FAN3100CSX [FAIRCHILD]

Single 2A High-Speed, Low-Side Gate Driver; 单2A高速,低侧栅极驱动器
FAN3100CSX
型号: FAN3100CSX
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Single 2A High-Speed, Low-Side Gate Driver
单2A高速,低侧栅极驱动器

驱动器 MOSFET驱动器 栅极 驱动程序和接口 接口集成电路 光电二极管 栅极驱动 PC
文件: 总21页 (文件大小:1446K)
中文:  中文翻译
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January 2009  
FAN3100  
Single 2A High-Speed, Low-Side Gate Driver  
Features  
Description  
The FAN3100 2A gate driver is designed to drive an N-  
channel enhancement-mode MOSFET in low-side  
switching applications by providing high peak current  
pulses during the short switching intervals. The driver is  
available with either TTL (FAN3100T) or CMOS  
(FAN3100C) input thresholds. Internal circuitry provides  
an under-voltage lockout function by holding the output  
low until the supply voltage is within the operating  
range. The FAN3100 delivers fast MOSFET switching  
performance, which helps maximize efficiency in high-  
frequency power converter designs.  
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3A Peak Sink/Source at VDD = 12V  
4.5 to 18V Operating Range  
2.5A Sink / 1.8A Source at VOUT = 6V  
Dual-Logic Inputs Allow Configuration as  
Non-Inverting or Inverting with Enable Function  
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Internal Resistors Turn Driver Off If No Inputs  
13ns Typical Rise Time and 9ns Typical Fall-Time  
with 1nF Load  
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Choice of TTL or CMOS Input Thresholds  
MillerDrive™ Technology  
FAN3100 drivers incorporate MillerDrive™ architecture  
for the final output stage. This bipolar-MOSFET  
combination provides high peak current during the  
Miller plateau stage of the MOSFET turn-on / turn-off  
process to minimize switching loss, while providing rail-  
to-rail voltage swing and reverse current capability.  
Typical Propagation Delay Time Under 20ns with  
Input Falling or Rising  
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6-Lead 2x2mm MLP or 5-Pin SOT23 Packages  
Rated from –40°C to 125°C Ambient  
The FAN3100 also offers dual inputs that can be  
configured to operate in non-inverting or inverting mode  
and allow implementation of an enable function. If one  
or both inputs are left unconnected, internal resistors  
bias the inputs such that the output is pulled low to hold  
the power MOSFET off.  
Applications  
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Switch-Mode Power Supplies  
High-Efficiency MOSFET Switching  
Synchronous Rectifier Circuits  
DC-to-DC Converters  
The FAN3100 is available in a lead-free finish 2x2mm  
6-lead Molded Leadless Package (MLP), for smallest  
size with excellent thermal performance, or industry-  
standard 5-pin SOT23.  
Motor Control  
Functional Pin Configurations  
Figure 1. 2x2mm 6-Lead MLP (Top View)  
Figure 2. SOT23-5 (Top View)  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
Ordering Information  
Input  
Part Number  
Package  
Packing Method Quantity / Reel  
Eco Status  
Threshold  
FAN3100CMPX  
FAN3100CSX  
FAN3100TMPX  
FAN3100TSX  
CMOS  
CMOS  
TTL  
Green  
RoHS  
Green  
RoHS  
6-Lead 2x2mm MLP  
5-Pin SOT23  
Tape & Reel  
Tape & Reel  
Tape & Reel  
Tape & Reel  
3000  
3000  
3000  
3000  
6-Lead 2x2mm MLP  
5-Pin SOT23  
TTL  
For Fairchild’s definition of “green” Eco Status, please visit: http://www.fairchildsemi.com/company/green/rohs_green.html.  
Package Outlines  
IN+ 1  
AGND 2  
VDD 3  
6 IN  
5 PGND  
4 OUT  
Figure 3. 2x2mm 6-Lead MLP (Top View)  
Figure 4. SOT23-5 (Top View)  
Thermal Characteristics(1)  
(2)  
(3)  
(4)  
(5)  
(6)  
Package  
Units  
ΘJL  
ΘJT  
ΘJA  
ΨJB  
ΨJT  
6-Lead 2x2mm Molded Leadless Package (MLP)  
2.7  
56  
133  
99  
58  
2.8  
51  
42  
5
°C/W  
°C/W  
SOT23-5  
157  
Notes:  
1. Estimates derived from thermal simulation; actual values depend on the application.  
2. Theta_JL (ΘJL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads (including any  
thermal pad) that are typically soldered to a PCB.  
3. Theta_JT (ΘJT): Thermal resistance between the semiconductor junction and the top surface of the package, assuming it is  
held at a uniform temperature by a top-side heatsink.  
4. Theta_JA (ΘJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking, and airflow.  
The value given is for natural convection with no heatsink, as specified in JEDEC standards JESD51-2, JESD51-5, and  
JESD51-7, as appropriate.  
5. Psi_JB (ΨJB): Thermal characterization parameter providing correlation between semiconductor junction temperature and an  
application circuit board reference point for the thermal environment defined in Note 4. For the MLP-6 package, the board  
reference is defined as the PCB copper connected to the thermal pad and protruding from either end of the package. For the  
SOT23-5 package, the board reference is defined as the PCB copper adjacent to pin 2.  
6. Psi_JT (ΨJT): Thermal characterization parameter providing correlation between the semiconductor junction temperature and  
the center of the top of the package for the thermal environment defined in Note 4.  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
2
Pin Definitions  
SOT23 MLP  
Pin # Pin #  
Name  
VDD  
Pin Description  
Supply Voltage. Provides power to the IC.  
1
3
2
AGND Analog ground for input signals (MLP only). Connect to PGND underneath the IC.  
GND Ground (SOT-23 only). Common ground reference for input and output circuits.  
2
3
4
1
6
IN+  
IN-  
Non-Inverting Input. Connect to VDD to enable output.  
Inverting Input. Connect to AGND or PGND to enable output.  
Gate Drive Output: Held low unless required inputs are present and VDD is above  
UVLO threshold.  
5
4
Pad  
5
OUT  
P1  
Thermal Pad (MLP only). Exposed metal on the bottom of the package which is  
electrically connected to pin 5.  
Power Ground (MLP only). For output drive circuit; separates switching noise from  
inputs.  
PGND  
Output Logic  
IN+  
0(7)  
0(7)  
1
IN  
OUT  
0
0
0
1
0
1(7)  
0
1(7)  
1
Note:  
7. Default input signal if no external connection is made.  
© 2007 Fairchild Semiconductor Corporation  
www.fairchildsemi.com  
FAN3100 • Rev. 1.0.2  
3
Block Diagrams  
Figure 5. Simplified Block Diagram (SOT23 Pin-out)  
Figure 6. Simplified Block Diagram (MLP Pin-out)  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
4
Absolute Maximum Ratings  
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device  
reliability. The absolute maximum ratings are stress ratings only.  
Symbol  
VDD  
Parameter  
Min.  
Max.  
Unit  
V
VDD to PGND  
-0.3  
20.0  
VIN  
Voltage on IN+ and IN- to GND, AGND, or PGND  
Voltage on OUT to GND, AGND, or PGND  
Lead Soldering Temperature (10 seconds)  
Junction Temperature  
GND - 0.3 VDD + 0.3  
GND - 0.3 VDD + 0.3  
+260  
V
VOUT  
TL  
V
ºC  
ºC  
ºC  
kV  
V
TJ  
-55  
-65  
4
+150  
+150  
TSTG  
Storage Temperature  
Human Body Model, JEDEC JESD22-A114  
Charged Device Model, JEDEC JESD22-C101  
Electrostatic Discharge  
Protection Level  
ESD  
750  
Recommended Operating Conditions  
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended  
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not  
recommend exceeding them or designing to Absolute Maximum Ratings.  
Symbol  
VDD  
Parameter  
Min.  
4.5  
0
Max.  
18.0  
VDD  
Unit  
V
Supply Voltage Range  
Input Voltage IN+, IN-  
VIN  
V
TA  
Operating Ambient Temperature  
-40  
+125  
ºC  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
5
Electrical Characteristics  
Unless otherwise noted, VDD = 12V, TJ = -40°C to +125°C. Currents are defined as positive into the device and  
negative out of the device.  
Symbol  
Supply  
VDD  
Parameter  
Conditions  
Min. Typ. Max. Unit  
Operating Range  
4.5  
18.0  
0.35  
0.8  
V
mA  
mA  
V
FAN3100C(8)  
0.20  
0.5  
3.9  
Supply Current  
Inputs/EN Not Connected  
IDD  
FAN3100T  
VON  
Turn-On Voltage  
Turn-Off Voltage  
3.5  
3.3  
4.3  
VOFF  
3.7  
4.1  
V
Inputs (FAN3100T)  
VINL_T  
VINH_T  
IIN+  
IN+, IN- Logic Low Voltage, Maximum  
0.8  
V
V
IN+, IN- Logic High Voltage, Minimum  
Non-inverting Input  
2.0  
175  
1
IN from 0 to VDD  
IN from 0 to VDD  
-1  
µA  
µA  
V
IIN-  
Inverting Input  
-175  
0.2  
VHYS  
IN+, IN- Logic Hysteresis Voltage  
0.4  
0.8  
Inputs (FAN3100C)  
VINL_C  
VINH_C  
IINL  
IN+, IN- Logic Low Voltage  
30  
%VDD  
%VDD  
µA  
IN+, IN- Logic High Voltage  
IN Current, Low  
70  
175  
1
IN from 0 to VDD  
IN from 0 to VDD  
-1  
IINH  
IN Current, High  
-175  
µA  
VHYS_C  
Output  
IN+, IN- Logic Hysteresis Voltage  
17  
%VDD  
OUT at VDD/2,  
ISINK  
OUT Current, Mid-Voltage, Sinking(9)  
2.5  
A
A
CLOAD = 0.1µF, f = 1kHz  
OUT at VDD/2,  
ISOURCE  
IPK_SINK  
OUT Current, Mid-Voltage, Sourcing(9)  
OUT Current, Peak, Sinking(9)  
-1.8  
CLOAD = 0.1µF, f = 1kHz  
CLOAD = 0.1µF, f = 1kHz  
CLOAD = 0.1µF, f = 1kHz  
CLOAD = 1000pF  
3
-3  
A
A
IPK_SOURCE OUT Current, Peak, Sourcing(9)  
tRISE  
tFALL  
Output Rise Time(10)  
Output Fall Time(10)  
Output Prop. Delay, CMOS Inputs(10)  
Output Prop. Delay, TTL Inputs(10)  
Output Reverse Current Withstand(9)  
13  
9
20  
14  
28  
30  
ns  
ns  
ns  
ns  
mA  
CLOAD = 1000pF  
tD1, tD2  
tD1, tD2  
IRVS  
0 - 12VIN; 1V/ns Slew Rate  
0 - 5VIN; 1V/ns Slew Rate  
7
9
15  
16  
500  
Note:  
8. Lower supply current due to inactive TTL circuitry.  
9. Not tested in production.  
10. See Timing Diagrams of Figure 7 and Figure 8.  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
6
Timing Diagrams  
90%  
90%  
Output  
Output  
10%  
10%  
VINH  
Input  
VINL  
VINH  
VINL  
Input  
tD1  
tD2  
tD1  
tD2  
tFALL  
tRISE  
Figure 7. Non-Inverting  
tRISE  
tFALL  
Figure 8. Inverting  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
7
Typical Performance Characteristics  
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.  
Figure 9. IDD (Static) vs. Supply Voltage  
Figure 11. IDD (No-Load) vs. Frequency  
Figure 13. IDD (1nF Load) vs. Frequency  
Figure 10. IDD (Static) vs. Supply Voltage  
Figure 12. IDD (No-Load) vs. Frequency  
Figure 14. IDD (1nF Load) vs. Frequency  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
8
Typical Performance Characteristics  
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.  
Figure 15. IDD (Static) vs. Temperature  
Figure 17. Input Thresholds vs. Supply Voltage  
Figure 19. Input Thresholds % vs. Supply Voltage  
Figure 16. IDD (Static) vs. Temperature  
Figure 18. Input Thresholds vs. Supply Voltage  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
9
Typical Performance Characteristics  
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.  
Figure 20. CMOS Input Thresholds vs. Temperature  
Figure 22. UVLO Thresholds vs. Temperature  
Figure 24. Propagation Delay vs. Supply Voltage  
Figure 21. TTL Input Thresholds vs. Temperature  
Figure 23. UVLO Hysteresis vs. Temperature  
Figure 25. Propagation Delay vs. Supply Voltage  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
10  
Typical Performance Characteristics  
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.  
Figure 26. Propagation Delay vs. Supply Voltage  
Figure 28. Propagation Delay vs. Temperature  
Figure 30. Propagation Delay vs. Temperature  
Figure 27. Propagation Delay vs. Supply Voltage  
Figure 29. Propagation Delay vs. Temperature  
Figure 31. Propagation Delay vs. Temperature  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
11  
Typical Performance Characteristics  
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.  
Figure 32. Fall Time vs. Supply Voltage  
Figure 33. Rise Time vs. Supply Voltage  
Figure 34. Rise and Fall Time vs. Temperature  
Figure 35. Rise / Fall Waveforms with 1nF Load  
Figure 36. Rise / Fall Waveforms with 10nF Load  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
12  
Typical Performance Characteristics  
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.  
Figure 37. Quasi-Static Source Current with VDD=12V  
Figure 38. Quasi-Static Sink Current with VDD=12V  
Figure 39. Quasi-Static Source Current with VDD=8V  
Figure 40. Quasi-Static Sink Current with VDD=8V  
Figure 41. Quasi-Static IOUT / VOUT Test Circuit  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
13  
Applications Information  
Input Thresholds  
because the body diode is generally conducting before  
the MOSFET is switched on.  
The FAN3100 offers TTL or CMOS input thresholds. In  
the FAN3100T, the input thresholds meet industry-  
standard TTL logic thresholds, independent of the VDD  
The output pin slew rate is determined by VDD voltage  
and the load on the output. It is not user adjustable, but  
if a slower rise or fall time at the MOSFET gate is  
needed, a series resistor can be added.  
voltage, and there is  
a
hysteresis voltage of  
approximately 0.4V. These levels permit the inputs to  
be driven from a range of input logic signal levels for  
which a voltage over 2V is considered logic high. The  
driving signal for the TTL inputs should have fast rising  
and falling edges with a slew rate of 6V/µs or faster, so  
the rise time from 0 to 3.3V should be 550ns or less.  
With reduced slew rate, circuit noise could cause the  
driver input voltage to exceed the hysteresis voltage  
and retrigger the driver input, causing erratic operation.  
In the FAN3100C, the logic input thresholds are  
dependent on the VDD level and, with VDD of 12V, the  
logic rising edge threshold is approximately 55% of VDD  
and the input falling edge threshold is approximately  
38% of VDD. The CMOS input configuration offers a  
hysteresis voltage of approximately 17% of VDD. The  
CMOS inputs can be used with relatively slow edges  
(approaching DC) if good decoupling and bypass  
techniques are incorporated in the system design to  
prevent noise from violating the input voltage hysteresis  
window. This allows setting precise timing intervals by  
fitting an R-C circuit between the controlling signal and  
the IN pin of the driver. The slow rising edge at the IN  
pin of the driver introduces a delay between the  
controlling signal and the OUT pin of the driver.  
Figure 42. MillerDrive™ Output Architecture  
Under-Voltage Lockout  
The FAN3100 start-up logic is optimized to drive ground  
referenced N-channel MOSFETs with a under-voltage  
lockout (UVLO) function to ensure that the IC starts up  
in an orderly fashion. When VDD is rising, yet below the  
3.9V operational level, this circuit holds the output low,  
regardless of the status of the input pins. After the part  
is active, the supply voltage must drop 0.2V before the  
part shuts down. This hysteresis helps prevent chatter  
when low VDD supply voltages have noise from the  
power switching. This configuration is not suitable for  
driving high-side P-channel MOSFETs because the low  
output voltage of the driver would turn the P-channel  
MOSFET on with VDD below 3.9V.  
Static Supply Current  
In the IDD (static) typical performance graphs (Figure 9 -  
Figure 10 and Figure 15 - Figure 16), the curve is  
produced with all inputs floating (OUT is low) and  
indicates the lowest static IDD current for the tested  
configuration. For other states, additional current flows  
through the 100kΩ resistors on the inputs and outputs  
shown in the block diagrams (see Figure 5 - Figure 6).  
In these cases, the actual static IDD current is the value  
obtained from the curves plus this additional current.  
VDD Bypass Capacitor Guidelines  
To enable this IC to turn a power device on quickly, a  
local, high-frequency, bypass capacitor CBYP with low  
ESR and ESL should be connected between the VDD  
and GND pins with minimal trace length. This capacitor  
is in addition to bulk electrolytic capacitance of 10µF to  
47µF often found on driver and controller bias circuits.  
MillerDrive™ Gate Drive Technology  
FAN3100 drivers incorporate the MillerDrive™  
architecture shown in Figure 42 for the output stage, a  
combination of bipolar and MOS devices capable of  
providing large currents over a wide range of supply  
voltage and temperature variations. The bipolar devices  
carry the bulk of the current as OUT swings between  
1/3 to 2/3 VDD and the MOS devices pull the output to  
the high or low rail.  
A typical criterion for choosing the value of CBYP is to  
keep the ripple voltage on the VDD supply 5%. Often  
this is achieved with a value 20 times the equivalent  
load capacitance CEQV, defined here as Qgate/VDD  
.
Ceramic capacitors of 0.1µF to 1µF or larger are  
common choices, as are dielectrics, such as X5R and  
X7R, which have good temperature characteristics and  
high pulse current capability.  
The purpose of the MillerDrive™ architecture is to  
speed up switching by providing the highest current  
during the Miller plateau region when the gate-drain  
capacitance of the MOSFET is being charged or  
discharged as part of the turn-on / turn-off process.  
For applications that have zero voltage switching during  
the MOSFET turn-on or turn-off interval, the driver  
supplies high peak current for fast switching even  
though the Miller plateau is not present. This situation  
often occurs in synchronous rectifier applications  
If circuit noise affects normal operation, the value of  
CBYP may be increased to 50-100 times the CEQV, or  
CBYP may be split into two capacitors. One should be a  
larger value, based on equivalent load capacitance, and  
the other a smaller value, such as 1-10nF, mounted  
closest to the VDD and GND pins to carry the higher-  
frequency components of the current pulses.  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
14  
Figure 44 shows the current path when the gate driver  
turns the MOSFET off. Ideally, the driver shunts the  
current directly to the source of the MOSFET in a small  
circuit loop. For fast turn-off times, the resistance and  
inductance in this path should be minimized.  
Layout and Connection Guidelines  
The FAN3100 incorporates fast reacting input circuits,  
short propagation delays, and powerful output stages  
capable of delivering current peaks over 2A to facilitate  
voltage transition times from under 10ns to over 100ns.  
The following layout and connection guidelines are  
strongly recommended:  
ƒ
Keep high-current output and power ground paths  
separate from logic input signals and signal ground  
paths. This is especially critical when dealing with  
TTL-level logic thresholds.  
ƒ
Keep the driver as close to the load as possible to  
minimize the length of high-current traces. This  
reduces the series inductance to improve high-  
speed switching, while reducing the loop area that  
can radiate EMI to the driver inputs and other  
surrounding circuitry.  
Figure 44. Current Path for MOSFET Turn-Off  
Truth Table of Logic Operation  
The FAN3100 truth table indicates the operational  
states using the dual-input configuration. In a non-  
inverting driver configuration, the IN- pin should be a  
logic low signal. If the IN- pin is connected to logic high,  
a disable function is realized, and the driver output  
remains low regardless of the state of the IN+ pin.  
ƒ
The FAN3100 is available in two packages with  
slightly different pinouts, offering similar  
performance. In the 6-pin MLP package, Pin 2 is  
internally connected to the input analog ground and  
should be connected to power ground, Pin 5,  
through a short direct path underneath the IC. In  
the 5-pin SOT23, the internal analog and power  
ground connections are made through separate,  
individual bond wires to Pin 2, which should be  
used as the common ground point for power and  
control signals.  
IN+  
0
IN-  
0
OUT  
0
0
1
0
0
1
1
0
1
1
ƒ
ƒ
Many high-speed power circuits can be susceptible  
to noise injected from their own output or other  
external sources, possibly causing output re-  
triggering. These effects can be especially obvious  
if the circuit is tested in breadboard or non-optimal  
circuit layouts with long input, enable, or output  
leads. For best results, make connections to all  
pins as short and direct as possible.  
In the non-inverting driver configuration in Figure 45,  
the IN- pin is tied to ground and the input signal (PWM)  
is applied to IN+ pin. The IN- pin can be connected to  
logic high to disable the driver and the output remains  
low, regardless of the state of the IN+ pin.  
The turn-on and turn-off current paths should be  
minimized as discussed in the following sections.  
Figure 43 shows the pulsed gate drive current path  
when the gate driver is supplying gate charge to turn  
the MOSFET on. The current is supplied from the local  
bypass capacitor, CBYP, and flows through the driver to  
the MOSFET gate and to ground. To reach the high  
peak currents possible, the resistance and inductance  
in the path should be minimized. The localized CBYP  
acts to contain the high peak current pulses within this  
driver-MOSFET circuit, preventing them from disturbing  
the sensitive analog circuitry in the PWM controller.  
Figure 45. Dual-Input Driver Enabled,  
Non-Inverting Configuration  
In the inverting driver application shown in Figure 46, the  
IN+ pin is tied high. Pulling the IN+ pin to GND forces the  
output low, regardless of the state of the IN- pin.  
Figure 46. Dual-Input Driver Enabled,  
Inverting Configuration  
Figure 43. Current Path for MOSFET Turn-On  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
15  
source voltage, VGS, with gate charge, QG, at  
switching frequency, fSW, is determined by:  
Operational Waveforms  
At power up, the driver output remains low until the VDD  
voltage reaches the turn-on threshold. The magnitude  
of the OUT pulses rises with VDD until steady-state VDD  
is reached. The non-inverting operation illustrated in  
Figure 47 shows that the output remains low until the  
UVLO threshold is reached, then the output is in-phase  
with the input.  
PGATE = QG • VGS • FSW  
(2)  
Dynamic Pre-drive / Shoot-through Current: A power  
loss resulting from internal current consumption  
under dynamic operating conditions, including pin  
pull-up / pull-down resistors, can be obtained using  
the IDD (no-Load) vs. Frequency graphs in Typical  
Performance Characteristics to determine the  
current IDYNAMIC drawn from VDD under actual  
operating conditions:  
PDYNAMIC = IDYNAMIC • VDD  
(3)  
Once the power dissipated in the driver is determined,  
the driver junction rise with respect to circuit board can  
be evaluated using the following thermal equation,  
ψJB  
assuming  
was determined for a similar thermal  
design (heat sinking and air flow):  
ψ
TJ = PTOTAL  
where:  
JB + TB  
(4)  
TJ  
ψJB  
= driver junction temperature  
= (psi) thermal characterization parameter relating  
temperature rise to total power dissipation  
Figure 47. Non-Inverting Start-Up Waveforms  
For the inverting configuration of Figure 46, start-up  
waveforms are shown in Figure 48. With IN+ tied to  
VDD and the input signal applied to IN–, the OUT  
pulses are inverted with respect to the input. At power  
up, the inverted output remains low until the VDD voltage  
reaches the turn-on threshold, then it follows the input  
with inverted phase.  
TB = board temperature in location defined in the  
Thermal Characteristics table.  
In a typical forward converter application with 48V input,  
as shown in Figure 49, the FDS2672 would be a  
potential MOSFET selection. The typical gate charge  
would be 32nC with VGS = VDD = 10V. Using a TTL input  
driver at a switching frequency of 500kHz, the total  
power dissipation can be calculated as:  
P
GATE = 32nC • 10V • 500kHz = 0.160W  
PDYNAMIC = 8mA • 10V = 0.080W  
TOTAL = 0.24W  
The 5-pin SOT23 has  
(5)  
(6)  
(7)  
P
a
junction-to-lead thermal  
ψ
characterization parameter JB = 51°C/W.  
In a system application, the localized temperature  
around the device is a function of the layout and  
construction of the PCB along with airflow across the  
surfaces. To ensure reliable operation, the maximum  
junction temperature of the device must be prevented  
from exceeding the maximum rating of 150°C; with 80%  
derating, TJ would be limited to 120°C. Rearranging  
Equation 4 determines the board temperature required  
to maintain the junction temperature below 120°C:  
Figure 48. Inverting Start-Up Waveforms  
Thermal Guidelines  
Gate drivers used to switch MOSFETs and IGBTs at  
high frequencies can dissipate significant amounts of  
power. It is important to determine the driver power  
dissipation and the resulting junction temperature in the  
application to ensure that the part is operating within  
acceptable temperature limits.  
ψ
T
B,MAX = TJ - PTOTAL  
(8)  
(9)  
JB  
TB,MAX = 120°C – 0.24W • 51°C/W = 108°C  
For comparison purposes, replace the 5-pin SOT23  
used in the previous example with the 6-pin MLP  
ψJB  
package with  
= 2.8°C/W. The 6-pin MLP package  
The total power dissipation in a gate driver is the sum of  
can operate at a PCB temperature of 119°C, while  
maintaining the junction temperature below 120°C. This  
illustrates that the physically smaller MLP package with  
thermal pad offers a more conductive path to remove  
the heat from the driver. Consider the tradeoffs between  
reducing overall circuit size with junction temperature  
reduction for increased reliability.  
two components; PGATE and PDYNAMIC  
:
PTOTAL = PGATE + PDYNAMIC  
(1)  
Gate Driving Loss: The most significant power loss  
results from supplying gate current (charge per unit  
time) to switch the load MOSFET on and off at the  
switching frequency. The power dissipation that  
results from driving a MOSFET at a specified gate-  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
16  
Typical Application Diagrams  
Figure 49. Forward Converter, Primary-Side Gate Drive (MLP Package Shown)  
Figure 50. Driver for Two-Transistor Forward Converter Gate Transformer  
Figure 51. Secondary Synchronous Rectifier Driver  
VDD  
R
FAN3100C  
OUT  
IN  
C
Delay  
IN  
OUT  
Figure 52. Programmable Time Delay Using CMOS Input  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
17  
Table 1. Related Products  
Gate  
Part  
Number  
Input  
Threshold  
Type  
Drive(11)  
Logic  
Package  
(Sink/Src)  
FAN3100C Single 2A +2.5A / -1.8A CMOS  
FAN3100T Single 2A +2.5A / -1.8A TTL  
Single Channel of Two-Input/One-Output  
Single Channel of Two-Input/One-Output  
Dual Inverting Channels + Dual Enable  
SOT23-5, MLP6  
SOT23-5, MLP6  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
FAN3226C Dual 2A  
FAN3226T Dual 2A  
FAN3227C Dual 2A  
FAN3227T Dual 2A  
FAN3228C Dual 2A  
FAN3228T Dual 2A  
FAN3229C Dual 2A  
FAN3229T Dual 2A  
FAN3223C Dual 4A  
FAN3223T Dual 4A  
FAN3224C Dual 4A  
FAN3224T Dual 4A  
FAN3225C Dual 4A  
+2.4A / -1.6A CMOS  
+2.4A / -1.6A TTL  
+2.4A / -1.6A CMOS  
+2.4A / -1.6A TTL  
+2.4A / -1.6A CMOS  
+2.4A / -1.6A TTL  
+2.4A / -1.6A CMOS  
+2.4A / -1.6A TTL  
+4.3A / -2.8A CMOS  
+4.3A / -2.8A TTL  
+4.3A / -2.8A CMOS  
+4.3A / -2.8A TTL  
+4.3A / -2.8A CMOS  
+4.3A / -2.8A TTL  
Dual Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Channels of Two-Input/One-Output, Pin Config.1  
Dual Channels of Two-Input/One-Output, Pin Config.1  
Dual Channels of Two-Input/One-Output, Pin Config.2  
Dual Channels of Two-Input/One-Output, Pin Config.2  
Dual Inverting Channels + Dual Enable  
Dual Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Channels of Two-Input/One-Output  
FAN3225T Dual 4A  
Dual Channels of Two-Input/One-Output  
Note:  
11. Typical currents with OUT at 6V and VDD = 12V.  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
18  
Physical Dimensions  
Figure 53. 2x2mm, 6-Lead Molded Leadless Package (MLP)  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify  
or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,  
specifically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/packaging/  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
19  
Physical Dimensions (Continued)  
SYMM  
C
L
3.00  
2.80  
0.95  
0.95  
A
5
4
B
3.00  
2.60  
1.70  
1.50  
2.60  
1
2
3
(0.30)  
1.00  
0.50  
0.30  
0.95  
0.20  
C A B  
1.90  
0.70  
TOP VIEW  
LAND PATTERN RECOMMENDATION  
SEE DETAIL A  
1.30  
0.90  
1.45 MAX  
C
0.15  
0.05  
0.22  
0.08  
0.10 C  
NOTES: UNLESS OTHEWISE SPECIFIED  
A) THIS PACKAGE CONFORMS TO JEDEC  
MO-178, ISSUE B, VARIATION AA,  
B) ALL DIMENSIONS ARE IN MILLIMETERS.  
GAGE PLANE  
0.25  
C) MA05Brev5  
8°  
0°  
0.55  
0.35  
SEATING PLANE  
0.60 REF  
Figure 54. 5-Lead SOT-23  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify  
or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,  
specifically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/packaging/  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
20  
© 2007 Fairchild Semiconductor Corporation  
FAN3100 • Rev. 1.0.2  
www.fairchildsemi.com  
21  

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