BS616LV2019DIP70 [BSI]

Very Low Power/Voltage CMOS SRAM 128K X 16 bit; 非常低的功率/电压CMOS SRAM 128K ×16位
BS616LV2019DIP70
型号: BS616LV2019DIP70
厂家: BRILLIANCE SEMICONDUCTOR    BRILLIANCE SEMICONDUCTOR
描述:

Very Low Power/Voltage CMOS SRAM 128K X 16 bit
非常低的功率/电压CMOS SRAM 128K ×16位

静态存储器
文件: 总10页 (文件大小:283K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Very Low Power/Voltage CMOS SRAM  
128K X 16 bit  
BSI  
BS616LV2019  
„ FEATURES  
• Easy expansion with CE and OE options  
• Vcc operation voltage range : 2.7V ~ 3.6V  
• Very low power consumption :  
• I/O Configuration x8/x16 selectable by LB and UB pin  
Vcc = 3.0V C-grade: 23mA (@55ns) operating current  
I -grade: 25mA (@55ns) operating current  
C-grade: 15mA (@70ns) operating current  
I -grade: 16mA (@70ns) operating current  
0.3uA(Typ.) CMOS standbycurrent  
„ DESCRIPTION  
The BS616LV2019 is a high performance , very low power CMOS Static  
Random Access Memory organized as 131,072 words by 16 bits and  
operates from a range of 2.7V to 3.6V supply voltage.  
Advanced CMOS technology and circuit techniques provide both high  
speed and low power features with a typical CMOS standby current of  
0.3uA at 3.0V/25oC and maximum access time of 55ns at 2.7V/85oC.  
Easy memory expansion is provided by active LOW chip enable (CE),  
active LOW output enable(OE) and three-state output drivers.  
The BS616LV2019 has an automatic power down feature, reducing the  
power consumption significantly when chip is deselected.  
• High speed access time :  
-55  
-70  
55ns  
70ns  
• Automatic power down when chip is deselected  
• Three state outputs and TTL compatible  
• Fully static operation  
• Data retention supply voltage as low as 1.5V  
The BS616LV2019 is available in DICE form , JEDEC standard 48-pin  
TSOP Type I package and 48-ball BGA package.  
„ PRODUCT FAMILY  
POWER DISSIPATION  
SPEED  
( ns )  
STANDBY  
Operating  
PRODUCT  
FAMILY  
OPERATING  
TEMPERATURE  
Vcc  
RANGE  
( ICCSB1, Max )  
( ICC, Max )  
PKG TYPE  
55ns: 2.7~3.6V  
70ns: 2.7~3.6V  
Vcc=3.0V  
Vcc=3.0V  
70ns  
55ns  
BS616LV2019DC  
BS616LV2019TC  
BS616LV2019AC  
BS616LV2019DI  
BS616LV2019TI  
BS616LV2019AI  
DICE  
+0 O C to +70O  
-40 O C to +85O  
C
C
2.7V ~3.6V  
2.7V ~ 3.6V  
55/70  
55/70  
15mA  
16mA  
3.0uA  
23mA  
TSOP1-48  
BGA-48-0608  
DICE  
TSOP1-48  
BGA-48-0608  
25mA  
5.0uA  
„ PIN CONFIGURATIONS  
„ BLOCK DIAGRAM  
A15  
1
48  
47  
46  
A16  
NC  
A14  
A13  
A12  
A11  
A10  
A9  
VSS  
IO15  
IO7  
A8  
A13  
IO14  
IO6  
A15  
Address  
A8  
IO13  
IO5  
20  
A16  
A14  
1024  
NC  
NC  
/WE  
CE2  
NC  
/UB  
/LB  
NC  
NC  
A7  
9
Input  
10  
IO12  
IO4  
Row  
Memory Array  
1024 x 2048  
A12  
A7  
37  
VCC  
IO11  
IO3  
BS616LV2019TC  
BS616LV2019TI  
Buffer  
13  
Decoder  
IO10  
IO2  
A6  
A5  
A4  
16  
17  
IO9  
IO1  
A6  
IO8  
2048  
A5  
IO0  
A4  
/OE  
VSS  
Data  
Input  
Buffer  
A3  
27  
25  
16  
16  
16  
Column I/O  
A2  
/CE  
A0  
DQ0  
A1  
24  
.
.
.
.
.
.
.
.
Write Driver  
Sense Amp  
1
2
3
4
5
6
128  
Data  
Output  
16  
A
B
C
D
E
F
LB  
D8  
OE  
UB  
A0  
A3  
A1  
A4  
A2  
N.C.  
D0  
Buffer  
Column Decoder  
DQ15  
CE  
D1  
D3  
14  
CE2,CE  
WE  
D9  
D10  
D11  
D12  
D13  
A5  
A6  
D2  
Control  
Address Input Buffer  
OE  
N.C.  
VSS  
VCC  
A7  
VCC  
VSS  
UB  
LB  
N.C.  
A14  
A12  
A9  
A16  
A15  
A13  
A10  
D4  
D5  
A11 A9 A3 A2 A1  
A0 A10  
D14  
D15  
N.C.  
D6  
D7  
Vcc  
Gnd  
WE  
A11  
G
H
N.C.  
A8  
N.C.  
48-ball BGA top view  
Brilliance Semiconductor, Inc. reserves the right to modify document contents without notice.  
Revision 1.2  
R0201-BS616LV2019  
1
May  
2004  
BS616LV2019  
BSI  
„ PIN DESCRIPTIONS  
Name  
Function  
A0-A16 Address Input  
These 17 address inputs select one of the 131,072 x 16-bit words in the RAM.  
CE is active LOW and CE2 is active HIGH. Both chip enables must be active when  
data read from or write to the device. If either chip enable is not active, the device is  
deselected and is in a standby power mode. The DQ pins will be in the high  
impedance state when the device is deselected. (48B BGA ignore CE2 pin)  
CE Chip Enable 1 Input  
CE2 Chip Enable 2 Input  
WE Write Enable Input  
The write enable input is active LOW and controls read and write operations. With the  
chip selected, when WE is HIGH and OE is LOW, output data will be present on the  
DQ pins; when WE is LOW, the data present on the DQ pins will be written into the  
selected memory location.  
OE Output Enable Input  
The output enable input is active LOW. If the output enable is active while the chip is  
selected and the write enable is inactive, data will be present on the DQ pins and they  
will be enabled. The DQ pins will be in the high impedance state when OE is inactive.  
Lower byte and upper byte data input/output control pins.  
LB and UB Data Byte Control Input  
DQ0 - DQ15 Data Input/Output  
Ports  
These 16 bi-directional ports are used to read data from or write data into the RAM.  
Vcc  
Power Supply  
Ground  
Gnd  
„ TRUTH TABLE  
MODE  
CE  
H
CE2 (1) WE  
OE  
X
LB  
X
UB  
D0~D7  
High Z  
High Z  
High Z  
High Z  
Dout  
D8~D15  
High Z  
High Z  
High Z  
High Z  
Dout  
Vcc CURRENT  
X
L
X
X
X
X
H
X
L
ICCSB , ICCSB1  
Not selected  
(Power Down)  
X
X
X
ICCSB , ICCSB1  
X
L
ICCSB , ICCSB1  
X
H
X
H
X
H
H
X
Output Disabled  
Read  
ICC  
ICC  
ICC  
ICC  
ICC  
ICC  
ICC  
L
H
L
L
L
H
H
H
L
L
L
High Z  
Dout  
Dout  
H
L
High Z  
Din  
L
Din  
Write  
X
H
L
L
X
Din  
H
Din  
X
1. 48B BGA ignore CE2 condition.  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
2
BS616LV2019  
„ OPERATING RANGE  
BSI  
„ ABSOLUTE MAXIMUM RATINGS(1)  
SYMBOL  
PARAMETER  
RATING  
UNITS  
AMBIENT  
TEMPERATURE  
0 O C to +70O  
RANGE  
Vcc  
Terminal Voltage with  
Respect to GND  
-0.5 to  
Vcc+0.5  
-0.5 to  
V
V
TERM  
cc  
V
V
T
T
P
Commercial  
Industrial  
C
2.7V ~ 3.6V  
2.7V ~ 3.6V  
Power Supply  
Vcc+0.5  
-40O C to +85O  
C
Temperature Under Bias  
Storage Temperature  
Power Dissipation  
DC Output Current  
-40 to +85  
-60 to +150  
1.0  
O C  
O C  
W
BIAS  
STG  
T
„ CAPACITANCE (1) (TA = 25oC, f = 1.0 MHz)  
20  
mA  
SYMBOL  
PARAMETER  
CONDITIONS  
MAX. UNIT  
OUT  
I
Input  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM  
RATINGS may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these  
or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
reliability.  
IN  
C
IN  
V
=0V  
6
8
pF  
pF  
Capacitance  
Input/Output  
Capacitance  
CDQ  
VI/O=0V  
1. This parameter is guaranteed and not 100% tested.  
„ DC ELECTRICAL CHARACTERISTICS ( TA = -40 to + 85oC )  
PARAMETER  
TYP.(1) MAX.  
UNITS  
PARAMETER  
TEST CONDITIONS  
MIN.  
NAME  
Guaranteed Input Low  
Voltage(2)  
VIL  
Vcc =3.0V  
Vcc =3.0V  
-0.3  
--  
0.8  
V
Guaranteed Input High  
VIH  
IIL  
2.0  
--  
--  
--  
Vcc+0.3  
1
V
Voltage(2)  
IN  
Input Leakage Current  
Output Leakage Current  
Vcc = Max, V = 0V to Vcc  
uA  
Vcc = Max,CE = VIH or CE2 (4) = VIL or OE = VIH  
,
ILO  
--  
--  
1
uA  
V
I/O = 0V to Vcc  
OL  
VOL  
VOH  
Output Low Voltage  
Output High Voltage  
Vcc = Max, I = 2.0mA  
Vcc =3.0V  
Vcc =3.0V  
--  
--  
--  
0.4  
--  
V
V
OH  
Vcc = Min, I = -1.0mA  
2.4  
(4)  
70ns  
55ns  
16  
25  
IL  
IH  
Operating Power Supply CE = V , CE2 = V  
(6)  
ICC  
3.0 V  
--  
--  
--  
--  
--  
mA  
mA  
uA  
Current  
I
DQ = 0mA, F = Fmax(3)  
(4)  
IH  
IL  
CE=V or CE2 =V  
ICCSB  
Standby Current-TTL  
Vcc =3.0V  
0.5  
5.0  
I
DQ = 0mA  
CEVcc-0.2V or CE2(4)0.2V,  
INVcc-0.2V or VIN0.2V  
(5)  
ICCSB1  
Standby Current-CMOS  
Vcc =3.0V  
0.3  
V
1. Typical characteristics are at TA = 25oC.  
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.  
3. Fmax = 1/tRC 4. 48B BGA ignore CE2 condition.  
5.IccsB1_Max. is 3.0uA at Vcc=3.0V and TA=70oC.  
6. Icc_Max. is 23mA(@55ns) / 15mA(@70ns) at Vcc=3.0V/ 0~70oC.  
.
„ DATA RETENTION CHARACTERISTICS ( TA = -40 to + 85oC )  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
MIN.  
TYP.(1)  
MAX.  
UNITS  
CE Vcc - 0.2V or CE2 0.2V(3)  
VIN Vcc - 0.2V or VIN 0.2V  
,
,
VDR  
Vcc for Data Retention  
1.5  
--  
--  
V
CE Vcc - 0.2V or CE2 0.2V(3)  
VIN Vcc - 0.2V or VIN 0.2V  
(4)  
ICCDR  
Data Retention Current  
--  
0
0.1  
1.0  
uA  
Chip Deselect to Data  
Retention Time  
tCDR  
tR  
--  
--  
--  
--  
ns  
ns  
See Retention Waveform  
(2)  
Operation Recovery Time  
TRC  
1. Vcc = 1.5V, TA = + 25OC  
3. 48B BGA ignore CE2 condition.  
2. tRC = Read Cycle Time  
4. IccDR is 0.7uA at TA=70oC.  
Revision 1.2  
R0201-BS616LV2019  
3
May  
2004  
BS616LV2019  
BSI  
„ LOW VCC DATA RETENTION WAVEFORM ( CE Controlled )  
Data Retention Mode  
V
DR 1.5V  
Vcc  
Vcc  
Vcc  
t
R
t
CDR  
CE Vcc - 0.2V  
VIH  
VIH  
CE  
„ KEY TO SWITCHING WAVEFORMS  
„AC TEST CONDITIONS  
(Test Load and Input/Output Reference)  
WAVEFORM  
INPUTS  
OUTPUTS  
Input Pulse Levels  
Vcc / 0V  
MUST BE  
STEADY  
MUST BE  
STEADY  
Input Rise and Fall Times  
1V/ns  
MAY CHANGE  
FROM H TO L  
WILL BE  
CHANGE  
FROM H TO L  
Input and Output  
0.5Vcc  
Timing Reference Level  
MAY CHANGE  
FROM L TO H  
WILL BE  
CHANGE  
FROM L TO H  
Output Load  
CL = 100pF+1TTL  
CL = 30pF+1TTL  
,
DON T CARE:  
CHANGE :  
STATE  
UNKNOWN  
ANY CHANGE  
PERMITTED  
DOES NOT  
APPLY  
CENTER  
LINE IS HIGH  
IMPEDANCE  
”OFF ”STATE  
„ AC ELECTRICAL CHARACTERISTICS ( TA = -40 to + 85oC )  
READ CYCLE (48B BGA ignore CE2 condition)  
JEDEC  
PARAMETER  
CYCLE TIME : 55ns  
CYCLE TIME : 70ns  
PARAMETER  
(Vcc = 2.7~3.6V)  
(Vcc = 2.7~3.6V)  
DESCRIPTION  
Read Cycle Time  
UNIT  
NAME  
MIN. TYP. MAX.  
MIN. TYP. MAX.  
NAME  
t
t
55  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
55  
55  
30  
30  
--  
70  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
70  
70  
35  
35  
--  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
AVAX  
RC  
t
t
Address Access Time  
AVQV  
AA  
t
t
Chip Select Access Time  
(CE,CE2)  
(LB,UB)  
--  
--  
ELQV  
ACS1 , 2  
(1)  
t
t
Data Byte Control Access Time  
Output Enable to Output Valid  
Chip Select to Output Low Z  
Data Byte Control to Output Low Z  
Output Enable to Output in Low Z  
Chip Deselect to Output in High Z  
Data Byte Control to Output High Z  
Output Disable to Output in High Z  
--  
--  
BA  
BA  
t
t
--  
--  
GLQV  
OE  
t
t
10  
10  
5
10  
10  
5
(CE,CE2)  
(LB,UB)  
E1LQX  
CLZ  
t
t
--  
--  
BE  
BE  
t
t
--  
--  
GLQX  
OLZ  
t
t
--  
30  
30  
25  
--  
35  
35  
30  
(CE,CE2)  
(LB,UB)  
EHQZ  
CHZ  
t
t
--  
--  
BDO  
BDO  
t
t
--  
--  
GHQZ  
OHZ  
t
t
Data Hold from Address Change  
AXOX  
OH  
10  
--  
--  
10  
--  
--  
ns  
NOTE :  
1. tBA is 30ns/35ns (@speed=55ns/70ns) with address toggle. ; tBA is 55ns/70ns (@speed=55ns/70ns) without address toggle.  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
4
BSI  
BS616LV2019  
„ SWITCHING WAVEFORMS (READ CYCLE)  
READ CYCLE1 (1,2,4)  
t
RC  
ADDRESS  
t
AA  
t
OH  
t
OH  
D OUT  
READ CYCLE2 (1,3,4)  
CE2  
(6)  
t
ACS2  
t
ACS1  
CE  
(5,6)  
(5,6)  
CLZ  
t
CHZ  
t
D OUT  
READ CYCLE3 (1,4)  
ADDRESS  
t
RC  
t
t
AA  
OE  
t
OH  
t
OE  
CE2  
CE  
(6)  
ACS2  
t
OLZ  
(5)  
t
ACS1  
t
OHZ  
(1,5,6)  
CHZ  
(5,6)  
CLZ  
t
t
LB,UB  
t
BE  
t
BDO  
t
BA  
D OUT  
NOTES:  
1. WE is high in read Cycle.  
2. Device is continuously selected when CE = VIL and CE2 = VIH.  
3. Address valid prior to or coincident with CE transition low.  
4. OE = VIL  
.
5. The parameter is guaranteed but not 100% tested.  
6. 48B BGA ignore this parameters related to CE2 .  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
5
BS616LV2019  
BSI  
„ AC ELECTRICAL CHARACTERISTICS ( TA = -40 to + 85oC )  
WRITE CYCLE (48B BGA ignore CE2 condition)  
JEDEC  
PARAMETER  
NAME  
CYCLE TIME : 70ns  
CYCLE TIME : 55ns  
(Vcc = 2.7~3.6V)  
PARAMETER  
(Vcc = 2.7~3.6V)  
DESCRIPTION  
Write Cycle Time  
UNIT  
NAME  
MIN. TYP. MAX.  
MIN. TYP. MAX.  
tAVAX  
tE1LWH  
tAVWL  
tAVWH  
tWLWH  
tWHAX  
tBW  
55  
55  
0
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
70  
70  
0
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tWC  
tCW  
tAS  
Chip Select to End of Write  
Address Setup Time  
(CE,CE2)  
--  
--  
Address Valid to End of Write  
Write Pulse Width  
55  
30  
0
--  
70  
35  
0
--  
tAW  
tWP  
tWR  
--  
--  
Write recovery Time  
--  
--  
(CE,CE2,WE)  
(LB,UB)  
(1)  
Date Byte Control to End of Write  
Write to Output in High Z  
Data to Write Time Overlap  
Data Hold from Write Time  
Output Disable to Output in High Z  
25  
--  
--  
30  
--  
--  
tBW  
tWHZ  
tDW  
tDH  
tWLQZ  
tDVWH  
tWHDX  
tGHQZ  
25  
--  
30  
--  
25  
0
30  
0
--  
--  
--  
25  
--  
30  
tOHZ  
tWHOX  
tOW  
End of Write to Output Active  
5
--  
--  
5
--  
--  
ns  
NOTE :  
1. tBW is 25ns/30ns (@speed=55ns/70ns) with address toggle. ; tBW is 55ns/70ns (@speed=55ns/70ns) without address toggle.  
„ SWITCHING WAVEFORMS (WRITE CYCLE)  
WRITE CYCLE1 (1)  
t
WC  
ADDRESS  
OE  
(3)  
WR  
t
(5,12)  
(5)  
CE2  
CE  
(11)  
CW  
t
t
BW  
(5)  
LB,UB  
t
AW  
(3)  
t
WP  
(2)  
t
AS  
WE  
(4,10)  
t
OHZ  
D OUT  
t
DH  
t
DW  
D IN  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
6
BS616LV2019  
BSI  
(1,6)  
WRITE CYCLE2  
t
WC  
ADDRESS  
CE2  
(5,12)  
(5)  
(11)  
CW  
t
CE  
t
BW  
(5)  
LB,UB  
t
t
WR  
t
AW  
(3)  
t
WP  
(2)  
WE  
t
AS  
(4,10)  
WHZ  
OW  
(7)  
(8)  
t
D OUT  
t
DW  
(8,9)  
t
DH  
D IN  
NOTES:  
1. WE must be high during address transitions.  
2. The internal write time of the memory is defined by the overlap of CE2, CE and WE low. All signals  
must be active to initiate a write and any one signal can terminate a write by going inactive.  
The data input setup and hold timing should be referenced to the second transition edge of  
the signal that terminates the write.  
3. TWR is measured from the earlier of CE2 going low, or CE or WE going high at the end of write cycle.  
4. During this period, DQ pins are in the output state so that the input signals of opposite phase  
to the outputs must not be applied.  
5. If the CE2 high transition or CE low transition occurs simultaneously with the WE low transitions or after the WE  
transition, output remain in a high impedance state.  
6. OE is continuously low (OE = VIL ).  
7. DOUT is the same phase of write data of this write cycle.  
8. DOUT is the read data of next address.  
9. If CE2 is high or CE is low during this period, DQ pins are in the output state. Then the data input signals of  
opposite phase to the outputs must not be applied to them.  
10. The parameter is guaranteed but not 100% tested.  
11. TCW is measured from the later of CE2 going high or CE going low to the end of write.  
12. 48B BGA ignore this parameters related to CE2 .  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
7
BS616LV2019  
BSI  
„ ORDERING INFORMATION  
BS616LV2019 X X Z Y Y  
SPEED  
55: 55ns  
70: 70ns  
PKG MATERIAL  
-: Normal  
G: Green  
P: Pb free  
GRADE  
C: +0oC ~ +70oC  
I: -40oC ~ +85oC  
PACKAGE  
T: TSOP1-48  
A: BGA-48-0608  
D: DICE  
Note:  
BSI (Brilliance Semiconductor Inc.) assumes no responsibility for the application or use of any product or circuit described herein. BSI does not authorize its products  
for use as critical components in any application in which the failure of the BSI product may be expected to result in significant injury or death, including life-support  
systems and critical medical instruments.  
„ PACKAGE DIMENSIONS  
NOTES:  
1: CONTROLLING DIMENSIONS ARE IN MILLIMETERS.  
2: PIN#1 DOT MARKING BY LASER OR PAD PRINT.  
3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS.  
BALL PITCH e = 0.75  
D
E
N
D1  
E1  
8.0  
6.0  
48  
5.25  
3.75  
D1  
VIEW A  
48 mini-BGA (6 x 8)  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
8
BS616LV2019  
BSI  
„ PACKAGE DIMENSIONS  
UNIT  
SYMBOL  
HD  
INCH  
MM  
A
0.0433±0.004  
1.10±0.10  
0.10±0.05  
1.00±0.05  
0.22±0.05  
0.20±0.03  
0.10 ~ 0.21  
0.10 ~ 0.16  
16.40±0.10  
11.80±0.10  
0.50±0.10  
18.00±0.20  
0.60±0.15  
0.80±0.10  
0.1 Max.  
A1 0.004±0.002  
A2 0.039±0.002  
1
48  
b
0.009±0.002  
b1 0.008±0.001  
0.004 ~ 0.008  
c1 0.004 ~ 0.006  
c
D
E
e
0.645±0.004  
0.472±0.004  
0.020±0.004  
HD 0.708±0.008  
0.0236±0.006  
L1 0.0315±0.004  
L
24  
25  
12°(2x)  
Seating Plane  
y
y
θ
0.004 Max.  
"A"  
0°~ 8°  
0°~ 8°  
D
GAUGE PLANE  
A
A
24  
25  
SEATING PLANE  
12°(2x)  
L
b
L1  
WITH PLATING  
"A" DETAIL VIEW  
c
c1  
BASE METAL  
b1  
SECTION A-A  
48  
1
TSOP1-48PIN  
Revision 1.2  
May 2004  
R0201-BS616LV2019  
9
BS616LV2019  
BSI  
REVISION HISTORY  
Revision Description  
Date  
Note  
1.1  
Initial release  
Jan., 05, 2004  
1.2  
Change Vcc_min  
from 2.4V to 2.7V  
May, 03, 2004  
Revision 1.2  
R0201-BS616LV2019  
10  
May  
2004  

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