E4707B-EDGE4707B [ETC]
Quad Channel Per-Pin Precision Measurement Unit ; 四通道每针精密测量单元\n
| 型号： | E4707B-EDGE4707B |
| 厂家： | 
ETC |
| 描述： | Quad Channel Per-Pin Precision Measurement Unit
|
| 文件： | 总25页 (文件大小：194K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Edge4707B
Quad Channel Per-Pin
Precision Measurement Unit
TEST AND MEASUREMENT PRODUCTS
Features
Description
The Edge4707B is a precision measurement unit designed
for automatic test equipment and instrumentation.
Manufactured in a wide voltage CMOS process, it is a
monolithic solution for a quad channel per pin PMU.
•
•
•
•
•
•
•
•
•
•
FV / MI Capability
FI / MV Capability
FV / MV Capability
FI / MI Capability
4 Current Ranges (2 µA, 20 µA, 200 µA, 2mA)
–2V to + 13V Output Range (Zero Current)
0V to 11V Output Range (Full Scale Current)
FV Linearity to ± .025% FSR
Central PMU Switches
Each channel of the Edge4707B features a PMU that can
force or measure voltage over a 15V I/O range, and
supports 4 current ranges: 2 µA, 200 µA, 20 µA, and 2
mA.
Per Pin Super Voltage Switches
Each channel of the Edge4707B features an on-board
window comparator that provides two bits of information:
DUT too high and DUT too low. There is also a monitor
function which provides a real time analog signal
proportional to either the measured voltage or current.
Functional Block Diagram
E_SN_IN
E_FC_IN
*
CHANNEL 0
The Edge4707B is designed to be a low power, low cost,
small footprint solution to allow high pin count testers to
support a PMU per pin.
45Ω
VINP
IVIN
100Ω
FORCE
1KΩ
1KΩ
1KΩ
FV / FI*
MI / MV*
SENSE
DUTLTH
DUTGTL
IVMON
In addition, two independent switches per channel (for a
central PMU force and sense) plus two wide voltage analog
muxes per channel are included.
IVMAX
IVMIN
COMPARATORS
DETECTOR LOGIC
VOLTAGE MONITOR
DISABLE
CHANNEL 1
45Ω
VINP
IVIN
100Ω
FORCE
FV / FI*
MI / MV*
Applications
SENSE
DUTLTH
DUTGTL
IVMON
IVMAX
IVMIN
COMPARATORS
DETECTOR LOGIC
VOLTAGE MONITOR
•
Automated Test Equipment
- Memory Testers
DISABLE
CHANNEL 2
45Ω
- VLSI Testers
- Mixed Signal Tester
VINP
IVIN
100Ω
FORCE
FV / FI*
MI / MV*
SENSE
DUTLTH
DUTGTL
IVMON
IVMAX
IVMIN
COMPARATORS
DETECTOR LOGIC
VOLTAGE MONITOR
DISABLE
CHANNEL 3
45Ω
VINP
IVIN
100Ω
FORCE
1KΩ
FV / FI*
MI / MV*
SENSE
DUTLTH
DUTGTL
IVMON
IVMAX
IVMIN
COMPARATORS
DETECTOR LOGIC
VOLTAGE MONITOR
DISABLE
* Typical values
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1
Edge4707B
TEST AND MEASUREMENT PRODUCTS
PIN Description
Pin Name
Pin #
Description
VINP[0:3]
C2, F5, H3, L2
Analog voltage input which forces the output voltage (FV/MI mode) (one per
channel).
IVIN[0:3]
C1, F2, H4, J5
Analog voltage input which forces the output current (FI/MV mode) (one per
channel).
FORCE[0:3]
C14, F12, H13, L12 Analog output pin which forces current or voltage.
C13, G10, H14, K11 Analog input pin which senses voltage.
SENSE[0:3]
FV/FI*[0:3]
D10, B8, A6, E6
B10, A8, C6, D5
TTL compatible input which determines whether the PMU is forcing voltage or
forcing current.
MI/MV*[0:3]
TTL compatible input which determines whether the PMU is measuring current
or measuring voltage.
RS0[0:3]
RS1[0:3]
B11, A9, C7, C5
A12, C10, D8, A5
TTL compatible current range select inputs.
IVMIN[0:3]
IVMAX[0:3]
G5, E1, H2, K3
C3, E3, H1, L1
Analog input voltages which establish the lower and upper threshold level for
the measurement comparator.
DUTLTH[0:3]
DUTGTL[0:3]
P11, N9, N7, N5
N11, P9, P7, P5
Digital comparator output that indicates the DUT measurement is less than the
upper threshold and greater than the lower threshold.
DISABLE[0:3]
E_SNSEL[0:3]
E_SN_IN
A11, C9, D7, A4
D11, E9, B7, B5
L4
TTL compatible input which places the IVMON outputs in high impedance.
TTL switch select for the external SENSE switch for Channels 0–3.
Analog output for external SENSE.
E_FC_IN
K5
Analog input for external FORCE signal.
E_FCSEL[0:3]
I_FCSEL[0:3]
E10, B9, A7, D6
C11, D9, B6, B4
TTL switch select for the external FORCE switch for Channels 0–3.
TTL switch select for internal FORCE switch for Channels 0–3.
RA[0:3], RB[0:3]
RC[0:3], RD[0:3]
D13, G11, J14, K10 External resistor input corresponding to Ranges A through D.
D14, G12, J13, L11
E12, G14, J10, M14
F11, G13, K12, M13
RES_IN[0:3]
F10, F13, J12, L13
External resistor input. One side of the external resistors connect to RA[0:3],
RB[0:3], RC[0:3], RD[0:3]. The other side of all resistors connect to RES_IN.
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
PIN Description (continued)
Pin Name
Pin #
Description
IVMON[0:3]
B1, E2, G4, J4
Analog voltage output that provides a real time monitor of either the measured
voltage or measured current level.
COMP1[0:3]
COMP2[0:3]
D4, F1, J2, K4
E5, F3, J1, M1
Internal compensation pins that require an external capacitor connected
between the two pins.
COMP3[0:3]
D2, F4, J3, M2
Internal compensation pin that requires an external capacitor connected
between the pin and ground.
Internal compensation pin that requires an external capacitor connected
between the pin and the RES_IN pin.
COMP4[0:3]
D1, G2, H5, L3
N/C
A2, A13, A14, B2,
B3, B12, B13, B14,
C4, C12, H10, K7,
M3, M11, N2, N3,
N12, N13, N14, P1,
P2, P12, P13, P14
Not connected.
Analog MUX
Switches
V
K9, M9, M7, M5
L10, K8, L7, K6
L9, M8, M6, M4
M10, L8, L6, L5
A10, C8, E7, A3
P10, N8, N6, N4
N10, P8, P6, P4
Driver High input.
Super voltage input High.
Driver Low input.
Super voltage input Low.
Select for MUX.
IH[0 :3 ]
V
IHH[0 :3 ]
V
IL[0 :3 ]
V
ILH[0 :3 ]
SVSEL[0:3]
DVH[0:3]
DVL[0:3]
Output High.
Output Low.
Power Pins
VCC[1:4]
A1, D12, E4, E14,
G3, H12, K2, K13
Positive analog power supply.
VDD
P3
Positive digital supply.
VEE[1:4]
D3, E13, G1, H11,
K1, K14, M12, N1
Negative analog power supply.
GND[1:4]
E11, F14, J11, L14
Ground.
Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
PIN Description (continued)
A1 Ball Pad
Indicator
Bottom View
12 mm X 12 mm 180 FLEXBGA
P2
P3
N3
M3
L3
P4
P5
P6
P7
P8
P9
P10
P11
P12
P13
P14
P1
P
N/C
N/C
N/C
VDD
N/C
N/C
DVL3
N4
DUTGTL3
N5
DUTGTL2
N7
DVL1
N8
DUTGTL1
N9
N/C
N12
N/C
N13
N/C
N14
DVL2
DVH0
N10
DUTLTH0
N11
N2
M2
N6
N1
M1
N
VEE4
DVH3
DUTLTH3
M5
DVH2
M6
DUTLTH2
M7
DVH1
M8
DUTLTH1
M9
DVL0
M10
DUTGTL0
M11
N/C
M12
N/C
M13
N/C
M14
M4
M
L
COMP2_3
L1
COMP3_3
L2
VIL3
VIH3
L5
VIL2
VIH2
L7
VIL1
L8
VIH1
L9
VILH0
L10
N/C
L11
VEE4
RD3
L13
RC3
L14
L4
L6
L12
IVMAX3
K1
VINP3
VCC4
COMP4_3
K3
E_SN_IN
K4
VILH3
K5
VILH2
VIHH2
K7
VILH1
K8
VIL0
K9
VIHH0
K10
RB3
K11
FORCE3
K12
RESIN3
K13
GND4
K14
K2
J2
K6
K
VEE3
IVMIN3
J3
COMP1_3
J4
E_FC_IN
J5
VIHH3
VIHH1
VIH0
J9
RA3
J10
SENSE3
J11
RD2
J12
VCC4
J13
VEE3
J14
J6
J7
J8
J1
J
COMP2_2 COMP1_2 COMP3_2
H2 H3
IVMON3
H4
IVIN3
H5
RC2
GND3
H11
RESIN2
H12
RB2
RA2
H6
H7
H8
H9
H10
G10
H13
H14
H1
A1 Ball Pad Corner Indicator
(No Solder Ball)
H
G
VINP2
IVIN2
G4
COMP4_2
G5
IVMAX2
IVMIN2
VEE2
G11
VCC3
G12
FORCE2
G13
SENSE2
G14
G2
G3
G6
G7
G8
G9
G1
VEE2
COMP4_1
F2
VCC3
SENSE1
F10
RA1
F11
RB1
F12
RD1
F13
RC1
F14
IVMIN0
F5
IVMON2
F4
F3
F6
F7
F8
F9
F1
F
E
D
C
COMP1_1
E1
IVIN1
E2
COMP2_1
E3
COMP3_1
E4
VINP1
E5
RESIN0
E10
RD0
E11
FORCE1
E12
RESIN1
E13
GND2
E14
E6
E7
E8
E9
COMP2_0
D5
FV/FI*3
D6
SVSEL2
E_SNSEL1 E_FCSEL0
GND1
D11
RC0
D12
VEE1
D13
VCC2
D14
IVMIN1
D1
IVMON1
D2
IVMAX1
D3
VCC2
D4
D7
D8
D9
D10
COMP3_0
C2
COMP4_0
C1
VEE1
C3
COMP1_0
C4
MI/MV*3 E_FCSEL3
C5 C6
DISABLE2
C7
RS1_2
I_FCSEL1
C9
FV/FI*0
E_SNSEL0
C11
VCC1
C12
RA0
C13
RB0
C14
C8
C10
N/C
B4
N/C
B12
VINP0
B2
RS0_3
B5
MI/MV*2
RS0_2
B7
SVSEL1
B8
DISABLE1
B9
RS1_1
B10
I_FCSEL0
B11
SENSE0
B13
FORCE0
B14
IVIN0
B1
IVMAX0
B3
B6
B
A
IVMON0
A1
I_FCSEL3 E_SNSEL3
I_FCSEL2
A6
E_SNSEL2
A7
FV/FI*1
A8
E_FCSEL1
A9
MI/MV*0
A10
RS0_0
A11
N/C
A2
N/C
A3
N/C
A12
N/C
A13
N/C
A14
A4
A5
VCC1
SVSEL3
DISABLE3
RS1_3
FV/FI*2
E_FCSEL2
MI/MV*1
RS0_1
SVSEL0
DISABLE0
RS1_0
N/C
N/C
N/C
1
2
3
4
5
6
7
8
9
10
11
12
13
14
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Revision 3 / December 18, 2002
4
Edge4707B
TEST AND MEASUREMENT PRODUCTS
PIN Description (continued)
A1 Ball Pad
Indicator
SEMTECH
Top View
12 mm X 12 mm 180 FLEXBGA
A2
B2
C2
A3
A4
A5
B5
A6
A7
A8
A9
A10
A11
A12
A13
A14
A1
B1
A
B
VCC1
N/C
N/C
SVSEL3
DISABLE3
B4
RS1_3
FV/FI*2
E_FCSEL2
B7
MI/MV*1
B8
RS0_1
SVSEL0
B10
DISABLE0
B11
RS1_0
B12
N/C
B13
N/C
B14
B3
B6
B9
N/C
IVMON0
C1
I_FCSEL3 E_SNSEL3
I_FCSEL2
C6
E_SNSEL2
C7
FV/FI*1
E_FCSEL1
C9
MI/MV*0
C10
RS0_0
C11
N/C
C12
N/C
N/C
C14
C3
C4
D4
C5
C8
C13
C
D
E
VINP0
D2
N/C
RS0_3
D5
MI/MV*2
D6
RS0_2
D7
SVSEL1
D8
DISABLE1
D9
RS1_1
D10
I_FCSEL0
D11
N/C
D12
SENSE0
D13
FORCE0
D14
IVIN0
D1
IVMAX0
D3
COMP3_0
E2
COMP4_0
E1
VEE1
COMP1_0
E4
MI/MV*3 E_FCSEL3
E5 E6
DISABLE2
E7
RS1_2
E8
I_FCSEL1
E9
FV/FI*0
E10
E_SNSEL0
E11
VCC1
E12
RA0
E13
RB0
E14
E3
COMP2_0
F5
FV/FI*3
SVSEL2
F7
E_SNSEL1 E_FCSEL0
GND1
F11
RC0
F12
VEE1
F13
VCC2
F14
IVMIN1
F1
IVMON1
F2
IVMAX1
F3
VCC2
F4
F6
F8
F9
F10
F
G
H
COMP1_1
G1
IVIN1
COMP2_1
G3
COMP3_1
G4
VINP1
G5
RESIN0
G10
RD0
G11
FORCE1
G12
RESIN1
G13
GND2
G14
G2
G6
H6
G7
H7
G8
H8
G9
H9
VEE2
H1
COMP4_1
H2
VCC3
H3
SENSE1
H10
RA1
H11
RB1
H12
RD1
H13
RC1
H14
IVMIN0
H5
IVMON2
H4
A1 Ball Pad Corner Indicator
(No Solder Ball)
VINP2
J3
IVIN2
J4
COMP4_2
J5
IVMAX2
J1
IVMIN2
J2
N/C
J10
VEE2
J11
VCC3
J12
FORCE2
J13
SENSE2
J14
J6
K6
L6
J7
J8
J9
K9
L9
J
COMP2_2 COMP1_2 COMP3_2
K2 K3
IVMON3
K4
IVIN3
K5
RC2
K10
GND3
K11
RESIN2
K12
RB2
K13
RA2
K14
K7
K8
K1
K
L
N/C
VEE3
VCC4
IVMIN3
L3
COMP1_3
L4
E_FC_IN
L5
VIHH3
VIHH1
L8
VIH0
RA3
L10
SENSE3
L11
RD2
L12
VCC4
L13
VEE3
L14
L2
L7
L1
IVMAX3
M1
VINP3
M2
COMP4_3
M3
E_SN_IN
M4
VILH3
M5
VILH2
M6
VIHH2
M7
VILH1
M8
VIL0
M9
VIHH0
M10
RB3
FORCE3
M12
RESIN3
M13
GND4
M14
M11
M
VIL3
N4
N/C
N3
N/C
N11
COMP2_3
N1
COMP3_3
N2
VIH3
N5
VIL2
N6
VIH2
VIL1
N8
VIH1
N9
VILH0
N10
VEE4
N12
RD3
N13
RC3
N14
N7
N
P
N/C
N/C
P3
VEE4
DVH3
P4
DUTLTH3
P5
DVH2
DUTLTH2
P7
DVH1
P8
DUTLTH1
P9
DVL0
P10
DUTGTL0
P11
N/C
P12
N/C
P13
N/C
P14
P2
P6
P1
VDD
DVL3
DUTGTL3
DUTGTL2
DVL1
DUTGTL1
N/C
N/C
DVH0
DUTLTH0
DVL2
N/C
N/C
N/C
1
2
3
4
5
6
7
8
9
10
11
12
13
14
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Circuit Description
Circuit Overview
Control Inputs
The Edge4707B is a quad channel parametric test and
measurement unit that can :
FV/FI* is a TTL compatible input which determines whether
the PMU forces voltage or current, and MI/MV* is a TTL
compatible input which determines whether the PMU
measures current or voltage. FV/FI* and MI/MV* are
independent for each PMU. Table 1 describes the modes
of operation controlled by these pins.
• Force Voltage / Measure Current
• Force Current / Measure Voltage
• Force Voltage / Measure Voltage
• Force Current / Measure Current
Each PMU channel can force or measure voltage over a
15V range and force or measure current over four distinct
FV / FI*
MI/MV*
Mode of Operation
ranges:
0
0
1
1
0
1
0
1
Force Current, Measure Voltage
Force Current, Measure Current
Force Voltage, Measure Voltage
Force Voltage, Measure Current
• ± 2 µA
• ± 20 µA
• ± 200 µA
• ± 2 mA.
An on-board window comparator provides two bit output
range classification. Also, a monitor passes a real time
analog voltage which tracks either the measured current
or voltage.
Table 1.
RS0 and RS1 are TTL compatible inputs to an internal
a na log mux which se le cts a n e xte rna l re sistor
corresponding to a desired current range. The truth table
for RS0 to RS1, along with the associated external resistor
values and current ranges, is shown in Table 2. RS0 and
RS1 are independent for each channel of the 4707B.
PPMU Functionality
The trapezoid in Figure 1 describes the current-voltage
functionality of the PMU with VCC = 1 5 .5 V and
VEE = –4.5V, in Range D.
V
Current
Range
V
= +15.5V
V
(@ I = 0) = 13.25V
RS1
RS0
Range
"Nominal" Ext. R
CC
OUT
V
(@ 200 µA) = 12.8V (in Range D)
OUT
0
0
1
1
0
1
0
1
A
B
C
D
± 2 µA
RA = 1MΩ
RB = 100KΩ
RC = 10KΩ
RD = 1KΩ
V
(@ 2 mA) = 11.25V
OUT
± 20 µA
± 200 µA
± 2 mA
No restrictions
Table 2.
I
(–2 mA)
I
(2 mA)
MAX
MIN
FORCE/SENSE
FORCE is an analog output which either forces a current
or forces a voltage, depending on which operating mode
is selected.
V
(@ 2 mA) = –0.25V
OUT
V
(@ –200 µA) = –1.8V (in Range D)
OUT
V
= –4.5V
V
(@ I = 0) = –2.25V
EE
OUT
SENSE is a high impedance analog input which measures
the DUT voltage input in the MV operating mode.
NOTE: Negative current implies current is flowing into the 4707 from DUT.
FORCE and SENSE are brought out to separate pins to
allow remote sensing.
Figure 1. PMU Functionality
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Revision 3 / December 18, 2002
6
Edge4707B
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
IVMON
Force Current Mode
In the FI mode (FV/FI* = 0), IVIN is a high impedance
analog voltage input that is converted into a current at
the FORCE pin using the following relationship:
IVMON is a real time analog voltage output which tracks
the sensed parameter.
In the MV mode, the output voltage displayed at IVMON is
a 1:1 mapping of the SENSE voltage. In the MI mode,
IVMON follows the equation:
Forced Current = IVIN / REXT
(Positive current is defined as current flowing out of the
FORCE pin.) The IVIN input voltage range and forced cur-
rent (at FORCE) can be seen in Table 4.
IVMON = I(measured) * REXT
Using nominal values for the external resistors (RA, RB,
RC, and RD), a voltage at IVMON of + 2V corresponds to
Imax and –2V corresponds to Imin of the selected current
range.
Corresponding
Forced Current
IVIN
+ 2V
0V
Imax (full scale)
0
–2V
Imin (full scale)
The IVMON pin can also be placed into a high impedance
state by using the DISABLE input (see Table 3).
Table 4.
Disable
MI / MV*
Sensed Parameter
High Impedance
Measure Voltage Mode
1
0
0
X
0
Measured Voltage
Measured Current
In the MV mode (MI/MV* = 0), DUT voltage is measured
via the SENSE input pin. Note that EXT_SENSE_SEL = 0
when the Edge4707B SENSE is used. This measured
voltage is also tested with the on-board window compara-
tor.
1
Table 3.
Comparator
Force Voltage Mode
The Edge4707B features an on-board window compara-
tor which provides two-bit measurement range classifica-
tion. IVMAX and IVMIN are high impedance analog inputs
that establish the upper and lower thresholds for the win-
dow comparator.
In the FV mode (FV/FI* = 1), VINP is a high impedance
analog voltage input that maps directly to the voltage forced
at the FORCE pin.
Measure Current Mode
In the MI mode, an I/V MAX input of + 2V will set the
upper threshold of the window comparator to a voltage
corresponding to + FSC (full-scale current), and an I/V MIN
input of –2V will set the lower threshold to a voltage
corresponding to –FSC (positive current is defined as
current flowing out of the PMU).
In the MI mode (MI/MV* = 1), a current monitor is
connected in series with the PMU forcing amplifier. This
monitor generates a voltage that is proportional to the
current passing through it, and is brought out to IVMON.
This voltage (corresponding to the measured current) is
also tested by the on-board window comparator.
DUTGTL the DUTLTH are LVTTL compatible outputs which
indicate the range of the measured parameter in relation
to IVMIN and IVMAX. Comparator functionality is sum-
marized in Table 5 for MI Mode and Table 6 for MV mode.
Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
TEST CONDITION
DUT LTH
DUT GTL
IVMON > IVMAX
IVMON < IVMAX
0
1
N/A
IVMON > IVMIN
IVMON < IVMIN
1
0
N/A
1
IVMON < IVMAX
and
IVMON > IVMIN
1
Table 5. MI Comparator Truth Table
TEST CONDITION
DUT LTH
DUT GTL
SENSE > IVMAX
SENSE < IVMAX
0
1
N/A
SENSE > IVMIN
SENSE < IVMIN
1
0
N/A
1
SENSE < IVMAX
and
SENSE > IVMIN
1
Table 6. MV Comparator Truth Table
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Figure 2. Edge4707B Functional Schematic
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
REXT Selection
I_FCSEL
E_FCSEL
FORCE
HiZ
0
1
1
0
0
1
0
1
The Edge 4707B is designed for the voltage drop across
RA, RB, RC, and RD to be ≤ 2V with the maximum current
passing through them. However, these resistor values
can be changed to support different applications.
Illegal Condition
VINP
E_FC_IN
Increasing the maximum current beyond the nominal range
is not recommended. However, decreasing the maximum
current is allowed by increasing the external resistor using
the equation IMAX = 2V / REXT.
Table 8.
For external sense operation, the switch controlled by
E_SNSEL can be used to internally connect the SENSE
input pin to the E_SN_IN output pin (see Figure 2). This
allows the user to use the E_SN_IN pin for remote sensing.
Switch Operation on Force and Sense Lines
Each channel of the Edge4707B features two switches
connected to the FORCE output pin (External Force = 45Ω,
Internal Force = 100Ω) and one 1KΩ switch connected
to the SENSE input pin. These switches are controlled by
the TTL compatible inputs I_FCSEL, E_FCSEL, and
E_SNSEL. Switch operation is described in Table 7.
Analog MUX
The Edge4707B has a separate analog mux section which
is intended for 12V flash programming signal muxing with
lower, more standard voltages. There are five inputs for
this section, all of which are brought out to external pins
(see Figure 3). The two outputs, DVH and DVL, connect
to driver reference voltages of the Edge720 (or other pin
electronics drivers).
Switch Select
Name
Open/Close
State on Switch
Switch
1 KΩ Switches
100Ω, to internal
I_FCSEL
E_FCSEL
E_SNSEL
0 = Open
1 = Closed
VIH
force circuitry
DVH
VIHH
45Ω, to external
force circuitry
0 = Open
1 = Closed
VIL
1KΩ, to external
0 = Open
DVL
sense circuitry
1 = Closed
VILH
Table 7.
SV_SEL
These switches can be configured to route the Edge4707B
for external forcing or sensing operations (see Figure 2).
For external forcing operation, the switch controlled by
I_FCSEL can be used to internally isolate the PMU from
the FORCE output. This enables the user to connect
the FORCE pin to an external device connected to the
E_FC_IN pin using the switch controlled by the E_FC_SEL
input. I_FCSEL and E_FCSEL functionality is described in
Table 8.
Figure 3. Analog MUX Section
(Typically used to provide flash programming and standard
voltages to driver pin electronic references.)
The truth table for SV-SEL is shown in Table 9.
SV_SEL
DVH = VIH
DVL = VIL
0
DVH = VIHH
1
DVL = VILH
(supervoltage)
Table 9. SV-SEL Truth Table
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Short Circuit Protection
The Edge 4707B is designed to survive a direct short circuit
to any legal voltage at the FORCE and SENSE pins, by
virtue of a limited current, which results from the presence
of an external current sense resistor (normally 1 KΩ to
1MΩ) in the FORCE path.
Transient Clamps
The Edge 4707B has on-board clamps to limit the voltage
and current spikes that might result from either changing
the current range or changing the operating mode.
Power Supply Sequencing
In order to avoid the possibility of latch-up, the following
power-up requirements must be satisified:
1. VEE ≤ GND ≤ VDD ≤ VCC at all times
2. VEE ≤ All inputs ≤ VCC
The following power supply sequencing can be used as a
guideline when operating the Edge4707:
Power Up Sequence
1. VCC (substrate)
2. VEE/VDD
3. Digital Inputs
4. Analog Inputs
Power Down Sequence
1. Analog Inputs
2. Digital Inputs
3. VEE/VDD
4. VCC (substrate)
Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Application Information
Required External Components (Per Channel)
22 pF
COMP1
COMP2
1 MΩ
RA
RB
100 KΩ
10 KΩ
1 KΩ
DUT LTH
RC
To LVTTL Gate
To LVTTL Gate
RD
Edge4707B
RES_IN
DUT GTL
COMP3
47 pF
COMP4
FORCE
To DUT
100 pF
SENSE
VCC
VDD
VDD
VEE
.01 µF
.1 µF
.01 µF
.1 µF
.01 µF
VCC
VEE
Actual decoupling and compensation
capacitor values depend on the system environment.
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Application Information (continued)
Calibration
Maximum Input Voltage Range for FV Mode
In order to attain a high degree of accuracy in a typical
ATE application, offset and gain errors are accounted for
through software calibration. When operating the
Edge4707B in the Measure Current (MI) or Force Current
(FI) modes, an additional source of error, common mode
error, should be accounted for. Common mode error is a
In order to ensure that the full-scale output voltage range
(FSV) can be achieved by the 4707B, errors such as gain,
linearity, and offset must be taken into account when
determining the input voltage range required at VINP. The
equations in Table 10 can be used to determine the input
voltage range required at VINP to achieve full scale voltage
(FSV) at the FORCE pin.
measure of how the common mode voltage, V , at the
CM
input of the current sense amplifier affects the forced or
measured current values (see Figure 4). Since this error
is created by internal resistors in the current sense
amplifier, it is very linear in nature.
VINP (Worst Case)
FORCE
FSV
Gain
+ V + LInearity Error
OS
+ FSV
Using the common mode error and common mode linearity
specifications, one can see that with a small number of
calibration steps (see Applications note PMU-A1), the
effect of this error can be significantly reduced.
–FSV
Gain
+ V + LInearity Error
OS
– FSV
Table 10.
Example: If it is desired to operate the 4707B with a FV
range of –2V to 13V, the VINP input voltages in Table 11
may be required.
MI Common Mode Error
V
OS
@ IVMON
CM Linearity
19.5 mV
VINP
FORCE
+ 13V
–2V
13.3V
–2.13V
CM Error = Slope
Table 11.
2 mV
V
CM
@ FORCE
VEE + 4.25
VCC – 4.25
–2 mV
–3 mV
NOTE: In some cases, slope may be negative.
Figure 4. Graphical Representation
of Common Mode Error
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Application Information (continued)
Maximum Input Voltage Range for FI Mode
In order to ensure that the full-scale output current range
(FSC) can be achieved by the 4707B, errors such as
gain, linearity, common mode, and offset must be taken
into account when determining the input voltage range
required at IVIN. The equations in Table 12 can be used
to determine the input voltage range required at IVIN to
achieve full scale current (FSC) at the FORCE pin.
Corresponding
IVIN (Worst Case)
Forced Current
2V
Gain
+ V + Common Mode Error + Linearity Error
OS
+ FSC
–2V
Gain
+ V + Common Mode Error + Linearity Error
OS
– FSC
Table 12.
Example: To guarantee that the 4707B is capable of
forcing ± 2 mA with REXT = 1KΩ (Range D), the input
voltages in Table 13 may be required.
Corresponding
IVIN
Forced Current
2.15V
2 mA
–2.15V
– 2 mA
Table 13.
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Package Information
0.10
–A–
D
–B–
PIN Descriptions
Top View
E
E2
D2
Detail B
14
13
12
11
10
9
8
7
6
5
4
3
2
1
A
B
C
D
E
F
G
H
Bottom View
E1
J
K
L
M
N
P
D1
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Package Information (continued)
Detail A
Side View
A
/ / ccc C
/ / bbb C
NX φb
C
φ0.20 S C A S B S
f
–C–
6
φ
0.75 S C
f
A2
A1
aaa C
e
4
5
Detail A
Detail B
Dimensional References
REF.
A
MIN.
1.30
0.30
0.65
11.80
NOM.
1.45
MAX.
1.55
NOTES:
1. All dimensions are in millimeters.
2. ‘e’ represents the basic solder ball grid pitch.
A1
A2
D
0.40
0.45
0.70
0.75
12.00
12.20
3. ‘M’ represents the basic solder ball matrix size, and symbol ‘N’ is
the maximum allowable number of balls after depopulating.
4. ‘b’ is measurable at the maximum solder ball diameter parallel
to primary datum –C–.
D1
D2
E
10.40 BSC.
12.00
11.80
11.80
12.20
12.20
12.00
E1
E2
b
10.40 BSC.
12.00
5. Dimension ‘ccc’ is measured parallel to primary datum –C–.
6. Primary datum –C– and seating plane are defined by the spherical
crowns of the solder balls.
11.80
0.50
12.20
0.60
0.55
c
0.35
aaa
bbb
ccc
e
0.15
0.20
0.25
0.875
0.90
7. Package surface shall be matte finish charmilles 24 to 27.
8. Package warp shall be 0.050 mm maximum.
9. Substrate material base is BT resin.
0.725
0.70
0.80
0.80
14
10. The overall package thickness ‘A’ already considers collapse balls.
f
M
N
180
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Positive Analog Power Supply (relative to GND)
Negative Analog Power Supply (relative to GND)
Total Analog Power Supply
VCC
VEE
15.25
–4.75
19.5
3.15
25
15.5
–4.5
20
15.75
–4.25
20.5
3.45
65
V
V
VCC – VEE
VDD
V
Digital Power Supply (relative to GND)
Case Temperature
3.3
V
TC
˚ C
˚ C/W
θ
Thermal Resistance of Package (Junction to Case)
JC
4.1
Absolute Maximum Ratings
Parameter
Symbol
VCC
Min
Typ
Max
Units
V
Positive Power Supply
Negative Power Supply
Total Power Supply
Digital Power Supply
Digital Inputs
20
VEE
–10
0
V
VCC – VEE
VDD
21
V
GND – .5
–.5
VCC
7.0
V
V
Analog Inputs
VEE – .5
VCC + .5
V
V
VI[H, L, HH, LH] –
VCC – VEE
Analog MUX Breakdown Voltage
Current Capability of MUX
DV[L, H]
I
–4.8
4.8
mA
V
MUX
External Force and Sense Switch Breakdown Voltage E_FC_IN – FORCE
E_SN_IN – FORCE
VCC – VEE
Storage Temperature
Junction Temperature
Soldering Temperature
–55
–65
+ 125
+ 125
260
˚ C
˚ C
˚ C
Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
DC Characteristics
Power Supplies
Parameter
Symbol
Min
Typ
Max
Units
Power Supply Consumption (Note 1)
Positive Supply
Negative Supply
ICC
IEE
IDD
30
30
1
mA
mA
mA
Digital Supply (Quiescent)
Power Supply Rejection Ratio (Notes 2, 3)
FV/MI Mode
FORCE Pin
@ 100 kHz
@ 500 kHz
@ 1 MHz
FV/MI PSRR
20
14
11
dB
dB
dB
IVMON Pin
@ 100 kHz
@ 500 kHz
@ 1 MHz
14
3
1
dB
dB
dB
FI/MV Mode
FORCE Pin
@ 100 kHz
@ 500 kHz
@ 1 MHz
FV/MI PSRR
20
13
13
dB
dB
dB
IVMON Pin
@ 100 kHz
@ 500 kHz
@ 1 MHz
18
10
7
dB
dB
dB
Force Voltage
Parameter
Symbol
Min
Typ
Max
Units
Input Voltage Range @ VINP
Input Bias Current
V
VEE + 2
VCC – 1.75
V
VINP
I
–1
0
1
µA
V
VINP
Output Forcing Voltage (positive full scale current
through REXT)
V
FORCE
VEE + 2.25
VCC – 4.25
Output Forcing Voltage (zero current through REXT)
Output Forcing Voltage (negative full scale current
through REXT)
V
VEE + 2.25
VEE + 4.25
VCC – 2.25
VCC – 2.25
V
V
FORCE
V
FORCE
Voltage Accuracy
Offset
Vos
FV Gain
FV INL
–100
.985
–0.025
100
1.015
+ 0.025
mV
V/V
%FSR
Gain
Linearity
± .01
Temperature Dependence (Note 6)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Temperature Coefficient of Linearity
∆Vos/∆T
∆FVGain/∆T
∆FV INL/∆T
–8
–.2
–2x10
µV/˚ C
µV/V˚ C
%FSR/˚ C
–7
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Measure Current
Parameter
Symbol
Min
Typ
Max
Units
Current Measurement Range
Range A
Range B
I
MEASURE
–2
–20
–200
–2
2
20
200
2
µA
µA
µA
mA
Range C
Range D
Current Measurement Accuracy
Measure Current Offset
Gain
V
–150
.985
+ 150
1.015
mV
OS
MI Gain
MI INL
Linearity (measured at IVMON)
FORCE = VEE + 4.25 to VCC – 5.25V
FORCE = VCC – 5.25 to VCC – 4.25V
–.05
–.08
± .01
.05
.08
% FSR
% FSR
Common Mode Error
CM Error
–1.5
1.5
mV/V
Common Mode Linearity
FORCE = VEE + 4.25V to VCC – 4.25V
∆CM Error
–.05
.05
%FSR
Temperature Dependence (Note 6)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Temperature Coefficient of Linearity
∆Vos/∆T
∆MI Gain/∆T
∆MI INL/∆T
–60
2
5x10
µV/˚ C
µV/V˚ C
%FSR/˚ C
–7
Force Current
Parameter
Symbol
Min
–2.25
–1
Typ
Max
2.25
1
Units
V
Input Voltage Range @ IVIN
Input Bias Current
V
IVIN
I
0
µA
IVIN
Output Forcing Current
Range A
Range B
I
FORCE
–2
–20
–200
–2
2
20
200
2
µA
µA
µA
mA
Range C
Range D
Compliance Voltage Range
V
FORCE
Positive Full-Scale Current through REXT
Zero Current through REXT
Negative Full-Scale Current through REXT
VEE + 2.25
VEE + 2.25
VEE + 4.25
VCC – 4.25
VCC – 2.25
VCC – 2.25
V
V
V
Current Accuracy
Offset
Gain
Ios
FI Gain
FI INL
–5
.985
5
1.015
% FSR
Linearity (measured at IVMON)
FORCE = VEE + 4.25 to VCC – 5.25V
FORCE = VCC – 5.25 to VCC – 4.25V
–.05
–.08
± .01
.05
.08
% FSR
% FSR
Common Mode Error (Note 4)
CM Error
–3
3
mV/V
Common Mode Linearity
FORCE = VEE + 4.25V to VCC – 4.25V
∆CM Error
–.05
.05
%FSR
Temperature Dependence (Note 6)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Temperature Coefficient of Linearity
–3
∆Vos/∆T
∆FI Gain/∆T
∆FI INL/∆T
7x10
2
1x10
µV/˚ C
µV/V˚ C
%FSR/V
–8
Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Measure Voltage
Parameter
Symbol
Min
Typ
Max
Units
Voltage Measurement Range
V
SENSE
VEE + 2.25
VCC – 2.25
V
Voltage Measurement Accuracy
Measure Voltage Offset
Gain
Vos
MV Gain
MV INL
–100
.985
–.025
100
1.015
.025
mV
Linearity
± .01
%FSR
Temperature Dependence (Note 6)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Temperature Coefficient of Linearity
∆Vos/∆T
∆MV Gain/∆T
∆MV INL/∆T
21
0.35
–9x10
µV/˚ C
µV/V˚ C
%FSR/˚ C
–8
Digital Inputs (FV/FI*, MI/MV*, RS0, RS1, DISABLE, I_FCSEL, E_FCSEL, E_SNSEL, SV_SEL)
Parameter
Symbol
VIL
Min
Typ
Max
Units
V
Input Low Level
0.8
Input High Level
VIH
2.0
V
Input Bias Current @ 0V to VDD
IIN
–1
0
1
µA
External Force & Sense Switches
Parameter
Symbol
Min
Typ
Max
Units
External Force Switches
V
mA
Ω
Usable Input Voltage Range @ E_FC_IN
Usable Input Current Range @ E_FC_IN
On-resistance
VE_FC_IN
IE_FC_IN
RON_E_FC_IN
VEE
–25
VCC
25
55
45
Leakage Current @ E_FC_IN
Switch Open (E_FC_SEL = 0)
Switch Closed (E_FC_SEL = 1)
Input Capacitance
nA
nA
pF
Ileak
Ileak
CE_FC_IN
–10
–10
10
10
28
External Sense Switches
Usable Input Voltage Range @ E_SN_IN
On-resistance
VE_SN_IN
RON-E_SN_IN
VEE
VCC
1200
V
Ω
1000
Leakage Current
Switch Open (E_SN_SEL = 0)
Switch Closed (E_SN_SEL = 1)
Ileak
Ileak
–10
–10
10
10
nA
nA
HiZ (Switches Open) Leakage Current (Note 5)
VFORCE = –3V to 13V, FV/FI* = 0
Ileak
–10
10
14
nA
pF
Combined Capacitance of FORCE and SENSE Pins
(Notes 2, 5)
C_FRC_SNS
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Analog MUX
Parameter
Symbol
Min
Typ
Max
VCC
1000
400
Units
Usable Input Voltage Range
On-resistance (Force) @ 500 µA
On-resistance Variability (Across full VEE to VCC Range)
Leakage Current
Vin
VEE
V
Ω
R
600
ON_MUX
∆R
Ω
ON_MUX
I
200
nA
LEAK_MUX
IVMON
Parameter
Symbol
Min
Typ
Max
Units
Leakage in DISABLED Mode
I
–100
+ 100
nA
LEAK_IVMON
@ IVMON = –2.2V to + 13V
Ω
IVMON Output Impedance
R
OUT
500
Comparator
Parameter
Symbol
Min
Typ
Max
Units
V
IVMAX Voltage Range
IVMAX
IVMIN
Vos
VEE + 1.75
VEE + 1.75
–100
VCC – 1.75
VCC – 1.75
+ 100
IVMIN Voltage Range
V
Comparator Offset (IVMIN, IVMAX)
Input Bias Current at IVMIN, IVMAX
mV
µA
Ibias
–1
+ 1
Digital Outputs (DUTLTH, DUTGTL)
Parameter
Symbol
Min
Typ
Max
Units
Output Low Level
VOL
VOH
400
mV
V
@ I = –200 µA
OL
Output High Level
2.4
VDD
@ I = 200 µA
OH
Above DC Characteristic specifications are guaranteed over full Recommended Operating Condition ranges unless otherwise
noted.
Note 1: Under no load conditions.
Note 2: Guaranteed by design and characterization. Not production tested.
Note 3: PSRR is tested from VCC/VEE supplies to FORCE and IVMON outputs. Characterized in FV/MI and FI/MV modes.
Note 4: The mV/V units shown are derived as follows: (∆offset current * range resistance) / ∆output force voltage.
Note 5: Test Conditions: E_FC_SEL = I_FC_SEL = 0; FV/FI* = 0, FORCE and SENSE tied together over full-scale
voltage range.
Note 6: Temperature coefficients are valid over a 25˚ C to 65˚ C case temperature range unless otherwise noted.
Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
AC Characteristics
Force Voltage/Measure Current
Parameter
Symbol
Min
Typ
Max
Units
FORCE Output Voltage Settling Time (Notes 1, 2)
To 0.1% of final value (C
Range A
= 100 pF)
t
t
t
FORCE/SENSE
settle
settle
settle
530
110
µs
µs
Ranges B, C, D
45
Measured Current Settling Time (Notes 1, 4)
To 0.1% of final value (C
Range A
Ranges B, C, D
= 100 pF)
FORCE/SENSE
1.4
110
ms
µs
50
28
To 2% of final value (C
Ranges B, C, D
= 150 pF)
FORCE/SENSE
110
µs
I/V Monitor (Note 3)
DISABLE True to HiZ Propagation Delay
DISABLE False to Active Propagation Delay
t
oe
60
60
ns
ns
z
t
Force Amp Saturation Recovery Time
t
11
40
4
µs
sat
Capacitive Loading Range for Stable Operation (FORCE)
C
LOAD
nF
Force Current/Measure Voltage
Parameter
Symbol
Min
Typ
Max
Units
FORCE Output Current Settling Time (Notes 1, 5)
(To 0.1% of final value)
Range A
t
settle
2
250
ms
µs
Ranges B, C, D
SENSE (Measure) Voltage Settling Time (Notes 1, 6)
t
settle
(To 0.1% of final value)
Range A
1.75
225
ms
µs
Ranges B, C, D
I/V Monitor (Note 3)
DISABLE True to HiZ Propagation Delay
DISABLE False to Active Propagation Delay
t
60
60
ns
ns
z
t
oe
Force Amp Saturation Recovery Time
t
11
40
4
µs
sat
Capacitive Loading Range for Stable Operation (FORCE)
C
LOAD
nF
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Revision 3 / December 18, 2002
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
AC Characteristics (continued)
Analog MUX
Parameter
Symbol
Min
Typ
Max
Units
Switch Propagation Delay (Note 3)
tpd
60
ns
Comparator
Parameter
Symbol
Min
Typ
Max
Units
Propagation Delay
tpd
25
µs
AC Test Conditions (unless otherwise noted): COMP1 to COMP2 = 22 pF, COMP3 = 100 pF to Ground,
COMP4 = 47 pF to RES_IN, Capacitive Load at FORCE/SENSE combined output = 150 pF to GND,
Capacitive Load at IVMON = 2 nF to GND,
Note 1:
Note 2:
Note 3:
Settling times are not production tested. Guaranteed by characterization.
Measured from 2V step at VINP to FORCE output.
Not production tested. Guaranteed by characterization.
Test Conditions for Characterization:
1. 15 pF load on output
2. input signal has 5 ns rise/fall time
3. tpd is defined as the difference between the time when the input crosses 1.5V to when the output
changes 10% (of the total change) from the initial voltage level. (see timing diagram below).
100%
10%
Output
10%
100%
tpd
tpd
2
1
2V
Input
1.5V
1.5V
0.8V
Note 4:
Note 5:
Note 6:
Measured from 2V step at VINP to IVMON output.
Measured from 2V step at IVIN to FORCE output.
Measured from 2V step at IVIN to IVMON output.
Revision 3 / December 18, 2002
23
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Edge4707B
TEST AND MEASUREMENT PRODUCTS
Ordering Information
Model Number
Package
E4707BBG
180 Lead 12 mm x 12 mm
FlexBGA
EVM4707BBG
Edge4707 Evaluation Module
This device is ESD sensitive. Care should be taken when handling
and installing this device to avoid damaging it.
Contact Information
Semtech Corporation
Test and Measurement Division
10021 Willow Creek Rd., San Diego, CA 92131
Phone: (858)695-1808 FAX (858)695-2633
www .semtech.com
Revision 3 / December 18, 2002
24
Edge4707B
TEST AND MEASUREMENT PRODUCTS
Revision History
Current Revision Date: October 3, 2002
Previous Revision Date: June 20, 2002
Page#
Section Name
Description of Change
Change from "Target" to "Preliminary"
all
11
18
Status
Circuit Description
Power Supplies
Add: Power Supply Sequencing Section
Break down Power Supply Rejection Ratio into FV/MI & FI/MV Modes
DC & AC
Characteristics
18-22
Replace all "TBDs" with numbers
Revision 3 / December 18, 2002
25
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