JAN2N6301 [ETC]
TRANSISTOR | BJT | DARLINGTON | NPN | 80V V(BR)CEO | 8A I(C) | TO-66 ; 晶体管| BJT |达林顿| NPN | 80V V（ BR ） CEO | 8A I（C ） | TO- 66\n
| 型号： | JAN2N6301 |
| 厂家： | 
ETC |
| 描述： | TRANSISTOR | BJT | DARLINGTON | NPN | 80V V(BR)CEO | 8A I(C) | TO-66
|
| 文件： | 总15页 (文件大小：84K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
INCH POUND
The documentation and process conversion
measures necessary to comply with this
revision shall be completed by 15 September 1997
MIL-PRF-19500/539B
15 June 1997
SUPERSEDING
MIL-S-19500/539A
20 October 1993
PERFORMANCE SPECIFICATION
SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, NPN, SILICON, POWER
TYPES 2N6300, 2N6301 JANTX AND JANTXV
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the performance requirements for NPN, Darlington, silicon, power transistors. Two levels of
product assurance are provided for each device type as specified in MIL-PRF-19500. For JAN quality assurance level (see 6.3).
1.2 Physical dimensions. See figure 1.
1.3 Maximum ratings.
PT 1/
TC = 100°C
VCBO
VCEO
VEBO
IC
IB
TOP and TSTG
TC = 0°C
W
75
75
W
32
32
V dc
60
80
V dc
60
80
V dc
5
5
A dc
8
8
mA dc
120
120
°C
2N6300
2N6301
-55 TO +200
-55 TO +200
1/ Derate linearly at 0.428 W/°C above TC > 0°C.
1.4 Primary electrical characteristics.
hFE2 1/
VCE = 3 V dc
IC = 4 A dc
hFE3 1/
VCE = 3 V dc
IC = 8 A dc
hfe
Cobo
Pulse response
ton toff
VCE = 3 V dc
IC = 3 A dc
f = 1 MHz
100 kHz ≤ f ≤ 1 MHz/
VCB = 10 V dc
IE = 0
pF
µs
2.0
µs
Min
750
100
25
Max
18000
350
200
8.0
See footnote at end of table.
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document
should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAT, 3990 East Broad Street, Columbus, OH
43216-5000, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or
by letter.
AMSC N/A
FSC 5961
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
MIL-PRF-19500/539B
1.4 Primary electrical characteristics. Continued.
VBE(sat)
VCE(sat)
hfe
Rθ
JC
IC = 8 A dc
IB = 80 mA dc
1/
IC = 8 A dc
IB = 80 mA dc
1/
VCE = 3 V dc
IC = 3 A dc
f = 1 kHz
V dc
4.0
V dc
3.0
°C/W
Min
Max
300
2.33
1/ Pulsed see 4.5.1
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include
documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has
been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements
documents cited in sections 3 and 4 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document
to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department
of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-19500
STANDARD
MILITARY
MIL-STD-750
- Semiconductor Devices, General Specification for.
-
Test Methods for Semiconductor Devices.
(Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for
related associated specifications or specification sheets), the text of this document takes precedence. Nothing in this document,
however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing
on the applicable qualified products list before contract award (see 4.2 and 6.4).
3,2 Associated performance specification. The individual item performance requirements shall be in accordance with MIL-PRF-
19500, and as specified herein.
3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in
MIL-PRF-19500.
3.4 Design, construction, and physical dimensions. The design, construction, and physical dimensions for the purpose of
interchangeability shall be as specified on figure 1 herein.
2
MIL-PRF-19500/539B
FIGURE 1. Physical dimensions.
3
MIL-PRF-19500/539B
|
|
|
|
|
|
|
|
||
|| Ltr
||
|
||
||
||
|| L1
||
||
|| MHD | .142
||
||
|| MHS | .958
||
|
|
|
|
|
|
|
|
|
|
|
|
|
| Ltr
Dimensions
Dimensions
|
|
|
|
|
|
|
Inches| Millimeters
| Notes ||
Inches
|
|
Millimeters
| Notes
|
| Max
|
| 1.27
|
|
| 3.86
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| Min
|
| Max
|
| .340
|
| Min
|
| 6.35
|
| Max
|
| 8.64
|
| Min
| Max
| Min
|
|
|
|
|
|
| CH | .250
|
|
| LD | .028
|
| .050
|
| 5, 9
|
|
| 7
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| .034
|
|
| .620
|
|
| .210
|
|
| 0.71
|
|
|
|
|
| 4.83
|
|
| .86
|
|
| 4, 9
|
|
| .152
| 3.61
|
|
|
|
|
|
|
|
|
|
|
|
| CD
|
|
| PS | .190
|
|
| PS1 | .0095 | .0105 | 2.41
|
|
| HT | .050
|
| 15.75 | 3
| .962
| 24.33 |24.43
|
|
|
|
|
|
|
|
|
|
|
|
|
||
|
|
| 5.33
|
|
| 2.66
|
|
| 1.91
|
|
| 4
|
|
| 3
|
|
| 3
|
|
|| HR
||
||
|| HR1 | .115
||
||
|| S1
||
|
| .350
|
| 8.89
|
|
| 3.68
|
|
|
|
|
|
|
|
|
| .145
| 2.92
| 6
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| .075
|
|
| 1.27
|
|
| .570
|
| .590
|
|14.48
|
| 14.99 | 4
|
|
|
|
|
| LL
|
| .360
|
| .500
|
| 9.14
|
|12.70
|
| 5
|
|
|
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only.
3. Body contour is optional within zone defined by CD.
4. Measured at points .050 (1.27 mm) - .055 (1.4 mm) below the seating plane. When gauge is not used, measurement
will be made at the seating plane.
5. Both terminals.
6. At both ends.
7. Two holes.
8. The collector shall be electrically connected to the case.
9. LD applies between L1 and LL. Diameter is uncontrolled within L1.
FIGURE 1. Physical dimensions - Continued.
4
MIL-PRF-19500/539B
3.4.1 Lead finish. Lead finish shall be solderable in accordance with MIL-PRF-19500, MIL-STD 750, and as specified herein.
3.4 Marking. Devices shall be marked as specified in MIL-PRF-19500.
4. QUALITY ASSURANCE PROVISIONS
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3)
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.
4.3 Screening. Screening shall be in accordance with appendix E, table IV of MIL-PRF-19500, and as specified herein. The
following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I herein shall not
be acceptable.
Screen (see
appendix E,
table IV of
Measurements
MIL-PRF-19500)
JANTX AND JANTXV levels
ICEX1 and hFE2
11
12
13
See 4.3.1
Subgroup 2 of table I herein;
∆hFE2 = ± 40 percent
ICEX1 = 100 percent of initial value
or 100 nA dc whichever is greater.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:
CE ≥ 10 V dc; TJ = 162.5°C ± 12.5°C
V
NOTE: No heat sink or forced air cooling on the devices shall be permitted.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table V of MIL-PRF-19500 and table
I herein. Electrical measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table II herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in
appendix E, table VIb (JANTX and JANTXV) of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements shall be
in accordance with the applicable steps of table II herein.
4.4.2.1 Group B inspection, appendix E, table VIb (JANTX and JANTXV) of MIL-PRF-19500.
Subgroup
B3
Method
1037
Conditions
CE ≥ 10 V dc, 2,000 cycles.
RθJC = 2.33°C/W.
V
B5
3151
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in
appendix E, table VII of MIL-PRF-19500. Electrical measurements (end points) and delta requirements shall be in accordance with the
applicable steps of table II herein.
5
MIL-PRF-19500/539B
4.4.3.1. Group C inspection, appendix E, table VII of MIL-PRF-19500.
Subgroup
C2
Method
2036
Conditions
Test condition A, weight = 10 lbs, t = 15 s.
CE ≥ 10 V dc, 6,000 cycles.
C6
1037
V
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
6
MIL-PRF-19500/539B
TABLE I. Group A inspection.
MIL-STD-750
Limits
Inspection 1/
Subgroup 1
Symbol
Unit
Method
2071
Conditions
Min
Max
Visual and mechanical
examination
Subgroup 2
Breakdown voltage,
collector - emitter
3011
Bias condition. D, IC = 100 mA dc;
pulsed (see 4.5.1)
V(BR)CEO
2N6300
2N6301
60
80
V dc
V dc
Collector - emitter
cutoff current
3041
3041
Bias condition A, VBE = -1.5 V dc;
ICEX1
2N6300
2N6301
V
V
CE = 60 V dc
CE = 80 V dc
0.5
0.5
mA dc
mA dc
Collector - emitter
cutoff current
Bias condition D,
ICEO
2N6300
2N6301
V
V
CE = 30 V dc
CE = 40 V dc
0.5
0.5
mA dc
mA dc
Emitter - base
cutoff current
3061
3076
3076
3076
3066
3066
3071
3071
Bias condition D, VEB = 5 V dc
IEBO
2.0
mA dc
Forward - current
transfer ratio
VCE = 3 V dc, IC = 1 A dc
hFE1
500
750
100
pulsed (see 4.5.1)
Forward - current
transfer ratio
VCE = 3 V dc, IC = 4 A dc
hFE2
18000
pulsed (see 4.5.1)
Forward - current
transfer ratio
VCE = 3 V dc; IC = 8 A dc
hFE3
pulsed (see 4.5.1)
Base - emitter
voltage (nonsaturated)
Test condition B; VCE = 3 V dc;
IC = 4 A dc; pulsed (see 4.5.1)
VBE(on)
VBE(sat)
VCE(sat)1
VCE(sat)2
2.8
4.0
2.0
V dc
V dc
V dc
V dc
Base - emitter
voltage (saturated)
Test condition A; IC = 8 A dc;
IB = 80 mA dc; pulsed (see 4.5.1)
Collector - emitter
voltage (saturated)
IC = 4 A dc; IB = 16 mA dc;
pulsed (see 4.5.1)
Collector - emitter
voltage (saturated)
IC = 8 A dc; IB = 80 mA dc;
pulsed (see 4.5.1)
3.0
See footnote at end of table.
7
MIL-PRF-19500/539B
TABLE I. Group A inspection.
MIL-STD-750
Limits
Inspection 1/
Subgroup 3
Symbol
Unit
Method
Conditions
Min
Max
High temperature
operation
TA = +150°C
Collector - emitter
cutoff current
3041
Bias condition A; VBE = -1.5 V dc,
ICEX2
2N6300
2N6301
V
V
CE = 60 V dc
CE = 80 V dc
5.0
5.0
mA dc
mA dc
Low temperature
operation
TA = -55°C
Forward - current
transfer ratio
3076
V
CE = 3 V dc; IC = 4 A dc;
hFE4
200
pulsed (see 4.5.1)
Subgroup 4
Small signal short
circuit forward current
transfer ratio
3206
3306
V
CE = 3 V dc; IC = 3 A dc;
hfe
300
25
f = 1 kHz
Magnitude of small
signal short - circuit
forward - current
transfer ratio
VCE = 3 V dc; IC = 3 A dc;
hfe
350
f = 1.0 MHz
Pulse response
Turn-on time
(See figure 2); VCC = 30 V dc;
IC = 4 A dc; IB1 = 16 mA dc
ton
2.0
8.0
µs
µs
pF
Turn-off time
(See figure 3) VCC = 30 V dc;
IC = 4 A dc; IB1 = IB2 = 16 mA dc
toff
Open circuit output
capacitance
3236
VCB = 10 V dc; IE = 0;
Cobo
200
100 kHz ≤ f ≤ 1 MHz
See footnote at end of table.
8
MIL-PRF-19500/539B
TABLE I. Group A inspection.
MIL-STD-750
Limits
Inspection 1/
Symbol
Unit
Method
3051
Conditions
Min
Max
Subgroup 5
Safe operating area (DC)
TC = 25°C +10°C; t = 1s; 1 cycle;
(see figure 4)
Test 1
Test 2
Test 3
V
CE = 8 V dc; IC = 8 A dc
VCE = 20 V dc; IC = 2.0 A dc;
IC = 100 mA dc;
2N6300
2N6301
V
V
CE = 60 V dc
CE = 80 V dc
Safe operating area
(switching)
3053
Load condition B; (clamped inductive
load); TA = 25°C; tr + tf ≤ 1.0 µs
duty cycle ≤ 10%; tp = 1 ms; (vary to
obtain IC); Rs = 0.1 ohms;
R
R
BB1 = 80 ohms; VBB1 = 16 V dc;
BB2 = 100 ohms; VBB2 = 1.5 V dc;
VCC = 50 V dc; IC = 8 A dc;
RL ≤ 2 ohms; L = 1 mH;
clamp voltage =
2N6300
2N6301
60 V dc
80 V dc
Safe operating area
(switching)
3053
Load condition C; (unclamped
inductive load) (see figure 5)
TA = 25°C; duty cycle ≤ 10%;
R
S ≤ 0.1 ohm
Test 1
Test 2
tp = 1 ms (vary to obtain IC);
R
R
BB1 = 80 ohms; VBB1 ≥ 12 V dc;
BB2 = ∞; VCC ≥ 30 V dc;
IC = 8 A dc; RL ≤ 0.5 ohms;
L = 1 mH at 8 A dc
tp = 1 ms (vary to obtain IC);
R
R
BB1 = 80 ohms; VBB1 ≥ 12 V dc;
BB2 = ∞; VBB2 = 0 V dc;
VCC ≥ 30 V dc; IC = 0.2 A dc;
RL ≤ 0.5 ohms; L = 100 mH at 0.2 A dc
End point electrical
measurements
See table II steps 1 and 3
Subgroups 6 & 7
Not applicable
1/ For sampling plan see MIL-PRF-19500
9
MIL-PRF-19500/539B
TABLE II. Groups B and C electrical measurements.
Step
1.
Inspection
MIL-STD-750
Conditions
Symbol
Limits
Max
0.5
Unit
Method
3041
Min
Collector - emitter
cutoff current
Bias condition A;
ICEX1
mA dc
VBE = 1.5 V dc;
2N6300
2N6301
V
V
CE = 60 V dc
CE = 80 V dc
2.
Collector - emitter
cutoff current
3041
Bias condition A;
ICEX2
1.0
mA dc
VBE = 1.5 V dc;
2N6300
2N6301
V
V
CE = 60 V dc
CE = 80 V dc
3.
4.
Forward - current
transfer ratio
3076
3076
V
CE = 3 V dc;
hFE2
750
18000
IC = 4 A dc
pulsed (see 4.5.1)
Forward - current
transfer ratio
VCE = 3 V dc;
∆hFE2
±40%
IC = 4 A dc
pulsed (see 4.5.1)
1/ The electrical measurements for appendix E, table VIb (JANTX and JANTXV) of MIL-PRF-19500 are as follows:
a. Subgroup 2, see table II herein, steps 1 and 3.
b. Subgroup 3, see table II herein, steps 2 and 4.
c. Subgroup 6, see table II herein, steps 2 and 4.
2/ The electrical measurements for appendix E, table VII of MIL-PRF-19500 are as follows:
a. Subgroup 3, see table II herein, steps 1 and 3.
b. Subgroup 6, see table II herein, steps 2 and 4.
10
MIL-PRF-19500/539B
FIGURE 2. Turn on (ton) time test circuit.
NOTE: tS + tf = toff
FIGURE 3. Switching time test circuit.
11
MIL-PRF-19500/539B
FIGURE 4. Maximum safe operating graph (dc).
12
MIL-PRF-19500/539B
FIGURE 5. Safe operating area for switching between saturation and cutoff
(unclamped inductive load).
13
MIL-PRF-19500/539B
5. PACKAGING
5.1 Packaging. Packaging shall prevent mechanical damage of the devices during shipping and handling and shall not be detrimental
to the device. When actual packaging of material is to be performed by DoD personnel, these personnel need to contact the responsible
packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the Inventory Control Points'
packaging activity within the Military Department or Defense Agency, or within the Military Departments' System Command. Packaging
data retrieval is available from the managing Military Departments' or Defense Agency's automated packaging files, CD-ROM products, or
by contacting the responsible packaging activity.
5.2 Marking. Unless otherwise specified (see 6.2), marking shall be in accordance with MIL-STD-129.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)
6.1 Notes. The notes specified in MIL-PRF-19500 are applicable to this specification.
6.2 Acquisition requirements. See MIL- PRF-19500.
6.3 Substitution of JAN devices. JANTX quality level devices are a oneway direct substitute for JAN quality level devices (example
JANTX2N6300 for JAN2N6300). Manufacturers can no longer manufacture device types from this specification with a JAN assurance
level.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of
award of contract, qualified for inclusion in Qualified Products List QPL No.19500 whether or not such products have actually been so
listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the
products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded
contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be
obtained from : Commander, Defense Supply Center Columbus, ATTN: DSCC-VQE, 3990 East Broad Street, Columbus, OH
43216-5000.
6.5 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous
issue due to the extent of the changes.
CONCLUDING MATERIAL
Custodians:
Army - CR
Navy - EC
Preparing activity:
DLA CC
Air Force - 17
NASA -NA
(Project 5961-1883)
Review activities:
Air Force - 19, 80, 85,99
14
MIL-PRF-19500/539B
STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
INSTRUCTIONS
1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision
letter should be given.
2. The submitter of this form must complete blocks 4, 5, 6, and 7.
3. The preparing activity must provide a reply within 30 days from receipt of the form.
NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of
requirements on current contracts. Comments submitted on this form do not constitute or imply authorization to
waive any portion of the referenced document(s) or to amend contractual requirements.
I RECOMMEND A CHANGE:
1. DOCUMENT NUMBER
MIL-PRF-19500/539B
2. DOCUMENT DATE (YYMMDD)
970615
3. DOCUMENT TITLE SEMICONDUCTOR DEVICE, DARLINGTON TRANSISTOR, NPN, SILICON, POWER TYPES 2N6300, 2N6301 JANTX
AND JANTXV
4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)
5. REASON FOR RECOMMENDATION
6. SUBMITTER
a. NAME (Last, First, Middle initial)
b. ORGANIZATION
c. ADDRESS (Include Zip Code)
d. TELEPHONE (Include Area Code)
(1) Commercial
7. DATE SUBMITTED
(YYMMDD)
(2) AUTOVON
(If applicable)
8. PREPARING ACTIVITY
a. NAME Alan Barone
b. TELEPHONE (Include Area Code)
(1) Commercial
(614) 692-0510
(2) AUTOVON
850-0510
c. ADDRESS (Include Zip Code) : Commander,
Defense Supply Center Columbus, ATTN:
DSCC-VAT, 3990 East Broad Street, Columbus,
OH 43216-5000
IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT:
Defense Quality and Standardization Office
5203 Leesburg Pike, Suite 1403, Falls Church, VA 22041-3466
Telephone (703) 756-2340 AUTOVON 289-2340
DD Form 1426, OCT 89
Previous editions are obsolete
198/290
15
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Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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VISHAY
SI9137DB
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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VISHAY
SI9137LG
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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VISHAY
SI9122E
500-kHz Half-Bridge DC/DC Controller with Integrated Secondary Synchronous Rectification DriversWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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VISHAY
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