ZXM66P03N8TA [DIODES]

30V P-CHANNEL ENHANCEMENT MODE MOSFET; 30V P沟道增强型MOSFET
ZXM66P03N8TA
型号: ZXM66P03N8TA
厂家: DIODES INCORPORATED    DIODES INCORPORATED
描述:

30V P-CHANNEL ENHANCEMENT MODE MOSFET
30V P沟道增强型MOSFET

文件: 总4页 (文件大小:64K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ZXM66P03N8  
30V P-CHANNEL ENHANCEMENT MODE MOSFET  
SUMMARY  
V
=-30V; R  
=0.025 ; I =-7.9A  
DS(ON)  
(BR)DSS  
D
DESCRIPTION  
This new generation of high density MOSFETs from Zetex utilises a unique  
structure that combines the benefits of low on-resistance with fast switching  
speed. This makes them ideal for high efficiency, low voltage, power  
management applications.  
SO8  
FEATURES  
Low on-resistance  
Fast switching speed  
Low threshold  
Low gate drive  
Low profile SOIC package  
APPLICATIONS  
DC - DC converters  
Power management functions  
Disconnect switches  
Motor control  
ORDERING INFORMATION  
DEVICE  
REEL SIZE  
TAPE WIDTH  
QUANTITY  
PER REEL  
ZXM66P03N8TA  
ZXM66P03N8TC  
7”  
12mm  
12mm  
500 units  
2500 units  
D
S
S
S
D
D
13”  
DEVICE MARKING  
ZXM  
Top View  
66P03  
ISSUE 1 - JANUARY 2006  
SEMICONDUCTORS  
1
ZXM66P03N8  
ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
SYMBOL  
LIMIT  
-30  
UNIT  
Drain-Source Voltage  
Gate- Source Voltage  
V
V
V
A
DSS  
V
20  
GS  
Continuous Drain Current V  
=-10V; T =25°C(b)  
I
-7.9  
-6.3  
-6.25  
GS  
A
D
V
=-10V; T =70°C(b)  
GS  
A
V
=-10V; T =25°C(a)  
GS  
A
Pulsed Drain Current (c)  
I
I
-28  
-4.1  
-28  
A
A
A
DM  
I
S
Continuous Source Current (Body Diode)(b)  
Pulsed Source Current (Body Diode)(c)  
SM  
Power Dissipation at T =25°C (a)  
A
P
1.56  
12.5  
W
mW/°C  
D
Linear Derating Factor  
Power Dissipation at T =25°C (b)  
A
P
2.5  
20  
W
mW/°C  
D
Linear Derating Factor  
Operating and Storage Temperature Range  
T :T  
-55 to +150  
°C  
j
stg  
THERMAL RESISTANCE  
PARAMETER  
SYMBOL  
VALUE  
80  
UNIT  
°C/W  
°C/W  
Junction to Ambient (a)  
R
θJA  
Junction to Ambient (b)  
NOTES  
50  
R
θJA  
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions  
(b) For a device surface mounted on FR4 PCB measured at tр10 secs.  
(c) Repetitive rating 25mm x 25mm FR4 PCB, D = 0.05, pulse width 10s - pulse width limited by maximum junction temperature.  
ISSUE 1 - JANUARY 2006  
SEMICONDUCTORS  
2
ZXM66P03N8  
ELECTRICAL CHARACTERISTICS (at T  
= 25°C unless otherwise stated).  
amb  
PARAMETER  
SYMBOL  
MIN.  
TYP.  
MAX. UNIT CONDITIONS  
STATIC  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate-Body Leakage  
V
-30  
V
I
=-250µA, V  
=0V  
(BR)DSS  
D
GS  
=-24V, V =0V  
GS  
I
-1  
V
µA  
DSS  
DS  
I
-100 nA  
V
V
= 20V, V  
=0V  
DS  
GSS  
GS  
Gate-Source Threshold Voltage  
V
-1.0  
I
V
=-250µA, V  
GS  
=
GS(th)  
DS  
D
Static Drain-Source On-State  
Resistance (1)  
R
0.025  
0.035  
V
V
=-10V, I =-5.6A  
D
DS(on)  
GS  
GS  
=-4.5V, I =-2.8A  
D
Forward Transconductance (1)(3)  
DYNAMIC (3)  
g
14.4  
S
V
=-15V,I =-5.6A  
D
fs  
DS  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
SWITCHING(2) (3)  
Turn-On Delay Time  
Rise Time  
C
C
C
1979  
743  
pF  
pF  
pF  
iss  
V
=-25 V, V  
=0V,  
DS  
GS  
f=1MHz  
oss  
rss  
279  
t
t
t
t
7.6  
16.3  
94.6  
39.6  
36  
ns  
ns  
ns  
ns  
nC  
d(on)  
V
R
=-15V, I =-5.6A  
D
r
DD  
=6.2, V  
=-10V  
GS  
G
Turn-Off Delay Time  
Fall Time  
d(off)  
f
Gate Charge  
Q
V
=-15V,V  
=-5V  
g
DS  
GS  
GS  
ID=-5.6A  
Total Gate Charge  
Gate-Source Charge  
Gate Drain Charge  
Q
Q
Q
62.5  
4.9  
nC  
nC  
nC  
g
V
=-15V,V  
=-10V  
DS  
gs  
gd  
ID=-5.6A  
19.6  
SOURCE-DRAIN DIODE  
Diode Forward Voltage (1)  
V
-0.95  
V
T =25°C, I =-5.6A,  
GS  
SD  
j
S
V
=0V  
Reverse Recovery Time (3)  
Reverse Recovery Charge(3)  
t
35  
ns  
T =25°C, I =-5.6A,  
j F  
rr  
di/dt= 100A/µs  
Q
39.9  
nC  
rr  
(1) Measured under pulsed conditions. Width=300µs. Duty cycle 2% .  
(2) Switching characteristics are independent of operating junction temperature.  
(3) For design aid only, not subject to production testing.  
ISSUE 1 - JANUARY 2006  
SEMICONDUCTORS  
3
ZXM66P03N8  
PACKAGE DIMENSIONS  
DIM  
Millimetres  
Inches  
Min  
Min  
4.80  
Max  
4.98  
Max  
A
B
C
D
E
F
0.189  
0.196  
1.27 BSC  
0.53 REF  
0.05 BSC  
0.02 REF  
0.36  
3.81  
1.35  
0.10  
5.80  
0°  
0.46  
0.014  
0.15  
0.05  
0.004  
0.23  
0°  
0.018  
3.99  
1.75  
0.25  
6.20  
8°  
0.157  
0.07  
0.010  
0.24  
8°  
G
J
K
L
0.41  
1.27  
0.016  
0.050  
© Zetex Semiconductors plc 2006  
Europe  
Americas  
Asia Pacific  
Corporate Headquarters  
Zetex GmbH  
Zetex Inc  
Zetex (Asia) Ltd  
Zetex Semiconductors plc  
Zetex Technology Park  
Chadderton, Oldham, OL9 9LL  
United Kingdom  
Streitfeldstraße 19  
D-81673 München  
Germany  
700 Veterans Memorial Hwy  
Hauppauge, NY 11788  
USA  
3701-04 Metroplaza Tower 1  
Hing Fong Road, Kwai Fong  
Hong Kong  
Telefon: (49) 89 45 49 49 0  
Fax: (49) 89 45 49 49 49  
europe.sales@zetex.com  
Telephone: (1) 631 360 2222  
Fax: (1) 631 360 8222  
usa.sales@zetex.com  
Telephone: (852) 26100 611  
Fax: (852) 24250 494  
asia.sales@zetex.com  
Telephone (44) 161 622 4444  
Fax: (44) 161 622 4446  
hq@zetex.com  
For international sales offices visit www.zetex.com/offices  
Zetex products are distributed worldwide. For details, see www.zetex.com/salesnetwork  
This publication is issued to provide outline information only which (unless agreed by the Company in writing) may not be used, applied or reproduced  
for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. The Company  
reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service.  
ISSUE 1 - JANUARY 2006  
SEMICONDUCTORS  
4

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