FDP6670AL-OLDDIE [FAIRCHILD]

Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET;
FDP6670AL-OLDDIE
型号: FDP6670AL-OLDDIE
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET

文件: 总5页 (文件大小:156K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
May 2003  
FDP6670AL/FDB6670AL  
N-Channel Logic Level PowerTrenchÒ MOSFET  
General Description  
Features  
This N-Channel Logic Level MOSFET has been  
designed specifically to improve the overall efficiency of  
DC/DC converters using either synchronous or  
conventional switching PWM controllers.  
·
·
·
·
80 A, 30 V  
RDS(ON) = 6.5 mW @ VGS = 10 V  
RDS(ON) = 8.5 mW @ VGS = 4.5 V  
Critical DC electrical parameters specified at  
elevated temperature  
These MOSFETs feature faster switching and lower  
gate charge than other MOSFETs with comparable  
RDS(ON) specifications.  
High performance trench technology for extremely  
low RDS(ON)  
The result is a MOSFET that is easy and safer to drive  
(even at very high frequencies), and DC/DC power  
supply designs with higher overall efficiency.  
175°C maximum junction temperature rating  
It has been optimized for low gate charge, low RDS(ON)  
and fast switching speed.  
D
D
G
G
G
S
TO-263AB  
FDB Series  
TO-220  
FDP Series  
D
S
S
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
30  
V
V
A
VGSS  
Gate-Source Voltage  
± 20  
ID  
Drain Current – Continuous  
– Pulsed  
(Note 1)  
(Note 1)  
80  
240  
PD  
68  
W
W/°C  
°C  
Total Power Dissipation @ TC = 25°C  
0.45  
Derate above 25°C  
Operating and Storage Junction Temperature Range  
TJ, TSTG  
–65 to +175  
Thermal Characteristics  
RqJC  
Thermal Resistance, Junction-to-Case  
2.2  
°C/W  
°C/W  
RqJA  
Thermal Resistance, Junction-to-Ambient  
62.5  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
24mm  
Quantity  
FDB6670AL  
FDB6670AL  
FDP6670AL  
13’’  
800 units  
45  
FDP6670AL  
Tube  
n/a  
FDP6670AL/FDB6670AL Rev D(W)  
Ó2003 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings (Note 1)  
WDSS  
IAR  
Single Pulse Drain-Source  
Avalanche Energy  
VDD = 15 V,  
ID = 80 A  
114  
80  
mJ  
A
Maximum Drain-Source Avalanche  
Current  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
30  
V
VGS = 0 V,  
ID = 250 mA  
DBVDSS  
DTJ  
Breakdown Voltage Temperature  
Coefficient  
ID = 250 mA, Referenced to 25°C  
mV/°C  
24  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage  
VDS = 24 V,  
VGS = 0 V  
1
mA  
nA  
VGS = ± 20 V, VDS = 0 V  
± 100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
1
1.9  
–5  
3
V
VDS = VGS  
,
ID = 250 mA  
DVGS(th)  
DTJ  
Gate Threshold Voltage  
Temperature Coefficient  
ID = 250 mA, Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain–Source On–  
Resistance  
VGS = 10 V,  
VGS = 4.5 V,  
VGS= 10 V, ID = 40 A, TJ=125°C  
ID = 40 A  
ID = 37 A  
5.2  
6.5  
7.2  
6.5  
8.5  
9.7  
mW  
ID(on)  
gFS  
On–State Drain Current  
VGS = 10 V,  
VDS = 10V,  
VDS = 10 V  
ID = 40 A  
80  
A
S
Forward Transconductance  
115  
Dynamic Characteristics  
Ciss  
Input Capacitance  
2440  
580  
pF  
pF  
VDS = 15 V,  
f = 1.0 MHz  
V GS = 0 V,  
Coss  
Output Capacitance  
Crss  
RG  
Reverse Transfer Capacitance  
Gate Resistance  
250  
1.4  
pF  
VGS = 15 mV, f = 1.0 MHz  
W
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
VDD = 10V,  
VGS = 10 V,  
ID = 1 A,  
RGEN = 6 W  
13  
13  
42  
15  
24  
7
23  
23  
68  
27  
33  
ns  
ns  
ns  
ns  
VDS = 15 V,  
VGS = 5 V  
ID = 40 A,  
Qg  
Qgs  
Qgd  
nC  
nC  
nC  
9
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
80  
A
V
Drain–Source Diode Forward  
VGS = 0 V, IS = 40 A  
Voltage  
VSD  
(Note 1)  
0.9  
1.3  
trr  
Diode Reverse Recovery Time  
Diode Reverse Recovery Charge  
IF = 40 A,  
diF/dt = 100 A/µs  
34  
24  
nS  
nC  
Qrr  
Notes:  
1. Pulse Test: Pulse Width < 300ms, Duty Cycle < 2.0%  
FDP6670AL/FDB6670AL Rev D(W)  
Typical Characteristics  
1.8  
1.6  
1.4  
1.2  
1
100  
4.0V  
4.5V  
VGS = 10V  
6.0V  
VGS = 3.5V  
75  
50  
25  
0
3.5V  
4.0V  
4.5V  
5.0V  
6.0V  
3.0V  
1.5  
10V  
80  
0.8  
0
0.5  
1
2
0
20  
40  
60  
100  
VDS, DRAIN-SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.021  
1.6  
ID = 80A  
VGS =10V  
ID = 40A  
1.4  
0.017  
0.013  
0.009  
0.005  
1.2  
1
TA = 125oC  
0.8  
0.6  
TA = 25oC  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
1000  
VGS = 0V  
VDS = 10V  
100  
10  
80  
60  
40  
20  
0
TA = 125oC  
25oC  
1
-55oC  
TA = 125oC  
25oC  
0.1  
0.01  
0.001  
-55oC  
2
2.5  
3
3.5  
4
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDP6670AL/FDB6670AL Rev D(W)  
Typical Characteristics  
10  
4000  
3000  
2000  
1000  
0
ID = 80A  
f = 1MHz  
VGS = 0 V  
8
VDS = 10V  
6
Ciss  
15V  
20V  
4
Coss  
2
0
Crss  
0
10  
20  
30  
40  
50  
0
5
10  
15  
20  
25  
30  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
5000  
1000  
SINGLE PULSE  
RqJC = 2.2°C/W  
TA = 25°C  
4000  
10µs  
100µs  
1mS  
10mS  
100mS  
DC  
RDS(ON) LIMIT  
100  
10  
1
3000  
2000  
1000  
0
VGS = 10V  
SINGLE PULSE  
RqJA = 2.2oC/W  
TA = 25oC  
0.1  
1
10  
100  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
VDS, DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RqJC(t) = r(t) * RqJA  
RqJA = 2.2 °C/W  
0.2  
P(pk  
0.1  
0.1  
t1  
t2  
0.05  
0.02  
0.01  
TJ - TA = P * RqJA(t)  
Duty Cycle, D = t1 / t2  
SINGLE PULSE  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
FDP6670AL/FDB6670AL Rev D(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
ACEx™  
PACMAN™  
POP™  
SPM™  
ImpliedDisconnect™  
ISOPLANAR™  
LittleFET™  
FACT™  
ActiveArray™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DOME™  
Stealth™  
FACT Quiet Series™  
FAST  
Power247™  
PowerTrench  
QFET  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
MSX™  
FASTr™  
FRFET™  
QS™  
GlobalOptoisolator™  
GTO™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
QT Optoelectronics™ TinyLogic  
Quiet Series™  
RapidConfigure™  
RapidConnect™  
TruTranslation™  
MSXPro™  
HiSeC™  
I2C™  
UHC™  
OCX™  
UltraFET  
OCXPro™  
Across the board. Around the world.™  
The Power Franchise™  
SILENT SWITCHER VCX™  
SMARTSTART™  
OPTOLOGIC  
OPTOPLANAR™  
ProgrammableActive Droop™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. I3  

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