KSC5338D [FAIRCHILD]

High Voltage Power Switch Switching Application; 高压电源开关切换应用程序
KSC5338D
型号: KSC5338D
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

High Voltage Power Switch Switching Application
高压电源开关切换应用程序

晶体 开关 晶体管 功率双极晶体管 电源开关 高压 局域网
文件: 总8页 (文件大小:98K)
中文:  中文翻译
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KSC5338D/KSC5338DW  
D2-PAK  
Equivalent Circuit  
C
High Voltage Power Switch Switching  
Application  
1
Wide Safe Operating Area  
Built-in Free-Wheeling Diode  
Suitable for Electronic Ballast Application  
Small Variance in Storage Time  
Two Package Choices : TO-220 or D2-PAK  
TO-220  
B
E
1
1.Base 2.Collector 3.Emitter  
NPN Triple Diffused Planar Silicon Transistor  
Absolute Maximum Ratings T =25°C unless otherwise noted  
C
Symbol  
Parameter  
Value  
Units  
V
V
V
V
Collector-Base Voltage  
1000  
CBO  
Collector-Emitter Voltage  
Emitter-Base Voltage  
Collector Current (DC)  
*Collector Current (Pulse)  
Base Current (DC)  
450  
V
CEO  
EBO  
12  
V
I
I
I
I
5
A
C
10  
A
CP  
B
2
A
*Base Current (Pulse)  
4
75  
A
BP  
P
Power Dissipation(T =25°C)  
W
°C  
°C  
C
C
T
T
Junction Temperature  
150  
J
Storage Temperature  
- 55 ~ 150  
STG  
* Pulse Test : Pulse Width = 5ms, Duty Cycle 10%  
Thermal Characteristics T =25°C unless otherwise noted  
C
Symbol  
Characteristics  
Junction to Case  
Junction to Ambient  
Maximun Lead Temperature for Soldering  
Rating  
1.65  
Unit  
R
R
Thermal Resistance  
°C/W  
θjc  
θja  
62.5  
T
270  
°C  
L
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
Electrical Characteristics T =25°C unless otherwise noted  
C
Symbol  
Parameter  
Test Condition  
Min.  
1000  
450  
12  
Typ.  
Max.  
Units  
V
BV  
Collector-Base Breakdown Voltage  
I =1mA, I =0  
CBO  
CEO  
EBO  
C
E
BV  
BV  
Collector-Emitter Breakdown Voltage I =5mA, I =0  
V
C
B
Emitter-Base Breakdown Voltage  
Collector Cut-off Current  
I =1mA, I =0  
V
E
C
I
I
V
=800V, I =0  
10  
100  
500  
100  
500  
10  
µA  
µA  
µA  
µA  
µA  
µA  
CBO  
CB  
E
Collector Cut-off Current  
V
=1000V,  
T =25°C  
C
CES  
CEO  
EBO  
CES  
I
=0  
EB  
T =125°C  
C
I
Collector Cut-off Current  
V
=450V, I =0  
T =25°C  
C
CE  
B
T =125°C  
C
I
Emitter Cut-off Current  
DC Current Gain  
V
V
=10V, I =0  
C
EB  
h
=1V, I =0.8A  
T =25°C  
15  
10  
6
25  
14  
FE  
CE  
C
C
T =125°C  
C
V
V
=1V, I =2A  
T =25°C  
9
CE  
CE  
C
C
T =125°C  
4
6
C
=2.5V, I =1A  
T =25°C  
18  
14  
25  
C
C
T =125°C  
18  
C
V
(sat)  
Collector-Emitter Saturation Voltage  
I =0.8A, I =0.08A T =25°C  
0.35  
0.55  
0.47  
0.9  
0.9  
1.8  
0.22  
0.3  
0.8  
0.65  
0.9  
0.8  
550  
60  
0.5  
0.75  
0.75  
1.1  
V
V
CE  
C
B
C
T =125°C  
C
I =2A, I =0.4A  
T =25°C  
V
C
B
C
T =125°C  
V
C
I =0.8A, I =0.04A T =25°C  
1.5  
V
C
B
C
T =125°C  
2.5  
V
C
I =1A, I =0.2A  
T =25°C  
0.5  
V
C
B
C
T =125°C  
0.6  
V
C
V
(sat)  
Base-Emitter Saturation Voltage  
I
=0.8A,  
T =25°C  
1.0  
V
BE  
CS  
C
I =0.08A  
B
T =125°C  
0.9  
V
C
I =2A, I =0.4A  
T =25°C  
1.0  
V
C
B
C
T =125°C  
0.9  
V
C
C
C
Input Capacitance  
V
=10V, I =0.5A, f=1MHz  
750  
100  
pF  
pF  
MHz  
V
ib  
EB  
C
Output Capacitance  
V
=10V, I =0, f=1MHz  
E
ob  
CB  
f
Current Gain Bandwidth Product  
Diode Forward Voltage  
I =0.5A,V =10V  
11  
T
C
CE  
V
I =1A, I =1mA,  
T =25°C  
0.86  
0.79  
0.95  
0.88  
1.3  
1.5  
F
F
C
C
I =0  
E
T =125°C  
V
C
I =2A  
T =25°C  
V
F
C
T =125°C  
V
C
t
Diode Froward Recvery Time  
(di/dt=10A/µs)  
I =0.4A  
460  
360  
325  
ns  
ns  
ns  
fr  
F
I =1A  
F
I =2A  
F
V
Dynamic Saturation Voltage  
I =1A, I =100mA T =25°C  
8
15  
2.9  
8
V
V
V
V
V
V
V
V
CE(DSAT)  
C
B1  
C
V
=300V at 1 µs  
CC  
T =125°C  
C
I =1A, I =100mA T =25°C  
C
B1  
C
V
=300V at 3 µs  
CC  
T =125°C  
C
I =2A, I =400mA T =25°C  
9
C
B1  
C
V
=300V at 1 µs  
CC  
T =125°C  
17  
1.9  
8.5  
C
I =2A, I =400mA T =25°C  
C
B1  
C
V
=300V at 3 µs  
CC  
T =125°C  
C
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
Electrical Characteristics T =25°C unless otherwise noted  
C
Symbol  
Parameter  
Test Condition  
Min  
Typ.  
Max.  
Units  
RESISTIVE LOAD SWITCHING (D.C < 10%, Pulse Width=40µs)  
t
t
t
t
Turn ON Time  
Storage Time  
Fall Time  
I =2.5A, I =500mA  
500  
750  
1.5  
ns  
µs  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ON  
STG  
F
C
B1  
I
=1A, V =250V, R = 100Ω  
B2  
CC L  
1.2  
100  
100  
150  
1.4  
200  
150  
Turn ON Time  
I =2A,  
T =25°C  
C
ON  
C
I
I
V
=400mA  
B1  
T =125°C  
C
=1A,  
=300V  
B2  
t
t
t
t
t
Storage Time  
Fall Time  
T =25°C  
2.2  
150  
150  
2.1  
STG  
F
C
CC  
T =125°C  
1.7  
C
R = 150Ω  
L
T =25°C  
90  
C
T =125°C  
150  
120  
150  
C
Turn ON Time  
Storage Time  
Fall Time  
I =2.5A,  
T =25°C  
C
ON  
STG  
F
C
I
I
=500mA  
=5mA,  
B1  
T =125°C  
C
B2  
T =25°C  
1.8  
C
V
=300V  
CC  
T =125°C  
2.6  
110  
160  
C
R = 120Ω  
L
T =25°C  
150  
C
T =125°C  
C
INDUCTIVE LOAD SWITCHING (V =15V)  
CC  
t
t
t
t
t
t
t
t
t
Storage Time  
I =2.5A,  
T =25°C  
1.9  
2.4  
2.2  
200  
500  
2.25  
150  
450  
0.8  
µs  
µs  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
STG  
C
C
I
I
=500mA  
=0.5A,  
B1  
T =125°C  
C
B2  
Fall Time  
T =25°C  
160  
330  
350  
750  
F
C
V =350V  
Z
T =125°C  
C
L =300µH  
C
Cross-over Time  
Storage Time  
Fall Time  
T =25°C  
C
C
T =125°C  
C
I =2A,  
T =25°C  
1.95  
STG  
F
C
C
I
I
=400mA  
=0.4A,  
B1  
T =125°C  
2.9  
120  
270  
300  
700  
0.6  
1.0  
70  
C
B2  
T =25°C  
C
V =300V  
Z
T =125°C  
C
L =200µH  
C
Cross-over Time  
Storage Time  
Fall Time  
T =25°C  
C
C
T =125°C  
C
I =1A,  
T =25°C  
C
STG  
F
C
I
I
=100mA  
=0.5A,  
B1  
T =125°C  
C
B2  
T =25°C  
C
V =300V  
Z
T =125°C  
110  
80  
C
L =200µH  
C
Cross-over Time  
T =25°C  
130  
C
C
T =125°C  
170  
C
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
Typical Characteristics  
5
100  
10  
1
IB = 1A  
VCE = 1V  
0.9A  
0.8A  
0.7A  
0.6A  
Tj = +25OC  
4
3
2
1
0
0.5A  
0.4A  
Tj = -25OC  
0.3A  
0.2A  
Tj = 125OC  
IB = 0.1A  
IB = 0  
0
2
4
6
8
10  
0.01  
0.1  
1
10  
VCE[V], COLLECTOR-EMITTER VOLTAGE  
IC[A], COLLECTOR CURRENT  
Figure 1. Static Characteristic  
Figure 2. DC current Gain  
100  
10  
VCE = 5V  
Tj = +25OC  
IC = 5IB  
Tj = 125OC  
Tj = -25OC  
10  
1
Tj = 125OC  
Tj = +25OC  
Tj = -25OC  
1
0.01  
0.1  
1E-3  
0.1  
1
10  
0.01  
0.1  
1
10  
IC[A], COLLECTOR CURRENT  
IC[A], COLLECTOR CURRENT  
Figure 3. DC current Gain  
Figure 4. Collector-Emitter Saturation Voltage  
10  
10  
IC = 5IB  
IC = 10IB  
Tj = 125OC  
1
1
Tj = -25OC  
Tj = +25OC  
Tj = 125OC  
Tj = +25OC  
Tj = -25OC  
0.1  
1E-3  
0.1  
1E-3  
0.01  
0.1  
1
10  
0.01  
0.1  
1
10  
IC[A], COLLECTOR CURRENT  
IC[A], COLLECTOR CURRENT  
Figure 5. Collector-Emitter Saturation Voltage  
Figure 6. Base-Emitter Saturation Voltage  
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
Typical Characteristics (Continued)  
10  
2000  
1000  
IC = 10IB  
f = 1MHz  
Cib  
1
Tj = -25OC  
100  
Tj = 125OC  
Cob  
Tj = +25OC  
0.1  
1E-3  
10  
0.01  
0.1  
1
10  
1
10  
100  
REVERSE VOLTAGE [V]  
IC[A], COLLECTOR CURRENT  
Figure 7. Base-Emitter Saturation Voltage  
Figure 8. Collector Output Capacitance  
10  
500  
VCC = 250V  
di/dt = 10A/µS  
TC = 25OC  
IC = 5IB1 = 2.5IB2  
tSTG  
450  
1
400  
350  
300  
250  
0.1  
tF  
0.01  
1
10  
0.25  
0.50  
0.75  
1.00  
1.25  
1.50  
1.75  
2.00  
0.2  
IF[A], FORWARD CURRENT  
IC[A], COLLECTOR CURRENT  
Figure 9. Forward Recovery Time  
Figure 10. Switching Time  
2000  
1500  
1000  
500  
0
5
4
3
2
IBon = IBoff  
IBon = IBoff  
IC = 2A @ Tj=125O  
C
VCC = 15V  
VZ = 300V  
LC = 200µH  
VCC = 15V  
VZ = 300V  
LC = 200µH  
IC = 2A @ Tj=125O  
C
IC = 1A @ Tj=125O  
C
IC = 1A @ Tj=125O  
IC = 2A @ Tj=25O  
C
C
IC = 2A @ Tj=25O  
C
IC = 1A @ Tj=25O  
C
IC = 1A @ Tj=25O  
C
2
4
6
8
10  
12  
14  
16  
18  
20  
0
5
10  
15  
20  
hFE, FORCED GAIN  
hFE, FORCED GAIN  
Figure 11. Induction Storage Time  
Figure 12. Inductive Crossover Time  
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
Typical Characteristics (Continued)  
1000  
100  
10  
IBon = IBoff  
IC = 2A @ Tj=125O  
C
VCC = 15V  
VZ = 300V  
LC = 200µH  
800  
600  
400  
200  
0
1µS  
10µS  
5mS  
1mS  
IC = 1A @ Tj=125O  
C
1
DC  
IC = 2A @ Tj=25O  
C
0.1  
0.01  
IC = 1A @ Tj=25O  
C
2
4
6
8
10  
12  
14  
16  
18  
20  
10  
100  
1000  
hFE, FORCED GAIN  
VCE[V], COLLECTOR-EMITTER VOLTAGE  
Figure 13. Inductive Fall Time  
Figure 14. Safe Operating Area  
100  
75  
50  
25  
0
6
5
4
3
2
1
0
TC = 25O  
C
LC = 2mH  
-5V  
-1.5V  
0V  
0
25  
50  
75  
100  
125  
150  
175  
200  
300  
400  
500  
600  
700  
800  
900  
1000  
TC[OC], CASE TEMPERATURE  
VCE[V], COLLECTOR-EMITTER VOLTAGE  
Figure 15. Reverse Bias Safe Operating  
Figure 16. Power Derating  
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
Package Demensions  
TO-220  
4.50 ±0.20  
9.90 ±0.20  
(8.70)  
+0.10  
1.30  
–0.05  
ø3.60 ±0.10  
(45  
°
)
1.27 ±0.10  
1.52 ±0.10  
0.80 ±0.10  
+0.10  
–0.05  
0.50  
2.40 ±0.20  
2.54TYP  
2.54TYP  
[2.54 ±0.20  
]
[2.54 ±0.20]  
10.00 ±0.20  
Dimensions in Millimeters  
©2000 Fairchild Semiconductor International  
Rev. A, February 2000  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
ACEx™  
HiSeC™  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
E2CMOS™  
FACT™  
ISOPLANAR™  
MICROWIRE™  
POP™  
PowerTrench®  
QFET™  
VCX™  
FACT Quiet Series™  
QS™  
FAST®  
Quiet Series™  
SuperSOT™-3  
SuperSOT™-6  
FASTr™  
GTO™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY  
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY  
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;  
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR  
INTERNATIONAL.  
As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the body,  
or (b) support or sustain life, or (c) whose failure to perform  
when properly used in accordance with instructions for use  
provided in the labeling, can be reasonably expected to  
result in significant injury to the user.  
2. A critical component is any component of a life support  
device or system whose failure to perform can be  
reasonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or In  
Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
©2000 Fairchild Semiconductor International  
Rev. E  

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