CY7S1041G [CYPRESS]

4-Mbit (256K words × 16 bit) Static RAM with PowerSnooze™ and Error Correcting Code (ECC);
CY7S1041G
型号: CY7S1041G
厂家: CYPRESS    CYPRESS
描述:

4-Mbit (256K words × 16 bit) Static RAM with PowerSnooze™ and Error Correcting Code (ECC)

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CY7S1041G  
CY7S1041GE  
4-Mbit (256K words × 16 bit) Static RAM  
with PowerSnooze™ and Error Correcting Code (ECC)  
4-Mbit (256K words  
× 16 bit) Static RAM with PowerSnooze™ and Error Correcting Code (ECC)  
Deep-Sleep input (DS) must be deasserted HIGH for normal  
operating mode.  
Features  
High speed  
Access time (tAA) = 10 ns / 15 ns  
To perform data writes, assert the Chip Enable (CE) and Write  
Enable (WE) inputs LOW, and provide the data and address on  
device data pins (I/O0 through I/O15) and address pins (A0  
through A17) respectively. The Byte High Enable (BHE) and Byte  
Low Enable (BLE) inputs control byte writes, and write data on  
the corresponding I/O lines to the memory location specified.  
BHE controls I/O8 through I/O15 and BLE controls I/O0 through  
I/O7.  
Ultra-low power Deep-Sleep (DS) current  
IDS = 15 µA  
Low active and standby currents  
Active Current ICC = 38-mA typical  
Standby Current ISB2 = 6-mA typical  
Wide operating voltage range: 1.65 V to 2.2 V, 2.2 V to 3.6 V,  
To perform data reads, assert the Chip Enable (CE) and Output  
Enable (OE) inputs LOW and provide the required address on  
the address lines. Read data is accessible on the I/O lines (I/O0  
through I/O15). You can perform byte accesses by asserting the  
required byte enable signal (BHE or BLE) to read either the  
upper byte or the lower byte of data from the specified address  
location  
4.5 V to 5.5 V  
Embedded ECC for single-bit error correction[1]  
1.0-V data retention  
TTL- compatible inputs and outputs  
Error indication (ERR) pin to indicate 1-bit error detection and  
correction  
The device is placed in a low-power Deep-Sleep mode when the  
Deep-Sleep input (DS) is asserted LOW. In this state, the device  
is disabled for normal operation and is placed in a low power data  
retention mode. The device can be activated by deasserting the  
Deep-Sleep input (DS) to HIGH.  
Available in Pb-free 44-pin TSOP II and 48-ball VFBGA  
Functional Description  
The CY7S1041G is a high-performance PowerSnoozestatic  
RAM organized as 256K words × 16 bits. This device features  
fast access times (10 ns) and a unique ultra-low power  
Deep-Sleep mode. With Deep-Sleep mode currents as low as  
15 µA, the CY7S1041G/ CY7S1041GE devices combine the  
best features of fast and low- power SRAMs in industry-standard  
package options. The device also features embedded ECC. logic  
which can detect and correct single-bit errors in the accessed  
location.  
The CY7S1041G is available in 44-pin TSOP II, 48-ball VFBGA  
and 44-pin (400-mil) Molded SOJ.  
Product Portfolio  
Power Dissipation  
Operating ICC  
,
Speed  
(ns)  
Standby, ISB2  
Deep-Sleep  
current (µA)  
Product [2]  
Range  
VCC Range (V)  
(mA)  
(mA)  
f = fmax  
Typ [3] Max Typ [3] Max Typ [3] Max  
CY7S1041G(E)18  
1.65 V–2.2 V  
2.2 V–3.6 V  
4.5–5.5 V  
15  
10  
10  
40  
45  
45  
6
8
15  
CY7S1041G(E)30 Industrial  
CY7S1041G(E)  
38  
38  
Notes  
1. This device does not support automatic write back on error detection.  
2. ERR pin is available only for devices which have ERR option “E” in the ordering code. Refer Ordering Information for details.  
3. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = 1.8 V (for V range of 1.65 V – 2.2 V),  
CC  
CC  
V
= 3 V (for V range of 2.2 V – 3.6 V), and V = 5 V (for V range of 4.5 V – 5.5 V), T = 25 °C.  
CC  
CC CC CC A  
Cypress Semiconductor Corporation  
Document Number: 001-92576 Rev. *E  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised November 19, 2015  
CY7S1041G  
CY7S1041GE  
Logic Block Diagram – CY7S1041G / CY7S1041GE  
ECC ENCODER  
INPUT BUFFER  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
ERR (Optional)  
I/O0I/O7  
MEMORY  
ARRAY  
I/O8I/O15  
COLUMN DECODER  
BHE  
WE  
CE2  
CE1  
POWER MANAGEMENT  
BLOCK  
DS  
OE  
BLE  
Document Number: 001-92576 Rev. *E  
Page 2 of 21  
CY7S1041G  
CY7S1041GE  
Contents  
Pin Configurations ...........................................................4  
Maximum Ratings .............................................................6  
Operating Range ...............................................................6  
DC Electrical Characteristics ..........................................6  
Capacitance ......................................................................7  
Thermal Resistance ..........................................................7  
AC Test Loads and Waveforms .......................................7  
Data Retention Characteristics .......................................8  
Data Retention Waveform ................................................8  
Deep-Sleep Mode Characteristics ...................................9  
AC Switching Characteristics .......................................10  
Switching Waveforms ....................................................11  
Truth Table ......................................................................15  
ERR Output – CY7S1041GE ...........................................15  
Ordering Information ......................................................16  
Ordering Code Definitions .........................................16  
Package Diagrams ..........................................................17  
Acronyms ........................................................................19  
Document Conventions .................................................19  
Units of Measure .......................................................19  
Document History Page .................................................20  
Sales, Solutions, and Legal Information ......................21  
Worldwide Sales and Design Support .......................21  
Products ....................................................................21  
PSoC® Solutions ......................................................21  
Cypress Developer Community .................................21  
Technical Support .....................................................21  
Document Number: 001-92576 Rev. *E  
Page 3 of 21  
CY7S1041G  
CY7S1041GE  
Pin Configurations  
Figure 1. 44-pin TSOP II pinout, CY7S1041G  
A0  
A1  
A17  
A16  
1
2
44  
43  
A2  
3
42 A15  
/OE  
41  
A3  
4
A4  
5
40 /BHE  
39 /BLE  
38 I/O15  
/CE  
I/O0  
I/O1  
I/O2  
I/O3  
VCC  
6
7
I/O14  
I/O13  
I/O12  
VSS  
8
37  
36  
35  
34  
9
10  
11  
VSS 12  
33 VCC  
I/O4  
I/O5  
I/O6  
I/O7  
/WE  
A5  
I/O11  
I/O10  
I/O9  
I/O8  
/DS  
13  
14  
15  
16  
17  
18  
19  
20  
21  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
A14  
A13  
A12  
A11  
A10  
A6  
A7  
A8  
A9 22  
Figure 2. 48-ball VFBGA (6 × 8 × 1.0 mm) Single Chip Enable Figure 3. 48-ball VFBGA (6 × 8 × 1.0 mm) Single Chip Enable  
without ERR, CY7S1041G [4], Package/Grade ID: BVJXI [6] with ERR, CY7S1041GE [4, 5], Package/Grade ID: BVJXI [6]  
1
BLE  
I/O8  
I/O9  
2
OE  
3
4
A1  
5
A2  
6
1
BLE  
I/O8  
I/O9  
2
OE  
3
4
A1  
5
A2  
6
A0  
A0  
DS  
I/O0  
I/O2  
VCC  
VSS  
I/O6  
A
B
C
D
DS  
I/O0  
I/O2  
VCC  
VSS  
I/O6  
A
B
C
D
BHE  
I/O10  
A3  
A5  
A4  
CE  
BHE  
I/O10  
A3  
A5  
A4  
CE  
I/O1  
I/O3  
I/O4  
I/O5  
WE  
A11  
A6  
I/O1  
I/O3  
I/O4  
I/O5  
WE  
A11  
A6  
VSS I/O11  
VCC I/O12  
I/O14 I/O13  
A17  
NC  
A14  
A12  
A9  
A7  
VSS I/O11  
A17  
A7  
A16  
A15  
A13  
A10  
VCC I/O12 ERR  
A16  
A15  
A13  
A10  
E
F
E
F
I/O14 I/O13  
A14  
A12  
A9  
I/O15  
NC  
NC  
A8  
I/O7  
NC  
I/O15  
NC  
NC  
A8  
I/O7  
NC  
G
H
G
H
Notes  
4. NC pins are not connected internally to the die.  
5. ERR is an output pin.  
6. Package type BVJXI is JEDEC compliant compared to package type BVXI. The difference between the two is that the higher and lower byte I/Os (I/O  
balls are swapped.  
and I/O  
[15:8]  
[7:0]  
Document Number: 001-92576 Rev. *E  
Page 4 of 21  
CY7S1041G  
CY7S1041GE  
Pin Configurations (continued)  
Figure 4. 48-ball VFBGA (6 × 8 × 1.0 mm) Single Chip Enable Figure 5. 48-ball VFBGA (6 × 8 × 1.0 mm) Single Chip Enable  
without ERR, CY7S1041G [7], Package/Grade ID: BVXI [9] with ERR, CY7S1041GE [7, 8], Package/Grade ID: BVXI [9]  
1
BLE  
I/O0  
I/O1  
VSS  
VCC  
I/O6  
I/O7  
NC  
2
OE  
3
4
A1  
5
A2  
6
DS  
1
2
3
4
A1  
5
A2  
6
DS  
A0  
A
B
C
D
BLE  
OE  
A0  
A
B
C
D
BHE  
I/O2  
I/O3  
I/O4  
I/O5  
NC  
A3  
A5  
A4  
CE  
I/O8  
I/O9  
I/O0 BHE  
A3  
A5  
A4  
CE  
I/O8  
A6  
I/O10  
I/O1  
I/O2  
I/O3  
A6  
I/O10 I/O9  
I/O11 VCC  
I/O12 VSS  
I/O13 I/O14  
A17  
NC  
A14  
A12  
A9  
A7  
I/O11 VCC  
I/O12 VSS  
I/O13 I/O14  
VSS  
A17  
A7  
VCC I/O4 ERR  
A16  
A15  
A13  
A10  
A16  
A15  
A13  
A10  
E
F
E
F
I/O6  
I/O7  
NC  
I/O5  
NC  
A8  
A14  
A12  
A9  
WE  
A11  
I/O15  
NC  
WE  
A11  
I/O15  
NC  
G
H
G
H
A8  
Notes  
7. NC pins are not connected internally to the die.  
8. ERR is an output pin.  
9. Package type BVJXI is JEDEC compliant compared to package type BVXI. The difference between the two is that the higher and lower byte I/Os (I/O  
balls are swapped.  
and I/O  
[15:8]  
[7:0]  
Document Number: 001-92576 Rev. *E  
Page 5 of 21  
CY7S1041G  
CY7S1041GE  
DC input voltage [10] ........................... –0.5 V to VCC + 0.5 V  
Current into outputs (LOW) ........................................ 20 mA  
Maximum Ratings  
Exceeding maximum ratings may impair the useful life of the  
device. These user guidelines are not tested.  
Static discharge voltage  
(MIL-STD-883, Method 3015) .................................> 2001 V  
Storage temperature ................................ –65 C to +150 C  
Latch-up current ....................................................> 140 mA  
Ambient temperature  
with power applied ................................... –55 C to +125 C  
Operating Range  
Supply voltage  
Range  
Ambient Temperature  
VCC  
on VCC relative to GND [10] .........................–0.5 V to + 6.0 V  
1.65 V to 2.2 V,  
2.2 V to 3.6 V,  
4.5 V to 5.5 V  
DC voltage applied to outputs  
Industrial  
–40 C to +85 C  
in HI-Z State [10] ..................................0.5 V to VCC + 0.5 V  
DC Electrical Characteristics  
Over the Operating Range of –40 C to +85 C  
10 ns/ 15 ns  
Parameter  
VOH  
Description  
Test Conditions  
Unit  
Max  
Min  
Typ[11]  
Output HIGH  
1.65 V to 2.2 V  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
4.5 V to 5.5 V  
4.5 V to 5.5 V  
1.65 V to 2.2 V  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
3.6 V to 5.5 V  
1.65 V to 2.2 V  
2.2 V to 2.7 V  
2.7 V to 3.6 V  
3.6 V to 5.5 V  
VCC = Min, IOH = –0.1 mA  
VCC = Min, IOH = –1.0 mA  
1.4  
voltage  
2
V
V
V
CC = Min, IOH = –4.0 mA  
CC = Min, IOH = –4.0 mA  
CC = Min, IOH = –0.1 mA  
2.2  
V
2.4  
VCC-0.5[13]  
VOL  
Output LOW  
voltage  
VCC = Min, IOL = 0.1 mA  
0.2  
V
V
V
CC = Min, IOL = 2 mA  
CC = Min, IOL = 8 mA  
CC = Min, IOL = 8 mA  
0.4  
V
V
V
0.4  
0.4  
[10, 12]  
VIH  
Input HIGH  
voltage  
1.4  
2
VCC + 0.2  
V
V
V
CC + 0.3  
CC + 0.3  
CC + 0.5  
0.4  
2
2.2  
–0.2  
–0.3  
–0.3  
–0.5  
–1  
–1  
[10, 12]  
VIL  
Input LOW voltage 1.65 V to 2.2 V  
2.2 V to 2.7 V  
0.6  
2.7 V to 3.6 V  
0.8  
3.6 V to 5.5 V  
0.8  
IIX  
Input leakage current  
Output leakage current  
VCC operating supply current  
GND < VIN < VCC  
+1  
A  
A  
IOZ  
ICC  
GND < VOUT < VCC, Output disabled  
+1  
VCC = Max,  
OUT = 0 mA,  
CMOS levels  
f = 100 MHz  
f = 66.7 MHz  
38  
40  
45  
I
mA  
mA  
mA  
µA  
40  
ISB1  
ISB2  
Standby current – TTL inputs  
Standby current – CMOS inputs  
Max VCC, CE > VIH,  
VIN > VIH or VIN < VIL, f = fMAX  
6
15  
8
Max VCC, CE > VCC – 0.2 V,  
DS > VCC – 0.2 V,  
VIN > VCC – 0.2 V or VIN < 0.2 V, f = 0  
IDS  
Deep-Sleep current  
Max VCC, CE > VCC – 0.2 V, DS < 0.2 V,  
IN > VCC – 0.2 V or VIN < 0.2 V, f = 0  
15  
V
Notes  
10. V (min) = –2.0 V and V (max) = V + 2 V for pulse durations of less than 2 ns.  
IL  
IH  
CC  
11. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = 1.8 V (for V range of 1.65 V – 2.2 V),  
CC  
CC  
V
= 3 V (for V range of 2.2V – 3.6 V), and V = 5 V (for V range of 4.5 V – 5.5 V), T = 25 °C.  
CC  
CC CC CC A  
12. For the DS pin, V (min) is V – 0.2 V and V (max) is 0.2 V.  
IH  
CC  
IL  
13. This parameter is guaranteed by design and not tested.  
Document Number: 001-92576 Rev. *E  
Page 6 of 21  
CY7S1041G  
CY7S1041GE  
Capacitance  
Parameter [14]  
Description  
Input capacitance  
I/O capacitance  
Test Conditions  
TA = 25 C, f = 1 MHz, VCC(typ)  
All packages Unit  
CIN  
10  
10  
pF  
pF  
COUT  
Thermal Resistance  
Parameter [14]  
Description  
Test Conditions  
48-ball VFBGA 44-pin TSOP II Unit  
JA  
Thermal resistance  
(junction to ambient)  
Still air, soldered on a 3 × 4.5 inch, four  
layer printed circuit board  
31.35  
68.85  
C/W  
JC  
Thermal resistance  
(junction to case)  
14.74  
15.97  
C/W  
AC Test Loads and Waveforms  
Figure 6. AC Test Loads and Waveforms [15]  
HI-Z Characteristics:  
VCC  
Output  
R1  
50  
Output  
VTH  
Z = 50  
R2  
30 pF*  
0
5 pF*  
* Including  
JIG and  
Scope  
(a)  
(b)  
* Capacitive Load Consists  
of all Components of the  
Test Environment  
All Input Pulses  
V
HIGH  
90%  
10%  
90%  
10%  
GND  
Fall Time:  
> 1 V/ns  
Rise Time:  
> 1 V/ns  
(c)  
Parameters  
R1  
1.8 V  
1667  
1538  
VCC/2  
1.8  
3.0 V  
317  
351  
1.5  
5.0 V  
Unit  
317  
351  
1.5  
R2  
VTH  
V
VHIGH  
3.0  
3.0  
V
Notes  
14. Tested initially and after any design or process changes that may affect these parameters.  
15. Full-device AC operation assumes a 100-s ramp time from 0 to V  
or 100-s wait time after V stabilization.  
CC(min)  
CC  
Document Number: 001-92576 Rev. *E  
Page 7 of 21  
CY7S1041G  
CY7S1041GE  
Data Retention Characteristics  
Over the Operating Range of –40C to +85 C  
Parameter  
VDR  
Description  
Conditions[16]  
Min  
Max  
Unit  
VCC for data retention  
1.0  
V
VCC = VDR, CE > VCC – 0.2 V, DS > VCC – 0.2 V,  
VIN > VCC – 0.2 V or VIN < 0.2 V  
ICCDR  
Data retention current  
0
8
mA  
ns  
Chip deselect to data retention  
time  
[17]  
tCDR  
2.2 V < VCC < 5.5 V  
VCC < 2.2 V  
10  
15  
ns  
ns  
[17, 18]  
tR  
Operation recovery time  
Data Retention Waveform  
Figure 7. Data Retention Waveform [18]  
DATA RETENTION MODE  
VDR = 1.0 V  
VCC  
VCC(min)  
tCDR  
VCC(min)  
tR  
CE  
Notes  
16. DS signal must be HIGH during Data Retention Mode.  
17. These parameters are guaranteed by design  
18. Full-device operation requires linear V ramp from V to V  
100 s or stable at V  
100 s.  
CC(min)  
CC  
DR  
CC(min)  
Document Number: 001-92576 Rev. *E  
Page 8 of 21  
CY7S1041G  
CY7S1041GE  
Deep-Sleep Mode Characteristics  
Over the Operating Range of –40 C to +85 C  
Parameter  
IDS  
Description  
Conditions  
Min  
Max  
Unit  
VCC = VCC (max), DS < 0.2 V,  
IN > VCC – 0.2 V or VIN < 0.2 V  
Deep-Sleep mode current  
15  
µA  
V
Minimum time for DS to be LOW  
for part to successfully exit  
Deep-Sleep mode  
[19]  
tPDS  
100  
1
ns  
DS assertion to Deep-Sleep  
mode transition time  
[20]  
tDS  
ms  
If tPDS > tPDS(min)  
If tPDS < tPDS(min)  
If tPDS > tPDS(min)  
If tPDS < tPDS(min)  
100  
0
s  
s  
[19]  
tDSCD  
DS deassertion to chip disable  
DS deassertion to chip access  
(Active/Standby)  
tDSCA  
300  
s  
Figure 8. Active, Standby, and Deep-Sleep Operation Modes  
Chip  
Access  
Allowed  
Not Allowed  
Allowed  
ENABLE/  
DISABLE  
ENABLE/  
DISABLE  
CE  
DS  
DON’T CARE  
tPDS  
DISABLE  
tDS  
tDSCD  
tDSCA  
Active/Standby  
Mode  
Standby  
Mode  
Active/Standby  
Mode  
Standby  
Mode  
Mode  
Deep Sleep Mode  
Note  
19. CE must be pulled HIGH within t  
time of DS deassertion to avoid SRAM data loss.  
DSCD  
20. After assertion of DS signal, device will take a maximum of t time to stabilize to Deep-Sleep current I . During this period, DS signal must continue to be asserted  
DS  
DS  
to logic level LOW to keep the device in Deep-Sleep mode.  
Document Number: 001-92576 Rev. *E  
Page 9 of 21  
CY7S1041G  
CY7S1041GE  
AC Switching Characteristics  
Over the Operating Range of –40 C to +85 C  
10 ns  
15 ns  
Unit  
Parameter [21]  
Description  
Min  
Max  
Min  
Max  
Read Cycle  
tRC  
Read cycle time  
10  
3
0
3
0
0
10  
15  
3
0
3
0
0
15  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
Address to data valid  
tOHA  
Data hold from address change  
CE LOW to data valid  
tACE  
10  
4.5  
15  
8
tDOE  
OE LOW to data valid  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
OE LOW to low impedance [22, 23, 24]  
OE HIGH to HI-Z [22, 23, 24]  
CE LOW to low impedance [22, 23, 24]  
CE HIGH to HI-Z [22, 23, 24]  
CE LOW to power-up [ 24]  
CE HIGH to power-down [ 24]  
Byte enable to data valid  
5
8
5
8
tPD  
10  
4.5  
15  
8
tDBE  
tLZBE  
tHZBE  
Write Cycle [25, 26]  
Byte enable to low impedance [22, 23, 24]  
Byte disable to HI-Z [22, 23, 24]  
6
8
tWC  
tSCE  
tAW  
Write cycle time  
10  
7
7
0
0
7
5
0
3
7
5
15  
12  
12  
0
8
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CE LOW to write end  
Address setup to write end  
Address hold from write end  
Address setup to write start  
WE pulse width  
tHA  
tSA  
0
tPWE  
tSD  
12  
8
Data setup to write end  
tHD  
Data hold from write end  
WE HIGH to low impedance [22, 23, 24]  
WE LOW to HI-Z [22, 23, 24]  
Byte Enable to End of Write  
0
tLZWE  
tHZWE  
tBW  
3
12  
Notes  
21. Test conditions assume a signal transition time (rise/fall) of 3 ns or less, timing reference levels of 1.5 V (for V > 3 V) and V /2 (for V < 3 V), and input pulse  
CC  
CC  
CC  
levels of 0 to 3 V (for V > 3 V) and 0 to V (for V < 3 V). Testconditionsforthereadcycleuseoutputloadingshowninpart(a)ofFigure6onpage7, unlessspecifiedotherwise.  
CC  
CC  
CC  
22. t  
, t  
, t  
, t  
, t  
, t  
, t  
, and t  
are specified with a load capacitance of 5 pF as in (b) of Figure 6 on page 7. Transition is measured 200 mV from steady  
HZOE HZCE HZWE HZBE LZOE LZCE LZWE  
LZBE  
state voltage.  
23. At any temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any device.  
HZCE  
LZCE HZBE  
LZBE HZOE  
LZOE  
HZWE  
LZWE  
24. These parameters are guaranteed by design  
25. The internal write time of the memory is defined by the overlap of WE = V , CE = V ,DS = V and BHE or BLE = V . WE, CE, BHE and BLE signals must be LOW  
IL  
IL  
IH  
IL  
and DS must be HIGH to initiate a write, and a HIGH transition of any of WE, CE, BHE and BLE signals or LOW transition on DS signal can terminate the operation.  
The input data setup and hold timing should be referenced to the edge of the signal that terminates the write.  
26. The minimum write pulse width for Write Cycle No. 2 (WE Controlled, OE LOW) should be the sum of t  
and t  
.
HZWE  
SD  
Document Number: 001-92576 Rev. *E  
Page 10 of 21  
CY7S1041G  
CY7S1041GE  
Switching Waveforms  
Figure 9. Read Cycle No. 1 of CY7S1041G (Address Transition Controlled) [27, 28, 29]  
tRC  
ADDRESS  
DATA I/O  
tAA  
tOHA  
PREVIOUS DATAOUT  
VALID  
DATAOUT VALID  
Figure 10. Read Cycle No. 2 of CY7S1041GE (Address Transition Controlled) [27, 28, 29]  
tRC  
ADDRESS  
tAA  
tOHA  
PREVIOUS DATAOUT  
VALID  
DATA I/O  
ERR  
DATAOUT VALID  
ERR VALID  
tAA  
tOHA  
PREVIOUS ERR VALID  
Notes  
27. The device is continuously selected. OE = V , CE = V , BHE or BLE or both = V .  
IL  
IL  
IL  
28. WE is HIGH for read cycle.  
29. DS is HIGH for chip access.  
Document Number: 001-92576 Rev. *E  
Page 11 of 21  
CY7S1041G  
CY7S1041GE  
Switching Waveforms (continued)  
Figure 11. Read Cycle No. 3 (OE Controlled) [30, 31, 32]  
ADDRESS  
tRC  
CE  
tPD  
tHZCE  
tACE  
OE  
tHZOE  
tDOE  
tLZOE  
BHE  
BLE  
/
tDBE  
tLZBE  
tHZBE  
HIGH  
HIGH IMPEDANCE  
tLZCE  
tPU  
DATA I /O  
DATA OUT VALID  
IMPEDANCE  
VCC  
SUPPLY  
CURRENT  
ISB  
Notes  
30. WE is HIGH for read cycle.  
31. Address valid prior to or coincident with CE LOW transition.  
32. DS must be HIGH for chip access  
Document Number: 001-92576 Rev. *E  
Page 12 of 21  
CY7S1041G  
CY7S1041GE  
Switching Waveforms (continued)  
Figure 12. Write Cycle No. 1 (CE Controlled) [33, 34, 35]  
tWC  
ADDRESS  
tSA  
tSCE  
CE  
tAW  
tHA  
tPWE  
WE  
tBW  
BHE/  
BLE  
OE  
tHZOE  
tHD  
tSD  
DATA I/O  
DATAIN VALID  
Figure 13. Write Cycle No. 2 (WE Controlled, OE LOW) [33, 34, 35, 36]  
tWC  
ADDRESS  
tSCE  
CE  
tBW  
BHE/  
BLE  
tAW  
tHA  
tSA  
tPWE  
WE  
tLZWE  
tSD  
t
HZWE  
tHD  
DATA I/O  
DATAIN VALID  
Notes  
33. The internal write time of the memory is defined by the overlap of WE = V , CE = V ,DS = V and BHE or BLE = V . WE, CE, BHE and BLE signals must be LOW  
IL  
IL  
IH  
IL  
and DS must be HIGH to initiate a write, and a HIGH transition of any of WE, CE, BHE and BLE signals or LOW transition on DS signal can terminate the operation.  
The input data setup and hold timing should be referenced to the edge of the signal that terminates the write.  
34. Data I/O is in HI-Z state if CE = V , or OE = V or BHE, and/or BLE = V  
.
IH  
IH  
IH  
35. DS must be HIGH for chip access.  
36. The minimum write pulse width for Write Cycle No. 2 (WE Controlled, OE LOW) should be sum of t  
and t  
.
HZWE  
SD  
Document Number: 001-92576 Rev. *E  
Page 13 of 21  
CY7S1041G  
CY7S1041GE  
Switching Waveforms (continued)  
Figure 14. Write Cycle No. 3 (WE Controlled) [37, 38, 39]  
tW C  
A D D R E S S  
tS C E  
C E  
tA W  
tS A  
tH A  
tP W E  
W E  
tB W  
B H E /B L E  
O E  
tH Z O E  
tH D  
tS D  
Note 40  
D A T A I/O  
D A T A IN V A LID  
Figure 15. Write Cycle No. 4 (BLE or BHE Controlled) [37, 38, 39]  
tWC  
ADDRESS  
tSCE  
CE  
tAW  
tSA  
tHA  
tBW  
BHE/  
BLE  
tPWE  
WE  
tHZWE  
tHD  
tSD  
tLZWE  
Note 40  
DATA I/O  
DATAIN VALID  
Notes  
37. The internal write time of the memory is defined by the overlap of WE = V , CE = V ,DS = V and BHE or BLE = V . WE, CE, BHE and BLE signals must be LOW  
IL  
IL  
IH  
IL  
and DS must be HIGH to initiate a write, and a HIGH transition of any of WE, CE, BHE and BLE signals or LOW transition on DS signal can terminate the operation.  
The input data setup and hold timing should be referenced to the edge of the signal that terminates the write.  
38. Data I/O is in HI-Z state if CE = V , or OE = V or DS = V or BHE, and/or BLE = V  
.
IH  
IH  
IL  
IH  
39. DS must be HIGH for chip access.  
40. During this period, the I/Os are in output state. Do not apply input signals.  
Document Number: 001-92576 Rev. *E  
Page 14 of 21  
CY7S1041G  
CY7S1041GE  
Truth Table  
DS CE OE WE BLE BHE I/O0–I/O7 I/O8–I/O15  
Mode  
Power  
H
H
H
L
L
L
L
L
L
L
X
X[41] X[41] X[41] X[41] HIGH-Z  
HIGH-Z  
Data out  
HI-Z  
Standby  
Standby (ISB)  
L
L
H
H
H
L
L
L
L
H
L
Data out  
Data out  
HI-Z  
Read all bits  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
)
)
)
)
)
)
)
H
Read lower bits only  
Read upper bits only  
Write all bits  
H
L
H
L
Data out  
Data in  
HI-Z  
H
X
X
X
H
X
L
Data in  
Data in  
HI-Z  
H
L
L
H
L
Write lower bits only  
Write upper bits only  
Selected, outputs disabled  
Deep-Sleep  
H
L
H
X
X
Data in  
HI-Z  
H
H
X
X
X
HI-Z  
L[42]  
HI-Z  
HI-Z  
Deep-Sleep Ultra Low Power  
(IDS  
)
ERR Output – CY7S1041GE  
Output [43]  
Mode  
0
1
Read operation, no single-bit error in the stored data.  
Read operation, single-bit error detected and corrected.  
Device deselected or outputs disabled or Write operation  
HI-Z  
Notes  
41. The input voltage levels on these pins should be either at V or V .  
IH  
IL  
42. V on DS must be < 0.2 V.  
IL  
43. ERR is an Output pin.If not used, this pin should be left floating.  
Document Number: 001-92576 Rev. *E  
Page 15 of 21  
CY7S1041G  
CY7S1041GE  
Ordering Information  
Speed  
(ns)  
Voltage  
Range  
Package  
Diagram  
Operating  
Range  
Ordering Code  
Package Type (All Pb-free)  
10 2.2 V–3.6 V CY7S1041GE30-10BVXI 51-85150 48-ball VFBGA (6 × 8 × 1.0 mm), ERR output  
Industrial  
CY7S1041G30-10BVXI  
CY7S1041G30-10ZSXI  
51-85150 48-ball VFBGA (6 × 8 × 1.0 mm)  
51-85087 44-pin TSOP II  
4.5 V–5.5 V CY7S1041G-10ZSXI  
51-85087 44-pin TSOP II  
Ordering Code Definitions  
CY 7 1 04 1  
S
G
XX X  
I
E
30 - 10  
Temperature Range:  
I = Industrial  
Pb-free  
Package Type: XX = BV or ZS  
BV = 48-ball VFBGA;  
ZS = 44-pin TSOP II  
Speed: 10 ns  
Voltage Range: No digits or 30 or 18  
No digits = 4.5 V to 5.5 V; 30 = 2.2 V to 3.6 V;18 = 1.65 V to 2.2 V  
ERR output  
Process Technology: Revision Code “G” = 65 nm Technology  
Data Width: 1 = × 16-bits  
Density: 04 = 4-Mbit  
Family Code: 1 = Fast Asynchronous SRAM family  
S = Deep-Sleep feature  
Marketing Code: 7 = SRAM  
Company ID: CY = Cypress  
Document Number: 001-92576 Rev. *E  
Page 16 of 21  
CY7S1041G  
CY7S1041GE  
Package Diagrams  
Figure 16. 44-pin TSOP II Package Outline, 51-85087  
51-85087 *E  
Document Number: 001-92576 Rev. *E  
Page 17 of 21  
CY7S1041G  
CY7S1041GE  
Package Diagrams (continued)  
Figure 17. 48-ball VFBGA (6 × 8 × 1.0 mm) BV48/BZ48 Package Outline, 51-85150  
51-85150 *H  
Document Number: 001-92576 Rev. *E  
Page 18 of 21  
CY7S1041G  
CY7S1041GE  
Acronyms  
Document Conventions  
Units of Measure  
Acronym  
Description  
BHE  
BLE  
Byte High Enable  
Symbol  
°C  
Unit of Measure  
Byte Low Enable  
Chip Enable  
degrees Celsius  
megahertz  
microampere  
microsecond  
milliampere  
millimeter  
nanosecond  
ohm  
MHz  
A  
s  
CE  
CMOS  
ECC  
I/O  
Complementary Metal Oxide Semiconductor  
Error Correcting Code  
mA  
mm  
ns  
Input/Output  
OE  
Output Enable  
SRAM  
TSOP  
TTL  
Static Random Access Memory  
Thin Small Outline Package  
Transistor-Transistor Logic  
Very Fine-Pitch Ball Grid Array  
Write Enable  
%
percent  
pF  
V
picofarad  
volt  
VFBGA  
WE  
W
watt  
Document Number: 001-92576 Rev. *E  
Page 19 of 21  
CY7S1041G  
CY7S1041GE  
Document History Page  
Document Title: CY7S1041G/CY7S1041GE, 4-Mbit (256K words × 16 bit) Static RAM with PowerSnooze™ and Error  
Correcting Code (ECC)  
Document Number: 001-92576  
Orig. of  
Change  
Submission  
Date  
Rev.  
ECN No.  
Description of Change  
*D  
4867081  
NILE  
07/31/2015 Changed status from Preliminary to Final.  
*E  
5020880  
VINI  
11/19/2015 Updated Pin Configurations:  
Removed 44-pin SOJ package related information.  
Updated Thermal Resistance:  
Removed 44-pin SOJ package related information.  
Added 48-ball VFBGA package related information.  
Updated Ordering Information:  
Updated part numbers.  
Updated Ordering Code Definitions.  
Updated Package Diagrams:  
Removed spec 51-85082 *E.  
Document Number: 001-92576 Rev. *E  
Page 20 of 21  
CY7S1041G  
CY7S1041GE  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
®
Products  
PSoC Solutions  
Automotive  
cypress.com/go/automotive  
cypress.com/go/clocks  
cypress.com/go/interface  
cypress.com/go/powerpsoc  
cypress.com/go/memory  
cypress.com/go/psoc  
psoc.cypress.com/solutions  
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP  
Clocks & Buffers  
Interface  
Cypress Developer Community  
Lighting & Power Control  
Memory  
Community | Forums | Blogs | Video | Training  
Technical Support  
PSoC  
cypress.com/go/support  
Touch Sensing  
USB Controllers  
Wireless/RF  
cypress.com/go/touch  
cypress.com/go/USB  
cypress.com/go/wireless  
© Cypress Semiconductor Corporation, 2014-2015. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of  
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for  
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as  
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems  
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),  
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,  
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress  
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without  
the express written permission of Cypress.  
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES  
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not  
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where  
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer  
assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Use may be limited by and subject to the applicable Cypress software license agreement.  
Document Number: 001-92576 Rev. *E  
Revised November 19, 2015  
Page 21 of 21  
All products and company names mentioned in this document may be the trademarks of their respective holders.  

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