74ACT16373SSC_NL [FAIRCHILD]

Bus Driver, ACT Series, 2-Func, 8-Bit, True Output, CMOS, PDSO48, 0.300 INCH, LEAD FREE, MO-118, SSOP-48;
74ACT16373SSC_NL
型号: 74ACT16373SSC_NL
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Bus Driver, ACT Series, 2-Func, 8-Bit, True Output, CMOS, PDSO48, 0.300 INCH, LEAD FREE, MO-118, SSOP-48

驱动 光电二极管 逻辑集成电路
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August 1999  
Revised May 2005  
74ACT16373  
16-Bit Transparent Latch with 3-STATE Outputs  
General Description  
Features  
The ACT16373 contains sixteen non-inverting latches with  
3-STATE outputs and is intended for bus oriented applica-  
tions. The device is byte controlled. The flip-flops appear  
transparent to the data when the Latch Enable (LE) is  
HIGH. When LE is low, the data that meets the setup time  
is latched. Data appears on the bus when the Output  
Enable (OE) is LOW. When OE is HIGH, the outputs are in  
high Z state.  
Separate control logic for each byte  
16-bit version of the ACT373  
Outputs source/sink 24 mA  
TTL-compatible inputs  
Ordering Code:  
Order Number  
74ACT16373SSC  
74ACT16373MTD  
Package Number  
MS48A  
Package Description  
48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300" Wide  
48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide  
MTD48  
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.  
Logic Symbol  
Connection Diagram  
Pin Descriptions  
Pin Names  
Description  
OEn  
Output Enable Input (Active Low)  
LEn  
Latch Enable Input  
Inputs  
I0I15  
O0O15  
Outputs  
FACT is a trademark of Fairchild Semiconductor Corporation.  
© 2005 Fairchild Semiconductor Corporation  
DS500297  
www.fairchildsemi.com  
Functional Description  
Truth Tables  
The ACT16373 contains sixteen D-type latches with  
3-STATE standard outputs. The device is byte controlled  
with each byte functioning identically, but independent of  
the other. Control pins can be shorted together to obtain full  
16-bit operation. The following description applies to each  
byte. When the Latch Enable (LEn) input is HIGH, data on  
Inputs  
OE1  
Outputs  
O0–O7  
LE1  
I0–I7  
X
H
H
L
H
L
L
L
X
L
Z
L
H
the Dn enters the latches. In this condition the latches are  
H
X
transparent, i.e., a latch output will change states each time  
its D input changes. When LEn is LOW, the latches store  
(Previous)  
information that was present on the D inputs a setup time  
preceding the HIGH-to-LOW transition of LEn. The  
Inputs  
OE2  
Outputs  
O8–O15  
3-STATE standard outputs are controlled by the Output  
Enable (OEn) input. When OEn is LOW, the standard out-  
LE2  
I8–I15  
puts are in the 2-state mode. When OEn is HIGH, the stan-  
X
H
H
L
H
L
L
L
X
L
Z
dard outputs are in the high impedance mode but this does  
not interfere with entering new data into the latches.  
L
H
H
X
(Previous)  
H
L
X
Z
HIGH Voltage Level  
LOW Voltage Level  
Immaterial  
High Impedance  
Previous previous output prior to HIGH-to-LOW transition of LE  
Logic Diagrams  
www.fairchildsemi.com  
2
Absolute Maximum Ratings(Note 1)  
Recommended Operating  
Conditions  
Supply Voltage (VCC  
DC Input Diode Current (IIK  
VI 0.5V  
VI VCC 0.5V  
DC Output Diode Current (IOK  
VO 0.5V  
)
0.5V to 7.0V  
)
Supply Voltage (VCC  
)
4.5V to 5.5V  
0V to VCC  
20 mA  
20 mA  
Input Voltage (VI)  
Output Voltage (VO)  
0V to VCC  
)
Operating Temperature (TA)  
40 C to 85 C  
125 mV/ns  
20 mA  
20 mA  
Minimum Input Edge Rate ( V/ t)  
VO VCC 0.5V  
V
IN from 0.8V to 2.0V  
DC Output Voltage (VO)  
0.5V to VCC 0.5V  
50 mA  
VCC @ 4.5V, 5.5V  
DC Output Source/Sink Current (IO)  
DC VCC or Ground Current  
per Output Pin  
Note 1: Absolute maximum ratings are those values beyond which dam-  
age to the device may occur. The databook specifications should be met,  
without exception to ensure that the system design is reliable over its power  
supply, temperature, and output/input loading variables. Fairchild does not  
recommend operation of FACT circuits outside databook specifications.  
50 mA  
Junction Temperature  
140 C  
Storage Temperature  
65 C to 150 C  
DC Electrical Characteristics  
V
T
25 C  
T
A
40 C to 85 C  
Symbol  
Parameter  
Units  
Conditions  
CC  
A
(V)  
4.5  
5.5  
4.5  
5.5  
4.5  
5.5  
Typ  
1.5  
Guaranteed Limits  
V
V
V
Minimum HIGH  
2.0  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
V
0.1V  
IH  
OUT  
V
V
V
Input Voltage  
Maximum LOW  
Input Voltage  
Minimum HIGH  
Output Voltage  
1.5  
2.0  
0.8  
0.8  
4.4  
5.4  
or V  
0.1V  
0.1V  
0.1V  
CC  
1.5  
V
IL  
OUT  
1.5  
or V  
CC  
4.49  
5.49  
OH  
I
50  
A
OUT  
V
V
IL  
or V  
IN  
OH  
OH  
IH  
4.5  
5.5  
4.5  
5.5  
3.86  
4.86  
0.1  
3.76  
4.76  
0.1  
V
V
V
I
I
24 mA  
24 mA (Note 2)  
V
Maximum LOW  
Output Voltage  
0.001  
0.001  
OL  
I
50  
A
OUT  
0.1  
0.1  
V
V
or V  
IH  
IN  
OL  
OL  
IL  
4.5  
5.5  
0.36  
0.36  
0.44  
0.44  
I
I
24 mA  
24 mA (Note 2)  
I
I
Maximum 3-STATE  
Leakage Current  
Maximum Input  
V
V
V
, V  
IH  
OZ  
I
IL  
5.5  
5.5  
0.5  
0.1  
5.0  
1.0  
A
A
V
, GND  
O
CC  
IN  
V
V
V
, GND  
2.1V  
I
CC  
Leakage Current  
I
I
I
I
Maximum I /Input  
CC  
5.5  
5.5  
5.5  
0.6  
1.5  
80.0  
75  
mA  
A
V
V
V
V
CCT  
CC  
I
CC  
Max Quiescent Supply Current  
Minimum Dynamic  
8.0  
V
or GND  
IN  
CC  
mA  
mA  
1.65V Max  
3.85V Min  
OLD  
OHD  
OLD  
OHD  
Output Current (Note 3)  
75  
Note 2: All outputs loaded; thresholds associated with output under test.  
Note 3: Maximum test duration 2.0 ms; one output loaded at a time.  
3
www.fairchildsemi.com  
AC Electrical Characteristics  
V
T
25 C  
T
40 C to 85 C  
50 pF  
Min Max  
CC  
A
A
C
50 pF  
C
L
Symbol  
Parameter  
(V)  
(Note 4)  
5.0  
Units  
L
Min  
3.1  
2.6  
3.1  
2.8  
2.5  
2.7  
2.1  
2.0  
Typ  
Max  
7.9  
7.3  
7.9  
7.3  
7.4  
7.5  
7.9  
7.4  
t
Propagation Delay  
D to O  
n
5.3  
4.6  
5.4  
4.9  
4.7  
4.8  
5.1  
4.5  
3.1  
2.6  
3.2  
2.8  
2.5  
2.7  
2.1  
2.0  
8.4  
7.8  
8.4  
7.8  
7.9  
8.0  
8.2  
7.9  
PLH  
ns  
ns  
ns  
ns  
t
PHL  
n
t
Propagation Delay  
LE to O  
5.0  
5.0  
5.0  
PLH  
t
PHL  
n
t
Output Enable  
Delay  
PZH  
t
PZL  
t
Output Disable  
Delay  
PHZ  
t
PLZ  
Note 4: Voltage Range 5.0 is 5.0V 0.5V.  
AC Operating Requirements  
V
T
25 C  
T
A
40 C to 85 C  
50 pF  
CC  
A
C
50 pF  
C
Units  
Symbol  
Parameter  
(V)  
L
L
(Note 5)  
Guaranteed Minimum  
t
Setup Time, HIGH or  
S
5.0  
3.0  
1.5  
4.0  
3.0  
ns  
ns  
ns  
LOW, Input to Clock  
Hold time, HIGH or  
LOW, Input to Clock  
CS Pulse Width,  
HIGH or LOW  
t
t
H
W
5.0  
5.0  
1.5  
4.0  
Note 5: Voltage Range 5.0 is 5.0V 0.5V  
Capacitance  
Symbol  
Parameter  
Typ  
4.5  
30  
Units  
pF  
Conditions  
C
C
Input Capacitance  
V
V
5.0V  
5.0V  
IN  
CC  
CC  
Power Dissipation Capacitance  
pF  
PD  
www.fairchildsemi.com  
4
Physical Dimensions inches (millimeters) unless otherwise noted  
48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300" Wide  
Package Number MS48A  
5
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide  
Package Number MTD48  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
www.fairchildsemi.com  
6

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