EDS1232CABB-10L [ELPIDA]

Synchronous DRAM, 4MX32, 6ns, CMOS, PBGA90, FBGA-90;
EDS1232CABB-10L
型号: EDS1232CABB-10L
厂家: ELPIDA MEMORY    ELPIDA MEMORY
描述:

Synchronous DRAM, 4MX32, 6ns, CMOS, PBGA90, FBGA-90

时钟 动态存储器 内存集成电路
文件: 总55页 (文件大小:571K)
中文:  中文翻译
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DATA SHEET  
128M bits SDRAM  
EDS1232CABB, EDS1232CATA (4M words × 32 bits)  
Description  
Features  
The EDS1232CA is a 128M bits SDRAM organized as  
1,048,576 words × 32 bits × 4 banks. All inputs and  
outputs are synchronized with the positive edge of the  
clock.  
2.5V power supply  
Clock frequency: 133MHz (max.)  
Single pulsed /RAS  
• ×32 organization  
They are packaged in 90-ball FBGA, 86-pin plastic  
TSOP (II).  
4 banks can operate simultaneously and  
independently  
Burst read/write operation and burst read/single write  
operation capability  
Programmable burst length (BL): 1, 2, 4, 8 and full  
page  
2 variations of burst sequence  
Sequential (BL = 1, 2, 4, 8)  
Interleave (BL = 1, 2, 4, 8)  
Programmable /CAS latency (CL): 2, 3  
Byte control by DQM  
Refresh cycles: 4096 refresh cycles/64ms  
2 variations of refresh  
Auto refresh  
Self refresh  
Document No. E0247E20 (Ver. 2.0)  
Date Published April 2002 (K) Japan  
URL: http://www.elpida.com  
Elpida Memory, Inc. 2002  
EDS1232CABB, EDS1232CATA  
Ordering Information  
Supply  
Organization  
Clock frequency  
Part number  
voltage  
(words × bits) Internal Banks  
MHz (max.)  
/CAS latency  
Package  
133  
100  
3
2
EDS1232CABB-75  
EDS1232CABB-10  
EDS1232CABB-75L  
EDS1232CABB-10L  
EDS1232CATA-75  
EDS1232CATA-10  
EDS1232CATA-75L  
EDS1232CATA-10L  
2.5V  
4M × 32  
4
90-ball FBGA  
100  
3
133  
100  
3
2
100  
3
133  
100  
3
2
86-pin plastic  
TSOP (II)  
2.5V  
4M × 32  
4
100  
3
133  
100  
3
2
100  
3
Part Number  
E D S 12 32 C A TA - 75 L  
Elpida Memory  
Material Type  
D: Monolithic Device  
Function  
S: SDRAM  
Density & Bank  
12: 128M/4 Banks  
Bit Organization  
32: x32  
Interface  
C: 2.5V, LVTTL  
Mask Revision  
Package  
TA: TSOP (II)  
BB: FBGA  
Speed  
75: 133MHz/CL3  
100MHz/CL2  
10: 100MHz/CL3  
Power Consumption  
Blank: Normal  
L: Low Power  
Data Sheet E0247E20 (Ver. 2.0)  
2
EDS1232CABB, EDS1232CATA  
Pin Configurations  
/xxx indicate active low signal.  
90-ball FBGA  
86-pin TSOP  
1
2
3
4
5
6
7
8
9
VDD  
DQ0  
V
SS  
1
86  
85  
84  
83  
82  
81  
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
DQ15  
VSSQ  
DQ14  
DQ13  
VDDQ  
DQ12  
DQ11  
VSSQ  
DQ10  
DQ9  
VDDQ  
DQ8  
NC  
2
A
B
C
D
E
F
VDDQ  
DQ1  
3
DQ26 DQ24 VSS  
DQ28 VDDQ VSSQ  
VSSQ DQ27 DQ25  
VSSQ DQ29 DQ30  
VDDQ DQ31 NC  
VSS DQM3 A3  
VDD DQ23 DQ21  
VDDQ VSSQ DQ19  
DQ22 DQ20 VDDQ  
DQ17 DQ18 VDDQ  
NC DQ16 VSSQ  
A2 DQM2 VDD  
4
DQ2  
5
VSSQ  
DQ3  
6
7
DQ4  
8
VDDQ  
DQ5  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
39  
40  
41  
42  
43  
DQ6  
VSSQ  
DQ7  
NC  
VDD  
VSS  
DQM0  
/WE  
DQM1  
NC  
/CAS  
/RAS  
/CS  
NC  
CLK  
G
H
J
CKE  
A9  
A4  
A7  
A5  
A8  
A6  
NC  
A9  
A10  
NC  
A0  
A1  
A11  
BA0  
A8  
BA1  
A7  
BA1 A11  
A10(AP)  
A0  
A6  
A5  
CLK CKE  
DQM1 NC  
BA0 /CS /RAS  
/CAS /WE DQM0  
VDD DQ7 VSSQ  
DQ6 DQ5 VDDQ  
DQ1 DQ3 VDDQ  
VDDQ VSSQ DQ4  
VDD DQ0 DQ2  
A1  
A2  
A4  
A3  
K
L
DQM2  
VDD  
DQM3  
VSS  
NC  
NC  
NC  
DQ16  
VSSQ  
DQ17  
DQ18  
VDDQ  
DQ19  
DQ20  
VSSQ  
DQ21  
DQ22  
VDDQ  
DQ23  
VDD  
DQ31  
VDDQ  
DQ30  
DQ29  
VSSQ  
DQ28  
DQ27  
VDDQ  
DQ26  
DQ25  
VSSQ  
DQ24  
VSS  
VDDQ DQ8 VSS  
VSSQ DQ10 DQ9  
VSSQ DQ12 DQ14  
DQ11 VDDQ VSSQ  
DQ13 DQ15 VSS  
M
N
P
R
(Top view)  
(Top view)  
Pin name  
A0 to A11  
BA0, BA1  
Function  
Address inputs  
Bank select  
DQ0 to DQ31  
CLK  
Data input/output  
Clock input  
CKE  
Clock enable  
Chip select  
/CS  
/RAS  
Row address strobe  
/CAS  
Column address strobe  
Write enable  
/WE  
DQM0 to DQM3  
VDD  
DQ mask enable  
Supply voltage  
Ground  
VSS  
VDDQ  
VSSQ  
Supply voltage for DQ  
Ground for DQ  
No connection  
NC  
Data Sheet E0247E20 (Ver. 2.0)  
3
EDS1232CABB, EDS1232CATA  
CONTENTS  
Description ....................................................................................................................................................1  
Features ........................................................................................................................................................1  
Ordering Information .....................................................................................................................................2  
Part Number..................................................................................................................................................2  
Pin Configurations.........................................................................................................................................3  
Electrical Specifications.................................................................................................................................5  
Block Diagram.............................................................................................................................................10  
Pin Function ................................................................................................................................................11  
Command Operation...................................................................................................................................12  
Truth Table..................................................................................................................................................16  
Simplified State Diagram.............................................................................................................................22  
Programming Mode Registers ....................................................................................................................23  
Mode Register.............................................................................................................................................24  
Power-up sequence ....................................................................................................................................27  
Operation of the SDRAM ............................................................................................................................28  
Timing Waveforms ......................................................................................................................................44  
Package Drawing ........................................................................................................................................51  
Recommended Soldering Conditions..........................................................................................................53  
Revision History ..........................................................................................................................................56  
Data Sheet E0247E20 (Ver. 2.0)  
4
EDS1232CABB, EDS1232CATA  
Electrical Specifications  
All voltages are referenced to VSS (GND).  
After power up, wait more than 100 µs and then, execute Power on sequence and CBR (auto) Refresh before  
proper device operation is achieved.  
Absolute Maximum Ratings  
Parameter  
Symbol  
VT  
Rating  
Unit  
V
Note  
–0.5 to +3.6  
–0.5 to +3.6  
Voltage on any pin relative to VSS  
Supply voltage relative to VSS  
Short circuit output current  
Power dissipation  
VDD, VDDQ  
IOS  
V
50  
mA  
W
PD  
1.0  
Operating ambient temperature  
Storage temperature  
TA  
0 to +70  
–55 to +125  
°C  
°C  
Tstg  
Caution  
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause  
permanent damage. The device is not meant to be operated under conditions outside the limits  
described in the operational section of this specification. Exposure to Absolute Maximum Rating  
conditions for extended periods may affect device reliability.  
Recommended Operating Conditions (TA = 0 to +70°C)  
Parameter  
Symbol  
min.  
typ.  
2.5  
0
max.  
Unit  
V
Notes  
Supply voltage  
VDD, VDDQ 2.3  
2.7  
VSS  
VIH  
VIL  
0
0
V
Input high voltage  
Input low voltage  
1.7  
–0.3  
VDD + 0.3*1  
V
0.7  
V
Notes: 1. VIH (max.) = VDDQ + 1.5V (pulse width 5ns).  
2. VIL (min.) = –1.5V (pulse width 5ns).  
Data Sheet E0247E20 (Ver. 2.0)  
5
EDS1232CABB, EDS1232CATA  
DC Characteristics (TA = 0 to +70°C, VDD, VDDQ = 2.5V±0.2V, VSS, VSSQ = 0V)  
Parameter  
/CAS latency  
Symbol  
IDD1  
Grade  
max.  
120  
Unit  
mA  
Test condition  
Notes  
1
Operating current  
(CL = 2)  
Burst length = 1  
tRC tRC (min.)  
IO = 0mA  
(CL = 3)  
IDD1  
120  
1
mA  
mA  
mA  
One bank active  
Standby current in power down  
IDD2P  
IDD2PS  
CKE VIL (max.) tCK = 15ns  
CKE VIL (max.) tCK = ∞  
Standby current in power down  
(input signal stable)  
1
CKE VIH (min.) tCK = 15ns  
CS VIH (min.)  
Input signals are changed one  
time during 30ns  
Standby current in non power  
down  
IDD2N  
20  
8
mA  
mA  
Standby current in non power  
down  
IDD2NS  
CKE VIH (min.) tCK = ∞  
(input signal stable)  
Active standby current in power  
down  
IDD3P  
5
4
mA  
mA  
CKE VIL (max.) tCK = 15ns  
CKE VIL (max.), tCK = ∞  
Active standby current in power  
down (input signal stable)  
IDD3PS  
CKE VIH (min.), tCK = 15 ns,  
/CS VIH (min.),  
Input signals are changed one  
time during 30ns.  
Active standby current in non  
power down  
IDD3N  
40  
mA  
mA  
Active standby current in non  
power down  
IDD3NS  
25  
CKE VIH (min.), tCK = ,  
(input signal stable)  
-75  
-10  
150  
130  
tCK tCK (min.),  
IO = 0mA, All banks active  
Burst operating current  
Refresh current  
IDD4  
IDD5  
IDD6  
mA  
mA  
mA  
2
3
250  
tRC tRC (min.)  
VIH VDD 0.2V,  
VIL GND + 0.2V  
Self refresh current  
2.0  
Self refresh current  
(L-version)  
IDD6  
-xxL  
0.6  
mA  
Notes: 1. IDD1 depends on output loading and cycle rates. Specified values are obtained with the output open. In  
addition to this, IDD1 is measured condition that addresses are changed only one time during tCK (min.).  
2. IDD4 depends on output loading and cycle rates. Specified values are obtained with the output open.  
In addition to this, IDD4 is measured condition that addresses are changed only one time during tCK  
(min.).  
3. IDD5 is measured on condition that addresses are changed only one time during tCK (min.).  
DC Characteristics 2 (TA = 0 to +70°C, VDD, VDDQ = 2.5V±0.2V, VSS, VSSQ = 0V)  
Parameter  
Symbol  
ILI  
min.  
–1.0  
max.  
1.0  
Unit  
µA  
Test condition  
Notes  
0 = VIN = VDDQ, VDDQ = VDD,  
All other pins not under test = 0V  
Input leakage current  
Output leakage current  
Output high voltage  
Output low voltage  
ILO  
–1.5  
2.0  
1.5  
µA  
V
0 = VIN = VDDQ DOUT is disabled  
IOH = –1mA  
VOH  
VOL  
0.4  
V
IOL = 1mA  
Data Sheet E0247E20 (Ver. 2.0)  
6
EDS1232CABB, EDS1232CATA  
Pin Capacitance (TA = 25°C, f = 1MHz)  
90-ball FBGA  
86-pin TSOP (II)  
Notes  
Parameter  
Symbol Pins  
min.  
1.5  
Typ  
max.  
3.0  
min.  
2.5  
Typ  
max.  
4.0  
Unit  
pF  
Input capacitance  
CI1  
CI2  
Address  
CLK, CKE, /CS, /RAS,  
/CAS, /WE, DQM  
1.5  
3.0  
3.0  
5.5  
2.5  
4.0  
4.0  
6.5  
pF  
pF  
Data input/output  
capacitance  
CI/O  
DQ  
AC Characteristics (TA = 0 to +70°C, VDD, VDDQ = 2.5V±0.2V, VSS, VSSQ = 0V)  
-75  
-10  
Parameter  
Symbol  
tCK  
min.  
max.  
min.  
max.  
Unit  
Notes  
System clock cycle time  
(CL = 2)  
10  
13  
ns  
(CL = 3)  
tCK  
tCH  
tCL  
tAC  
tOH  
tLZ  
7.5  
2.5  
2.5  
5.4  
5.4  
10  
3
6
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CLK high pulse width  
CLK low pulse width  
Access time from CLK  
Data-out hold time  
3
2
2
6
CLK to Data-out low impedance  
CLK to Data-out high impedance  
Input setup time  
0
0
tHZ  
tSI  
2
2
1.5  
0.8  
1.5  
2
Input hold time  
tHI  
1
CKE setup time (Power down exit)  
tCKSP  
2
ACT to REF/ACT command period  
(operation)  
tRC  
67.5  
70  
ns  
(refresh)  
tRC  
67.5  
45  
70  
50  
ns  
ns  
Active to Precharge command period  
tRAS  
120000  
120000  
Active command to column command  
(same bank)  
tRCD  
tRP  
20  
20  
15  
20  
20  
20  
ns  
ns  
ns  
Precharge to active command period  
Write recovery or data-in to precharge  
lead time  
tDPL  
2CLK +  
20ns  
2CLK +  
20ns  
Last data into active latency  
tDAL  
Active (a) to Active (b) command period tRRD  
15  
2
20  
2
ns  
Mode register set cycle time  
Transition time (rise and fall)  
tRSC  
tT  
CLK  
ns  
0.5  
30  
64  
0.5  
30  
64  
Refresh period  
(4096 refresh cycles)  
tREF  
ms  
Data Sheet E0247E20 (Ver. 2.0)  
7
EDS1232CABB, EDS1232CATA  
Test Conditions  
AC high level input voltage / low level input voltage: 2.4V / 0.4V  
Input timing measurement reference level: 1.4V  
Transition time (Input rise and fall time): 1ns  
Output timing measurement reference level: 1.4V  
Termination voltage (Vtt): 1.2V  
tCK  
tCL  
tCH  
2.4V  
CLK  
1.4V  
0.4V  
tSETUP tHOLD  
2.4V  
1.4V  
0.4V  
Input  
tAC  
tOH  
Output  
Vtt  
50Ω  
Z = 50Ω  
Output  
30pF  
Input Waveforms and Output Load  
Data Sheet E0247E20 (Ver. 2.0)  
8
EDS1232CABB, EDS1232CATA  
Relationship Between Frequency and Minimum Latency  
Parameter  
-75  
133  
7.5  
-10  
Frequency (MHz)  
tCK (ns)  
100  
10  
100  
10  
77  
13  
Symbol  
lRCD  
Notes  
1
Active command to column command  
(same bank)  
Active command to active command  
(same bank)  
3
9
6
3
2
2
7
5
2
2
2
7
5
2
2
2
6
4
2
2
lRC  
1
1
1
1
Active command to precharge command  
(same bank)  
lRAS  
lRP  
Precharge command to active command  
(same bank)  
Write recovery or data-in to precharge  
command (same bank)  
lDPL  
Active command to active command  
(different bank)  
lRRD  
lSREX  
lDAL  
2
1
5
2
1
4
2
1
4
2
1
4
1
Self refresh exit time  
2
Last data in to active command  
(Auto precharge, same bank)  
= [lDPL + lRP]  
= [lRC]  
3
Self refresh exit to command input  
lSEC  
9
7
7
6
Precharge command to high impedance  
(CL = 2)  
lHZP  
lHZP  
lAPR  
2
3
1
2
3
1
(CL = 3)  
3
1
3
1
Last data out to active command  
(auto precharge) (same bank)  
Last data out to precharge  
(early precharge)  
(CL = 2)  
lEP  
–1  
–1  
(CL = 3)  
lEP  
–2  
1
–2  
1
–2  
1
–2  
1
Column command to column command  
Write command to data in latency  
DQM to data in  
lCCD  
lWCD  
lDID  
0
0
0
0
0
0
0
0
DQM to data out  
lDOD  
lCLE  
lMRD  
lCDD  
lPEC  
2
2
2
2
CKE to CLK disable  
1
1
1
1
Register set to active command  
/CS to command disable  
Power down exit to command input  
2
2
2
2
0
0
0
0
1
1
1
1
Notes: 1. IRCD to IRRD are recommended value.  
2. Be valid [DESL] or [NOP] at next command of self refresh exit.  
3. Except [DESL] and [NOP]  
Data Sheet E0247E20 (Ver. 2.0)  
9
EDS1232CABB, EDS1232CATA  
Block Diagram  
CLK  
Clock  
Generator  
CKE  
Bank 3  
Bank 2  
Bank 1  
Row  
Address  
Address  
Buffer  
&
Refresh  
Counter  
Mode  
Register  
Bank 0  
Sense Amplifier  
DQM  
/CS  
Column Decoder &  
Latch Circuit  
Column  
Address  
Buffer  
&
Burst  
Counter  
/RAS  
/CAS  
/WE  
Data Control Circuit  
DQ  
Data Sheet E0247E20 (Ver. 2.0)  
10  
EDS1232CABB, EDS1232CATA  
Pin Function  
CLK (input pin)  
CLK is the master clock input. Other inputs signals are referenced to the CLK rising edge.  
CKE (input pins)  
CKE determine validity of the next CLK (clock). If CKE is high, the next CLK rising edge is valid; otherwise it is  
invalid. If the CLK rising edge is invalid, the internal clock is not issued and the Synchronous DRAM suspends  
operation.  
When the Synchronous DRAM is not in burst mode and CKE is negated, the device enters power down mode.  
During power down mode, CKE must remain low.  
/CS (input pins)  
/CS low starts the command input cycle. When /CS is high, commands are ignored but operations continue.  
/RAS, /CAS, and /WE (input pins)  
/RAS, /CAS and /WE have the same symbols on conventional DRAM but different functions. For details, refer to the  
command table.  
A0 to A11 (input pins)  
Row Address is determined by A0 to A11 at the CLK (clock) rising edge in the active command cycle.  
Column Address is determined by A0 to 7 at the CLK rising edge in the read or write command cycle.  
A10 defines the precharge mode. When A10 is high in the precharge command cycle, all banks are precharged;  
when A10 is low, only the bank selected by BA0 and BA1 is precharged.  
When A10 is high in read or write command cycle, the precharge starts automatically after the burst access.  
BA0 and BA1 (input pin)  
BA0 and BA1 are bank select signal. (See Bank Select Signal Table)  
[Bank Select Signal Table]  
BA0  
L
BA1  
L
Bank 0  
Bank 1  
Bank 2  
Bank 3  
H
L
L
H
H
H
Remark: H: VIH. L: VIL. ×: VIH or VIL  
DQM (input pins)  
DQM controls I/O buffers. DQM0 controls DQ0 to 7, DQM1 controls DQ8 to DQ15, DQM2 controls DQ16 to DQ23,  
DQM3 controls DQ24 to DQ31. In read mode, DQM controls the output buffers like a conventional /OE pin. DQM  
high and DQM low turn the output buffers off and on, respectively. The DQM latency for the read is two clocks. In  
write mode, DQM controls the word mask. Input data is written to the memory cell if DQM is low but not if DQM is  
high. The DQM latency for the write is zero.  
DQ0 to DQ31 (input/output pins)  
DQ pins have the same function as I/O pins on a conventional DRAM.  
VDD, VSS, VDDQ, VSSQ (Power supply)  
VDD and VSS are power supply pins for internal circuits. VDDQ and VSSQ are power supply pins for the output  
buffers.  
Data Sheet E0247E20 (Ver. 2.0)  
11  
EDS1232CABB, EDS1232CATA  
Command Operation  
Mode register set command (/CS, /RAS, /CAS, /WE)  
The Synchronous DRAM has a mode register that defines how the device operates. In this command, A0 through  
A11 are the data input pins. After power on, the mode register set command must be executed to initialize the  
device. The mode register can be set only when all banks are in idle state. During 2CLK (tRSC) following this  
command, the Synchronous DRAM cannot accept any other commands.  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
Mode Register Set Command  
Activate command (/CS, /RAS = Low, /CAS, /WE = High)  
The Synchronous DRAM has four banks, each with 8,192 rows. This command activates the bank selected by BA0  
and BA1 and a row address selected by A0 through A11. This command corresponds to a conventional DRAM's  
/RAS falling.  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
Row  
Row  
Row Address Strobe and Bank Activate Command  
Data Sheet E0247E20 (Ver. 2.0)  
12  
EDS1232CABB, EDS1232CATA  
Precharge command (/CS, /RAS, /WE = Low, /CAS = High)  
This command begins precharge operation of the bank selected by BA0 and BA1. When A10 is High, all banks are  
precharged, regardless of BA0 and BA1. When A10 is Low, only the bank selected by BA0 and BA1 is precharged.  
After this command, the Synchronous DRAM can’t accept the activate command to the precharging bank during tRP  
(precharge to activate command period). This command corresponds to a conventional DRAM’s /RAS rising.  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
(Precharge select)  
Add  
Precharge Command  
Write command (/CS, /CAS, /WE = Low, /RAS = High)  
If the mode register is in the burst write mode, this command sets the burst start address given by the column  
address to begin the burst write operation. The first write data in burst mode can input with this command with  
subsequent data on following clocks.  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
Col.  
Column Address and Write Command  
Data Sheet E0247E20 (Ver. 2.0)  
13  
EDS1232CABB, EDS1232CATA  
Read command (/CS, /CAS = Low, /RAS, /WE = High)  
Read data is available after /CAS latency requirements have been met. This command sets the burst start address  
given by the column address.  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
Col.  
Column Address and and Read Command  
CBR (auto) refresh command (/CS, /RAS, /CAS = Low, /WE, CKE = High)  
This command is a request to begin the CBR (auto) refresh operation. The refresh address is generated internally.  
Before executing CBR (auto) refresh, all banks must be precharged. After this cycle, all banks will be in the idle  
(precharged) state and ready for a row activate command. During tRC period (from refresh command to refresh or  
activate command), the Synchronous DRAM cannot accept any other command  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
CBR (auto) Refresh Command  
Data Sheet E0247E20 (Ver. 2.0)  
14  
EDS1232CABB, EDS1232CATA  
Self refresh entry command (/CS, /RAS, /CAS, CKE = Low, /WE = High)  
After the command execution, self refresh operation continues while CKE remains low. When CKE goes high, the  
Synchronous DRAM exits the self refresh mode. During self refresh mode, refresh interval and refresh operation are  
performed internally, so there is no need for external control. Before executing self refresh, all banks must be  
precharged.  
CLK  
CKE  
/CS  
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
Self Refresh Entry Command  
Burst stop command (/CS = /WE = Low, /RAS, /CAS = High)  
This command can stop the current burst operation.  
CLK  
CKE  
H
/CS  
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
Burst Stop Command in Full Page Mode  
No operation (/CS = Low, /RAS, /CAS, /WE = High)  
This command is not an execution command. No operations begin or terminate by this command.  
CLK  
CKE  
/CS  
H
/RAS  
/CAS  
/WE  
BA0, BA1  
(Bank select)  
A10  
Add  
No Operation  
Data Sheet E0247E20 (Ver. 2.0)  
15  
EDS1232CABB, EDS1232CATA  
Truth Table  
Command Truth Table  
CKE  
n – 1  
H
BA0,  
BA1  
×
A9 - A0,  
Function  
Symbol  
DESL  
NOP  
n
×
×
×
×
×
×
×
×
×
×
×
/CS  
H
L
/RAS  
×
/CAS  
×
/WE  
×
A10  
×
A11  
×
Device deselect  
No operation  
H
H
H
H
H
H
H
L
H
H
L
H
L
×
×
×
Burst stop  
BST  
H
L
×
×
×
Read  
READ  
READA  
WRIT  
WRITA  
ACT  
H
L
H
H
L
V
L
V
V
V
V
V
×
Read with auto precharge  
Write  
H
L
L
V
H
L
H
L
L
V
Write with auto precharge  
Bank activate  
H
L
L
L
V
H
V
L
H
L
H
H
H
L
H
L
V
Precharge select bank  
Precharge all banks  
Mode register set  
PRE  
H
L
L
V
PALL  
MRS  
H
L
L
L
×
H
L
×
H
L
L
L
L
V
Remark: H: VIH. L: VIL. ×: VIH or VIL, V = Valid data  
DQM Truth Table  
CKE  
DQM  
0
1
2
3
Function  
Symbol  
ENB  
n – 1  
H
n
Data write / output enable  
×
×
×
×
×
×
×
×
×
×
L
H
L
×
×
×
H
×
×
×
L
H
×
L
×
×
×
H
×
×
L
H
×
×
L
×
×
×
H
×
L
H
×
×
×
L
×
×
×
H
Data mask / output disable  
MASK  
ENB0  
H
DQ0 to DQ7 write enable/output enable  
DQ8 to DQ15 write enable/output enable  
DQ16 to DQ23 write enable/output enable  
DQ24 to DQ31 write enable/output enable  
DQ0 to DQ7 write inhibit/output disable  
DQ8 to DQ15 write inhibit/output disable  
DQ16 to DQ23 write inhibit/output disable  
DQ24 to DQ31 write inhibit/output disable  
H
ENB1  
H
ENB2  
H
ENB3  
H
MASK0  
MASK 1  
MASK 2  
MASK 3  
H
H
H
H
Remark: H: VIH. L: VIL. ×: VIH or VIL  
Data Sheet E0247E20 (Ver. 2.0)  
16  
EDS1232CABB, EDS1232CATA  
CKE Truth Table  
CKE  
Current state  
Activating  
Any  
Function  
Symbol  
n – 1  
H
L
n
/CS  
×
/RAS  
×
/CAS  
×
/WE  
×
Address  
Clock suspend mode entry  
Clock suspend mode  
Clock suspend mode exit  
CBR (auto) refresh command  
Self refresh entry  
L
×
×
×
×
×
L
×
×
×
×
Clock suspend  
Idle  
L
H
H
L
×
×
×
×
REF  
H
H
L
L
L
L
H
H
H
×
Idle  
SELF  
L
L
L
Self refresh  
Self refresh exit  
H
H
L
L
H
×
H
×
×
×
×
×
×
×
L
H
L
Idle  
Power down entry  
Power down exit  
H
H
L
H
×
H
×
H
×
L
H
H
L
Power down  
H
H
×
×
×
L
H
H
H
Remark: H: VIH. L: VIL. ×: VIH or VIL  
Data Sheet E0247E20 (Ver. 2.0)  
17  
EDS1232CABB, EDS1232CATA  
Function Truth Table*1  
Current state  
Idle  
/CS /RAS /CAS /WE Address  
Command  
Operation  
Notes  
H
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
×
×
×
×
DESL  
Nop or power down  
Nop or power down  
ILLEGAL  
2
2
3
3
H
H
H
L
H
L
×
×
NOP or BST  
READ/READA  
H
L
BA, CA, A10  
WRIT/ WRITA  
L
BA, CA, A10  
ILLEGAL  
H
H
L
H
L
BA, RA  
ACT  
Row activating  
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
Nop  
L
H
L
×
CBR (auto) refresh or self refresh  
Mode register accessing  
Nop  
4
L
L
OPCODE  
Row active  
×
×
×
×
DESL  
H
H
H
L
H
L
×
×
NOP or BST  
Nop  
READ/READA  
H
L
BA, CA, A10  
Begin read: Determine AP  
Begin write: Determine AP  
ILLEGAL  
5
5
3
6
WRIT/ WRITA  
L
BA, CA, A10  
H
H
L
H
L
BA, RA  
ACT  
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
Precharge  
L
H
L
×
ILLEGAL  
L
L
OPCODE  
ILLEGAL  
Read  
×
×
×
×
×
×
DESL  
Continue burst to end Row active  
Continue burst to end Row active  
Burst stop Row active  
H
H
H
H
L
H
H
L
H
L
NOP  
BST  
H
L
BA, CA, A10 READ/READA Terminate burst, new read: Determine AP  
BA, CA, A10 WRIT/WRITA  
7
L
Terminate burst, begin write: Determine AP 7, 8  
H
H
L
H
L
BA, RA  
ACT  
ILLEGAL  
3
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
Terminate burst, Precharging  
ILLEGAL  
L
H
L
×
L
L
OPCODE  
ILLEGAL  
Write  
×
×
×
×
×
×
DESL  
Continue burst to end Write recovering  
Continue burst to end Write recovering  
Burst stop Row active  
H
H
H
H
L
H
H
L
H
L
NOP  
BST  
H
L
BA, CA, A10 READ/READA Terminate burst, start read : Determine AP 7, 8  
L
BA, CA, A10 WRIT/WRITA  
Terminate burst, new write : Determine AP  
7
3
9
H
H
L
H
L
BA, RA  
BA, A10  
×
ACT  
ILLEGAL  
L
PRE/PALL  
REF/SELF  
MRS  
Terminate burst, Precharging  
ILLEGAL  
L
H
L
L
L
OPCODE  
ILLEGAL  
Data Sheet E0247E20 (Ver. 2.0)  
18  
EDS1232CABB, EDS1232CATA  
Current state  
Read with auto  
precharge  
/CS /RAS /CAS /WE Address  
Command  
Operation  
Notes  
H
L
L
L
L
L
L
L
L
×
×
×
×
DESL  
NOP  
Continue burst to end Precharging  
H
H
H
H
L
H
H
L
H
L
×
Continue burst to end Precharging  
×
BST  
ILLEGAL  
ILLEGAL  
ILLEGAL  
ILLEGAL  
ILLEGAL  
ILLEGAL  
ILLEGAL  
READ/READA  
H
L
BA, CA, A10  
BA, CA, A10  
BA, RA  
BA, A10  
×
3
3
3
3
WRIT/ WRITA  
L
H
H
L
H
L
ACT  
L
PRE/PALL  
REF/SELF  
MRS  
L
H
L
L
L
OPCODE  
Continue burst to end Write  
recovering with auto precharge  
Write with auto  
precharge  
H
L
×
×
×
×
×
DESL  
NOP  
Continue burst to end Write  
recovering with auto precharge  
H
H
H
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
H
H
L
H
L
L
×
BST  
ILLEGAL  
READ/READA  
H
L
BA, CA, A10  
ILLEGAL  
3
3
3
3
WRIT/ WRITA  
L
BA, CA, A10  
ILLEGAL  
H
H
L
H
L
BA, RA  
ACT  
ILLEGAL  
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
ILLEGAL  
L
H
L
×
ILLEGAL  
L
L
OPCODE  
ILLEGAL  
Precharging  
×
×
×
×
×
×
DESL  
Nop Enter idle after tRP  
Nop Enter idle after tRP  
ILLEGAL  
H
H
H
H
L
H
H
L
H
L
NOP  
BST  
H
L
BA, CA, A10 READ/READA ILLEGAL  
3
3
3
L
BA, CA, A10 WRIT/WRITA  
ILLEGAL  
H
H
L
H
L
BA, RA  
ACT  
ILLEGAL  
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
Nop Enter idle after tRP  
ILLEGAL  
L
H
L
×
L
L
OPCODE  
ILLEGAL  
Row activating  
×
×
×
×
×
×
DESL  
Nop Enter bank active after tRCD  
Nop Enter bank active after tRCD  
ILLEGAL  
H
H
H
H
L
H
H
L
H
L
NOP  
BST  
H
L
BA, CA, A10 READ/READA ILLEGAL  
3
L
BA, CA, A10 WRIT/WRITA  
ILLEGAL  
ILLEGAL  
ILLEGAL  
ILLEGAL  
ILLEGAL  
3
H
H
L
H
L
BA, RA  
BA, A10  
×
ACT  
3, 10  
3
L
PRE/PALL  
REF/SELF  
MRS  
L
H
L
L
L
OPCODE  
Data Sheet E0247E20 (Ver. 2.0)  
19  
EDS1232CABB, EDS1232CATA  
Current state  
/CS /RAS /CAS /WE Address  
Command  
Operation  
Notes  
Write recovering  
H
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
L
L
L
L
H
L
L
L
×
×
×
×
DESL  
NOP  
Nop Enter row active after tDPL  
Nop Enter row active after tDPL  
Nop Enter row active after tDPL  
Start read, Determine AP  
New write, Determine AP  
ILLEGAL  
H
H
H
H
L
H
H
L
H
L
×
×
BST  
READ/READA  
H
L
BA, CA, A10  
8
WRIT/ WRITA  
L
BA, CA, A10  
H
H
L
H
L
BA, RA  
ACT  
3
3
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
ILLEGAL  
L
H
L
×
ILLEGAL  
L
L
OPCODE  
ILLEGAL  
Write recovering  
×
×
×
×
×
×
DESL  
Nop Enter precharge after tDPL  
Nop Enter precharge after tDPL  
Nop Enter row active after tDPL  
with auto  
H
H
H
H
L
H
H
L
H
L
NOP  
precharge  
BST  
H
L
BA, CA, A10 READ/READA ILLEGAL  
L
BA, CA, A10 WRIT/WRITA  
ILLEGAL  
3, 8  
3
H
H
L
H
L
BA, RA  
ACT  
ILLEGAL  
L
BA, A10  
PRE/PALL  
REF/SELF  
MRS  
ILLEGAL  
3
L
H
L
×
ILLEGAL  
L
L
OPCODE  
ILLEGAL  
Refresh  
×
×
×
×
×
×
×
×
×
×
×
×
DESL  
Nop Enter idle after tRC  
Nop Enter idle after tRC  
H
H
H
H
×
H
H
L
H
L
NOP/BST  
READ/READA ILLEGAL  
ACT/PRE/PALL ILLEGAL  
REF/SELF/MRS ILLEGAL  
H
L
L
Mode register  
accessing  
×
×
DESL  
NOP  
BST  
Nop Enter idle after tRSC  
H
H
H
H
H
L
H
L
Nop Enter idle after tRSC  
ILLEGAL  
H
READ/READA ILLEGAL  
ACT/PRE/PLL/  
ILLEGAL  
L
L
L
L
×
REF/SELF/MRS  
Remark: H: VIH. L: VIL. ×: VIH or VIL, V = Valid data  
BA: Bank Address, CA: Column Address, RA: Row Address  
Notes: 1. All entries assume that CKE was active (High level) during the preceding clock cycle.  
2. If all banks are idle, and CKE is inactive (Low level), the Synchronous DRAM will enter Power down  
mode.  
3. Illegal to bank in specified states; Function may be legal in the bank indicated by Bank Address (BA),  
depending on the state of that bank.  
4. If all banks are idle, and CKE is inactive (Low level), the Synchronous DRAM will enter Self refresh mode.  
All input buffers except CKE will be disabled.  
5. Illegal if tRCD is not satisfied.  
6. Illegal if tRAS is not satisfied.  
7. Must satisfy burst interrupt condition.  
8. Must satisfy bus contention, bus trun around, and/or write recovery requirements.  
9. Must mask preceding data which don’t satisfy tDPL.  
10. Illegal if tRRD is not satisfied.  
Data Sheet E0247E20 (Ver. 2.0)  
20  
EDS1232CABB, EDS1232CATA  
Command Truth Table for CKE  
CKE  
Current State  
Self refresh  
n – 1 n  
/CS /RAS /CAS /WE Address  
Operation  
Notes  
H
L
×
×
H
L
L
L
×
H
L
L
L
H
L
L
L
×
H
L
×
H
L
L
L
L
H
L
L
L
L
×
×
×
×
×
×
×
×
×
×
H
H
L
×
×
H
H
L
×
H
H
L
×
×
H
×
×
H
L
L
L
×
H
L
L
L
×
×
×
×
×
×
×
×
×
×
H
L
×
×
×
H
L
×
×
H
L
×
×
×
H
×
×
×
H
L
L
×
×
H
L
L
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
H
×
×
×
×
H
L
×
×
×
H
L
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
×
INVALID, CLK (n – 1) would exit self refresh  
Self refresh recovery  
Self refresh recovery  
ILLEGAL  
H
H
H
H
L
L
L
L
ILLEGAL  
L
Continue self refresh  
Idle after tRC  
Self refresh recovery  
H
H
H
H
H
H
H
H
H
L
H
H
H
H
L
Idle after tRC  
ILLEGAL  
ILLEGAL  
ILLEGAL  
L
ILLEGAL  
L
ILLEGAL  
L
ILLEGAL  
Power down  
All banks idle  
×
INVALID, CLK (n – 1) would exit power down  
EXIT power down  
H
H
L
×
×
×
L
EXIT power down  
L
Continue power down mode  
Refer to operations in Function Truth Table  
Refer to operations in Function Truth Table  
Refer to operations in Function Truth Table  
CBR (auto) Refresh  
H
H
H
H
H
H
H
H
H
H
L
H
H
H
H
H
L
×
OPCODE Refer to operations in Function Truth Table  
Begin power down next cycle  
L
Refer to operations in Function Truth Table  
Refer to operations in Function Truth Table  
L
L
×
Self refresh  
1
L
OPCODE Refer to operations in Function Truth Table  
H
L
×
×
×
×
Exit power down next cycle  
Power down  
L
1
1
2
Row active  
H
L
×
Refer to operations in Function Truth Table  
Clock suspend  
×
Any state other than  
listed above  
H
H
L
H
L
Refer to operations in Function Truth Table  
Begin clock suspend next cycle  
Exit clock suspend next cycle  
Maintain clock suspend  
×
×
×
H
L
L
Remark: H = VIH, L = VIL, × = VIH or VIL  
Notes: 1. Self refresh can be entered only from the all banks idle state. Power down can be entered only from all  
banks idle or row active state.  
2. Must be legal command as defined in Function Truth Table.  
Data Sheet E0247E20 (Ver. 2.0)  
21  
EDS1232CABB, EDS1232CATA  
Simplified State Diagram  
Self  
Refresh  
MRS  
Mode  
Register  
Set  
REF  
CBR(auto)  
Refresh  
IDLE  
CKE  
CKE  
Power  
Down  
CKE  
Active  
Power  
Down  
ROW  
ACTIVE  
CKE  
Write  
Read  
CKE  
Read  
CKE  
WRITE  
SUSPEND  
READ  
SUSPEND  
WRITE  
READ  
Write  
CKE  
CKE  
CKE  
CKE  
CKE  
READA  
SUSPEND  
WRITEA  
SUSPEND  
WRITEA  
READA  
CKE  
PRE (Precharge termination)  
Precharge  
POWER  
ON  
Precharge  
Automatic sequence  
Manual input  
Data Sheet E0247E20 (Ver. 2.0)  
22  
EDS1232CABB, EDS1232CATA  
Programming Mode Registers  
The mode register is programmed by the Mode register set command using address bits A11 through A0, BA0 and  
BA1 as data inputs. The registers retain data until it is re-programmed, or the device loses power.  
The mode register has three fields;  
Options  
:
:
:
:
A11 through A7, BA0, BA1  
A6 through A4  
A3  
/CAS latency  
Wrap type  
Burst length  
A2 through A0  
Following mode register programming, no command can be issued before at least 2 CLK have elapsed.  
/CAS Latency  
/CAS latency is the most critical of the parameters being set. It tells the device how many clocks must elapse before  
the data will be available. The value is determined by the frequency of the clock and the speed grade of the device.  
”Relationship between Frequency and Latency” shows the relationship of /CAS latency to the clock period and the  
speed grade of the device.  
Burst Length  
Burst Length is the number of words that will be output or input in a read or write cycle. After a read burst is  
completed, the output bus will become High-Z. The burst length is programmable as 1, 2, 4, 8 or full page.  
Wrap Type (Burst Sequence)  
The wrap type specifies the order in which the burst data will be addressed. This order is programmable as either  
“Sequential” or “Interleave”. The method chosen will depend on the type of CPU in the system.  
Some microprocessor cache systems are optimized for sequential addressing and others for interleaved addressing.  
“Burst Length Sequence” shows the addressing sequence for each burst length using them. Both sequences  
support bursts of 1, 2, 4 and 8. Additionally, sequence supports the full page length.  
Data Sheet E0247E20 (Ver. 2.0)  
23  
EDS1232CABB, EDS1232CATA  
Mode Register  
BA0 BA1 A11 A10 A9  
A8  
0
A7  
1
A6  
A5  
A4  
A3  
A2  
A1  
A0  
0
0
0
0
0
JEDEC Standard Test Set (refresh counter test)  
BA0 BA1 A11 A10 A9  
A8  
0
A7  
0
A6  
A6  
A5  
A4  
A4  
A3  
A2  
A2  
A1  
BL  
A0  
x
x
x
x
1
LTMODE  
WT  
Burst Read and Single Write  
(for Write Through Cache)  
BA0 BA1 A11 A10 A9  
A8  
1
A7  
0
A5  
A3  
A1  
A0  
Use in future  
BA0 BA1 A11 A10 A9  
A8  
1
A7  
1
A6  
V
A5  
V
A4  
V
A3  
V
A2  
V
A1  
V
A0  
x
x
x
x
x
V
Vender Specific  
V = Valid  
x = Don’t care  
BA0 BA1 A11 A10 A9  
A8  
0
A7  
0
A6  
A5  
A4  
A3  
A2  
A1  
A0  
0
0
0
0
0
LTMODE  
WT  
BL  
Mode Register Set  
Bits2-0  
000  
WT = 0  
WT = 1  
1
1
2
001  
2
010  
4
4
Burst length  
011  
100  
101  
110  
111  
8
8
R
R
R
R
R
R
R
Full page  
0
1
Sequential  
Wrap type  
Interleave  
Bits6-4  
000  
001  
010  
011  
100  
101  
110  
111  
/CAS latency  
R
R
2
3
Latency  
mode  
R
R
R
R
Remark R : Reserved  
Mode Register Set Timing  
CLK  
CKE  
/CS  
/RAS  
/CAS  
/WE  
A0 - A11,  
BA0(13), BA1(A12)  
Mode Register Set  
Data Sheet E0247E20 (Ver. 2.0)  
24  
EDS1232CABB, EDS1232CATA  
Burst Length and Sequence  
[Burst of Two]  
Starting address  
(column address A0, binary)  
Sequential addressing sequence  
(decimal)  
Interleave addressing sequence  
(decimal)  
0
1
0, 1  
1, 0  
0, 1  
1, 0  
[Burst of Four]  
Starting address  
(column address A1 to A0, binary)  
Sequential addressing sequence  
(decimal)  
Interleave addressing sequence  
(decimal)  
00  
01  
10  
11  
0, 1, 2, 3  
1, 2, 3, 0  
2, 3, 0, 1  
3, 0, 1, 2  
0, 1, 2, 3  
1, 0, 3, 2  
2, 3, 0, 1  
3, 2, 1, 0  
[Burst of Eight]  
Starting address  
(column address A2 to A0, binary)  
Sequential addressing sequence  
(decimal)  
Interleave addressing sequence  
(decimal)  
000  
001  
010  
011  
100  
101  
110  
111  
0, 1, 2, 3, 4, 5, 6, 7  
1, 2, 3, 4, 5, 6, 7, 0  
2, 3, 4, 5, 6, 7, 0, 1  
3, 4, 5, 6, 7, 0, 1, 2  
4, 5, 6, 7, 0, 1, 2, 3  
5, 6, 7, 0, 1, 2, 3, 4  
6, 7, 0, 1, 2, 3, 4, 5  
7, 0, 1, 2, 3, 4, 5, 6  
0, 1, 2, 3, 4, 5, 6, 7  
1, 0, 3, 2, 5, 4, 7, 6  
2, 3, 0, 1, 6, 7, 4, 5  
3, 2, 1, 0, 7, 6, 5, 4  
4, 5, 6, 7, 0, 1, 2, 3  
5, 4, 7, 6, 1, 0, 3, 2  
6, 7, 4, 5, 2, 3, 0, 1  
7, 6, 5, 4, 3, 2, 1, 0  
Full page burst is an extension of the above tables of sequential addressing, with the length being 256.  
Data Sheet E0247E20 (Ver. 2.0)  
25  
EDS1232CABB, EDS1232CATA  
Address Bits of Bank-Select and Precharge  
BA1(A12) BA0(A13)  
Result  
Row  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9 A10 A11 BA1 BA0  
Select Bank A  
“Activate” command  
0
0
1
1
0
1
0
1
(Activate command)  
Select Bank B  
“Activate” command  
Select Bank C  
“Activate” command  
Select Bank D  
“Activate” command  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9 A10 A11 BA1 BA0  
BA1(A12) BA0(A13)  
A10  
0
Result  
(Precharge command)  
0
0
1
1
x
0
1
0
1
x
Precharge Bank A  
Precharge Bank B  
Precharge Bank C  
Precharge Bank D  
Precharge All Banks  
0
0
0
1
x : Don’t care  
disables Auto-Precharge  
(End of Burst)  
0
1
enables Auto-Precharge  
(End of Burst)  
Col.  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9 A10  
x
BA1 BA0  
(/CAS strobes)  
BA1(A12) BA0(A13)  
Result  
enables Read/Write  
commands for Bank A  
0
0
1
1
0
1
0
1
enables Read/Write  
commands for Bank B  
enables Read/Write  
commands for Bank C  
enables Read/Write  
commands for Bank D  
Data Sheet E0247E20 (Ver. 2.0)  
26  
EDS1232CABB, EDS1232CATA  
Power-up sequence  
Power-up sequence  
The SDRAM should be goes on the following sequence with power up.  
The CLK, CKE, /CS, DQM and DQ pins keep low till power stabilizes.  
The CLK pin is stabilized within 100 µs after power stabilizes before the following initialization sequence.  
The CKE and DQM is driven to high between power stabilizes and the initialization sequence.  
This SDRAM has VDD clamp diodes for CLK, CKE, /CS DQM and DQ pins. If these pins go high before power up,  
the large current flows from these pins to VDD through the diodes.  
Initialization sequence  
When 200 µs or more has past after the above power-up sequence, all banks must be precharged using the  
precharge command (PALL). After tRP delay, set 8 or more auto refresh commands (REF). Set the mode register  
set command (MRS) to initialize the mode register. We recommend that by keeping DQM and CKE to High, the  
output buffer becomes High-Z during Initialization sequence, to avoid DQ bus contention on memory system formed  
with a number of device.  
Initialization sequence  
Power up sequence  
100 µs  
200 µs  
VDD, VDDQ 0 V  
Low  
Low  
Low  
CKE, DQM  
CLK  
/CS, DQ  
Power stabilize  
Power-up sequence and Initialization sequence  
Data Sheet E0247E20 (Ver. 2.0)  
27  
EDS1232CABB, EDS1232CATA  
Operation of the SDRAM  
Read/Write Operations  
Bank active  
Before executing a read or write operation, the corresponding bank and the row address must be activated by the  
bank active (ACT) command. An interval of tRCD is required between the bank active command input and the  
following read/write command input.  
Read operation  
A read operation starts when a read command is input. Output buffer becomes Low-Z in the (/CAS Latency - 1)  
cycle after read command set. The SDRAM can perform a burst read operation.  
The burst length can be set to 1, 2, 4 and 8. The start address for a burst read is specified by the column address  
and the bank select address at the read command set cycle. In a read operation, data output starts after the number  
of clocks specified by the /CAS Latency. The /CAS Latency can be set to 2 or 3.  
When the burst length is 1, 2, 4 and 8 the DOUT buffer automatically becomes High-Z at the next clock after the  
successive burst-length data has been output.  
The /CAS latency and burst length must be specified at the mode register.  
CLK  
tRCD  
Command  
Address  
READ  
ACT  
Row  
Column  
out 3  
out 1 out 2  
out 0  
out 1 out 2  
CL = 2  
CL = 3  
DQ  
out 3  
out 0  
CL = /CAS latency  
Burst Length = 4  
/CAS Latency  
CLK  
Command  
Address  
tRCD  
ACT  
Row  
READ  
Column  
out 0  
BL = 1  
out 0 out 1  
BL = 2  
BL = 4  
BL = 8  
DQ  
out 3  
out 0 out 1 out 2  
out 0 out 1 out 2  
out 3  
out 5 out 6 out 7  
out 4  
BL : Burst Length  
/CAS Latency = 2  
Burst Length  
Data Sheet E0247E20 (Ver. 2.0)  
28  
EDS1232CABB, EDS1232CATA  
Write operation  
Burst write or single write mode is selected by the OPCODE of the mode register.  
1. Burst write: A burst write operation is enabled by setting OPCODE (A9, A8) to (0, 0). A burst write starts in the  
same clock as a write command set. (The latency of data input is 0 clock.) The burst length can be set to 1, 2, 4  
and 8, like burst read operations. The write start address is specified by the column address and the bank select  
address at the write command set cycle.  
CLK  
tRCD  
Command  
Address  
ACT  
Row  
WRIT  
Column  
in 0  
in 0  
BL = 1  
in 1  
in 1  
in 1  
BL = 2  
BL = 4  
BL = 8  
DQ  
in 3  
in 0  
in 0  
in 2  
in 2  
in 5  
in 6 in 7  
in 3 in 4  
CL = 2, 3  
Burst write  
2. Single write: A single write operation is enabled by setting OPCODE (A9, A8) to (1, 0). In a single write  
operation, data is only written to the column address and the bank select address specified by the write  
command set cycle without regard to the burst length setting. (The latency of data input is 0 clock).  
CLK  
tRCD  
Command  
WRIT  
ACT  
Row  
Column  
Address  
DQ  
in 0  
Single write  
Data Sheet E0247E20 (Ver. 2.0)  
29  
EDS1232CABB, EDS1232CATA  
Auto Precharge  
Read with auto-precharge  
In this operation, since precharge is automatically performed after completing a read operation, a precharge  
command need not be executed after each read operation. The command executed for the same bank after the  
execution of this command must be the bank active (ACT) command. In addition, an interval defined by lAPR is  
required before execution of the next command.  
[Clock cycle time]  
/CAS latency  
Precharge start cycle  
3
2
2 cycle before the final data is output  
1 cycle before the final data is output  
CLK  
ACT  
READA  
ACT  
CL=2 Command  
lRAS  
DQ  
out0  
out1  
out2  
out3  
lAPR  
CL=3 Command  
DQ  
ACT  
READA  
ACT  
lRAS  
out0  
out1  
out2  
out3  
lAPR  
Note: Internal auto-precharge starts at the timing indicated by " ".  
And an interval of tRAS (lRAS) is required between previous active (ACT) command and internal precharge  
"
".  
Burst Read (BL = 4)  
Write with auto-precharge  
In this operation, since precharge is automatically performed after completing a burst write or single write operation,  
a precharge command need not be executed after each write operation. The command executed for the same bank  
after the execution of this command must be the bank active (ACT) command. In addition, an interval of lDAL is  
required between the final valid data input and input of next command.  
CLK  
WRITA  
ACT  
ACT  
Command  
DQ  
IRAS  
in0 in1 in2 in3  
lDAL  
Note: Internal auto-precharge starts at the timing indicated by " ".  
and an interval of tRAS (lRAS) is required between previous active (ACT) command  
and internal precharge " ".  
Burst Write (BL = 4)  
Data Sheet E0247E20 (Ver. 2.0)  
30  
EDS1232CABB, EDS1232CATA  
CLK  
WRITA  
ACT  
ACT  
Command  
IRAS  
DQ  
in  
lDAL  
Note: Internal auto-precharge starts at the timing indicated by " ".  
and an interval of tRAS (lRAS) is required between previous active (ACT) command  
and internal precharge " ".  
Single Write  
Data Sheet E0247E20 (Ver. 2.0)  
31  
EDS1232CABB, EDS1232CATA  
Burst Stop Command  
During a read cycle, when the burst stop command is issued, the burst read data are terminated and the data bus  
goes to High-Z after the /CAS latency from the burst stop command.  
CLK  
READ  
BST  
Command  
High-Z  
High-Z  
DQ  
out  
out  
out  
out  
out  
(CL = 2)  
DQ  
(CL = 3)  
out  
Burst Stop at Read  
During a write cycle, when the burst stop command is issued, the burst write data are terminated and data bus goes  
to High-Z at the same clock with the burst stop command.  
CLK  
WRITE  
in  
BST  
Command  
DQ  
High-Z  
in  
in  
in  
Burst Stop at Write  
Data Sheet E0247E20 (Ver. 2.0)  
32  
EDS1232CABB, EDS1232CATA  
Command Intervals  
Read command to Read command interval  
1. Same bank, same ROW address: When another read command is executed at the same ROW address of the  
same bank as the preceding read command execution, the second read can be performed after an interval of no  
less than 1 clock. Even when the first command is a burst read that is not yet finished, the data read by the  
second command will be valid.  
CLK  
Command  
ACT  
Row  
READ  
READ  
Column A Column B  
Address  
BS  
DQ  
out A0  
out B2 out B3  
out B0 out B1  
CL = 3  
BL = 4  
Bank 0  
Column =B  
Dout  
Bank0  
Active  
Column =A Column =B Column =A  
Read Read Dout  
READ to READ Command Interval (same ROW address in same bank)  
2. Same bank, different ROW address: When the ROW address changes on same bank, consecutive read  
commands cannot be executed; it is necessary to separate the two read commands with a precharge command  
and a bank active command.  
3. Different bank: When the bank changes, the second read can be performed after an interval of no less than 1  
clock, provided that the other bank is in the bank active state. Even when the first command is a burst read that  
is not yet finished, the data read by the second command will be valid.  
CLK  
Command  
READ READ  
ACT  
ACT  
Column A  
Row 1  
Column B  
Address  
BS  
Row 0  
DQ  
out A0  
out B2 out B3  
out B0 out B1  
Bank3  
Dout  
Bank0  
Dout  
CL = 3  
BL = 4  
Bank0  
Active  
Bank3 Bank0 Bank3  
Active Read Read  
READ to READ Command Interval (different bank)  
Data Sheet E0247E20 (Ver. 2.0)  
33  
EDS1232CABB, EDS1232CATA  
Write command to Write command interval  
1. Same bank, same ROW address: When another write command is executed at the same ROW address of the  
same bank as the preceding write command, the second write can be performed after an interval of no less than  
1 clock. In the case of burst writes, the second write command has priority.  
CLK  
Command  
Address  
WRIT  
ACT  
Row  
WRIT  
Column B  
Column A  
BS  
DQ  
in A0  
in B2 in B3  
in B0 in B1  
Bank0  
Active  
Column =A Column =B  
Write Write  
Burst Write Mode  
BL = 4  
Bank 0  
WRITE to WRITE Command Interval (same ROW address in same bank)  
2. Same bank, different ROW address: When the ROW address changes, consecutive write commands cannot be  
executed; it is necessary to separate the two write commands with a precharge command and a bank active  
command.  
3. Different bank: When the bank changes, the second write can be performed after an interval of no less than 1  
clock, provided that the other bank is in the bank active state. In the case of burst write, the second write  
command has priority.  
CLK  
Command  
Address  
ACT  
WRIT WRIT  
ACT  
Column A  
Column B  
Row 1  
Row 0  
BS  
DQ  
in A0  
in B2 in B3  
in B0 in B1  
Burst Write Mode  
BL = 4  
Bank0  
Active  
Bank3 Bank0 Bank3  
Active Write Write  
WRITE to WRITE Command Interval (different bank)  
Data Sheet E0247E20 (Ver. 2.0)  
34  
EDS1232CABB, EDS1232CATA  
Read command to Write command interval  
1. Same bank, same ROW address: When the write command is executed at the same ROW address of the same  
bank as the preceding read command, the write command can be performed after an interval of no less than 1  
clock. However, DQM must be set High so that the output buffer becomes High-Z before data input.  
CLK  
Command  
READ WRIT  
CL=2  
DQM  
CL=3  
DQ (input)  
DQ (output)  
in B0  
in B3  
in B1 in B2  
BL = 4  
Burst write  
High-Z  
READ to WRITE Command Interval (1)  
CLK  
Command  
DQM  
READ  
WRIT  
2 clock  
CL=2  
out  
out  
out  
out  
out  
in  
in  
in  
in  
in  
in  
in  
in  
DQ  
CL=3  
READ to WRITE Command Interval (2)  
2. Same bank, different ROW address: When the ROW address changes, consecutive write commands cannot be  
executed; it is necessary to separate the two commands with a precharge command and a bank active  
command.  
3. Different bank: When the bank changes, the write command can be performed after an interval of no less than 1  
cycle, provided that the other bank is in the bank active state. However, DQM must be set High so that the  
output buffer becomes High-Z before data input.  
Data Sheet E0247E20 (Ver. 2.0)  
35  
EDS1232CABB, EDS1232CATA  
Write command to Read command interval:  
1. Same bank, same ROW address: When the read command is executed at the same ROW address of the same  
bank as the preceding write command, the read command can be performed after an interval of no less than 1  
clock. However, in the case of a burst write, data will continue to be written until one clock before the read  
command is executed.  
CLK  
Command  
DQM  
WRIT  
in A0  
READ  
DQ (input)  
DQ (output)  
out B0  
out B1  
out B2  
out B3  
Burst Write Mode  
CL = 2  
Column = A  
Write  
/CAS Latency  
Column = B  
Read  
Column = B  
Dout  
BL = 4  
Bank 0  
WRITE to READ Command Interval (1)  
CLK  
WRIT  
in A0  
READ  
Command  
DQM  
DQ (input)  
in A1  
DQ (output)  
out B0  
out B1  
out B2  
out B3  
Burst Write Mode  
CL = 2  
Column = A  
Write  
/CAS Latency  
Column = B  
Read  
Column = B  
Dout  
BL = 4  
Bank 0  
WRITE to READ Command Interval (2)  
2. Same bank, different ROW address: When the ROW address changes, consecutive read commands cannot be  
executed; it is necessary to separate the two commands with a precharge command and a bank active  
command.  
3. Different bank: When the bank changes, the read command can be performed after an interval of no less than 1  
clock, provided that the other bank is in the bank active state. However, in the case of a burst write, data will  
continue to be written until one clock before the read command is executed (as in the case of the same bank and  
the same address).  
Data Sheet E0247E20 (Ver. 2.0)  
36  
EDS1232CABB, EDS1232CATA  
Read with auto precharge to Read command interval  
1. Different bank: When some banks are in the active state, the second read command (another bank) is executed.  
Even when the first read with auto-precharge is a burst read that is not yet finished, the data read by the second  
command is valid. The internal auto-precharge of one bank starts at the next clock of the second command.  
CLK  
Command  
BS  
READA  
READ  
DQ  
out A0  
out A1  
out B0  
out B1  
bank0  
Read A  
bank3  
Read  
CL= 3  
BL = 4  
Note: Internal auto-precharge starts at the timing indicated by "  
Read with Auto Precharge to Read Command Interval (Different bank)  
2. Same bank: The consecutive read command (the same bank) is illegal.  
Write with auto precharge to Write command interval  
".  
1. Different bank: When some banks are in the active state, the second write command (another bank) is executed.  
In the case of burst writes, the second write command has priority. The internal auto-precharge of one bank  
starts 2 clocks later from the second command.  
CLK  
Command  
BS  
WRITA  
in A0  
WRIT  
in B0  
DQ  
in A1  
in B1  
in B2  
".  
in B3  
bank0  
Write A  
bank3  
Write  
BL= 4  
Note: Internal auto-precharge starts at the timing indicated by "  
Write with Auto Precharge to Write Command Interval (Different bank)  
2. Same bank: The consecutive write command (the same bank) is illegal.  
Data Sheet E0247E20 (Ver. 2.0)  
37  
EDS1232CABB, EDS1232CATA  
Read with auto precharge to Write command interval  
1. Different bank: When some banks are in the active state, the second write command (another bank) is executed.  
However, DQM must be set High so that the output buffer becomes High-Z before data input. The internal auto-  
precharge of one bank starts at the next clock of the second command.  
CLK  
Command  
BS  
READA  
WRIT  
in B0  
CL = 2  
DQM  
CL = 3  
DQ (input)  
in B1  
in B2  
in B3  
DQ (output)  
High-Z  
BL = 4  
bank0  
ReadA  
bank3  
Write  
Note: Internal auto-precharge starts at the timing indicated by "  
".  
Read with Auto Precharge to Write Command Interval (Different bank)  
2. Same bank: The consecutive write command from read with auto precharge (the same bank) is illegal. It is  
necessary to separate the two commands with a bank active command.  
Write with auto precharge to Read command interval  
1. Different bank: When some banks are in the active state, the second read command (another bank) is executed.  
However, in case of a burst write, data will continue to be written until one clock before the read command is  
executed. The internal auto-precharge of one bank starts at 2 clocks later from the second command.  
CLK  
Command  
BS  
WRITA  
in A0  
READ  
DQM  
DQ (input)  
DQ (output)  
out B0  
out B1  
out B2 out B3  
CL = 3  
BL = 4  
bank0  
WriteA  
bank3  
Read  
Note: Internal auto-precharge starts at the timing indicated by "  
".  
Write with Auto Precharge to Read Command Interval (Different bank)  
2. Same bank: The consecutive read command from write with auto precharge (the same bank) is illegal. It is  
necessary to separate the two commands with a bank active command.  
Data Sheet E0247E20 (Ver. 2.0)  
38  
EDS1232CABB, EDS1232CATA  
Read command to Precharge command interval (same bank)  
When the precharge command is executed for the same bank as the read command that preceded it, the minimum  
interval between the two commands is one clock. However, since the output buffer then becomes High-Z after the  
clocks defined by lHZP, there is a case of interruption to burst read data output will be interrupted, if the precharge  
command is input during burst read. To read all data by burst read, the clocks defined by lEP must be assured as  
an interval from the final data output to precharge command execution.  
CLK  
PRE/PALL  
out A2  
READ  
Command  
DQ  
out A0  
out A1  
out A3  
CL=2  
lEP = -1 cycle  
READ to PRECHARGE Command Interval (same bank): To output all data (CL = 2, BL = 4)  
CLK  
PRE/PALL  
out A1  
READ  
Command  
DQ  
out A0  
out A2  
out A3  
CL=3  
lEP = -2 cycle  
READ to PRECHARGE Command Interval (same bank): To output all data (CL = 3, BL = 4)  
CLK  
PRE/PALL  
READ  
Command  
High-Z  
DQ  
out A0  
lHZP = 2  
READ to PRECHARGE Command Interval (same bank): To stop output data (CL = 2, BL = 1, 2, 4, 8)  
CLK  
PRE/PALL  
READ  
Command  
DQ  
High-Z  
out A0  
lHZP =3  
READ to PRECHARGE Command Interval (same bank): To stop output data (CL = 3, BL = 1, 2, 4, 8)  
Data Sheet E0247E20 (Ver. 2.0)  
39  
EDS1232CABB, EDS1232CATA  
Write command to Precharge command interval (same bank)  
When the precharge command is executed for the same bank as the write command that preceded it, the minimum  
interval between the two commands is 1 clock. However, if the burst write operation is unfinished, the input data  
must be masked by means of DQM for assurance of the clock defined by tDPL.  
CLK  
PRE/PALL  
Command  
DQM  
WRIT  
DQ  
tDPL  
WRIT  
CLK  
Command  
DQM  
PRE/PALL  
DQ  
in A0  
in A1  
tDPL  
WRITE to PRECHARGE Command Interval (same bank) (BL = 4 (To stop write operation))  
CLK  
PRE/PALL  
Command  
DQM  
WRIT  
in A0  
DQ  
in A1  
in A2  
in A3  
tDPL  
WRITE to PRECHARGE Command Interval (same bank) (BL = 4 (To write all data))  
Data Sheet E0247E20 (Ver. 2.0)  
40  
EDS1232CABB, EDS1232CATA  
Bank active command interval  
1. Same bank: The interval between the two bank active commands must be no less than tRC.  
2. In the case of different bank active commands: The interval between the two bank active commands must be no  
less than tRRD.  
CLK  
Command  
Address  
BS  
ACT  
ACT  
ROW  
ROW  
tRC  
Bank 0  
Active  
Bank 0  
Active  
Bank Active to Bank Active for Same Bank  
CLK  
Command  
Address  
ACT  
ACT  
ROW:0  
ROW:1  
BS  
tRRD  
Bank 0  
Active  
Bank 3  
Active  
Bank Active to Bank Active for Different Bank  
Mode register set to Bank active command interval  
The interval between setting the mode register and executing a bank active command must be no less than lMRD.  
CLK  
Command  
Address  
MRS  
ACT  
OPCODE  
BS & ROW  
IMRD  
Mode  
Register Set  
Bank  
Active  
Mode register set to Bank active command interval  
Data Sheet E0247E20 (Ver. 2.0)  
41  
EDS1232CABB, EDS1232CATA  
DQM Control  
The DQM mask the DQ data. The UDQM and LDQM mask the upper and lower bytes of the DQ data, respectively.  
The timing of UDQM/LDQM is different during reading and writing.  
Reading  
When data is read, the output buffer can be controlled by DQM. By setting DQM to Low, the output buffer becomes  
Low-Z, enabling data output. By setting DQM to High, the output buffer becomes High-Z, and the corresponding  
data is not output. However, internal reading operations continue. The latency of DQM during reading is 2 clocks.  
Writing  
Input data can be masked by DQM. By setting DQM to Low, data can be written. In addition, when DQM is set to  
High, the corresponding data is not written, and the previous data is held. The latency of DQM during writing is 0  
clock.  
CLK  
DQM  
High-Z  
DQ  
out 0  
out 1  
out 3  
lDOD = 2 Latency  
Reading  
CLK  
DQM  
DQ  
in 3  
in 0  
in 1  
lDID = 0 Latency  
Writing  
Data Sheet E0247E20 (Ver. 2.0)  
42  
EDS1232CABB, EDS1232CATA  
Refresh  
Auto-refresh  
All the banks must be precharged before executing an auto-refresh command. Since the auto-refresh command  
updates the internal counter every time it is executed and determines the banks and the ROW addresses to be  
refreshed, external address specification is not required. The refresh cycles are required to refresh all the ROW  
addresses within tREF (max.). The output buffer becomes High-Z after auto-refresh start. In addition, since a  
precharge has been completed by an internal operation after the auto-refresh, an additional precharge operation by  
the precharge command is not required.  
Self-refresh  
After executing a self-refresh command, the self-refresh operation continues while CKE is held Low. During self-  
refresh operation, all ROW addresses are refreshed by the internal refresh timer. A self-refresh is terminated by a  
self-refresh exit command. Before and after self-refresh mode, execute auto-refresh to all refresh addresses in or  
within tREF (max.) period on the condition 1 and 2 below.  
1. Enter self-refresh mode within time as below* after either burst refresh or distributed refresh at equal interval to  
all refresh addresses are completed.  
2. Start burst refresh or distributed refresh at equal interval to all refresh addresses within time as below*after  
exiting from self-refresh mode.  
Note: tREF (max.) / refresh cycles.  
Others  
Power-down mode  
The SDRAM enters power-down mode when CKE goes Low in the IDLE state. In power down mode, power  
consumption is suppressed by deactivating the input initial circuit. Power down mode continues while CKE is held  
Low. In addition, by setting CKE to High, the SDRAM exits from the power down mode, and command input is  
enabled from the next clock. In this mode, internal refresh is not performed.  
Clock suspend mode  
By driving CKE to Low during a bank active or read/write operation, the SDRAM enters clock suspend mode. During  
clock suspend mode, external input signals are ignored and the internal state is maintained. When CKE is driven  
High, the SDRAM terminates clock suspend mode, and command input is enabled from the next clock. For details,  
refer to the "CKE Truth Table".  
Data Sheet E0247E20 (Ver. 2.0)  
43  
EDS1232CABB, EDS1232CATA  
Timing Waveforms  
Read Cycle  
tCK  
tCH tCL  
CLK  
tRC  
VIH  
CKE  
t
tRAS  
RP  
tRCD  
tHI  
tSI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
/CS  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
/RAS  
tSI tHI  
tSI tHI  
/CAS  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
/WE  
BS  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
A10  
Address  
DQM  
tSI tHI  
tSI tHI  
tSI  
tHI  
DQ (input)  
t
t
t
t
HZ  
AC  
AC  
AC  
DQ (output)  
t
AC  
t
t
OH  
t
OH  
OH  
t
OH  
/CAS latency = 2  
Burst length = 4  
Bank 0 access  
= VIH or VIL  
Bank 0  
Read  
tLZ  
Bank 0  
Active  
Bank 0  
Precharge  
Data Sheet E0247E20 (Ver. 2.0)  
44  
EDS1232CABB, EDS1232CATA  
Write Cycle  
tCK  
tCH tCL  
CLK  
tRC  
VIH  
CKE  
tRP  
tRAS  
tRCD  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
/CS  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
/RAS  
tSI tHI  
/CAS  
/WE  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
tSI tHI  
BS  
tSI tHI  
tSI tHI  
tSI tHI  
A10  
tSI tHI  
tSI tHI  
Address  
DQM  
tSI  
tHI  
tSI tHI tSI tHI tSI tHI tSI tHI  
DQ (input)  
tDPL  
DQ (output)  
Bank 0  
Precharge  
Bank 0  
Write  
CL = 2  
BL = 4  
Bank 0  
Active  
Bank 0 access  
= VIH or VIL  
Mode Register Set Cycle  
0
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
CLK  
VIL  
CKE  
/CS  
/RAS  
/CAS  
/WE  
BS  
code  
C: b’  
Address  
DQM  
valid  
C: b  
R: b  
b
b+3  
b’ b’+1 b’+2 b’+3  
DQ (output)  
DQ (input)  
High-Z  
lMRD  
lRP  
lRCD  
Output mask  
l
RCD = 3  
Precharge  
If needed  
Mode  
register  
Set  
Bank 3  
Active  
Bank 3  
Read  
/CAS latency = 3  
Burst length = 4  
= VIH or VIL  
Data Sheet E0247E20 (Ver. 2.0)  
45  
EDS1232CABB, EDS1232CATA  
Read Cycle/Write Cycle  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20  
CLK  
CKE  
VIH  
Read cycle  
/RAS-/CAS delay = 3  
/CAS latency = 3  
Burst length = 4  
/CS  
/RAS  
=
VIH or VIL  
/CAS  
/WE  
BS  
Address  
DQM  
R:a  
C:a  
R:b  
C:b  
C:b'  
C:b"  
DQ (output)  
DQ (input)  
a
a+1 a+2 a+3  
b
b+1 b+2 b+3 b' b'+1 b" b"+1 b"+2 b"+3  
High-Z  
Bank 0  
Active  
Bank 0  
Read  
Bank 3  
Active  
Bank 3 Bank 0  
Bank 3  
Read  
Bank 3  
Read  
Bank 3  
Precharge  
Read  
Precharge  
VIH  
CKE  
Write cycle  
/RAS-/CAS delay = 3  
/CAS latency = 3  
Burst length = 4  
= VIH or VIL  
/CS  
/RAS  
/CAS  
/WE  
BS  
Address  
DQM  
R:a  
C:a  
a
R:b  
C:b  
C:b'  
C:b"  
High-Z  
DQ (output)  
DQ (input)  
a+1 a+2 a+3  
b
b+1 b+2 b+3 b'  
b'+1 b" b"+1b"+2 b"+3  
Bank 0  
Active  
Bank 0  
Write  
Bank 3  
Active  
Bank 3  
Write  
Bank 0  
Precharge  
Bank 3  
Write  
Bank 3  
Write  
Bank 3  
Precharge  
Data Sheet E0247E20 (Ver. 2.0)  
46  
EDS1232CABB, EDS1232CATA  
Read/Single Write Cycle  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20  
CLK  
V
IH  
CKE  
/CS  
/RAS  
/CAS  
/WE  
BS  
R:a  
C:a  
R:b  
C:a' C:a  
a
Address  
DQM  
DQ (input)  
DQ (output)  
a
a+1 a+2 a+3  
a
a+1 a+2 a+3  
Bank 0  
Active  
Bank 0  
Read  
Bank 3  
Active  
Bank 0 Bank 0  
Write Read  
Bank 0  
Precharge  
Bank 3  
Precharge  
V
IH  
CKE  
/CS  
/RAS  
/CAS  
/WE  
BS  
R:a  
C:a  
R:b  
C:a  
C:b C:c  
Address  
DQM  
a
b
c
DQ (input)  
DQ (output)  
a
a+1  
a+3  
Bank 0  
Active  
Bank 0  
Read  
Bank 0  
Write  
Bank 0 Bank 0  
Write Write  
Bank 0  
Precharge  
Bank 3  
Active  
Read/Single write  
/RAS-/CAS delay = 3  
/CAS latency = 3  
Burst length = 4  
=
VIH or VIL  
Data Sheet E0247E20 (Ver. 2.0)  
47  
EDS1232CABB, EDS1232CATA  
Read/Burst Write Cycle  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20  
CLK  
CKE  
/CS  
/RAS  
/CAS  
/WE  
BS  
Address  
DQM  
R:a  
C:a  
R:b  
C:a'  
a
a+1 a+2 a+3  
DQ (input)  
DQ (output)  
a
a+1 a+2 a+3  
Bank 0  
Active  
Bank 0  
Read  
Bank 3  
Active  
Clock  
suspend  
Bank 0  
Precharge  
Bank 3  
Precharge  
Bank 0  
Write  
VIH  
CKE  
/CS  
/RAS  
/CAS  
/WE  
BS  
R:a  
C:a  
R:b  
C:a  
a
Address  
DQM  
DQ (input)  
DQ (output)  
a+1 a+2 a+3  
a
a+1  
a+3  
Bank 0  
Active  
Bank 0  
Read  
Bank 0  
Write  
Bank 0  
Precharge  
Bank 3  
Active  
Read/Burst write  
/RAS-/CAS delay = 3  
/CAS latency = 3  
Burst length = 4  
=
VIH or VIL  
Auto Refresh Cycle  
0
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
CLK  
CKE  
/CS  
VIH  
/RAS  
/CAS  
/WE  
BS  
Address  
C:a  
A10=1  
R:a  
DQM  
DQ (input)  
a
a+1  
High-Z  
DQ (output)  
t
t
t
RC  
RP  
RC  
Refresh cycle and  
Read cycle  
Active  
Bank 0  
Read  
Bank 0  
Auto Refresh  
Precharge  
If needed  
Auto Refresh  
/RAS-/CAS delay = 2  
/CAS latency = 2  
Burst length = 4  
= VIH or VIL  
Data Sheet E0247E20 (Ver. 2.0)  
48  
EDS1232CABB, EDS1232CATA  
Self Refresh Cycle  
CLK  
CKE  
/CS  
lSREX  
CKE Low  
/RAS  
/CAS  
/WE  
BS  
Address  
DQM  
A10=1  
DQ (input)  
High-Z  
DQ (output)  
t
RC  
t
t
RC  
RP  
Self refresh cycle  
/RAS-/CAS delay = 3  
CL = 3  
Auto  
refresh  
Self refresh entry  
command  
Precharge command  
If needed  
Next  
Self refresh exit  
ignore command  
or No operation  
Next  
clock  
enable  
Self refresh entry  
command  
clock  
enable  
BL = 4  
=
VIH or VIL  
Clock Suspend Mode  
tSI  
tSI  
10 11 12 13 14 15 16 17 18 19 20  
tHI  
8
0
1
2
3
4
5
6
7
9
CLK  
CKE  
Read cycle  
/RAS-/CAS delay = 2  
/CAS latency = 2  
Burst length = 4  
= VIH or VIL  
/CS  
/RAS  
/CAS  
/WE  
BS  
Address  
R:a  
C:a  
R:b  
C:b  
DQM  
DQ (output)  
DQ (input)  
a
a+1 a+2  
a+3  
b
b+1 b+2 b+3  
High-Z  
Bank0 Active clock  
Active suspend start  
Active clock Bank0  
suspend end Read  
Bank3 Read suspend Read suspend  
Bank0  
Earliest Bank3  
Precharge  
Bank3  
Active  
start  
end Read Precharge  
CKE  
Write cycle  
/RAS-/CAS delay = 2  
/CAS latency = 2  
Burst length = 4  
= VIH or VIL  
/CS  
/RAS  
/CAS  
/WE  
BS  
R:b  
a+1  
Address  
DQM  
R:a  
C:a  
a
C:b  
High-Z  
DQ (output)  
DQ (input)  
a+2  
a+3  
b
b+1 b+2 b+3  
Bank0  
Active clock Bank0 Bank3 Write suspend Write suspend Bank3  
Earliest Bank3  
Precharge  
Bank0 Active clock  
Active suspend start  
Precharge  
end Write  
supend end Write Active  
start  
Data Sheet E0247E20 (Ver. 2.0)  
49  
EDS1232CABB, EDS1232CATA  
Power Down Mode  
CLK  
CKE  
/CS  
CKE Low  
/RAS  
/CAS  
/WE  
BS  
Address  
DQM  
A10=1  
R: a  
DQ (input)  
High-Z  
DQ (output)  
tRP  
Power down cycle  
Power down  
Power down entry  
Precharge command  
If needed  
/RAS-/CAS delay = 3  
mode exit  
Active Bank 0  
/CAS latency = 3  
Burst length = 4  
= VIH or VIL  
Initialization Sequence  
53  
0
1
2
3
4
5
6
7
8
9
10  
48  
49  
50  
51  
52  
54  
55  
CLK  
CKE  
/CS  
VIH  
/RAS  
/CAS  
/WE  
code  
valid  
Address  
Valid  
V
IH  
DQM  
DQ  
High-Z  
t
t
RC  
tRP  
RC  
l
MRD  
Bank active  
If needed  
All banks  
Precharge  
Mode register  
Set  
Auto Refresh  
Auto Refresh  
Data Sheet E0247E20 (Ver. 2.0)  
50  
EDS1232CABB, EDS1232CATA  
Package Drawing  
90-ball FBGA  
Unit: mm  
S
A
0.2  
8.0 ± 0.1  
S
B
0.2  
13.0 ± 0.1  
INDEX AREA  
S
0.2  
1.07 max.  
S
0.27 ± 0.05  
S
0.1  
B
A
0.8  
INDEX MARK  
0.8  
0.8  
0.9  
B
1.6  
90-φ0.45 ± 0.05  
M S A  
φ0.08  
ECA-TS2-0061-01  
Data Sheet E0247E20 (Ver. 2.0)  
51  
EDS1232CABB, EDS1232CATA  
86-pin TSOP (II)  
Unit: mm  
*1  
22.22 ± 0.10  
A
86  
44  
PIN#1 ID  
1
43  
A
B
0.50  
0.10  
0.15 to 0.30  
0.81 max.  
M S  
B
0.80  
Nom  
0.25  
0 to 8°  
S
S
0.10  
0.60 ± 0.15  
Note: 1. This dimension does not include mold flash, protrusions or gate burrs. Mold flash, protrusions or  
gate burrs shall not exceed 0.20mm per side.  
ECA-TS2-0030-01  
Data Sheet E0247E20 (Ver. 2.0)  
52  
EDS1232CABB, EDS1232CATA  
Recommended Soldering Conditions  
Please consult with our sales offices for soldering conditions of the EDS1232CA.  
Type of Surface Mount Device  
EDS1232CABB: 90-ball FBGA  
EDS1232CATA: 86-pin TSOP (II)  
Data Sheet E0247E20 (Ver. 2.0)  
53  
EDS1232CABB, EDS1232CATA  
NOTES FOR CMOS DEVICES  
PRECAUTION AGAINST ESD FOR MOS DEVICES  
1
Exposing the MOS devices to a strong electric field can cause destruction of the gate  
oxide and ultimately degrade the MOS devices operation. Steps must be taken to stop  
generation of static electricity as much as possible, and quickly dissipate it, when once  
it has occurred. Environmental control must be adequate. When it is dry, humidifier  
should be used. It is recommended to avoid using insulators that easily build static  
electricity. MOS devices must be stored and transported in an anti-static container,  
static shielding bag or conductive material. All test and measurement tools including  
work bench and floor should be grounded. The operator should be grounded using  
wrist strap. MOS devices must not be touched with bare hands. Similar precautions  
need to be taken for PW boards with semiconductor MOS devices on it.  
2
HANDLING OF UNUSED INPUT PINS FOR CMOS DEVICES  
No connection for CMOS devices input pins can be a cause of malfunction. If no  
connection is provided to the input pins, it is possible that an internal input level may be  
generated due to noise, etc., hence causing malfunction. CMOS devices behave  
differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed  
high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected  
to VDD or GND with a resistor, if it is considered to have a possibility of being an output  
pin. The unused pins must be handled in accordance with the related specifications.  
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES  
Power-on does not necessarily define initial status of MOS devices. Production process  
of MOS does not define the initial operation status of the device. Immediately after the  
power source is turned ON, the MOS devices with reset function have not yet been  
initialized. Hence, power-on does not guarantee output pin levels, I/O settings or  
contents of registers. MOS devices are not initialized until the reset signal is received.  
Reset operation must be executed immediately after power-on for MOS devices having  
reset function.  
CME0107  
Data Sheet E0247E20 (Ver. 2.0)  
54  
EDS1232CABB, EDS1232CATA  
The information in this document is subject to change without notice. Before using this document, confirm that this is the latest version.  
No part of this document may be copied or reproduced in any form or by any means without the prior  
written consent of Elpida Memory, Inc.  
Elpida Memory, Inc. does not assume any liability for infringement of any intellectual property rights  
(including but not limited to patents, copyrights, and circuit layout licenses) of Elpida Memory, Inc. or  
third parties by or arising from the use of the products or information listed in this document. No license,  
express, implied or otherwise, is granted under any patents, copyrights or other intellectual property  
rights of Elpida Memory, Inc. or others.  
Descriptions of circuits, software and other related information in this document are provided for  
illustrative purposes in semiconductor product operation and application examples. The incorporation of  
these circuits, software and information in the design of the customer's equipment shall be done under  
the full responsibility of the customer. Elpida Memory, Inc. assumes no responsibility for any losses  
incurred by customers or third parties arising from the use of these circuits, software and information.  
[Product applications]  
Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability.  
However, users are instructed to contact Elpida Memory's sales office before using the product in  
aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment,  
medical equipment for life support, or other such application in which especially high quality and  
reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk  
of bodily injury.  
[Product usage]  
Design your application so that the product is used within the ranges and conditions guaranteed by  
Elpida Memory, Inc., including the maximum ratings, operating supply voltage range, heat radiation  
characteristics, installation conditions and other related characteristics. Elpida Memory, Inc. bears no  
responsibility for failure or damage when the product is used beyond the guaranteed ranges and  
conditions. Even within the guaranteed ranges and conditions, consider normally foreseeable failure  
rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so  
that the equipment incorporating Elpida Memory, Inc. products does not cause bodily injury, fire or other  
consequential damage due to the operation of the Elpida Memory, Inc. product.  
[Usage environment]  
This product is not designed to be resistant to electromagnetic waves or radiation. This product must be  
used in a non-condensing environment.  
If you export the products or technology described in this document that are controlled by the Foreign  
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U.S. export control regulations, or another country's export control laws or regulations, you must follow  
the necessary procedures in accordance with such laws or regulations.  
If these products/technology are sold, leased, or transferred to a third party, or a third party is granted  
license to use these products, that third party must be made aware that they are responsible for  
compliance with the relevant laws and regulations.  
M01E0107  
Data Sheet E0247E20 (Ver. 2.0)  
55  

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