ADC701 [BB]
16-Bit 512kHz SAMPLING A/D CONVERTER SYSTEM; 16位512KHZ采样A / D转换器系统
| 型号： | ADC701 |
| 厂家： | 
BURR-BROWN CORPORATION |
| 描述： | 16-Bit 512kHz SAMPLING A/D CONVERTER SYSTEM |
| 文件： | 总15页 (文件大小：112K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
®
ADC701
SHC702
16-Bit 512kHz
SAMPLING A/D CONVERTER SYSTEM
APPLICATIONS
FEATURES
● MEDICAL IMAGING
● CONVERSION RATE: to 512kHz Over
Temp
● SONAR
● NO MISSING CODES AT 16 BITS
● PROFESSIONAL AUDIO RECORDING
● AUTOMATIC TEST EQUIPMENT
● SPURIOUS-FREE DYNAMIC RANGE:
107dB
● HIGH PERFORMANCE FFT SPECTRUM
● LOW NONLINEARITY: ±0.0015%
ANALYSIS
● SELECTABLE INPUT RANGES: ±5V,
±10V, 0 to +10V, 0 to +5V, –10V to 0
● ULTRASOUND SIGNAL PROCESSING
● HIGH SPEED DATA ACQUISITION
● REPLACES DISCRETE MODULAR ADCs
● LOW POWER DISSIPATION: 2.8W Typical
Including Sample/Hold
● METAL AND CERAMIC DIP PACKAGES
DESCRIPTION
Excellent linearity and stability are assured through
use of a new ultra-precise monolithic D/A converter
and a low-drift reference circuit. Custom monolithic
op amps provide very high bandwidth and low noise
in all sections of the analog signal path. Logic is
CMOS/TTL compatible and is designed for maxi-
mum flexibility.
The ADC701 is a very high speed 16-bit analog-to-
digital converter based on a three-step subranging
architecture. Outstanding dynamic performance is
achieved with the SHC702 companion sample/hold
amplifier. Both devices use hybrid construction for
applications where reliability, small size, and low
power consumption are especially important.
1kΩ
Input
Flash
Encoder
PGA
Scaling
Network
1kΩ
Analog
Input
–
Timing and
Control Logic
Data
Output
DAC
+
Buffer
Output
Switch
–
Drive
Buffer
Input
+
10V
Ref
SHC702
ADC701
Convert Command
Sample/Hold
Command
InternationalAirportIndustrialPark•MailingAddress:POBox11400,Tucson,AZ85734•StreetAddress:6730S.TucsonBlvd.,Tucson,AZ85706•Tel:(520)746-1111•Twx:910-952-1111
Internet:http://www.burr-brown.com/•FAXLine:(800)548-6133(US/CanadaOnly)•Cable:BBRCORP•Telex:066-6491•FAX:(520)889-1510•ImmediateProductInfo:(800)548-6132
© 1988 Burr-Brown Corporation
PDS-877D
Printed in U.S.A. May, 1997
SPECIFICATIONS
ELECTRICAL (ADC701 ONLY)
At TA = +25°C, 500kHz sampling rate, ±VCC = ±15V, ±VDD1 = ±5V, +VDD2 = +5V, and five-minute warmup in a convection environment, unless otherwise noted.
ADC701JH
TYP
ADC701KH
TYP
PARAMETER
CONDITIONS
MIN
MAX
MIN
MAX
UNITS
RESOLUTION
INPUTS
16
*
Bits
ANALOG
Voltage Ranges
Unipolar
Bipolar
0 to +5, 0 to +10, –10 to 0
V
V
±5, ±10
Resistance
0 to +5V Range
0 to +10V, –10 to 0, ±5V Ranges
±10V Range
2.45
4.9
9.8
2.5
5
10
5
2.55
5.1
10.2
*
*
*
*
*
*
*
*
*
*
kΩ
kΩ
kΩ
pF
Capacitance
All Ranges
DIGITAL
Logic Family
Convert Command
Pulse Width
TTL-Compatible CMOS
Rising Edge
Start Conversion
t = Conversion Period
50
t – 50
*
*
ns
TRANSFER CHARACTERISTICS
ACCURACY
Gain Error(1)
0 to +10V Range
±10V Range
All Ranges, All Supplies
0 to +10V Range
±10V Range
±0.03
±0.03
±0.005
±1
±5
±0.006
±0.002
±0.0006 ±0.0012
Guaranteed
0.6
±0.1
±0.1
±0.1
±3
±10
±0.1
±0.003
*
*
*
*
*
*
*
*
*
*
*
*
*
*
%
%
%/V
mV
mV
%FSR/V
%FSR(3)
%FSR
Power Supply Sensitivity of Gain
Input Offset Error(1)
Power Supply Sensitivity of Offset
Integral Linearity Error(2)
Differential Linearity Error(2)
No Missing Codes
All Ranges, All Supplies
±0.0012
*
Guaranteed
*
Noise
RSOURCE ≤ 50Ω
LSB rms
CONVERSION CHARACTERISTICS
Sample Rate
Conversion Time(4)
Unadjusted
Unadjusted
DC
512
1.5
*
*
*
kHz
µs
1.45
*
OUTPUTS
DIGITAL
Logic Family
Data Coding
TTL-Compatible CMOS
Unipolar Ranges
Bipolar Ranges
IOL ≤ 3.2mA
IOH ≤ 80µA
Both Edges
Straight Binary
Offset Binary
0.4
Logic “0” Levels (VOL
Logic “1” Levels (VOH
Data Valid Setup Time Before Strobe
)
)
0.1
4.9
37
*
*
*
*
*
V
V
ns
4
28
*
*
INTERNAL REFERENCE
Voltage
Current Available to External Loads
RLOAD ≥ 5kΩ
+9.995 +10.000 +10.005
*
*
*
*
V
mA
2
5
POWER SUPPLY REQUIREMENTS
Supply Voltages: +VCC
Operating
+14.25
–14.25
+4.75
–4.25
+4.25
+15
–15
+5
–5
+5
25
33
45
37
+15.75
–15.75
+5.25
–6
+5.25
30
45
55
50
150
2.3
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
*
V
V
V
V
V
mA
mA
mA
mA
mA
W
–VCC
+VDD1
–VDD1
+VDD2
Supply Currents: +ICC
Operating
–ICC
+IDD1
–IDD1
+IDD2
133
1.95
Power Dissipation
Nominal Voltages
PERFORMANCE OVER TEMPERATURE
Specification Temperature Range
Gain Error
Input Offset Error
TA Min to TA Max
All Ranges
All Unipolar Ranges
All Bipolar Ranges
+15
+55
±15
±5
0
+70
*
*
°C
ppm/°C
ppm FSR/°C
ppm FSR/°C
ppm/°C
±10
±1
±1
±0.2
±0.05
Typical
±3
*
*
*
*
±5
*
Integral Linearity Error(2)
Differential Linearity Error(2)
No Missing Codes
Reference Output Drift
Drift of Conversion Time
Sample Rate
±0.5
±0.3
*
ppm/°C
Guaranteed
*
*
ppm/°C
ns/°C
kHz
Unadjusted
Unadjusted
+3
+4
512
*
*
DC
*
* Same specifications as ADC701JH.
®
2
ADC701/SHC702
SPECIFICATIONS
ELECTRICAL (SHC702 ONLY)
At TA = +25°C, 500kHz sampling rate, ±VCC = ±15V, +VDD1 = +5V, and five-minute warmup in a convection environment, unless otherwise noted.
SHC702JM
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
INPUTS (Without Input Buffer)
ANALOG
Voltage Range
Resistance
Capacitance
±10.25
0.98
±11
1
3
V
kΩ
pF
1.02
DIGITAL
Logic Family
Input Loading
LSTTL
2
LSTTL Loads
TRANSFER CHARACTERISTICS
ACCURACY
Gain
Gain Error
Linearity Error
Offset Error
Charge Offset (Pedestal) Error
Droop Rate
Dynamic Nonlinearity
Power Supply Sensitivity
RSOURCE = 0Ω
RSOURCE = 0Ω
Sample Mode
–1
V/V
%
%FSR
mV
±0.02
±0.0003
±0.5
±0.5
±0.2
±0.1
Sample Mode
±3
±5
±2
Sample/Hold Mode, RSOURCE ≤ 50Ω
Hold Mode
Sample/Hold Mode
Offset Plus Charge Offset, All Supplies
mV
µV/µs
%FSR
%FSR/V
±0.0005
±0.003
DYNAMIC CHARACTERISTICS
Acquisition Time
10V Step to ±150µV
5V Step to ±150µV
to ±150µV
600
500
120
20
ns
ns
ns
Sample-to-Hold Settling Time(5)
Aperture Delay Time
Aperture Uncertainty (Jitter)
Slew Rate
Small Signal Bandwidth
Full-Power Bandwidth
Feedthrough Rejection
ns
10
25
ps rms
V/µs
MHz
MHz
%
150
3.1
2
VIN = ±1V
VIN = ±10V
Hold Mode, 10Vp-p Square Wave Input
0.001
OUTPUT
Voltage Range
Output Current
RLOAD ≥ 1kΩ
±10.25
±40
±11
V
mA
Short Circuit Protection
Output Impedance
RLOAD = 0Ω
Indefinite
0.01
DC
0.1
Ω
INPUT BUFFER CHARACTERISTICS
INPUT
Impedance
Bias Current
Offset Voltage
Voltage Range
1013
±2
±0.3
±11
3
Ω
pF
pA
VIN = ±10V
RSOURCE ≤ 10kΩ
±15
±1.5
mV
V
±10.25
DYNAMIC CHARACTERISTICS
Slew Rate
Full-Power Bandwidth
Settling Time
20
35
570
1.7
V/µs
kHz
µs
VIN = ±10V
10V Step to ±150µV
OUTPUT
Output Current
Short Circuit Protection
±15
±20
Indefinite
mA
RLOAD = 0Ω
POWER SUPPLY REQUIREMENTS
Voltage: +VCC
–VCC
+VDD1
Current: +ICC
–ICC
Operating
+13.5
–13.5
+4.75
+15
–15
+5
33
18
+16.5
–16.5
+5.25
40
25
10
V
V
V
mA
mA
mA
mW
Operating
+IDD1
Power Dissipation
5
790
Nominal Voltages
950
PERFORMANCE OVER TEMPERATURE
Specification Temperature Range
Sample/Hold Gain Error
Sample/Hold Offset Error
Sample/Hold Charge Offset Error
Droop Rate
TA Min to TA Max
RSOURCE = 0Ω
RSOURCE ≤ 50Ω
RSOURCE ≤ 50Ω
0
+70
±5
±30
±80
±50
±15
°C
±1
±10
±10
ppm/°C
µV/°C
µV/°C
µV/µs
µV/°C
Buffer Offset Error
RSOURCE ≤ 10kΩ
±3
NOTES: (1) Adjustable to zero. Tested and guaranteed for 0 to +10V and ±10V ranges only. (2) Peak-to-peak based on 99.9% of all codes. (3) FSR means full-
scale range and depends on the input range selected. (4) ADC conversion time is defined as the time that the Sample/Hold must remain in the Hold mode; i.e.,
the duration of the Sample/Hold command. This time must be added to the Sample/Hold acqusition time to obtain the total system throughput time. (5) Given for
reference only — this time overlaps with the ADC701 conversion time and does not affect system throughput rate.
®
3
ADC701/SHC702
SPECIFICATIONS
ELECTRICAL (COMBINED ADC701/SHC702)
At TA= +25°C, 500kHz sampling rate, ±VCC = ±15V, ±VDD1= ±5V, +VDD2 = +5V, and five-minute warmup in a convection environment, ±5V input range, unless otherwise noted.
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
Sample Rate
Dynamic Nonlinearity
Total Harmonic Distortion (THD)
Unadjusted
DC
512
kHz
%FSR
dB
dB
dB
±0.002
–103
–82
107
94
–81
–86
93
f
IN = 20kHz (–0.3dB)
IN = 199kHz (–0.2dB)
IN = 20kHz (–0.3dB)
IN = 199kHz (–12dB)
1 = 195kHz (–6.5dB), f2 = 200kHz (–6.5dB)
1 = 195kHz (–12.5dB), fF2 = 200kHz (–12.5dB)
f
Spurious-Free Dynamic Range (SFDR)
Two-Tone Intermodulation Distortion (IMD)
f
f
dB
f
dBC
dBC
dB
f
Signal-to-Noise Ratio (SNR)
Total Power Dissipation
f
IN = 5kHz (–0.5dB)
Operating
2.8
3.25
W
ADC701 PIN ASSIGNMENTS
ADC701 ORDERING INFORMATION
PIN NO.
DESCRIPTION
PIN NO.
DESCRIPTION
(
)
ADC701
H
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Bit 1/9 (Bit 1 = MSB)
Bit 2/10
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
–VDD1 (–5V) Analog
Common (Analog)
+VDD1 (+5V) Analog
Reference (Gain) Adjust
+10V Reference Output(2)
Common (Reference)
DNC
Basic Model Number
Performance Grade Code
K: 0°C to +70°C Ambient Temperature
J: +15°C to +55°C Ambient Temperature
Package Code
Bit 3/11
Bit 4/12
Bit 5/13
Bit 6/14
Bit 7/15
Bit 8/16
H: Metal and Ceramic
Common (Analog)
+10V Reference Input(2)
Clip Detect Output
+VDD2 (+5V) Digital
Common (Digital)
Data Strobe
High/Low Byte Select
Convert Command
Sample/Hold Control(3)
Common (Digital)
Common (Digital)
Clock Adjust
(1)
Input D
Input C
(1)
ADC701 ABSOLUTE MAXIMUM RATINGS
Common (Signal)
(1)
Input B
Input A
±VCC .......................................................................................................................................... ±18V
±VDD1, +VDD2 ............................................................................... ±7V, +7V
Analog Input ...................................................................................... ±VCC
Logic Input .......................................................... –0.5V to (+VDD2 + 0.3V)
Logic Output .................................................................................. ±25mA
Case Temperature ........................................................................ +150°C
Junction Temperature ................................................................... +165°C
Storage Temperature..................................................... –65°C to +165°C
Power Dissipation ................................................................................. 3W
Stresses above these ratings may permanently damage the device.
(1)
–VCC (–15V) Analog
Common (Power)
+VCC (+15V) Analog
DNC(4)
Common (Digital)
+VDD2 (+5V) Digital
Offset Adjust
Offset Adjust
NOTES: (1) Refer to Input Connection Table. (2) Reference Input is normally
connected to Reference Output, unless an external 10V reference is used. (3)
Sample/Hold Control goes high to activate Hold mode. (4) DNC = Do Not
Connect.
PACKAGING INFORMATION
PACKAGE DRAWING
PRODUCT
PACKAGE
NUMBER(1)
ADC701JH
ADC701KH
Metal and Ceramic
Metal and Ceramic
230
230
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix C of Burr-Brown IC Data Book.
®
4
ADC701/SHC702
ADC701 OUTPUT CODING
NOMINAL INPUT VOLTAGE TO ADC701
(Multiply by –1 for SHC702 Input Voltage)
OUTPUT CODE
INPUT LEVEL
(Exact Center of Code)
0–10V RANGE
(1LSB ≈153µV)
±10V RANGE
(1LSB ≈05µV
±5V RANGE
(1LSB ≈153µV)
(1 = Logic High)
CLIP
DETECT
MSB
LSB
Underrange
–FS
–FS + 1LSB
< –76µV
0V
+153µV
< –10.000153V
–10V
–9.999695V
< –5.000076V
–5V
–4.999847V
0000 0000 0000 0000
0000 0000 0000 0000
0000 0000 0000 0001
1
0
0
–3/4FS
–1/2FS
–1/4FS
+1.25V
+2.5V
+3.75V
–7.5V
–5V
–2.5V
–3.75V
–2.5V
–1.25V
0010 0000 0000 0000
0100 0000 0000 0000
0110 0000 0000 0000
0
0
0
–1LSB
Mid-Scale
+1LSB
+4.999847V
+5V
+5.000153V
–305µV
0V
+305µV
–153µV
0V
+153µV
0111 1111 1111 1111
1000 0000 0000 0000
1000 0000 0000 0001
0
0
0
+1/4FS
+1/2FS
+3/4FS
+6.25V
+7.5V
+8.75V
+2.5V
+5V
+7.5V
+1.25V
+2.5V
+3.75V
1010 0000 0000 0000
1100 0000 0000 0000
1110 0000 0000 0000
0
0
0
+FS –2LSB
+FS – 1LSB
Overrange
+9.999695V
+9.999847V
> +9.999924V
+9.99939V
+9.999695V
> +9.999847V
+4.999695V
+4.999847V
> +4.999924V
1111 1111 1111 1110
1111 1111 1111 1111
1111 1111 1111 1111
0
0
1
SHC702 ORDERING INFORMATION
SHC702 PIN ASSIGNMENTS
PIN NO.
DESCRIPTION
PIN NO.
DESCRIPTION
SHC702
J
M
24
23
22
21
20
19
18
17
16
15
14
13
+VCC (+15V) Analog
Common (Power)
–VCC (–15V) Analog
Common (Analog)
NC
1
2
3
4
5
6
7
8
9
Sample/Hold Output
Basic Model Number
Performance Grade Code
J: 0°C to +70°C Ambient Temperature
Package Code
NC(3)
NC
NC
NC
NC
NC
M: Metal
NC
NC
Buffer Amp Input(2)
NC
Common (Signal)
Buffer Amp Output
Analog Input
NC
+VDD1 (+5V) Analog
Common (Digital)
Hold Input(1)
Hold Input(1)
10
11
12
SHC702 ABSOLUTE MAXIMUM RATINGS
±Vcc .................................................................................................... ±18V
+VDD1 ................................................................................................... +7V
Analog and Buffer Inputs ................................................................... ±VCC
Outputs .......................................................... Indefinite Short to Common
Logic Inputs........................................................... –0.5V to (+VDD1 + 0.3V)
Case Temperature ........................................................................ +150°C
Junction Temperature ................................................................... +165°C
Storage Temperature ...................................................... –65°C to +165°C
Power Dissipation .............................................................................. 1.5W
Stresses above these ratings may permanently damage the device.
NOTES: (1) Hold mode is activated only when pin 12 is low and pin 11 is high.
For normal use with ADC701, pin 12 is grounded and pin 11 is connected to
ADC701 Sample/Hold control (ADC701 pin 15). (2) If the buffer amp is not used,
pin 17 should be grounded. (3) NC = No Internal Connection.
PACKAGING INFORMATION
PACKAGE DRAWING
PRODUCT
PACKAGE
NUMBER(1)
SHC702JM
24-Pin
037
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix C of Burr-Brown IC Data Book.
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes
no responsibility for the use of this information, and all use of such information shall be entirely at the user's own risk. Prices and specifications are subject to change
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant
any BURR-BROWN product for use in life support devices and/or systems.
®
5
ADC701/SHC702
TYPICAL DYNAMIC PERFORMANCE (ADC701/SHC702)(1)
FULL-SCALE SINEWAVE RESPONSE, fIN = 20kHz
FULL-SCALE SINEWAVE RESPONSE, fIN = 100kHz
0
–20
0
–20
–40
–40
–60
–60
2
V
3
V
–80
–80
4
V
7
2
V
6
V
8
9
5
V
5
V
3
V
4
V
7
V
V
–100
–120
–140
–100
–120
–140
9
V
V
V
0
50
100
150
200
250
0
50
100
150
200
250
Frequency (kHz)
Frequency (kHz)
Input Frequency
Fundamental –0.3 dB
2nd Harmonic –107.5 dB
3rd Harmonic –111.5 dB
19.9890136719 kHz
Input Frequency
100.982666016 kHz
4th Harmonic
5th Harmonic
6th Harmonic
–115.6 dB
–111.2 dB
–124.5 dB
Fundamental
2nd Harmonic
3rd Harmonic
–0.5 dB
–89.1 dB
–90.5 dB
4th Harmonic
5th Harmonic
6th Harmonic
–102.5 dB
–110.2 dB
–106.8 dB
TWO-TONE INTERMODULATION RESPONSE,
fIN = 195kHz and 200kHz
FULL-SCALE SINEWAVE RESPONSE, fIN = 200kHz
0
–20
0
–20
–40
–40
–60
–60
2
1
V
3
V
2
V
–80
–80
3
V
5
V
V
4
V
7
6
V
5
V
V
–100
–120
–140
–100
–120
–140
0
50
100
150
200
250
0
50
100
150
200
250
Frequency (kHz)
Frequency (kHz)
Input Frequency
199.005126953 kHz
Frequency 1
Frequency 2
194.976806641 kHz
199.981689453 kHz
Fundamental
2nd Harmonic
3rd Harmonic
–0.7dB
–81.4dB
–89.4dB
4th Harmonic
5th Harmonic
6th Harmonic
–111.5dB
–97.0dB
–112.5dB
f1
f2
–6.8dB
3 > f1 +2f2
4 > 2f1 +f2
5 > f1 –2f2
6 > 2f1 –f2
–96.0dB
–6.3dB
–87.7dB
–88.8dB
–96.8dB
–104.9dB
–109.0dB
1 > f1 +f2
2 > f1 –f2
NOTE: (1) For figures above, sampling rate = 500.0000000000kHz. 16,384 point FFT, non-windowed. Noise floor limited by synthesized generators.
DIFFERENTIAL NONLINEARITY OF ALL CODES,
19.6 MILLION SAMPLES
2
1
0
–1
–2
0
32767
Codes
65535
®
6
ADC701/SHC702
The ADC701 input voltage is converted to a current through
the input scaling resistors (Figure 2), and this current is
applied to the summing junction (virtual ground) of error
amplifier A1. The current output of the DAC (0 to 2mA) is
also applied to the summing point. If bipolar operation is
selected, the 10V reference output is applied to input D,
creating a 1mA offset current which sums with the input
current.
THEORY OF OPERATION
The ADC701 uses a three-step subranging architecture,
meaning that the analog-to-digital conversion is performed
in three passes which constitute coarse, medium and fine
approximations of the input signal. Refer to Figures 1 and 2
for simplified block diagrams of the system.
Before the input signal is presented to the ADC, it must be
sampled with high linearity and low aperture error by the
sample/hold amplifier.
1kΩ
In the SHC702, the sampling switch is placed at the sum-
ming junction (virtual ground) of a high speed FET ampli-
fier (Figure 1). This arrangement maintains constant charge
injection independent of the signal amplitude, which is
critically important for good linearity performance. The
sampling switch itself is a high speed DMOS FET whose
gate is driven from a fast-slewing control signal, thus mini-
mizing the time aperture between the fully closed (sample
mode) and the fully open (hold mode) states of the switch.
The signal voltage is held across the feedback capacitor,
forcing the op-amp to maintain a constant output voltage for
the duration of the A/D conversion. Feedthrough from the
input, already low due to the MOSFET’s low capacitance, is
further reduced by clamping the summing point to ground
with another FET.
CHOLD
1kΩ
Analog
Input
–
+
Analog
Output
Hold
Hold
Switch and
Clamp Drive
Signal
Conditioning
FIGURE 1. Simplified Block Diagram of the SHC702.
Ref Ref Input
Input
D
Input
A
Input
B
Out In
C
5kΩ
5kΩ
5kΩ
5kΩ
Input
Scaling
Network
High Speed PGA
Attenuator
Rf
–
+
A1
X32
X32
Buffer
DAC
Error
Amp
10V
DAC
Reference
Register
PGA Control
Lines
VIN
7 Bit
Adder
(Digital Error Correction)
Flash ADC
ADC
Timing and
Output Register
Control Logic
Flash ADC
Reference
Generator
ADC
Output
Convert
Command
Hold
Command
Data
Strobe
FIGURE 2. Simplified Block Diagram of the ADC701.
®
7
ADC701/SHC702
At the beginning of each conversion, the DAC is reset to
mid-scale so that its output current is exactly 1mA. This
1mA is subtracted from the input signal current. The differ-
ence current flows through Rf and appears as an error
voltage at the output of A1.
INSTALLATION AND
OPERATING INSTRUCTIONS
The ADC701/SHC702 combination is designed to be easy to
use in a wide variety of applications, without sacrificing
flexibility of the analog and digital interface.
During the first pass, the programmable gain amplifier
(PGA) is set to unity gain, which matches the error voltage
range to the input range of the flash ADC. The error signal
is digitized to 7-bit resolution by the flash ADC, creating a
coarse approximation of the digital output value, which is
then applied to the DAC.
SHC702 INTERFACE
The connection diagram (Figure 3) shows the basic hookup.
At the SHC702 input, the user may opt to connect the built-
in FET buffer amplifier. The buffer is most useful in multi-
channel applications where the signal bandwidth is less than
100kHz. In those applications, it serves to isolate the multi-
plexer output from the 1kΩ input impedance of the sample/
hold. For higher frequency applications and for any system
that does not require the very high impedance, the best
results (lowest noise and distortion) will be achieved by
driving the SHC702’s analog input directly. If the buffer is
not used, its input should be grounded to avoid random noise
pickup and saturation of the buffer op amp.
Since the DAC output is now approximately equal to the
input signal current, the remaining difference current flow-
ing through Rf is small—ideally less than 1/128 of full scale,
which is due to the built-in quantizing uncertainty of the 7-
bit flash ADC. However, other sources of error (e.g., integral
and differential nonlinearity of the flash ADC, gain and
offset of the PGA, settling and noise errors throughout the
signal path) cause the possible error range to be significantly
greater. In fact, the ADC701 is designed to handle remainder
signals up to 1/32 of full scale, which is four times the
“ideal” value.
Only two connections are required between the SHC702 and
the ADC701: SHC702 analog output to ADC701 input(s)
and the digital Hold Command from the ADC701 to the
SHC702. As always, it is best to avoid routing these analog
and digital lines along parallel traces. Although the place-
ment of the SHC702 relative to the ADC is not extremely
critical, one good approach is to mount the SHC along one
end of the ADC package as shown in Figure 4. This mini-
mizes the length of the interconnections and keeps the
digital lines well away from sensitive analog signals.
Therefore, the PGA is set during the second pass to a gain
of 32, allowing the small remainder signal to match the full
range of the flash ADC. This is again digitized to 7-bit
resolution and added to the previous result to create the
“medium” approximation of the input signal. Because the
full-scale range of the flash represents 1/32 of the input
signal’s full range, the 7-bit flash output is shifted right by
5 bits before being added to the original 7-bit “coarse”
result, creating a 12-bit word. There is an overlap of two bits
because the two least significant bits of the first-pass result
correspond to the two most significant bits of the second-
pass result. This overlap in the adder is called “digital error
correction”—the mechanism that allows nonideal remain-
ders from the first pass to be corrected in the second pass.
ADC701 INPUT CONNECTIONS
The ADC input network has four separate terminals, allow-
ing many different input ranges. These should be connected
as indicated in Table I. Most users will take advantage of the
ADC701’s built-in reference circuit, which has very low
noise and excellent temperature stability. To use the internal
reference, it is only necessary to connect pin 36 (Reference
Output) to pin 32 (Reference Input). To use an external 10V
reference (to cause the ADC gain to track a system refer-
ence, for example), pin 36 is left unconnected and the
external reference is applied to pin 32. If required, the
ADC701 will typically accommodate a five to ten percent
variation in the 10V reference. External references should
have very low noise to avoid degrading the excellent signal-
to-noise ratio (SNR) of the ADC701.
The 12-bit approximation is applied once again to the DAC,
causing the remaining difference current to become yet
smaller. For the third pass, the PGA’s gain is increased by
another factor of 32, and the remainder is again digitized by
the flash ADC.
At this point in the conversion, all of the necessary data has
been latched and it is no longer necessary to hold the analog
signals from the sample/hold or the DAC. From a systems
perspective, the conversion is now complete because the
sample/hold is released to begin acquiring the next input
sample and the DAC is reset to mid-scale for the next
conversion. Meanwhile, the final result from the flash is
added to the previous 12-bit result. Again there is a two-bit
overlap to allow for error correction. The adder output is
monitored to prevent a digital “rollover” condition, so that
the ADC clips properly at the signal extremes. The upper
sixteen bits of the final adder result are stored in the ADC’s
output register, ready to be presented in byte-sequential
form at the eight output data lines. The overrange or “clip”
condition can also be detected externally by monitoring pin
9. Refer to the section on ADC701 Digital I/O for further
detail.
INPUT RANGE
CONNECT VIN TO
CONNECT Ref In TO
0 to +10V
±10V
Input A and Input D
Input A
—
Input D
Input D
±5V
–10V to 0
0 to +5V
Input A and Input B
Input A and Input B
Input B and Input C
Input C and Input D
—
TABLE I. ADC701 Input Connection Table.
®
8
ADC701/SHC702
+15V
–15V
+5V
+
+
+
24
+15V
22
–15V
9
+5V
Connect for
Buffered Input
17
14
13
11
Buffer
Input
Hold
Buffer
Output
(1)
VIN
SHC702
Connect for
Direct Input
1
Analog
Input
Analog
Output
= Analog Ground Plane (5)
Hold
12
Common
15 21
10
23
Optional
Optional
+15V
–15V
+5V
–5V
Gain Adjust
20kΩ
Offset Adjust
500kΩ(6)
+
+
30kΩ
22
+
+
31
Input Ref Ref Ref Ref
In
Out Adj Com Commons Com Com
32
36
37
35
39
33
25
21
24
+15V
26
–15V
38
+5V
40
–5V
29
Analog Signal Power
Offset
Adjust
Offset
Adjust
D
27
28
Input A(2)
Input B
Start
Convert
ADC701
15
Convert Command In
Sample/Hold Command Out
High/Low
14
Bit
Bit
Bit
Bit
Bit
Bit
Bit
Bit Data
Clip
Byte
Clock
4/12
1/9 2/10 3/11
5/13 6/14 7/15 8/16 Strobe Detect
Select
Adj +5V +5V
Digital Common
16 17 19
1
2
3
4
5
6
7
8
12
9
11
13
18
10
20
+
1kΩ
Optional
Clock Adjust
+5V
D
74HC574
Optional(4)
74HC574
Octal Flip-Flop
(3)
Q
Bit
4
Bit
1
Bit
2
Bit
3
Bit
5
Bit
6
Bit
7
Bit
8
Bit
9
Bit
10
Bit
11
Bit
12
Bit
13
Bit
14
Bit
15
Bit
16
Clip
Detect
(Latched)
NOTES: (1) For lowest distortion at high input frequencies the non-buffered option should be used. If the buffer is not used, its input should be grounded. (2) Shown
connected for ±5V input range. Refer to Input Connection Table for other options. (3) If the Clip Detect feature is used, then the signal may be latched with a simple
D type flip-flop as shown. See the section on ADC701 Digital I/O for additional applications information. (4) The second octal flip-flop is recommended but optional
— it provides added digital signal isolation and buffering, and also permits three-state logic output compatibility. (5) All commons should be connected to the analog
ground plane. Refer to the section on “Power and Ground Connections.” (6) The Offset Adjust circuit shown provides an adjustment range of approximately ±0.25%
FSR.
FIGURE 3. ADC701/SHC702 Connection Diagram.
®
9
ADC701/SHC702
OFFSET, GAIN AND CONVERSION
SPEED ADJUSTMENTS (OPTIONAL)
to the ground plane connections. For example, the ADC701
output data lines will sink current (statically and/or dynami-
cally) when in the low state. This current comes from the
power supply that runs the interface logic, and so must
return to that supply’s ground. If the ground termination is
placed such that this digital current will flow away from the
ADC701, then the existing ground plane will suffice to carry
the current. On the other hand, if the ground termination
must be placed such that the digital current flows across the
ADC or SHC layout, then it would be advisable to break the
analog ground plane under the package (to stop the flow of
current across the package) and to provide a separate trace
(several centimeters wide) on another PC board layer to
carry the digital return current from pins 11 and 19 to the
termination point. If the ADC701 must interface into a fairly
noisy digital environment, then another approach is to keep
the first layer of latches and/or buffers connected to the
ADC701 power and ground planes, so that the ADC itself is
connected to “quiet” circuits with short return paths. This
transfers the interface problem to the outputs of the latches,
where it can be managed with less impact on the analog
components.
Adjustment of the reference voltage is the most straightfor-
ward way to adjust the ADC gain. For the internal reference,
this is accomplished by connecting a 20kΩ potentiometer as
shown in Figure 3. This will provide a gain trim range of
about ±3%. It is also possible to use external series or
parallel resistance in the input network, but that is more
cumbersome and usually will degrade the gain stability over
temperature due to tempco (temperature coefficient) mis-
matches among the resistors.
ADC offset may be adjusted by connecting a 500kΩ poten-
tiometer to pins 21 and 22, with the wiper connected
through a series 30kΩ resistor to ground as shown in Figure
3. This will provide an offset trim range of approximately
±0.25% FSR. For a larger trim range of offset or gain, it is
recommended that trims be accomplished elsewhere in the
system.
The Clock Adjust input (pin 18) is intended primarily for
small adjustments of the conversion time. However, this
will rarely be necessary because the ADC701 is guaranteed
to convert up to 512kHz over the specified temperature
range without external clock adjustment.
PHYSICAL INSTALLATION
The packages may be soldered directly into a PC board or
mounted in low-profile machined pin sockets with good
results. Use of tall (long lead length) sockets, adapters or
headers is not recommended unless a local ground plane and
bypass capacitors can be mounted directly under the pack-
ages.
POWER AND GROUND CONNECTIONS
Experience with testing and applying the ADC701 shows
that it will perform well in most board layouts, provided that
appropriate care is taken with grounding and bypassing.
Power supplies may be shared between the ADC701, SHC702
and other analog circuitry without difficulty. It is recom-
mended that each power pin be locally bypassed to the
ground plane with a high quality tantalum capacitor of at
least 1µF. If at all possible, power should be derived from
well-regulated linear supplies—switching power supplies
will require much more effort for proper decoupling and are
not recommended for this or any high performance wide-
band analog system.
In a room-temperature environment or inside an enclosure
with moderate airflow, the ADC701 and SHC702 normally
do not require heat-sinking. However, to keep the devices
running as cool as possible, it is helpful to install a thin heat-
transfer plate under the packages to conduct heat into the
ground plane. The plate may be made from metal (copper,
aluminum or steel) or from a special heat-conductive mate-
rial such as Sil-Pad(1). The Sil-Pad material has the advan-
tage of being electrically insulating and somewhat pliable,
so that it will tend to distribute pressure evenly and conform
to the package—an advantage in systems where the board
may be flexed or subjected to vibration.
The +5V Digital supply pins, though not as sensitive to
noise as the +5V Analog pin, should nonetheless be kept as
quiet as possible. If the system digital supply is noisy, then
it is best to use the system +5V analog supply for all of the
+5V connections on the ADC701 and SHC702 rather than
trying to separate them. If only one +5V supply is available
and it is shared with other system logic, then extra bypassing
and/or supply filtering may be required.
PC BOARD LAYOUT
An optimized layout has been designed for the DEM-
ADC701-E demonstration fixture. For information concern-
ing the demo board and the layout, contact your local sales
representative.
The –5V supply will operate with any voltage between –
4.75 and –6V. If –5V is not available from the system
supplies, then an industry-standard 7905 regulator may be
used to derive –5V from the –15V supply.
All ground pins on both the ADC701 and the SHC702
should be connected directly to a common ground plane.
This is true for both analog and digital grounds. However,
it is also helpful to recognize where the digital ground
currents flow in the system, and to provide PC board return
paths for potentially troublesome digital currents in addition
®
10
ADC701/SHC702
OPTIONS FOR STROBED OUTPUT
ADC701 Digital I/O
There are several ways in practice to implement the logic
interface. Figure 3 shows the simplest configurations. In
order to convert the ADC701’s byte-sequential data into 16-
bit parallel form, the minimum requirement is for one single
octal flip-flop, such as a 74HC574 or equivalent. This will
latch the first byte on the rising edge of the ADC701 Data
Strobe. Then the second byte becomes valid, and all 16 bits
may be strobed to the outside system on the falling edge of
the Data Strobe.
Refer to the timing diagram, Figure 4. The conversion
process is initiated by a rising edge on the Convert Com-
mand input. This will immediately bring the sample/hold
command output to a logic high state (Hold mode).
After the ADC701 conversion is completed (approximately
1.5µs after the convert command edge), the Sample/Hold
Command falls to a low state, enabling the sample/hold to
begin acquisition of the next input sample. However, the
ADC701 internal clock continues to run so that the output
data may be processed.
For better noise isolation of the ADC701 from the digital
system, or if full three-state capability is required for the 16
output lines, a second octal flip-flop can be added as shown
in the dashed lines of Figure 3. This will also require an
inverter to convert the falling Data Strobe edge into a rising
clock edge for the second flip-flop IC.
There are two methods of reading data from the ADC:
1. Strobed Output—This will usually be the easiest and
fastest method. The data are presented sequentially as
high and low bytes of the total 16-bit word. The sequence
High-Low or Low-High is controlled by the state of the
High/Low Byte Select input. The first byte is valid on the
rising edge of the Data Strobe output; the second byte is
valid on the falling edge.
If it is desirable to have all 16 output lines change simulta-
neously (for example when driving a D/A converter), then a
third octal flip-flop (not shown in Figure 3) may be added to
re-latch the output of the first byte. By driving that device’s
clock also from the inverted Data Strobe, fully synchronous
switching of the 16 output bits will be achieved.
2. Polled output—With this method, data strobes will occur
as described above, but they are ignored by the user.
Instead, the user waits until the Data Strobe output falls,
and then manually selects high and low output data by
means of the High/Low Byte Select input. This polling
procedure may be carried out during the subsequent ADC
conversion cycle, but two precautions must be observed:
First, the user should avoid switching the High/Low Byte
Select immediately before or after the next convert com-
mand. This will prevent digital switching noise from
coupling into the system at the instant of analog sam-
pling. Second, the polling sequence must be completed
before the ADC begins to strobe out data from the
subsequent conversion.
USING THE CLIP DETECT OUTPUT
The ADC701 provides a built-in Clip Detect signal on pin 9
which indicates an ADC overrange or underrange condition.
The Clip Detect signal is only valid when the High Byte
becomes valid as shown in Figure 4. Therefore, the simplest
way to latch the Clip Detect signal is to provide an extra flip-
flop which is clocked on the same strobe edge as the High
Byte flip-flop. Such a setup is illustrated in Figure 3. The
Clip Detect signal remains at logic 0 under normal condi-
tions, and indicates a clip condition by rising to a logic 1.
Start Conversion
N
Start Conversion
N + 1
ADC701
Convert Command
(CC)
50ns min
50ns min
CC to Hold delay 18ns typ
Hold Mode
1.45µs typ
Hold Command
to SHC702
Sample Mode
Low Byte,(4)
Data N – 1
Low Byte,(4)
Data N
High Byte,(3)
Data N
Data Outputs for
Pin 13 = Low
Data Outputs for
Pin 13 = High
Low Byte,(4)
Data N
High Byte,(3)
Data N – 1
High Byte,(3)
Data N
(2)
(1)
(1)
110ns
typ
Data Strobe Output
1.55µs typ
NOTES: (1) Setup Time 28ns min, 37ns typ. (2) Hold Time 30ns min, 73ns typ. (3) High Byte refers to ADC bits 1 - 8, the most significant 8 bits.
Also, the Clip Detect signal on pin 9 is valid simultaneously with High Byte. (4) Low Byte refers to ADC bits 9 - 16, the least significant bits.
FIGURE 4. ADC701 Interface Timing Diagram.
®
11
ADC701/SHC702
The latched version of Clip Detect may be used to generate
an interrupt to the user’s system computer, which would
then launch a service routine to generate the appropriate
alarms or corrective action. Another possible application
would be to stretch the pulse using a monostable so that it
would be easily visible when driving an LED warning lamp.
TESTING THE ADC701/SHC702
The ADC701 and SHC702 together form a very high perfor-
mance converter system and careful attention to test tech-
niques is necessary to achieve accurate results. Spectral
analysis by application of a Fast Fourier Transform (FFT) to
the ADC digital output is the best method of examining total
system performance. Attempts to evaluate the system by
analog reconstruction through a D/A converter will usually
prove unsatisfactory; assuming that the static and dynamic
distortions of the D/A can be brought below the required
level (–110dB), the performance will still be beyond the
range of presently available spectrum analyzers.
In some systems, it may be desirable to provide separate
latched outputs for Underrange and Overrange. These con-
ditions may be separately detected by using simple logic to
implement the boolean equations:
Underrange = Clip Detect AND Anybit
Overrange = Clip Detect AND Anybit
Even when the analysis is done using FFT techniques,
several key issues must be addressed. First, the parameters
of the FFT need to be adequate to perform the analysis and
extract meaningful data. Second, the proper selection of test
frequencies is critical for good results. Third, the limitations
of commercial signal generators must be considered. These
three points are addressed in later sections. Finally, the test
board layout must follow the recommendations discussed on
pages 8 through 10.
where “Anybit” is any one of the data output bits.
The Underrange and Overrange signals would then be latched
into two separate flip-flops. A simple solution using a single
’74 dual flip-flop and a single ’00 quad NAND provides
enough logic to implement the logic equations, with a spare
NAND gate left over to use for creating the inverted Data
Strobe signal.
USING THE ADC701 AT
MAXIMUM CONVERSION RATES
DYNAMIC PERFORMANCE DEFINITIONS
The ADC701 is guaranteed to accept Convert commands at
a rate of DC to 512kHz over the specified operating tem-
perature range. At a conversion rate of 500kHz, the total
throughput time of 2µs allows for the 1.5µs ADC conversion
time plus 500ns for the digital output timing and sample/
hold acquisition time.
1. Total Harmonic Distortion (THD):
Harmonic Power (first 9 harmonics)
10 log
Sinewave Signal Power
If the user tries to exceed the maximum conversion rate by
a large amount, the Convert Command of conversion N+1
will occur before the Data Strobe has fallen from conversion
N. In such a situation, the ADC701 will simply ignore every
other Convert command so the actual conversion rate will
become half of the Convert command rate. Otherwise, the
conversion will proceed normally. Note that the ADC timing
slows down at high temperatures, so the frequency at which
this occurs will vary with temperature—although it is still
guaranteed to be greater than 512kHz over the specified
temperature range.
2. Signal-to-Noise Ratio (SNR):
Sinewave Signal Power
10 log
Noise Power
3. Intermodulation Distortion (IMD):
IMD Product Power (RMS sum; to 3rd-order)
10 log
Sinewave Signal Power
4. Spurious-Free Dynamic Range (SFDR):
Another consideration for operation at very high rates is that
the sample/hold acquisition time becomes shorter as the
conversion rate is increased. Users will note that the avail-
able acquisition time becomes less than 550ns at rates above
500kHz, which is less than the typical SHC702 acquisition
time for a 10V step to 150µV accuracy. However, the signal
degradation is gradual as the acquisition time is shortened—
even at 512kHz, there is enough time to acquire a 5V step to
better than 500µV. Also, most signal processing environ-
ments do not contain full-power signals at the Nyquist
frequency, but rather show a rolloff of signal power at high
frequencies. If the ability to acquire extremely large input
changes at extremely high conversion rates is of paramount
importance, the user may elect to use a Burr-Brown model
SHC803 sample/hold instead—it is pin compatible with the
SHC702 and provides much faster acquisition time at the
expense of some extra noise and higher distortion at low
input frequencies.
Power of Peak Spurious Component
10 log
Sinewave Signal Power
IMD is referred to the larger of the test signals f1 or f2—not
to the total signal power, which would result in a number
approximately 6dB “better.” The zero frequency bin (DC) is
not included in these calculations—it represents total offset
of the ADC, SHC and test equipment and is of little impor-
tance in dynamic signal processing applications.
®
12
ADC701/SHC702
FFT Parameters
SELECTION OF TEST FREQUENCIES
Accurate FFT analysis of 16-bit systems requires adequate
computing hardware and software. The FFT length (number
of points) should be relatively large—at least 4K and prefer-
ably 16K or larger. There are several reasons for this:
The FFT (and any similar DSP operation) treats the total
time-domain record length as one cycle of an infinitely long
periodic signal. Therefore, if the end of the sampled record
does not match up smoothly with the beginning, the output
spectrum will contain serious errors known as leakage or
truncation error(2). This well-known problem is usually
handled by applying a windowing function to the time-
domain samples, suppressing the worst effects of the mis-
match. However, the most often used windows such as
Hanning, Hamming, raised cosine, etc., are completely inad-
equate for 16-bit ADC testing. More sophisticated functions
such as the four-sample Blackman-Harris window(3) will
provide much better results, although there still will be
obvious spreading of the spectral lines.
1. The converter itself has 64K codes. Ideally, the test
would guarantee that all codes are tested at least once.
Practically speaking, however, that would require im-
mensely long FFTs (>>64K points) or averaging of a
large number of smaller FFTs. By using an FFT length of
4K or greater and proper selection of the test frequencies,
a very good statistical picture of the ADC performance
will be obtained which shows the effect of any defects in
the transfer function.
2. The noise floor of the output spectrum is not low enough
if less than 4K points are taken. Shorter FFTs have fewer
bins to cover the output spectrum, so a larger fraction of
the total system noise appears in each bin. Although the
SNR of the ADC701/SCH702 system is in the range of
–93dB, the noise level of the available generators may
increase the total measured noise power to –80dB. Every
doubling of the FFT length will spread the noise power
among twice as many bins, resulting in a 3dB reduction
of the spectral noise floor. In order to resolve spurious
components that are at the level of –110dB, an average
noise floor of less than –113dB would be barely ad-
equate. This requires at least 2048 bins in the output
half-spectrum, corresponding to a 4K-point FFT. Even
at this level, it will be difficult or impossible to separate
higher order harmonics in the ADC701 response from
the average noise level, indicating that longer FFTs are
desirable.
The most successful approach is to eliminate the need for
windowing by properly selecting the test signal frequency
(or frequencies) in relation to the ADC sampling frequency(4).
If the time sample contains exactly an integer number of
cycles, then there is no mismatch or truncation error. An-
other point to consider is that the sampling frequency should
not be an exact integer multiple of the signal frequency,
which would tend to reduce the number of different ADC
codes that are tested and also tend to artificially concentrate
quantization error in the harmonics of the test signal.
Both of these criteria are met by choosing an FFT length
which is a power of two (the most standard and fastest to
compute) and choosing a test frequency which causes an
exact odd integer number of cycles to appear in the time
record. In software, this selection can be accomplished very
easily:
1. Determine the desired sampling frequency fS.
3. Following the guidelines for test frequency selection
which are outlined in the next section, it becomes clear
that longer FFTs allow a much wider choice of test
frequencies without concern for sophisticated data win-
dowing or code coverage problems.
2. Determine the desired input signal frequency fAPPROX.
3. Determine the FFT length N, which should be a power of
2 (e.g., 4096 or 16384).
4. Divide fAPPROX by fS, multiply the quotient by N, and
round the result to the nearest odd integer. This is M, the
number of cycles in the time record.
Besides the consideration of FFT length, it is important to
realize that the FFT calculations must be performed with
high-precision arithmetic. The use of 32-bit fixed or floating
point calculations will generally be inadequate because the
noise floor due to calculation errors alone will interfere with
the ADC performance data. Unfortunately, this considera-
tion precludes the use of most DSP accelerator boards and
similar hardware. In order to preserve the full dynamic range
of the ADC output, it is best to use standard 64- or 80-bit
arithmetic. To avoid excessively long calculation times, the
FFT algorithm should be written in an efficiently compiled
language and make use of techniques such as trigonometric
look-up tables in software and dedicated floating-point
coprocessors in hardware. There are several commercial
software packages available from Burr-Brown and others
that meet these requirements.
5. Multiply M by fS and divide by N to obtain the exact
input signal frequency fACTUAL
.
SIGNAL GENERATOR CONSIDERATIONS
To suppress leakage effects, the calculated ratio of fS to
fACTUAL must be precisely maintained during the test. This
requirement is met easily by the use of synthesized signal
generators whose reference oscillators can be locked to-
gether. Other possible approaches include external phase
locking of non-synthesized generators and direct digital
synthesis techniques. If it is not possible to use phase-locked
signals, then a Blackman-Harris window may be used as
mentioned previously.
®
13
ADC701/SHC702
Another key issue is the purity of both the signal and
sampling frequency generators. The sampling clock’s phase
noise (jitter) will act as another source of SNR degradation.
This is not serious as long as the jitter is random and the
noise sidebands contain no sharp peaks. The HP3325 syn-
thesizer is suitable for this purpose. The input signal genera-
tor will require more attention because its distortion will
usually be greater than that of the ADC701/SHC702. Pres-
ently, the lowest distortion synthesized generator is the
Brüel & Kjær Model 1051 (or 1049). This is suitable for
testing the system in the audio range. The upper frequency
limit of the B&K synthesizer is 200kHz. Above 20kHz, the
distortion becomes a limiting factor, and low-pass filters
must be inserted into the signal path to reduce the harmonic
and spurious content.
As noted previously, the combined noise contributions of
the signal generator and sampling clock generator far exceed
the SNR of the ADC701/SHC702 itself. The SNR has been
measured separately by applying a highly filtered sinewave
to the input, resulting in typical SNR performance of –93dB.
However, the filters employed to achieve this low-noise test
stimulus are found to cause reactive loading of the signal
source which results in increased distortion. Therefore it is
best to separate the tests for SNR from those for THD and
IMD, unless a suitably pure and low-noise signal can be
generated.
Figures 5 and 6 show block diagrams of FFT test setups for
the ADC701 and SHC702, summarizing the placement of
the major components discussed above. The Typical Dy-
namic Performance section shows typical results obtained
from testing the ADC701/SHC702 at a 500kHz conversion
rate, using 16K samples for the FFT analysis.
Start Conversion
N
Start Conversion
N + 1
ADC701
Convert Command
(CC)
50ns min
50ns min
CC to Hold delay 18ns typ
Hold Mode
1.45µs typ
Hold Command
to SHC702
Sample Mode
Low Byte,(4)
Data N – 1
Low Byte,(4)
Data N
High Byte,(3)
Data N
Data Outputs for
Pin 13 = Low
Data Outputs for
Pin 13 = High
Low Byte,(4)
Data N
High Byte,(3)
Data N – 1
High Byte,(3)
Data N
(2)
(1)
(1)
110ns
typ
Data Strobe Output
1.55µs typ
NOTES: (1) Setup Time 28ns min, 37ns typ. (2) Hold Time 30ns min, 73ns typ. (3) High Byte refers to ADC bits 1 - 8, the most significant 8 bits.
Also, the Clip Detect signal on pin 9 is valid simultaneously with High Byte. (4) Low Byte refers to ADC bits 9 - 16, the least significant bits.
FIGURE 5. FFT Test Configuration for Single-Tone Testing.
®
14
ADC701/SHC702
HISTOGRAM TESTING
verter. In practice 10 to 20 million samples will demonstrate
good results for a 16-bit system and expose any serious
flaws in the DL performance. If the memory incrementing
hardware can keep pace with the ADC701, then 20 million
samples can be accumulated in well under one minute. The
last figure on page six shows the results of a 19.6 million
point histogram taken at an input frequency of 1kHz.
The FFT provides an excellent measure of harmonic and
intermodulation distortion. Low-order spurious products are
primarily caused by integral nonlinearity of the SHC and
ADC. The influence of differential linearity errors is harder
to distinguish in a spectral plot—it may show up as high-
order harmonics or as very minor variations in the overall
appearance of the noise floor.
A more direct method of examining the differential linearity
(DL) performance is by using the popular histogram test
method (5). Application of the histogram test to the ADC701/
SHC702 is relatively straightforward, though once again
extra precision is required for a 16-bit system compared to
8- or 12-bit systems. Basically, this means that a very large
number of samples are required to build an accurate statis-
tical picture of each code width. If a histogram is taken using
only one million points, then the average number of samples
per code is less than fifteen. This is inadequate for good
statistical confidence, and the resulting DL plot will look
considerably worse than the actual performance of the con-
NOTES:
1. Available from Bergquist, 5300 Edina Industrial Blvd., Minneapolis, MN 55435
(612) 835-2322.
2. Brigham, E. Oran, The Fast Fourier Transform, Englewood Cliffs, N.J.: Prentice-
Hall, 1974.
3. Harris, Fredric J., “On the Use of Windows for Harmonic Analysis with the Discrete
Fourier Transform”, Proceedings of the IEEE, Vol. 66, No. 1, January 1978, pp 51-
83.
4. Halbert, Joel M. and Belcher, R. Allan, “Selection of Test Signals for DSP-Based
Testing of Digital Audio Systems”, Journal of the Audio Engineering Society, Vol.
34, No. 7/8, July/August, 1986, pp 546-555.
5. “Dynamic Tests for A/D Converter Performance”, Application Bulletin AB-133,
Burr-Brown Corporation, Tucson, AZ, 1985.
+2.8V
+0.2V
HP3325A
Frequency
Synthesizer
Convert
Phase-Locked
Command
Analog
Input
ADC701 &
TTL
Brüel & Kjær
Type 1051
Synthesizer
Low-Pass
Filter
SHC702
Latches
Under Test
74HC574
600Ω
– or –
Crystal
Filter
HP330
Series 9000
Computer
High-Speed
SRAM
64KB x 16
FIGURE 6. FFT Test Configuration for Two-Tone (Intermodulation) Testing.
®
15
ADC701/SHC702
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