IRFZ34NSTRR [ETC]

TRANSISTOR | MOSFET | N-CHANNEL | 55V V(BR)DSS | 29A I(D) | TO-263AB ; 晶体管| MOSFET | N沟道| 55V V( BR ) DSS | 29A I( D) | TO- 263AB\n
IRFZ34NSTRR
型号: IRFZ34NSTRR
厂家: ETC    ETC
描述:

TRANSISTOR | MOSFET | N-CHANNEL | 55V V(BR)DSS | 29A I(D) | TO-263AB
晶体管| MOSFET | N沟道| 55V V( BR ) DSS | 29A I( D) | TO- 263AB\n

晶体 晶体管 开关 脉冲 局域网
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中文:  中文翻译
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PD - 9.1311A  
IRFZ34NS/L  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Surface Mount (IRFZ34NS)  
l Low-profilethrough-hole(IRFZ34NL)  
l 175°C Operating Temperature  
l Fast Switching  
D
VDSS = 55V  
RDS(on) = 0.040Ω  
G
l Fully Avalanche Rated  
ID = 29A  
S
Description  
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedizeddevicedesignthatHEXFETPowerMOSFETs  
arewellknownfor,providesthedesignerwithanextremely  
efficient and reliable device for use in a wide variety of  
applications.  
The D2Pak is a surface mount power package capable of  
accommodating die sizes up to HEX-4. It provides the  
highest power capability and the lowest possible on-  
resistance in any existing surface mount package. The  
D2Pak is suitable for high current applications because of  
its low internal connection resistance and can dissipate  
up to 2.0W in a typical surface mount application.  
Thethrough-holeversion(IRFZ34NL)isavailableforlow-  
profileapplications.  
2
D
Pa k  
T O -2 6 2  
Absolute Maximum Ratings  
Parameter  
Max.  
29  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10Vꢀ  
Continuous Drain Current, VGS @ 10Vꢀ  
Pulsed Drain Current ꢀ  
20  
A
100  
3.8  
68  
PD @TA = 25°C  
PD @TC = 25°C  
Power Dissipation  
W
W
Power Dissipation  
Linear Derating Factor  
0.45  
± 20  
130  
16  
W/°C  
V
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy‚ꢀ  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒꢀ  
Operating Junction and  
5.6  
5.0  
mJ  
V/ns  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
300 (1.6mm from case )  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
––––  
––––  
Max.  
2.2  
Units  
RθJC  
RθJA  
°C/W  
Junction-to-Ambient (PCB mount) **  
40  
8/25/97  
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IRFZ34NS/L  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
55 ––– –––  
––– 0.052 ––– V/°C Reference to 25°C, ID = 1mAꢀ  
Conditions  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
VGS = 0V, ID = 250µA  
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient  
RDS(ON)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 0.040  
2.0 ––– 4.0  
6.5 ––– –––  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 34  
––– ––– 6.8  
––– ––– 14  
––– 7.0 –––  
––– 49 –––  
––– 31 –––  
––– 40 –––  
V
S
VGS = 10V, ID = 16A„  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 16A  
VDS = 55V, VGS = 0V  
VDS = 44V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Forward Transconductance  
IDSS  
IGSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
VGS = -20V  
Qg  
ID = 16A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
nC VDS = 44V  
VGS = 10V, See Fig. 6 and 13 „ꢀ  
VDD = 28V  
RiseTime  
ID = 16A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
RG = 18Ω  
RD = 1.8Ω, See Fig. 10 „ꢀ  
Between lead,  
and center of die contact  
VGS = 0V  
nH  
pF  
LS  
Internal Source Inductance  
––– 7.5 –––  
Ciss  
Coss  
Crss  
Input Capacitance  
––– 700 –––  
––– 240 –––  
––– 100 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFETsymbol  
D
IS  
––– ––– 29  
A
showing the  
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
––– ––– 100  
p-n junction diode.  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
––– ––– 1.6  
––– 57 86  
––– 130 200  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
V
TJ = 25°C, IS = 16A, VGS = 0V „  
ns  
TJ = 25°C, IF = 16A  
Qrr  
ton  
nC di/dt = 100A/µs „ꢀ  
Notes:  
 Repetitive rating; pulse width limited by  
ƒ ISD 16 A, di/dt 420A/µs, VDD V(BR)DSS  
TJ 175°C  
,
max. junction temperature. ( See fig. 11 )  
‚ VDD = 25V, starting TJ = 25°C, L = 610µH  
RG = 25, IAS = 16A. (See Figure 12)  
„ Pulse width 300µs; duty cycle 2%.  
Uses IRFZ34N data and test conditions  
** When mounted on 1" square PCB (FR-4 or G-10 Material ).  
For recommended footprint and soldering techniques refer to application note #AN-994.  
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IRFZ34NS/L  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTT OM 4.5V  
BOTT OM 4.5V  
4.5V  
4.5V  
20µs PULSE W IDTH  
20µs PULSE W IDTH  
T = 25°C  
T = 175°C  
= C  
J
C
T
= 175°C  
J
C
1
0.1  
A
1
A
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
D S  
D S  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
2. 4  
2. 0  
1. 6  
1. 2  
0. 8  
0. 4  
0. 0  
1 0 0  
1 0  
1
I
= 26A  
D
T
= 25°C  
J
T
= 175°C  
J
V
= 2 5V  
DS  
V
= 10V  
20µs P U LS E W IDTH  
G S  
A
1 0 A  
- 6 0 - 4 0 - 2 0  
0
2 0  
4 0  
6 0  
8 0 1 0 0 1 2 0 1 4 0 1 6 0 1 8 0  
4
5
6
7
8
9
TJ , Junction Tem perature (°C)  
VG S , Gate-to-Sou rce Voltage (V)  
Fig 4. Normalized On-Resistance  
Fig 3. Typical Transfer Characteristics  
Vs. Temperature  
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IRFZ34NS/L  
1200  
20  
16  
12  
8
V
C
C
C
= 0V,  
f = 1MHz  
I
= 16A  
GS  
iss  
D
= C  
= C  
= C  
+ C  
+ C  
,
C
SHORTED  
ds  
gs  
gd  
ds  
gd  
V
V
= 44V  
= 28V  
DS  
DS  
rss  
oss  
1000  
800  
600  
400  
200  
0
C
C
gd  
is s  
o ss  
C
rs s  
4
FOR TES T CIRCUIT  
SEE FIGURE 13  
0
A
A
1
10  
100  
0
10  
20  
30  
40  
VD S , Drain-to-Source Voltage (V)  
Q G , Total Gate Charge (nC)  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1 0 0 0  
1 0 0  
1 0  
1000  
100  
10  
OPE RATION IN THIS A RE A LIMITE D  
BY R  
D S(o n)  
10µs  
T
= 175°C  
J
100µs  
T
= 25°C  
J
1m s  
T
T
= 25°C  
= 175°C  
C
J
10m s  
S ingle Pulse  
V
= 0V  
GS  
1
A
1
A
0. 4  
0. 8  
1. 2  
1. 6  
2. 0  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
VSD , Source-to-Drain Voltage (V)  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
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IRFZ34NS/L  
RD  
VDS  
VGS  
30  
25  
20  
15  
10  
5
D.U.T.  
RG  
+ VDD  
-
10 V  
Pulse Width1µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
0
10%  
25  
50  
75  
100  
125  
150  
175  
V
GS  
°
, Case Temperature ( C)  
T
C
t
t
r
t
t
f
d(on)  
d(off)  
Fig 10b. Switching Time Waveforms  
CaseTemperature  
10  
D = 0.50  
0.20  
1
0.10  
0.05  
P
DM  
0.02  
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
0.1  
t
1
t
2
Notes:  
1. Duty factor D =  
t / t  
1
2
thJC  
2. Peak T = P  
x Z  
+ T  
C
J
DM  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
t , Rectangular Pulse Duration (sec)  
1
Fig11. MaximumEffectiveTransientThermalImpedance,Junction-to-Case  
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IRFZ34NS/L  
250  
200  
150  
100  
50  
I
D
TOP  
6.5A  
11A  
B OTTOM 16A  
L
V
DS  
D.U.T.  
R
+
-
G
V
DD  
I
10V  
AS  
t
p
0.01Ω  
Fig 12a. Unclamped Inductive Test Circuit  
V
= 25V  
50  
D D  
0
A
175  
V
(BR)DSS  
25  
75  
100  
125  
150  
Starting TJ , Junction Temperature (°C)  
t
p
V
DD  
Fig 12c. Maximum Avalanche Energy  
V
DS  
Vs. Drain Current  
I
AS  
Current Regulator  
Fig 12b. UnclampedInductiveWaveforms  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
V
10 V  
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Current Sampling Resistors  
Charge  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
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IRFZ34NS/L  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14.ForN-ChannelHEXFETS  
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IRFZ34NS/L  
D2Pak Package Outline  
10.54 (.415)  
10.29 (.405)  
10.16 (.400)  
REF.  
- B -  
1.32 (.052)  
4.69 (.185)  
4.20 (.165)  
1.40 (.055)  
- A -  
MAX.  
1.22 (.048)  
2
6.47 (.255)  
6.18 (.243)  
1.78 (.070)  
1.27 (.050)  
15.49 (.610)  
14.73 (.580)  
2.79 (.110)  
2.29 (.090)  
1
3
2.61 (.103)  
2.32 (.091)  
5.28 (.208)  
4.78 (.188)  
8.89 (.350)  
REF.  
1.40 (.055)  
1.14 (.045)  
1.39 (.055)  
1.14 (.045)  
3X  
0.55 (.022)  
0.46 (.018)  
0.93 (.037)  
0.69 (.027)  
3X  
5.08 (.200)  
0.25 (.010)  
M
B A M  
MINIMUM RECOMM ENDED FOOTPRINT  
11.43 (.450)  
8.89 (.350)  
NOTES:  
LEAD ASSIGNM ENTS  
1 - GATE  
1
2
3
4
DIM ENSIONS AFTER SOLDER DIP.  
17.78 (.700)  
2 - DRAIN  
3 - SOU RC E  
DIM ENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.  
CONTROLLING DIMENSION : INCH.  
HEATSINK & LEAD DIMEN SION S DO NOT INCLUDE BURRS.  
3.81 (.150)  
2.54 (.100)  
2.08 (.082)  
2X  
2X  
Part Marking Information  
D2Pak  
A
INTERNATIONAL  
RECTIFIER  
LOGO  
PART NUMBER  
F530S  
9246  
1M  
DATE CODE  
(YYW W )  
9B  
ASSEMBLY  
LOT CODE  
YY = YEAR  
W W = W EEK  
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IRFZ34NS/L  
Package Outline  
TO-262 Outline  
Part Marking Information  
TO-262  
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IRFZ34NS/L  
Tape & Reel Information  
D2Pak  
TR R  
1 .6 0 (.0 6 3 )  
1 .5 0 (.0 5 9 )  
1 .6 0 (.0 6 3)  
1 .5 0 (.0 5 9)  
4 .1 0 (.1 6 1)  
3 .9 0 (.1 5 3)  
0 .3 68 (.0 14 5 )  
0 .3 42 (.0 13 5 )  
F EED D IR EC TIO N  
1 .8 5 (.0 7 3 )  
11 .6 0 (. 45 7 )  
11 .4 0 (. 44 9 )  
1 .6 5 (.0 6 5 )  
2 4 .30 (.9 5 7)  
2 3 .90 (.9 4 1)  
15 .4 2 (.60 9 )  
15 .2 2 (.60 1 )  
TR L  
1. 75 (.0 69 )  
1. 25 (.0 49 )  
1 0. 90 (.4 29 )  
1 0. 70 (.4 21 )  
4 .7 2 (.1 3 6)  
4 .5 2 (.1 7 8)  
1 6. 10 (.6 34 )  
1 5. 90 (.6 26 )  
FE ED D IR EC TION  
1 3.5 0 (. 532 )  
1 2.8 0 (. 504 )  
2 7.4 0 (1 .079 )  
2 3.9 0 (.9 41)  
4
33 0.0 0  
(14. 17 3)  
M AX .  
6 0.0 0 (2 .36 2)  
M IN .  
3 0.4 0 (1 .19 7)  
M A X .  
N O T ES  
:
1. C O M F O R M S T O EIA -418 .  
2. C O N T R O LLIN G D IM EN SIO N : M ILLIM E T ER .  
3. D IM E N S IO N M EA S U R E D  
4. IN C LU D E S F L AN G E D IS T O R T IO N  
26 .40 (1. 03 9)  
24 .40 (.9 61 )  
4
@ H U B .  
3
@
O U T E R ED G E.  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
8/97  
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