NDS336PD87Z [FAIRCHILD]

Small Signal Field-Effect Transistor, 1.2A I(D), 20V, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, SUPERSOT-3;
NDS336PD87Z
型号: NDS336PD87Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Small Signal Field-Effect Transistor, 1.2A I(D), 20V, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, SUPERSOT-3

文件: 总7页 (文件大小:83K)
中文:  中文翻译
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June 1997  
NDS336P  
P-Channel Logic Level Enhancement Mode Field Effect Transistor  
General Description  
Features  
-1.2 A, -20 V, RDS(ON) = 0.27 W @ VGS= -2.7 V  
SuperSOTTM-3 P-Channel logic level enhancement mode power  
field effect transistors are produced using Fairchild's  
proprietary, high cell density, DMOS technology. This very high  
density process is especially tailored to minimize on-state  
resistance. These devices are particularly suited for low voltage  
applications such as notebook computer power management,  
portable electronics, and other battery powered circuits where  
fast high-side switching, and low in-line power loss are needed  
in a very small outline surface mount package.  
RDS(ON) = 0.2 W @ VGS = -4.5 V.  
Very low level gate drive requirements allowing direct  
operation in 3V circuits. VGS(th) < 1.0V.  
Proprietary package design using copper lead frame for  
superior thermal and electrical capabilities.  
High density cell design for extremely low RDS(ON)  
.
Exceptional on-resistance and maximum DC current  
capability.  
Compact industry standard SOT-23 surface  
package.  
Mount  
________________________________________________________________________________  
D
S
G
Absolute Maximum Ratings TA = 25°C unless otherwise noted  
Symbol Parameter  
NDS336P  
Units  
Drain-Source Voltage  
-20  
±8  
V
V
A
VDSS  
VGSS  
ID  
Gate-Source Voltage - Continuous  
Maximum Drain Current - Continuous  
- Pulsed  
(Note 1a)  
-1.2  
-10  
PD  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
0.5  
W
0.46  
TJ,TSTG  
Operating and Storage Temperature Range  
-55 to 150  
°C  
THERMAL CHARACTERISTICS  
RqJA  
RqJC  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
250  
75  
°C/W  
°C/W  
© 1997 Fairchild Semiconductor Corporation  
NDS336P Rev. E  
Electrical Characteristics (TA = 25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
OFF CHARACTERISTICS  
BVDSS  
IDSS  
Drain-Source Breakdown Voltage  
VGS = 0 V, ID = -250 µA  
VDS = -16 V, VGS = 0 V  
-20  
V
Zero Gate Voltage Drain Current  
-1  
µA  
µA  
nA  
nA  
-10  
TJ =55°C  
IGSS  
IGSS  
Gate - Body Leakage Current  
Gate - Body Leakage Current  
VGS = 8 V, VDS = 0 V  
VGS = -8 V, VDS = 0 V  
100  
-100  
ON CHARACTERISTICS (Note 2)  
VGS(th)  
Gate Threshold Voltage  
VDS = VGS, ID = -250 µA  
VGS = -2.7 V, ID = -1.2 A  
-0.5  
-0.3  
-0.78  
-0.58  
0.22  
0.34  
0.16  
-1  
V
-0.8  
0.27  
0.49  
0.2  
TJ =125°C  
TJ =125°C  
RDS(ON)  
Static Drain-Source On-Resistance  
W
VGS = -4.5 V, ID = -1.3 A  
VGS = -2.7 V, VDS = -5 V  
VDS = -5 V, ID = -1.2 A  
On-State Drain Current  
-2  
A
S
ID(ON)  
gFS  
Forward Transconductance  
-3  
DYNAMIC CHARACTERISTICS  
Input Capacitance  
360  
170  
60  
pF  
pF  
pF  
Ciss  
Coss  
Crss  
VDS = -10 V, VGS = 0 V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
SWITCHING CHARACTERISTICS (Note 2)  
tD(on)  
tr  
tD(off)  
tf  
Turn - On Delay Time  
Turn - On Rise Time  
Turn - Off Delay Time  
Turn - Off Fall Time  
Total Gate Charge  
VDD = -5 V, ID = -1 A,  
8
15  
50  
60  
45  
8.5  
ns  
ns  
VGS = -4.5 V, RGEN = 6 W  
29  
33  
23  
5.7  
0.7  
1.8  
ns  
ns  
Qg  
Qgs  
Qgd  
VDS = -10 V, ID = -1.2 A,  
VGS = -4.5 V  
nC  
nC  
nC  
Gate-Source Charge  
Gate-Drain Charge  
NDS336P Rev. E  
Electrical Characteristics (TA = 25°C unless otherwise noted)  
Symbol Parameter Conditions  
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS  
Min  
Typ  
Max  
Units  
IS  
Maximum Continuous Source Current  
-0.42  
-10  
A
A
V
Maximum Pulsed Drain-Source Diode Forward Current  
ISM  
VSD  
Drain-Source Diode Forward Voltage  
VGS = 0 V, IS = -0.42 (Note 2)  
-0.65  
-1.2  
Notes:  
1. RqJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solde mounting surface of the drain pins. RqJC is guaranteed by  
design while RqCA is determined by the user's board design.  
T
R
- T  
T
- T  
J
J
A
A
( )  
PD t =  
2 ( )  
= ID t ´ RDS ON @T  
( )  
t
=
(
)
J
( )  
t
R
+R  
q
CA  
q
q
JA  
JC  
Typical RqJA using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:  
a. 250oC/W when mounted on a 0.02 in2 pad of 2oz copper.  
b. 270oC/W when mounted on a 0.001 in2 pad of 2oz copper.  
1a  
1b  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.  
NDS336P Rev. E  
Typical Electrical Characteristics  
2
1.8  
1.6  
1.4  
1.2  
1
-10  
V
= -4.5V  
-4.0  
GS  
-3.5  
V
=-2.0V  
GS  
-8  
-6  
-4  
-2  
0
-3.0  
-2.5  
-2.7  
-2.7  
-2.5  
-3.0  
-3.5  
-2.0  
-4.0  
-4.5  
0.8  
0.6  
0
-2  
-4  
-6  
-8  
-10  
0
-1  
-2  
-3  
-4  
-5  
I
, DRAIN CURRENT (A)  
V
, DRAIN-SOURCE VOLTAGE (V)  
D
DS  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation  
with Drain Current and Gate Voltage.  
1.6  
1.4  
1.2  
1
2
VGS = -2.7V  
I
V
= -1.2A  
= -2.7V  
D
1.8  
GS  
1.6  
1.4  
1.2  
1
T = 125°C  
J
25°C  
-55°C  
0.8  
0.6  
0.8  
0.6  
-50  
-25  
0
T
25  
50  
75  
100  
125  
150  
0
-2  
-4  
-6  
-8  
-10  
, JUNCTION TEMPERATURE (°C)  
I
, DRAIN CURRENT (A)  
J
D
Figure 4. On-Resistance Variation  
with Drain Current and Temperature.  
Figure 3. On-Resistance Variation  
with Temperature.  
-5  
-4  
-3  
-2  
-1  
0
1.2  
1.1  
1
VDS = -5V  
T = -55°C  
V
= V  
GS  
= -250µA  
J
DS  
-25°C  
-125°C  
I
D
0.9  
0.8  
0.7  
0.6  
-0.5  
-1  
-1.5  
-2  
-2.5  
-3  
-50  
-25  
0
T
25  
50  
75  
100  
125  
150  
V
, GATE TO SOURCE VOLTAGE (V)  
, JUNCTION TEMPERATURE (°C)  
GS  
J
Figure 6. Gate Threshold Variation  
with Temperature.  
Figure 5. Transfer Characteristics.  
NDS336P Rev. D  
Typical Electrical Characteristics (continued)  
5
1
1.06  
VGS = 0V  
I
= - 250µA  
D
1.04  
1.02  
1
T
= 125°C  
J
0.1  
0.01  
25°C  
-55°C  
0.001  
0.98  
0.96  
0.0001  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0.2  
0.4  
-V  
0.6  
0.8  
1
1.2  
T
, JUNCTION TEMPERATURE (°C)  
, BODY DIODE FORWARD VOLTAGE (V)  
J
SD  
Figure 8. Body Diode Forward Voltage Variation  
with Source Current and  
Figure 7. Breakdown Voltage Variation with  
Temperature.  
Temperature.  
800  
5
VDS = -5V  
ID = -1.2A  
-10V  
500  
4
C
iss  
-15V  
300  
200  
3
2
1
0
C
oss  
100  
f = 1 MHz  
VGS = 0V  
C
rss  
60  
40  
0
2
4
6
8
0.1  
0.2  
0.5  
1
2
5
10  
20  
Q
, GATE CHARGE (nC)  
-V , DRAIN TO SOURCE VOLTAGE (V)  
g
DS  
Figure 10. Gate Charge Characteristics.  
Figure 9. Capacitance Characteristics.  
VDD  
ton  
toff  
td(off)  
t d(on)  
tr  
tf  
RL  
VIN  
90%  
90%  
D
VOUT  
V
OUT  
VGS  
10%  
10%  
90%  
RGEN  
DUT  
G
V
50%  
50%  
IN  
S
10%  
INVERTED  
PULSE WIDTH  
Figure 12. Switching Waveforms.  
Figure 11. Switching Test Circuit.  
NDS336P Rev. D  
Typical Electrical Characteristics (continued)  
20  
10  
5
8
VDS= -5V  
TJ = -55°C  
-25°C  
6
4
2
0
2
1
0.5  
-125°C  
VGS = -2.7V  
SINGLE PULSE  
RqJA= See Note 1b  
TA = 25°C  
0.1  
0.05  
0.01  
0.1  
0.2  
0.5  
1
2
5
10  
20 30  
0
-2  
-4  
-6  
-8  
-10  
-V , DRAIN-SOURCE VOLTAGE (V)  
I
, DRAIN CURRENT (A)  
DS  
D
Figure 14. Maximum Safe Operating Area.  
Figure 13. Transconductance Variation with  
Drain Current and Temperature.  
1
1.6  
0.8  
0.6  
0.4  
0.2  
0
1.4  
1.2  
1
1a  
1b  
1a  
1b  
4.5"x5" FR-4 Board  
TA = 25 o  
Still Air  
C
4.5"x5" FR-4 Board  
TA = 25o  
Still Air  
C
VGS = -2.7V  
0.8  
0
0.1  
0.2  
0.3  
2
0.4  
0
0.1  
0.2  
0.3  
2
0.4  
2oz COPPER MOUNTING PAD AREA (in  
)
2oz COPPER MOUNTING PAD AREA (in  
)
Figure 16. Maximum Steady-State Drain  
Current versus Copper Mounting Pad Area.  
Figure 15. SuperSOTTM _ 3 Maximum  
Steady-State Power Dissipation versus  
Copper Mounting Pad Area.  
1
D = 0.5  
0.5  
R
R
(t) = r(t) * R  
JA  
q
JA  
q
0.2  
0.1  
0.2  
0.1  
=
See Note 1b  
qJA  
0.05  
0.05  
P(pk)  
0.02  
0.01  
0.02  
0.01  
t
1
t
2
Single Pulse  
T - T = P * R  
(t)  
JA  
q
J
A
0.005  
Duty Cycle, D = t /t  
1
2
0.002  
0.001  
0.0001  
0.001  
0.01  
0.1  
t , TIME (sec)  
1
10  
100  
300  
1
Figure 17. Transient Thermal Response Curve.  
Note : Characterization performed using the conditions described in note 1b. Transient thermal response will  
change depending on the circuit board design.  
NDS336P Rev. D  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
â
SMART START™  
STAR*POWER™  
Stealth™  
VCX™  
FAST  
ACEx™  
Bottomless™  
CoolFET™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
FASTr™  
FRFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
CROSSVOLT™  
DenseTrench™  
DOME™  
POP™  
Power247™  
PowerTrenchâ  
QFET™  
EcoSPARK™  
E2CMOSTM  
TinyLogic™  
QS™  
EnSignaTM  
TruTranslation™  
UHC™  
QT Optoelectronics™  
Quiet Series™  
SILENTSWITCHERâ  
FACT™  
FACT Quiet Series™  
UltraFETâ  
STAR*POWER is used under license  
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOT ASSUME ANY LIABILITYARISING OUT OF THE APPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICESORSYSTEMSWITHOUTTHEEXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H4  

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