74F794PC [FAIRCHILD]
8-Bit Register with Readback; 8位寄存器回读型号: | 74F794PC |
厂家: | FAIRCHILD SEMICONDUCTOR |
描述: | 8-Bit Register with Readback |
文件: | 总6页 (文件大小:53K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
March 1990
Revised August 1999
74F794
8-Bit Register with Readback
General Description
Features
The 74F794 is an 8-bit register with readback capability
designed to store data as well as read the register informa-
tion back onto the data bus. The I/O bus (D bus) has 3-
STATE outputs. Current sinking capability is 64 mA on both
the D and Q busses.
■ 3-STATE outputs on the I/O port
■ D and Q output sink capability of 64 mA
■ Functionally and pin equivalent to the 74LS794
Data is loaded into the registers on the LOW-to-HIGH tran-
sition of the clock (CP). The output enable (OE) is used to
enable data on D0–D7. When OE is LOW, the output of the
registers is enabled on D0–D7, enabling D as an output
bus. When OE is HIGH, D0–D7 are inputs to the registers
configuring D as an input bus.
Ordering Code:
Order Number
74F794SC
Package Number
M20B
Package Description
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
74F794PC
N20A
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol
Connection Diagram
© 1999 Fairchild Semiconductor Corporation
DS010652
www.fairchildsemi.com
Input Loading/Fan-Out
HIGH/LOW
Current
Pin Names
Description
(U.L.)
Output Enable Input
1.0/1.0
20 µA/−0.6 mA
OE
CP
Clock Pulse Inputs
D Bus Inputs/
1.0/1.0
20 µA/−0.6 mA
70 µA/−650 µA
−15 mA/64 mA
−15 mA/64 mA
D0–D7
3.5/1.083
750/106.6
750/106.6
3-STATE Outputs
Q Bus Outputs
Q0–Q7
Truth Table
Logic Diagram
Inputs
CP
Outputs
OE
L
Q
Qn
Qn
Qn
D
D
L or H or ↓
Output, Q
L or H or ↓
H
Input
↑
↑
L
Output, Q (Note 1)
Input
H
Note 1: In this case the output of the register is clocked to the inputs and
the overall Q output is unchanged at Q .
n
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2
Absolute Maximum Ratings(Note 2)
Recommended Operating
Conditions
−65°C to + 150°C
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
−55° to +125°C
−55°C to +150°C
−0.5V to +7.0V
−0.5V to +7.0V
−30 mA to +5.0 mA
4000V
Free Air Ambient Temperature
Supply Voltage
0°C to 70°C
+4.5V to +5.5V
V
CC Pin Potential to Ground Pin
Input Voltage (Note 3)
Input Current (Note 3)
ESD Last Passing Voltage (Min)
Voltage Applied to Output
In HIGH State (with VCC = 0V)
Standard Output
Note 2: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 3: In this case the output of the register is clocked to the inputs and
the overall Q output is unchanged at Q .
n
Current Applied to Output
in LOW State (Max)
Note 4: Either voltage limit or current limit is sufficient to protect inputs.
Twice the Rated IOL (mA)
DC Electrical Characteristics over Operating Temperature Range unless otherwise specified
V
Symbol
Parameter
Input HIGH Voltage
Min
Typ
Max
Units
Conditions
CC
V
V
V
2.0
V
V
Recognized as a HIGH Signal
Recognized as a LOW Signal
IH
Input LOW Voltage
Input Clamp
Diode Voltage
Output HIGH
Voltage
0.8
IL
CD
−1.2
V
V
Min
Min
Min
Max
I
= −18 mA
IN
V
2.4
2.0
2.8
I
I
= −3 mA
OH
OL
OH
OH
2.44
= −15 mA
V
Output LOW
Voltage
0.45
0.55
5.0
V
I
= 64 mA
= 2.7V
OL
I
Input HIGH
Current
IH
µA
V
IN
I
Input HIGH Current
Breakdown Test
Input HIGH Current
Breakdown (I/O)
Output HIGH
Leakage Current
Input Leakage
Test
BVI
7.0
0.5
50
µA
mA
µA
V
Max
Max
Max
0.0
V
V
V
= 7.0V (OE, CP)
IN
I
BVIT
= 5.5V (D )
IN
n
I
CEX
= V
OUT
CC
V
I
= 1.9 µA
ID
ID
4.75
All Other Pins Grounded
V = 150 mV
IOD
I
Output Leakage
Circuit Current
Input LOW
OD
3.75
−0.6
−225
70
µA
mA
mA
µA
µA
V
0.0
All Other Pins Grounded
V = 0.5V
IN
I
IL
Max
Max
Max
Max
0.0
Current
(OE, CP)
I
Output Short-
OS
−100
V
V
= 0V
OUT
Circuit Current
I
+
Output Leakage Current
= 2.7V
IH
OUT
I
(Dn)
OZH
I
+
Output Leakage
Current
V
= 0.5V
OUT
IL
−650
I
(Dn)
I = 1.9 µA
ID
OZL
V
Input Leakage
ID
4.75
Test
All Other Pins Grounded
V = 150 mV
IOD
I
Output Circuit
OD
3.75
µA
0.0
Leakage Current
Bus Drainage Test
Power Supply Current
Power Supply Current
Power Supply Current
All Other Pins Grounded
I
100
65
µA
mA
mA
mA
0.0
V
V
V
V
= 5.25V
OUT
ZZ
I
Max
Max
Max
= HIGH
CCH
O
O
O
I
80
= LOW
= HIGH Z
CCL
I
80
CCZ
3
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AC Electrical Characteristics
T
= +25°C
T = 0°C to +70°C
A
A
V
= +5.0V
= 50 pF
Typ
V
= +5.0V
C = 50 pF
L
CC
CC
Symbol
Parameter
Units
C
L
Min
90
Max
Min
90
Max
f
Maximum Clock Frequency
Propagation Delay
CP to Q
MHz
ns
MAX
t
2.5
2.5
2.3
2.0
1.0
1.0
4.0
4.0
1.5
1.5
5.8
5.8
7.0
8.0
8.5
10.0
7.0
7.0
2.5
2.5
2.0
2.0
1.0
1.0
4.0
4.0
1.5
1.5
5.8
5.8
8.0
9.0
PLH
t
PHL
n
t
Output Enable Time
9.0
PZH
ns
ns
ns
ns
ns
t
10.5
8.0
PZL
t
Output Disable Time
PHZ
t
8.0
PLZ
t (H)
Setup Time, HIGH or LOW
Bus to Clock
S
t (L)
S
t
(H)
(L)
Hold Time, HIGH or LOW
Bus to Clock
H
t
H
t
(H
Clock Pulse Width
HIGH or LOW
W
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4
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
5
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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6
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