74LVQ08SJX [ETC]

Quad 2-input AND Gate ; 四路2输入与门\n


型号：	74LVQ08SJX
厂家：	ETC
描述：	Quad 2-input AND Gate 四路2输入与门\n 栅
文件：	总5页 (文件大小：51K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

February 1992

Revised June 2001

74LVQ08

Low Voltage Quad 2-Input AND Gate

General Description

The LVQ08 contains four, 2-input AND gates.

Features

■ Ideal for low power/low noise 3.3V applications

■ Guaranteed simultaneous switching noise level and

dynamic threshold performance

■ Guaranteed pin-to-pin skew AC performance

■ Guaranteed incident wave switching into 75Ω

Ordering Code:

Package

Order Number

Package Description

Number

74LVQ08SC

74LVQ08SJ

M14A

M14D

14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow

14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide

Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.

Logic Symbol

Connection Diagram

IEEE/IEC

Pin Descriptions

Pin Names

A_n, B_n

O_n

Description

Inputs

Outputs

DS011344

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Absolute Maximum Ratings(Note 1)

Recommended Operating

Conditions ^{(Note 2)}

Supply Voltage (V_CC

)

−0.5V to +7.0V

DC Input Diode Current (I_IK

V_I= −0.5V

)

Supply Voltage (V_CC

)

2.0V to 3.6V

0V to V_CC

−20 mA

+20 mA

Input Voltage (V_I)

V_I= V_CC+ 0.5V

Output Voltage (V_O)

0V to V_CC

DC Input Voltage (V_I)

−0.5V to V_CC+ 0.5V

Operating Temperature (T_A)

−40°C to +85°C

DC Output Diode Current (I_OK

)

Minimum Input Edge Rate (∆V/∆t)

_O= −0.5V

−20 mA

+20 mA

_INfrom 0.8V to 2.0V

_O= V_CC+ 0.5V

V_CC@ 3.0V

125 mV/ns

DC Output Voltage (V_O)

DC Output Source

−0.5V to V_CC+ 0.5V

Note 1: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum ratings.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

or Sink Current (I_O)

±50 mA

DC V_CCor Ground Current

(I_CCor I_GND

)

±200 mA

Note 2: Unused inputs must be held HIGH or LOW. They may not float.

Storage Temperature (T_STG

DC Latch-Up Source or

Sink Current

)

−65°C to +150°C

±100 mA

DC Electrical Characteristics

V_CC

(V)

_A= +25°C

T_A= −40°C to +85°C

Symbol

V_IH

Parameter

Units

Conditions

Typ

Guaranteed Limits

Minimum High Level

Input Voltage

_OUT= 0.1V

3.0

1.5

2.0

or V_CC− 0.1V

V_IL

Maximum Low Level

Input Voltage

3.0

1.5

0.8

2.9

0.8

2.9

V_OUT= 0.1V

V_OH

Minimum High Level

Output Voltage

2.99

_OUT= −50 µA

_IN= V_ILor V_IH(Note 3)

2.58

0.1

2.48

0.1

_OH= −12 mA

_OUT= 50 µA

V_OL

Maximum Low Level

Output Voltage

0.002

V_IN= V_ILor V_IH(Note 3)

0.36

0.44

_OL= 12 mA

I_IN

Maximum Input

Leakage Current

Minimum Dynamic

3.6

±0.1

±1.0

µA

V_I= V_CC, GND

I_OLD

I_OHD

I_CC

3.6

V_OLD= 0.8V Max (Note 5)

V_OHD= 2.0V Min (Note 5)

V_IN= V_CC

Output Current (Note 4)

Maximum Quiescent

Supply Current

−25

3.6

3.3

2.0

0.8

20.0

µA

or GND

V_OLP

V_OLV

V_IHD

V_ILD

Quiet Output

0.4

−0.4

1.8

(Note 6)(Note 7)

Maximum Dynamic V_OL

Quiet Output

−0.8

2.0

(Note 6)(Note 7)

(Note 6)(Note 8)

Minimum Dynamic V_OL

Maximum High Level

Dynamic Input Voltage

Maximum Low Level

Dynamic Input Voltage

1.8

0.8

Note 3: All outputs loaded; thresholds on input associated with output under test.

Note 4: Maximum test duration 2.0 ms, one output loaded at a time.

Note 5: Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed for 74LVQ.

Note 6: Worst case package.

Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.

Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (V_ILD), 0V to threshold

(V_IHD), f = 1 MHz.

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AC Electrical Characteristics

_A= +25°C

_A= −40°C to +85°C

_L= 50 pF

Max

V_CC

_L= 50 pF

Symbol

Parameter

Units

(V)

2.7

Min

1.5

Typ

9.0

7.5

8.4

7.0

1.0

Max

13.4

9.5

Min

t_PLH

Propagation Delay

1.0

14.0

10.0

13.0

9.0

3.3 ± 0.3

2.7

t_PHL

Propagation Delay

12.0

8.5

3.3 ± 0.3

2.7

t_OSHL

t_OSLH

Output to Output Skew

(Note 9)

1.5

3.3 ± 0.3

1.5

Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The

specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t_OSHL) or LOW-to-HIGH (t_OSLH). Parameter guaranteed by design.

Capacitance

Symbol

Parameter

Input Capacitance

_PD(Note 10) Power Dissipation Capacitance

Note 10: C_PDis measured at 10 MHz.

Typ

4.5

Units

Conditions

C_IN

V_CC= Open

V_CC= 3.3V

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Physical Dimensions inches (millimeters) unless otherwise noted

14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow

Package Number M14A

www.fairchildsemi.com

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide

Package Number M14D

Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and

Fairchild reserves the right at any time without notice to change said circuitry and specifications.

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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD

SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or systems

which, (a) are intended for surgical implant into the

body, or (b) support or sustain life, and (c) whose failure

to perform when properly used in accordance with

instructions for use provided in the labeling, can be rea-

sonably expected to result in a significant injury to the

user.

2. A critical component in any component of a life support

device or system whose failure to perform can be rea-

sonably expected to cause the failure of the life support

device or system, or to affect its safety or effectiveness.

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