74LCXZ16245MTD [FAIRCHILD]

Low Voltage 16-Bit Bidirectional Transceiver with 5V Tolerant Inputs and Outputs; 低电压16位双向收发器,具有5V容限输入和输出
74LCXZ16245MTD
型号: 74LCXZ16245MTD
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Low Voltage 16-Bit Bidirectional Transceiver with 5V Tolerant Inputs and Outputs
低电压16位双向收发器,具有5V容限输入和输出

总线驱动器 总线收发器 逻辑集成电路 光电二极管
文件: 总8页 (文件大小:94K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
March 2002  
Revised March 2002  
74LCXZ16245  
Low Voltage 16-Bit Bidirectional Transceiver  
with 5V Tolerant Inputs and Outputs  
General Description  
Features  
5V tolerant inputs and outputs  
The LCXZ16245 contains sixteen non-inverting bidirec-  
tional buffers with 3-STATE outputs and is intended for bus  
oriented applications. The device is designed for low volt-  
age (2.7V or 3.3V) VCC applications with capability of inter-  
2.7V–3.6V VCC specifications provided  
4.5 ns tPD max (VCC = 3.3V), 20 µA ICC max  
Power-down high impedance inputs and outputs  
Supports live insertion/withdrawal (Note 1)  
±24 mA output drive (VCC = 3.0V)  
facing to a 5V signal environment. The device is byte  
controlled. Each byte has separate control inputs which  
could be shorted together for full 16-bit operation. The T/R  
inputs determine the direction of data flow through the  
device. The OE inputs disable both the A and B ports by  
placing them in a high impedance state.  
Implements patented noise/EMI reduction circuitry  
Latch-up performance conforms to the requirements of  
JESD78  
When VCC is between 0V and 1.5V, the LCXZ16245 is on  
ESD performance:  
the high impedance state during power-up or power-down.  
This places the outputs in the high impedance (Z) state  
preventing intermittent low impedance loading or glitching  
in bus oriented applications.  
Human body model > 2000V  
Machine model > 200V  
Also packaged in plastic Fine-Pitch Ball Grid Array  
(FBGA) (Preliminary)  
The LCXZ16245 is fabricated with an advanced CMOS  
technology to achieve high speed operation while maintain-  
ing CMOS low power dissipation.  
Note 1: To ensure the high-impedance state during power up or down, OE  
should be tied to VCC through a pull-up resistor: the minimum value or the  
resistor is determined by the current-sourcing capability of the driver.  
Ordering Code:  
Order Number  
Package Number  
Package Description  
74LCXZ16245GX  
(Note 2)  
BGA54A  
(Preliminary)  
54-Ball Fine-Pitch Ball Grid Array (FBGA), JEDEC MO-205, 5.5mm Wide  
[TAPE and REEL]  
74LCXZ16245MTD  
MTD48  
48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide  
Devices also available in Tape and Reel. Specify by appending the suffix letter Xto the ordering code.  
Note 2: BGA package available in Tape and Reel only.  
Logic Symbol  
© 2002 Fairchild Semiconductor Corporation  
DS500580  
www.fairchildsemi.com  
Connection Diagrams  
Pin Descriptions  
Pin Names  
Description  
Output Enable Input  
Transmit/Receive Input  
Pin Assignment for SSOP and TSSOP  
OEn  
T/Rn  
A0A15  
B0B15  
NC  
Side A Inputs or 3-STATE Outputs  
Side B Inputs or 3-STATE Outputs  
No Connect  
FBGA Pin Assignments  
1
2
3
4
5
6
A
B
C
H
E
F
B0  
B2  
NC  
B1  
T/R1  
NC  
OE1  
NC  
NC  
A1  
A0  
A2  
B4  
B3  
VCC  
GND  
GND  
GND  
VCC  
NC  
VCC  
GND  
GND  
GND  
VCC  
NC  
A3  
A4  
B6  
B5  
A5  
A6  
B8  
B7  
A7  
A8  
B10  
B12  
B14  
B9  
A9  
A10  
A12  
A14  
G
H
B11  
B13  
A11  
A13  
J
B15  
NC  
T/R2  
OE2  
NC  
A15  
Truth Tables  
Inputs  
Outputs  
OE1  
T/R1  
L
L
L
H
X
Bus B0B7 Data to Bus A0A7  
Bus A0A7 Data to Bus B0B7  
HIGH Z State on A0A7, B0B7  
H
Inputs  
Outputs  
Pin Assignment for FBGA  
OE2  
T/R2  
L
L
L
H
X
Bus B8B15 Data to Bus A8A15  
Bus A8A15 Data to Bus B8B15  
H
HIGH Z State on A8A15, B8B15  
H = HIGH Voltage Level  
L = LOW Voltage Level  
X = Immaterial  
Z = High Impedance  
Logic Diagram  
(Top Thru View)  
www.fairchildsemi.com  
2
Absolute Maximum Ratings(Note 3)  
Symbol  
VCC  
Parameter  
Supply Voltage  
Value  
Conditions  
Units  
0.5 to +7.0  
0.5 to +7.0  
0.5 to +7.0  
V
V
VI  
DC Input Voltage  
VO  
DC Output Voltage  
Output in 3-STATE  
V
0.5 to VCC + 0.5 Output in HIGH or LOW State (Note 4)  
IIK  
DC Input Diode Current  
DC Output Diode Current  
50  
50  
VI < GND  
mA  
mA  
IOK  
V
V
O < GND  
O > VCC  
+50  
IO  
DC Output Source/Sink Current  
DC Supply Current per Supply Pin  
DC Ground Current per Ground Pin  
Storage Temperature  
±50  
mA  
mA  
mA  
°C  
ICC  
±100  
IGND  
TSTG  
±100  
65 to +150  
Recommended Operating Conditions (Note 5)  
Symbol  
VCC  
Parameter  
Min  
2.7  
0
Max  
3.6  
5.5  
VCC  
5.5  
±24  
±12  
85  
Units  
Supply Voltage  
Input Voltage  
Output Voltage  
Operating  
V
V
VI  
VO  
HIGH or LOW State  
3-STATE  
0
V
0
IOH/IOL  
Output Current  
V
V
CC = 3.0V 3.6V  
CC = 2.7V 3.0V  
mA  
TA  
Free-Air Operating Temperature  
40  
°C  
t/V  
Input Edge Rate, VIN = 0.8V2.0V, VCC = 3.0V  
0
10  
ns/V  
Note 3: The Absolute Maximum Ratings are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated  
at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the Absolute Maximum Ratings. The Recom-  
mended Operating Conditionstable will define the conditions for actual device operation.  
Note 4: IO Absolute Maximum Rating must be observed.  
Note 5: Unused inputs or I/O's must be held HIGH or LOW. They may not float.  
DC Electrical Characteristics  
VCC  
TA = −40°C to +85°C  
Symbol  
Parameter  
Conditions  
Units  
(V)  
2.7 3.6  
2.7 3.6  
2.7 3.6  
2.7  
Min  
Max  
VIH  
HIGH Level Input Voltage  
LOW Level Input Voltage  
HIGH Level Output Voltage  
2.0  
V
V
VIL  
0.8  
VOH  
I
I
I
I
I
I
I
I
OH = −100 µA  
OH = −12 mA  
OH = −18 mA  
OH = −24 mA  
OL = 100 µA  
OL = 12 mA  
OL = 16 mA  
OL = 24 mA  
VCC 0.2  
2.2  
V
V
3.0  
2.4  
3.0  
2.2  
VOL  
LOW Level Output Voltage  
2.7 3.6  
2.7  
0.2  
0.4  
3.0  
0.4  
3.0  
0.55  
±5.0  
±5.0  
II  
Input Leakage Current  
3-STATE I/O Leakage  
0 VI 5.5V  
0 VO 5.5V  
VI = VIH or VIL  
2.7 3.6  
2.7 3.6  
µA  
µA  
µA  
µA  
IOZ  
IOFF  
Power-Off Leakage Current  
Power-Up/Power-Down  
3-STATE Output Current  
Quiescent Supply Current  
VI or VO = 5.5V  
O = 0.5V to VCC  
0
10  
IPU/PD  
V
0 - 1.5  
±5.0  
VI = VCC or GND  
ICC  
VI = VCC or GND  
2.73.6  
2.73.6  
2.73.6  
225  
±225  
500  
µA  
µA  
3.6V VI, VO 5.5V (Note 6)  
ICC  
Increase in ICC per Input  
VIH = VCC 0.6V  
Note 6: Outputs disabled or 3-STATE only.  
3
www.fairchildsemi.com  
AC Electrical Characteristics  
T
A = −40°C to +85°C, RL = 500Ω  
CC = 3.3V ± 0.3V CC = 2.7V  
L = 50 pF L = 50 pF  
V
V
Symbol  
Parameter  
Units  
C
C
Min  
1.0  
1.0  
1.0  
1.0  
1.0  
1.0  
Max  
4.5  
4.5  
6.5  
6.5  
6.4  
6.4  
1.0  
1.0  
Min  
1.0  
1.0  
1.0  
1.0  
1.0  
1.0  
Max  
5.2  
5.2  
7.2  
7.2  
6.9  
6.9  
tPHL  
tPLH  
tPZL  
tPZH  
tPLZ  
Propagation Delay  
ns  
ns  
ns  
ns  
An to Bn or Bn to An  
Output Enable Time  
Output Disable Time  
tPHZ  
tOSHL  
tOSLH  
Output to Output Skew (Note 7)  
Note 7: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The  
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.  
Dynamic Switching Characteristics  
VCC  
TA = 25°C  
Symbol  
Parameter  
Conditions  
Units  
(V)  
3.3  
3.3  
Typical  
0.8  
VOLP  
VOLV  
Quiet Output Dynamic Peak VOL  
Quiet Output Dynamic Valley VOL  
C
L = 50 pF, VIH = 3.3V, VIL = 0V  
L = 50 pF, VIH = 3.3V, VIL = 0V  
V
V
C
0.8  
Capacitance  
Symbol  
Parameter  
Conditions  
CC = Open, VI = 0V or VCC  
Typical  
Units  
pF  
CIN  
Input Capacitance  
Input/Output Capacitance  
Power Dissipation Capacitance  
V
V
V
7
8
CI/O  
CPD  
CC = 3.3V, VI = 0V or VCC  
pF  
CC = 3.3V, VI = 0V or VCC, f = 10 MHz  
20  
pF  
www.fairchildsemi.com  
4
AC LOADING and WAVEFORMS Generic for LCX Family  
FIGURE 1. AC Test Circuit (CL includes probe and jig capacitance)  
Test  
tPLH, tPHL  
PZL, tPLZ  
Switch  
Open  
t
6V at VCC = 3.3 ± 0.3V, and 2.7V  
tPZH, tPHZ  
GND  
3-STATE Output High Enable and  
Waveform for Inverting and Non-Inverting Functions  
Disable Times for Logic  
Setup Time, Hold Time and Recovery Time for Logic  
Propagation Delay. Pulse Width and trec Waveforms  
trise and tfall  
3-STATE Output Low Enable and  
Disable Times for Logic  
FIGURE 2. Waveforms  
(Input Characteristics; f =1MHz, tr = tf = 3ns)  
VCC  
Symbol  
3.3V ± 0.3V  
1.5V  
2.7V  
1.5V  
Vmi  
Vmo  
Vx  
1.5V  
1.5V  
V
OL + 0.3V  
V
OL + 0.3V  
Vy  
V
OH 0.3V  
VOH 0.3V  
5
www.fairchildsemi.com  
Schematic Diagram Generic for LCX Family  
www.fairchildsemi.com  
6
Physical Dimensions inches (millimeters) unless otherwise noted  
54-Ball Fine-Pitch Ball Grid Array (FBGA), JEDEC MO-205, 5.5mm Wide  
Package Number BGA54A  
Preliminary  
7
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide  
Package Number MTD48  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
www.fairchildsemi.com  
8

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