PUMA68F32006M-15 [ETC]

EEPROM ; EEPROM\n
PUMA68F32006M-15
型号: PUMA68F32006M-15
厂家: ETC    ETC
描述:

EEPROM
EEPROM\n

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总23页 (文件大小:181K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
1M x 32 FLASH MODULE  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Elm Road, West Chirton, NORTH SHIELDS, Tyne & Wear  
NE29 8SE, England Tel. +44 (0191) 2930500 Fax. +44 (0191) 2590997  
A version 'A' with four independant write enables  
(WE1-4) is available.  
Description  
The PUMA 68F32006 is a high density 32Mbit  
CMOS 5V Only FLASH memory organised as  
1M x 32 in a JEDEC 68 pin surface mount  
PLCC, with read access times of 90, 120, and  
150ns.  
The output width is user configurable as 8 , 16  
or 32 bits using four Chip Selects (CE1~4) for  
optimum application flexibility.  
Features  
Fast Access Times of 90/120/150 ns.  
Output Configurable as 32 / 16 / 8 bit wide.  
Commercial, Industrial, or Military (Restricted) grade.  
AutomaticWrite/ErasebyEmbeddedAlgorithm-endof  
The module incorporates Embedded Algorithms  
for Program and Erase with Sector architecture  
(64K sector) and supports full chip erase.  
The device also features hardware sector  
protection, which disables both program and  
erase operations in any of the 64 sectors on the  
module.  
Write/Erase indicated by DATA Polling and Toggle Bit.  
Flexible Sector Erase Architecture - 64K byte sector  
size, with hardware protection of sector groups.  
Single Byte Program of 7µs (Typ.)  
Erase/WriteCycleEndurance100,000(Min.)-Evariant.  
Block Diagram (see page 24 for 'A' version)  
Pin Definition (see page 24 for 'A' version)  
64 63 62 61  
8 7 6 5 4 3 2 1 68 67 66 65  
9
10  
D1 11  
D0  
60  
D16  
D17  
D18  
D19  
D20  
D21  
D22  
D23  
GND  
D24  
D25  
D26  
D27  
D28  
D29  
D30  
D31  
A0~A19  
OE  
59  
58  
57  
56  
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
12  
13  
14  
15  
16  
17  
D2  
D3  
D4  
D5  
D6  
D7  
WE  
1M x 8  
1M x 8  
1M x 8  
PUMA 68F32006  
1M x 8  
FLASH  
FLASH  
FLASH  
FLASH  
VIEW  
FROM  
ABOVE  
CS1  
CS2  
CS3  
CS4  
D0~7  
D8~15  
D16~23  
D24~31  
GND 18  
19  
D9 20  
D8  
21  
22  
23  
24  
D10  
D11  
D12  
D13  
D14 25  
26  
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43  
D15  
Pin Functions  
D0-D31  
WE  
Vcc  
A0-A19  
CE1-4  
OE  
Address Input  
Chip Enables  
Output Enable  
Ground  
Data Inputs/Outputs  
Write Enable (WE1-4 for 'A' version)  
Power (+5V)  
GND  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Absolute Maximum Ratings (1)  
max  
-2.0 to +7  
-2.0 to +7  
unit  
V
V
Voltage on any pin w.r.t. Gnd  
Supply Voltage(2)  
Voltage on A9 w.r.t. Gnd (3)  
Storage Temperature  
-2.0 to +13.5 V  
-65 to +125 °C  
Notes : (1) Stresses above those listed may cause permanent damage to the device. This is a stress rating only and functional  
operationof the device at those or any other conditions above those indicated in the operational sections of this  
specification  
is not implied.  
(2) Minimum DC voltage on any input or I/O pin is -0.5V. Maximum DC voltage on output and I/O pins is Vcc+0.5V  
During transitions voltage may overshoot by +/-2V for upto 20ns  
(3) Minimum DC input voltage on A9 is -0.5V during voltage transitions, A9 may overshoot Vss to -2V for periods of up to  
20ns, maximum DC input voltage in A9 is 12.5V which may overshoot to 14.0V for periods up to 20ns  
Recommended Operating Conditions  
Parameter  
Supply Voltage  
Input High Voltage  
Input Low Voltage  
Operating Temperature  
min  
4.5  
2.0  
-0.5  
0
typ  
5.0  
max  
5.5  
VCC+0.5  
VCC+0.8  
70  
unit  
V
V
V
°C  
VCC  
VIH  
VIL  
TA  
TAI  
TAM  
-
-
-
-
-
-40  
-55  
85  
115  
OC (-I suffix)  
OC (-M suffix)  
Parameter  
I/P Leakage CurrentAddress, OE, WE ILI1  
A9 Input Leakage Current ILI2  
Symbol Test Condition  
min  
typ max Unit  
VCC=VCC max, VIN=0V or VCC  
VCC=VCC max, A9=12V  
-
-
-
-
-
-
-
-
-
-
-
-
-
-
±4 µA  
200 µA  
±1 µA  
±4 µA  
120 mA  
62 mA  
33 mA  
Other Pins ILI3  
ILO  
VCC=VCC max, VIN=0V or VCC  
VCC=VCC max, VOUT=0V or VCC  
Output Leakage Current  
VCC Operating Current  
32 bit ICCO32 CE=VIL(1), OE=VIH, IOUT=0mA, f=6MHz  
16 bit ICCO16 As above  
8 bit ICCO8  
As above  
VCC Program/Erase Current 32 bit ICCP32 Programming in Progress  
16 bit ICCP16 As above  
-
-
-
-
-
-
240 mA  
122 mA  
63 mA  
8 bit ICCP8  
As above  
(1)  
Standby Supply Current  
ISB1  
VCC=VCC max, CE=VIH OE = VIH  
VCC = 5.0V  
-
-
-
-
-
-
4
12.5  
0.45  
-
mA  
V
Autoselect / Sector Protect Voltage  
Output Low Voltage  
VID  
11.5  
VOL  
IOL=12mA. VCC = VCC min.  
IOH=-2.5mA. VCC = VCC min.  
-
2.4  
3.2  
V
Output High Voltage  
VOH1  
VLKO  
V
Low VCC Lock-Out Voltage  
4.2  
V
Notes (1) CE above are accessed through CE1-4. These inputs must be operated simultaneoulsy for 32 bit operation,  
in pairs in 16 bit mode and singly for 8 bit mode.  
2
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Capacitance (TA=25°C,f=1MHz)  
Parameter  
Symbol  
Test Condition  
typ  
max  
Unit  
Input CapacitanceAddress, OE, WE CIN1  
VIN=0V  
VIN=0V  
-
-
35  
14  
pF  
pF  
Other pins  
CIN2  
Output Capacitance  
32 bit  
COUT32  
VOUT=0V  
-
54  
pF  
Note: These parameters are calculated, not measured.  
AC Test Conditions  
166  
* Input pulse levels : 0.0V to 3.0V  
* Input rise and fall times : 5 ns  
* Input and output timing reference levels : 1.5V  
* VCC = 5V +/- 10%  
I/O Pin  
1.76V  
30pF  
* Module tested in 32 bit mode  
3
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
AC OPERATING CONDITIONS  
Read Cycle  
Parameter  
Symbol  
90  
min typ max Unit  
Read Cycle Time  
tRC  
tACC  
tCE  
90  
-
-
-
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
Address to output delay  
Chip enable to output  
Output enable to output  
-
90  
90  
40  
20  
-
-
tOE  
-
Output enable to output High Z tDF  
Output hold time from address tOH  
CE or OE whichever occurs first  
-
0
Parameter  
Symbol  
120  
150  
min  
120  
typ max min typ max Unit  
Read Cycle Time  
tRC  
tACC  
tCE  
-
-
-
-
-
-
-
150  
-
-
-
-
-
-
-
ns  
Address to output delay  
Chip enable to output  
Output enable to output  
-
-
120  
120  
50  
30  
-
-
-
150 ns  
150 ns  
tOE  
-
-
55  
35  
-
ns  
ns  
ns  
Output enable to output High Z tDF  
Output hold time from address tOH  
CE or OE whichever occurs first  
-
-
0
0
4
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Write/Erase/Program  
Parameter  
Symbol  
90  
min  
typ  
max  
unit  
Write Cycle time (2)  
Address Setup time  
Address Hold time  
Data Setup Time  
tWC  
tAS  
90  
0
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
sec  
µs  
tAH  
45  
45  
0
-
-
tDS  
-
-
Data hold Time  
tDH  
-
-
Output Enable Setup Time  
Read Recover before Write  
CE setup time  
tOES  
tGHWL  
tCE  
0
-
-
0
-
-
0
-
-
CE hold time  
tCH  
0
-
-
WE Pulse Width  
tWP  
45  
20  
-
-
-
WE Pulse Width High  
Byte Programming operation  
Sector Erase operation (1)  
Vcc setup time (2)  
tWPH  
tWHWH1  
tWHWH2  
tVCS  
-
-
8
1
-
-
-
15  
-
50  
Parameter  
Symbol  
120  
typ  
150  
typ  
min  
max  
min  
max  
unit  
Write Cycle time (2)  
Address Setup time  
Address Hold time  
Data Setup Time  
tWC  
tAS  
120  
0
-
-
-
-
150  
0
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
sec  
µs  
tAH  
50  
50  
0
-
-
50  
50  
0
-
-
tDS  
-
-
-
-
Data hold Time  
tDH  
-
-
-
-
Output Enable Setup Time  
Read Recover before Write  
CE setup time  
tOES  
tGHWL  
tCE  
0
-
-
0
-
-
0
-
-
0
-
-
0
-
-
0
-
-
CE hold time  
tCH  
0
-
-
0
-
-
WE Pulse Width  
tWP  
50  
20  
-
-
-
50  
20  
-
-
-
WE Pulse Width High  
Byte Programming operation  
Sector Erase operation (1)  
Vcc setup time (2)  
tWPH  
tWHWH1  
tWHWH2  
tVCS  
-
-
-
-
8
1
-
-
8
1
-
-
-
15  
-
-
15  
-
50  
50  
Notes: (1) This does not include the preprogramming time.  
(2) Not 100% tested.  
5
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Write/Erase/Program Alternate CE controlled Writes  
Parameter  
Symbol  
90  
min  
typ  
max  
unit  
Write Cycle time (2)  
Address Setup time  
tWC  
tAS  
90  
0
-
-
-
-
ns  
ns  
Address Hold time  
Data Setup Time  
tAH  
tDS  
45  
45  
0
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
us  
sec  
us  
Data hold Time  
tDH  
-
-
Output Enable Setup Time  
Read Recover before Write  
WE setup time  
tOES  
tGHEL  
tWS  
0
-
-
0
-
-
0
-
-
WE hold time  
tWH  
0
-
-
CE Pulse Width  
tCP  
45  
20  
-
-
-
CE Pulse Width High  
Programming operation  
Sector Erase operation (1)  
Vcc setup time (2)  
tCPH  
tWHWH1  
tWHWH2  
tVCS  
-
-
8
1
50  
-
-
15  
-
-
Parameter  
Symbol  
120  
typ  
150  
typ  
min  
max  
min  
max  
unit  
Write Cycle time (2)  
Address Setup time  
tWC  
tAS  
120  
0
-
-
-
-
150  
0
-
-
-
-
ns  
ns  
Address Hold time  
Data Setup Time  
tAH  
tDS  
50  
50  
0
-
-
-
-
50  
50  
0
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
us  
sec  
us  
Data hold Time  
tDH  
-
-
-
-
Output Enable Setup Time  
Read Recover before Write  
WE setup time  
tOES  
tGHEL  
tWS  
0
-
-
0
-
-
0
-
-
0
-
-
0
-
-
0
-
-
WE hold time  
tWH  
0
-
-
0
-
-
CE Pulse Width  
tCP  
50  
20  
-
-
-
50  
20  
-
-
-
CE Pulse Width High  
Programming operation  
Sector Erase operation (1)  
Vcc setup time (2)  
tCPH  
tWHWH1  
tWHWH2  
tVCS  
-
-
-
-
8
1
50  
-
8
1
50  
-
-
15  
-
-
15  
-
-
-
Note: (1) Does not include pre-programming time.  
(2) Not 100% tested.  
6
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
AC Waveforms for Read Operation  
tRC  
Addresses Stable  
tACC  
Addresses  
CE  
tDF  
tOE  
OE  
tOH  
tCE  
WE  
High Z  
High Z  
Output Valid  
Outputs  
AC Waveforms Program  
Data Polling  
5555H  
tWC  
PA  
PA  
Address  
CE  
tAH  
tAS  
tRC  
tGHWL  
OE  
t
tWHP  
tWHWH1  
WP  
WE  
tDF  
tOE  
tCS  
tDH  
DATA  
A0H  
PD  
DOUT  
DQ7  
tDS  
tCE  
tOH  
VCC  
Notes:  
1. PA is address of the memory location to be programmed.  
2. PD is data to be programmed at byte address.  
3. DQ7 is the out put of the complement of the data written to the device.  
4. DOUT is the output of the data written to the device.  
5. Figure indicates last two bus cycles of four bus cycle sequence.  
7
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
A.C Waveforms - Alternate CE controlled Program operation timings  
Data Polling  
5555H  
tWC  
PA  
PA  
Address  
tAH  
tAS  
tRC  
WE  
tGHEL  
OE  
t
tCHP  
tWHWH1  
CP  
CE  
t
DF  
tOE  
tWS  
tDH  
DATA  
A0H  
PD  
DOUT  
DQ7  
tDS  
tCE  
tOH  
V
CC  
NOTES:  
1. PA is address of memory location to be programmed.  
2. PD is data to be programmed at byte address.  
3. DQ7 is the output of the complement of the data written to the device.  
4. DOUT is the output of the data written to the device.  
5. Figure indicates last two bus cycles of four bus cycle sequence.  
AC Waveforms for Data Polling During Embedded Algorithm Operations  
t
CH  
CE  
tDF  
tOE  
OE  
tOEH  
tCE  
WE  
t
OH  
*
HIGH Z  
HIGH Z  
DQ7=  
Valid Data  
DQ7  
DQ7  
tWHWH  
1 or 2  
DQ0-DQ6  
= Invalid  
DQ0-DQ7=  
Vaild Data  
DQ0-DQ6  
t
OE  
8
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
AC Waveforms for Toggle Bit During Embedded Algorithm Operations  
CE  
WE  
tOEH  
OE  
*
DATA  
(DQ0-DQ7)  
DQ0-DQ7  
Valid  
DQ6=  
Stop Toggling  
DQ6=Toggle  
DQ6=Toggle  
tOE  
* DQ6 stops toggling ( the device has completed the embedded operations)  
AC Waveforms Chip / Sector Erase  
tAH  
tAS  
Address  
CE  
5555H  
2AAAH  
5555H  
5555H  
2AAAH  
SA  
tGHWL  
OE  
tWP  
WE  
tWPH  
tDH  
tCS  
10H/30H  
80H  
AAH  
55H  
55H  
AAH  
Data  
tDS  
Vcc  
tVCS  
NOTES:  
1. SA is the address for sector erase. Addresses = don't care for Chip Erase.  
9
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
EMBEDDED PROGRAMMING ALGORITHM  
Start  
Write Program Command  
Sequence  
(see below)  
Data Poll Device  
Last  
Address  
?
No  
Increment Address  
Yes  
Programming  
Completed  
Program Command Sequence (Address /Command)  
5555H/AAH  
2AAAH/55H  
5555H/A0H  
Program Address/Program data  
10  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
EMBEDDED ERASE ALGORITHM  
START  
Write Erase Command Sequence  
(See below)  
Data Poll or Toggle Bit  
Successfully Completed  
Erasure Completed  
Individual Sector/Mulitiple Sector  
Chip Erase Command Sequence  
(Address/Command):  
Erase Command Sequence  
(Address/Command):  
5555H/AAH  
5555H/AAH  
2AAAH/55H  
5555H/80H  
5555H/AAH  
2AAAH/55H  
2AAAH/55H  
5555H/80H  
5555H/AAH  
5555H/10H  
2AAAH/55H  
Sector Address/30H  
Sector Address/30H  
Sector Address/30H  
Additional sector  
erase commands  
are optional  
}
11  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
DATA POLLING ALGORITHM  
START  
Read Byte  
(DQ0-DQ7)  
Addr =VA  
YES  
DQ7 = Data ?  
NO  
NO  
DQ5 = 1 ?  
YES  
Read Byte  
(DQ0-DQ7)  
Addr =VA  
YES  
DQ7 = Data ?  
PASS  
NO  
FAIL  
NOTE:  
1. DQ7 is rechecked even if DQ5 = 1 because DQ7 may change simultaneously with DQ5.  
2. VA = Byte address for programming.  
= Any of the sector addresses within the sector being erased during sector erase operation  
= Valid address equals any Non-protected sector group address during chip erase.  
TOGGLE BIT ALGORITHM  
START  
Read Byte  
(DQ0-DQ7)  
Addr=Don't Care  
NO  
DQ6=Toggle ?  
YES  
NO  
DQ5 = 1 ?  
YES  
Read Byte  
(DQ0-DQ7)  
Addr=Don't Care  
NO  
DQ6=Toggle ?  
PASS  
YES  
FAIL  
NOTES:  
1. DQ6 is rechecked even if DQ5 = 1 because DQ6 may stop toggling at the same time as DQ5 changing to "1".  
12  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
DEVICE OPERATION  
The following description deals with the device operating in 8 bit mode accessed through CE1,  
however status flag definitions shown apply equally to the corresponding flag for each device in the module.  
Read Mode  
The device has two control functions which must be satisfied in order to obtain data at the outputs  
CE1-4 is the power control and should be used for device selection  
OE is the output control and should be used to gate data to the output pins if the device is selected.  
Standby Mode  
Two standby modes are available :  
CMOS standby : CE1-4 held at Vcc +/- 0.3V  
TTL standby : CE1-4 held at VIH  
In the standby mode the outputs are in a high impedance state independent of the OE input. If the device is  
deselected during erasure or programming the device will draw active current until the operation is completed.  
Output Disable  
With the OE input at a logic high level (VIH), output from the device is disabled. This will cause the output pins  
to be in a high impedance state.  
Autoselect  
The autoselect mode allows the reading out of a binary code from the device and will identify the die manu-  
facturer and type. This mode is intended for use by programming equipment. This mode is functional over the  
full military temperature range. The autoselect codes for the first device are as follows :  
Type  
A17-A19  
A6  
A1  
A0  
Code  
(HEX)  
DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0  
Manufacture  
Code  
X
VIL  
VIL  
VIL  
01H  
A4H  
01H*  
0
1
0
0
1
0
0
0
0
0
1
0
0
0
0
0
1
0
0
0
0
1
1
1
X
VIL  
VIL  
VIL  
VIH  
VIH  
VIL  
Device Code  
Sector Group Sector Group  
Protection Address  
* Outputs 01H at protected sector address  
To activate this mode the programming equipment must force VID on address A9 . Two identifier bytes may  
then be sequenced from each die device outputs by toggling A0 from VIL to VIH. All addresses are dont care  
apart from A0, A1, A6. All identifiers for manufacturer and device will exhibit odd parity with D7 defined as the  
parity bit. In order to read the proper device codes when executing the autoselect A1 must be VIL.  
Write  
Device erasure and programming are accomplished via the command register. The contents of the register  
serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. The  
register is a latch used to store the commands along with the address and data information required to execute  
the command. The command register is written by bringing WE/WE1-4 to VIL while CE1-4 is at VIL and  
OE is at VIH.Addresses are latched on the falling edge of WE/WE1-4 while data is latched on the rising edge.  
13  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
COMMAND DEFINITIONS  
Device operations are selected by writing specific address and data sequences into the command register.  
The following table defines these register command sequences.  
Bus  
Write  
Cycles  
Req'd  
Fourth Bus  
Read/Write  
Cycle  
First Bus  
Write Cycle  
Second Bus  
Write Cycle  
Third Bus  
Write Cycle  
Fifth Bus  
Write Cycle  
Sixth Bus  
Write Cycle  
Command  
Sequence  
Read/Reset  
Addr  
Data  
Addr  
Data  
Addr  
Data  
Addr  
Data  
Addr  
Data  
Addr  
Data  
F0H  
AAH  
1
3
XXXXH  
5555H  
Read/Reset  
Read/Reset  
Autoselect  
2AAAH  
2AAAH  
2AAAH  
2AAAH  
2AAAH  
55H  
55H  
55H  
55H  
55H  
5555H  
5555H  
5555H  
5555H  
5555H  
F0H  
90H  
A0H  
80H  
80H  
RA  
RD  
00H/  
01H  
3
4
5555H  
5555H  
5555H  
5555H  
AAH  
AAH  
AAH  
AAH  
01H/D5H  
PD  
Byte Program  
Chip Erase  
PA  
2AAAH  
2AAAH  
5555H  
5555H  
AAH  
AAH  
55H  
55H  
5555H  
SA  
10H  
30H  
6
6
Sector Erase  
Erase Suspend  
Erase Resume  
1
1
XXXXH B0H  
30H  
XXXXH  
NOTES:  
1. Address bit A15,A14,A13, A12, A11=X=Don't care.  
2. RA=Address of the memory location to be read.  
PA=Address of memory location to be programmed. Addresses are latched on the falling edge of the WE pulse .  
SA=Address of the sector to be erased. The combination of A19, A18, A17 and A16 will uniquely select any  
sector.  
3. RD=Data read from location RA during read operation.  
PD=Data to be programmed at location PA. Data is latched on the falling edge of WE  
Read / Reset Command  
The read or reset operation is initiated by writing the read/reset command sequence into the command  
register. Microprocessor read cycles retrieve array data from the memory. The device remains enabled for  
reads until the command register contents are altered.  
The device will automatically power-up in the read/reset state. In this case, a command sequence is not  
required to read data. Standard microprocessor read cycles will retrieve array data. This default value ensures  
that no spurious alteration of memory content occurs during the power transition. Refer to the AC Read  
Characteristics and Waveforms for specific timing parameters.  
14  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Sector Group Protection  
The device features hardware sector group protection. This feature will disable both program and erase  
operations in any combination of sector groups of memory. The sector protect feature is enabled using pro-  
gramming equipment at the users site. The device is shipped with all sector groups unprotected.  
It is also possible to determine if a sector is protected in the system by writing the autoselect command.  
Performing a read operation at XX02H , where the higher order addresses (A17, A18, A19) is the desired  
sector group address, will produce 01H data at DQ0 for a protected sector group.  
Sector Address Table  
A17  
0
A19  
0
A18  
0
A16  
0
Address Range  
000000h-00FFFFh  
010000h-01FFFFh  
020000h-02FFFFh  
030000h-03FFFFh  
040000h-04FFFFh  
050000h-05FFFFh  
060000h-06FFFFh  
SA0  
SA1  
SA2  
SA3  
0
0
0
1
0
0
1
0
0
0
1
1
0
1
0
0
SA4  
0
1
0
SA5  
1
SA6  
0
1
1
0
0
1
1
1
SA7  
070000h-07FFFFh  
1
0
0
SA8  
0
080000h-08FFFFh  
090000h-09FFFFh  
1
0
0
1
SA9  
1
1
1
1
1
1
0
0
1
1
1
1
1
1
0
0
1
1
SA10  
SA11  
SA12  
SA13  
SA14  
SA15  
0A0000h-0AFFFFh  
0B0000h-0BFFFFh  
0C0000h-0CFFFFh  
0D0000h-0DFFFFh  
0E0000h-0EFFFFh  
0
1
0
1
0
1
0F0000h-0FFFFFh  
Sector Group Address Table  
Sectors  
A17  
0
A19  
A18  
0
0
0
0
1
1
1
1
0
0
1
1
SA0-SA1  
SA2-SA3  
SA4-SA5  
SA6-SA7  
SA8-SA9  
SA10-SA11  
SA12-SA13  
SGA0  
SGA1  
SGA2  
SGA3  
1
0
1
0
0
0
1
1
SGA4  
SGA5  
SGA6  
SGA7  
1
0
SA14-SA15  
1
15  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Autoselect Command  
Flash memories are intended for use in applications where the local CPU alters memory contents. As such,  
manufacture and device codes must be accessible while the device resides in the target systems. PROM  
programmers typically access the signature codes by raising A9 to a high voltage. However, multiplexing high  
voltage onto the address lines is not generally a desired system design practice.  
The device contains an autoselect operation to supplement traditional PROM programming methodology. The  
operation is initiated by writing the autoselect command sequence into the command register. Following the  
command write, a read cycle from address XX00H retrieves the manufacture code of 01H. A read cycle from  
address XX01H returns the device code D5H. Further, the write protect status of sectors can be read in this  
mode. Scanning the sector group addresses (A17, A18, A19) while (A6,A1,A0)=(0, 1, 0) will produce a logical  
'1' at device output DQ0 for a protected sector group.  
To terminate the operation, it is necessary to write the read/reset command sequence into the register.  
Byte Programming  
The device is programmed on a byte-by-byte basis. Programming is a four bus cycle operation. There are two  
"unlock" write cycle. These are followed by the program set-up command and data write cycles. Addresses are  
latched on the falling edge of WE/WE1-4 or CE1-4, whichever happens later, while the data are latched on the  
rising edge of WE/WE1-4 or CE1-4 whichever happens first. The rising edge of WE/WE1-4 or CE1-4 begins  
programming. Upon executing the Embedded Program Algorithm Command sequence the system is not  
required to provide further controls or timings. The device will automatically provide adequate internally gener-  
ated program pulses and verify the programmed cell margin. The automatic programming operation is com-  
pleted when the data on D7 is equivalent to data written to this bit (see written Operations Status) at which time  
the device returns to read mode. Data Polling must be performed at the memory location which is being  
programmed.  
Programming is allowed in any address sequence and across sector boundaries.  
Chip Erase  
Chip erase is a six bus cycle operation. There are two "unlock" write cycles. These are followed by writing the  
"set-up" command. Two more "unlock" write cycles are then followed by the chip erase command.  
Chip erase doesn't require the user to program the device prior to erase. Upon executing the Embedded Erase  
Algorithm command sequence the device will automatically program and verify the entire memory for an all  
zero data pattern prior to electrical erase. The systems is not required to provide any controls or timings during  
these operations.  
The automatic erase begins on the rising edge of the last WE pulse in the command sequence and terminates  
when the data on D7 is "1" (See Written Operation Section) at which time the device returns to read the mode.  
16  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Sector Erase  
Sector erase is a six bus cycle operation. There are two "unlock"write cycles. These are followed by writing  
the "Set-up" command. Two more "unlock" write cycles are then followed by the sector erase command. The  
sector address (any address location within the desired sector) is latched on the falling edge of WE, while the  
command (30H) is latched on the rising edge of WE. A time-out of 50us from the rising edge of the last sector  
erase command will initiate the sector erase command(s).  
Multiple sectors may be erased sequentially by writing the six bus cycle operations as desribed above. This  
sequence is followed with writes of the sector erase command to addresses in other sectors desired to be  
sequentially erased. A time-out of 50us from the rising edge of the WE pulse for the last sector erase com-  
mand will initiate the sector erase. If another sector erase command is wriiten within the 50us time-out window  
the timer is reset. Any command other than sector erase within the time-out window will reset the device to the  
read mode, ignoring the previous command string (refer to Write Operation Status section for Sector Erase  
Timer operation). Loading the sector erase buffer may be done in any sequence and with any number of  
sectors (0 to 7).  
Sector erase doesn't require the user to program the device prior to erase. The device automatically programs  
all memory locations in the sector(s) to be erased prior to electrical erase. When erasing a sector or sectors  
the remaining unselected sectors are not affected. The system is not required to provide any controls or  
timings during these operations.  
The automatic sector erase begins after the 50us time-out from the rising edge of the WE pulse for the last  
sector erase command pulse and terminates when the data on D7 is "1" ( see Written Operation Status  
Section) at which time the device returns to read mode. Data polling must be preformed at an address within  
any of the sectors being erased.  
Erase Suspend  
Erase suspend allows the user to interrupt a sector erase operation and then perform data reads or programs  
to a sector not being erased.  
This command is only applicable during the sector erase operation which includes the time-out period for  
sector erase. Writing the erase suspend command during the sector erase time-out results in immediate  
termination of the time-out period & suspension of the erase operation. Writing the erase resume command  
resumes the erase operation.  
When the erase operation has been suspended, the device defaults to the erase-suspend-read mode. After  
entering the erase-suspend-read mode, the user can program the device by writing the appropriate command  
sequence for Byte program. The end of the erase-suspend program operation is detected by data polling, or  
by the toggle bit. Note that DQ7 must be read from the byte program address.  
To resume the sector erase operation, the resume command (30H) should be written. Any further writes of the  
resume command at this point will be ignored.  
17  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Operating Modes  
The following modes are used to control the device.  
OPERATION  
Auto-Select Manufacturer Code  
Auto Select Device Code  
Read(1)  
CE  
L
OE  
L
WE  
A0  
A1  
A6  
A9  
I /O  
Code  
Code  
DOUT  
H
L
L
L
VID  
VID  
L
L
H
H
A0  
X
L
L
L
L
X
A1  
X
A6  
X
A9  
Standby  
H
L
X
H
H
L
X
H
L
X
High Z  
High Z  
Din  
Output Disable  
X
X
X
X
Write  
L
A0  
A1  
A6  
A9  
VID  
Verify Sector Group Protect  
L
H
L
H
L
Code  
1) L=VIL, H=VIH, X=Don't Care  
NOTE:  
1) WE can be VIL if OE is VIL , OE at VIH initiates write cycle.  
WRITE OPERATIONS STATUS  
Status  
DQ7  
DQ6 DQ5  
DQ3 DQ2  
Toggle  
Toggle  
0
1
0
DQ7  
Byte Program in Embedded Program Algorithm  
Embedded Erase Algorithm  
0
1
Toggle  
1
0
Toggle  
Erase Suspend Read  
1
0
Data  
0
0
(Erase Suspend Sector)  
(Note 1)  
In Progress  
Erase Suspend Read  
Erase Suspended Mode  
Data  
DQ7  
Data  
Data  
0
Data  
(Non-Erase Suspend Sector)  
Toggle  
Erase Suspend Program  
1
(Non-Erase Suspend Sector)  
(Note 2)  
(Note 3)  
Toggle  
Toggle  
0
1
1
DQ7  
0
1
Byte Program in Embedded Program Algorithm  
Program/Erase in Embedded Erase Algorithm  
1
1
Exceeded  
N/A  
Time Limits  
Erase Suspend Program  
(Non-Erase Suspend Sector)  
DQ7  
N/A  
Toggle  
1
Erase Suspended Mode  
Notes:  
1. Performing successive read operations from the erase-suspended sector will cause DQ2 to toggle.  
2. Performing successive read operations from any address will cause DQ6 to toggle.  
3. Reading the byte address being programmed while in the erase-suspend program mode will indicate logic '1' at the DQ2 bit.  
However, successive reads from the erase-suspended sector will cause DQ2 to toggle.  
18  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
D7 Data Polling  
The device features Data Polling as a method to indicate to the host system that the Embedded Algorithms  
are in progress or completed.  
During the Embedded Programming Algorithm, an attempt to read the device will produce the complement of  
the data last written to D7. Upon completion of the Embedded Programming Algorithm an attempt to read the  
device will produce the true data last written to D7.  
During the Embedded Erase Algorithm, D7will be "0" until the erase operation is completed. Upon completion  
data at D7 is "1". For chip erase, the Data Polling is valid after the rising edge of the sixth WE pulse in the six  
write pulse sequence. For sector erase, Data Polling is valid after the last rising edge of the sector erase WE  
pulse.  
The Data Polling feature is only active during the Embedded Programming Algorithm, Embedded Erase  
Algorithm, Erase Suspend, Erase-Suspend-Program, or sector erase time-out.  
D6  
Toggle Bit  
The device also features the "toggle bit" as a method to indicate to the host system that the Embedded  
Algorithms are in progress or completed.  
During an Embedded Program or Erase Algorithm cycle, successive attempts to read data from the device  
will result in D6 toggling between one and zero. Once the Embedded Program or Erase Algorithm cycle is  
completed, D6 will stop toggling and valid data will be read on successive attempts. During programming, the  
Toggle bit is valid after the rising edge of the forth WE pulse in the four write pulse sequence. For chip erase,  
the Toggle bit is valid after the rising edge of the sixth WE pulse in the six write pulse sequence. For Sector  
Erase, the toggle bit is valid after the last rising edge of the sector erase WE pulse. The Toggle Bit is active  
during the sector time-out.  
D5 Exceeding Time Limits  
D5 will indicate if the program or erase time has exceeded the specified limits. Under these conditions D5 will  
produce "1", indicating the program or erase cycle was not successfully completed . Data Polling is the only  
operating function of the device under this condition. The CE circuit will partially power down the device under  
these conditions (to approximately 2mA). The OE and WE pins will control the output disable functions .  
The D5 failure condition may also appear if the user tries to program a non blank location without erasing. In  
this case the device locks out and never completes the embedded algorithm operation. Hence the system  
never reads a valid data on D7 and D6 never stops toggling. Once the device has exceeded timing limits, the  
D5 bit will indicate '1'  
D3 Sector Erase Timer  
After the completion of the initial sector erase command sequence the sector erase time-out will begin. D3  
will remain low until the time-out is complete. Data Polling and Toggle Bit are valid after the initial sector erase  
command sequence.  
If Data Polling or the Toggle Bit indicates the device has been written with a valid erase command, D3 may  
be used to determine if the sector erase timer window is still open. If D3 is high the internally controlled erase  
cycle has begun; attempts to write subsequent commands to the device will be ignored until the erase opera-  
tion is completed as indicated by Data Polling or Toggle Bit. If D3 is low , the device will accept additional  
sector erase commands. To insure the command has been accepted, the software should check the status of  
D3 prior to and following each subsequent sector erase command. If D3 were high on the second status  
check, the command may not have been accepted.  
19  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
DATA PROTECTION  
The device is designed to offer protection against accidental erasure or programming caused by spurious  
system level signals that may exist during power transition. During power up the device automatically resets  
the internal state machine in the Read mode. Also, with its controls register architecture , alteration of the  
memory contents only occurs after successful completion of specific multi-bus cycle command sequences.  
The device also incorporates several features to prevent inadvertent write cycles resulting from Vcc power up  
and power down transitions or system noise.  
Low Vcc Write Inhibit  
To avoid initiation of a write cycle during VCC power up and power down, a write cycle is locked out for  
VCC<VLKO . If VCC<VLKO, the command register is disabled and all internal program/erase circuits are disabled.  
Under this condition the device will reset to read mode. Subsequent writes will be ignored until the VCC level is  
greater than VLKO. It is usually correct to prevent unintentional writes when VCC>VLKO  
.
Write Pulse "Glitch" Protection  
Noise pulses of less than 5ns (typical) on OE, CE, WE will not initiate a write cycle  
Logical Inhibit  
Writing is inhibited by holding any one of OE=VIL, CE=VIH or WE=VIH. To initiate a write cycle CE and WE  
must be logical zero while OE is a logical one.  
Power Up Write Inhibit  
Power-up of the device with WE=CE=VIL and OE=VIH will not accept commands on the rising edge of WE.  
The internal state machine is automatically reset to the read mode on power-up.  
Sector Protect  
Sectors of the device may be hardware protected at the users factory. The protection circuitry will disable both  
program and erase functions for the protected sector(s). Requests to program or erase a protected sector will  
be ignored by the device.  
ERASE AND PROGRAMMING PERFORMANCE  
Limits  
Parameter  
Min  
Typ  
Max  
Unit  
Comments  
Sector Erase Time  
-
1
15  
sec  
Excludes 00H programming  
prior to erasure.  
(Note 1)  
Byte Programming Time  
Chip Programming Time  
-
-
7
1000  
50  
us  
Excludes System-level overhead.  
(Note 1)  
7.2  
sec  
Excludes system-level overhead.  
(Note 1)  
16  
(Note 1)  
Chip Erase Time  
-
240  
sec  
Exclude 00H programming  
prior to erase  
Notes: (1) 25OC, 5V VCC, 100,000 cycles.  
20  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Version 'A' Pin Definition  
Version 'A' Block Diagram  
64 63 62 61  
8 7 6 5 4 3 2 1 68 67 66 65  
9
A0~A19  
10  
D1 11  
D0  
60  
D16  
OE  
59 D17  
WE4  
WE3  
WE2  
WE1  
12  
13  
14  
15  
16  
17  
D2  
D3  
D4  
D5  
D6  
D7  
58  
57  
56  
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
D18  
D19  
D20  
D21  
D22  
D23  
GND  
D24  
D25  
D26  
D27  
D28  
D29  
D30  
D31  
PUMA 68F32006A  
1M x 8  
1M x 8  
1M x 8  
FLASH  
1M x 8  
VIEW  
FROM  
ABOVE  
FLASH  
FLASH  
FLASH  
GND 18  
D8 19  
D9 20  
D10 21  
CS1  
CS2  
CS3  
CS4  
D0~7  
D8~15  
D16~23  
D24~31  
22  
23  
24  
D11  
D12  
D13  
D14 25  
26  
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43  
D15  
21  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
Package Information  
Dimensions in mm(inches)  
Plastic 68 Pin JEDEC Surface mount PLCC  
25.27 (0.995) sq.  
5.08  
(0.200) max  
0.10 (0.004)  
25.02 (0.985) sq.  
1.27  
(0.050) typ.  
0.46  
(0.018) typ.  
0.90 (0.035) typ.  
Ordering Information  
PUMA 68F32006AM-90E  
Speed  
90 = 90 ns  
12 = 120 ns  
15 = 150 ns  
Temperature range Blank = Commercial Temperature  
I = Industrial Temperature  
M = Military Temperature (Restricted)  
Special Features  
Organisation  
Blank = Single WE  
A = WE1-4  
32006 = 1M x 32, user configurable  
as 2M x 16 and 4M x 8  
Memory Type  
Package  
F = FLASH  
PUMA 68 = 68 pin "J" Leaded PLCC  
NOTE: The E variant is designated to parts with extended Erase/Write Cycle Endurance (100,000 Min.). If not  
specified when ordered only a Erase/Write Cycle Endurance of 10,000 Minimum can be  
guaranteed.  
Note :  
Although this data is believed to be accurate the information contained herein is not intended to and does not create any  
warranty of merchantibility or fitness for aparticular purpose.  
Our products are subject to a constant process of development. Data may be changed without notice.  
Products are not authorised for use as critical components in life support devices without the express written approval  
of a company director.  
PUMA 68F32006/A-90/12/15  
Issue 4.2 : December 1999  
ISSUE HISTORY  
PUMA 68F32006-90/12/15  
Issue 4.1 DCN3964 First issue based on AMD29F080.  
Issue 4.2  
Restricted military Operating temperature from 125OC to 115OC  
23  

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