74ACTQ04SC_NL [FAIRCHILD]
Inverter, ACT Series, 6-Func, 1-Input, CMOS, PDSO14, 0.150 INCH , LEAD FREE, MS-012, SOIC-14;
| 型号： | 74ACTQ04SC_NL |
| 厂家： | 
FAIRCHILD SEMICONDUCTOR |
| 描述： | Inverter, ACT Series, 6-Func, 1-Input, CMOS, PDSO14, 0.150 INCH , LEAD FREE, MS-012, SOIC-14 光电二极管 逻辑集成电路 |
| 文件： | 总9页 (文件大小：230K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
May 2007
74ACTQ04
tm
Quiet Series™ Hex Inverter
Features
General Description
■ I reduced by 50%
The ACTQ04 contains six inverters and utilizes Fairchild
Quiet Series™ technology to guarantee quiet output
switching and improved dynamic threshold performance.
FACT Quiet Series™ features GTO™ output control and
undershoot corrector in addition to a split ground bus for
superior ACMOS performance.
CC
■ Guaranteed simultaneous switching noise level and
dynamic threshold performance
■ Improved latch-up immunity
■ Outputs source/sink 24mA
■ Has TTL-compatible inputs
Ordering Information
Order
Number
Package
Number
Package Description
74ACTQ04SC
74ACTQ04SJ
74ACTQ04MTC
M14A
M14D
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
MTC14
14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm
Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering number.
Pb-Free package per JEDEC J-STD-020B.
Connection Diagram
Logic Symbol
IEEE/IEC
Pin Description
Pin Names
Description
A
Inputs
Outputs
n
O
n
FACT™, FACT Quiet Series™, and GTO™ are trademarks of Fairchild Semiconductor Corporation.
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Rating
V
I
Supply Voltage
–0.5V to +7.0V
CC
IK
DC Input Diode Current
V = –0.5V
–20mA
+20mA
I
V = V + 0.5V
I
CC
V
DC Input Voltage
–0.5V to V + 0.5V
I
CC
I
DC Output Diode Current
OK
V
= –0.5V
–20mA
+20mA
O
V
= V + 0.5V
O
CC
V
DC Output Voltage
DC Output Source or Sink Current
–0.5V to V + 0.5V
O
CC
I
50mA
50mA
O
I
or I
DC V or Ground Current per Output Pin
CC
GND
STG
CC
T
Storage Temperature
–65°C to +150°C
300mA
DC Latch-Up Source or Sink Current
Junction Temperature
T
140°C
J
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
Parameter
Rating
V
Supply Voltage
4.5V to 5.5V
CC
V
Input Voltage
0V to V
0V to V
I
CC
CC
V
Output Voltage
O
T
Operating Temperature
Minimum Input Edge Rate:
–40°C to +85°C
125mV/ns
A
∆V / ∆t
V
from 0.8V to 2.0V, V @ 4.5V, 5.5V
CC
IN
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
2
DC Electrical Characteristics
T = +25°C T = –40°C to +85°C
A
A
Symbol
Parameter
V
(V)
Conditions
Typ.
Guaranteed Limits
Units
CC
V
Minimum HIGH Level
Input Voltage
4.5
V
= 0.1V
CC
1.5
1.5
2.0
2.0
0.8
0.8
4.4
5.4
2.0
2.0
0.8
0.8
4.4
5.4
V
IH
OUT
or V – 0.1V
5.5
4.5
5.5
4.5
5.5
V
Maximum LOW Level
Input Voltage
V
= 0.1V
CC
1.5
V
V
IL
OUT
or V – 0.1V
1.5
V
Minimum HIGH Level
Output Voltage
I
= –50µA
OUT
4.49
5.49
OH
V
I
= V or V :
IN
IL
IH
4.5
5.5
4.5
5.5
= –24mA
3.86
4.86
3.76
4.76
0.1
OH
OH
(1)
I
I
= –24mA
= 50µA
V
Maximum LOW Level
Output Voltage
0.001 0.1
0.001 0.1
V
OL
OUT
0.1
V
I
= V or V :
IN
IL
IH
4.5
5.5
5.5
= 24mA
0.36
0.36
0.1
0.44
0.44
1.0
OL
OL
(1)
I
= 24mA
I
Maximum Input
Leakage Current
V = V , GND
µA
IN
I
CC
I
Maximum I /Input
5.5
5.5
5.5
5.5
V = V – 2.1V
0.6
1.5
75
mA
mA
mA
µA
CCT
CC
I
CC
I
Minimum Dynamic
V
V
V
= 1.65V Max.
OLD
OLD
OHD
(2)
Output Current
I
= 3.85V Min.
–75
20.0
OHD
I
Maximum Quiescent
Supply Current
= V or GND
2.0
1.5
–0.6 –1.2
CC
IN
CC
(3)
V
Quiet Output Maximum
5.0
5.0
5.0
5.0
Figures 1 & 2
1.1
V
V
V
V
OLP
Dynamic V
OL
(3)
V
Quiet Output Minimum
Dynamic V
Figures 1 & 2
OLV
OL
(4)
V
Minimum HIGH Level
Dynamic Input Voltage
1.9
1.2
2.2
0.8
IHD
(4)
V
Maximum LOW Level
Dynamic Input Voltage
ILD
Notes:
1. All outputs loaded; thresholds on input associated with output under test.
2. Maximum test duration 2.0ms, one output loaded at a time.
3. Max number of outputs defined as (n). Data inputs are 0V to 3V. One output @ GND.
4. Max number of data inputs (n) switching. (n–1) inputs switching 0V to 3V. Input-under-test switching:
3V to threshold (V ), 0V to threshold (V ), f = 1MHz.
ILD
IHD
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
3
AC Electrical Characteristics
T = +25°C,
T = –40°C to +85°C,
A
A
C = 50pF
C = 50pF
L
L
(5)
Symbol
Parameter
V
(V)
Min.
Typ. Max.
Min.
Max.
Units
CC
t
Propagation Delay,
Data to Output
5.0
2.0
6.5
6.5
0.5
7.5
7.5
1.0
2.0
8.0
ns
PLH
t
Propagation Delay,
Data to Output
5.0
5.0
2.0
2.0
8.0
1.0
ns
ns
PHL
(6)
t
, t
Output to Output Skew
OSHL OSLH
Notes:
5. Voltage range 5.0 is 5.0V 0.5V.
6. Skew is defined as the absolute value of the difference between the actual propagation delay for any two
separate outputs of the same device. The specification applies to any outputs switching in the same direction,
either HIGH-to-LOW (t
) or LOW-to-HIGH (t
). Parameter guaranteed by design.
OSHL
OSLH
Capacitance
Symbol
Parameter
Conditions
Typ.
4.5
Units
pF
C
C
Input Capacitance
V
V
= OPEN
= 5.0V
IN
CC
Power Dissipation Capacitance
74
pF
PD
CC
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
4
FACT™ Noise Characteristics
The setup of a noise characteristics measurement is
critical to the accuracy and repeatability of the tests. The
following is a brief description of the setup used to
measure the noise characteristics of FACT.
V
/V
and V
/V
:
OLP OLV
OHP OHV
■ Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually
be the furthest from the ground pin. Monitor the output
voltages using a 50Ω coaxial cable plugged into a
standard SMB type connector on the test fixture.
Do not use an active FET probe.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
■ Measure V
and V
on the quiet output during
OLP
OLV
worst case transition for active and enable. Measure
and V on the quiet output during the worst
case active and enable transition.
Tektronics Model 7854 Oscilloscope
V
OHP
OHV
Procedure:
1. Verify Test Fixture Loading: Standard Load 50pF,
■ Verify that the GND reference recorded on the
oscilloscope has not drifted to ensure the accuracy
and repeatability of the measurements.
500Ω.
2. Deskew the HFS generator so that no two channels
have greater than 150ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
V
and V
:
ILD
IHD
■ Monitor one of the switching outputs using a 50Ω
coaxial cable plugged into a standard SMB type
connector on the test fixture. Do not use an active
FET probe.
3. Terminate all inputs and outputs to ensure proper
loading of the outputs and that the input levels are at
the correct voltage.
■ First increase the input LOW voltage level, V , until
IL
the output begins to oscillator steps out a min of 2ns.
Oscillation is defined as noise on the output LOW
4. Set the HFS generator to toggle all but one output at
a frequency of 1MHz. Greater frequencies will
increase DUT heating and effect the results of the
measurement.
level that exceeds V limits, or on output HIGH levels
IL
that exceed V limits. The input LOW voltage level at
IH
which oscillation occurs is defined as V
.
ILD
■ Next decrease the input HIGH voltage level, V , until
IH
the output begins to oscillate or steps out a min of 2ns.
Oscillation is defined as noise on the output LOW
level that exceeds V limits, or on output HIGH levels
IL
that exceed V limits. The input HIGH voltage level at
IH
which oscillation occurs is defined as V
.
IHD
■ Verify that the GND reference recorded on the
oscilloscope has not drifted to ensure the accuracy
and repeatability of the measurements.
Notes:
7. V
and V
are measured with respect to ground
OHV
OLP
reference.
8. Input pulses have the following characteristics:
f = 1MHz, t = 3ns, t = 3ns, skew < 150ps.
r
f
Figure 1. Quiet Output Noise Voltage Waveforms
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
Figure 2. Simultaneous Switching Test Circuit
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
5
Physical Dimensions
Dimensions are in inches (millimeters) unless otherwise noted.
Figure 3. 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
6
Physical Dimensions (Continued)
Dimensions are in millimeters unless otherwise noted.
Figure 4. 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
7
Physical Dimensions (Continued)
Dimensions are in millimeters unless otherwise noted.
Figure 5. 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Package Number MTC14
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
8
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an
exhaustive list of all such trademarks.
ACEx®
i-Lo™
Power-SPM™
PowerTrench®
Programmable Active Droop™
QFET®
TinyBoost™
TinyBuck™
TinyLogic®
TINYOPTO™
TinyPower™
TinyWire™
TruTranslation™
µSerDes™
UHC®
Across the board. Around the world.™
ActiveArray™
Bottomless™
Build it Now™
CoolFET™
CROSSVOLT™
CTL™
Current Transfer Logic™
ImpliedDisconnect™
IntelliMAX™
ISOPLANAR™
MICROCOUPLER™
MicroPak™
MICROWIRE™
Motion-SPM™
MSX™
QS™
QT Optoelectronics™
Quiet Series™
RapidConfigure™
RapidConnect™
ScalarPump™
SMART START™
SPM®
STEALTH™
SuperFET™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
SyncFET™
DOME™
UniFET™
VCX™
Wire™
MSXPro™
OCX™
E2CMOS™
EcoSPARK®
EnSigna™
OCXPro™
OPTOLOGIC®
OPTOPLANAR®
PACMAN™
PDP-SPM™
POP™
FACT Quiet Series™
FACT®
FAST®
FASTr™
Power220®
FPS™
FRFET®
Power247®
TCM™
PowerEdge™
PowerSaver™
The Power Franchise®
™
GlobalOptoisolator™
GTO™
HiSeC™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems 2. A critical component in any component of a life support,
which, (a) are intended for surgical implant into the body or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
device, or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In Design
This datasheet contains the design specifications for product
development. Specifications may change in any manner without notice.
Preliminary
First Production
Full Production
Not In Production
This datasheet contains preliminary data; supplementary data will be
published at a later date. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve design.
No Identification Needed
Obsolete
This datasheet contains final specifications. Fairchild Semiconductor
reserves the right to make changes at any time without notice to improve
design.
This datasheet contains specifications on a product that has been
discontinued by Fairchild Semiconductor. The datasheet is printed for
reference information only.
Rev. I26
©1990 Fairchild Semiconductor Corporation
74ACTQ04 Rev. 1.4
www.fairchildsemi.com
9
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