CY15E064Q [CYPRESS]

64-Kbit (8K × 8) Serial (SPI) Automotive F-RAM;
CY15E064Q
型号: CY15E064Q
厂家: CYPRESS    CYPRESS
描述:

64-Kbit (8K × 8) Serial (SPI) Automotive F-RAM

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中文:  中文翻译
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CY15E064Q  
64-Kbit (8K × 8) Serial (SPI) Automotive  
F-RAM  
64-Kbit (8K  
× 8) Serial (SPI) Automotive F-RAM  
Features  
Functional Description  
64-Kbit ferroelectric random access memory (F-RAM) logically  
organized as 8K × 8  
High-endurance 10 trillion (1013) read/writes  
121-year data retention (See the Data Retention and  
Endurance table)  
NoDelay™ writes  
Advanced high-reliability ferroelectric process  
The CY15E064Q is a 64-Kbit nonvolatile memory employing an  
advanced ferroelectric process. A ferroelectric random access  
memory or F-RAM is nonvolatile and performs reads and writes  
similar to a RAM. It provides reliable data retention for 121 years  
while eliminating the complexities, overhead, and system level  
reliability problems caused by serial flash, EEPROM, and other  
nonvolatile memories.  
Very fast serial peripheral interface (SPI)  
Up to 16MHz frequency  
Direct hardware replacement for serial flash and EEPROM  
Supports SPI mode 0 (0, 0) and mode 3 (1, 1)  
Unlike serial flash and EEPROM, the CY15E064Q performs  
write operations at bus speed. No write delays are incurred. Data  
is written to the memory array immediately after each byte is  
successfully transferred to the device. The next bus cycle can  
commence without the need for data polling. In addition, the  
product offers substantial write endurance compared with other  
nonvolatile memories. The CY15E064Q is capable of supporting  
1013 read/write cycles, or 10 million times more write cycles than  
EEPROM.  
Sophisticated write protection scheme  
Hardware protection using the Write Protect (WP) pin  
Software protection using Write Disable instruction  
Software block protection for 1/4, 1/2, or entire array  
These capabilities make the CY15E064Q ideal for nonvolatile  
memory applications requiring frequent or rapid writes.  
Examples range from data collection, where the number of write  
cycles may be critical, to demanding industrial controls where the  
long write time of serial flash or EEPROM can cause data loss.  
Low power consumption  
300 A active current at 1 MHz  
10 A (typ) standby current at +85 C  
Voltage operation: VDD = 4.5 V to 5.5 V  
Automotive-E temperature: –40 C to +125 C  
8-pin small outline integrated circuit (SOIC) package  
AEC Q100 Grade 1 compliant  
The CY15E064Q provides substantial benefits to users of serial  
EEPROM or flash as a hardware drop-in replacement. The  
CY15E064Q uses the high-speed SPI bus, which enhances the  
high-speed write capability of F-RAM technology. The device  
specifications are guaranteed over an automotive-e temperature  
range of –40 C to +125 C.  
Restriction of hazardous substances (RoHS) compliant  
Logic Block Diagram  
WP  
Instruction Decoder  
CS  
Clock Generator  
Control Logic  
HOLD  
Write Protect  
SCK  
8 K x 8  
F-RAM Array  
Instruction Register  
13  
8
Address Register  
Counter  
SI  
SO  
Data I/O Register  
3
Nonvolatile Status  
Register  
Cypress Semiconductor Corporation  
Document Number: 002-10028 Rev. *B  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised April 12, 2017  
CY15E064Q  
Contents  
Pinout ................................................................................3  
Pin Definitions ..................................................................3  
Functional Overview ........................................................4  
Memory Architecture ........................................................4  
Serial Peripheral Interface – SPI Bus ..............................4  
SPI Overview ...............................................................4  
SPI Modes ...................................................................5  
Power Up to First Access ............................................6  
Command Structure ....................................................6  
WREN - Set Write Enable Latch .................................6  
WRDI - Reset Write Enable Latch ...............................6  
Status Register and Write Protection .............................6  
RDSR - Read Status Register .....................................7  
WRSR - Write Status Register ....................................7  
Memory Operation ............................................................8  
Write Operation ...........................................................8  
Read Operation ...........................................................8  
HOLD Pin Operation ...................................................9  
Endurance .................................................................10  
Maximum Ratings ...........................................................11  
Operating Range .............................................................11  
DC Electrical Characteristics ........................................11  
Data Retention and Endurance .....................................12  
Example of an F-RAM Life Time  
in an AEC-Q100 Automotive Application .....................12  
Capacitance ....................................................................12  
Thermal Resistance ........................................................12  
AC Test Conditions ........................................................12  
AC Switching Characteristics .......................................13  
Power Cycle Timing .......................................................15  
Ordering Information ......................................................16  
Ordering Code Definitions .........................................16  
Package Diagram ............................................................17  
Acronyms ........................................................................18  
Document Conventions .................................................18  
Units of Measure .......................................................18  
Document History Page .................................................19  
Sales, Solutions, and Legal Information ......................20  
Worldwide Sales and Design Support .......................20  
Products ....................................................................20  
PSoC® Solutions ......................................................20  
Cypress Developer Community .................................20  
Technical Support .....................................................20  
Document Number: 002-10028 Rev. *B  
Page 2 of 20  
CY15E064Q  
Pinout  
Figure 1. 8-pin SOIC pinout  
8
7
6
5
V
CS  
SO  
1
2
3
DD  
HOLD  
SCK  
SI  
Top View  
not to scale  
WP  
V
4
SS  
Pin Definitions  
Pin Name  
I/O Type  
Description  
CS  
Input  
Chip Select. This active LOW input activates the device. When HIGH, the device enters low-power  
standby mode, ignores other inputs, and tristates the output. When LOW, the device internally  
activates the SCK signal. A falling edge on CS must occur before every opcode.  
SCK  
Input  
Serial Clock. All I/O activity is synchronized to the serial clock. Inputs are latched on the rising edge  
and outputs occur on the falling edge. Because the device is synchronous, the clock frequency may  
be any value between 0 and 16 MHz and may be interrupted at any time.  
SI[1]  
SO[1]  
WP  
Input  
Output  
Input  
Serial Input. All data is input to the device on this pin. The pin is sampled on the rising edge of SCK  
and is ignored at other times. It should always be driven to a valid logic level to meet IDD specifications.  
Serial Output. This is the data output pin. It is driven during a read and remains tristated at all other  
times including when HOLD is LOW. Data transitions are driven on the falling edge of the serial clock.  
Write Protect. This active LOW pin prevents write operation to the Status Register when WPEN is  
set to ‘1’. This is critical because other write protection features are controlled through the Status  
Register. A complete explanation of write protection is provided in Status Register and Write Protection  
on page 7. This pin must be tied to VDD if not used. Note that the function of WP is different from the  
FM25040 where it prevents all writes to the part.  
HOLD  
Input  
HOLD Pin. The HOLD pin is used when the host CPU must interrupt a memory operation for another  
task. When HOLD is LOW, the current operation is suspended. The device ignores any transition on  
SCK or CS. All transitions on HOLD must occur while SCK is LOW. This pin must be tied to VDD if not  
used.  
VSS  
VDD  
Power supply Ground for the device. Must be connected to the ground of the system.  
Power supply Power supply input to the device.  
Note  
1. SI may be connected to SO for a single pin data interface.  
Document Number: 002-10028 Rev. *B  
Page 3 of 20  
CY15E064Q  
edge of SCK starting from the first rising edge after CS goes  
active.  
Functional Overview  
The CY15E064Q is a serial F-RAM memory. The memory array  
is logically organized as 8,192 × 8 bits and is accessed using an  
industry standard serial peripheral interface (SPI) bus. The  
functional operation of the F-RAM is similar to serial flash and  
serial EEPROMs. The major difference between the  
CY15E064Q and a serial flash or EEPROM with the same pinout  
is the F-RAM's superior write performance, high endurance, and  
low power consumption.  
The SPI protocol is controlled by opcodes. These opcodes  
specify the commands from the bus master to the slave device.  
After CS is activated, the first byte transferred from the bus  
master is the opcode. Following the opcode, any addresses and  
data are then transferred. The CS must go inactive after an  
operation is complete and before a new opcode can be issued.  
The commonly used terms in the SPI protocol are as follows:  
SPI Master  
Memory Architecture  
The SPI master device controls the operations on a SPI bus. An  
SPI bus may have only one master with one or more slave  
devices. All the slaves share the same SPI bus lines and the  
master may select any of the slave devices using the CS pin. All  
of the operations must be initiated by the master activating a  
slave device by pulling the CS pin of the slave LOW. The master  
also generates the SCK and all the data transmission on SI and  
SO lines are synchronized with this clock.  
When accessing the CY15E064Q, the user addresses 8K  
locations of eight data bits each. These eight data bits are shifted  
in or out serially. The addresses are accessed using the SPI  
protocol, which includes a chip select (to permit multiple devices  
on the bus), an opcode, and a two-byte address. The upper 3 bits  
of the address range are 'don't care' values. The complete  
address of 13 bits specifies each byte address uniquely.  
Most functions of the CY15E064Q are either controlled by the  
SPI interface or handled by on-board circuitry. The access time  
for the memory operation is essentially zero, beyond the time  
needed for the serial protocol. That is, the memory is read or  
written at the speed of the SPI bus. Unlike a serial flash or  
EEPROM, it is not necessary to poll the device for a ready  
condition because writes occur at bus speed. By the time a new  
bus transaction can be shifted into the device, a write operation  
is complete. This is explained in more detail in the interface  
section.  
SPI Slave  
The SPI slave device is activated by the master through the Chip  
Select line. A slave device gets the SCK as an input from the SPI  
master and all the communication is synchronized with this  
clock. An SPI slave never initiates a communication on the SPI  
bus and acts only on the instruction from the master.  
The CY15E064Q operates as an SPI slave and may share the  
SPI bus with other SPI slave devices.  
Chip Select (CS)  
Note The CY15E064Q contains no power management circuits  
other than a simple internal power-on reset circuit. It is the user’s  
responsibility to ensure that VDD is within datasheet tolerances  
to prevent incorrect operation. It is recommended that the part is  
not powered down with chip enable active.  
To select any slave device, the master needs to pull down the  
corresponding CS pin. Any instruction can be issued to a slave  
device only while the CS pin is LOW. When the device is not  
selected, data through the SI pin is ignored and the serial output  
pin (SO) remains in a high-impedance state.  
Note A new instruction must begin with the falling edge of CS.  
Therefore, only one opcode can be issued for each active Chip  
Select cycle.  
Serial Peripheral Interface – SPI Bus  
The CY15E064Q is a SPI slave device and operates at speeds  
up to 16 MHz. This high-speed serial bus provides  
high-performance serial communication to a SPI master. Many  
common microcontrollers have hardware SPI ports allowing a  
direct interface. It is quite simple to emulate the port using  
ordinary port pins for microcontrollers that do not. The  
CY15E064Q operates in SPI Mode 0 and 3.  
Serial Clock (SCK)  
The Serial Clock is generated by the SPI master and the  
communication is synchronized with this clock after CS goes  
LOW.  
The CY15E064Q enables SPI modes 0 and 3 for data  
communication. In both of these modes, the inputs are latched  
by the slave device on the rising edge of SCK and outputs are  
issued on the falling edge. Therefore, the first rising edge of SCK  
signifies the arrival of the first bit (MSB) of a SPI instruction on  
the SI pin. Further, all data inputs and outputs are synchronized  
with SCK.  
SPI Overview  
The SPI is a four-pin interface with Chip Select (CS), Serial Input  
(SI), Serial Output (SO), and Serial Clock (SCK) pins.  
The SPI is a synchronous serial interface, which uses clock and  
data pins for memory access and supports multiple devices on  
the data bus. A device on the SPI bus is activated using the CS  
pin.  
Data Transmission (SI/SO)  
The SPI data bus consists of two lines, SI and SO, for serial data  
communication. SI is also referred to as Master Out Slave In  
(MOSI) and SO is referred to as Master In Slave Out (MISO). The  
master issues instructions to the slave through the SI pin, while  
The relationship between chip select, clock, and data is dictated  
by the SPI mode. This device supports SPI modes 0 and 3. In  
both of these modes, data is clocked into the F-RAM on the rising  
Document Number: 002-10028 Rev. *B  
Page 4 of 20  
CY15E064Q  
the slave responds through the SO pin. Multiple slave devices  
may share the SI and SO lines as described earlier.  
these three bits are ‘don’t care’, Cypress recommends that these  
bits be set to 0s to enable seamless transition to higher memory  
densities.  
The CY15E064Q has two separate pins for SI and SO, which can  
be connected with the master as shown in Figure 2.  
Serial Opcode  
For a microcontroller that has no dedicated SPI bus, a  
general-purpose port may be used. To reduce hardware  
resources on the controller, it is possible to connect the two data  
pins (SI, SO) together and tie off (HIGH) the HOLD and WP pins.  
Figure 3 shows such a configuration, which uses only three pins.  
After the slave device is selected with CS going LOW, the first  
byte received is treated as the opcode for the intended operation.  
CY15E064Q uses the standard opcodes for memory accesses.  
Invalid Opcode  
If an invalid opcode is received, the opcode is ignored and the  
device ignores any additional serial data on the SI pin until the  
next falling edge of CS, and the SO pin remains tristated.  
Most Significant Bit (MSB)  
The SPI protocol requires that the first bit to be transmitted is the  
Most Significant Bit (MSB). This is valid for both address and  
data transmission.  
Status Register  
CY15E064Q has an 8-bit Status Register. The bits in the Status  
Register are used to configure the device. These bits are  
described in Table 3 on page 7.  
The 64-Kbit serial F-RAM requires a 2-byte address for any read  
or write operation. Because the address is only 13 bits, the first  
three bits which are fed in are ignored by the device. Although  
Figure 2. System Configuration with SPI port  
SCK  
MOSI  
MISO  
SCK  
CY15E064Q  
HOLD WP  
SCK  
CY15E064Q  
HOLD WP  
SI SO  
SI SO  
SPI  
Microcontroller  
CS  
CS  
C S 1  
H O LD 1  
W P 1  
C S 2  
H O LD 2  
W P 2  
Figure 3. System Configuration without SPI port  
P1.0  
P1.1  
SCK  
CY15E064Q  
HOLD WP  
SI SO  
Microcontroller  
CS  
P1.2  
For both these modes, the input data is latched in on the rising  
SPI Modes  
edge of SCK starting from the first rising edge after CS goes  
active. If the clock starts from a HIGH state (in mode 3), the first  
rising edge after the clock toggles is considered. The output data  
is available on the falling edge of SCK.  
CY15E064Q may be driven by a microcontroller with its SPI  
peripheral running in either of the following two modes:  
SPI Mode 0 (CPOL = 0, CPHA = 0)  
SPI Mode 3 (CPOL = 1, CPHA = 1)  
Document Number: 002-10028 Rev. *B  
Page 5 of 20  
CY15E064Q  
The two SPI modes are shown in Figure 4 and Figure 5. The  
status of the clock when the bus master is not transferring data is:  
WREN - Set Write Enable Latch  
The CY15E064Q will power up with writes disabled. The WREN  
command must be issued before any write operation. Sending  
the WREN opcode allows the user to issue subsequent opcodes  
for write operations. These include writing the Status Register  
(WRSR) and writing the memory (WRITE).  
SCK remains at 0 for Mode 0  
SCK remains at 1 for Mode 3  
The device detects the SPI mode from the status of the SCK pin  
when the device is selected by bringing the CS pin LOW. If the  
SCK pin is LOW when the device is selected, SPI Mode 0 is  
assumed and if the SCK pin is HIGH, it works in SPI Mode 3.  
Sending the WREN opcode causes the internal Write Enable  
Latch to be set. A flag bit in the Status Register, called WEL,  
indicates the state of the latch. WEL = ’1’ indicates that writes are  
permitted. Attempting to write the WEL bit in the Status Register  
has no effect on the state of this bit – only the WREN opcode can  
set this bit. The WEL bit will be automatically cleared on the rising  
edge of CS following a WRDI, a WRSR, or a WRITE operation.  
This prevents further writes to the Status Register or the F-RAM  
array without another WREN command. Figure 6 illustrates the  
WREN command bus configuration.  
Figure 4. SPI Mode 0  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
Figure 6. WREN Bus Configuration  
7
6
5
4
3
2
1
0
MSB  
LSB  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
Figure 5. SPI Mode 3  
0
0
0
0
0
1
1
0
CS  
0
1
2
3
4
5
6
7
HI-Z  
SO  
SCK  
WRDI - Reset Write Enable Latch  
The WRDI command disables all write activity by clearing the  
Write Enable Latch. The user can verify that writes are disabled  
by reading the WEL bit in the Status Register and verifying that  
WEL is equal to ‘0’. Figure 7 illustrates the WRDI command bus  
configuration.  
SI  
7
6
5
4
3
2
1
0
MSB  
LSB  
Power Up to First Access  
The CY15E064Q is not accessible for a tPU time after power up.  
Users must comply with the timing parameter tPU, which is the  
minimum time from VDD (min) to the first CS LOW.  
Figure 7. WRDI Bus Configuration  
CS  
Command Structure  
0
1
2
3
4
5
6
7
There are six commands, called opcodes, that can be issued by  
the bus master to the CY15E064Q. They are listed in Table 1.  
These opcodes control the functions performed by the memory.  
SCK  
SI  
0
0
0
0
0
0
1
0
Table 1. Opcode commands  
HI-Z  
Name  
WREN  
Description  
Set write enable latch  
Write disable  
Opcode  
0000 0110b  
0000 0100b  
0000 0101b  
0000 0001b  
0000 0011b  
0000 0010b  
SO  
WRDI  
RDSR  
WRSR  
READ  
WRITE  
Read Status Register  
Write Status Register  
Read memory data  
Write memory data  
Document Number: 002-10028 Rev. *B  
Page 6 of 20  
CY15E064Q  
is organized as follows. (The default value shipped from the  
factory for bits in the Status Register is ‘0’.)  
Status Register and Write Protection  
The write protection features of the CY15E064Q are multi-tiered  
and are enabled through the status register. The Status Register  
Table 2. Status Register  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
WPEN (0)  
X (0)  
X (0)  
X (0)  
BP1 (0)  
BP0 (0)  
WEL (0)  
X (0)  
Table 3. Status Register Bit Definition  
Bit Definition  
Don’t care  
Description  
Bit 0  
This bit is non-writable and always returns ‘0’ upon read.  
Bit 1 (WEL)  
Write Enable Latch  
WEL indicates if the device is write enabled. This bit defaults to ‘0’ (disabled) on power-up.  
WEL = ‘1’ --> Write enabled  
WEL = ‘0’ --> Write disabled  
Bit 2 (BP0)  
Bit 3 (BP1)  
Bit 4-6  
Block Protect bit ‘0’  
Block Protect bit ‘1’  
Don’t care  
Used for block protection. For details, see Table 4.  
Used for block protection. For details, see Table 4.  
These bits are non-writable and always return ‘0’ upon read.  
Bit 7 (WPEN)  
Write Protect Enable bit Used to enable the function of Write Protect Pin (WP). For details, see Table 5.  
Bits 0 and 4-6 are fixed at ‘0’; none of these bits can be modified.  
Note that bit 0 (“Ready or Write in progress” bit in serial flash and  
EEPROM) is unnecessary, as the F-RAM writes in real-time and  
is never busy, so it reads out as a ‘0’. The BP1 and BP0 control  
the software write-protection features and are nonvolatile bits.  
The WEL flag indicates the state of the Write Enable Latch.  
Attempting to directly write the WEL bit in the Status Register has  
no effect on its state. This bit is internally set and cleared via the  
WREN and WRDI commands, respectively.  
write to the Status Register. Thus the Status Register is  
write-protected only when WPEN = ‘1’ and WP = ‘0’.  
Table 5 summarizes the write protection conditions.  
Table 5. Write Protection  
Protected Unprotected  
Status  
Register  
WEL WPEN WP  
Blocks  
Blocks  
0
1
1
1
X
0
1
1
X
X
0
1
Protected  
Protected  
Protected  
Protected Unprotected Unprotected  
Protected Unprotected Protected  
Protected Unprotected Unprotected  
BP1 and BP0 are memory block write protection bits. They  
specify portions of memory that are write-protected as shown in  
Table 4.  
Table 4. Block Memory Write Protection  
RDSR - Read Status Register  
BP1  
BP0  
Protected Address Range  
None  
The RDSR command allows the bus master to verify the  
contents of the Status Register. Reading the status register  
provides information about the current state of the  
write-protection features. Following the RDSR opcode, the  
CY15E064Q will return one byte with the contents of the Status  
Register.  
0
0
1
1
0
1
0
1
1800h to 1FFFh (upper 1/4)  
1000h to 1FFFh (upper 1/2)  
0000h to 1FFFh (all)  
WRSR - Write Status Register  
The BP1 and BP0 bits and the Write Enable Latch are the only  
mechanisms that protect the memory from writes. The remaining  
write protection features protect inadvertent changes to the block  
protect bits.  
The WRSR command allows the SPI bus master to write into the  
Status Register and change the write protect configuration by  
setting the WPEN, BP0 and BP1 bits as required. Before issuing  
a WRSR command, the WP pin must be HIGH or inactive. Note  
that on the CY15E064Q, WP only prevents writing to the Status  
Register, not the memory array. Before sending the WRSR  
command, the user must send a WREN command to enable  
writes. Executing a WRSR command is a write operation and  
therefore, clears the Write Enable Latch.  
The write protect enable bit (WPEN) in the Status Register  
controls the effect of the hardware write protect (WP) pin. When  
the WPEN bit is set to ‘0’, the status of the WP pin is ignored.  
When the WPEN bit is set to ‘1’, a LOW on the WP pin inhibits a  
Document Number: 002-10028 Rev. *B  
Page 7 of 20  
CY15E064Q  
Figure 8. RDSR Bus Configuration  
CS  
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
SCK  
Opcode  
SI  
0
0
0
0
0
1
0
1
Data  
D7 D6 D5 D4 D3 D2 D1 D0  
MSB LSB  
HI-Z  
SO  
Figure 9. WRSR Bus Configuration (WREN not shown)  
CS  
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
SCK  
Data  
Opcode  
SI  
1
0
0
0
0
0
0
0
D7  
MSB  
X
X
X
D3 D2  
X
X
LSB  
HI-Z  
SO  
EEPROMs use page buffers to increase their write throughput.  
This compensates for the technology's inherently slow write  
operations. F-RAM memories do not have page buffers because  
each byte is written to the F-RAM array immediately after it is  
clocked in (after the eighth clock). This allows any number of  
bytes to be written without page buffer delays.  
Memory Operation  
The SPI interface, which is capable of a high clock frequency,  
highlights the fast write capability of the F-RAM technology.  
Unlike serial flash and EEPROMs, the CY15E064Q can perform  
sequential writes at bus speed. No page register is needed and  
any number of sequential writes may be performed.  
Note If the power is lost in the middle of the write operation, only  
the last completed byte will be written.  
Write Operation  
All writes to the memory begin with a WREN opcode. The WRITE  
opcode is followed by a two-byte address containing the 13-bit  
address (A12–A0) of the first data byte to be written into the  
memory. The upper three bits of the two-byte address are  
ignored. Subsequent bytes are data bytes, which are written  
sequentially. Addresses are incremented internally as long as  
the bus master continues to issue clocks and keeps CS LOW. If  
the last address of 1FFFh is reached, the counter will roll over to  
0000h. Data is written MSB first. The rising edge of CS  
terminates a write operation. A write operation is shown in Figure  
10 on page 9.  
Read Operation  
After the falling edge of CS, the bus master can issue a READ  
opcode. Following the READ command is a two-byte address  
containing the 13-bit address (A12–A0) of the first byte of the  
read operation. The upper three bits of the address are ignored.  
After the opcode and address are issued, the device drives out  
the read data on the next eight clocks. The SI input is ignored  
during read data bytes. Subsequent bytes are data bytes, which  
are read out sequentially. Addresses are incremented internally  
as long as the bus master continues to issue clocks and CS is  
LOW. If the last address of 1FFFh is reached, the counter will roll  
over to 0000h. Data is read MSB first. The rising edge of CS  
terminates a read operation and tristates the SO pin. A read  
operation is shown in Figure 11 on page 9.  
Note When a burst write reaches a protected block address, the  
automatic address increment stops and all the subsequent data  
bytes received for write will be ignored by the device.  
Document Number: 002-10028 Rev. *B  
Page 8 of 20  
CY15E064Q  
Figure 10. Memory Write (WREN not shown)  
CS  
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
12 13 14 15  
0
1
2
3
4
5
6
7
SCK  
Opcode  
13-bit Address  
A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0  
LSB MSB LSB  
Data  
SI  
0
0
0
0
0
0
1
0
X
X
X
A12 A11 A10 A9 A8  
MSB  
HI-Z  
SO  
Figure 11. Memory Read  
CS  
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
12 13 14 15  
0
1
2
3
4
5
6
7
SCK  
Opcode  
13-bit Address  
SI  
0
0
0
0
0
0
1
1
X
X
X
A12 A11 A10 A9 A8  
A3 A2 A1 A0  
LSB  
MSB  
Data  
D7 D6 D5 D4 D3 D2 D1 D0  
MSB LSB  
HI-Z  
SO  
HIGH while SCK is LOW will resume an operation. The  
transitions of HOLD must occur while SCK is LOW, but the SCK  
and CS pin can toggle during a hold state.  
HOLD Pin Operation  
The HOLD pin can be used to interrupt a serial operation without  
aborting it. If the bus master pulls the HOLD pin LOW while SCK  
is LOW, the current operation will pause. Taking the HOLD pin  
Figure 12. HOLD Operation[2]  
CS  
SCK  
HOLD  
SI  
VALID IN  
VALID IN  
SO  
Note  
2. Figure shows HOLD operation for input mode and output mode.  
Document Number: 002-10028 Rev. *B  
Page 9 of 20  
CY15E064Q  
F-RAM read and write endurance is virtually unlimited even at a  
16 MHz clock rate.  
Endurance  
The CY15E064Q devices are capable of being accessed at least  
1013 times, reads or writes. An F-RAM memory operates with a  
read and restore mechanism. Therefore, an endurance cycle is  
applied on a row basis for each access (read or write) to the  
memory array. The F-RAM architecture is based on an array of  
rows and columns of 1K rows of 64-bits each. The entire row is  
internally accessed once whether a single byte or all eight bytes  
are read or written. Each byte in the row is counted only once in  
an endurance calculation. Table 6 shows endurance calculations  
for a 64-byte repeating loop, which includes an opcode, a starting  
address, and a sequential 64-byte data stream. This causes  
each byte to experience one endurance cycle through the loop.  
Table 6. Time to Reach Endurance Limit for Repeating  
64-byte Loop  
SCK Freq Endurance  
Endurance  
Years to Reach  
Limit  
(MHz)  
Cycles/sec Cycles/year  
4
1
7,480  
1,870  
2.36 × 1011  
5.88 × 1010  
42.3  
170.1  
Document Number: 002-10028 Rev. *B  
Page 10 of 20  
CY15E064Q  
Package power  
dissipation capability (TA = 25 °C) ............................... 1.0 W  
Maximum Ratings  
Exceeding maximum ratings may shorten the useful life of the  
device. These user guidelines are not tested.  
Surface mount lead  
soldering temperature (3 seconds) .......................... +260C  
Storage temperature ................................ –55 C to +150 C  
DC output current (1 output at a time, 1s duration) .... 15 mA  
Maximum accumulated storage time  
Electrostatic Discharge Voltage [3]  
Human Body Model (AEC-Q100-002 Rev. E) ....................... 2 kV  
At 150 °C ambient temperature ................................. 1000 h  
At 125 °C ambient temperature ................................11000 h  
At 85 °C ambient temperature .............................. 121 Years  
Charged Device Model (AEC-Q100-011 Rev. B) ................. 500 V  
Latch up current .....................................................> 140 mA  
Ambient temperature  
with power applied ................................... –55 °C to +125 °C  
Operating Range  
Supply voltage on VDD relative to VSS .........–1.0 V to +7.0 V  
Input voltage ............. –1.0 V to +7.0 V and VIN < VDD+1.0 V  
Range  
Ambient Temperature (TA)  
VDD  
Automotive-E  
–40 C to +125 C  
4.5 V to 5.5 V  
DC voltage applied to outputs  
in High Z state ....................................0.5 V to VDD + 0.5 V  
Transient voltage (< 20 ns)  
on any pin to ground potential ............2.0 V to VDD + 2.0 V  
DC Electrical Characteristics  
Over the Operating Range  
Parameter  
VDD  
Description  
Power supply  
Test Conditions  
Min  
4.5  
Typ [4]  
Max  
5.5  
0.3  
1.2  
3.2  
Unit  
V
5.0  
IDD  
VDD supply current  
SCK toggling between fSCK = 1 MHz  
mA  
mA  
mA  
VDD – 0.3 V and VSS  
other inputs  
VSS or VDD – 0.3 V.  
SO = Open.  
,
f
SCK = 4 MHz  
SCK = 16 MHz  
f
ISB  
VDD standby current  
CS = VDD. All other TA = 85 °C  
10  
A  
A  
A  
A  
V
inputs VSS or VDD  
.
TA = 125 °C  
30  
ILI  
Input leakage current  
Output leakage current  
Input HIGH voltage  
Input LOW voltage  
Output HIGH voltage  
Output LOW voltage  
VSS < VIN < VDD  
±1  
ILO  
VIH  
VIL  
VOH  
VOL  
VSS < VOUT < VDD  
±1  
0.75 × VDD  
– 0.3  
VDD + 0.3  
0.25 × VDD  
V
IOH = –2 mA  
IOL = 2 mA  
VDD – 0.8  
0.4  
V
V
[5]  
VHYS  
Input Hysteresis (CS and SCK  
pin)  
0.05 × VDD  
V
Notes  
3. Electrostatic Discharge voltages specified in the datasheet are the AEC-Q100 standard limits used for qualifying the device. To know the maximum value device passes  
for, please refer to the device qualification report available on the website.  
4. Typical values are at 25 °C, V = V (typ). Not 100% tested.  
DD  
DD  
5. This parameter is characterized but not 100% tested.  
Document Number: 002-10028 Rev. *B  
Page 11 of 20  
CY15E064Q  
Data Retention and Endurance  
Parameter  
TDR  
Description  
Data retention  
Test condition  
Min  
11000  
11  
Max  
Unit  
Hours  
Years  
TA = 125 C  
TA = 105 C  
TA = 85 C  
121  
1013  
NVC  
Endurance  
Over operating temperature  
Cycles  
Example of an F-RAM Life Time in an AEC-Q100 Automotive Application  
An application does not operate under a steady temperature for the entire usage life time of the application. Instead, it is often expected  
to operate in multiple temperature environments throughout the application’s usage life time. Accordingly, the retention specification  
for F-RAM in applications often needs to be calculated cumulatively. An example calculation for a multi-temperature thermal profiles  
is given below.  
AccelerationFactorwithrespecttoTmax  
A [6]  
Profile Factor  
P
Profile Life Time  
L (P)  
Tempeature  
T
Time Factor  
t
1
Ea 1  
1
LP= P LTmax  
---------------  
------- ---   
-------------------------------------------------------  
P =  
Tmax  
k
T
LT  
LTmax  
t1  
t2  
t3  
t4  
------------------------  
A =  
= e  
------- ------- ------- -------  
+
+
+
A1 A2 A3 A4  
T1 = 125 C  
T2 = 105 C  
T3 = 85 C  
T4 = 55 C  
t1 = 0.1  
t2 = 0.15  
t3 = 0.25  
t4 = 0.50  
A1 = 1  
A2 = 8.67  
8.33  
> 10.46 Years  
A3 = 95.68  
A4 = 6074.80  
Capacitance  
Parameter [7]  
Description  
Test Conditions  
Max  
8
Unit  
CO  
CI  
Output pin capacitance (SO)  
Input pin capacitance  
TA = 25 C, f = 1 MHz, VDD = VDD(typ)  
pF  
pF  
6
Thermal Resistance  
Description  
Test Conditions  
8-pin SOIC  
Unit  
Parameter  
JA  
Thermal resistance  
(junction to ambient)  
Test conditions follow standard test methods and  
procedures for measuring thermal impedance, per EIA /  
JESD51.  
147  
C/W  
JC  
Thermal resistance  
(junction to case)  
47  
C/W  
AC Test Conditions  
Input pulse levels .................................10% and 90% of VDD  
Input rise and fall times ...................................................5 ns  
Input and output timing reference levels ................0.5 × VDD  
Output load capacitance .............................................. 30 pF  
Notes  
-5  
6. Where k is the Boltzmann constant 8.617 × 10 eV/K, Tmax is the highest temperature specified for the product, and T is any temperature within the F-RAM product  
specification. All temperatures are in Kelvin in the equation.  
7. This parameter is characterized but not 100% tested.  
Document Number: 002-10028 Rev. *B  
Page 12 of 20  
CY15E064Q  
AC Switching Characteristics  
Over the Operating Range  
Parameters [8]  
Description  
Min  
Max  
Min  
Max  
Unit  
Cypress  
Alt. Parameter  
Parameter  
fSCK  
tCH  
SCK Clock frequency  
0
100  
100  
100  
100  
4
0
25  
25  
10  
10  
16  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Clock HIGH time  
Clock LOW time  
Chip select setup  
Chip select hold  
Output disable time  
Output data valid time  
Output hold time  
Deselect time  
tCL  
tCSU  
tCSH  
tCSS  
tCSH  
tHZCS  
tCO  
[9, 10]  
tOD  
tODV  
tOH  
tD  
100  
75  
20  
25  
0
0
100  
60  
[11, 12]  
tR  
Data in rise time  
Data in fall time  
50  
50  
50  
50  
[11, 12]  
tF  
tSU  
tH  
tHS  
tHH  
tSD  
tHD  
tSH  
tHH  
tHHZ  
tHLZ  
Data setup time  
30  
20  
70  
40  
5
Data hold time  
5
HOLD setup time  
HOLD hold time  
HOLD LOW to HI-Z  
HOLD HIGH to data active  
10  
10  
[9, 10]  
tHZ  
100  
50  
20  
20  
[10]  
tLZ  
Notes  
8. Test conditions assume a signal transition time of 5 ns or less, timing reference levels of 0.5 × V , input pulse levels of 10% to 90% of V , and output loading of  
DD  
DD  
the specified I /I and 30 pF load capacitance shown in AC Test Conditions on page 12.  
OL OH  
9.  
t
and t are specified with a load capacitance of 5 pF. Transition is measured when the outputs enter a high impedance state.  
OD HZ  
10. This parameter is characterized but not 100% tested.  
11. Rise and fall times measured between 10% and 90% of waveform.  
12. These parameters are guaranteed by design and are not tested.  
Document Number: 002-10028 Rev. *B  
Page 13 of 20  
CY15E064Q  
Figure 13. Synchronous Data Timing (Mode 0)  
t
D
CS  
SCK  
SI  
t
t
t
CSU  
CH  
CL  
t
CSH  
t
t
SU  
H
VALID IN  
VALID IN  
VALID IN  
t
t
t
OD  
OH  
ODV  
HI-Z  
HI-Z  
SO  
Figure 14. HOLD Timing  
CS  
SCK  
t
t
HH  
HH  
t
t
HS  
HS  
HOLD  
SI  
t
SU  
t
VALID IN  
VALID IN  
t
HZ  
LZ  
SO  
Document Number: 002-10028 Rev. *B  
Page 14 of 20  
CY15E064Q  
Power Cycle Timing  
Over the Operating Range  
Parameter  
Description  
Min  
Max  
Unit  
Power-up VDD(min) to first access (CS LOW)  
Last access (CS HIGH) to power-down (VDD(min))  
VDD power-up ramp rate  
1
ms  
tPU  
tPD  
tVR  
tVF  
0
µs  
[13]  
[13]  
30  
20  
µs/V  
µs/V  
VDD power-down ramp rate  
Figure 15. Power Cycle Timing  
V
V
DD(min)  
DD(min)  
t
t
VR  
V
VF  
DD  
t
t
PU  
PD  
CS  
Note  
13. Slope measured at any point on V waveform.  
DD  
Document Number: 002-10028 Rev. *B  
Page 15 of 20  
CY15E064Q  
Ordering Information  
Package  
Diagram  
Operating  
Range  
Ordering Code  
Package Type  
CY15E064Q-SXE  
CY15E064Q-SXET  
51-85066 8-pin SOIC  
51-85066 8-pin SOIC  
Automotive-E  
All these parts are Pb-free. Contact your local Cypress sales representative for availability of these parts.  
Ordering Code Definitions  
CY 15  
E
064 Q - S  
X
E
X
Option: X = blank or T  
blank = Standard; T = Tape and Reel  
Temperature Range:  
E = Automotive-E (–40 C to +125 C)  
X = Pb-free  
Package Type: S = 8-pin SOIC  
Q = SPI F-RAM  
Density: 064 = 64-kbit  
Voltage: E = 4.5 V to 5.5 V  
F-RAM  
Company ID: CY = Cypress  
Document Number: 002-10028 Rev. *B  
Page 16 of 20  
CY15E064Q  
Package Diagram  
Figure 16. 8-pin SOIC (150 Mils) Package Outline, 51-85066  
51-85066 *H  
Document Number: 002-10028 Rev. *B  
Page 17 of 20  
CY15E064Q  
Acronyms  
Document Conventions  
Units of Measure  
Acronym  
Description  
AEC  
Automotive Electronics Council  
Clock Phase  
Symbol  
°C  
Unit of Measure  
CPHA  
CPOL  
degree Celsius  
hertz  
Clock Polarity  
Hz  
kHz  
K  
Kbit  
kV  
MHz  
A  
s  
EEPROM Electrically Erasable Programmable Read-Only  
Memory  
kilohertz  
kilohm  
EIA  
Electronic Industries Alliance  
Input/Output  
kilobit  
I/O  
kilovolt  
JEDEC  
JESD  
LSB  
Joint Electron Devices Engineering Council  
JEDEC Standards  
megahertz  
microampere  
microsecond  
milliampere  
millisecond  
nanosecond  
ohm  
Least Significant Bit  
MSB  
F-RAM  
RoHS  
SPI  
Most Significant Bit  
mA  
ms  
ns  
Ferroelectric Random Access Memory  
Restriction of Hazardous Substances  
Serial Peripheral Interface  
Small Outline Integrated Circuit  
SOIC  
%
percent  
pF  
V
picofarad  
volt  
W
watt  
Document Number: 002-10028 Rev. *B  
Page 18 of 20  
CY15E064Q  
Document History Page  
Document Title: CY15E064Q, 64-Kbit (8K × 8) Serial (SPI) Automotive F-RAM  
Document Number: 002-10028  
Orig. of  
Change  
Submission  
Date  
Rev.  
ECN No.  
Description of Change  
**  
5023918  
5568261  
GVCH  
GVCH  
12/02/2015 New data sheet.  
*A  
01/27/2017 Changed status from Preliminary to Final.  
Updated Maximum Ratings:  
Updated Electrostatic Discharge Voltage (in compliance with AEC-Q100  
standard):  
Changed value of “Human Body Model” from 4 kV to 2 kV.  
Changed value of “Charged Device Model” from 1.25 kV to 500 V.  
Removed Machine Model related information.  
Updated Ordering Information:  
Updated part numbers.  
Updated to new template.  
*B  
5693278  
GVCH  
04/12/2017 Updated Maximum Ratings:  
Added Note 3 and referred the same note in “Electrostatic Discharge Voltage”.  
Updated to new template.  
Document Number: 002-10028 Rev. *B  
Page 19 of 20  
CY15E064Q  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
®
Products  
PSoC Solutions  
ARM® Cortex® Microcontrollers  
cypress.com/arm  
cypress.com/automotive  
cypress.com/clocks  
cypress.com/interface  
cypress.com/iot  
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP  
Automotive  
Cypress Developer Community  
Clocks & Buffers  
Interface  
Forums | WICED IOT Forums | Projects | Video | Blogs |  
Training | Components  
Internet of Things  
Memory  
Technical Support  
cypress.com/memory  
cypress.com/mcu  
cypress.com/support  
Microcontrollers  
PSoC  
cypress.com/psoc  
Power Management ICs  
Touch Sensing  
USB Controllers  
Wireless Connectivity  
cypress.com/pmic  
cypress.com/touch  
cypress.com/usb  
cypress.com/wireless  
© Cypress Semiconductor Corporation, 2015–2017. This document is the property of Cypress Semiconductor Corporation and its subsidiaries, including Spansion LLC ("Cypress"). This document,  
including any software or firmware included or referenced in this document ("Software"), is owned by Cypress under the intellectual property laws and treaties of the United States and other countries  
worldwide. Cypress reserves all rights under such laws and treaties and does not, except as specifically stated in this paragraph, grant any license under its patents, copyrights, trademarks, or other  
intellectual property rights. If the Software is not accompanied by a license agreement and you do not otherwise have a written agreement with Cypress governing the use of the Software, then Cypress  
hereby grants you a personal, non-exclusive, nontransferable license (without the right to sublicense) (1) under its copyright rights in the Software (a) for Software provided in source code form, to  
modify and reproduce the Software solely for use with Cypress hardware products, only internally within your organization, and (b) to distribute the Software in binary code form externally to end users  
(either directly or indirectly through resellers and distributors), solely for use on Cypress hardware product units, and (2) under those claims of Cypress's patents that are infringed by the Software (as  
provided by Cypress, unmodified) to make, use, distribute, and import the Software solely for use with Cypress hardware products. Any other use, reproduction, modification, translation, or compilation  
of the Software is prohibited.  
TO THE EXTENT PERMITTED BY APPLICABLE LAW, CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS DOCUMENT OR ANY SOFTWARE  
OR ACCOMPANYING HARDWARE, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. To the extent  
permitted by applicable law, Cypress reserves the right to make changes to this document without further notice. Cypress does not assume any liability arising out of the application or use of any  
product or circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is  
the responsibility of the user of this document to properly design, program, and test the functionality and safety of any application made of this information and any resulting product. Cypress products  
are not designed, intended, or authorized for use as critical components in systems designed or intended for the operation of weapons, weapons systems, nuclear installations, life-support devices or  
systems, other medical devices or systems (including resuscitation equipment and surgical implants), pollution control or hazardous substances management, or other uses where the failure of the  
device or system could cause personal injury, death, or property damage ("Unintended Uses"). A critical component is any component of a device or system whose failure to perform can be reasonably  
expected to cause the failure of the device or system, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim,  
damage, or other liability arising from or related to all Unintended Uses of Cypress products. You shall indemnify and hold Cypress harmless from and against all claims, costs, damages, and other  
liabilities, including claims for personal injury or death, arising from or related to any Unintended Uses of Cypress products.  
Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, WICED, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in  
the United States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners.  
Document Number: 002-10028 Rev. *B  
Revised April 12, 2017  
Page 20 of 20  

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