SPT7824ACN [CADEKA]

10-BIT, 40 MSPS, TTL OUTPUT A/D CONVERTER; 10位, 40 MSPS , TTL输出A / D转换器
SPT7824ACN
型号: SPT7824ACN
厂家: CADEKA MICROCIRCUITS LLC.    CADEKA MICROCIRCUITS LLC.
描述:

10-BIT, 40 MSPS, TTL OUTPUT A/D CONVERTER
10位, 40 MSPS , TTL输出A / D转换器

转换器 光电二极管 输出元件
文件: 总11页 (文件大小:198K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SPT7824  
10-BIT, 40 MSPS, TTL OUTPUT A/D CONVERTER  
APPLICATIONS  
FEATURES  
• Medical Imaging  
Monolithic 40 MSPS Converter  
• On-Chip Track/Hold  
• Professional Video  
• Radar Receivers  
• Instrumentation  
• Electronic Warfare  
• Digital Communications  
• Bipolar ±2.0 V Analog Input  
• 57 dB SNR @ 3.58 MHz Input  
• Low Power (1.0 W Typical)  
5 pF Input Capacitance  
• TTL Outputs  
GENERAL DESCRIPTION  
The SPT7824 A/D converter is a 10-bit monolithic converter  
capable of word rates a minimum of 40 MSPS. On board  
track/hold function assures excellent dynamic performance  
without the need for external components. Drive require-  
ment problems are minimized with an input capacitance of  
only 5 pF.  
indicate overflow conditions. Output data format is straight  
binary. Power dissipation is very low at only 1.0 watt with  
power supply voltages of +5.0 and -5.2 volts. The SPT7824  
also provides a wide input voltage swing of ±2.0 volts.  
The SPT7824 is available in 28-lead ceramic sidebrazed DIP,  
PDIP andSOIC packages over the commercial,industrialand  
military temperature ranges. Consult the factory for availabil-  
ity of die and /833 versions.  
Inputs and outputs are TTL compatible to interface with TTL  
logic systems. An overrange output signal is provided to  
BLOCK DIAGRAM  
Analog  
Coarse  
Input  
4
A/D  
Analog  
Prescaler  
T/H Amplifier  
Bank  
Digital  
Output  
10  
Successive Interpolation  
Stage i  
Successive Interpolation  
Stage i+1  
Successive Interpolation  
Stage N  
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C  
Supply Voltages  
Output  
Digital Outputs .......................................... +30 to -30 mA  
V
CC  
V
EE  
...........................................................................+6 V  
........................................................................... -6 V  
Temperature  
Input Voltages  
Analog Input............................................... V V V  
Operating Temperature ............................ -55 to +125 °C  
Junction Temperature .............................................. +175 °C  
Lead Temperature, (soldering 10 seconds) ........ +300 °C  
Storage Temperature................................ -65 to +150 °C  
1
FB IN FT  
, V ..............................................................+3.0 V, -3.0 V  
V
FT FB  
Reference Ladder Current .....................................12 mA  
CLK Input .................................................................. V  
CC  
Note: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal  
applied conditions in typical applications.  
ELECTRICAL SPECIFICATIONS  
T =T  
A
- T  
, V =+5.0 V, V =-5.2 V, DV =+5.0 V, V =±2.0 V, V =-2.0 V, V =+2.0 V, f  
=40 MHz, 50% clock duty cycle, unless otherwise  
CLK  
MIN  
MAX CC  
EE  
CC  
IN  
SB  
ST  
specified.  
TEST  
CONDITIONS  
TEST  
LEVEL  
SPT7824A  
TYP  
SPT7824B  
TYP MAX UNITS  
PARAMETERS  
MIN  
MAX  
MIN  
Resolution  
10  
10  
Bits  
±
DC Accuracy (+25 °C)  
Integral Nonlinearity  
Differential Nonlinearity  
No Missing Codes  
Full Scale  
100 kHz Sample Rate  
V
V
±1.0  
±0.5  
±1.5  
±0.75  
LSB  
LSB  
VI  
Guaranteed  
Guaranteed  
Analog Input  
f
=1 MHz  
=0 V  
CLK  
Input Voltage Range  
Input Bias Current  
Input Bias Current  
Input Resistance  
Input Resistance  
Input Capacitance  
Input Bandwidth  
+FS Error  
V
VI  
IV  
VI  
IV  
V
±2.0  
30  
±2.0  
V
V
60  
75  
30  
60 µA  
75 µA  
kΩ  
IN  
T =-55 to +125 °C  
A
100  
75  
300  
300  
5
100  
75  
300  
300  
5
T =-55 to +125 °C  
kΩ  
pF  
A
3 dB Small Signal  
V
V
V
120  
±2.0  
±2.0  
120  
±2.0  
±2.0  
MHz  
LSB  
LSB  
-FS Error  
Reference Input  
f
=1 MHz  
CLK  
Reference Ladder Resistance  
Reference Ladder Tempco  
VI  
V
500  
40  
800  
0.8  
500  
800  
0.8  
/°C  
Timing Characteristics  
Maximum Conversion Rate  
Overvoltage Recovery Time  
Pipeline Delay (Latency)  
Output Delay  
VI  
V
IV  
V
V
V
40  
14  
MHz  
ns  
20  
20  
1
18  
1
Clock Cycle  
T =+25 °C  
14  
1
5
18 ns  
ns  
A
Aperture Delay Time  
Aperture Jitter Time  
Acquisition Time  
T =+25 °C  
1
5
12  
A
T =+25 °C  
ps-RMS  
ns  
A
T =+25 °C  
A
V
12  
Dynamic Performance  
Effective Number of Bits  
f
f
f
=1 MHz  
=3.58 MHz  
=10.0 MHz  
8.7  
8.7  
7.3  
8.2  
8.2  
6.9  
Bits  
Bits  
Bits  
IN  
IN  
IN  
Typical thermal impedances (unsoldered, in free air): 28L sidebrazed DIP: θ = 50 °C/W, 28L plastic DIP: θ = 50°C/W,  
ja  
ja  
28L SOIC: θ = 100 °C/W.  
ja  
SPT7824  
2
3/11/97  
ELECTRICAL SPECIFICATIONS  
T =T -T  
, V =+5.0 V, V =-5.2 V, DV =+5.0 V, V =±2.0 V, V =-2.0 V, V =+2.0 V, f  
=40 MHz, 50% clock duty cycle unless otherwise specified.  
CLK  
A
MIN MAX CC  
EE  
CC  
IN  
SB  
ST  
TEST  
CONDITIONS  
TEST  
LEVEL  
SPT7824A  
SPT7824B  
TYP  
PARAMETERS  
MIN  
TYP  
MAX  
MIN  
MAX UNITS  
Dynamic Performance  
Signal-To-Noise Ratio  
(without Harmonics)  
f
f
f
=1 MHz  
T =+25 °C  
I
55  
53  
49  
55  
53  
49  
48  
45  
41  
57  
55  
51  
57  
55  
51  
50  
47  
43  
52  
50  
46  
52  
50  
46  
46  
43  
39  
54  
52  
48  
54  
52  
48  
48  
45  
41  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
IN  
IN  
IN  
A
T =0 to +70, -25 to +85 °C  
IV  
IV  
I
IV  
IV  
I
A
T =-55 to +125 °C*  
A
=3.58 MHz  
=10.0 MHz  
T =+25 °C  
A
T =0 to 70, -25 to +85 °C  
A
T =-55 to +125 °C*  
A
T =+25 °C  
A
T =0 to 70, -25 to +85 °C  
IV  
IV  
A
T =-55 to +125 °C*  
A
Harmonic Distortion  
f
f
f
=1 MHz  
T =+25 °C  
I
54  
51  
50  
54  
51  
50  
46  
45  
44  
56  
53  
52  
56  
53  
52  
48  
47  
46  
52  
49  
48  
52  
49  
48  
43  
41  
40  
54  
51  
50  
54  
51  
50  
45  
44  
42  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
IN  
IN  
IN  
A
T =0 to 70, -25 to +85 °C  
IV  
IV  
I
IV  
IV  
I
A
T =-55 to +125 °C*  
A
=3.58 MHz  
=10.0 MHz  
T =+25 °C  
A
T =0 to 70, -25 to +85 °C  
A
T =-55 to +125 °C*  
A
T =+25 °C  
A
T =0 to 70, -25 to +85 °C  
IV  
IV  
A
T =-55 to +125 °C*  
A
Signal-to-Noise and Distortion  
f
f
f
=1 MHz  
T =+25 °C  
I
52  
49  
48  
52  
49  
48  
44  
43  
40  
54  
54  
46  
49  
46  
45  
49  
46  
45  
41  
40  
37  
51  
51  
43  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
Degree  
%
IN  
IN  
IN  
A
T =0 to 70, -25 to +85 °C  
IV  
IV  
I
IV  
IV  
I
IV  
IV  
V
A
T =-55 to +125 °C*  
A
=3.58 MHz  
=10.0 MHz  
T =+25 °C  
A
T =0 to 70, -25 to +85 °C  
A
T =-55 to +125 °C*  
A
T =+25 °C  
A
T =0 to 70, -25 to +85 °C  
A
T =-55 to +125 °C*  
A
Spurious Free Dynamic Range T =+25 °C, f =1 MHz  
Differential Phase  
Differential Gain  
67  
0.2  
0.5  
67  
0.2  
0.7  
A
IN  
T =+25 °C, f = 3.58 & 4.35 MHz  
V
V
A
IN  
T =+25 °C, f = 3.58 & 4.35 MHz  
A
IN  
Digital Inputs  
f
=1 MHz  
CLK  
Logic 1 Voltage  
Logic 0 Voltage  
Maximum Input Current Low T =+25 °C  
Maximum Input Current High T =+25 °C  
Pulse Width Low (CLK)  
Pulse Width High (CLK)  
VI  
VI  
I
I
IV  
IV  
2.4  
4.5  
0.8  
+20  
+20  
2.4  
4.5  
0.8  
+20 µA  
+20 µA  
ns  
V
V
0
0
10  
10  
+5  
+5  
0
0
10  
10  
+5  
+5  
A
A
300  
300 ns  
Digital Outputs  
Logic "1" Voltage  
f
=1 MHz  
CLK  
VI  
VI  
2.4  
2.4  
V
V
Logic "0" Voltage  
0.6  
0.6  
Power Supply Requirements  
VoltagesV  
IV  
IV  
IV  
I
I
I
4.75  
4.75  
-4.95  
5.25  
5.25  
-5.45 -4.95  
145  
55  
57  
4.75  
4.75  
5.25  
5.25  
-5.45  
145 mA  
55 mA  
57 mA  
V
V
V
CC  
DV  
-V  
5.0  
-5.2  
118  
40  
5.0  
-5.2  
118  
40  
CC  
EE  
Currents I  
T =+25 °C  
CC  
A
DI  
T =+25 °C  
CC  
A
-I  
T =+25 °C  
A
40  
40  
EE  
Power Dissipation  
Power Supply Rejection  
T =+25 °C  
+5 V ±0.25 V, -5.2 V ±0.25 V  
I
V
1.0  
1.0  
1.3  
1.0  
1.0  
1.3  
W
LSB  
A
*Temperature tested /883 only.  
SPT7824  
3
3/11/97  
TEST LEVEL CODES  
TEST LEVEL  
TEST PROCEDURE  
All electrical characteristics are subject to the  
following conditions:  
I
100% production tested at the specified temperature.  
II  
100% production tested at T = +25 °C, and sample  
A
tested at the specified temperatures.  
All parameters having min/max specifications  
are guaranteed. The Test Level column indi-  
cates the specific device testing actually per-  
formed during production and Quality Assur-  
ance inspection. Any blank section in the data  
column indicates that the specification is not  
tested at the specified condition.  
III  
QA sample tested only at the specified temperatures.  
IV  
Parameter is guaranteed (but not tested) by design  
and characterization data.  
V
Parameter is a typical value for information purposes  
only.  
VI  
100% production tested at T = +25 °C. Parameter is  
A
guaranteed over specified temperature range.  
Figure 1A - Timing Diagram  
N+1  
N
N+2  
t
t
pwH  
pwL  
CLK  
t
d
Output  
N-2  
N-1  
Data Valid  
N
Data Valid  
N+1  
Data  
Figure 1B - Single Event Clock  
CLK  
t
d
Output  
Data  
Data Valid  
Table I - Timing Parameters  
PARAMETERS  
DESCRIPTION  
MIN  
-
TYP  
MAX  
18  
UNITS  
ns  
t
t
CLK to Data Valid Prop Delay  
CLK High Pulse Width  
14  
-
d
10  
300  
ns  
pwH  
t
CLK Low Pulse Width  
10  
-
-
ns  
pwL  
SPT7824  
4
3/11/97  
TYPICAL PERFORMANCE CHARACTERISTICS  
THD vs Input Frequency  
SNR vs Input Frequency  
80  
70  
60  
50  
40  
80  
70  
f
= 40 MSPS  
s
fs = 40 MSPS  
60  
50  
40  
30  
20  
30  
20  
0
0
1
2
10  
1
2
10  
10  
10  
10  
10  
Input Frequency (MHz)  
Input Frequency (MHz)  
SNR, THD, SINAD vs Sample Rate  
SINAD vs Input Frequency  
80  
70  
80  
70  
fs =40 MSPS  
SNR  
60  
50  
60  
50  
SINAD  
f
= 1 MHz  
IN  
THD  
40  
40  
30  
20  
30  
20  
0
1
2
10  
10  
10  
0
1
2
10  
10  
10  
Input Frequency (MHz)  
Sample Rate (MSPS)  
Spectral Response  
SNR, THD, SINAD vs Temperature  
65  
0
f
f
= 40 MSPS  
= 1 MHz  
S
IN  
60  
55  
-30  
-60  
-90  
SNR  
THD  
SINAD  
50  
f
f
= 40 MSPS  
= 1 MHz  
S
IN  
45  
40  
-120  
-25  
0
+25  
Temperature (°C)  
+50  
+75  
0
1
2
3
4
5
6
7
8
9
10  
Input Frequency (MHz)  
SPT7824  
5
3/11/97  
AGND and DGND are the two grounds available on the  
SPT7824. These two internal grounds are isolated on the  
device.Theuseofgroundplanesisrecommendedtoachieve  
TYPICAL INTERFACE CIRCUIT  
The SPT7824 requires few external components to achieve  
the stated operation and performance. Figure 2 shows the  
typical interface requirements when using the SPT7824 in  
normal circuit operation. The following section provides a  
description of the pin functions and outlines critical perfor-  
mance criteria to consider for achieving the optimal device  
performance.  
optimumdeviceperformance. DGNDisneededfortheDV  
CC  
returnpath(40mAtypical)andforthereturnpathforalldigital  
output logic interfaces. AGND and DGND should be sepa-  
rated from each other and connected together only at the  
device through a ferrite bead.  
A Schottky or hot carrier diode connected between AGND  
and V  
is required. The use of separate power supplies  
EE  
POWER SUPPLIES AND GROUNDING  
betweenV andDV isnotrecommendedduetopotential  
CC  
CC  
power supply sequencing latch-up conditions. Using the  
recommended interface circuit shown in figure 2 will provide  
optimum device performance for the SPT7824.  
The SPT7824 requires -5.2 V and +5 V analog supply  
voltages. The +5 V supply is common to analog V  
and  
CC  
digital DV . A ferrite bead in series with each supply line is  
CC  
intendedtoreducethetransientnoiseinjectedintotheanalog  
V
CC  
. These beads should be connected as closely as pos-  
sible to the device. The connection between the beads and  
the SPT7824 should not be shared with any other device.  
Each power supply pin should be bypassed as closely as  
possible to the device. Use 0.1 µF for V  
and V , and  
EE  
CC  
0.01 µF for DV  
(chip caps are preferred).  
CC  
Figure 2 - Typical Interface Circuit  
R1  
CLK  
CLK  
(TTL)  
100  
V
4
± 2.5 V Max  
IN  
D10 (Overrange)  
D9 (MSB)  
COARSE  
A/D  
V
(±2 V)  
IN  
2
6
V
D8  
D7  
D6  
D5  
V
FT  
ST  
+2.5 V  
C1  
.01 µF  
+ 5 V  
IC1  
V
IN  
+
OUT  
(REF-03)  
C19  
5
+
ANALOG  
PRESCALER  
1 µF  
4
C2  
R
Trim  
10 kΩ  
V
GND  
.01 µF  
1 µF  
30 kΩ  
2R  
2R  
2R  
2R  
D4  
D3  
C3  
.01 µF  
SUCCESSIVE  
INTERPOLATION  
STAGE # 1  
V
RM  
3
2
- 5.2 V  
D2  
D1  
1
+
-
IC2  
4
10 kΩ  
OP-07  
30 kΩ  
C4  
.01 µF  
.01 µF  
V
V
D0 (LSB)  
8
SB  
FB  
+5 V  
SUCCESSIVE  
INTERPOLATION  
STAGE # N  
7
R
.01 µF  
6
-2.5 V  
C5  
.01 µF  
1 µF  
+
C10  
.01 µF  
C6  
.1 µF  
C8  
C9  
C7  
C11  
.1 µF  
.01 µF  
Notes to prevent latch-up due to power sequencing:  
FB  
1)  
2)  
D1 = Schottky or hot carrier diode, P/N IN5817.  
FB = Ferrite bead, Fair Rite P/N 2743001111  
D1  
10 µF  
10 µF  
to be mounted as close to the device as possible. The ferrite bead to the  
ADC connection should not be shared with any other device.  
+
+
3)  
C1-C11 = Chip cap (recommended) mounted as close to the device's pin  
as possible.  
+5 V  
(Analog)  
4)  
5)  
6)  
7)  
Use of a separate supply for V  
CC  
R1 provides current limiting to 45 mA.  
and DV is not recommended.  
CC  
-5.2 V  
(Analog)  
AGND  
DGND  
C6, C7, C8 and C9 should be ten times larger than C10 and C11.  
C8 = C9 = a 0.1 µF cap in parallel with a 4.7 µF cap.  
SPT7824  
6
3/11/97  
VOLTAGE REFERENCE  
ever, because the device is laser trimmed to optimize perfor-  
mancewith ± 2.5Vreferences, theaccuracyofthedevicewill  
degrade if operated beyond a ± 2% range.  
The SPT7824 requires the use of two voltage references:  
VFT and VFB. VFT is the force for the top of the voltage  
reference ladder (+2.5 V typ), VFB (-2.5 V typ) is the force for  
thebottomofthevoltagereferenceladder. Bothvoltagesare  
applied across an internal reference ladder resistance of  
The following errors are defined:  
+FS error = top of ladder offset voltage = (+FS -V +1LSB)  
ST  
-FSerror=bottomofladderoffsetvoltage=(-FS-V -1LSB)  
SB  
800 ohms. The +2.5 V voltage source for reference V must  
FT  
where the +FS (full scale) input voltage is defined as the  
output transition between 1-10 and 1-11 and the -FS input  
voltage is defined as the output transition between 0-00 and  
0-01.  
be current limited to 20 mA maximum if a different driving  
circuit is used in place of the recommended reference circuit  
shown in figures 2 and 3. In addition, there are three  
referenceladdertaps(VST, VRM andVSB). VST isthesensefor  
the top of the reference ladder (+2.0 V), VRM is the midpoint  
of the ladder (0.0 V typ) and VSB is the sense for the bottom  
ofthereferenceladder(-2.0V).ThevoltagesseenatVST and  
VSB are the true full scale input voltages of the device when  
VFT and VFB are driven to the recommended voltages (+2.5 V  
and-2.5Vtypicalrespectively). Thesepointsshouldbeused  
to monitor the actual full scale input voltage of the device and  
should not be driven to the expected ideal values as is  
commonly done with standard flash converters. When not  
being used, a decoupling capacitor of .01 uF (chip carrier  
preferred) connected to AGND from each tap is recommended  
to minimize high frequency noise injection.  
ANALOG INPUT  
VIN is the analog input. The full scale input range will be 80% of  
the reference voltage or ±2 V with VFB=-2.5 V and VFT=+2.5 V.  
The drive requirements for the analog inputs are minimal  
when compared to conventional Flash converters due to the  
SPT7824’s extremely low input capacitance of only 5 pF and  
veryhighinputresistanceof300k.Forexample,foraninput  
signalof±2Vp-pwithaninputfrequencyof10MHz, thepeak  
output current required for the driving circuit is only 628 µA.  
CLOCK INPUT  
Figure 3 - Analog Equivalent Input Circuit  
TheSPT7824isdrivenfromasingle-endedTTLinput(CLK).  
TheCLKpulsewidth(tpwH)mustbekeptbetween10nsand  
300 ns to ensure proper operation of the internal track-and-  
hold amplifier. (See timing diagram.) When operating the  
SPT7824 at sampling rates above 3 MSPS, it is recom-  
mended that the clock input duty cycle be kept at 50% to  
optimize performance. (See figure 4.) The analog input  
signal is latched on the rising edge of the CLK.  
V
CC  
V
V
IN  
FT  
TheclockinputmustbedrivenfromfastTTLlogic(V 4.5V,  
IH  
T
<6 ns). In the event the clock is driven from a high  
RISE  
current source, use a 100 resistor in series to current limit  
to approximately 45 mA.  
V
EE  
Figure 4 - SNR vs Clock Duty Cycle  
An example of a reference driver circuit recommended is  
shown in figure 2. IC1 is REF-03, the +2.5 V reference with a  
tolerance of 0.6% or +/- 0.015 V. The potentiometer R1 is  
10 kand supports a minimum adjustable range of up to  
150 mV. IC2 is recommended to be an OP-07 or equivalent  
device. R2 and R3 must be matched to within 0.1% with good  
59  
57  
55  
53  
TCtrackingtomaintaina0.3LSBmatchingbetweenV and  
FT  
Duty  
Cycle  
t
t
pwH  
pwL  
51  
49  
47  
45  
43  
=
V
FB  
. If 0.1% matching is not met, then potentiometer R4 can  
beusedtoadjusttheV voltagetothedesiredlevel.V and  
FB  
FT  
tpwH  
tpwL  
V
FB  
should be adjusted such that V and V are exactly  
ST SB  
+2.0 V and -2.0 V respectively.  
The analog input range will scale proportionally with respect  
to the reference voltage if a different input range is required.  
The maximum scaling factor for device operation is ± 20% of  
the recommended reference voltages of V and V . How-  
30  
35  
40  
45  
50  
55  
60  
65  
70  
75  
Duty Cycle of Positive Clock Pulse (%)  
FT  
FB  
SPT7824  
7
3/11/97  
DIGITAL OUTPUTS  
OVERRANGE OUTPUT  
The format of the output data (D0-D9) is straight binary. (See  
table II.) The outputs are latched on the rising edge of CLK  
with a propagation delay of 14 ns (typ). There is a one clock  
cycle latency between CLK and the valid output data. (See  
timing diagram.)  
The OVERRANGE OUTPUT (D10) is an indication that the  
analog input signal has exceeded the positive full scale input  
voltageby1LSB.Whenthisconditionoccurs,D10willswitch  
to logic 1. All other data outputs (D0 to D9) will remain at  
logic 1 as long as D10 remains at logic 1. This feature makes  
it possible to include the SPT7824 into higher resolution  
systems.  
Table II - Output Data Information  
ANALOG INPUT  
OVERRANGE  
D1O  
OUTPUT CODE  
D9-DO  
EVALUATION BOARD  
>+2.0 V + 1/2 LSB  
+2.0 V -1 LSB  
0.0 V  
1
11 1111 1111  
11 1111 111Ø  
ØØ ØØØØ ØØØØ  
OO OOOO OOOØ  
OO OOOO OOOO  
The EB7824 Evaluation Board is available to aid designers in  
demonstrating the full performance of the SPT7824. This  
board includes a reference circuit, clock driver circuit, output  
data latches and an on-board reconstruction of the digital  
data. An application note describing the operation of this  
board as well as information on the testing of the SPT7824 is  
also available. Contact the factory for price and availability.  
O
O
O
O
-2.0 V +1 LSB  
<-2.0 V  
(Ø indicates the flickering bit between logic 0 and 1).  
The rise times and fall times of the digital outputs are not  
symmetrical. The propagation delay of the rise time is typi-  
cally 14 ns and the fall time is typically 6 ns. (See figure 5.)  
The nonsymmetrical rise and fall times create approximately  
8 ns of invalid data.  
Figure 5 - Digital Output Characteristics  
N
N+1  
CLK In  
2.4 V  
Rise Time  
6 nsec  
6 ns  
typ.  
3.5 V  
Invalid  
Data  
Invalid  
Data  
Data Out  
(Actual)  
2.4 V  
(N)  
(N-1)  
(N-2)  
0.8 V  
0.5 V  
tpd1  
(14 ns typ.)  
Invalid  
Data  
Data Out  
(Equivalent)  
Invalid  
Data  
(N-1)  
(N-2)  
(N-1)  
SPT7824  
8
3/11/97  
PACKAGE OUTLINES  
28-Lead Sidebrazed  
INCHES  
MIN  
0.077  
MILLIMETERS  
MIN MAX  
1.96  
SYMBOL  
MAX  
0.093  
28  
1
H
A
B
C
D
E
F
G
H
I
2.36  
0.51  
0.016  
0.095  
0.020  
0.105  
.050 typ  
0.060  
0.235  
1.412  
0.605  
0.012  
0.620  
0.41  
2.41  
2.67  
0.00  
1.27  
I
0.040  
0.215  
1.388  
0.585  
0.009  
0.600  
1.02  
1.52  
5.46  
5.97  
J
35.26  
14.86  
0.23  
35.86  
15.37  
0.30  
G
J
15.24  
15.75  
A
E
F
C
B
D
28-Lead Plastic DIP  
INCHES  
MIN  
MILLIMETERS  
MIN MAX  
SYMBOL  
MAX  
A
B
C
D
E
F
G
H
I
0.200  
0.135  
0.020  
0.100  
0.067  
0.013  
0.180  
0.622  
0.555  
1.460  
0.085  
5.08  
3.43  
K
0.120  
3.05  
0.51  
2.54  
28  
1.70  
0.33  
I
0.170  
4.32  
4.57  
15.80  
14.10  
37.08  
2.16  
1
J
K
J
H
G
A
B
F
C
D
E
SPT7824  
9
3/11/97  
PACKAGE OUTLINES  
28-Lead SOIC  
INCHES  
MIN  
0.696  
MILLIMETERS  
MIN MAX  
17.68  
SYMBOL  
MAX  
0.712  
A
B
C
D
E
F
G
H
I
18.08  
0.30  
1.27  
0.48  
0.30  
2.54  
1.27  
10.64  
7.59  
0.004  
0.012  
.050 typ  
0.019  
0.10  
0.00  
0.36  
0.23  
2.03  
0.41  
10.01  
7.39  
28  
0.014  
0.009  
0.080  
0.016  
0.394  
0.291  
0.012  
I
H
0.100  
0.050  
0.419  
1
0.299  
A
F
B
C
D
G
E
SPT7824  
10  
3/11/97  
PIN ASSIGNMENTS  
PIN FUNCTIONS  
Name  
DGND  
D0-D9  
D10  
Function  
DGND  
D0  
1
28  
DV  
CC  
Digital Ground  
V
2
3
27  
26  
EE  
TTL Outputs (D0=LSB)  
TTL Output Overrange  
Clock  
D1  
AGND  
D2  
V
4
5
25  
24  
CC  
CLK  
D3  
V
FB  
V
-5.2 V Supply (Analog)  
Analog Ground  
D4  
V
EE  
6
7
23  
22  
SB  
D5  
V
AGND  
DIP/PDIP/SOIC  
RM  
D6  
V
8
9
21  
20  
V
V
+5.0 V Supply (Analog)  
Analog Input  
CC  
IN  
IN  
D7  
V
ST  
D8  
10  
11  
19  
18  
V
DV  
Digital +5.0 V Supply  
CC  
FT  
D9  
V
V
V
V
V
V
Middle of Voltage Reference Ladder  
Force for Top of Reference Ladder  
Sense for Top of Reference Ladder  
Force for Bottom of Reference Ladder  
Sense for Bottom of Reference Ladder  
RM  
CC  
D10  
DGND  
12  
13  
14  
17  
16  
15  
AGND  
FT  
ST  
FB  
SB  
V
EE  
DV  
CC  
CLK  
ORDERING INFORMATION  
PART NUMBER  
TEMPERATURE RANGE  
PACKAGE TYPE  
SPT7824AIJ  
SPT7824BIJ  
SPT7824ACN  
SPT7824BCN  
SPT7824ACS  
SPT7824BCS  
SPT7824AMJ  
SPT7824BMJ  
-25 to +85 °C  
-25 to +85 °C  
0 to +70 °C  
28L Sidebrazed DIP  
28L Sidebrazed DIP  
28L Plastic DIP  
28L Plastic DIP  
28L SOIC  
0 to +70 °C  
0 to +70 °C  
0 to +70 °C  
28L SOIC  
-55 to +125 °C  
-55 to +125 °C  
28L Sidebrazed DIP  
28L Sidebrazed DIP  
SPT7824  
11  
3/11/97  

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