EDI88130LP70ZM [ETC]
x8 SRAM ; X8 SRAM\n型号: | EDI88130LP70ZM |
厂家: | ETC |
描述: | x8 SRAM
|
文件: | 总8页 (文件大小:156K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
EDI88128C
HI-RELIABILITY PRODUCT
128Kx8 Monolithic SRAM, SMD 5962-89598
FEATURES
The EDI88128C is a high speed, high performance, Monolithic
CMOS Static RAM organized as 128Kx8.
■ Access Times of 70, 85, 100ns
■ Available with Single Chip Selects (EDI88128) or Dual Chip
The device is also available as EDI88130C with an additional chip
select line (CS2) which will automatically power down the device
when proper logic levels are applied.
Selects (EDI88130)
■ 2V Data Retention (LP Versions)
■ CS and OE Functions for Bus Control
■ TTL Compatible Inputs and Outputs
■ Fully Static, No Clocks
The second chip select line (CS2) can be used to provide system
memory security during power down in non-battery backed up
systems and simplifiy decoding schemes in memory banking
where large multiple pages of memory are required.
■ Organized as 128Kx8
The EDI88128C and the EDI88130C have eight bi-directional in-
put-output lines to provide simultaneous access to all bits in a
word. An automatic power down feature permits the on-chip
circuitry to enter a very low standby mode and be brought back
into operation at a speed equal to the address access time.
■ Industrial, Military and Commercial Temperature Ranges
■ Thru-hole and Surface Mount Packages JEDEC Pinout
• 32 pin Ceramic DIP, 0.6 mils wide (Package 9)
• 32 lead Ceramic ZIP (Package 100)
• 32 lead Ceramic SOJ (Package 140)
Low power versions, EDI88128LP and EDI88130LP, offer a 2V data
retention function for battery back-up opperation. Military prod-
uct is available compliant to Appendix A of MIL-PRF-38535.
■ Single +5V (±10%) Supply Operation
FIG. 1 PIN CONFIGURATION
PIN DESCRIPTION
32 DIP
I/O0-7
A0-16
WE
Data Inputs/Outputs
Address Inputs
Write Enable
32 SOJ
32 ZIP
TOP VIEW
TOP VIEW
NC
A16
A14
A12
A7
A6 11
A5 13
A4 15
A3 17
A2 19
A1 21
AØ 23
I/OØ 25
I/O1 27
I/O2 29
1
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2 10
A1 11
AØ 12
I/OØ 13
I/O1 14
I/O2 15
1
2
3
4
5
6
7
8
9
32 VCC
2
4
6
8
VCC
A15
NC/CS2*
WE
CS1, CS2
OE
Chip Selects
3
5
7
9
31 A15
30 NC/CS2*
29 WE
28 A13
27 A8
26 A9
25 A11
24 OE
23 A10
22 CS1
21 I/O7
20 I/O6
19 I/O5
18 I/O4
17 I/O3
Output Enable
Power (+5V ±10%)
Ground
VCC
10 A13
12 A8
14 A9
VSS
NC
Not Connected
16 A11
18 OE
20 A10
22 CS1
24 I/O7
26 I/O6
28 I/O5
30 I/O4
32 I/O3
BLOCK DIAGRAM
Memory Array
VSS 31
V
SS 16
Address
Buffer
Address
Decoder
I/O
Circuits
A
Ø-16
I/OØ-7
WE
CS1
CS
OE
2
* Pin 30 is NC for 88128 or CS2 for 88130.
1
July 1999 Rev. 13
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
EDI88128C
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS
Parameter
Unit
OE
X
X
X
H
L
CS1
H
X
X
L
CS2
X
WE
X
Mode
Standby
Output
Power
Icc2, Icc3
Icc2, Icc3
Icc1
High Z
High Z
High Z
High Z
Data Out
Data In
Voltage on any pin relative to Vss
Operating Temperature TA (Ambient)
Commercial
-0.5 to 7.0
V
L
X
Standby
L
X
Output Deselect
Output Deselect
Read
0 to +70
-40 to +85
-55 to +125
-65 to +150
1
°C
°C
°C
°C
W
H
H
Icc1
Industrial
L
H
H
Icc1
Military
X
L
H
L
Write
Icc1
Storage Temperature, Plastic
Power Dissipation
RECOMMENDED OPERATING CONDITIONS
Output Current
20
mA
°C
Junction Temperature, TJ
175
Parameter
Symbol
VCC
Min
4.5
0
Typ
5.0
0
Max
5.5
Unit
V
NOTE:
Supply Voltage
Supply Voltage
Input High Voltage
Input Low Voltage
Stress greater than those listed under "Absolute Maximum Ratings" may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions greater than those indi-
cated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
VSS
0
V
VIH
2.2
-0.3
—
—
Vcc +0.5
+0.8
V
VIL
V
CAPACITANCE
(TA = +25°C)
Parameter
Symbol
CI
Condition
IN = Vcc or Vss, f = 1.0MHz
VOUT = Vcc or Vss, f = 1.0MHz
Max Unit
Address Lines
Input/Output Lines
V
12
14
pF
pF
CO
These parameters are sampled, not 100% tested.
DC CHARACTERISTICS
(VCC = 5V, TA = +25°C)
Parameter
Symbol
Conditions
Units
Min
Typ
—
Max
+5
Input Leakage Current
Output Leakage Current
ILI
VIN = 0V to VCC
-5
-10
—
—
—
—
—
—
2.4
µA
µA
mA
mA
mA
mA
mA
V
ILO
VI/O = 0V to VCC, CS1 ≥ VIH and/or CS2 ≤ VIL
—
+10
120
110
10
(70-85ns)
(100ns)
WE, CS1 = VIL, II/O = 0mA, Min Cycle
CS2 = VIH
Operating Power Supply Current
ICC1
Standby (TTL) Power Supply Current
Full Standby Power Supply Current
ICC2
ICC3
CS1 ≥ VIH and/or CS2 ≤ VIL, VIN ≥ VIH or ≤ VIL
C
1
5
CS1 ≥ VCC -0.2V and/or CS2 ≤ Vcc +0.2V
VIN ≥ Vcc -0.2V or VIN ≤ 0.2V
LP
—
—
—
1
Output Low Voltage
Output High Voltage
VOL
VOH
IOL = 2.1mA
IOH = -1.0mA
0.4
—
V
NOTE: DC test conditions: VIL = 0.3V, VIH = Vcc -0.3V
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
2
EDI88128C
AC CHARACTERISTICS – READ CYCLE
(VCC = 5.0V, VSS = 0V, TA = 0°C to +70°C)
Symbol
JEDEC
70ns
85ns
100ns
Parameter
Alt.
tRC
tAA
Min
Max
Min
Max
Min
Max
Units
ns
Read Cycle Time
tAVAV
tAVQV
70
85
100
Address Access Time
Chip Select Access Time
70
85
100
ns
tELQV
tSHQV
tACS
tACS
70
70
85
85
100
100
ns
ns
Chip Select to Output in Low Z (1)
Chip Disable to Output in High Z (1)
tELQX
tSHQX
tCLZ
tCLZ
3
3
3
3
3
3
ns
ns
tEHQZ
tSLQZ
tCHZ
tCHZ
0
0
30
30
0
0
30
30
0
0
30
30
ns
ns
Output Hold from Address Change
Output Enable to Output Valid
tAVQX
tGLQV
tGLQX
tGHQZ
tOH
tOE
3
3
3
ns
ns
ns
ns
25
30
30
30
50
30
Output Enable to Output in Low Z (1)
Output Disable to Output in High Z (1)
tOLZ
tOHZ
0
0
0
0
0
0
1. This parameter is guaranteed by design but not tested.
AC TEST CONDITIONS
Figure 1
Figure 2
Input Pulse Levels
VSS to 3.0V
Vcc
Vcc
Input Rise and Fall Times
Input and Output Timing Levels
Output Load
5ns
1.5V
480Ω
480Ω
Figure 1
NOTE: For tEHQZ, tGHQZ and tWLQZ, CL = 5pF Figure 2)
Q
Q
30pF
5pF
255Ω
255Ω
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
EDI88128C
AC CHARACTERISTICS – WRITE CYCLE
(VCC = 5.0V, VSS = 0V, TA = 0°C to +70°C)
Symbol
JEDEC
70ns
85ns
100ns
Parameter
Alt.
Min
Max
Min
Max
Min
Max
Units
Write Cycle Time
Chip Select to End of Write
tAVAV
tWC
70
85
100
ns
tELWH
tELEH
tSHWH
tSHSL
tCW
tCW
tCW
tCW
60
60
60
60
75
75
75
75
85
85
85
85
ns
ns
ns
ns
Address Setup Time
tAVWL
tAVEL
tAVSH
tAS
tAS
tAS
0
0
0
0
0
0
0
0
0
ns
ns
ns
Address Valid to End of Write
Write Pulse Width
tAVWH
tAW
60
75
85
ns
tWLWH
tWLEH
tWLSL
tWP
tWP
tWP
35
35
35
70
70
70
80
80
80
ns
ns
ns
Write Recovery Time
Data Hold Time
tWHAX
tEHAX
tSLAX
tWR
tWR
tWR
5
5
5
5
5
5
5
5
5
ns
ns
ns
tWHDX
tEHDX
tSLDX
tDH
tDH
tDH
0
0
0
0
0
0
0
0
0
ns
ns
ns
Write to Output in High Z (1)
Data to Write Time
tWLQZ
tWHZ
0
30
0
35
0
40
ns
tDVWH
tDVEH
tDVSL
tDW
tDW
tDW
35
35
35
40
40
40
40
40
40
ns
ns
ns
Output Active from End of Write (1)
tWHQX
tWLZ
5
5
5
ns
1. This parameter is guaranteed by design but not tested.
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
4
EDI88128C
tAVAV
FIG. 2
ADDRESS
TIMING WAVEFORM - READ CYCLE
tAVQV
CS
1
tELQV
tELQX
tEHQZ
tSLQZ
tGHQZ
tAVAV
CS
2
ADDRESS
DATA I/O
ADDRESS 1
ADDRESS 2
tSHQV
tSHQX
OE
tAVQV
tAVQX
tGLQV
tGLQX
DATA 1
DATA 2
DATA I/O
READ CYCLE 1 (WE HIGH; OE, CS LOW)
READ CYCLE 2 (WE HIGH)
tAVAV
FIG. 3
WRITE CYCLE 1
ADDRESS
tAVWH
tWLWH
tWHAX
tAVWL
WE
CS
CS
1
2
tELWH
tWHQX
tWHDX
tSHWH
tDVWH
DATA IN
DATA VALID
tWLQZ
HIGH Z
DATA OUT
WRITE CYCLE 1 - LATE WRITE, WE CONTROLLED
FIG. 4
WRITE CYCLE 3
WRITE CYCLE2
tAVAV
tAVAV
WS32K32-XHX
ADDRESS
ADDRESS
tSLAX
tEHAX
tAVSH
tAVEL
tWLSL
tWLEH
WE
WE
tSHSL
tELEH
CS
1
CS1
CS
2
CS2
tDVSL
tSLDX
tDVEH
tEHDX
DATA IN
DATA IN
DATA VALID
DATA VALID
WRITE CYCLE 2 - EARLY WRITE, CS
1
CONTROLLED
WRITE CYCLE 3 - EARLY WRITE, CS2 CONTROLLED
5
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
EDI88128C
DATA RETENTION CHARACTERISTICS (EDI88128LP & EDI88130LP ONLY)
(TA = -55°C to +125°C)
Characteristic
Sym
Conditions
Min
Typ
Max
Units
Low Power Version only
Data Retention Voltage
VDD
ICCDR
TCDR
TR
VDD = 2.0V
2
–
–
–
–
–
400
–
V
µA
ns
Data Retention Quiescent Current
Chip Disable to Data Retention Time (1)
Operation Recovery Time (1)
CS1 ≥ VDD -0.2V
VIN ≥ VDD -0.2V
or VIN ≤ 0.2V
–
0
TAVAV*
–
ns
NOTE:
1. Parameter guaranteed by design, but not tested.
* Read Cycle Time
FIG. 5
DATA RETENTION - CS1 CONTROLLED
Data Retention Mode
WS32K32-XHX
4.5V
4.5V
Vcc
VDD
tCDR
tR
CS1
CS1 ≥ VDD -0.2V
DATA RETENTION, CS1 CONTROLLED
FIG. 6
DATA RETENTION - CS2 CONTROLLED
Data Retention Mode
WS32K32-XHX
4.5V
4.5V
Vcc
VDD
tCDR
tR
CS2
CS2 ≤ 0.2V
DATA RETENTION, CS2 CONTROLLED
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
6
EDI88128C
PACKAGE 9: 32 PIN SIDEBRAZED CERAMIC DIP (600mils wide)
1.616
1.584
0.620
0.600
0.060
0.040
Pin 1 Indicator
0.175
0.125
0.155
0.115
0.600
NOM
0.020
0.016
0.100
TYP
0.061
0.017
15 x 0.100 = 1.500
ALL DIMENSIONS ARE IN INCHES
PACKAGE 100: 32 LEAD CERAMIC ZIP
1.65 MAX
0.125
MAX
0.500
MAX
0.040
0.020
0.155
0.125
0.100
NOM
0.050
0.040
MIN
31 x 0.050 = 1.550
ALL DIMENSIONS ARE IN INCHES
PACKAGE 140: 32 LEAD CERAMIC SOJ
0.108
0.088
0.840
0.820
0.040
0.030
0.050
TYP
0.440
0.430
0.379
REF
0.155
0.120
ALL DIMENSIONS ARE IN INCHES
7
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
EDI88128C
ORDERING INFORMATION
EDI 8 8 128 C X X X
WHITE ELECTRONIC DESIGNS
SRAM
ORGANIZATION, 128Kx8
8 130 = Dual Chip Select
TECHNOLOGY:
C = CMOS Standard Power
LP = Low Power
ACCESS TIME (ns)
PACKAGE TYPE:
C = 32 lead Sidebrazed DIP, 600 mil (Package 9)
N = 32 lead Ceramic SOJ (Package 140)
Z = 32 lead Ceramic ZIP (Package 100)
DEVICE GRADE:
B = MIL-STD-883 Compliant
M= Military Screened
I = Industrial
C = Commercial
-55°C to +125°C
-40°C to +85°C
0°C to +70°C
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
8
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