NID9N05.REV3.PDF [ETC]

NID9N05CL/D ;
NID9N05.REV3.PDF
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NID9N05CL/D

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NID9N05CL  
Power MOSFET  
9 Amps, 52 Volts  
N-Channel, Logic Level, Clamped  
MOSFET w/ ESD Protection in a  
DPAK Package  
http://onsemi.com  
Benefits  
9 AMPERES  
52 V CLAMPED  
RDS(on) = 90 mW (Typ.)  
High Energy Capability for Inductive Loads  
Low Switching Noise Generation  
Features  
Drain  
(Pins 2, 4)  
Diode Clamp Between Gate and Source  
ESD Protection - HBM 5000 V  
Active Over-Voltage Gate to Drain Clamp  
M
PWR  
Overvoltage  
Protection  
Scalable to Lower or Higher R  
DS(on)  
Gate  
(Pin 1)  
Internal Series Gate Resistance  
R
G
Applications  
ESD Protection  
Automotive and Industrial Markets:  
Solenoid Drivers, Lamp Drivers, Small Motor Drivers  
Source  
(Pin 3)  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Rating  
Symbol  
Value  
52-59  
±12  
Unit  
Vdc  
Vdc  
A
Drain-to-Source Voltage Internally Clamped  
Gate-to-Source Voltage - Continuous  
V
DSS  
MARKING  
DIAGRAM  
V
GS  
Drain Current - Continuous @ T = 25°C  
Drain Current - Single Pulse (tp = 10 ms)  
I
9.0  
35  
A
D
YWW  
1
3
I
DM  
2
X
4
DPAK  
CASE 369A  
STYLE 2  
Total Power Dissipation @ T = 25°C  
P
D
28.8  
W
A
D9N05CL  
Operating and Storage Temperature Range  
T , T  
-55 to  
175  
°C  
J
stg  
1
2
3
4
= Gate  
D9N05CL = Device Code  
= Drain  
= Source  
= Drain  
Single Pulse Drain-to-Source Avalanche En-  
E
AS  
160  
mJ  
Y
WW  
= Year  
= Work Week  
ergy - Starting T = 125°C  
J
(V = 50 V, I  
DD  
= 1.5 A, V = 10 V, R =  
D(pk)  
GS G  
25 W)  
Thermal Resistance - Junction-to-Case  
- Junction-to-Ambient (Note 1)  
- Junction-to-Ambient (Note 2)  
R
R
R
5.2  
72  
100  
°C/W  
°C  
q
JC  
JA  
JA  
q
q
ORDERING INFORMATION  
Maximum Lead Temperature for Soldering  
Purposes, 1/8from Case for 10 Sec.  
T
260  
Device  
NID9N05CLT4  
NID9N05CL  
Package  
DPAK  
Shipping  
L
2500/Tape & Reel  
75 Units/Rail  
2
1. When surface mounted to an FR4 board using 1pad size, (Cu area 1.127 in )  
2. When surface mounted to an FR4 board using minimum recommended pad  
DPAK  
2
size, (Cu area 0.412 in )  
Semiconductor Components Industries, LLC, 2003  
1
Publication Order Number:  
March, 2003 - Rev. 3  
NID9N05CL/D  
NID9N05CL  
MOSFET ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
J
Characteristic  
OFF CHARACTERISTICS  
Symbol  
Min  
Typ  
Max  
Unit  
Drain-to-Source Breakdown Voltage (Note 3)  
V
(BR)DSS  
(V = 0 Vdc, I = 1.0 mAdc)  
52  
-
55  
-10  
59  
-
Vdc  
mV/°C  
GS  
D
Temperature Coefficient (Negative)  
Zero Gate Voltage Drain Current  
I
mAdc  
DSS  
(V = 40 Vdc, V = 0 Vdc)  
-
-
-
-
10  
25  
DS  
GS  
(V = 40 Vdc, V = 0 Vdc, T = 125°C)  
DS  
GS  
J
Gate-Body Leakage Current  
(V = ±8 Vdc, V = 0 Vdc)  
I
mAdc  
GSS  
-
-
-
±10  
-
GS  
DS  
(V = ±14 Vdc, V = 0 Vdc)  
±22  
GS  
DS  
ON CHARACTERISTICS (Note 3)  
Gate Threshold Voltage (Note 3)  
V
GS(th)  
(V = V , I = 100 mAdc)  
1.3  
-
1.75  
-4.5  
2.5  
-
Vdc  
mV/°C  
DS  
GS  
D
Threshold Temperature Coefficient (Negative)  
Static Drain-to-Source On-Resistance (Note 3)  
R
mW  
DS(on)  
(V = 4.0 Vdc, I = 1.5 Adc)  
-
-
-
70  
153  
175  
-
181  
364  
1210  
-
GS  
D
(V = 3.5 Vdc, I = 0.6 Adc)  
GS  
D
(V = 3.0 Vdc, I = 0.2 Adc)  
GS  
D
(V = 12 Vdc, I = 9.0 Adc)  
90  
GS  
D
(V = 12 Vdc, I = 12 Adc)  
67  
95  
-
GS  
D
Forward Transconductance (Note 3) (V = 15 Vdc, I = 9.0 Adc)  
g
FS  
-
24  
-
Mhos  
pF  
DS  
D
DYNAMIC CHARACTERISTICS  
Input Capacitance  
C
-
-
-
-
-
-
155  
60  
250  
iss  
(V = 40 Vdc, V = 0 V,  
DS  
GS  
Output Capacitance  
Transfer Capacitance  
Input Capacitance  
C
100  
oss  
f = 10 kHz)  
C
25  
40  
-
rss  
C
175  
70  
pF  
iss  
(V = 25 Vdc, V = 0 V,  
DS  
GS  
Output Capacitance  
Transfer Capacitance  
C
-
oss  
f = 10 kHz)  
C
30  
-
rss  
3. Pulse Test: Pulse Width 300 ms, Duty Cycle 2%.  
4. Switching characteristics are independent of operating junction temperatures.  
http://onsemi.com  
2
NID9N05CL  
MOSFET ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
J
Characteristic  
SWITCHING CHARACTERISTICS (Note 4)  
Turn-On Delay Time  
Symbol  
Min  
Typ  
Max  
Unit  
t
t
t
t
t
t
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
130  
500  
1300  
1150  
200  
500  
2500  
1800  
120  
275  
1600  
1100  
4.5  
200  
ns  
d(on)  
Rise Time  
t
r
750  
(V = 10 Vdc, V = 40 Vdc,  
GS  
DD  
I
D
= 9.0 Adc, R = 9.0 W)  
G
Turn-Of f Delay Time  
Fall Time  
2000  
d(off)  
t
f
1850  
Turn-On Delay Time  
Rise Time  
-
ns  
ns  
d(on)  
t
r
-
(V = 10 Vdc, V = 15 Vdc,  
GS  
DD  
I
D
= 1.5 Adc, R = 2 kW)  
G
Turn-Of f Delay Time  
Fall Time  
-
d(off)  
t
f
-
Turn-On Delay Time  
Rise Time  
-
d(on)  
t
r
-
(V = 10 Vdc, V = 15 Vdc,  
GS  
DD  
I
D
= 1.5 Adc, R = 50 W)  
G
Turn-Of f Delay Time  
Fall Time  
-
d(off)  
t
f
-
Gate Charge  
Q
T
Q
1
Q
2
Q
T
Q
1
Q
2
7.0  
nC  
nC  
(V = 4.5 Vdc, V = 40 Vdc,  
GS  
I
DS  
1.2  
-
-
-
-
-
= 9.0 Adc) (Note 3)  
D
2.7  
Gate Charge  
3.6  
(V = 4.5 Vdc, V = 15 Vdc,  
GS  
I
DS  
1.0  
= 1.5 Adc) (Note 3)  
D
2.0  
SOURCE-DRAIN DIODE CHARACTERISTICS  
Forward On-Voltage  
(I = 4.5 Adc, V = 0 Vdc) (Note 3)  
V
SD  
-
-
-
0.86  
0.845  
0.725  
1.2  
-
-
Vdc  
ns  
S
GS  
(I = 4.0 Adc, V = 0 Vdc)  
S
GS  
(I = 4.5 Adc, V = 0 Vdc, T = 125°C)  
S
GS  
J
Reverse Recovery Time  
t
rr  
-
-
-
-
700  
200  
500  
6.5  
-
-
-
-
(I = 4.5 Adc, V = 0 Vdc,  
S
GS  
t
a
dI /dt = 100 A/ms) (Note 3)  
s
t
b
Reverse Recovery Stored Charge  
ESD CHARACTERISTICS  
Q
mC  
RR  
Electro-Static Discharge Capability  
Human Body Model (HBM)  
Machine Model (MM)  
ESD  
5000  
500  
-
-
-
-
V
3. Pulse Test: Pulse Width 300 ms, Duty Cycle 2%.  
4. Switching characteristics are independent of operating junction temperatures.  
http://onsemi.com  
3
NID9N05CL  
18  
16  
14  
12  
10  
8
18  
16  
6 V  
V
= 10 V  
GS  
T
= -55°C  
T = 25°C  
J
J
8 V  
14  
6.5 V  
T = 25°C  
5 V  
T = 100°C  
J
J
12  
4.6 V  
10  
4.2 V  
8
4 V  
3.8 V  
6
6
4
3.2 V  
4
3.4 V  
2.8 V  
2
0
2
0
V
DS  
10 V  
0
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
9
V
DS  
, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
V
GS  
, GATE-T O-SOURCE VOLTAGE (VOLTS)  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
0.4  
0.35  
0.3  
0.5  
0.4  
I
= 4.5 A  
D
T = 25°C  
J
T = 25°C  
V
GS  
= 4 V  
J
0.25  
0.2  
0.3  
0.2  
0.1  
0
0.15  
0.1  
V
GS  
= 12 V  
0.05  
0
2
4
6
8
10  
12  
0
2
4
6
8
10  
12  
14  
16  
18  
V
GS  
, GATE-T O-SOURCE VOLTAGE (VOLTS)  
I , DRAIN CURRENT (AMPS)  
D
Figure 3. On-Resistance versus  
Gate-to-Source Voltage  
Figure 4. On-Resistance versus Drain Current  
and Gate Voltage  
2.5  
1,000,000  
100,000  
10,000  
I
V
= 9 A  
D
V
GS  
= 0 V  
= 12 V  
GS  
2
T = 150°C  
J
1.5  
T = 100°C  
J
1
1000  
100  
0.5  
-50 -25  
0
25  
50  
75 100 125 150 175  
20  
25  
, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
DS  
30  
35  
40  
45  
50  
T , JUNCTION TEMPERATURE (°C)  
J
V
Figure 5. On-Resistance Variation with  
Temperature  
Figure 6. Drain-to-Source Leakage Current  
versus Voltage  
http://onsemi.com  
4
NID9N05CL  
500  
400  
300  
200  
Frequency = 10 kHz  
T = 25°C  
J
V
GS  
= 0 V  
C
iss  
C
oss  
100  
0
C
rss  
0
10  
20  
30  
40  
50  
V
DS  
, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
Figure 7. Capacitance Variation  
5
4
3
2
50  
40  
10,000  
1000  
100  
Q
T
V
= 40 V  
= 9 A  
= 10 V  
DD  
I
D
V
V
GS  
GS  
Q
Q
gs  
gd  
30  
20  
t
d(off)  
t
f
t
r
I
= 9 A  
T = 25°C  
D
J
V
DS  
10  
0
1
0
t
d(on)  
0
1
2
3
4
5
1
10  
100  
Q , TOTAL GATE CHARGE (nC)  
g
R , GATE RESISTANCE (OHMS)  
G
Figure 8. Gate-To-Source and Drain-To-Source  
Voltage versus Total Charge  
Figure 9. Resistive Switching Time  
Variation versus Gate Resistance  
DRAIN-T O-SOURCE DIODE CHARACTERISTICS  
10  
V
GS  
= 0 V  
T = 25°C  
J
8
6
4
2
0
0.4  
0.6  
0.8  
1.0  
1.2  
V
SD  
, SOURCE-TO-DRAIN VOLTAGE (VOLTS)  
Figure 10. Diode Forward Voltage versus Current  
http://onsemi.com  
5
NID9N05CL  
SAFE OPERATING AREA  
The Forward Biased Safe Operating Area curves define  
reliable operation, the stored energy from circuit inductance  
dissipated in the transistor while in avalanche must be less  
than the rated limit and adjusted for operating conditions  
differing from those specified. Although industry practice is  
to rate in terms of energy, avalanche energy capability is not  
a constant. The energy rating decreases non-linearly with an  
increase of peak current in avalanche and peak junction  
temperature.  
the maximum simultaneous drain-to-source voltage and  
drain current that a transistor can handle safely when it is  
forward biased. Curves are based upon maximum peak  
junction temperature and a case temperature (T ) of 25°C.  
C
Peak repetitive pulsed power limits are determined by using  
the thermal response data in conjunction with the procedures  
discussed in AN569, “Transient Thermal Resistance -  
General Data and Its Use.”  
Switching between the off-state and the on-state may  
traverse any load line provided neither rated peak current  
Although many E- FETs can withstand the stress of  
drain- to- source avalanche at currents up to rated pulsed  
current (I ), the energy rating is specified at rated  
DM  
(I ) nor rated voltage (V ) is exceeded and the  
continuous current (I ), in accordance with industry custom.  
DM  
DSS  
D
transition time (t ,t ) do not exceed 10 µs. In addition the total  
power averaged over a complete switching cycle must not  
The energy rating must be derated for temperature as shown  
in the accompanying graph (Figure 12). Maximum energy at  
r f  
exceed (T  
- T )/(R ).  
currents below rated continuous I can safely be assumed to  
J(MAX)  
C
θJC  
D
A Power MOSFET designated E-FET can be safely used  
in switching circuits with unclamped inductive loads. For  
equal the values indicated.  
http://onsemi.com  
6
NID9N05CL  
SAFE OPERATING AREA  
100  
10  
V
= 12 V  
GS  
10 µs  
100 µs  
SINGLE PULSE  
T
C
= 25°C  
1 ms  
dc  
10 ms  
1
R
LIMIT  
DS(on)  
THERMAL LIMIT  
PACKAGE LIMIT  
0.1  
0.1  
1
10  
100  
V
DS  
, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
Figure 11. Maximum Rated Forward Biased  
Safe Operating Area  
10  
D = 0.5  
0.2  
0.1  
P
(pk)  
1
R
(t) = r(t) R  
θ
JC  
θ
JC  
0.05  
0.01  
D CURVES APPLY FOR POWER  
PULSE TRAIN SHOWN  
READ TIME AT t  
t
1
1
t
2
T
J(pk)  
- T = P  
R
θ
(t)  
JC  
C
(pk)  
SINGLE PULSE  
0.0001  
DUTY CYCLE, D = t /t  
1
2
001  
0.00001  
0.001  
0.01  
0.1  
1
10  
t, TIME (s)  
Figure 12. Thermal Response  
http://onsemi.com  
7
NID9N05CL  
PACKAGE DIMENSIONS  
DPAK  
CASE 369A-13  
ISSUE AB  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
SEATING  
PLANE  
-T-  
2. CONTROLLING DIMENSION: INCH.  
C
B
R
INCHES  
DIM MIN MAX  
MILLIMETERS  
E
V
MIN  
5.97  
6.35  
2.19  
0.69  
0.84  
0.94  
MAX  
6.35  
6.73  
2.38  
0.88  
1.01  
1.19  
A
B
C
D
E
F
0.235  
0.250  
0.086  
0.027  
0.033  
0.037  
0.250  
0.265  
0.094  
0.035  
0.040  
0.047  
4
2
Z
A
K
S
1
3
G
H
J
0.180 BSC  
4.58 BSC  
U
0.034  
0.018  
0.102  
0.040  
0.023  
0.114  
0.87  
0.46  
2.60  
1.01  
0.58  
2.89  
K
L
0.090 BSC  
2.29 BSC  
F
J
R
S
U
V
Z
0.175  
0.020  
0.020  
0.030  
0.138  
0.215  
0.050  
−−−  
4.45  
0.51  
0.51  
0.77  
3.51  
5.46  
1.27  
−−−  
L
H
0.050  
−−−  
1.27  
−−−  
D 2 PL  
M
G
STYLE 2:  
PIN 1. GATE  
2. DRAIN  
0.13 (0.005)  
T
3. SOURCE  
4. DRAIN  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make  
changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any  
particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all  
liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be  
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SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications  
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PUBLICATION ORDERING INFORMATION  
Literature Fulfillment:  
JAPAN: ON Semiconductor, Japan Customer Focus Center  
2-9-1 Kamimeguro, Meguro-ku, Tokyo, Japan 153-0051  
Phone: 81-3-5773-3850  
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For additional information, please contact your local  
Sales Representative.  
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NID9N05CL/D  

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