CS5317-KP [CIRRUS]

16-Bit, 20 kHz Oversampling A/D Converter; 16位, 20kHz的过采样A / D转换器
CS5317-KP
型号: CS5317-KP
厂家: CIRRUS LOGIC    CIRRUS LOGIC
描述:

16-Bit, 20 kHz Oversampling A/D Converter
16位, 20kHz的过采样A / D转换器

转换器
文件: 总32页 (文件大小:355K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CS5317  
16-Bit, 20 kHz Oversampling A/D Converter  
Features  
Description  
The CS5317 is an ideal analog front-end for voiceband  
signal processing applications such as high-perfor-  
mance modems, passive sonar, and voice recognition  
systems. It includes a 16-bit A/D converter with an inter-  
nal track & hold amplifier, a voltage reference, and a  
linear-phase digital filter.  
l Complete Voiceband DSP Front-End  
- 16-Bit A/D Converter  
- Internal Track & Hold Amplifier  
- On-Chip Voltage Reference  
- Linear-Phase Digital Filter  
l On-Chip PLL for Simplified Output Phase  
Locking in Modem Applications  
l 84 dB Dynamic Range  
An on-chip phase-lock loop (PLL) circuit simplifies the  
CS5317’s use in applications where the output word rate  
must be locked to an external sampling signal.  
l 80 dB Total Harmonic Distortion  
l Output Word Rates up to 20 kHz  
l DSP-Compatible Serial Interface  
l Low Power Dissipation: 220 mW  
The CS5317 uses delta-sigma modulation to achieve  
16-bit output word rates up to 20 kHz. The delta-sigma  
technique utilizes oversampling followed by a digital fil-  
tering and decimation process. The combination of  
oversampling and digital filtering greatly eases antialias  
requirements. Thus, the CS5317 offers 84 dB dynamic  
range and 80 dB THD and signal bandwidths up to  
10 kHz at a fraction of the cost of hybrid and discrete  
solutions.  
The CS5317’s advanced CMOS construction provides  
low power consumption of 220 mW and the inherent re-  
liability of monolithic devices.  
ORDERING INFORMATION  
See page 20.  
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Cirrus Logic, Inc.  
Copyright Cirrus Logic, Inc. 1997  
(All Rights Reserved)  
Crystal Semiconductor Products Division  
P.O. Box 17847, Austin, Texas 78760  
(512) 445 7222 FAX: (512) 445 7581  
http://www.crystal.com  
MAR ‘95  
DS27F4  
1
CS5317  
ANALOG CHARACTERISTICS (T = T  
± ±  
; VA+, VD+ = 5V 10%; VA-, VD- = -5V 10%;  
CLKIN = 4.9152 MHz in CLKOR mode; 1kHz Input Sinewave; with 1.2 k, .01 µF antialiasing filter.)  
- T  
A
MIN  
MAX  
Parameter*  
Specified Temperature Range  
Min  
Typ  
Max  
Units  
0 to 70  
°C  
Resolution  
16  
-
-
Bits  
Dynamic Performance  
Dynamic Rnage  
(Note 1)  
(Note2)  
78  
72  
-
84  
80  
84  
-
-
-
dB  
dB  
dB  
Total Harmonic Distortion  
Signal to Intermodulation Distorition  
dc Accuracy  
Differential Nonlinearity  
Positive Full-Scale Error  
Positive Full-Scale Drift  
Bipolar Offset Error  
-
-
-
-
-
-
-
-
-
-
LSB  
mV  
±0.4  
±150  
±500  
±10  
µV/°C  
mV  
Bipolar Offset Drift  
±50  
µV/°C  
Filter Characteristics  
Absolute Group Delay  
Passband Frequency  
Input Characteristics  
(Note 3)  
(Note 4)  
78.125  
-
-
-
-
µs  
5
kHz  
AC Input Impedance  
(1kHz)  
-
80  
-
-
-
kΩ  
Analog Input Full Scale Signal Level  
Power Supplies  
V
±2.75  
Power Dissipation  
(Note5)  
-
220  
300  
mW  
Notes: 1. Measured over the full 0 to 9.6kHz band with a -20dB input and extrapolated to full-scale. Since this  
includes energy in the stopband above 5kHz, additional post-filtering at the CS5317’s output can  
typically achieve 88dB dynamic range by improving rejection above 5kHz. This can be increased to  
90dB by bandlimiting the output to 2.5kHz.  
2. No missing codes is guaranteed by design.  
3. Group delay is constant with respect to input analog frequency; that is, the digital FIR filter has  
linear phase. Group delay is determined by the formula D = 384/CLKIN in CLKOR mode, or  
grp  
192/CLKOUT in any mode.  
4. The digital filter’s frequency response scales with the master clock. Its -3dB point is determined by  
f
= CLKIN/977.3 in CLKOR mode, or CLKOUT/488.65 in any mode.  
-3dB  
5. All outputs unloaded. All inputs CMOS levels.  
* Refer to the Parameter Definitions section after the Pin Description section.  
2
DS27F4  
CS5317  
ANALOG CHARACTERISTICS (continued)  
Parameter  
Min  
Typ  
Max  
Units  
Power Supply Rejection  
VA+  
VA-  
VD+  
VD-  
(Note 6)  
-
-
-
-
60  
45  
60  
55  
-
-
-
-
dB  
dB  
dB  
dB  
Specified Temperature Range  
0 to 70  
°C  
Phase-Lock Loop Characteristics  
VCO Gain Constant, Ko  
(Note 7)  
(Note 8)  
-4  
1.28  
-3  
-10  
-
-30  
5.12  
-12  
Mrad/Vs  
MHz  
VCO Operating Frequency  
Phase Detector Gain Control, Kd  
Phase Detector Prop. Delay  
-8  
50  
µA/rad  
ns  
-
100  
Notes: 6. With 300mV p-p, 1kHz ripple applied to each supply separately.  
7. Over 1.28 MHz to 5.12 MHz VCO output range, where VCO frequency = 2 CLKOUT.  
*
8. Delay from an input edge to the phase detector to a response at the PHDT output pin.  
DIGITAL CHARACTERISTICS (T = T  
- T ; VA+, VD+ = 5V±10%; VA-, VD- = -5V±10%)  
MAX  
A
MIN  
All measurements performed under static conditions.  
Parameter  
Symbol  
Min  
Typ  
Max  
Units  
High-Level Input Voltage  
Low-Level Input Voltage  
High-Level Output Voltage  
V
2.0  
-
-
-
0.8  
-
V
V
IH  
V
-
IL  
(Note 9)  
V
(VD+)-1.0V  
-
V
OH  
Low-Level Output Voltage  
Input Leakage Current  
3-State Leakage Current  
I
= 1.6mA  
V
I
-
-
-
-
-
0.4  
10  
±10  
-
V
OL  
OUT  
-
µA  
µA  
pF  
in  
I
-
OZ  
Digital Output Pin Capacitance  
C
out  
9
Note: 9. I =-100µA. This specification guarantees the ability to drive one TTL load (V =2.4V @ I =-40µA.).  
out  
OH  
out  
RECOMMENDED OPERATING CONDITIONS (DGND, AGND = 0V, see Note 10.)  
Parameter  
Symbol  
Min  
Typ  
Max  
Units  
DC Power Supplies:  
Positive Digital  
VD+  
VD-  
VA+  
VA-  
4.5  
-4.5  
4.5  
5.0  
-5.0  
5.0  
5.5  
-5.5  
5.5  
V
V
V
V
Negative Digital  
Positive Analog  
Negative Analog  
-4.5  
-5.0  
-5.5  
Master Clock Frequency  
f
0.01  
-
5.12  
MHz  
clk  
Note: 10. All voltages with respect to ground.  
Specifications are subject to change without notice.  
DS27F4  
3
CS5317  
SWITCHING CHARACTERISTICS (T = T  
-T  
; C =50 pF; VD+ = 5V±10%; VD- = -5V±10%)  
L
A
MIN MAX  
Parameter  
Symbol  
Min  
Typ  
Max  
Units  
Master Clock Frequency:  
CLKIN  
CLKG1 Mode  
CLKG2 Mode  
CLKOR Mode  
f
f
f
-
-
-
-
-
-
20  
10  
5.12  
kHz  
kHz  
MHz  
clkg1  
clkg2  
clkor  
Output Word Rate:  
Rise Times:  
DOUT  
f
-
-
20  
kHz  
dout  
Any Digital Input  
Any Digital Output  
t
-
-
20  
15  
1000  
20  
ns  
ns  
risein  
t
riseout  
Fall Times:  
Any Digital Input  
Any Digital Output  
t
-
-
20  
15  
1000  
20  
ns  
ns  
fallin  
t
fallout  
CLKIN Duty Cycle  
CLKG1 and CKLG2 Modes  
Pulse Width Low  
Pulse Width High  
Pulse Width Low  
Pulse Width High  
t
200  
200  
45  
-
-
-
-
-
-
-
-
ns  
ns  
ns  
ns  
pwl1  
t
pwh1  
CLKOR Mode  
t
pwl1  
t
45  
pwh1  
RST Pulse Width Low  
t
400  
-
-
ns  
pwr  
Set Up Times:  
RST High to CLKIN High  
CLKIN High to RST High  
t
t
40  
40  
-
-
-
-
ns  
ns  
su1  
su2  
Propagation Delays:  
DOE Falling to Data Valid  
CLKIN Rising to DOUT Falling  
DOE Rising to Hi-Z Output  
CLKOUT Rising to DOUT Falling  
CLKOUT Rising to DOUT Rising  
CLKOUT Rising to Data Valid  
CLKIN Rising to CLKOUT Falling  
CLKIN Rising to CLKOUT Rising  
t
-
-
-
-
-
-
-
-
-
1
-
-
-
-
-
-
150  
-
80  
60  
60  
100  
200  
200  
ns  
CLKOUT  
cycles  
ns  
phl1  
phl2  
plh1  
plh2  
plh3  
plh4  
plh5  
plh6  
(Note 11)  
t
t
t
t
t
t
t
ns  
ns  
ns  
ns  
(Note 12)  
(Note 12)  
Notes: 11. CLKIN only pertains to CLKG1 and CLKG2 modes.  
12. Only valid in CLKOR mode.  
ABSOLUTE MAXIMUM RATINGS (DGND, AGND = 0V, all voltages with repect to groung)  
Parameter  
Symbol  
Min  
Max  
Units  
DC Power Supplies:  
Positive Digital  
VD+  
VD-  
VA+  
VA-  
-0.3  
0.3  
-0.3  
0.3  
(VA+) + 0.3  
-6.0  
V
V
V
V
Negative Digital  
Positive Analog  
Negative Analog  
6.0  
-6.0  
Input Current, Any Pin Except Supplies  
Analog Input Voltage (AIN and VREF pins)  
Digital Input Voltage  
(Note 13)  
I
-
(VA-) - 0.3  
-0.3  
mA  
V
±10  
(VA+) + 0.3  
(VD+) + 0.3  
125  
in  
V
V
INA  
V
IND  
Ambient Operating Temperature  
Storage Temperature  
T
-55  
°C  
°C  
A
T
-65  
150  
stg  
Notes: 13. Transient currents up to 100mA will not cause SCR latch-up.  
WARNING:Operating this device at or beyond these extremes may result in permanent damage to the device.  
Normal operation of the part is not guaranteed at these extremes.  
4
DS27F4  
CS5317  
t
t
riseout  
t
t
risein  
fallin  
fallout  
2.0 V  
0.8 V  
2.4 V  
0.4 V  
Rise and Fall Times  
t
t
pwh1  
pwl1  
CLKIN  
CLKIN Timing  
t
CLKIN  
(Note 14)  
phl2  
t
plh3  
CLKOUT  
DOUT  
t
t
plh1  
plh2  
t
phl1  
15  
14  
1
0
DATA  
t
plh4  
(MSB)  
DOE  
(Note 15)  
Serial Output Timing  
CLKIN  
t
plh6  
t
t
plh5  
plh5  
CLKOUT  
DOUT  
t
su1  
t
t
su2  
su1  
t
t
su2  
pwr  
RST  
(Note 16)  
Reset Timing  
Notes: 14. CLKIN only pertains to CLKG1 and CLKG2 modes.  
15. If DOE is brought high during serial data transfer, CLKOUT, DOUT, and DATA will immediately  
3-state and the rest of the serial data is lost.  
16. RST must be held high except in the clock override (CLKOR) mode where it can be used to align  
the phases of all internal clocks.  
DS27F4  
5
CS5317  
GENERAL DESCRIPTION  
modulator’s 1-bit output conveys information in  
the form of duty cycle. The digital filter then  
processes the 1-bit signal and extracts a high  
resolution output at a much lower rate (that is,  
16-bits at a 20 kHz word rate with a 5 kHz input  
bandwidth).  
The CS5317 functions as a complete data conver-  
sion subsystem for voiceband signal processing.  
The A/D converter, sample/hold, voltage refer-  
ence, and much of the antialiasing filtering are  
performed on-chip. The CS5317’s serial interface  
offers its 16-bit, 2’s complement output in a for-  
An elementary example of a delta-sigma A/D  
converter is a conventional voltage-to-frequency  
converter and counter. The VFC’s 1-bit output  
conveys information in the form of frequency (or  
duty-cycle), which is then filtered (averaged) by  
the counter for higher resolution. In comparison,  
the CS5317 uses a more sophisticated multi-order  
modulator and more powerful FIR filtering to ex-  
tract higher word rates, much lower noise, and  
more useful system-level filtering.  
mat  
which  
easily  
interfaces  
with  
industry-standard micro’s and DSP’s.  
The CS5317 also includes a phase-locked loop  
that simplifies the converter’s application in sys-  
tems which require sampling to be locked to an  
external signal source. The CS5317 continuously  
samples its analog input at a rate set by an exter-  
nal clock source. On-chip digital filtering, an  
integral part of the delta-sigma ADC, processes  
the data and updates the 16-bit output register at  
up to 20 kHz. The CS5317 can be read at any rate  
up to 20 kHz.  
Filtering  
At the system level, the CS5317’s digital filter  
can be modeled exactly like an analog filter with  
a few minor differences. First, digital filtering re-  
sides behind the A/D conversion and can thus  
reject noise injected during the conversion proc-  
ess (i.e. power supply ripple, voltage reference  
noise, or noise in the ADC itself). Analog filtering  
cannot.  
The CS5317 is a CS5316 with an on-chip sam-  
pling clock generator. As such, it replaces the  
CS5316 and should be considered for all new de-  
signs. In addition, a CS5316 look-alike mode is  
included, allowing a CS5317 to be dropped into a  
CS5316 socket.  
Also, since digital filtering resides behind the  
A/D converter, noise riding unfiltered on a near-  
full-scale input could potentially saturate the  
ADC. In contrast, analog filtering removes the  
noise before it ever reaches the converter. To ad-  
dress this issue, the CS5317’s analog modulator  
and digital filter reserve headroom such that the  
device can process signals with 100mV "excur-  
sions" above full-scale and still output accurately  
converted and filtered data. Filtered input signals  
above full-scale still result in an output of all  
ones.  
THEORY OF OPERATION  
The CS5317 utilizes the delta-sigma technique of  
executing low-cost, high-resolution A/D conver-  
sions. A delta-sigma A/D converter consists of  
two basic blocks: an analog modulator and a digi-  
tal filter.  
Conversion  
The analog modulator consists of a 1-bit A/D  
converter (that is, a comparator) embedded in an  
analog negative feedback loop with high open-  
loop gain. The modulator samples and converts  
the analog input at a rate well above the band-  
width of interest (2.5 MHz for the CS5317). The  
An Application Note called "Delta Sigma Over-  
view" contains more details on delta-sigma  
conversion and digital filtering.  
6
DS27F4  
CS5317  
SYSTEM DESIGN WITH THE CS5317  
Some systems such as echo-canceling modems,  
though, require the output sampling rate to be  
locked to a sampling signal which is 20 kHz or  
below. For this reason the CS5317 includes an  
on-chip phase-lock loop (PLL) which can gener-  
ate its requisite 5.12 MHz master clock from a  
20 kHz sampling signal.  
Like a tracking ADC, the CS5317 continuously  
samples and converts, always tracking the analog  
input signal and updating its output register at a  
20 kHz rate. The device can be read at any rate to  
create any system-level sampling rate desired up  
to 20kHz.  
The CS5317 features two modes of operation  
which utilize the internal PLL. The first, termed  
Clock Generation 1 (CLKG1), accepts a sam-  
pling clock up to 20 kHz at the CLKIN pin and  
internally generates the requisite 5.12 MHz clock.  
The CS5317 then processes samples updating its  
output register at the rate defined at CLKIN, typi-  
cally 20 kHz. For a 20 kHz clock input the digital  
filter’s 3 dB corner is set at 5.239 kHz, so CLKG1  
provides a factor of 2X oversampling at the sys-  
tem level (20 kHz is twice the minimum possible  
sampling frequency needed to reconstruct a 5  
kHz input). The CLKG1 mode is initiated by ty-  
ing the MODE input to +5V.  
Clocking  
Oversampling is a critical function in delta-sigma  
A/D conversion. Although system-level output  
sample rates typically remain between 7kHz and  
20kHz in voiceband applications, the CS5317 ac-  
tually samples and converts the analog input at  
rates up to 2.56 MHz. This internal sampling rate  
is typically set by a master clock which is on the  
order of several megahertz. See Table1 for a com-  
plete description of the clock relationships in the  
various CS5317 operating modes.  
+5V  
10  
Analog  
Supply  
0.1  
µ
F
1
2
0.1  
µF  
VA+  
VD+  
10  
µF  
10  
µF  
9
Clock  
CLKIN  
MODE  
Source  
VD- (clock override mode / CLKOR)  
VD+ (clock gen. mode / CLKG1)  
(clock gen. mode / CLKG2)  
7
CS5317  
Analog  
Signal  
Source  
16  
3
Signal  
Conditioning  
11  
18  
AIN  
± 2.75V  
RST  
DOE  
uP or DSP  
Control  
8
6
5
VA+  
DOUT  
DATA  
Serial  
Data  
VCOIN  
PHDT  
AGND  
25 k  
17  
15  
25 nF  
Interface  
CLKOUT  
0.1  
µF  
µF  
0.1  
10  
4
µ
F
12  
DGND  
VD-  
REFBUF  
VA-  
14  
10  
10  
µF  
-5V  
10  
0.1  
µF  
Analog  
Supply  
Figure 1. System Connection Diagram with Example PLL Components  
DS27F4  
7
CS5317  
Output Word  
Rate Provides  
CLKOUT DOUT  
Mode  
Pin  
System-level 2X  
RESET Oversampling  
CLKIN  
(kHz)  
7.2  
9.6  
f
f
F
t
*
sin  
sout  
dcD  
Mode  
Clock  
Symbol  
(MHz)  
(kHz) (kHz)  
7.2  
9.6  
(ns)  
CLKG2  
CLKG2  
CLKG2  
CLKG1  
CLKG1  
CLKG1  
CLKOR  
CLKOR  
CLKOR  
0V  
+5V  
-5V  
HIGH  
HIGH  
SYNC  
NO  
1.8432  
2.4576  
2.56  
1.8432  
2.4576  
2.56  
1.8432  
2.4576  
2.56  
14.4  
19.2  
20.0  
14.4  
19.2  
20.0  
14.4  
19.2  
20.0  
542.5  
406.9  
390.6  
542.5  
406.9  
390.6  
N/A  
N/A  
N/A  
Gen. 2  
10.0 (max)  
10.0  
YES  
YES  
YES  
14.4  
19.2  
20.0 (max)  
3686.4  
4915.2  
5120.0 (max)  
14.4  
19.2  
20.0  
14.4  
19.2  
20.0  
Clock  
Gen. 1  
Clock  
Override  
CS5316  
CS5316 FSYNC LOW  
5120.0 (max)  
2.56  
20.0  
20.0  
N/A  
- Delay from CLKIN rising to DOUT falling = 1 CLKOUT cycle  
* t  
dcD  
Table 1. Mode Comparisons  
The second PLL mode is termed Clock Genera-  
Analog Design Considerations  
tion 2 (CLKG2) which generates its 5.12 MHz  
clock from a 10 kHz external sampling signal.  
Again, output samples are available at the system  
sampling rate set by CLKIN, typically 10 kHz.  
For the full-rated 10 kHz clock CLKG2 still sets  
the filter’s 3 dB point at 5 kHz. Therefore,  
CLKG2 provides no oversampling beyond the  
Nyquist requirement at the system level  
(10 kHz : 5 kHz) and its internal digital filter pro-  
vides little anti-aliasing value. The CLKG2 mode  
is initiated by grounding the MODE pin.  
DC Characteristics  
The CS5317 was designed for signal processing.  
Its analog modulator uses CMOS amplifiers re-  
sulting in offset and gain errors which drift over  
temperature. If the CS5317 is being considered  
for low-frequency (< 10 Hz) measurement appli-  
cations, Crystal Semiconductor recommends the  
CS5501, a low-cost, d.c. accurate, delta-sigma  
ADC featuring excellent 60 Hz rejection and a  
system-level calibration capability.  
The CS5317 features a third operating mode  
called Clock Override (CLKOR). Initiated by ty-  
ing the MODE pin to -5V, CLKOR allows the  
5.12 MHz master clock to be driven directly into  
the CLKIN pin. The CS5317 then processes sam-  
The Analog Input Range and Coding Format  
The input range of the CS5317 is nominally ± 3V,  
with ± 250 mV possible gain error. Because of  
this gain error, analog input levels should be kept  
below ± 2.75V. The converter’s serial output ap-  
pears MSB-first in 2’s complement format.  
ples updating its output register at f  
/256.  
clkin  
Since all clocking is generated internally, the  
CLKOR mode includes a Reset capability which  
allows the output samples of multiple CS5317’s  
to be synchronized.  
Antialiasing Considerations  
The CS5317 also has a CS5316 compatible  
mode, selected by tying RST low, and using  
MODE (pin 7) as the FSYNC pin. See the  
CS5316 data sheet for detailed timing informa-  
tion.  
In applying the CS5317, aliasing occurs during  
both the initial sampling of the analog input at f  
s
in  
(~2.5 MHz) and during the digital decimation  
process to the 16-bit output sample rate, f  
.
s
out  
8
DS27F4  
CS5317  
Initial Sampling  
noise within ± 5 kHz bands around 2.5 MHz, 5  
MHz, 7.5 MHz, etc. will pass unfiltered and alias  
into the baseband. Such noise can only be filtered  
by analog filtering before the signal is sampled.  
Since the signal is heavily oversampled (2.5  
MHz : 5 kHz, or 500 : 1), a single-pole passive  
RC filter can be used as shown in Figure 2.  
The CS5317 samples the analog input, AIN, at  
one-half the master clock frequency (~2.5 MHz  
max). The input sampling frequency, f , appears  
at CLKOUT regardless of whether the master  
clock is generated on-chip (CLKG1 and CLKG2  
modes) or driven directly into the CS5317  
(CLKOR mode). The digital filter then processes  
the input signal at the input sample rate.  
s
in  
Input  
Signal  
AIN  
1.2 K  
Like any sampled-data filter, though, the digital  
0.01µF  
filter’s passband spectrum repeats around integer  
multiples of the sample rate, f . That is, when  
s
in  
the CS5317 is operating at its full-rated speed any  
Note: Any nonlinearities contributed by this filter  
will be encoded as distortion by the CS5317.  
Therefore a low distortion, high frequency ca-  
jω  
0
Mag H(e ) (dB)  
-2.74 dB  
pacitor such as COG-ceramic is recommended.  
Figure 2. Anti-alias Filter  
-40  
-80  
f
0
.25 F .5 F  
F
2F  
3F  
3
sin(128πƒT)  
=
Magnitude where: T = 1/ƒ  
sin  
128sin(πƒT)  
ƒ
= input sampling frequency = CLKOUT frequency for all modes  
= CLKIN/2 in CLKOR mode  
sin  
= CLKIN*128 in CLKG1 mode  
= CLKIN*256 in CLKG2 mode  
F = ƒ /128 for all modes  
sin  
ƒ = input frequency  
ƒ
= ƒ /128 = output data rate for CLKOR & CLKG1 = F  
sin  
sout  
ƒ
= ƒ /256 = output data rate for CLKG2 = F/2  
sin  
sout  
Examples:  
For ƒ = 2.56 MHz at ƒ = 5 kHz: Magnitude is -2.74 dB  
sin  
For ƒ = 2.56 MHz at ƒ = 10 kHz: Magnitude is -11.8 dB  
sin  
Figure 3. CS5317 Low-Pass Filter Response  
DS27F4  
9
CS5317  
Decimation  
noise from the modulator. This will typically in-  
crease the converter’s dynamic range to 88 dB.  
Aliasing effects due to decimation are identical in  
the CLKOR and CLKG1 modes. Aliasing is dif-  
ferent in the CLKG2 mode due to the difference  
in output sample rates (10 kHz vs. 20 kHz) and  
thus will be discussed separately.  
Further bandlimiting the digital output to f out/8  
(2.5 kHz at full speed) will typically increase dy-  
namic range to 90 dB.  
s
Aliasing in the CLKG2 Mode  
Aliasing in the CLKOR and CLKG1 Modes  
Aliasing effects in the CLKG2 mode can be mod-  
eled exactly as those in the CLKG1 mode with  
the output decimated by two (from 20 kHz to 10  
kHz). This is most easily achieved by ignoring  
every other sample. In the CLKG2 mode the ratio  
of the output sampling rate to the filter’s -3 dB  
point is two, with no oversampling beyond the  
demands of the Nyquist criterion. Without the  
The delta-sigma modulator output is fed into the  
digital low-pass filter at the input sampling rate,  
f . The filter’s frequency response is shown in  
s
in  
Figure 3. In the process of filtering the digitized  
signal the filter decimates the sampling rate by  
128 (that is, f  
= f /128). In its most elemen-  
s
in  
s
out  
tary form, decimation simply involves ignoring -  
or selectively reading - a fraction of the available  
samples.  
ability to roll-off substantially before f out/2, the  
on-chip digital filter’s antialiasing value is dimin-  
ished.  
s
In the process of decimation the output of the  
The CLKG2 mode should therefore be used only  
when the output data rate must be minimized due  
to communication and/or storage reasons. In ad-  
dition, adequate analog filtering must be provided  
prior to the A/D converter.  
digital filter is effectively resampled at f out, the  
s
output word rate, which has aliasing implications.  
Residual signals after filtering at multiples of f  
s
out  
will alias into the baseband. For example, an in-  
put tone at 28 kHz will be attenuated by 39.9 dB.  
If f  
= 20 kHz, the residual tone will alias into  
Digital Design Considerations  
s
out  
the baseband and appear at 8 kHz in the output  
spectrum.  
The CS5317 presents its 16-bit serial output  
MSB-first in 2’s complement format. The con-  
verter’s serial interface was designed to easily  
interface to a wide variety of micro’s and DSP’s.  
Appendix A offers several hardware interfaces to  
industry-standard processors.  
If the input signal contains a large amount of out-  
of-band energy, additional analog and/or digital  
antialias filtering may be required. If digital post-  
filtering is used to augment the CS5317’s  
rejection above f out/4 (that is, above 5 kHz), the  
s
filtering will also reject residual quantization  
f
out  
DOUT  
CLKOUT  
15 14 13 12 11 10  
9
8
7
6
5
4
3
2
1
0
15 14  
DATA  
MSB  
LSB  
(sign bit)  
Figure 4. Data Output  
10  
DS27F4  
CS5317  
Data Output Characteristics & Coding Format  
manently damaged. If the two supplies are de-  
rived from separate sources, care must be taken  
that the analog supply comes up first at power-up.  
Figure 1 shows a decoupling scheme which al-  
lows the CS5317 to be powered from a single set  
As shown in Figure 4, the CS5317 outputs its 16-  
bit data word in a serial burst. The data appears at  
the DATA pin on the rising edge of the same  
CLKOUT cycle in which DOUT falls. Data  
changes on the rising edge of CLKOUT, and can  
be latched on the falling edge. The CLKOUT rate  
±
of 5V rails. The digital supplies are derived  
from the analog supplies through 10 resistors  
to prevent the analog supply from dropping be-  
low the digital supply.  
is set by the CLKIN input (f  
/2 in the CLKOR  
clkin  
mode; f  
*128 in the CLKG1 mode; and  
clkin  
f
*256 in the CLKG2 mode). DOUT returns  
clkin  
PLL Characteristics  
high after the last bit is transmitted. After trans-  
mitting the sixteen data bits, DATA will remain  
high until DOUT falls again, initiating the next  
data output cycle.  
A phase-locked loop is included on the CS5317  
and is used to generate the requisite high fre-  
quency A/D sampling clock. A functional  
diagram of the PLL is shown in Figure 5. The  
PLL consists of a phase detector, a filter, a VCO  
(voltage-controlled oscillator), and a counter/di-  
A 3-state capability is available for bus-oriented  
applications. The 3-state control input is termed  
Data Output Enable, DOE, and is asynchronous  
with respect to the rest of the CS5317. If DOE is  
taken high at any time, even during a data burst,  
the DATA, DOUT and CLKOUT pins go to a  
high impedance state. Any data which would be  
output while DOE is high is lost.  
vider. The phase detector inputs are CLKIN (θ )  
1
and a sub-multiple of the VCO output signal (θ ).  
2
The inputs to the phase detector are positive-edge  
triggered and therefore the duty cycle of the  
CLKIN signal is not significant. With this type of  
phase detector, the lock range of the PLL is equal  
to the capture range and is independent of the low  
pass filter. The output of the phase detector is in-  
put to an external low pass filter. The filter  
characteristics are used to determine the transient  
response of the loop. The output voltage from the  
filter functions as the input control voltage to the  
VCO. The output of the VCO is then divided in  
frequency to provide an input to the phase detec-  
tor. The clock divider ratio is a function of the  
PLL mode which has been selected.  
Power Supplies  
Since the A/D converter’s output is digitally fil-  
tered in the CS5317, the device is more forgiving  
and requires less attention than conventional 16-  
bit A/D converters to grounding and layout  
arrangements. Still, care must be taken at the de-  
sign and layout stages to apply the device  
properly. The CS5317 provides separate analog  
and digital power supply connections to isolate  
digital noise from its analog circuitry. Each sup-  
ply pin should be decoupled to its respective  
ground, AGND or DGND. Decoupling should be  
accomplished with 0.1 µF ceramic capacitors. If  
significant low frequency noise is present in the  
supplies, 10 µF tantalum capacitors are recom-  
mended in parallel with the 0.1 µF capacitors.  
Phase Detector Gain (Kd)  
A properly designed and operating phase-locked  
loop can be described using steady state linear  
analysis. Once in frequency lock, any phase dif-  
ference between the two inputs to the phase  
detector cause a current output from the detector  
during the phase error. While either the +50 µA or  
the -50 µA current source may be turned on, the  
average current flow is:  
The positive digital power supply of the CS5317  
must never exceed the positive analog supply by  
more than a diode drop or the chip could be per-  
DS27F4  
11  
CS5317  
tio sets the ratio of the VCO frequency to the  
CLKIN frequency. As illustrated in Figure 5, the  
VCO output is always divided by two to yield the  
CLKOUT signal which is identical in frequency  
to the delta-sigma modulator sampling clock.  
The CLKOUT signal is then further divided by  
either 128 in the CLKG1 mode or by 256 in the  
CLKG2 mode. When the divide by two stage is  
included, the divider ratio (N) for the PLL in the  
CLKG1 mode is effectively 256. In the CLKG2  
mode the divider ratio (N) is 512.  
i
= Kd(θ −θ ) ≈ (−50µA 2π) (θ −θ )  
1 2 1 2  
out  
avg  
where θ is the phase of IN1, θ is the phase of  
1
2
IN2 and Kd is the phase detector gain. The factor  
2π comes from averaging the current over a full  
CLKIN cycle. Kd is in units of micro-am-  
peres/radian.  
VCO Gain (Ko)  
The output frequency from the VCO ranges from  
1.28 MHz to 5.12 MHz. The frequency is a func-  
tion of the control voltage input to the VCO. The  
VCO has a negative gain factor, meaning that as  
the control voltage increases more positively the  
output frequency decreases. The gain factor units  
are Megaradians per Volt per Second. This is  
equivalent to 2π Megahertz per volt. Changes in  
output frequency are given by:  
Loop Transfer Function  
As the phase-locked loop is a closed loop system,  
an equation can be determined which describes its  
closed loop response. Using the gain factors for  
the phase detector and the VCO, the filter ar-  
rangement and the counter/divider constant N,  
analysis will yield the following equation which  
describes the transfer function of the PLL:  
∆ω = Ko VCO  
[Ko is typ. -10Mrad/Vs.]  
vco  
in  
KoKdR  
N
KoKd  
NC  
s +  
Counter/Divider Ratio  
θ
θ
2
1
=
KoKdR  
KoKd  
NC  
2
s +  
s +  
The CS5317 PLL multiplies the CLKIN rate by  
an integer value. To set the multiplication rate, a  
counter/divider chain is used to divide the VCO  
output frequency to develop a clock whose fre-  
quency is compared to the CLKIN frequency in  
the phase detector. The binary counter/divider ra-  
N
This equation may be rewritten such that its ele-  
ments  
correspond  
with  
the  
following  
+5V  
VA+  
External RC  
50 µA  
K
=
-8  
µ
A/rad  
d
C
1
C
2
R
IN1  
DOWN  
CLKOR  
CLKIN  
Phase/Frequency  
Detect Logic  
VCO  
2
Delta-Sigma  
Sampling Clock  
(CLKOUT)  
PHDT VCOIN  
CLKOR  
IN2  
UP  
K
= -10 Mrad/V.s  
0
2
50  
-5V  
µ
A
CLKG2  
CLKG1  
128  
2
Conversion Output Rate -  
Same Frequency as DOUT  
Internal Sync for Digital Filter  
Figure 5. PLL Functional Diagram  
12  
DS27F4  
CS5317  
characteristic form in which the damping factor,  
CLKIN is approximately 20 times greater than  
the 3 dB corner frequency of the control loop.  
ζ, and the natural frequency, ω , are evident:  
n
2
Filter Components  
θ
θ
2ζω s + ωn  
n
2
1
=
2
2
s + 2ζω s + ω  
n
n
Using the equations which describe the transfer  
function of the PLL system, the following exter-  
nal filter component equations can be determined:  
Both thenaturalfrequencyand thedampingfac-  
tor are particularly important in determining the  
transient response of the phase-locked loop when  
subjected to a step input of phase or frequency. A  
family of curves are illustrated in Figure 6 that  
indicate the overshoot and stability of the loop as  
a function of the damping factor. Each response is  
KoKd  
C =  
2
Nω  
n
N
KoKd  
R = 2ζω  
n
plotted as a function of the normalized time, ω t.  
n
The gain factors (Ko, Kd) are specified in the  
Analog Characteristics table. In the event the sys-  
tem calls for very low bandwidth, hence a  
corresponding reduction in loop gain, the phase  
detector gain factor Kd can be reduced. A large  
series resistor (R1) can be inserted between the  
output of the detector and the filter. Then the  
50 µA current sources will saturate to the supplies  
and yield the following gain factor:  
For a given ζ and lock time, t, the ω required  
n
can be determined. Alternatively, phase lock con-  
trol loop bandwidth may be a specified parameter.  
In some systems it may be desirable to reduce the  
-3dB bandwidth of the PLL control loop to re-  
duce the effects of jitter in the phase of the input  
clock. The 3 dB bandwidth of the PLL control  
loop is defined by the following equation:  
ω3dB = ω 2ζ2 + 1 +  
2
2
n
(2ζ + 1) + 1  
5V  
Kd ≈  
2πR  
1
The equations used to describe the PLL and the  
3 dB bandwidth are valid only if the frequency of  
20 log(θ /θ )  
2
1
θ
normalized to θ  
2
1
4
3
ζ= 0.5  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0.0  
ζ = 0.5  
ζ = 0.5  
ζ = 0.6  
ζ = 0.7  
ζ = 0.8  
ζ = 0.9  
ζ = 1.0  
ζ = 1.5  
ζ = 2.0  
ζ = 3.0  
ζ = 10.0  
2
1
ζ = 10  
0
ζ= 10.0  
-1  
-2  
-3  
-4  
-5  
-6  
-7  
-8  
-9  
-10  
0
1
2
3
4
5
6
7
8
9
10  
0.1  
1
10  
ω
t.  
n
ω/ω  
n
Figure 6a. θ Unit Step Response  
2
Figure 6b. Second Order PLL Frequency Response  
DS27F4  
13  
CS5317  
In some applications additional filtering may be  
useful to eliminate any jitter associated with the  
discrete current pulses from the phase detector.  
In this case a capacitor whose value is no more  
than 0.1 C can be placed across the RC filter net-  
To calculate values for the resistor R and capaci-  
tor C of the filter, we must first derive a value for  
ω . Using the general rule that the sample clock  
n
should be at least 20 times higher frequency than  
the 3dB bandwidth of the PLL control loop:  
work (C in Figure 5).  
2
CLKIN 20 ω3dB  
Filter Design Example  
where CLKIN = 9600 Hz = 2π 9600 radians/sec.  
So: ω3dB = 2π 9600/20 = 3016 radians/sec.  
Knowing ω3dB and the damping factor of 1.0, we  
The following is a step by step example of how to  
derive the loop filter components. The CS5317  
A/D sampling clock is to be derived from a 9600  
Hz clock source. The application requires the sig-  
nal passband of the CS5317 to be 4 kHz. The  
on-chip digital filter of the CS5317 has a 3 dB  
passband of CLKOUT/488.65 (see Note 4 in the  
data sheet specifications tables). The 4 kHz pass-  
band requirement dictates that the sample clock  
(CLKOUT) of the CS5317 be a minimum of  
4000 X 488.65 = 1.954 MHz. This requires the  
VCO to run at 3.908 MHz. The 3.908 MHz rate is  
407 times greater than the 9600 Hz PLL input  
clock. Therefore the CS5317 must be set up in  
mode CLKG2 with N = 512. If the CLKG1 mode  
were used (N = 256), too narrow of a signal band-  
width through the A/D would result.  
can calculate the natural frequency, ω , of the  
n
control loop:  
2
2
2
ω = ω3dB2ζ + 1 +  
n
(2ζ + 1) + 1  
2
2
2
ω = 3016 2(1) + 1 +  
n
(2(1) + 1) + 1  
ω = 1215  
n
1 sec  
Once the natural frequency, ω , is determined,  
n
values for R and C for the loop filter can be cal-  
culated:  
Once the operating mode has been determined  
from the system requirements, a value for the  
damping factor must be chosen. Figure 6 illus-  
trates the dynamic aspects of the system with a  
given damping factor. Damping factor is gener-  
ally chosen to be between 0.5 and 2.0. The choice  
of 0.5 will result in an overshoot of 30 % to a step  
response whereas the choice of 2.0 will result in  
an overshoot of less than 5 %. For example pur-  
poses, let us use a damping factor of 1.0.  
R = 2ζω N/KoKd  
n
R = 2(1)(1215 1/s) 512/(-10Mrad/v.s.)(-8 µA/rad)  
R = 15552 v/A = 15.55 k. Use R = 15 k.  
2
C = KoKd/Nω  
n
2
C = (-10 Mrad/v.s)(- 8 µA/rad)/512 (1215 1/s)  
-9  
So, let us begin with the following variables :  
C = 105.8 x 10 A.s/v = 105 nF. Use 0.1 µF.  
Ko = - 10 Mradians/volt.sec  
Kd = - 8 µA/radian  
N = 512  
The above example assumed typical values for  
Ko and Kd. Your application may require a worst  
case analysis which includes the minimum or  
maximum values. Table 2 shows some other ex-  
ample situations and R and C values.  
ζ = 1.0  
14  
DS27F4  
CS5317  
CLKIN  
(Hz)  
7200  
9600  
14400  
19200  
CLKOUT  
(MHz)  
1.8432  
2.4576  
1.8432  
2.4576  
Mode  
CLKG2  
CLKG2  
CLKG1  
CLKG1  
N
ζ
ω
ω
911  
1215  
1822  
2430  
R * (k)  
11.6  
15.5  
11.6  
15.5  
C * (nF)  
187  
106  
94  
3dB  
n
512  
512  
256  
256  
1.0  
1.0  
1.0  
1.0  
2262  
3016  
4524  
6032  
52  
* The values for R and C are as calculated using the described method. Component tolerances have  
not been allowed for. Notice that Ko and Kd can vary over a wide range, so using tight tolerances  
for R and C is not justified. Use the nearest conveniently available value.  
Table 2 Example PLL Loop Filter R and C values  
CS5317 PERFORMANCE  
The quality of the window used for harmonic  
analysis is typically judged by its highest side-  
lobe level. The Blackman-Harris window used to  
test the CS5317 has a maximum side-lobe level  
of -92 dB.  
The CS5317 features 100% tested dynamic per-  
formance. The following section is included to  
illustrate the test method used for the CS5317.  
FFT Tests and Windowing  
Figure 7 shows an FFT plot of a typical CS5317  
with a 1 kHz sinewave input generated by an "ul-  
tra-pure" sine wave generator and the output  
multiplied by a Blackman-Harris window. Arti-  
facts of windowing are discarded from the  
signal-to-noise calculation using the assumption  
that quantization noise is white. All FFT plots in  
this data sheet were derived by averaging the FFT  
results from ten time records. This filters the  
spectral variability that can arise from capturing  
finite time records, without disturbing the total  
energy outside the fundamental. All harmonics  
and the -92 dB side-lobes from the Blackman-  
Harris window are therefore clearly visible in the  
plots.  
The CS5317 is tested using Fast Fourier Trans-  
form (FFT) techniques to analyze the converter’s  
dynamic performance. A pure sine wave is ap-  
plied to the CS5317 and a "time record" of 1024  
samples is captured and processed. The FFT algo-  
rithm analyzes the spectral content of the digital  
waveform and distributes its energy among 512  
"frequency bins". Assuming an ideal sinewave,  
distribution of energy in bins outside of the fun-  
damental and dc can only be due to quantization  
effects and errors in the CS5317.  
If sampling is not synchronized to the input sine-  
wave it is highly unlikely that the time record will  
contain an exact integer number of periods of the  
input signal. However, the FFT assumes that the  
signal is periodic, and will calculate the spectrum  
of a signal that appears to have large discontinui-  
ties, thereby yielding a severely distorted  
spectrum. To avoid this problem, the time record  
is multiplied by a window function prior to per-  
forming the FFT. The window function smoothly  
forces the endpoints of the time record to zero,  
removing the discontinuities. The effect of the  
"window" in the frequency domain is to convo-  
lute the spectrum of the window with that of the  
actual input.  
0dB  
Sampling Rate: 19.2 kHz  
-20dB  
-40dB  
Full Scale:  
+_ 2.75 V  
S/(N+D): 81.39 dB  
-60dB  
Signal  
Amplitude  
Relative to  
Full Scale  
-80dB  
-100dB  
-120dB  
1 kHz  
9.6 kHz  
dc  
Input Frequency  
Figure 7. CS5317 Dynamic Performance  
DS27F4  
15  
CS5317  
Full - scale signal - to - noise - plus - distortion  
[S/(N+D)] is calculated as the ratio of the rms  
power of the fundamental to the sum of the rms  
power of the FFT’s other frequency bins, which  
include both noise and distortion. For the  
CS5317, signal-to-noise-plus-distortion is shown  
to be better than 81 dB for an input frequency  
range of 0 to 9.6 kHz (fs/2).  
0dB  
-20dB  
-40dB  
-60dB  
-80dB  
-100dB  
-120dB  
S/I.M.D.: 84.7 dB  
Signal  
Amplitude  
Relative to  
Full Scale  
Harmonic distortion characteristics of the CS5317  
are excellent at 80 dB full scale signal to THD  
(typical), as are intermodulation distortion char-  
acteristics, shown in Figure 8. Intermodulation  
distortion results from the modulation distortion  
of two or more input frequencies by a non-linear  
transfer function.  
800 1450  
9600  
dc  
Input Frequency (Hz)  
Figure 8. CS5317 Intermodulation Distortion  
The plot below illustrates the typical DNL per-  
formance of the CS5317, and clearly shows the  
part easily achieves no missing codes.  
DNL Test  
Figure 9 shows a plot of the typical differential  
non-linearity (DNL) of the CS5317. This test is  
done by taking a large number of conversion re-  
sults, and counting the occurrences of each code.  
A perfect A/D converter would have all codes of  
equal size and therefore equal numbers of occur-  
rences. In the DNL test, a code with the average  
number of occurrences is considered ideal and  
plotted as DNL = 0 LSB. A code with more or  
less occurrences than average will appear as a  
DNL of greater than or less than zero. A missing  
code has zero occurrences, and will appear as a  
DNL of -1 LSB.  
Schematic & Layout Review Service  
Confirm Optimum  
Schematic & Layout  
Before Building Your Board.  
For Our Free Review Service  
Call Applications Engineering.  
C a l l : ( 5 1 2 ) 4 4 5 - 7 2 2 2  
+1  
+1/2  
0
-1/2  
-1  
0
32,768  
65,535  
Codes  
Figure 9. CS5317 DNL Plot  
16  
DS27F4  
CS5317  
PIN DESCRIPTIONS (Pin numbers refer to the 18-pin DIP package)  
18 pin DIP Pinout  
POSITIVE ANALOG POWER  
POSITIVE DIGITAL POWER  
DATA OUTPUT ENABLE  
DIGITAL GROUND  
VA+  
VD+  
DOE  
VCOIN  
PHDT  
RST  
AGND  
VA-  
VCO INPUT  
PHASE DETECT  
RESET  
ANALOG GROUND  
NEGATIVE ANALOG POWER  
NO CONNECT  
18  
17  
16  
15  
14  
13  
12  
11  
10  
1
2
3
4
5
6
7
8
9
DGND  
SERIAL CLOCK OUTPUT CLKOUT  
SERIAL DATA OUTPUT  
CLOCKING MODE SELECT  
DATA OUTPUT READY  
CLOCK INPUT  
DATA  
MODE  
DOUT  
CLKIN  
NC  
REFBUF POSITIVE REFERENCE BUFFER  
AIN  
VD-  
ANALOG INPUT  
NEGATIVE DIGITAL POWER  
20 pin SOIC pinout  
POSITIVE ANALOG POWER  
POSITIVE DIGITAL POWER  
DATA OUTPUT ENABLE  
VA+  
VD+  
DOE  
VCOIN  
PHDT  
RST  
VCO INPUT  
PHASE DETECT  
RESET  
ANALOG GROUND  
NO CONNECT  
NO CONNECT  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
DIGITAL GROUND DGND  
AGND  
NO CONNECT  
NC  
16 NC  
15  
14  
13  
12  
11  
SERIAL CLOCK OUTPUT CLKOUT  
SERIAL DATA OUTPUT DATA  
CLOCKING MODE SELECT MODE  
DATA OUTPUT READY DOUT  
CLOCK INPUT CLKIN  
NC  
VA-  
NEGATIVE ANALOG POWER  
REFBUF POSITIVE REFERENCE BUFFER  
AIN  
VD-  
ANALOG INPUT  
NEGATIVE DIGITAL POWER  
Power Supplies  
VD+ - Positive Digital Power, PIN 2.  
Positive digital supply voltage. Nominally 5 volts.  
VD- - Negative Digital Power, PIN 10.  
Negative digital supply voltage. Nominally -5 volts.  
DGND - Digital Ground, PIN 4.  
Digital ground reference.  
VA+ - Positive Analog Power, PIN 1.  
Positive analog supply voltage. Nominally 5 volts.  
VA- - Negative Analog Power, PIN 14.  
Negative analog supply voltage. Nominally -5 volts.  
AGND - Analog Ground, PIN 15.  
Analog ground reference.  
PLL/Clock Generator  
CLKIN - Clock Input, PIN 9.  
Clock input for both clock generation modes and the clock override mode (see MODE).  
DS27F4  
17  
CS5317  
MODE - Mode Set, PIN 7.  
Determines the internal clocking mode utilized by the CS5317. Connect to +5V to select  
CLKG1 mode. Connect to DGND to select CLKG2 mode. Connect to -5V to select CLKOR  
mode. This pin becomes equivalent to FSYNC in the CSZ5316 compatible mode.  
VCOIN - VCO Input, PIN 18.  
This pin is typically connected to PHDT. A capacitor and resistor in series connected between  
VA+ and this pin sets the filter response of the on-chip phase locked loop.  
PHDT - Phase Detect, PIN 17.  
This pin is typically connected to VCOIN. A capacitor and resistor in series connected between  
VA+ and this pin sets the filter response of the on-chip phase locked loop.  
Inputs  
AIN - Analog Input, PIN 11.  
DOE - Data Output Enable, PIN 3.  
Three-state control for serial output interface. When low, DATA, DOUT, and CLKOUT are  
active. When high, they are in a high impedance state.  
RST - Sample Clock Reset, PIN 16.  
Sets phase of CLKOUT. Functions only in the clock override mode, CLKOR. Used to  
synchronize the output samples of multiple CS5317’s. Must be kept high in CLKG1 or CLKG2  
modes. Also, tying this pin low, with MODE not tied to - 5V, will place the CS5317 into  
CSZ5316 compatible mode.  
Outputs  
DOUT - Data Output Flag, PIN 8.  
The falling edge indicates the start of serial data output on the DATA pin. The rising edge  
indicates the end of serial data output.  
DATA - Data Output, PIN 6.  
Serial data output pin. Converted data is clocked out on this pin by the rising edge of  
CLKOUT. Data is sent MSB first in two’s complement format.  
CLKOUT - Data Output Clock, PIN 5.  
Serial data output clock. Data is clocked out on the rising edge of this pin. The falling edge  
should be used to latch data. Since CLKOUT is a free running clock, DOUT can be used to  
indicate valid data.  
REFBUF - Positive Voltage Reference Noise Buffer, PIN 12.  
Used to attenuate noise on the internal positive voltage reference. Must be connected to the  
analog ground through a 0.1µF ceramic capacitor.  
18  
DS27F4  
CS5317  
PARAMETER DEFINITIONS  
N
Resolution - The number of different output codes possible. Expressed as N, where 2 is the number  
of available output codes.  
Dynamic Range - The ratio of the largest allowable input signal to the noise floor.  
Total Harmonic Distortion - The ratio of the rms sum of all harmonics to the rms value of the largest  
allowable input signal. Units in dB’s.  
Signal to Intermodulation Distortion - The ratio of the rms sum of two input signals to the rms sum  
of all discernible intermodulation and harmonic distortion products.  
Linearity Error - The deviation of a code from a straight line passing through the endpoints of the  
transfer function after zero- and full-scale errors have been accounted for. "Zero-scale" is a  
point 1/2 LSB below the first code transition and "full-scale" is a point 1/2 LSB beyond the  
code transition to all ones. The deviation is measured from the middle of each particular code.  
Units in %FS.  
Differential Nonlinearity - The deviation of a code’s width from the ideal width. Units in LSB’s.  
Positive Full Scale Error - The deviation of the last code transition from the ideal, (VREF - 3/2 LSB).  
Units in mV.  
Positive Full Scale Drift - The drift in effective, positive, full-scale input voltage with temperature.  
Negative Full Scale Error - The deviation of the first code transition from the ideal, (-VREF + 1/2  
LSB). Units in mV.  
Negative Full Scale Drift - The drift in effective, negative, full-scale input voltage with temperature.  
Bipolar Offset - The deviation of the mid-scale transition from the ideal. The ideal is defined as the  
middle transition lying on a straight line between actual positive full-scale and actual negative  
full-scale.  
Bipolar Offset Drift - The drift in the bipolar offset error with temperature.  
Absolute Group Delay - The delay through the filter section of the part.  
Passband Frequency - The upper -3 dB frequency of the CS5317.  
DS27F4  
19  
CS5317  
ORDERING GUIDE  
Model Number  
CS5317-KP  
CS5317-KS  
Temperature Range  
0 to 70°C  
Package  
18 Pin Plastic DIP  
20 Pin Plastic SOIC  
0 to 70°C  
20  
DS27F4  
CS5317  
APPENDIX A  
APPLICATIONS  
Figure A1 shows one method of converting the  
serial output of the CS5317 into 16-bit, parallel  
words. The associated timing is also shown.  
+5V  
CS5317  
DATA  
OE2  
P
A
D0  
D1  
D2  
D3  
D4  
D5  
D6  
D7  
A
P
B
CLKOUT  
DOUT  
P
C
8
P
D
S1  
S2  
P
E
P
F
P
G
16  
Q
H
P
Data  
Bus  
H
OE1  
+5V  
CS  
OE2 OE1  
P
D8  
A
P
D9  
B
A
P
D10  
D11  
D12  
D13  
D14  
D15  
C
8
P
D
P
E
S1  
S2  
P
F
P
G
P
H
SET  
D
Q
Q
INT  
INT  
Only needed for level sensitive interrupt driven systems.  
CLKOUT  
DOUT  
15  
14  
13  
2
1
0
DATA  
INT  
(MSB)  
INT Cleared when data read  
(CS goes low)  
Figure A1. CS5317-to-Parallel Data Bus Interface  
DS27F4  
21  
CS5317  
Figure A2 shows the interconnection and timing  
details for connecting a CS5317 to a NEC  
µPD7730 DSP chip.  
Figure A3 shows the interconnection and timing  
details for connecting a CS5317 to a Motorola  
DSP 56000.  
CS5317  
CLKOUT  
µ
PD77230  
Status Register (SR)  
SICK  
SIEN  
SI  
Bit Mnemonic Setting Meaning  
DOUT  
DATA  
9
7, 6  
3
SCI  
SDLI  
SIF  
0
External Clock  
1, 0 16 bit data  
MSB First  
0
CLKOUT  
DOUT  
DATA  
15  
14  
13  
2
1
0
(MSB)  
Figure A2. CS5317-to-NEC µPD77230 Serial Interface  
SYNC ASYNC  
CLKOUT SCK  
SC0  
CS5317  
CLKOUT  
DSP56000  
SSI Control Reg. A  
CRA (X:FFEC)  
PINS DOUT  
SC2  
SC1  
WL1 = 1  
16 bits  
GCK  
0
1
0
0
0
-
0
0
0
-
SCK, SC0  
SC2, SC1  
SRD  
WL0 = 0  
SYN  
FSL  
DOUT  
DATA  
SCKD  
SCD2  
SCD1  
SCD0  
-
0
0
-
CLKOUT  
DOUT  
DATA  
15  
14  
13  
2
1
0
(MSB)  
Figure A3. CS5317-to-Motorola DSP56000 Serial Interface  
22  
DS27F4  
CS5317  
Figure A4 shows the interconnection and timing  
details for connecting a CS5317 to a WE DSP16  
DSP chip.  
Figure A5 shows the interconnection and timing  
details for connecting a CS5317 with TMS32020  
and TMS320C25 DSP chips.  
Serial I/O Control Register (SIOC)  
Field Value Meaning  
CS5317  
DSP16  
ICK  
MSB  
ILD  
1
0
0
0
MSB input first  
ILD is an input  
ICK is an input  
16 bit input data  
CLKOUT  
DOUT  
ILD  
DI  
ICK  
D
Q
DATA  
ILEN  
DATA  
d
74  
CLKOUT  
DOUT  
DATA  
15  
14  
13  
2
1
0
d
(MSB)  
Figure A4. CS5317-to-WE DSP16 Serial Interface  
TMS32020  
CS5317  
TMS320C25  
TMS32020 Status Register (ST1):  
F0 = 0 (16 bit data)  
CLKOUT  
DOUT  
CLKR  
FSR  
DR  
TMS320C25 Status Register (ST1):  
F0 = 0 (16 bit data)  
DATA  
FSM = 1 (Frame Sync used)  
CLKOUT  
DOUT  
DATA  
15  
14  
13  
2
1
0
(MSB)  
Figure A5. CS5317-to-TMS32020/TMS320C25 Serial Interface  
DS27F4  
23  
• Notes •  
CDB5317  
Evaluation Board for CS5317  
Features  
Description  
The CDB5317 Evaluation Board is designed to allow the  
user to quickly evaluate performance of the CS5317 Del-  
ta-Sigma Analog-to-Digital Converter. All that is required  
to use this board is an external power supply, a signal  
source, a clock source, and an ability to read either serial  
or parallel 16bitdata words.  
Easy to Use Digital Interface  
Parallel 16 Bits With Clock  
Serial Output With Clock  
Multiple Operating Modes  
Including Two PLL Modes  
IDC Header used to access Parallel Data,  
ORDERING INFORMATION  
Serial Data, and Clock Input and Output  
CDB5317  
Evaluation Board  
I
V
L
+5V GND -5V  
AIN  
CLKOUT  
DATA  
CLKIN  
SERIAL TO PARALLEL  
CONVERTER  
CLKIN  
CS5317  
DRDY  
DACK  
IDC HEADER  
D0-D15  
Cirrus Logic, Inc.  
Copyright Cirrus Logic, Inc. 1998  
(All Rights Reserved)  
Crystal Semiconductor Products Division  
P.O. Box 17847, Austin, Texas 78760  
(512) 445 7222 FAX: (512) 445 7581  
http://www.crystal.com  
MAR ‘95  
DS27DB3  
25  
CDB5317  
GENERAL DESCRIPTION  
Set-up for evaluation is straightforward. First de-  
cide the operating mode and place the jumper on  
the board for the proper selection. Then decide  
whether the filter components for the phase  
locked loop are adequate or whether they should  
be changed for your evaluation. The PLL will  
lock on a steady clock input with the filter as it is.  
Connect the necessary 5 V (CMOS compatible)  
CLKIN signal for the application. Use the sine-  
wave generator to supply the analog signal to the  
CDB5317. Apply the analog input and CLKIN  
signals only when the evaluation board is pow-  
ered up. Converted data will then appear at the  
header on the CDB5317. The header should be  
connected to the digital data acquisition board in  
the PC through an IDC 40 pin connector and ca-  
ble. The software routine should collect the data  
from the CDB5317 and run a standard 1024 point  
Fast Fourier Transform (FFT). Such an analysis  
results in a plot similar to Figure 1. This plot re-  
sulted from using a 1kHz input signal and a  
Blackman-Harris window for the FFT.  
The CDB5317 Evaluation Board is a stand-alone  
environment for easy lab evaluation of the  
CS5317 Delta-Sigma Analog-to-Digital Converter.  
Included on the board is a serial-to-parallel con-  
verter. The user can access output data in either  
parallel or serial form. When supplied with the  
necessary +5 V and -5 V power supplies, a  
CLKIN signal, and an analog signal source, the  
CDB5317 will provide converted data at the 40  
pin header.  
SUGGESTED EVALUATION METHOD  
An efficient evaluation of the CS5317 using the  
CDB5317 may be accomplished as described be-  
low.  
The following equipment will be required for the  
evaluation:  
The CDB5317 Evaluation Board.  
A power supply capable of supplying +5V and  
-5V.  
A clock source as the CLKIN signal of the  
CS5317.  
A spectrally pure sine wave generator such as  
the Krohn-Hite Model 4400A "Ultra-Low Distor-  
tion Oscillator".  
A PC equipped with a digital data acquisition  
board such as the Metrabyte Model PIO12 "24 Bit  
Parallel Digital I/O Interface".  
The signal to noise and signal to total harmonic  
distortion characteristics of the CS5317 may be  
easily measured in this way. The signal to total  
harmonic distortion value for a particular input is  
the ratio of the RMS value of the input signal and  
the sum of the RMS values of the harmonics  
shown in the diagram. The dynamic range of the  
CS5317 can be measured by reducing the input  
0dB  
A software routine to collect the data and per-  
form a Fast Fourier Transform (FFT).  
Sampling Rate: 19.2 kHz  
± 2.75 V  
Full Scale:  
S/(N+D): 81.39 dB  
-20dB  
-40dB  
-60dB  
The evaluation board includes filter components  
for the on-chip phase locked loop. The compo-  
nents are adequate for testing if the CLKIN signal  
has little or no phase-jitter. If the CDB5317 board  
is being tested as part of a system which generates  
a CLKIN which contains jitter, the PLL filter  
components may need to be optimized for your  
system (see the CS5317 data sheet).  
Signal  
Amplitude  
Relative to  
Full Scale  
-80dB  
-100dB  
-120dB  
9.6 kHz  
1 kHz  
dc  
Input Frequency  
Figure 1. FFT Plot Example  
26  
DS27DB3  
CDB5317  
amplitude so that distortion products become neg-  
ligible. This allows an accurate measurement of  
the noise floor.  
are supplied on the board to connect the +5, -5,  
and ground power lines. A good quality low rip-  
ple, low noise supply will give the best  
performance. The +5 V supply can also be used  
for VL and should be connected between the VL  
board jack and the power supply, as opposed to  
connecting the VL jack straight to the +5V jack.  
The +5V jack is the positive power source for the  
CS5317 IC whereas the VL jack supplies power  
to all the digital ICs. Care should be taken that  
noise is not coupled between VL and +5V; how-  
ever, supply noise is generally not a problem with  
the CS5317 since the on-chip decimation filter  
will remove any interference outside of its pass-  
band. The +5 and -5 V supply lines are filtered on  
More complex analysis such as intermodulation  
distortion measurements can be accomplished  
with the addition of another sine-wave generator.  
CIRCUIT DESCRIPTION  
Figure 2 illustrates the CS5317 A/D converter IC  
circuit connections. The chip operates off of ±5V.  
These voltages are supplied from a power source  
external to the evaluation board. Binding posts  
TP6  
V
V
L
L
C5  
0.1  
C4  
10  
D1  
µ
F
µF  
R7  
10  
TP10  
D3  
+5V  
1
2
C9  
10  
C8  
C6  
10  
C7  
+
3
C19  
C17  
0.22  
6.8v  
µF  
0.1  
µF  
0.1 µF  
µ
F
µ
F
VA+  
VD+  
R10  
10k  
R5  
17  
18  
DOE  
PHDT  
VCOIN  
10 k  
8
5
6
DOUT (fig. 3)  
CLKOUT (fig. 3)  
DATA (fig. 3)  
DOUT  
CLKOUT  
R2  
200  
TP8  
9
CLKIN  
AIN  
CLKIN  
DATA  
RST  
R9  
16  
R1*  
51  
CLKIN (fig.6)  
R6  
10 k  
10 k  
U6  
R11  
11  
12  
AIN  
CLKG1  
CLKG2  
CLKOR  
C18  
0.01  
NPO  
1.2k  
7
4
REFBUF  
µF  
P2  
MODE  
C14  
CS5317  
DGND  
0.1  
µF  
TP7  
15  
GND  
-5V  
AGND  
C15  
C16  
C13 C12  
+
D2  
VA-  
14  
VD-  
10  
TP9  
10 F  
µ
0.1  
µ
F
6.8v  
0.1  
µF  
10 µF  
R8  
10  
* Remove for logic gate CLKIN source  
Figure 2. Analog-to-Digital Converter  
DS27DB3  
27  
CDB5317  
the board and then connected to the V + and V -  
supply pins of the chip. The +5 V and -5V are  
to the phase detector of the on-chip phase locked  
loop of the CS5317.  
A
A
then connected by means of ten resistors to the  
Header connector P2 (see Figure 2) is provided to  
allow mode selection for the CS5317 chip. The  
mode selection works together with the CLKIN  
signal to set the sample rate and the output word  
rate of the CS5317. See the CS5317 data sheet  
for details on mode selection. Two of the avail-  
able modes (CLKG1 and CLKG2) utilize the  
on-chip phase locked loop to step up the CLKIN  
frequency to obtain the necessary sample rate  
clock for the A/D converter. Another mode (the  
CLKOR mode) does not use the on-chip PLL but  
instead drives the sample function directly. The  
V + and V - pins respectively. Capacitive filter-  
D
D
ing is provided on all supply pins of the chip. In  
addition there is a 0.1 µF filter capacitor con-  
nected from the REFBUF pin of the chip to the  
V - supply pin.  
A
To properly operate, the CS5317 chip requires an  
external (5 V CMOS compatible) clock. A BNC  
connector labeled CLKIN is provided to connect  
the off-board clock signal to the board. The  
CLKIN signal is also available on the 40 pin  
header connector. The CLKIN signal is one input  
DOUT2  
(fig. 6)  
V
L
C10  
V
U5  
L
0.1  
µ
F
1
3
2
4
14  
4
C1  
µ
0.1 F  
D
TP2  
S
2
3
5
6
D
Q
U4  
74HC74  
14  
DRDY  
(fig. 6)  
12  
13  
1
2
9
8
DOUT  
(fig. 2)  
CL  
Q
7
10  
11  
13  
GND R  
V
L
V
7
L
12  
TP3  
µ
0.1 F  
C11  
6
14  
DACK  
(fig. 6)  
5
U5  
R4  
10k  
7
3
4
CLKOUT  
(fig. 2)  
UNUSED GATES  
VL  
U1  
5
6
8
CLKOUT  
(fig. 6)  
CLKOUT2  
(fig. 6)  
10  
VL  
VL  
12  
11  
9
8
S
Q
D
11  
10  
9
DATA  
(fig. 2)  
DATA 1  
(fig. 6)  
U4  
CL  
Q
R
DATA  
(fig. 6)  
VL  
13  
Figure 3. Buffers and Parallel Handshake Flip-Flop  
28  
DS27DB3  
CDB5317  
CLKOUT  
DATA  
15 14 13 12 11 10  
9
8
7
6
5
4
3
2
1
0
DOUT  
Note: For a complete description of serial timing see the CS5317 Data Sheet  
Figure 4 Serial Data Timing  
two modes which use the phase locked loop will  
require appropriate low pass filter components on  
the Evaluation Board. The low pass filter compo-  
nents help determine the PLL control loop  
response, including its bandwidth and stability  
and therefore directly affect the transient response  
of the PLL control loop. Appropriate filter compo-  
nents should be installed if a particular dynamic  
response to changes of the CLKIN signal is de-  
sired.  
The analog signal to be digitized is input to the  
AIN BNC connector. The digital output words  
from the CS5317 are buffered by HEX inverters  
as shown in Figure 3. The buffered versions of  
the CLKOUT and DATA signals are available on  
the header connector P1 in Figure 6. The serial  
data signals out of the CS5317 are illustrated in  
Figure 4. If remote control of the DOE line is  
desired, the trace on the PC Board can be opened  
and a wire connection can be soldered to the DOE  
input line. Remote control of the RST line of the  
CS5317 is also available if desired.  
The filter components which are installed on the  
board have been chosen for the following parame-  
ters: MODE: CLKG2; CLKIN: 7,200; N=512;  
damping factor: 1.0; Control loop -3 dB band-  
width: 2262 radians/second. These parameters  
yield R as 10 k and C as 0.22 µF for the filter  
components.  
Figures 5 and 6 illustrate the serial to parallel shift  
registers including timing information. The DATA  
output signal from the CS5317 is input to the data  
input of the shift register. An inverted version of  
the CLKOUT signal is used to clock the DATA  
into the shift registers. The two 8-bit shift register  
ICs also include output latches. The rising edge  
Serial Data  
Shifting Out  
Serial Data  
Shifting Out  
Parallel Data Valid  
Parallel Data (D0-D15) Valid  
DATA  
DOUT  
DRDY  
DACK  
Figure 5. Parallel Data Timing  
DS27DB3  
29  
CDB5317  
of the DOUT signal from the CS5317 is used to  
latch the data once it is input to the shift registers.  
The rising edge of DOUT is also used to toggle  
the DRDY flip flop (see Figure 3). The flip flop  
is used to signal a remote device whenever new  
data is latched into the output registers. The  
DRDY flip flop is reset whenever DACK occurs.  
A component layout of the CDB5317 board is il-  
lustrated in Figure 7.  
CLKIN  
(fig. 2)  
CLKOUT2  
(fig. 3)  
P1  
V
L
TP4  
CLKIN  
CLKOUT  
DATA  
D15  
C2  
0.1  
µ
F
10 16  
RST  
DATA1  
(fig. 3)  
7
QH  
D14  
6
74HC595  
U2  
QG  
QF  
QE  
QD  
QC  
QB  
QA  
D13  
5
TP5  
D12  
4
D11  
12  
3
LATCH CLK  
SHIFT CLK  
D10  
2
D9  
11  
14  
1
D8  
15  
DIN  
GND  
OE  
8
13  
V
L
R3  
C3  
10k  
0.1  
µ
F
10 16  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
9
RST  
DOUT  
7
QH  
QG  
QF  
QE  
QD  
QC  
QB  
QA  
6
5
74HC595  
4
U3  
3
12  
DOUT2  
(fig. 3)  
LATCH CLK  
2
11  
14  
1
CLKOUT  
(fig. 3)  
DATA  
(fig. 2)  
SHIFT CLK  
15  
DIN  
DACK  
DRDY  
GND  
13  
8
DACK  
(fig. 3)  
DRDY  
(fig. 3)  
Figure 6.  
30  
DS27DB3  
CDB5317  
Figure 7. Bird’s Eye View  
DS27DB3  
31  

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