74FR573SCX [ETC]

8-Bit D-Type Latch ; 8位D类锁存器\n
74FR573SCX
型号: 74FR573SCX
厂家: ETC    ETC
描述:

8-Bit D-Type Latch
8位D类锁存器\n

锁存器 逻辑集成电路 光电二极管 驱动
文件: 总6页 (文件大小:58K)
中文:  中文翻译
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January 1991  
Revised May 2001  
74FR573  
Octal D-Type Latch with 3-STATE Outputs  
General Description  
The 74FR573 is a high speed octal latch with buffered  
common Latch Enable (LE) and buffered common Output  
Enable (OE) inputs.  
Features  
Broadside pinout aids in PC layout  
Functionally identical to the 74F373, 74F573  
Outputs have current sourcing capability of 15 mA and  
current sinking capability of 64 mA  
This device is functionally identical to the 74F573.  
Guaranteed pin-to-pin skew  
Ordering Code:  
Order Number Package Number  
Package Description  
74FR573SC  
74FR573PC  
M20B  
N20A  
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide  
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide  
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.  
Logic Symbol  
Connection Diagram  
Pin Descriptions  
Pin Names  
OE  
Description  
Output Enable Input (Active-LOW)  
Latch Enable Input (Active-HIGH)  
Data Inputs  
LE  
D0D7  
O0O7  
3-STATE Latch Outputs  
© 2001 Fairchild Semiconductor Corporation  
DS010903  
www.fairchildsemi.com  
Functional Description  
Function Table  
The 74FR573 contains eight D-type latches with 3-STATE  
output buffers. When the latch enable (LE) input is HIGH,  
data on the Dn inputs enters the latches. In this condition  
Inputs  
Output  
On  
OE  
LE  
Dn  
the latches are transparent, i.e., a latch output will change  
state each time its D input changes. When LE is LOW the  
latches store the information that was present on the D  
inputs a setup time preceding the HIGH-to-LOW transition  
of LE. The 3-STATE buffers are controlled by the Output  
Enable (OE) input. When OE is LOW, the buffers are in the  
bi-state mode. When OE is HIGH the buffers are in the high  
impedance mode, but this does not interfere with entering  
new data into the latches.  
L
L
H
H
L
H
L
H
L
L
X
X
On 1  
H
X
High Z State  
H = HIGH Voltage Level  
L = LOW Voltage Level  
X = Immaterial  
Logic Diagram  
www.fairchildsemi.com  
2
Absolute Maximum Ratings(Note 1)  
Recommended Operating  
Conditions  
Storage Temperature  
65°C to +150°C  
Ambient Temperature under Bias  
Junction Temperature under Bias  
VCC Pin Potential to Ground Pin  
Input Voltage (Note 2)  
55°C to 125°C  
55° to +150°C  
0.5V to +7.0V  
Free Air Ambient Temperature  
Supply Voltage  
0°C to +70°C  
+4.5V to 5.5V  
0.5V to +7.0V  
Input Current (Note 2)  
30 mA to +5.0 mA  
Voltage Applied to Output  
in HIGH State (with VCC = 0V)  
Standard Output  
0.5V to VCC  
0.5 to +5.5V  
Note 1: Absolute maximum ratings are values beyond which the device  
may be damaged or have its useful life impaired. Functional operation  
under these conditions is not implied.  
3-STATE Output  
Current Applied to Output  
in LOW State (Max)  
Note 2: Either voltage limit or current limit is sufficient to protect inputs.  
twice the rated IOL (mA)  
4000V  
ESD Last Passing Voltage (Min)  
DC Electrical Characteristics  
VCC  
Symbol  
VIH  
Parameter  
Input HIGH Voltage  
Min  
Typ  
Max  
Units  
V
Conditions  
Recognized HIGH Signal  
Recognized LOW Signal  
2.0  
VIL  
Input LOW Voltage  
Input Clamp Diode Voltage  
Output HIGH  
0.8  
V
VCD  
VOH  
1.2  
V
Min  
Min  
Min  
Min  
Max  
I
I
I
I
IN = −18 mA  
OH = −3 mA  
OH = −15 mA  
IOL = 64 mA  
2.4  
2.0  
V
Voltage  
V
VOL  
IIH  
Output LOW Voltage  
Input HIGH Current  
Input HIGH Current  
Breakdown Test  
0.55  
5
V
µA  
VIN = 2.7V  
IBVI  
7
µA  
Max  
VIN = 7.0V  
IIL  
Input LOW Current  
150  
100  
µA  
µA  
V
Max  
Max  
0.0  
V
IN = 0.5V Data Inputs  
VIN = 0.5V Control Inputs  
VID  
Input Leakage Test  
4.75  
IID = 1.9 µA,  
All Other Pins Grounded  
µAIOD = 150 mV,  
All Other Pins Grounded  
VOUT = 2.7V  
IOD  
Output Circuit  
3.75  
µA  
0.0  
Leakage Current  
IOZH  
IOZL  
IOS  
Output Leakage Current  
Output Leakage Current  
Output Short-Circuit Current  
Output HIGH Leakage Current  
Bus Drainage Test  
20  
20  
225  
50  
µA  
µA  
mA  
µA  
µA  
mA  
mA  
mA  
pF  
Max  
Max  
Max  
Max  
0.0  
VOUT = 0.5V  
100  
VOUT = 0.0V  
ICEX  
IZZ  
VOUT = VCC  
100  
32  
VOUT = 5.25V  
ICCH  
ICCL  
ICCZ  
CIN  
Power Supply Current  
Power Supply Current  
Power Supply Current  
Input Capacitance  
26  
55  
32  
8.0  
Max  
Max  
Max  
5.0  
All Outputs HIGH  
All Outputs LOW  
Outputs 3-STATED  
65  
40  
3
www.fairchildsemi.com  
AC Electrical Characteristics  
T
A = +25°C  
T
A = 0°C to +70°C  
CC = +5.0V  
L = 50 pF  
Max  
V
CC = +5.0V  
V
Symbol  
Parameter  
Units  
C
L = 50 pF  
C
Min  
1.7  
1.7  
2.6  
2.6  
2.8  
2.8  
2.2  
2.2  
Typ  
2.9  
2.6  
6.0  
4.3  
4.0  
5.0  
4.0  
3.5  
Max  
4.5  
4.5  
8.5  
8.5  
7.4  
7.4  
6.3  
6.3  
Min  
1.7  
1.7  
2.6  
2.6  
2.8  
2.8  
2.2  
2.2  
tPLH  
Propagation Delay  
Dn to On  
4.5  
4.5  
8.5  
8.5  
7.4  
7.4  
6.3  
6.3  
ns  
ns  
ns  
ns  
tPHL  
tPLH  
tPHL  
tPZH  
tPZL  
tPHZ  
tPLZ  
Propagation Delay  
LE to On  
Output Enable Time  
Output Disable Time  
AC Operating Requirements  
T
A = +25°C  
T
A = 0°C to +70°C  
CC = +5.0V  
L = 50 pF  
Max  
V
CC = +5.0V  
V
Symbol  
Parameter  
Units  
C
L = 50 pF  
C
Min  
1.0  
1.0  
2.5  
2.5  
5.0  
Typ  
0.4  
0.7  
0.9  
Max  
Min  
1.0  
1.0  
2.5  
2.5  
5.0  
tS(H)  
Setup Time, HIGH or LOW  
ns  
tS(L)  
tH(H)  
tH(L)  
Dn to LE  
Hold Time, HIGH or LOW  
Dn to LE  
ns  
ns  
0.6  
tW(H)  
LE Pulse Width HIGH  
2.7  
Extended AC Electrical Characteristics  
T
A = 0°C to +70°C  
CC = +5.0V  
L = 50 pF  
T
A = 0°C to +70°C  
V
VCC = +5.0V  
C
CL = 250 pF  
Symbol  
Parameter  
Units  
Eight Outputs Switching  
(Note 3)  
(Note 4)  
Min  
1.7  
1.7  
2.6  
2.6  
2.8  
2.8  
2.2  
2.2  
Max  
5.7  
5.7  
9.8  
9.8  
9.6  
9.6  
7.3  
7.3  
Min  
Max  
tPLH  
Propagation Delay  
Dn to On  
3.4  
3.4  
4.5  
4.5  
8.1  
8.1  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tPHL  
tPLH  
Propagation Delay  
LE to On  
12.3  
12.3  
tPHL  
tPZH  
Output Enable Time  
tPZL  
tPHZ  
Output Disable Time  
tPLZ  
tOSHL  
(Note 5)  
tOSLH  
(Note 5)  
tOST  
Pin-to-Pin Skew  
for HL Transitions  
Pin-to-Pin Skew  
for LH Transitions  
Pin-to-Pin Skew  
for HL/LH Transitions  
1.3  
1.3  
3.0  
(Note 5)  
Note 3: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase,  
i.e. all LOW-to-HIGH, HIGH-to-LOW, 3-STATE-to-HIGH, etc.  
Note 4: These specifications guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load  
capacitors in the standard AC load. This specification pertains to single output switching only.  
Note 5: Skew is defined as the absolute value of the difference between the actual propagation delays for any two outputs of the same device. The specifi-  
cation applies to any outputs switching HIGH-to-LOW, (tOSHL), LOW-to-HIGH, (tOSLH) or any combination of HIGH-to-LOW and/or LOW-to-HIGH, (tOST).  
Specifications guaranteed with all outputs switching in phase.  
www.fairchildsemi.com  
4
Physical Dimensions inches (millimeters) unless otherwise noted  
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide  
Package Number M20B  
5
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide  
Package Number N20A  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
www.fairchildsemi.com  
6

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