FDD3680_NL [FAIRCHILD]

Power Field-Effect Transistor, 25A I(D), 100V, 0.046ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3;
FDD3680_NL
型号: FDD3680_NL
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, 25A I(D), 100V, 0.046ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3

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中文:  中文翻译
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February 2001  
FDD3680  
100V N-Channel PowerTrenchÒ MOSFET  
General Description  
Features  
This N-Channel MOSFET has been designed  
specifically to improve the overall efficiency of DC/DC  
converters using either synchronous or conventional  
switching PWM controllers.  
· 25 A, 100 V. RDS(ON) = 46 mW @ VGS = 10 V  
RDS(ON) = 51 mW @ VGS = 6 V  
· Low gate charge (38 nC typical)  
· Fast switching speed  
These MOSFETs feature faster switching and lower  
gate charge than other MOSFETs with comparable  
RDS(ON) specifications.  
· High performance trench technology for extremely  
low RDS(ON)  
The result is a MOSFET that is easy and safer to drive  
(even at very high frequencies), and DC/DC power  
supply designs with higher overall efficiency.  
· High power and current handling capability.  
D
D
G
G
S
TO-252  
S
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
V
100  
VGSS  
ID  
Gate-Source Voltage  
V
A
±20  
Drain Current – Continuous  
Drain Current – Pulsed  
Maximum Power Dissipation  
(Note 1)  
25  
100  
PD  
(Note 1)  
68  
W
(Note 1a)  
3.8  
(Note 1b)  
1.6  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +175  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
(Note 1)  
2.2  
96  
RqJC  
°C/W  
°C/W  
(Note 1b)  
RqJA  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
16mm  
Quantity  
FDD3680  
FDD3680  
13’’  
2500 units  
Ó2001 Fairchild Semiconductor Corporation  
FDD3680 Rev B1(W)  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings (Note 1)  
WDSS  
IAR  
Single Pulse Drain-Source  
Avalanche Energy  
Maximum Drain-Source  
Avalanche Current  
VDD = 50 V,  
ID = 6.1 A  
245  
6.1  
mJ  
A
Off Characteristics  
Drain–Source Breakdown  
Voltage  
BVDSS  
100  
V
VGS = 0 V,  
ID = 250 mA  
Breakdown Voltage Temperature  
Coefficient  
–101  
DBVDSS  
DT  
J
ID = 250 mA, Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current VDS = 80 V,  
VGS = 0 V  
VDS = 0 V  
VDS = 0 V  
10  
mA  
nA  
nA  
IGSSF  
IGSSR  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VGS = 20 V,  
VGS = –20 V  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
VDS = VGS  
,
ID = 250 mA  
2
2.4  
4
V
DVGS(th)  
DT  
J
Gate Threshold Voltage  
Temperature Coefficient  
ID = 250 mA, Referenced to 25°C  
–6.5  
mV/°C  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = 10 V,  
VGS = 10 V,  
VGS = 6 V,  
ID = 6.1 A  
ID = 6.1 A, TJ = 125°C  
ID = 5.8 A  
32  
61  
34  
46  
92  
51  
mW  
ID(on)  
gFS  
On–State Drain Current  
VGS = 10 V,  
VDS = 5 V,  
VDS = 5 V  
ID = 6.1 A  
25  
A
S
Forward Transconductance  
25  
Dynamic Characteristics  
C
iss  
Input Capacitance  
VDS = 50 V,  
f = 1.0 MHz  
V GS = 0 V,  
1735  
176  
53  
pF  
pF  
pF  
Coss  
Output Capacitance  
C
rss  
Reverse Transfer Capacitance  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
VDD = 50 V,  
VGS = 10 V,  
ID = 1 A,  
RGEN = 10 W  
14  
8.5  
63  
25  
17  
94  
34  
53  
ns  
ns  
ns  
21  
ns  
Qg  
VDS = 50 V,  
VGS = 10 V  
ID = 6.1 A,  
38  
nC  
nC  
nC  
Qgs  
Qgd  
8.1  
9.2  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
2.9  
1.3  
A
V
Drain–Source Diode Forward  
VSD  
VGS = 0 V,  
IS = 2.9 A (Note 2)  
0.73  
Voltage  
Notes:  
1. RqJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. qJC is guaranteed by design while Rq CA is determined by the user's board design.  
R
o
b) RqJA= 96 C/W on a  
minimum mounting pad.  
o
RqJA= 40 C/W when  
a)  
2
mounted on a 1in pad of  
2oz copper.  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300ms, Duty Cycle < 2.0%  
FDD3680 Rev B1(W)  
Typical Characteristics  
1.8  
1.6  
1.4  
1.2  
1
40  
VGS = 10V  
5V  
4.5V  
30  
20  
10  
0
4V  
VGS =4.0V  
4.5V  
5.0V  
6.0  
10V  
3.5V  
0.8  
0
10  
20  
30  
40  
50  
60  
0
2
4
6
ID, DRAIN CURRENT (A)  
VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
2.6  
0.12  
ID = 6.1A  
ID = 3.0A  
VGS = 10V  
2.2  
1.8  
1.4  
1
0.08  
0.04  
0
TA = 125oC  
TA = 25oC  
0.6  
0.2  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
40  
30  
20  
10  
0
VGS = 0V  
VDS =5V  
10  
1
TA = 125oC  
25oC  
125oC  
-55oC  
TA = -55oC  
0.1  
25oC  
0.01  
0.001  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1
2
3
4
5
6
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDD3680 Rev B1(W)  
Typical Characteristics  
10  
3000  
2500  
2000  
1500  
1000  
500  
f = 1MHz  
VGS = 0  
ID = 6.1A  
VDS = 15V  
30V  
8
6
4
2
0
50V  
CISS  
COSS  
CRSS  
40  
0
0
5
10  
15  
20  
25  
30  
35  
40  
0
20  
60  
80  
100  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
1000  
40  
30  
20  
10  
0
SINGLE PULSE  
RqJA = 96°C/W  
TA = 25°C  
100  
10  
RDS(ON) LIMIT  
100ms  
1ms  
10ms  
100ms  
1s  
1
10s  
DC  
VGS = 10V  
SINGLE PULSE  
R JA = 96oC/W  
0.1  
q
TA = 25oC  
0.01  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
1000  
VDS , DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
0.2  
RqJA (t) = r(t) + RqJA  
RqJA = 96°C/W  
0.1  
0.1  
0.05  
0.02  
P(pk  
)
t1  
0.01  
0.01  
t2  
TJ - TA = P * RqJA(t)  
Duty Cycle, D = t1 / t2  
100  
SINGLE PULSE  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
FDD3680 Rev B1(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PowerTrench  
QFET™  
QS™  
SyncFET™  
TinyLogic™  
UHC™  
ACEx™  
FASTr™  
GlobalOptoisolator™  
GTO™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DOME™  
QT Optoelectronics™  
VCX™  
HiSeC™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
ISOPLANAR™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
POP™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
FAST  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. G  

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