IBM0116160PT3-60 [ETC]

x16 Fast Page Mode DRAM ; X16快速页模式DRAM\n
IBM0116160PT3-60
型号: IBM0116160PT3-60
厂家: ETC    ETC
描述:

x16 Fast Page Mode DRAM
X16快速页模式DRAM\n

内存集成电路 光电二极管 动态存储器
文件: 总27页 (文件大小:385K)
中文:  中文翻译
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Discontinued (9/98 - last order; 3/99 last ship)  
IBM01161601M  
x 1612/8, 5.0VMMDD35DSU-011010627. IBM0116160P1M x 1612/8, 3.3V, LP, SRMMDD35DSU-011010627. IBM0116160M 1M x 1612/8, 5.0V, LP, SRMMDD35DSU-011010627. IBM011616B1M x 1612/8, 3.3VMMDD35DSU-011010627.  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Features  
• Low Power Dissipation  
• 1,048,576 word by 16 bit organization  
- Active (max) - 50 mA / 45 mA  
- Standby: TTL Inputs (max) - 2.0 mA  
- Standby: CMOS Inputs (max)  
- 1.0 mA (SP version)  
• Single 3.3V ± 0.3V or 5.0V ± 0.5V power supply  
• Standard Power (SP) and Low Power (LP)  
- 0.1 mA (LP version)  
- Self Refresh (LP version only)  
- 200µA (3.3 Volt)  
• 4096 Refresh Cycles  
- 64 ms Refresh Rate (SP version)  
- 256 ms Refresh Rate (LP version)  
- 300µA (5.0 Volt)  
• High Performance:  
• 2 CAS  
-50  
50  
13  
25  
95  
35  
-60  
60  
Units  
ns  
• Fast Page Mode  
tRAC  
tCAC  
tAA  
RAS Access Time  
• Read-Modify-Write  
CAS Access Time  
15  
ns  
• RAS Only and CAS before RAS Refresh  
• Hidden Refresh  
Column Address Access Time  
Cycle Time  
30  
ns  
tRC  
110  
40  
ns  
• Package: TSOP-II 50/44 (400mil x 825mil)  
SOJ 42/42 (400mil)  
tPC  
Fast Page Mode Cycle Time  
ns  
Description  
vide high performance, low power dissipation, and  
high reliability. The devices operate with a single  
3.3V ± 0.3V or 5.0V ± 0.5V power supply. The 20  
addresses required to access any bit of data are  
multiplexed (12 are strobed with RAS, 8 are strobed  
with CAS).  
The IBM0116160 is a dynamic RAM organized  
1,048,576 words by 16 bits, which has a very low  
“sleep mode” power consumption option. These  
devices are fabricated in IBM’s advanced 0.5µm  
CMOS silicon gate process technology. The circuit  
and process have been carefully designed to pro-  
Pin Assignments (Top View)  
Pin Description  
RAS  
LCAS / UCAS  
WE  
Row Address Strobe  
L/U Column Address Strobe  
Read/Write Input  
Address Inputs  
50/44 TSOP  
42/42 SOJ  
VCC  
IO0  
IO1  
IO2  
IO3  
VCC  
IO4  
IO5  
IO6  
IO7  
NC  
1
50  
VSS  
VCC  
IO0  
IO1  
IO2  
IO3  
VCC  
IO4  
IO5  
IO6  
IO7  
1
2
3
4
5
6
7
8
42  
VSS  
2
3
4
5
49 IO15  
48 IO14  
47 IO13  
46 IO12  
41 IO15  
40 IO14  
39 IO13  
38 IO12  
A0 - A11  
OE  
Output Enable  
6
7
8
9
10  
11  
45  
VSS  
37  
VSS  
44 IO11  
43 IO10  
42 IO9  
41 IO8  
40 NC  
36 IO11  
35 IO10  
34 IO9  
I/O0 - I/O15  
VCC  
Data Input/Output  
Power (+3.3V or +5.0V)  
Ground  
9
33  
32 NC  
IO8  
10  
11  
VSS  
NC  
NC  
NC  
WE  
RAS  
A11 19  
A10  
A0  
A1  
A2  
A3  
15  
16  
17  
18  
36 NC  
35 LCAS  
34 UCAS  
33 OE  
32 A9  
31 A8  
30 A7  
29 A6  
28 A5  
27 A4  
NC  
WE  
RAS  
A11 15  
A10  
A0  
12  
13  
14  
31 LCAS  
30 UCAS  
29 OE  
28 A9  
27 A8  
26 A7  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
A1  
A2  
25 A6  
24 A5  
A3  
VCC  
20  
21  
23 A4  
22  
VSS  
VCC  
26  
VSS  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Ordering Information  
Part Number  
SP / LP  
SP  
SP  
SP  
SP  
SP  
SP  
SP  
SP  
LP  
Self Refresh Power Supply  
Speed  
50ns  
60ns  
50ns  
60ns  
50ns  
60ns  
50ns  
60ns  
50ns  
60ns  
50ns  
60ns  
50ns  
60ns  
50ns  
60ns  
Package  
Notes  
IBM0116160T3 -50  
IBM0116160T3 -60  
IBM0116160BT3 -50  
IBM0116160BT3 -60  
IBM0116160J3 -50  
IBM0116160J3 -60  
IBM0116160BJ3 -50  
IBM0116160BJ3 -60  
IBM0116160MT3 -50  
IBM0116160MT3 -60  
IBM0116160PT3 -50  
IBM0116160PT3 -60  
IBM0116160MJ3 -50  
IBM0116160MJ3 -60  
IBM0116160PJ3 -50  
IBM0116160PJ3 -60  
No  
No  
5.0V  
5.0V  
3.3V  
3.3V  
5.0V  
5.0V  
3.3V  
3.3V  
5.0V  
5.0V  
3.3V  
3.3V  
5.0V  
5.0V  
3.3V  
3.3V  
400mil TSOP-II 50/44  
400mil TSOP-II 50/44  
400mil TSOP-II 50/44  
400mil TSOP-II 50/44  
400mil SOJ 42/42  
400mil SOJ 42/42  
400mil SOJ 42/42  
400mil SOJ 42/42  
400mil TSOP-II 50/44  
400mil TSOP-II 50/44  
400mil TSOP-II 50/44  
400mil TSOP-II 50/44  
400mil SOJ 42/42  
400mil SOJ 42/42  
400mil SOJ 42/42  
400mil SOJ 42/42  
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
No  
No  
No  
No  
No  
No  
Yes  
Yes  
Yes  
Yes  
Yes  
Yes  
Yes  
Yes  
LP  
LP  
LP  
LP  
LP  
LP  
LP  
1. SP = Standard Power version (IBM0116160 and IBM0116160B); LP = Low Power version (IBM0116160M and IBM00116160P)  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Block Diagram  
I/O0  
I/O15  
Vss  
Vcc  
(5.0 Volt version)  
(to OCDs)  
16  
16  
Regulator  
OE  
V
(internal)  
Data In Buffer  
Data Out Buffer  
DD  
WE  
&
16  
16  
UCAS  
LCAS  
CAS Clock  
Generator  
OR  
Column Address  
Buffer (8)  
16  
Column Decoder and I/O Gate  
Sense Amplifiers  
8
A0  
A1  
8
A2  
Refresh  
A3  
256 x 16  
Controller  
A4  
A5  
A6  
Refresh Counter  
(12)  
A7  
A8  
Memory Array  
12  
12  
4096  
A9  
4096 x 256 x 16  
Row Address  
Buffer (12)  
A10  
A11  
12  
RAS Clock  
Generator  
RAS  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Truth Table  
Row  
Address Address  
Column  
Function  
RAS  
LCAS UCAS  
WE  
OE  
I/O0 - I/O15  
HX HX  
Standby  
H
L
X
H
X
L
X
X
High Impedance  
Data Out  
Read: Word  
L
L
L
Row  
Col  
Lower Byte: Data Out  
Upper Byte: High-Z  
Read: Lower Byte  
Read: Upper Byte  
L
L
L
L
L
H
H
H
L
L
L
Row  
Row  
Row  
Row  
Row  
Col  
Col  
Col  
Col  
Col  
Lower Byte: High-Z  
Upper Byte: Data Out  
H
L
L
L
Write: Word  
Early-Write  
X
X
X
Data In  
Write: Lower Byte  
Early-Write  
Lower Byte: Data In  
Upper Byte: High-Z  
L
H
L
L
Write: Upper Byte  
Early-Write  
Lower Byte: High-Z  
Upper Byte: Data In  
H
L
HL  
H
LH  
Read-Modify-Write  
L
L
HL  
HL  
HL  
HL  
HL  
HL  
H
L
HL  
HL  
HL  
HL  
HL  
HL  
H
Row  
Row  
N/A  
Row  
N/A  
Row  
N/A  
Row  
X
Col  
Col  
Col  
Col  
Col  
Col  
Col  
N/A  
N/A  
Col  
Data Out, Data In  
Data Out  
1st Cycle  
L
L
L
Fast Page Mode  
Read  
2nd Cycle  
1st Cycle  
2nd Cycle  
1st Cycle  
2nd Cycle  
L
H
Data Out  
L
L
X
Data In  
Fast Page Mode  
Write  
L
L
X
Data In  
HL  
HL  
X
LH  
LH  
X
L
Data Out, Data In  
Data Out, Data In  
High Impedance  
High Impedance  
Data Out  
Fast Page Mode  
Read-Modify-Write  
L
L
RAS-Only Refresh  
HL  
LHL  
CAS-Before-RAS Refresh  
L
L
H
X
Read  
Write  
L
L
H
L
Row  
Hidden Refresh  
LH  
L
L
X
Row  
X
Col  
X
Data In  
LHL  
HL  
Self Refresh (LP version only)  
L
L
H
X
High Impedance  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Absolute Maximum Ratings  
Rating  
Symbol  
Parameter  
Units Notes  
3.3 Volt Device  
-0.5 to +4.6  
5.0 Volt Device  
VCC  
VIN  
Power Supply Voltage  
Input Voltage  
-1.0 to +7.0  
V
V
1
1
1
1
1
1
1
-0.5 to min (VCC+0.5, 4.6)  
-0.5 to min (VCC+0.5, 4.6)  
0 to +70  
-0.5 to min (VCC+0.5, 7.0)  
VOUT  
TOPR  
TSTG  
PD  
-0.5 to min (VCC+0.5, 7.0)  
Output Voltage  
V
°C  
°C  
W
mA  
Operating Temperature  
Storage Temperature  
Power Dissipation  
0 to +70  
-55 to +150  
1.0  
-55 to +150  
1.0  
IOUT  
Short Circuit Output Current  
50  
50  
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reli-  
ability.  
Recommended DC Operating Conditions (TA= 0 to 70˚C)  
3.3 Volt Device  
5.0 Volt Device  
Symbol  
Parameter  
Units  
Notes  
Min.  
3.0  
Typ.  
3.3  
Max.  
3.6  
Min.  
4.5  
Typ.  
5.0  
Max.  
5.5  
VCC  
VIH  
VIL  
Supply Voltage  
V
V
V
1
VCC + 0.5  
0.8  
VCC + 0.5  
0.8  
Input High Voltage  
Input Low Voltage  
2.0  
2.4  
1, 2  
1, 2  
-0.5  
-0.5  
1. All voltages referenced to VSS  
.
2. VIH may overshoot to VCC + 1.2V for pulse widths of 4.0ns with 3.3 Volt, or VCC + 2.0V for pulse widths of 4.0ns (or VCC + 1.0V  
for 8.0ns) with 5.0 Volt. Additionally, VIL may undershoot to -2.0V for pulse widths 4.0ns with 3.3 Volt, or to -2.0V for pulse  
widths 4.0ns (or -1.0V for 8.0ns) with 5.0 Volt. Pulse widths measured at 50% points with amplitude measured peak to DC ref-  
erence.  
Capacitance (TA= 25°C, VCC= 3.3V ± 0.3V or VCC= 5.0V ± 0.5V)  
Symbol  
CI1  
Parameter  
Input Capacitance (A0 - A11)  
Min.  
Max.  
Units  
pF  
Notes  
5
7
7
1
1
1
CI2  
Input Capacitance (RAS, LCAS, UCAS, WE, OE)  
Output Capacitance (I/O0 - I/O15)  
pF  
CO  
pF  
1. Input capacitance measurements made with rise time shift method with CAS = VIH to disable output.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
 
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
DC Electrical Characteristics (TA= 0 to +70˚C, VCC= 3.3V ± 0.3V or VCC= 5.0V ± 0.5V)  
Symbol  
Parameter  
Min.  
Max.  
50  
Units  
mA  
Notes  
1, 2, 3  
Operating Current  
-50  
-60  
ICC1  
Average Power Supply Operating Current  
(RAS, CAS, Address Cycling: tRC = tRC min.)  
45  
Standby Current (TTL)  
Power Supply Standby Current  
(RAS = CAS = VIH)  
ICC2  
ICC3  
ICC4  
ICC5  
ICC6  
1
mA  
RAS Only Refresh Current  
Average Power Supply Current, RAS Only Mode  
(RAS Cycling, CAS = VIH: tRC = tRC min)  
-50  
-60  
50  
45  
25  
25  
1
mA  
mA  
1, 3  
Fast Page Mode Current  
Average Power Supply Current  
(RAS = VIL, CAS, Address Cycling: tPC = tPC min)  
-50  
1, 2, 3  
-60  
Standby Current (CMOS)  
Power Supply Standby Current  
(RAS = CAS = VCC - 0.2V)  
SP version  
LP version  
-50  
mA  
mA  
0.1  
50  
45  
200  
CAS Before RAS Refresh Current  
Average Power Supply Current, CAS Before RAS Mode  
(RAS, CAS, Cycling: tRC = tRC min)  
1, 3  
-60  
Self Refresh Current, LP version only  
3.3V  
Average Power Supply Current during Self Refresh  
CBR cycle with RAS tRASS (min); CAS held low;  
WE = VCC - 0.2V; Addresses and DIN = VCC - 0.2V or 0.2V.  
ICC7  
µA  
5.0V  
300  
Input Leakage Current  
Input Leakage Current, any input  
(0.0 VIN (VCC + 0.3V)), All Other Pins Not Under Test = 0V  
II(L)  
IO(L)  
VOH  
µA  
µA  
V
-5  
-5  
+5  
+5  
Output Leakage Current  
(DOUT is disabled, 0.0 VOUT VCC  
)
Output Level (TTL)  
Output “H” Level Voltage  
(IOUT = -2.0mA for 3.3V, or IOUT = -5mA for 5.0V)  
VCC  
2.4  
Output Level (TTL)  
Output “L” Level Voltage  
VOL  
0.0  
0.4  
V
(IOUT = +2.0mA for 3.3V, or IOUT = +4.2mA for 5.0V)  
1. ICC1, ICC3, ICC4 and ICC6 depend on cycle rate.  
2. ICC1 and ICC4 depend on output loading. Specified values are obtained with the output open.  
3. Address can be changed once or less while RAS =VIL. In the case of ICC4, it can be changed once or less when CAS =VIH.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
AC Characteristics (TA= 0 to +70˚C, VCC= 3.3V ± 0.3V or VCC= 5.0V ± 0.5V)  
1. An initial pause of 200µs is required after power-up followed by 8 RAS only refresh cycles before proper device operation is  
achieved. In case of using the internal refresh counter, a minimum of 8 CAS before RAS refresh cycles instead of 8 RAS only  
refresh cycles is required.  
2. AC measurements assume tT=5ns.  
3. VIH(min.) and VIL(max.) are reference levels for measuring timing of input signals. Also, transition times are measured between VIH  
and VIL.  
4. Valid column addresses are A0 through A7.  
5. When both LCAS and UCAS go low at the same time, all 16 bits of data are read/written into the device. LCAS and UCAS cannot be  
staggered within the same read/write cycle.  
Read, Write, Read-Modify-Write and Refresh Cycles (Common Parameters)  
-50  
Max.  
-60  
Max.  
Symbol  
Parameter  
Units  
Notes  
Min.  
95  
30  
10  
50  
13  
0
Min.  
110  
40  
10  
60  
15  
0
tRC  
tRP  
Random Read or Write Cycle Time  
RAS Precharge Time  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tCP  
CAS Precharge Time  
tRAS  
tCAS  
tASR  
tRAH  
tASC  
tCAH  
tRCD  
tRAD  
tRSH  
tCSH  
tCRP  
tDZO  
tDZC  
tT  
RAS Pulse Width  
10K  
10K  
10K  
10K  
CAS Pulse Width  
Row Address Setup Time  
Row Address Hold Time  
Column Address Setup Time  
Column Address Hold Time  
RAS to CAS Delay Time  
RAS to Column Address Delay Time  
RAS Hold Time  
10  
0
10  
0
10  
20  
15  
13  
50  
5
10  
20  
15  
15  
60  
5
37  
25  
45  
30  
1
2
CAS Hold Time  
CAS to RAS Precharge Time  
OE Delay Time from DIN  
CAS Delay Time from DIN  
Transition Time (Rise and Fall)  
0
0
3
3
4
0
0
3
50  
3
50  
1. Operation within the tRCD(max.) limit ensures that tRAC(max.) can be met. tRCD(max.) is specified as a reference point only. If tRCD  
is greater than the specified tRCD(max.) limit, then access time is controlled by tCAC  
2. Operation within the tRAD(max.) limit ensures that tRAC(max.) can be met. tRAD(max.) is specified as a reference point only. If tRAD is  
.
greater than the specified tRAD(max.) limit, then access time is controlled by tAA  
.
3. Either tDZC or tDZO must be satisfied.  
4. AC measurements assume tT=5ns.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
 
 
 
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Write Cycle  
-50  
Max.  
-60  
Max.  
Symbol  
Parameter  
Write Command Set Up Time  
Units  
Notes  
1
Min.  
0
Min.  
0
tWCS  
tWCH  
tWP  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Write Command Hold Time  
Write Command Pulse Width  
Write Command to RAS Lead Time  
Write Command to CAS Lead Time  
OE to DIN Delay Time  
10  
10  
13  
13  
13  
0
15  
15  
15  
15  
15  
0
tRWL  
tCWL  
tOED  
tDS  
2
3
3
DIN Setup Time  
tDH  
DIN Hold Time  
10  
12  
1. tWCS, tRWD, tCWD, tAWD and tCPW are not restrictive operating parameters. They are included in the data sheet as electrical charac-  
teristics only. If tWCS tWCS (min), the cycle is an early write cycle and the data pin will remain open circuit (high impedance)  
through the entire cycle. If tRWD tRWD (min), tCWD tCWD (min), tAWD tAWD (min), and tCPW tCPW (min)(Fast Page Mode), the  
cycle is a Read-Modify-Write cycle and the data out will contain data read from the selected cell. If neither of the above sets of con-  
ditions are satisfied, the condition of the data out (at access time) is indeterminate.  
2. Either tCDD or tOED must be satisfied.  
3. These parameters are referenced to LCAS or UCAS leading edge in early write cycles and to WE leading edge in Read-Modify-  
Write cycles.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Read Cycle  
-50  
Max.  
-60  
Symbol  
Parameter  
Units  
Notes  
Min.  
0
Min.  
0
Max.  
60  
15  
30  
15  
tRAC  
tCAC  
tAA  
Access Time from RAS  
Access Time from CAS  
50  
13  
25  
13  
13  
13  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
1, 2, 3  
1, 3  
2, 3  
3
Access Time from Address  
Access Time from OE  
tOEA  
tRCS  
tRCH  
tRRH  
tRAL  
tCAL  
tCLZ  
tOH  
Read Command Setup Time  
Read Command Hold Time to CAS  
Read Command Hold Time to RAS  
Column Address to RAS Lead Time  
Column Address to CAS Lead Time  
CAS to Output in Low-Z  
0
0
4
4
0
0
25  
25  
0
30  
30  
0
3
Output Data Hold Time  
3
3
tOHO  
tOFF  
tOEZ  
tCDD  
Output Data Hold from OE  
3
3
Output Buffer Turn-Off Delay  
Output Buffer Turn-Off Delay from OE  
CAS to DIN Delay Time  
13  
15  
15  
15  
5
5
6
1. Operation within the tRCD(max.) limit ensures that tRAC(max.) can be met. tRCD(max.) is specified as a reference point only. If tRCD  
is greater than the specified tRCD(max.) limit, then access time is controlled by tCAC  
2. Operation within the tRAD(max.) limit ensures that tRAC(max.) can be met. tRAD(max.) is specified as a reference point only. If tRAD is  
.
greater than the specified tRAD(max.) limit, then access time is controlled by tAA  
.
3. Measured with the specified current load and 100pF.  
4. Either tRCH or tRRH must be satisfied for a read cycle.  
5. tOFF (max) and tOEZ (max) define the time at which the output achieves the open circuit condition and are not referenced to output  
voltage levels.  
6. Either tCDD or tOED must be satisfied.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
 
 
 
 
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Read-Modify-Write Cycle  
-50  
Max.  
-60  
Max.  
Symbol  
Parameter  
Read-Modify-Write Cycle Time  
Units  
Notes  
Min.  
128  
68  
Min.  
150  
80  
tRWC  
tRWD  
tCWD  
tAWD  
tOEH  
ns  
ns  
ns  
ns  
ns  
RAS to WE Delay Time  
1
1
1
CAS to WE Delay Time  
31  
35  
Column Address to WE Delay Time  
OE Command Hold Time  
43  
50  
13  
15  
1. tWCS, tRWD, tCWD, tAWD and tCPW are not restrictive operating parameters. They are included in the data sheet as electrical charac-  
teristics only. If tWCS tWCS (min), the cycle is an early write cycle and the data pin will remain open circuit (high impedance)  
through the entire cycle. If tRWD tRWD (min), tCWD tCWD (min), tAWD tAWD (min), and tCPW tCPW (min)(Fast Page Mode), the  
cycle is a Read-Modify-Write cycle and the data out will contain data read from the selected cell. If neither of the above sets of con-  
ditions are satisfied, the condition of the data out (at access time) is indeterminate.  
Fast Page Mode Cycle  
-50  
Max.  
-60  
Max.  
Symbol  
Parameter  
Fast Page Mode Cycle Time  
Units  
Notes  
Min.  
35  
Min.  
40  
tPC  
200K  
28  
200K  
35  
ns  
ns  
ns  
ns  
tRASP  
tCPA  
Fast Page Mode RAS Pulse Width  
Access Time from CAS Precharge  
RAS Hold Time from CAS Precharge  
50  
60  
1
tCPRH  
30  
35  
1. Measured with the specified current load and 100pF.  
Fast Page Mode Read-Modify-Write Cycle  
-50  
-60  
Symbol  
Parameter  
Units  
Notes  
Min.  
71  
Max.  
Min.  
80  
Max.  
Fast Page Mode Read-Modify-Write  
Cycle Time  
tPRWC  
tCPW  
ns  
ns  
WE Delay Time from CAS Precharge  
48  
55  
1
1. tWCS, tRWD, tCWD, tAWD and tCPW are not restrictive operating parameters. They are included in the data sheet as electrical charac-  
teristics only. If tWCS tWCS (min), the cycle is an early write cycle and the data pin will remain open circuit (high impedance)  
through the entire cycle. If tRWD tRWD (min), tCWD tCWD (min), tAWD tAWD (min), and tCPW tCPW (min)(Fast Page Mode), the  
cycle is a Read-Modify-Write cycle and the data out will contain data read from the selected cell. If neither of the above sets of con-  
ditions are satisfied, the condition of the data out (at access time) is indeterminate.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
 
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Refresh Cycle  
-50  
Max.  
-60  
Symbol  
Parameter  
Units  
Notes  
Min.  
5
Min.  
5
Max.  
CAS Setup Time  
tCSR  
tCHR  
tWRP  
ns  
ns  
ns  
(CAS before RAS Refresh Cycle)  
CAS Hold Time  
10  
10  
10  
10  
(CAS before RAS Refresh Cycle)  
WE Setup Time  
(CAS before RAS Refresh Cycle)  
WE Hold Time  
tWRH  
tRPC  
10  
5
10  
5
ns  
ns  
(CAS before RAS Cycle)  
RAS Precharge to CAS Hold Time  
Self Refresh Cycle - Low Power Version Only  
-50  
-60  
Symbol  
Parameter  
Units  
Notes  
Min.  
100  
Max.  
Min.  
100  
Max.  
RAS Pulse Width  
tRASS  
tRPS  
tCHS  
tCHD  
µs  
ns  
ns  
µs  
1
During Self Refresh Cycle  
RAS Precharge Time  
During Self Refresh Cycle  
89  
-50  
350  
104  
-50  
1
CAS Hold Time From RAS Rising  
During Self Refresh Cycle  
1, 2  
1, 2  
CAS Hold Time From RAS Falling  
During Self Refresh Cycle  
350  
1. When using Self Refresh mode, the following refresh operations must be performed to ensure proper DRAM operation:  
If row addresses are being refreshed in an EVENLY DISTRIBUTED manner over the refresh interval using CBR refresh cycles,  
then only one CBR cycle must be performed immediately after exit from Self Refresh.  
If row addresses are being refreshed in any other manner (ROR- Distributed/Burst; or CBR-Burst) over the refresh interval, then a  
full set of row refreshes must be performed immediately before entry to and immediately after exit from Self Refresh.  
2. If tRASS > tCHD (min) then tCHD applies. If tRASS tCHD (min) then tCHS applies.  
Refresh  
-50  
-60  
Symbol  
Parameter  
Units  
ms  
Notes  
1
Min.  
Max.  
64  
Min.  
Max.  
64  
SP version  
LP version  
tREF  
Refresh Period  
256  
256  
1. 4096 cycles.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
 
 
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Read Cycle  
tRC  
tRP  
tRAS  
VIH  
RAS  
VIL  
tCSH  
tCRP  
tRCD  
tRSH  
VIH  
UCAS  
LCAS  
tCAS  
VIL  
tRAD  
tASC  
tRAL  
tCAL  
tASR  
tRAH  
tCAH  
VIH  
Address  
Row  
Column  
VIL  
tRCH  
tRCS  
tRRH  
VIH  
VIL  
WE  
OE  
tAA  
VIH  
VIL  
tOEA  
tDZC  
tCDD  
tDZO  
tOED  
VIH  
VIL  
Hi-Z  
DIN  
tCAC  
tOFF  
tCLZ  
tOEZ  
VOH  
VOL  
Valid Data Out  
DOUT  
Hi-Z  
Hi-Z  
tRAC  
tOH  
: “H”: or “L”  
tOHO  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Write Cycle (Early Write)  
tRC  
tRAS  
tRP  
VIH  
RAS  
VIL  
tCSH  
tCRP  
tRCD  
tRSH  
VIH  
tCAS  
UCAS  
LCAS  
VIL  
tRAD  
tASC  
tASR  
tRAH  
tCAH  
VIH  
VIL  
Address  
Row  
Column  
tWCS  
tWCH  
VIH  
VIL  
tWP  
WE  
OE  
VIH  
VIL  
tDS  
tDH  
VIH  
VIL  
DIN  
Valid Data In  
VOH  
VOL  
DOUT  
Hi-Z  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Write Cycle (Delayed Write)  
tRC  
tRAS  
tRP  
VIH  
RAS  
VIL  
tCSH  
tCRP  
tRCD  
tRSH  
VIH  
VIL  
UCAS  
LCAS  
tCAS  
tRAD  
tASC  
tASR  
tRAH  
tCAH  
VIH  
VIL  
Address  
Row  
Column  
tCWL  
tRCS  
VIH  
VIL  
tWP  
WE  
OE  
tRWL  
VIH  
VIL  
tOEH  
tDH  
tOED  
tDZO  
tDS  
tDZC  
VIH  
VIL  
Valid Data In  
DIN  
Hi-Z  
tOEZ  
tCLZ  
tOEA  
VOH  
VOL  
*
DOUT  
Hi-Z  
Hi-Z  
*
tOEH greater than or equal to tCWL  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Read-Modify-Write Cycle  
tRWC  
tRP  
tRAS  
VIH  
RAS  
VIL  
tCSH  
tRSH  
tCAS  
tCRP  
tRCD  
VIH  
UCAS  
LCAS  
tRAD  
tASC  
VIL  
tASR  
tRAH  
tCAH  
VIH  
VIL  
Row  
Column  
Address  
tCWD  
tRWL  
tCWL  
tAWD  
tRWD  
tAA  
tWP  
VIH  
VIL  
WE  
OE  
tRCS  
tOEH  
VIH  
VIL  
tOEA  
tDZC  
tDH  
tDS  
tDZO  
Hi-Z  
VIH  
VIL  
DIN  
DIN  
tCAC  
tCLZ  
tOED  
tOEZ  
VOH  
VOL  
*
Hi-Z  
Hi-Z  
DOUT  
DOUT  
tRAC  
tOHO  
: “H” or “L”  
*
tOEH greater than or equal to tCWL  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Fast Page Mode Read Cycle  
tRASP  
tRP  
VIH  
tCPRH  
RAS  
VIL  
tPC  
tRCD  
tCP  
tCP  
tRSH  
tCAS  
tCAL  
tCRP  
VIH  
UCAS  
tCAS  
tCAS  
LCAS  
VIL  
tCSH  
tASC  
tRAL  
tASC  
tRAH  
tCAH  
tASR  
tCAH  
tASC  
tCAH  
VIH  
VIL  
Address  
Row  
Column 1  
Column 2  
Column n  
tRAD  
tRCS  
tRCS  
tRCS  
tRCH  
tRCH  
tRCH  
VIH  
VIL  
WE  
OE  
tRRH  
tAA  
tAA  
tAA  
tCPA  
tCPA  
tOEA  
tOEA  
tOEA  
VIH  
VIL  
tOHO  
tOH  
tOHO  
tOH  
tOHO  
tOH  
tDZC  
tDZC  
tDZC  
tCDD  
tOED  
tDZO  
tDZO  
tDZO  
tOED  
tOED  
VIH  
VIL  
DIN  
tCAC  
tCAC  
tCAC  
tOFF  
tOEZ  
tOFF  
tOEZ  
tOFF  
tOEZ  
tRAC  
tCLZ  
tCLZ  
tCLZ  
VOH  
VOL  
DOUT  
DOUT  
1
D
OUT 2  
DOUT N  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Fast Page Mode Write Cycle  
tRASP  
tRP  
VIH  
RAS  
VIL  
tPC  
tRSH  
tCAS  
tCRP  
tCP  
tCP  
tRCD  
VIH  
VIL  
UCAS  
LCAS  
tCAS  
tCSH  
tASC  
tASR tRAH  
tCAH  
tCAH  
tCAH  
tASC  
tASC  
VIH  
VIL  
Address  
Row  
Column 1  
Column 2  
Column n  
tRAD  
tCWL  
tCWL  
tRWL  
tCWL  
tWCH  
tWCH  
tWCH  
tWCS  
tWCS  
tWCS  
VIH  
VIL  
tWP  
tWP  
tWP  
WE  
OE  
VIH  
VIL  
tDS  
tDH  
tDH  
tDH  
tDS  
tDS  
VIH  
VIL  
DIN  
DIN  
1
DIN  
2
DIN N  
VOH  
VOL  
DOUT  
Hi-Z  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Fast Page Mode Read-Modify-Write Cycle  
tRASP  
tRP  
VIH  
RAS  
VIL  
tPRWC  
tCRP  
tRCD  
tCP  
tCP  
tRSH  
tCAS  
VIH  
VIL  
UCAS  
LCAS  
tCAS  
tCAS  
tCSH  
tASC  
tCWL  
tCWL  
tCWL  
tASC tCAH  
tASC  
tRWL  
tASR  
tCAH  
tRAH  
tCAH  
VIH  
VIL  
Address  
Row  
Column 1  
Column 2  
Column n  
tCPW  
tAWD  
tCPW  
tAWD  
tRWD  
tAWD  
tRCS  
tWP  
tRCS  
tWP  
tRCS  
tCWD  
tCWD  
tCWD  
tWP  
VIH  
VIL  
WE  
OE  
tCAC  
tCAC  
tCAC  
tAA  
tAA  
tAA  
tRAD  
tCPA  
tCPA  
VIH  
VIL  
tOEH  
tOEH  
tOEH  
tOEA  
tOEA  
tOEA  
tDH  
tDS  
tDH  
tDS  
tDH  
tDS  
tDZC  
tOED  
tOED  
tOED  
tDZO  
VIH  
VIL  
DIN  
DIN  
1
DIN 2  
DIN N  
tOEZ  
tOHO  
tOEZ  
tOHO  
tOEZ  
tOHO  
tCLZ  
tCLZ  
tCLZ  
VOH  
VOL  
*
DOUT  
Hi-Z  
tRAC  
DOUT  
1
DOUT  
2
DOUT  
N
*
t
OEH greater than or equal to tCWL  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
RAS Only Refresh Cycle  
tRC  
tRAS  
tRP  
VIH  
RAS  
VIL  
tRPC  
tCRP  
VIH  
UCAS  
LCAS  
VIL  
tASR  
tRAH  
VIH  
Address  
Row  
VIL  
VOH  
VOL  
Hi-Z  
DOUT  
: “H” or “L”  
NOTE: WE, OE and DIN are “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
CAS Before RAS Refresh Cycle  
tRC  
tRAS  
tRP  
VIH  
RAS  
VIL  
tRPC  
tRPC  
tCSR  
tCSR  
tCP  
tCHR  
VIH  
VIL  
UCAS  
LCAS  
tWRH  
tWRH  
tWRP  
tWRP  
VIH  
VIL  
WE  
VIH  
VIL  
OE  
tOED  
tCDD  
VOH  
VOL  
DIN  
Hi-Z  
tOEZ  
tOFF  
VOH  
VOL  
DOUT  
Hi-Z  
: “H” or “L”  
NOTE: Address is “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Hidden Refresh Cycle (Read)  
tRC  
tRC  
tRP  
tRP  
tRAS  
tRAS  
VIH  
RAS  
VIL  
tRCD  
tRSH  
tCRP  
tCHR  
VIH  
VIL  
UCAS  
LCAS  
tRAL  
tWRH  
tWRP  
tRAD  
tASC  
tASR  
tRAH  
tCAH  
VIH  
VIL  
Address  
Row  
Column  
tRRH  
tRCS  
VIH  
VIL  
WE  
OE  
tAA  
VIH  
VIL  
tOEA  
tDZC  
tCDD  
tDZO  
tOED  
VIH  
VIL  
Hi-Z  
DIN  
tCAC  
tCLZ  
tOFF  
tOEZ  
VOH  
VOL  
DOUT  
Valid Data Out  
Hi-Z  
Hi-Z  
tRAC  
tOH  
tOHO  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Hidden Refresh Cycle (Write)  
tRC  
tRC  
tRP  
tRP  
tRAS  
tRAS  
VIH  
RAS  
VIL  
tRSH  
tCRP  
tRCD  
tCHR  
VIH  
VIL  
UCAS  
LCAS  
tASR  
tASC  
tRAH  
tCAH  
VIH  
VIL  
Address  
Row  
Column  
tWRP  
tWRH  
tWCS  
tWCH  
VIH  
VIL  
tWP  
WE  
OE  
VIH  
VIL  
tDH  
tDS  
VIH  
VIL  
DIN  
Valid Data  
VOH  
VOL  
DOUT  
Hi-Z  
: “H” or “L”  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Self Refresh Cycle (Sleep Mode) - Low Power version only  
tRASS  
tRPS  
VIH  
RAS  
VIL  
tRPC  
tCHS  
tCSR  
tCRP  
tCP  
tCHD  
VIH  
VIL  
UCAS  
LCAS  
tWRH  
tWRP  
VIH  
VIL  
WE  
tOFF  
VOH  
VOL  
DOUT  
Hi-Z  
: “H” or “L”  
NOTES:  
1. Address and OE are “H” or “L”  
2. Once RAS (min) is provided and RAS remains low, the DRAM  
will be in Self Refresh, commonly known as “Sleep Mode.”  
3. If tRASS > tCHD (min) then tCHD applies.  
If tRASS tCHD (min) then tCHS applies.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
PACKAGE DIMENSIONS (400mil; 50/44 lead; Thin Small Outline Package)  
20.95 ± 0.10  
Detail A  
+0.075  
-0.005  
0.125  
Lead #1  
Seating Plane  
0.10  
+ 0.10  
- 0.05  
0.35  
0.80 Basic  
0.875 REF  
Detail A  
0.25 Basic  
1.00 ± 0.05  
Gage Plane  
+0.10  
-0.00  
0.5 ± 0.1  
0.05  
NOTE: All dimensions are in millimeters; Package diagrams are not drawn to scale.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160 IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
PACKAGE DIMENSIONS (400mil; 42/42 lead; Small Outline J-Lead)  
27.305 ± 0.127  
3.505 ± 0.254  
2.083 min  
0.76 min  
+0.097  
0.203  
-0.025  
Lead #1 I.D.  
Lead #1  
Seating Plane  
0.10  
+0.088  
0.42  
-0.039  
+0.123  
-0.03  
1.27 Basic  
0.69  
NOTE: All dimensions are in millimeters; Package diagrams are not drawn to scale.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
IBM0116160  
IBM0116160M  
IBM0116160B IBM0116160P  
1M x 16 12/8 DRAM  
Revision Log  
Revision  
Contents Of Modification  
11/93  
Initial Release  
09/06/94  
Combine the 3.3 Volt and the 5.0 Volt specifications  
1. Iout changed to +2.0 mA and -2.0 mA in DC Electrical Characteristics table.  
2. Packaging diagrams modified to clarify lead thickness and standoff height.  
3. t  
4. t  
min changed from 0 to 5ns.  
min changed from 20 to 10ns.  
RPC  
CHR  
5. Currents in DC Electrical Characteristics table revised.  
6. Test Modes and Test Circuit Diagram removed.  
7. Rename t  
to t  
.
ODD  
OED  
11/15/95  
8. t  
9. t  
, t  
OED CDD OEZ  
, t  
, and t  
min changed from 20 to 15ns, for the 70ns part.  
OFF  
min changed from 5 to 0ns for all speed sorts.  
min changed from 20 to 15ns for the 70ns part.  
min changed from 10 to 5ns for all speed sorts.  
min changed from 15 to 10ns on 60 and 70ns parts.  
max changed from 20 to 15ns for 70ns parts.  
RRH  
OEH  
CSR  
CAH  
OFF  
10. t  
11. t  
12. t  
13. t  
14. 400mil 42/42 SOJ package option added  
1. The Low Power and Standard Power Specifications were combined. ES# 43G9174 and ES# 43G9618 were  
combined into ES# 43G9618.  
2. Added Die Rev E part numbers.  
3. tDH was reduced from 15ns to 12ns for the -60 speed sort.  
12/10/95  
4. tCHD was added to the Self Refresh Cycle with a value of 350µs for all speed sorts.  
5. The Self Refresh timing was changed to allow CAS to go high tCHD after RAS falls entering a Self Refresh.  
6. The CBR timing diagram was changed to allow CAS to remain low for back-to-back CBR cycles.  
7. WE for the Hidden Refresh Write cycle in the Truth Table was changed from “Lto ” H”.  
1. ICC2 was changed from 2mA to 1mA.  
2. II(L) and IO(L) were altered from +/- 10uA to +/- 5uA.  
3. tT was initially at a max of 30ns. It has been modified to 50ns for all speed sorts.  
4. tCPA was decreased from 30ns to 28ns for the -50 speed sort.  
5. tRASP max of 125K was raised to 200K for all speed sorts.  
6. tRP was changed from 35ns to 30ns for the -50 speed sort.  
09/01/96  
1. WE for the Hidden Refresh Write cycle in the Truth Table was changed from “H” to “LH”.  
2. tOED was moved from the Common Parameters table to the Write Cycle Parameters Table.  
3. tODD in the CAS before RAS timing diagram was renamed tOED  
.
4. The -70 speed sort and timings were removed.  
03/19/97  
04/23/97  
5. Icc1, Icc3, Icc6 for the -50 speed sort were reduced from 85mA to 50mA.  
6. Icc4 for the -50 speed sort was reduced from 75mA to 25mA.  
7. Icc1, Icc3, Icc6 for the -60 speed sort were reduced from 75mA to 45mA.  
8. Icc4 for the -60 speed sort was reduced from 65mA to 25mA.  
1. Icc5 was changed from 200µA to 100µA for the Low Power Die Rev F Parts.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
43G9618  
SA14-4207-06  
Revised 4/97  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  
Discontinued (9/98 - last order; 3/99 last ship)  
International Business Machines Corp.1997  
Printed in the United States of America  
All rights reserved  
IBM and the IBM logo are registered trademarks of the IBM Corporation.  
This document may contain preliminary information and is subject to change by IBM without notice. IBM assumes no responsibility or  
liability for any use of the information contained herein. Nothing in this document shall operate as an express or implied license or  
indemnity under the intellectual property rights of IBM or third parties. The products described in this document are not intended for  
use in implantation or other direct life support applications where malfunction may result in direct physical harm or injury to persons.  
NO WARRANTIES OF ANY KIND, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY  
OR FITNESS FOR A PARTICULAR PURPOSE, ARE OFFERED IN THIS DOCUMENT.  
For more information contact your IBM Microelectronics sales representative or  
visit us on World Wide Web at http://www.chips.ibm.com  
IBM Microelectronics manufacturing is ISO 9000 compliant.  
SA14-4207-06  
Powered by ICminer.com Electronic-Library Service CopyRight 2003  

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