CTL0432PS-R3 [CTMICRO]
P-Channel Enhancement MOSFET;
| 型号： | CTL0432PS-R3 |
| 厂家： | 
CT Micro International Corporation |
| 描述： | P-Channel Enhancement MOSFET |
| 文件： | 总11页 (文件大小：760K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
CTL0432PS-R3
P-Channel Enhancement MOSFET
Features
Description
The CTL0432PS-R3 is the P-Channel logic enhancement
Drain-Source Breakdown Voltage VDSS -20 V
Drain-Source On-Resistance
•
•
mode power field effect transistors are produced using
high cell density, DMOS trench technology. This high
density process is especially tailored to minimize on-state
resistance.
R
DS(ON) 40m
Ω
Ω
Ω
Ω
, at VGS= -10V, ID= -5.1A
, at VGS= -4.5V, ID= -4.5A
, at VGS= -2.5V, ID= -3.7A
, at VGS= -1.8V, ID= -1.7A
RDS(ON) 43m
RDS(ON) 52m
RDS(ON) 60m
•
•
•
Continuous Drain Current at TA=25 ID = -4.3A
Advanced high cell density Trench Technology
RoHS Compliance & Halogen Free
Applications
•
•
•
•
Power Management
Portable Equipment
Load switch
Package Outline
Schematic
Drain
Drain
Gate
Source
Source
Gate
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 1
CTL0432PS-R3
P-Channel Enhancement MOSFET
Absolute Maximum Rating at 25oC
Symbol
Parameters
Test Conditions
Min
V
Notes
Drain-Source Voltage
-20
8
V
DS
GS
Gate-Source Voltage
V
V
Continuous Drain Current
Pulsed Drain Current
-4.3
A
1
1
2
I
D
-17
A
IDM
Total Power Dissipation
Storage Temperature Range
Operating Junction Temperature Range
1.4
W
°C
°C
P
D
-55 to 150
-55 to 150
T
STG
T
J
Thermal Characteristics
Symbol
Parameters
Test Conditions
Min
--
Typ
Max
--
Units Notes
Thermal Resistance
Junction-Ambient (t=10s)
R
ӨJA4
oC /W
1,4
90
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 2
CTL0432PS-R3
P-Channel Enhancement MOSFET
Electrical Characteristics TA = 25°C (unless otherwise specified)
Static Characteristics
Symbol
Parameters
Test Conditions
= -250µA
DS = -20V, VGS = 0V
Min
Typ
Max
-
Units Notes
Drain-Source Breakdown Voltage
Drain-Source Leakage Current
Gate-Source Leakage Current
V
GS= 0V, I
D
-20
-
-
V
B
VDSS
DSS
V
-
-
-1
µA
nA
I
V
GS
=
8V, VDS = 0V
100
-
IGSS
On Characteristics
Symbol
Parameters
Test Conditions
Min
Typ
40
43
52
60
---
Max
48
Units Notes
VGS = -10V, ID = -5.1A
-
-
mΩ
VGS
VGS
VGS
VGS
ID
= -4.5V, = -4.5A
52
mΩ
3
mΩ
Drain-Source On-Resistance
Gate-Source Threshold Voltage
RDS(ON)
ID
= -2.5V, = -3.7A
65
ID
= -1.8V, = -1.7A
-
85
mΩ
VGS(th)
ID
-0.6
-1.5
V
3
= VDS, I =-250µA
Dynamic Characteristics
Symbol
Parameters
Test Conditions
VGS
Min
Typ
934
Max
Units Notes
Input Capacitance
-
-
-
-
-
-
C
ISS
=0V,
Output Capacitance
VDS =-10V
93.7
30.3
pF
C
OSS
RSS
Reverse Transfer Capacitance
f=1MHz
C
Switching Characteristics
Symbol
Parameters
Turn-On Delay Time
Rise Time
Test Conditions
VDS = -10V ,
VGS = -10V,
RG = 1Ω,
Min
Typ
36.1
21.7
59.4
5
Max
Units
Notes
-
-
-
-
-
-
-
-
-
-
-
-
-
-
T
D(ON)
T
R
ns
Turn-Off Delay Time
Fall Time
T
D(OFF)
RL= 10Ω,
T
F
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
6.2
Q
G
VDS = -10V ,
VGS = -2.5V,
ID = -5.1A
2.8
nC
Q
GS
2.3
Q
GD
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 3
CTL0432PS-R3
P-Channel Enhancement MOSFET
Drain-Source Diode Characteristics
Symbol
Parameters
Test Conditions
= -4.1A
Min
Typ
-0.8
-
Max
-1.2
-4.1
Units
Notes
Body Diode Forward Voltage
Body Diode Continuous Current
V
GS = 0V, I
D
-
-
V
A
VSD
1
ISD
Note:
1.The power dissipation is limited by 150 junction temperature.
2.
Device mounted on a glass-epoxy board
FR-4
25.4 × 25.4 mm .
2 Oz Copper
Test Board
The data tested by pulsed , pulse width
300 s , duty cycle
2%
3.
4.Thermal Resistance follow JESD51-3.
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 4
CTL0432PS-R3
P-Channel Enhancement MOSFET
Typical Characteristic Curves
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 5
CTL0432PS-R3
P-Channel Enhancement MOSFET
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 6
CTL0432PS-R3
P-Channel Enhancement MOSFET
Test Circuits & Waveforms
Figure 9: Gate Charge Test Circuit
Figure 10: Gate Charge Waveform
Figure 11: Switching Time Test Circuit
Figure 12: Switching Time Waveform
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
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CTL0432PS-R3
P-Channel Enhancement MOSFET
Package Dimension (SOT-23)
Note: Dimensions in mm
Recommended pad layout for surface mount leadform
Note: Dimensions in mm
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
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CTL0432PS-R3
P-Channel Enhancement MOSFET
Marking Information
0432: Device Number
Ordering Information
Part Number
Description
Quantity
CTL0432PS-R3
SOT-23 Reel
3000 pcs
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
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CTL0432PS-R3
P-Channel Enhancement MOSFET
Reflow Profile
Profile Feature
Pb-Free Assembly Profile
150°C
Temperature Min. (Tsmin)
Temperature Max. (Tsmax)
Time (ts) from (Tsmin to Tsmax)
Ramp-up Rate (tL to tP)
200°C
60-120 seconds
3°C/second max.
217°C
Liquidous Temperature (TL)
Time (tL) Maintained Above (TL)
Peak Body Package Temperature
Time (tP) within 5°C of 260°C
Ramp-down Rate (TP to TL)
Time 25°C to Peak Temperature
60 – 150 seconds
260°C +0°C / -5°C
30 seconds
6°C/second max
8 minutes max.
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
Page 10
CTL0432PS-R3
P-Channel Enhancement MOSFET
DISCLAIMER
CT MICRO RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. CT MICRO DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
______________________________________________________________________________________
CT MICRO ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL OF CT MICRO INTERNATIONAL CORPORATION.
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical
implant into the body, or (b) support or sustain life,
or (c) whose failure to perform when properly used
in accordance with instruction for use provided in
the labelling, can be reasonably expected to result
in significant injury to the user.
2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.
CT Micro
Proprietary & Confidential
Rev 2
Jun, 2015
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