CY62127BV_02 [CYPRESS]

1M (64K x 16) Static RAM; 1M ( 64K ×16 )静态RAM
CY62127BV_02
型号: CY62127BV_02
厂家: CYPRESS    CYPRESS
描述:

1M (64K x 16) Static RAM
1M ( 64K ×16 )静态RAM

文件: 总11页 (文件大小:343K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
®
CY62127BV MoBL  
1M (64K x 16) Static RAM  
significantly reduces power consumption when addresses are  
not toggling, or when deselected (CE HIGH or both BLE and  
BHE are HIGH). The input/output pins (I/O0 through I/O15) are  
placed in a high-impedance state when: deselected (CE  
HIGH), outputs are disabled (OE HIGH), both Byte High  
Enable and Byte Low Enable are disabled (BHE, BLE HIGH),  
or during a write operation (CE LOW, and WE LOW).  
Features  
High Speed: 55 ns and 70 ns  
Wide voltage range: 2.7V3.6V  
Low active power  
54 mW (max.) (15 mA)  
Low standby power (70 ns)  
Writing to the device is accomplished by taking Chip Enable  
(CE) and Write Enable (WE) inputs LOW. If Byte Low Enable  
(BLE) is LOW, then data from I/O pins (I/O1 through I/O8), is  
written into the location specified on the address pins (A0  
through A15). If Byte High Enable (BHE) is LOW, then data  
from I/O pins (I/O9 through I/O16) is written into the location  
specified on the address pins (A0 through A15).  
54 µW (max.) (15 µA)  
Easy memory expansion with CE and OE features  
Automatic power-down when deselected  
CMOS for optimum speed/power  
Package available in a 44-pin TSOP Type II (forward  
pinout) and a 48-ball fBGA package  
Reading from the device is accomplished by taking Chip  
Enable (CE) and Output Enable (OE) LOW while forcing the  
Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW,  
then data from the memory location specified by the address  
pins will appear on I/O0 to I/O7. If Byte High Enable (BHE) is  
LOW, then data from memory will appear on I/O8 to I/O15. See  
the truth table at the back of this data sheet for a complete  
description of read and write modes.  
Functional Description[1]  
The CY62127BV MoBL® MoBL® is a high-performance  
CMOS static RAM organized as 64K words by 16 bits. This  
device features advanced circuit design to provide ultra-low  
active current. This is ideal for providing More Battery Life  
(MoBL) in portable applications such as cellular telephones.  
The device also has an automatic power-down feature that  
Logic Block Diagram  
DATA IN DRIVERS  
A
10  
9
A
A
8
A
7
A
A
64K x 16  
6
RAM Array  
2048 X 512  
I/O I/O  
5
0
7
A
4
I/O I/O  
A
8
15  
3
A
A
2
1
A
0
COLUMN DECODER  
BHE  
WE  
CE  
OE  
BLE  
CE  
Power -Down  
Circuit  
BHE  
BLE  
Note:  
1. For best practice recommendations, please refer to the Cypress application note System Design Guidelineson http://www.cypress.com.  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose  
CA 95134  
408-943-2600  
Document #: 38-05155 Rev. *B  
Revised August 27, 2002  
®
CY62127BV MoBL  
Pin Configurations[2]  
FBGA (Top View)  
TSOP II (Forward)  
Top View  
1
2
4
3
5
6
44  
1
A
A
5
4
A
A
A
2
NC  
OE  
BLE  
0
1
A
B
C
43  
42  
41  
40  
39  
38  
A
A
2
3
4
5
6
3
6
A
A
2
7
OE  
A
A
A
4
I/O BHE  
8
CE  
I/O  
I/O  
0
1
3
BHE  
BLE  
I/O  
A
0
CE  
A
A
6
I/O I/O  
I/O  
2
5
I/O  
9
10  
1
7
0
15  
37  
36  
35  
34  
33  
I/O  
I/O  
8
I/O  
I/O  
1
2
14  
13  
12  
9
V
NC  
A
7
V
I/O  
I/O  
3
CC  
D
E
F
SS  
11  
10  
11  
12  
13  
I/O  
V
SS  
I/O  
3
CC  
V
SS  
V
DNU NC  
V
CC  
SS  
I/O  
I/O  
V
V
12  
4
CC  
32  
I/O  
I/O  
I/O  
4
5
6
7
11  
10  
31  
30  
29  
28  
I/O  
I/O  
I/O  
14  
15  
16  
A
A
15  
I/O  
I/O  
I/O  
I/O  
6
14  
13  
5
14  
I/O  
I/O  
9
8
WE 17  
NC  
A
A
G
H
I/O  
NC  
WE  
I/O  
7
13  
12  
15  
18  
27  
26  
25  
A
A
8
15  
19  
A
A
14  
13  
9
10  
11  
A
A
A
A
A
20  
21  
22  
A
A
NC  
NC  
10  
9
11  
8
A
12  
24  
23  
NC  
NC  
DC Input Voltage[3].................................... −0.5V to VCC + 0.5V  
Maximum Ratings  
Output Current into Outputs (LOW)............................. 20 mA  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Static Discharge Voltage........................................... >2001V  
(per MIL-STD-883, Method 3015)  
Storage Temperature .................................65°C to +150°C  
Latch-up Current..................................................... >200 mA  
Ambient Temperature with  
Power Applied.............................................55°C to +125°C  
Operating Range  
Supply Voltage to Ground Potential................. 0.5V to 4.6V  
Ambient  
DC Voltage Applied to Outputs  
Range  
Temperature  
VCC  
in High-Z State[3] ....................................0.5V to VCC + 0.5V  
Industrial  
40°C to +85°C  
2.7V to 3.6V  
Product Portfolio  
Power Dissipation (Industrial)  
Operating, ICC  
VCC Range (V)  
(mA) f = fmax  
Standby, ISB2 (µA)  
[4]  
Product  
VCC(min.) VCC(typ.)  
2.7 3.0  
VCC(max.)  
Speed (ns)  
Max.  
20  
Typ.[4]  
Max.  
CY62127BV  
MoBL®  
3.6  
55  
70  
0.5  
15  
15  
Notes:  
2. NC pins are not connected to the die.  
3. VIL(min.) = 2.0V for pulse durations less than 20 ns.  
4. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ.), TA = 25°C.  
Document #: 38-05155 Rev. *B  
Page 2 of 11  
®
CY62127BV MoBL  
Electrical Characteristics Over the Operating Range  
CY62127BV  
MoBL®-55  
CY62127BV  
MoBL®-70  
Parameter  
VOH  
Description  
Test Conditions  
Min. Typ.[4] Max. Min. Typ.[4] Max. Unit  
Output HIGH Voltage IOH = 1.0 mA  
Output LOW Voltage IOL = 2.1 mA  
Input HIGH Voltage  
VCC = 2.7V  
VCC = 2.7V  
2.2  
2.2  
V
V
V
VOL  
0.4  
0.4  
VIH  
2.0  
VCC  
+
2.0  
VCC +  
0.3V  
0.4  
+1  
0.3V  
0.4  
+1  
VIL  
IIX  
Input LOW Voltage  
0.3  
1  
0.3  
1  
V
Input Leakage Current GND < VI < VCC  
µA  
µA  
IOZ  
Output Leakage  
Current  
GND < VI< VCC, Output Disabled  
1  
+1  
1  
+1  
ICC  
VCC Operating Supply  
Current  
f = fMAX = 1/tRC VCC = 3.6V  
IOUT = 0 mA  
20  
2
15  
2
mA  
mA  
CMOS Levels  
ISB1  
Automatic CE  
Max. VCC, CE VIH  
Power-Down  
VIN VIH or VIN VIL, f = fMAX  
CurrentTTL Inputs  
ISB2  
Automatic CE  
Power-Down  
CurrentCMOS  
Inputs  
Max. VCC, CE VCC 0.3V,  
IN VCC 0.3V, or VIN 0.3V,  
f = 0  
0.5  
15  
0.5  
15  
V
µA  
Capacitance[5]  
Parameter  
CIN  
Description  
Input Capacitance  
Output Capacitance  
Test Conditions  
TA = 25°C, f = 1 MHz,  
Max.  
Unit  
pF  
9
9
VCC = 3.3V  
COUT  
pF  
Thermal Resistance  
Description  
Test Conditions  
Symbol  
BGA  
Unit  
Thermal Resistance  
Still Air, soldered on a 4.25 x 1.125 inch, 4-layer printed  
circuit board  
ΘJA  
55  
°C/W  
(Junction to Ambient)[5]  
Thermal Resistance  
(Junction to Case)[5]  
ΘJC  
16  
°C/W  
AC Test Loads and Waveforms  
R1  
V
ALL INPUT PULSES  
90%  
10%  
CC  
V
Typ  
CC  
OUTPUT  
90%  
10%  
GND  
Rise TIme: 1 V/ns  
R2  
30 pF  
Fall Time: 1 V/ns  
INCLUDING  
JIG AND  
SCOPE  
Equivalent to:  
THÉVENIN EQUIVALENT  
R
TH  
OUTPUT  
V
TH  
Note:  
5. Tested initially and after any design or process changes that may affect these parameters.  
Document #: 38-05155 Rev. *B  
Page 3 of 11  
®
CY62127BV MoBL  
Parameters  
3.0V  
1.076  
1.262  
0.581  
1.620  
Unit  
R1  
R2  
K Ohms  
K Ohms  
K Ohms  
Volts  
RTH  
VTH  
Data Retention Characteristics (Over the Operating Range)  
Parameter  
Description  
VCC for Data Retention  
Conditions  
Min. Typ.[4] Max. Unit  
VDR  
2.0  
3.6  
V
VCC= VDR = 2.0V, CE > VCC 0.3V, VIN > VCC  
0.3V or VIN < 0.3V  
ICCDR  
Data Retention Current  
0.5  
15  
µA  
[5]  
tCDR  
Chip Deselect to Data Retention Time  
Operation Recovery Time  
0
ns  
ns  
[6]  
tR  
tRC  
Data Retention Waveform[7]  
DATA RETENTION MODE  
3.0 V  
3.0 V  
V
> 2.0 V  
V
CC  
DR  
t
t
R
CDR  
CE or  
BHE.BLE  
[8]  
Switching Characteristics Over the Operating Range  
55 ns  
70 ns  
Parameter  
Read Cycle  
Description  
Min.  
55  
Max.  
Min.  
70  
Max.  
Unit  
tRC  
Read Cycle Time  
Address to Data Valid  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
55  
70  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
Data Hold from Address Change  
CE LOW to Data Valid  
10  
10  
55  
25  
70  
35  
OE LOW to Data Valid  
OE LOW to Low Z[9]  
OE HIGH to High Z[9, 11]  
CE LOW to Low Z[9]  
CE HIGH to High Z[9, 11]  
5
10  
0
5
10  
0
20  
20  
25  
25  
CE LOW to Power-Up  
tPD  
CE HIGH to Power-Down  
BHE / BLE LOW to Data Valid  
BHE / BLE LOW to Low Z[9]  
BHE / BLE HIGH to High Z[9, 11]  
55  
55  
70  
70  
tDBE  
[10]  
tLZBE  
5
5
tHZBE  
20  
25  
Write Cycle[12]  
tWC  
Write Cycle Time  
55  
45  
70  
60  
ns  
ns  
tSCE  
CE LOW to Write End  
Notes:  
6. Full Device AC operation requires linear VCC ramp from VDR to VCC(min.) > 100 µs or stable at VCC(min.) > 100 µs.  
7. BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.  
8. Test conditions assume signal transition time of 5 ns or less, timing reference levels of VCC(typ.)/2, input pulse levels of 0 to VCC(typ.), and output loading of the  
specified IOL/IOH and 30-pF load capacitance.  
9. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any  
given device.  
10. If both byte enables are toggled together this value is 10 ns.  
11. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high impedance state.  
12. The internal write time of the memory is defined by the overlap of WE, CE = VIL, BHE and/or BLE = VIL. All signals must be ACTIVE to initiate a write and any  
of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates  
the write.  
Document #: 38-05155 Rev. *B  
Page 4 of 11  
®
CY62127BV MoBL  
Switching Characteristics Over the Operating Range (continued)[8]  
55 ns  
70 ns  
Parameter  
Description  
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
WE Pulse Width  
Min.  
45  
0
Max.  
Min.  
60  
0
Max.  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAW  
tHA  
tSA  
0
0
tPWE  
tBW  
tSD  
40  
45  
25  
0
50  
60  
30  
0
BHE / BLE Pulse Width  
Data Set-Up to Write End  
Data Hold from Write End  
WE LOW to High Z[9, 11]  
WE HIGH to Low Z[9]  
tHD  
tHZWE  
tLZWE  
25  
25  
5
5
Switching Waveforms  
[13, 14]  
Read Cycle No. 1 (Address Transition Controlled)  
t
RC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
Read Cycle No. 2 (OE Controlled)[14, 15]  
ADDRESS  
CE  
t
RC  
t
PD  
HZCE  
t
t
ACE  
OE  
t
HZOE  
tDOE  
BHE/BLE  
t
LZOE  
t
HZBE  
t
DBE  
t
LZBE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
DATA VALID  
t
LZCE  
t
PU  
V
I
CC  
CC  
SUPPLY  
CURRENT  
50%  
50%  
I
SB  
Notes:  
13. Device is continuously selected. OE, CE = VIL, BHE, BLE = VIL  
14. WE is HIGH for read cycle.  
.
15. Address valid prior to or coincident with CE, BHE, BLE transition LOW.  
Document #: 38-05155 Rev. *B  
Page 5 of 11  
®
CY62127BV MoBL  
Switching Waveforms (continued)  
Write Cycle No. 1 (WE Controlled)[12, 16, 17]  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
BW  
BHE/BLE  
OE  
t
t
SD  
HD  
DATA  
DATA I/O  
VALID  
IN  
NOTE  
18  
t
HZOE  
[12, 16, 17]  
Write Cycle No. 2 (CE Controlled)  
t
WC  
ADDRESS  
CE  
t
SCE  
tSA  
t
t
HA  
AW  
t
PWE  
WE  
t
BW  
BHE/BLE  
OE  
t
t
SD  
HD  
VALID  
DATA  
DATA I/O  
IN  
NOTE  
18  
t
HZOE  
Notes:  
16. Data I/O is high-impedance if OE = VIH  
.
17. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.  
18. During this period, the I/Os are in output state and input signals should not be applied.  
Document #: 38-05155 Rev. *B  
Page 6 of 11  
®
CY62127BV MoBL  
Switching Waveforms (continued)  
[17]  
Write Cycle No. 3 (WE Controlled, OE LOW)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
BW  
BHE/BLE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
t
HD  
SD  
NOTE 18  
DATAI/O  
DATA VALID  
IN  
t
LZWE  
t
HZWE  
[17]  
Write Cycle No. 4 (BHE/BLE Controlled, OE LOW)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
t
BW  
BHE/BLE  
WE  
t
SA  
t
PWE  
t
SD  
t
HD  
DATA I/O  
VALID  
DATA  
NOTE 18  
IN  
Truth Table  
CE  
H
X
WE  
X
OE  
X
BHE  
X
BLE  
X
Inputs/Outputs  
Mode  
Power  
High Z  
Deselect/Power-Down  
Deselect/Power-Down  
Read  
Standby (ISB  
Standby (ISB  
Active (ICC  
Active (ICC  
)
X
X
H
H
High Z  
)
L
H
L
L
L
Data Out (I/OOI/O15  
)
)
L
H
L
H
L
Data Out (I/OOI/O7);  
I/O8I/O15 in High Z  
Read  
)
L
H
L
L
H
Data Out (I/O8I/O15);  
I/O0I/O7 in High Z  
Read  
Active (ICC)  
L
L
H
H
H
H
L
L
L
High Z  
High Z  
Output Disabled  
Output Disabled  
Active (ICC  
)
H
Active (ICC  
)
Document #: 38-05155 Rev. *B  
Page 7 of 11  
®
CY62127BV MoBL  
Truth Table (continued)  
CE  
L
WE  
H
L
OE  
H
BHE  
L
BLE  
H
Inputs/Outputs  
Mode  
Power  
High Z  
Data In (I/OOI/O15  
Data In (I/OOI/O7)  
Output Disabled  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
)
L
X
L
L
)
Write  
)
L
L
X
H
L
Write Lower Byte Only  
Write Upper Byte Only  
)
L
L
X
L
H
Data In (I/O8I/O15  
)
)
Ordering Information  
Speed  
Package  
Name  
Operating  
Range  
(ns)  
Ordering Code  
CY62127BVLL-55ZI  
CY62127BVLL-70ZI  
CY62127BVLL-70BAI  
CY62127BVLL-70BVI  
Package Type  
55  
Z44  
44-lead TSOP II  
Industrial  
70  
BA48A  
BV48A  
48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)  
48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)  
Package Diagrams  
48-Ball (7.00 mm x 7.00 mm x 1.2 mm) FBGA BA48A  
51-85096-* E  
Document #: 38-05155 Rev. *B  
Page 8 of 11  
®
CY62127BV MoBL  
Package Diagrams (continued)  
44-pin TSOP II Z44  
51-85087-A  
Document #: 38-05155 Rev. *B  
Page 9 of 11  
®
CY62127BV MoBL  
Package Diagrams (continued)  
.
48-Lead VFBGA (6 x 8 x 1 mm) BV48A  
51-85150-**  
MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor. All products and company  
names mentioned in this document may be trademarks of their respective holders.  
Document #: 38-05155 Rev. *B  
Page 10 of 11  
© Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use  
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize  
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress  
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.  
®
CY62127BV MoBL  
Document Title: CY62127BV MoBL® 1M (64K x 16) Static RAM  
Document Number: 38-05155  
REV.  
ECN NO.  
Issue  
Date  
Orig. of  
Change  
Description of Change  
**  
*A  
*B  
109899  
113307  
116362  
10/02/01  
03/01/02  
09/04/02  
SZV  
MGN  
GBI  
Change from Spec number: 38-01018 to 38-05155  
Format standardization & update ordering information  
Add footnote 1 and BV Package.  
Document #: 38-05155 Rev. *B  
Page 11 of 11  

相关型号:

CY62127DV18

1M (64K x 16) Static RAM
CYPRESS

CY62127DV18L-55BVI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV18L-55ZI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV18LL-55BVI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV18LL-55ZI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV18_05

1 Mb (64K x 16) Static RAM
CYPRESS

CY62127DV20

1M (64K x 16) Static RAM
CYPRESS

CY62127DV20L-55BVI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV20L-55ZI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV20LL-55BVI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV20LL-55ZI

1M (64K x 16) Static RAM
CYPRESS

CY62127DV30

1 Mb (64K x 16) Static RAM
CYPRESS