FDPC8013S [FAIRCHILD]

PowerTrench® Power Clip 30 V Asymmetric Dual N-Channel MOSFET; PowerTrench®电源夹30 V非对称双N沟道MOSFET
FDPC8013S
型号: FDPC8013S
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

PowerTrench® Power Clip 30 V Asymmetric Dual N-Channel MOSFET
PowerTrench®电源夹30 V非对称双N沟道MOSFET

文件: 总12页 (文件大小:509K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2012  
FDPC8013S  
PowerTrench® Power Clip  
30 V Asymmetric Dual N-Channel MOSFET  
Features  
General Description  
Q1: N-Channel  
This device includes two specialized N-Channel MOSFETs in a  
dual package. The switch node has been internally connected to  
enable easy placement and routing of synchronous buck  
converters. The control MOSFET (Q1) and synchronous  
SyncFETTM (Q2) have been designed to provide optimal power  
efficiency.  
„ Max rDS(on) = 9.6 mΩ at VGS = 4.5 V, ID = 10 A  
Q2: N-Channel  
„ Max rDS(on) = 2.7 mΩ at VGS = 4.5 V, ID = 22 A  
„ Low inductance packaging shortens rise/fall times, resulting in  
lower switching losses  
Applications  
„ MOSFET integration enables optimum layout for lower circuit  
inductance and reduced switch node ringing  
„ Computing  
„ RoHS Compliant  
„ Communications  
„ General Purpose Point of Load  
Pin 1  
V+  
Pin 1  
HSG  
LS  
GND  
V+  
PAD9  
V+(HSD)  
V+  
V+  
HSG  
SW  
GND  
(HSD  
GND  
SW  
SW  
SW  
LSG  
GND  
GND  
LSG  
GND  
GND  
(LSS  
HSG  
SW  
SW  
SW  
SW  
SW  
SW  
PAD10  
GND(LSS)  
Bottom  
Top  
3.3 mm x 3.3 mm  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Q1  
30  
Q2  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
30  
±20  
55  
261b  
100  
97  
V
V
(Note 4)  
±20  
Drain Current  
-Continuous (Package limited)  
-Continuous  
TC = 25 °C  
TA = 25 °C  
20  
ID  
131a  
40  
A
-Pulsed  
EAS  
Single Pulse Avalanche Energy  
(Note 3)  
TA = 25 °C  
TA = 25 °C  
21  
mJ  
W
Power Dissipation for Single Operation  
Power Dissipation for Single Operation  
Operating and Storage Junction Temperature Range  
1.61a  
0.81c  
2.01b  
0.91d  
PD  
TJ, TSTG  
-55 to +150  
°C  
Thermal Characteristics  
RθJA  
RθJA  
RθJC  
Thermal Resistance, Junction to Ambient  
771a  
1511c  
5.0  
631b  
1351d  
3.5  
Thermal Resistance, Junction to Ambient  
Thermal Resistance, Junction to Case  
°C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ”  
Tape Width  
Quantity  
13CF/15CF  
FDPC8013S  
Power Clip 33  
12 mm  
3000 units  
1
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max  
Units  
Off Characteristics  
I
I
D = 250 μA, VGS = 0 V  
D = 1 mA, VGS = 0 V  
Q1  
Q2  
30  
30  
BVDSS  
Drain to Source Breakdown Voltage  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
ID = 250 μA, referenced to 25 °C  
D = 10 mA, referenced to 25 °C  
Q1  
Q2  
16  
20  
mV/°C  
I
V
V
DS = 24 V, VGS = 0 V  
DS = 24 V, VGS = 0 V  
Q1  
Q2  
1
500  
μA  
μA  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current,  
Forward  
VGS = 20 V, VDS= 0 V  
V
Q1  
Q2  
100  
100  
nA  
nA  
GS = 20 V, VDS= 0 V  
On Characteristics  
V
V
GS = VDS, ID = 250 μA  
GS = VDS, ID = 1 mA  
Q1  
Q2  
1.2  
1.2  
1.5  
1.7  
3.0  
3.0  
VGS(th)  
Gate to Source Threshold Voltage  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
ID = 250 μA, referenced to 25 °C  
D = 10 mA, referenced to 25 °C  
Q1  
Q2  
-5  
-6  
mV/°C  
I
V
V
V
GS = 10 V, ID = 13 A  
GS = 4.5 V, ID = 10 A  
GS = 10 V, ID = 13 A,TJ =125 °C  
4.6  
6.7  
6.6  
6.4  
9.6  
9.2  
Q1  
Q2  
rDS(on)  
Drain to Source On Resistance  
mΩ  
V
V
V
GS = 10 V, ID = 26 A  
GS = 4.5 V, ID = 22 A  
GS = 10 V, ID = 26 A ,TJ =125 °C  
1.4  
2.0  
1.9  
1.9  
2.7  
2.6  
V
V
DS = 5 V, ID = 13 A  
DS = 5 V, ID = 26 A  
Q1  
Q2  
53  
168  
gFS  
Forward Transconductance  
S
Dynamic Characteristics  
Q1  
Q2  
827  
2785  
Q1:  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
pF  
pF  
pF  
Ω
VDS = 15 V, VGS = 0 V, f = 1 MHZ  
Q1  
Q2  
333  
997  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
Q2:  
VDS = 15 V, VGS = 0 V, f = 1 MHZ  
Q1  
Q2  
44  
128  
Q1  
Q2  
0.5  
0.5  
Switching Characteristics  
Q1  
Q2  
6
11  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
ns  
ns  
Q1:  
Q1  
Q2  
2
5
VDD = 15 V, ID = 13 A, RGEN = 6 Ω  
Q1  
Q2  
16  
30  
Q2:  
Turn-Off Delay Time  
Fall Time  
ns  
V
DD = 15 V, ID = 26 A, RGEN = 6 Ω  
Q1  
Q2  
2
4
ns  
Q1  
Q2  
13  
44  
Qg  
Total Gate Charge  
Total Gate Charge  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 4.5 V  
nC  
nC  
nC  
nC  
Q1  
DD = 15 V,  
D = 13 A  
V
I
Q1  
Q2  
6
21  
Qg  
Q1  
Q2  
2.2  
7.2  
Q2  
VDD = 15 V,  
Qgs  
Qgd  
Q1  
Q2  
1.9  
6.6  
I
D = 26 A  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
2
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max  
Units  
Drain-Source Diode Characteristics  
V
V
GS = 0 V, IS = 13 A  
GS = 0 V, IS = 26 A  
(Note 2) Q1  
(Note 2) Q2  
0.80  
0.77  
1.2  
1.2  
VSD  
trr  
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
V
Q1  
Q2  
22  
29  
Q1  
ns  
nC  
IF = 13 A, di/dt = 100 A/μs  
Q2  
IF = 26 A, di/dt = 300 A/μs  
Q1  
Q2  
7
30  
Qrr  
Reverse Recovery Charge  
Notes:  
2
1.R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined by  
θJA  
θJC  
θCA  
the user's board design.  
b. 63 °C/W when mounted on  
a 1 in pad of 2 oz copper  
a. 77 °C/W when mounted on  
a 1 in pad of 2 oz copper  
2
2
d. 135 °C/W when mounted on a  
minimum pad of 2 oz copper  
c. 151 °C/W when mounted on  
minimum pad of 2 oz copper  
a
2 Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.  
o
3. Q1 :E of 21 mJ is based on starting T = 25 C; N-ch: L = 1.2 mH, I = 6 A, V = 23 V, V = 10 V. 100% test at L= 0.1 mH, I = 14.5 A.  
AS  
J
AS  
DD  
GS  
AS  
o
Q2: E of 97 mJ is based on starting T = 25 C; N-ch: L = 0.6 mH, I = 18 A, V = 23 V, V = 10 V. 100% test at L= 0.1 mH, I = 32.9 A.  
AS  
J
AS  
DD  
GS  
AS  
4. As an N-ch device, the negative V rating is for low duty cycle pulse occurence only. No continuous rating is implied.  
gs  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
3
Typical Characteristics (Q1 N-Channel) TJ = 25 °C unless otherwise noted  
40  
30  
20  
10  
0
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
VGS = 3 V  
VGS = 10 V  
VGS = 6 V  
VGS = 4.5 V  
VGS = 3.5 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 3.5 V  
VGS = 3 V  
VGS = 4.5 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 6 V  
VGS = 10 V  
0.0  
0.3  
0.6  
0.9  
1.2  
1.5  
0
10  
20  
30  
40  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On Region Characteristics  
F i g u r e 2 . No rma li zed O n-Re si stan ce  
vs Drain Current and Gate Voltage  
35  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
ID = 13 A  
ID = 13 A  
VGS = 10 V  
28  
21  
14  
TJ = 125 oC  
7
TJ = 25 o  
C
0
2
3
4
5
6
7
8
9
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
40  
40  
PULSE DURATION = 80 μs  
VGS = 0 V  
DUTY CYCLE = 0.5% MAX  
10  
VDS = 5 V  
30  
20  
10  
0
TJ = 150 o  
C
1
TJ = 25 oC  
TJ = 25 o  
C
TJ = 150 o  
C
0.1  
0.01  
TJ = -55 o  
C
TJ = -55 o  
C
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
4
Typical Characteristics (Q1 N-Channel) TJ = 25 °C unless otherwise noted  
2000  
1000  
10  
8
Ciss  
Coss  
Crss  
ID = 13 A  
6
VDD = 10 V  
VDD = 20 V  
100  
4
VDD = 15 V  
2
f = 1 MHz  
= 0 V  
V
GS  
10  
0
0.1  
1
10  
30  
0
3
6
9
12  
15  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Q , GATE CHARGE (nC)  
g
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
50  
60  
50  
40  
30  
20  
10  
0
VGS = 10 V  
10  
TJ = 25 oC  
TJ = 100 oC  
VGS = 4.5 V  
TJ = 125 o  
C
Limited by Package  
RθJC = 5.0 oC/W  
1
0.001  
25  
50  
75  
100  
125  
150  
0.01  
0.1  
1
10  
50  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure9. Unclamped Inductive  
Switching Capability  
Figure 10. Maximum Continuous Drain  
Current vs. Ambient Temperature  
1000  
100  
10  
SINGLE PULSE  
RθJA = 151 oC/W  
100 μs  
100  
10  
1
THIS AREA IS  
1 ms  
10 ms  
100 ms  
1s  
LIMITED BY r  
DS(on)  
SINGLE PULSE  
TJ = MAX RATED  
0.1  
θJA = 151 oC/W  
TA = 25 oC  
10s  
DC  
R
1
0.5  
0.01  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
100  
101  
0.01  
0.1  
1
10  
100  
100 1000  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 11. Forward Bias Safe  
Operating Area  
Figure12. Si ng l e Pu ls e Max imu m  
Power Dissipation  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
5
Typical Characteristics (Q1 N-Channel) TJ = 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.05  
0.1  
0.01  
0.02  
0.01  
P
DM  
t
1
t
SINGLE PULSE  
RθJA = 151 oC/W  
(Note 1b)  
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
0.001  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
100  
101  
100  
1000  
Figure 13. Junction-to-Ambient Transient Thermal Response Curve  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
6
Typical Characteristics (Q2 N-Channel) TJ = 25 oC unlenss otherwise noted  
100  
80  
60  
40  
20  
0
6
5
4
3
2
1
0
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
VGS = 6 V  
VGS = 3 V  
VGS = 4.5 V  
VGS = 3.5 V  
VGS = 3.5 V  
VGS = 4.5 V  
VGS = 3 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 6 V  
60  
VGS = 10 V  
80 100  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
0
20  
40  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 14. On-Region Characteristics  
Figure 15. Normalized on-Resistance vs Drain  
Current and Gate Voltage  
7
1.6  
ID = 26 A  
GS = 10 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
6
V
1.4  
1.2  
1.0  
0.8  
0.6  
5
4
3
2
1
0
ID = 26 A  
TJ = 125 oC  
TJ = 25 o  
C
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 17. On-Resistance vs Gate to  
Source Voltage  
Figure 16. Normalized On-Resistance  
vs Junction Temperature  
100  
100  
VGS = 0 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
10  
1
80  
60  
40  
20  
0
VDS = 5 V  
TJ = 125 o  
C
TJ = 25 oC  
TJ = 125 o  
C
0.1  
TJ = -55 o  
C
TJ = 25 o  
C
0.01  
TJ = -55 o  
C
0.001  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 18. Transfer Characteristics  
Figure 19. Source to Drain Diode  
Forward Voltage vs Source Current  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
7
Typical Characteristics (Q2 N-Channel) TJ = 25 oC unlenss otherwise noted  
10000  
10  
8
ID = 26 A  
Ciss  
Coss  
6
1000  
VDD = 10 V  
VDD = 15 V  
4
Crss  
VDD = 20 V  
2
f = 1 MHz  
= 0 V  
100  
50  
V
GS  
0
0.1  
1
10  
30  
0
10  
20  
30  
40  
50  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Q , GATE CHARGE (nC)  
g
Figure 21. Capacitance vs Drain  
to Source Voltage  
Figure 20. Gate Charge Characteristics  
120  
100  
80  
60  
40  
20  
0
100  
10  
1
VGS = 10 V  
TJ = 25 o  
C
VGS = 4.5 V  
TJ = 100 o  
C
TJ = 125 o  
C
Limited by Package  
RθJC = 3.5 oC/W  
25  
50  
75  
100  
125  
150  
0.001  
0.01  
0.1  
1
10  
100  
1000  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure 23. Maximum Continouns Drain  
Current vs Ambient Temperature  
Figure 22. Unclamped Inductive  
Switching Capability  
3000  
200  
100  
SINGLE PULSE  
θJA = 135 oC/W  
1000  
100  
10  
100 μs  
R
10  
1
THIS AREA IS  
LIMITED BY r  
1 ms  
DS(on)  
10 ms  
100 ms  
1s  
SINGLE PULSE  
TJ = MAX RATED  
RθJA = 135 oC/W  
0.1  
10s  
DC  
T
A = 25 oC  
1
0.5  
0.01  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
100  
101  
100 1000  
0.01  
0.1  
1
10  
100  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 25. Single Pulse Maximum  
Power Dissipation  
Figure 24. Forward Bias Safe  
Operating Area  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
8
Typical Characteristics (Q2 N-Channel) TJ = 25 oC unlenss otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
P
DM  
0.01  
1E-3  
1E-4  
0.01  
t
1
SINGLE PULSE  
θJA = 135 oC/W  
t
2
NOTES:  
DUTY FACTOR: D = t /t  
R
1
2
(Note 1b)  
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
100  
101  
100  
1000  
Figure 26. Junction-to-Ambient Transient Thermal Response Curve  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
9
Typical Characteristics (continued)  
TM  
SyncFET Schottky body diode  
Characteristics  
Fairchild’s SyncFETTM process embeds a Schottky diode in  
parallel with PowerTrench MOSFET. This diode exhibits similar  
characteristics to a discrete external Schottky diode in parallel  
Schottky barrier diodes exhibit significant leakage at high tem-  
perature and high reverse voltage. This will increase the power  
in the device.  
with  
a MOSFET. Figure 27 shows the reverse recovery  
characteristic of the FDPC8013S.  
104  
30  
25  
20  
15  
10  
5
TJ = 125 o  
C
103  
102  
10  
1
TJ = 100 o  
C
di/dt = 300 A/μs  
TJ = 25 o  
C
0
-5  
100  
0
5
10  
15  
20  
25  
30  
150  
200  
250  
300  
350  
400  
VDS, REVERSE VOLTAGE (V)  
TIME (ns)  
Figure 28. SyncFETTM body diode reverse  
leakage versus drain-source voltage  
Figure 27. FDPC8013S SyncFETTM body  
diode reverse recovery characteristic  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
10  
Dimensional Outline and Pad Layout  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
www.fairchildsemi.com  
11  
TRADEMARKS  
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not  
intended to be an exhaustive list of all such trademarks.  
®
®
2Cool™  
F-PFS™  
FRFET  
Global Power Resource  
Green Bridge™  
PowerTrench  
PowerXS™  
The Power Franchise  
®
®
AccuPower™  
AX-CAP™*  
SM  
Programmable Active Droop™  
®
®
BitSiC  
QFET  
TinyBoost™  
TinyBuck™  
TinyCalc™  
Build it Now™  
CorePLUS™  
CorePOWER™  
CROSSVOLT™  
CTL™  
Green FPS™  
Green FPS™ e-Series™  
Gmax™  
GTO™  
IntelliMAX™  
ISOPLANAR™  
QS™  
Quiet Series™  
RapidConfigure™  
®
TinyLogic  
TINYOPTO™  
TinyPower™  
TinyPWM™  
TinyWire™  
Current Transfer Logic™  
Saving our world, 1mW/W/kW at a time™  
®
DEUXPEED  
Marking Small Speakers Sound Louder SignalWise™  
Dual Cool™  
EcoSPARK  
EfficentMax™  
ESBC™  
and Better™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
SmartMax™  
®
TranSiC  
®
SMART START™  
Solutions for Your Success™  
TriFault Detect™  
TRUECURRENT *  
®
®
SPM  
μSerDes™  
MicroPak™  
STEALTH™  
®
®
MicroPak2™  
MillerDrive™  
MotionMax™  
Motion-SPM™  
mWSaver™  
OptoHiT™  
SuperFET  
®
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
Fairchild  
®
UHC  
®
Fairchild Semiconductor  
FACT Quiet Series™  
Ultra FRFET™  
UniFET™  
VCX™  
VisualMax™  
VoltagePlus™  
XS™  
®
®
SupreMOS  
FACT  
®
SyncFET™  
Sync-Lock™  
®*  
FAST  
®
OPTOLOGIC  
OPTOPLANAR  
FastvCore™  
FETBench™  
FlashWriter  
FPS™  
®
®
*
®
tm  
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE  
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY  
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.  
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY  
THEREIN, WHICH COVERS THESE PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE  
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used here in:  
1. Life support devices or systems are devices or systems which, (a) are  
intended for surgical implant into the body or (b) support or sustain life,  
and (c) whose failure to perform when properly used in accordance with  
instructions for use provided in the labeling, can be reasonably  
expected to result in a significant injury of the user.  
2. A critical component in any component of a life support, device, or  
system whose failure to perform can be reasonably expected to cause  
the failure of the life support device or system, or to affect its safety or  
effectiveness.  
ANTI-COUNTERFEITING POLICY  
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website,  
www.Fairchildsemi.com, under Sales Support.  
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their  
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed  
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the  
proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild  
Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild  
Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of  
up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and  
warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is  
committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Datasheet contains the design specifications for product development. Specifications  
may change in any manner without notice.  
Advance Information  
Formative / In Design  
Datasheet contains preliminary data; supplementary data will be published at a later  
date. Fairchild Semiconductor reserves the right to make changes at any time without  
notice to improve design.  
Preliminary  
First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
make changes at any time without notice to improve the design.  
No Identification Needed  
Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I61  
©2012 Fairchild Semiconductor Corporation  
FDPC8013S Rev.C1  
12  
www.fairchildsemi.com  

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