T2525N736-DDW [ATMEL]

Telecom Circuit, 1-Func, CMOS, WAFER-10;
T2525N736-DDW
型号: T2525N736-DDW
厂家: ATMEL    ATMEL
描述:

Telecom Circuit, 1-Func, CMOS, WAFER-10

电信 电信集成电路
文件: 总13页 (文件大小:169K)
中文:  中文翻译
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Features  
No external components except PIN diode  
Supply-voltage range: 4.5 V to 5.5 V  
Automatic sensitivity adaptation (AGC)  
Automatic strong signal adaptation (ATC)  
Enhanced immunity against ambient light disturbances  
Available for carrier frequencies between 30 kHz to 76 kHz; adjusted by Zener diode  
fusing  
TTL and CMOS compatible  
Suitable min. burst length 6 or 10 pulses/burst  
IR Receiver  
ASSP  
Applications  
Audio video applications  
Home appliances  
Remote control equipment  
T2525  
Description  
The IC T2525 is a complete IR receiver for data communication developed and opti-  
mized for use in carrier-frequency-modulated transmission applications. Its function  
can be described using the block diagram (see figure 1). The input stage meets two  
main functions. First, it provides a suitable bias voltage for the PIN diode. Secondly,  
the pulsed photo-current signals are transformed into a voltage by a special circuit  
which is optimized for low-noise applications. After amplification by a controlled gain  
amplifier (CGA), the signals have to pass a tuned integrated narrow bandpass filter  
with a center frequency f0 which is equivalent to the chosen carrier frequency of the  
input signal. The demodulator is used to convert the input burst signal into a digital  
envelope output pulse and to evaluate the signal information quality, i.e. unwanted  
pulses will be suppressed at the output pin. All this is done by means of an integrated  
dynamic feedback circuit which varies the gain as a function of the present environ-  
mental condition (ambient light, modulated lamps etc.). Other special features are  
used to adapt to the current application to secure best transmission quality. The  
T2525 operates in a supply-voltage range of 4.5 V to 5.5 V.  
Block Diagram  
Figure 1.  
VS  
IN  
OUT  
CGA &  
filter  
µC  
Input  
Demodulator  
AGC / ATC & digital  
control  
Oscillator  
Carrier frequency f  
0
Modulated IR signal  
min 6/10 pulses  
GND  
Rev. A3, 17-Oct-01  
1 (13)  
Preliminary Information  
Preliminary Information  
Ordering Information  
Extended Type  
PL2)  
2
RPU  
30  
D4)  
Type  
3)  
Number  
T2525N0xx1)-yyy5)  
T2525N1xx1)-DDW  
2090  
2090  
Standard type: 10 pulses, enhanced sensibility, high data rate  
Standard type: 10 pulses, enhanced sensibility, high data rate  
1
30  
Lamp type: 10 pulses, enhanced suppression of disturbances, secure  
data transmission  
T2525N2xx1)-yyy5  
T2525N3xx1)-DDW  
2
1
40  
40  
1373  
1373  
Lamp type: 10 pulses, enhanced suppression of disturbances, secure  
data transmission  
T2525N6xx1)-yyy5  
T2525N7xx1)-DDW  
2
1
30  
30  
3415  
3415  
Short burst type: 6 pulses, enhanced data rate  
Short burst type: 6 pulses, enhanced data rate  
Notes: 1. xx means the used carrier frequency value f0 30,33,36,38,40,44 ,56 kHz.(76 kHz type on request)  
2. Two pad layout versions (see figures 2 and 3) available for different assembly demand  
3. Integrated pull-up resistor at PIN OUT (see electrical characteristics)  
4. Typical data transmission rate up to bit/s with f0 = 56 kHz, VS = 5 V (see figure 7)  
5. yyy means kind of packaging:  
.................... .......DDW -> unsawn wafers in box  
.................... .......TAS -> SO8 in stick  
.................... .......TAQ -> SO8 taped and reeled  
.................... .......6AQ -> (on request, not standard; TSSOP8 taped 1and reeled)  
Samples in SO8 package are available as T2525N038, T2525N238 and T2525N638.  
Pad Layout  
Figure 2. Pad layout 1 (DDW only)  
GND  
IN  
OUT  
T2525  
FUSING  
VS  
2 (13)  
T2525  
Rev. A3, 17-Oct-01  
T2525  
Figure 3. Pad layout 2 (DDW, SO8 or TSSOP8)  
GND  
IN  
(6)  
(5)  
(1)  
VS  
T2525  
(3)  
OUT  
FUSING  
Pin Description  
Pin  
Symbol  
Function  
1
VS  
Supply voltage  
2
n.c.  
Not connected  
Data output  
3
OUT  
n.c.  
4
Not connected  
Input PIN-diode  
Ground  
5
IN  
6
GND  
n.c.  
7
Not connected  
Not connected  
8
n.c.  
Figure 4. Pinning SO8 and TSSOP8  
VS  
n.c.  
1
2
3
4
8
7
6
5
n.c.  
n.c.  
GND  
IN  
OUT  
n.c.  
3 (13)  
Preliminary Information  
Rev. A3, 17-Oct-01  
Preliminary Information  
Absolute Maximum Ratings  
Parameter  
Symbol  
VS  
Value  
-0.3 to 6  
3
Unit  
V
Supply voltage  
Supply current  
IS  
mA  
V
Input voltage  
VIN  
IIN  
-0.3 to VS  
0.75  
Input DC current at VS = 5 V  
Output voltageVO-0.3 to VSV  
Output current  
mA  
V
VO  
-0.3 to VS  
IO  
mA  
°C  
Operating temperature  
Storage temperature  
Power dissipation at Tamb = 25°C  
Tamb  
Tstg  
Ptot  
°C  
mW  
30  
Thermal Resistance  
Parameter  
Symbol  
RthJA  
Value  
130  
Unit  
k/W  
K/W  
Junction ambient SO8  
Junction ambient TSSOP8  
RthJA  
tbd  
Electrical Characteristics  
Tamb = -25 to 85°C, VS = 4.5 to 5.5 V unless otherwise specified.  
No.  
1
Parameters  
Supply  
Test Conditions  
Pin  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Type*  
1.1  
1.2  
2
Supply-voltage range  
Supply current  
Output  
1
1
VS  
IS  
4.5  
0.8  
5
5.5  
1.3  
V
C
B
IIN =0  
1.1  
mA  
Tamb = 25°C;  
Internal pull-up  
resistor 1)  
2.1  
1,3  
RPU  
30/40  
kΩ  
A
see figure 11  
IL = 2 mA;  
2.2  
2.3  
2.4  
Output voltage low  
Output voltage high  
3,6  
3,1  
3,6  
VOL  
VOH  
IOCL  
250  
Vs  
mV  
V
B
B
B
see figure 11  
VS-  
0.25  
Output current  
clamping  
R2 = 0; see figure 11  
VIN = 0; see figure 11  
8
mA  
3
Input  
3.1  
Input DC current  
5
5
IIN_DCMAX  
IIN_DCMAX  
-85  
µA  
µA  
C
B
VIN = 0; Vs = 5V,  
Input DC-current; see  
figure 6  
3.2  
-530  
-960  
Tamb = 25°C  
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter  
Notes: 1. Depending on version, see Ordering Information”  
2. BER = bit error rate; e.g. BER = 5% means that with P = 20 at the input pin 19...21 pulses can appear at the Pin OUT  
3. After transformation of input current into voltage  
4 (13)  
T2525  
Rev. A3, 17-Oct-01  
T2525  
Electrical Characteristics  
Tamb = -25 to 85°C, VS = 4.5 to 5.5 V unless otherwise specified.  
No.  
Parameters  
Test Conditions  
Pin  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Type*  
3.3  
Min. detection  
threshold current; see  
figure 5  
Test signal:  
see figure 10  
VS = 5 V,  
3
IEemin  
-520  
pA  
B
Tamb= 25°C,  
IIN_DC=1µA;  
square pp,  
burst N=16,  
f=f0; tPER = 10ms,  
Fig. 10;  
BER = 502)  
3.4  
Min. detection  
threshold current with  
AC current  
disturbance  
IIN_AC100 = 3 µA at  
100 Hz  
Test signal:  
3
IEemin  
-800  
pA  
C
see figure 10  
VS = 5 V, Tamb = 25°C,  
IIN_DC = 1µA,  
square pp,  
burst N = 16,  
f = f0; tPER = 10 ms,  
Fig. 10;  
BER = 50%2)  
3.5  
Max. detection  
threshold current with  
VIN > 0V  
Test signal:  
3
IEemax  
-400  
µA  
D
see figure 10  
VS = 5V, Tamb = 25°C,  
IIN_DC = 1µA;  
square pp,  
burst N = 16,  
f = f0; tPER = 10ms,  
Fig. 10; BER=5%2)  
4
Controlled Amplifier and Filter  
Max. value of variable  
gain (CGA)  
GVARMAX  
GVARMIN  
GMAX  
51  
-5  
dB  
dB  
dB  
D
D
D
4.1  
Min. value of variable  
gain (CGA)  
4.2  
4.3  
Total internal  
amplification3)  
71  
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter  
Notes: 1. Depending on version, see Ordering Information”  
2. BER = bit error rate; e.g. BER = 5% means that with P = 20 at the input pin 19...21 pulses can appear at the Pin OUT  
3. After transformation of input current into voltage  
5 (13)  
Preliminary Information  
Rev. A3, 17-Oct-01  
Preliminary Information  
Electrical Characteristics  
Tamb = -25 to 85°C, VS = 4.5 to 5.5 V unless otherwise specified.  
No.  
Parameters  
Test Conditions  
Pin  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Type*  
4.4  
Center frequency  
fusing accuracy of  
bandpass  
f0_FUSE  
-3  
f0  
+3  
%
A
VS = 5 V, Tamb = 25°C  
4.5  
4.6  
Overall accuracy  
center frequency of  
bandpass  
f0  
-6.7  
f0  
+4.1  
%
C
BPF bandwidth:  
type N0 - N3  
-3dB; f0 = 38 kHz;  
see fig 8  
B
B
3.5  
5.4  
kHz  
kHz  
C
C
BPF bandwidth:  
type N6, N7  
-3dB; f0 = 38 kHz  
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter  
Notes: 1. Depending on version, see Ordering Information”  
2. BER = bit error rate; e.g. BER = 5% means that with P = 20 at the input pin 19...21 pulses can appear at the Pin OUT  
3. After transformation of input current into voltage  
ESD  
All pins  
2000V HBM; 200V MM, MIL-STD-883C, Method 3015.7  
Reliability  
Electrical qualification (1000h) in molded S08 plastic package  
Typical Electrical Curves at Tamb = 25°C  
Figure 5. IEemin vs. IIN_DC , VS = 5 V  
6 (13)  
T2525  
Rev. A3, 17-Oct-01  
T2525  
Figure 6. VIN vs. IIN_DC, VS = 5 V  
Figure 7. Data transmission rate, VS = 5 V  
Figure 8. Typical bandpass curve  
Q = f0 / f; f = -3dB values. Example: Q = 1/ (1.047 - 0.954) = 11  
7 (13)  
Preliminary Information  
Rev. A3, 17-Oct-01  
Preliminary Information  
Figure 9. Illustration of used terms  
1066 µs  
Period (P=16)  
Burst (N=16 pulses)  
533 µs  
IN  
1
7
16  
7
7
33 µs  
t
t
DON  
OUT  
DOFF  
533 µs  
Envelope 1  
Envelope 16  
17056µs / data word  
OUT  
Telegram pause  
Data word  
17 ms  
Data word  
t
T
= 62 ms  
REP  
Example: f = 30 kHz, burst with 16 pulses, 16 periods  
Test Circuit  
Figure 10.  
I
=
U1/400K  
Ee  
= 5 V  
DD  
V
U1  
1nF  
400k  
I
IN_DC  
R1 = 220  
VS  
20k  
I
I
Ee  
IN  
T2525  
GND  
IN  
OUT  
1nF  
V
PULSE  
U2  
~
C1  
I
20k  
= U /40k  
2
IN_DC  
f
0
4.7µF  
16  
I
IN_AC100  
-
DC  
+
t
= 10ms  
PER  
8 (13)  
T2525  
Rev. A3, 17-Oct-01  
T2525  
Application Circuit  
Figure 11.  
V
= 5V  
DD  
*) optional  
R2* > 2.4k  
R1 = 220  
RPU  
I
S
VS  
I
I
OCL  
L
IN  
T2525  
µC  
OUT  
I
I
IN  
GND  
V
V
IN  
O
I
IN_DC  
C1=4.7µF  
C2* = 470pF  
Ee  
9 (13)  
Preliminary Information  
Rev. A3, 17-Oct-01  
Preliminary Information  
Chip Dimensions  
Figure 12. Chip size in µm  
1130,1030  
GND  
IN  
723,885  
351,904  
scribe  
VS  
63,660  
T2525  
63,70  
FUSING  
OUT  
0,0  
width  
Note: Pad coordinates are for lower left corner of the pad in µm from the origin 0,0  
Dimensions  
Length incl. scribe  
Width incl. scribe  
Thickness  
1.15 mm  
1.29 mm  
290 µ ± 5%  
90 µ x 90 µ  
70 µ x 70 µ  
Pads  
Fusing pads  
AlSiTi  
Pad metallurgy  
Finish  
Si3N4 thickness 1.05 µm  
10 (13)  
T2525  
Rev. A3, 17-Oct-01  
T2525  
Package Information  
Figure 13.  
Package SO8  
Dimensions in mm  
5.2  
4.8  
5.00  
4.85  
3.7  
1.4  
0.25  
0.2  
0.4  
3.8  
0.10  
1.27  
6.15  
5.85  
3.81  
8
5
technical drawings  
according to DIN  
specifications  
1
4
Figure 14.  
Package TSSO8  
Dimensions in mm  
3.1  
2.9  
5.0  
4.8  
0.9  
0.8  
0.20  
0.13  
0.38  
0.25  
0.15  
0.05  
3.1  
2.9  
0.65  
1.95  
8
5
technical drawings  
according to DIN  
specifications  
1
4
11 (13)  
Preliminary Information  
Rev. A3, 17-Oct-01  
Preliminary Information  
Ozone Depleting Substances Policy Statement  
It is the policy of Atmel Germany GmbH to  
1. Meet all present and future national and international statutory requirements.  
2. Regularly and continuously improve the performance of our products, processes, distribution and operating systems  
with respect to their impact on the health and safety of our employees and the public, as well as their impact on  
the environment.  
It is particular concern to control or eliminate releases of those substances into the atmosphere which are known as  
ozone depleting substances (ODSs).  
The Montreal Protocol (1987) and its London Amendments (1990) intend to severely restrict the use of ODSs and forbid  
their use within the next ten years. Various national and international initiatives are pressing for an earlier ban on these  
substances.  
Atmel Germany GmbH has been able to use its policy of continuous improvements to eliminate the use of ODSs listed  
in the following documents.  
1. Annex A, B and list of transitional substances of the Montreal Protocol and the London Amendments respectively  
2. Class I and II ozone depleting substances in the Clean Air Act Amendments of 1990 by the Environmental  
Protection Agency (EPA) in the USA  
3. Council Decision 88/540/EEC and 91/690/EEC Annex A, B and C (transitional substances) respectively.  
Atmel Germany GmbH can certify that our semiconductors are not manufactured with ozone depleting substances and  
do not contain such substances.  
12 (13)  
T2525  
Rev. A3, 17-Oct-01  
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Atmel Germany GmbH makes no warranty for the use of its products, other than those expressly contained in the Companys standard warranty  
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Data sheets can also be retrieved fron the Internet: http://www.atmel-wm.com  
Rev. A3, 17-Oct-01  

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