RG1005N-103-W-T5 [ETC]
RES SMD 10K OHM 0.05% 1/16W 0402;
| 型号： | RG1005N-103-W-T5 |
| 厂家： | 
ETC |
| 描述： | RES SMD 10K OHM 0.05% 1/16W 0402 |
| 文件： | 总2页 (文件大小：275K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Metal thin film chip resistors
(the highest precision)
RG series
■
AEC-Q200 Compliant
Features
Long term stability with inorganic passivation
・
・
・
・
Less than ±0.1% drift after 10000 hours of reliability test
High precision resistance tolerance: ±0.05%, very small TCR: ±5ppm/
Thin film structure enabling low noise and anti-sulfur
℃
Applications
Automotive electronics
・
・
・
Industrial measurement instrumentation, industrial machines
Various sensors, medical electronics
Part numbering system
◆
◆
RG 1608 N - 102 - B - T5
Packaging quantity:
T5(5,000pcs), T10(10,000pcs)
Series code
Size: RG1005, RG1608, RG2012, RG3216
Temperature coefficient of resistance
Resistance tolerance
Nominal resistance value
(E-24: 3 digit, E-96: 4 digit, RG3216: all 4 digit)
Electrical Specification
Temperature
coefficient
of resistance
Power ratings
Low
Resistance range（Ω）Resistance tolerance（%）
Operating
Pakaging
quantity
Maximum
voltage
Resistance
value series
Type
temperature
Regular
High (ppm/°C
±0.1% (B)
±0.5%(D)
）
±0.05% (W)
±5（V）
±10（N）
±25（P）
±100（R）
±5（V）
100≦R＜3k
47≦R≦100k
47≦R≦150k
T5
75V
R G１００５ 1/32W 1/16W 1/8W
R G１６０８ 1/16W 1/10W 1/6W
T10
ー
10≦R＜47
ー
100≦R＜5.1k
47≦R≦274k
±10（N）
±25（P）
±50（Q）
±5（V）
100V
150V
200V
47≦R≦274k
ー
47≦R≦1M
10≦R＜47
ー
E-24, E-96 -55℃ ̃ 155℃
100≦R＜10.2k
47≦R≦475k
±10（N）
±25（P）
±50（Q）
±5（V）
T5
R G２０１２ 1/10W
1/8W
1/4W
1/4W
47≦R≦475k
ー
47≦R≦2.7M
10≦R＜47
ー
100≦R≦33.2k
±10（N）
±25（P）
±50（Q）
47≦R≦1M
R G３２１６
1/8W
ー
47≦R≦5.1M
ー
10≦R＜47
ー
Dimensions
◆
L
Size
(inch)
Type
L
W
a
b
t
RG1005
RG1608
RG2012
RG3216
0402 1.00＋0.1/－0.05
0.50±0.05
0.20±0.10
0.30±0.20
0.40±0.20
0.50±0.25
0.25±0.05
0.30±0.20
0.40±0.20
0.50±0.20
0.35±0.05
0.40±0.10
0.40±0.10
W
0603
0805
1206
1.60±0.20
2.00±0.20
3.20±0.20
0.80±0.20
1.25±0.20
1.60±0.20
a
0.40±0.10
t
（unit：mm）
b
15
Reliability specification
◆
Low
Regular
High
Typical
Test Items
Condition (test methods)
≦47Ω
≧47Ω
≦47Ω
≧47Ω
≦47Ω
≧47Ω
Low
1
*
Short time overload
Life (biased)
2.5 x rated voltage, 5 seconds
±0.10% ±0.05% ±0.10% ±0.05%
±0.25% ±0.10% ±0.50% ±0.25%
ー
±0.10% ±(0.01%)
±0.50% ±(0.01%)
1
*
70℃, rated voltage, 90min on 30min off, 1000hours
85℃, 85%RH, 1/10 of rated power,
90min on 30min off, 1000hours
ー
ー
High temperature
high humidity
±0.25% ±0.10% ±0.50% ±0.25%
±0.50% ±(0.05%)
Temperature shock
-55℃ (30min)～125℃ (30min) 1000cycles
155℃, no bias, 1000hours
±0.25% ±0.10% ±0.25% ±0.10%
±0.25% ±0.10% ±0.25% ±0.10%
ー
ー
ー
±0.10% ±(0.01%)
±0.10% ±(0.01%)
±0.1％ ±(0.01%)
High temperature
exposure
Resistance to
soldering heat
260±5℃, 10 seconds (reflow)
±0.1％
±0.1％
±0.1％
±0.1％
*1 Rated voltage is given by E= R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
10000 hour reliability test data
◆
Biased life test
High temperature high humidity (biased)
○
○
High temoperature life test (85℃)
High temperature high humidity bias (THB 85℃ 85％）
0.50
0.40
0.30
0.20
0.10
0.00
0.50
Sample : RG1608series
Sample
Test
:
RG1608series
0.40
0.30
0.20
0.10
0.00
Test
Temperature85℃
Temperature85℃ Humidity85％RH
conditions: Rated voltage 90 min. on/30min. off
conditions: 1/10 rated power 90min.on/30min. off
Rated power=0.1W
n=100
Rated power=0.1W
n=100
－0.10
－0.20
－0.30
－0.40
－0.50
－0.10
－0.20
－0.30
－0.40
－0.50
1kΩ
100kΩ
330kΩ
1kΩ
100kΩ
330kΩ
10kΩ
56kΩ
10kΩ
56kΩ
10
100
1000
3000
10000
10
100
1000
3000
10000
Test duration(h)
Test duration(h)
Temperature shock
High temperature exposure
○
○
High temperature exposure(155℃)
0.50
Temperature shock
0.50
Sample : RG1608series
Sample : RG1608series
Test Temperature155℃
conditions: n=100
0.40
0.30
0.20
0.10
0.00
0.40
Test
-55℃（30min）→room temp（. 3min）→
0.30
0.20
0.10
0.00
conditions: ＋125℃（30min）→room temp（. 3min）
n=50
－0.10
－0.20
－0.30
－0.40
－0.50
－0.10
－0.20
－0.30
－0.40
－0.50
1kΩ
100kΩ
330kΩ
10kΩ
56kΩ
56kΩ
100kΩ
10
100
1000
3000
10000
10
100
1000
10000
Test duration(h)
Number of cycles
Derating Curve
◆
◆
High power application
Regular power application
High precision
100
50
0
155
50
100
7085
-55
0
Ambient temperature (℃)
Maximum pulse power limit
100
Test procedure
Voltage pulse is applied to the test samples mounted
on the test board.
10
After each pulse, resistance drift is measured. Pulse
voltage is increased until the drift exceeds +/-0.5%.
The power at that voltage is defined as the
maximum pulse power.
1005 type
1608 type
2012 type
3216 type
1
0.1
0.0001
0.001
0.01
0.1
1
10
Pulse duration (seconds)
16
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