot to +7.0V for pulses of less than 20 ns.

Operating Modes

OE/V

Mode \ Pin

Read

Outputs

OUT

(1)

Output Disable

Standby

High Z

(1)

(2)

Rapid Program

(1)

PGM Inhibit

High Z

(3)

A9 = V

(4)

Product Identification

A0 = V or V

Identification Code

A1 - A15 = V

Notes: 1. X can be V_ILor V_IH.

4. Two identifier bytes may be selected. All Ai inputs are held

low (V_IL), except A9 which is set to V_Hand A0 which is tog-

gled low (V_IL) to select the Manufacturer’s Identification byte

and high (V_IH) to select the Device Code byte.

2. Refer to Programming Characteristics.

3. V_H= 12.0 ± 0.5V.

3-137

DC and AC Operating Conditions for Read Operation

AT27C512R

-45

-55

-70

-90

-12

-15

Operating

Com. 0°C - 70°C

0°C - 70°C

Temp.(Case)

Ind. -40°C - 85°C -40°C - 85°C

5V ± 10% 5V ± 10%

-40°C - 85°C -40°C - 85°C -40°C - 85°C -40°C - 85°C

Supply

5V ± 10%

DC and Operating Characteristics for Read Operation

Symbol Parameter

Condition

Min

Max

Units

Input Load Current

= 0V to V

±1

±5

µA

Output Leakage Current

= 0V to V

OUT

100

(CMOS), CE = V ± 0.3V

SB1

SB2

(1)

Standby Current

(TTL), CE = 2.0 to V + 0.5V

f = 5 MHz, I

CE = V

= 0 mA,

OUT

Active Current

0.8

Input Low Voltage

Input High Voltage

Output Low Voltage

Output High Voltage

-0.6

2.0

+ 0.5

= 2.1 mA

0.4

= -400 µA

2.4

Note: 1. V_CCmust be applied simultaneously or before OE/V_PP, and removed simultaneously or after OE/V_PP

AC Characteristics for Read Operation

AT27C512R

-70 -90

-45

-55

-12

-15

Min Max Min Max Min Max Min Max Min Max Min Max

Symbol Parameter

Condition

Units

Address to

CE = OE/V_PP

= V_IL

(3)

120

150 ns

ACC

Output Delay

(2)

CE to Output Delay OE/V_PP= V_IL

OE/V_PPto Output

CE = V_IL

(2, 3)

(4, 5)

Delay

OE/V_PPor CE High to

Output Float, whichever occurred first

Output Hold from

Address, CE or OE/V_PP

whichever occurred first

Notes:

2, 3, 4, 5. - see AC Waveforms for Read Operation.

3-138

AT27C512R

AC Waveforms for Read Operation ⁽¹⁾

Notes: 1. Timing measurement reference level is 1.5V for -45 and 3. OE/V_PPmay be delayed up to t_ACC- t_OEafter the

-55 devices. Input AC drive levels are V_IL= 0.0V and

V_IH= 3.0V. Timing measurement reference levels for

address is valid without impact on t_ACC.

4. This parameter is only sampled and is not 100% tested.

5. Output float is defined as the point when data is no longer

driven.

all other speed grades are V_OL= 0.8V and V_OH

2.0V. Input AC drive levels are V_IL= 0.45V and V_IH

2.4V.

2. OE/V_PPmay be delayed up to t_CE- t_OEafter the falling

edge of CE without impact on t_CE

Input Test Waveforms and Measurement Levels

Output Test Load

For -45 and -55 devices

only:

t_R, t_F< 5 ns (10% to 90%)

For -70, -90, -12, -15,

and -20 devices:

Note: CL = 100 pF including jig capaci-

tance, except for the -45 and -55

devices, where CL = 30 pF.

t_R, t_F< 20 ns (10% to 90%)

Pin Capacitance (f = 1 MHz T = 25°C) ⁽¹⁾

Typ

Max

Units

Conditions

= 0V

OUT

Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.

3-139

Programming Waveforms

Notes: 1. The Input Timing Reference is 0.8V for V_ILand 2.0V for V_IH.

2. t_OEand t_DFPare characteristics of the device but must be accommodated by the programmer.

DC Programming Characteristics

T_A= 25 ± 5°C, V_CC= 6.5 ± 0.25V, OE/V_PP= 13.0 ± 0.25V

Test

Limits

Symbol

Parameter

Conditions

Min

Units

µA

Max

±10

0.8

Input Load Current

Input Low Level

Input High Level

Output Low Voltage

Output High Voltage

V_IN= V_IL,V_IH

-0.6

2.0

V_CC+ 1

0.4

I_OL= 2.1 mA

I_OH= -400 µA

2.4

V_CCSupply Current

(Program and Verify)

CC2

PP2

OE/V_PPCurrent

CE = V_IL

A9 Product Identification Voltage

11.5

12.5

3-140

AT27C512R

AC Programming Characteristics

RapidProgramming Algorithm

T_A= 25 ± 5°C, V_CC= 6.5 ± 0.25V, OE/V_PP= 13.0 ± 0.25V

A 100 µs CE pulse width is used to program. The address

is set to the first location. V

is raised to 6.5V and

Sym-

bol

Test

Condtions*

Limits

Units

OE/V is raised to 13.0V. Each address is first pro-

(1)

Parameter

Min

Max

grammed with one 100 µs CE pulse without verification.

Then a verification/reprogramming loop is executed for

each address. In the event a byte fails to pass verification,

up to 10 successive 100 µs pulses are applied with a veri-

fication after each pulse. If the byte fails to verify after 10

pulses have been applied, the part is considered failed.

After the byte verifies properly, the next address is se-

Address Setup Time

OE/V_PPSetup Time

OE/V_PPHold Time

Data Setup Time

Address Hold Time

Data Hold Time

µs

OES

OEH

lected until all have been checked. OE/V is then low-

ered to V and V to 5.0V. All bytes are read again and

CE High to

compared with the original data to determine if the device

passes or fails.

130

Output Float Delay ⁽²⁾

DFP

V_CCSetup Time

µs

VCS

CE Program Pulse Width ⁽³⁾

Data Valid from CE ⁽²⁾

OE/V_PPRecovery Time

105

OE/V_PPPulse Rise

Time During Programming

PRT

*AC Conditions of Test:

Input Rise and Fall Times (10% to 90%).............. 20 ns

Input Pulse Levels....................................0.45V to 2.4V

Input Timing Reference Level....................0.8V to 2.0V

Output Timing Reference Level.................0.8V to 2.0V

Notes: 1. V_CCmust be applied simultaneously or before

OE/V_PPand removed simultaneously or after

OE/V_PP

2. This parameter is only sampled and is not 100%

tested. Output Float is defined as the point where

data is no longer driven — see timing diagram.

3. Program Pulse width tolerance is 100 µsec ± 5%.

Atmel’s 27C512R Integrated

Product Identification Code

Pins

Hex

Codes

Data

A0 O7 O6 O5 O4 O3 O2 O1 O0

Manufacturer

Device Type

3-141

Ordering Information

(mA)

ACC

Ordering Code

Package

Operation Range

(ns)

Active

Standby

0.1

AT27C512R-45JC

AT27C512R-45PC

AT27C512R-45RC

AT27C512R-45TC

32J

Commercial

(0°C to 70°C)

28P6

28R

28T

AT27C512R-45JI

AT27C512R-45PI

AT27C512R-45RI

AT27C512R-45TI

32J

Industrial

(-40°C to 85°C)

28P6

28R

28T

AT27C512R-55JC

AT27C512R-55PC

AT27C512R-55RC

AT27C512R-55TC

32J

Commercial

(0°C to 70°C)

28P6

28R

28T

AT27C512R-55JI

AT27C512R-55PI

AT27C512R-55RI

AT27C512R-55TI

32J

Industrial

(-40°C to 85°C)

28P6

28R

28T

AT27C512R-70JC

AT27C512R-70PC

AT27C512R-70RC

AT27C512R-70TC

32J

Commercial

(0°C to 70°C)

28P6

28R

28T

AT27C512R-70JI

AT27C512R-70PI

AT27C512R-70RI

AT27C512R-70TI

32J

Industrial

(-40°C to 85°C)

28P6

28R

28T

AT27C512R-90JC

AT27C512R-90PC

AT27C512R-90RC

AT27C512R-90TC

32J

Commercial

(0°C to 70°C)

28P6

28R

28T

AT27C512R-90JI

AT27C512R-90PI

AT27C512R-90RI

AT27C512R-90TI

32J

Industrial

(-40°C to 85°C)

28P6

28R

28T

120

AT27C512R-12JC

AT27C512R-12PC

AT27C512R-12RC

AT27C512R-12TC

32J

Commercial

(0°C to 70°C)

28P6

28R

28T

AT27C512R-12JI

AT27C512R-12PI

AT27C512R-12RI

AT27C512R-12TI

32J

Industrial

(-40°C to 85°C)

28P6

28R

28T

150

AT27C512R-15JC

AT27C512R-15PC

AT27C512R-15RC

AT27C512R-15TC

32J

Commercial

(0°C to 70°C)

28P6

28R

28T

(continued)

3-142

AT27C512R

Ordering Information (Continued)

(mA)

ACC

Ordering Code

Package

Operation Range

(ns)

Active

Standby

0.1

150

AT27C512R-15JI

AT27C512R-15PI

AT27C512R-15RI

AT27C512R-15TI

32J

Industrial

(-40°C to 85°C)

28P6

28R

28T

Package Type

32J

32 Lead, Plastic J-Leaded Chip Carrier (PLCC)

28P6

28R

28T

28 Lead, 0.600" Wide, Plastic Dual Inline Package (PDIP)

28 Lead, 0.330" Wide, Plastic Gull Wing Small Outline (SOIC)

28 Lead, Thin Small Outline Package (TSOP)

3-143

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