QED123UL [FAIRCHILD]
PLASTIC INFRARED LIGHT EMITTING DIODE; 塑料红外发光二极管
| 型号： | QED123UL |
| 厂家： | 
FAIRCHILD SEMICONDUCTOR |
| 描述： | PLASTIC INFRARED LIGHT EMITTING DIODE |
| 文件： | 总4页 (文件大小：493K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
PACKAGE DIMENSIONS
0.195 (4.95)
REFERENCE
SURFACE
0.305 (7.75)
0.040 (1.02)
NOM
0.800 (20.3)
MIN
0.050 (1.25)
CATHODE
0.100 (2.54)
NOM
SCHEMATIC
0.240 (6.10)
0.215 (5.45)
0.020 (0.51)
SQ. (2X)
ANODE
NOTES:
CATHODE
1. Dimensions for all drawings are in inches (mm).
2. Tolerance of .010 (.25) on all non-nominal dimensions
unless otherwise specified.
FEATURES
•
•
•
•
•
•
•
•
UL217 Approved
λ = 880 nm
Chip material = AlGaAs
Package type: T-1 3/4 (5mm lens diameter)
Matched Photosensor: QSB34
Narrow Emission Angle, 18°
High Output Power
Package material and color: Clear, peach
© 2004 Fairchild Semiconductor Corporation
Page 1 of 4
4/2/04
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
ABSOLUTE MAXIMUM RATINGS (T = 25°C unless otherwise specified)
A
Parameter
Symbol
Rating
Unit
Operating Temperature
Storage Temperature
T
-40 to + 100
-40 to + 100
240 for 5 sec
260 for 10 sec
100
°C
°C
OPR
T
STG
(2,3,4)
(2,3)
Soldering Temperature (Iron)
T
°C
SOL-I
Soldering Temperature (Flow)
Continuous Forward Current
Reverse Voltage
T
°C
SOL-F
I
mA
V
F
V
P
5
R
D
(1)
Power Dissipation
200
mW
NOTES:
1. Derate power dissipation linearly 2.67 mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
4. Soldering iron 1/16" (1.6 mm) minimum from housing
.
ELECTRICAL / OPTICAL CHARACTERISTICS (T =25°C)
A
Parameter
Test Conditions
Symbol
Min
Typ
Max
Units
Peak Emission Wavelength
Emission Angle
I = 20 mA
λ
—
—
—
—
16
—
—
880
18
—
—
nm
Deg.
V
F
PE
1
I = 100 mA
2Θ /
F
2
Forward Voltage
Reverse Current
Radiant Intensity QED121
Rise Time
I = 100 mA, tp = 20 ms
V
—
1.7
10
40
—
F
F
V = 5 V
I
—
µA
R
R
I = 100 mA, tp = 20 ms
I
—
mW/sr
ns
F
E
t
800
800
r
I = 100 mA
F
Fall Time
t
—
ns
f
© 2004 Fairchild Semiconductor Corporation
Page 2 of 4
4/2/04
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
Typical Performance Characteristics
10
1
Normalized to:
Normalized to:
Pulse Width = 100 µs
Duty Cycle = 0.1%
I = 100 mA, T = 25˚C
Pulse Width = 100 µs
F
A
I
= 100 mA
F
0.8
0.6
0.4
0.2
0
1
0.1
V
= 5 V
= 100Ω
= 25˚C
CC
R
L
T
A
I
= 20 mA
F
0.01
0.001
1
10
100
1000
0
1
2
3
4
5
6
I
- INPUT CURRENT (mA)
LENS TIP SEPERATION (INCHES)
Fig. 2 Coupling Characteristics of QED12X and QSD12X
F
Fig. 1 Normalized Radiant Intensity vs. Input Current
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
2.5
2
I
= 100 mA
F
I
= 50 mA
F
1.5
1
I
= 10 mA
I
= 20 mA
F
F
0.5
0
Pulse Width = 100 µs
Duty Cycle = 0.1%
775
800
825
850
875
900
925
950
-40 -30 -20 -10
0
10
20
30
40
50
60
70
80
90 100
T
- TEMPERATURE (˚C)
A
λ (nm)
Fig. 4 Normalized Radiant Intensity vs. Wavelength
Fig. 3 Forward Voltage vs.Temperature
Fig. 5 Radiation Pattern
0˚
10
-10
20
-20
30
-30
40
-40
50
60
-50
-60
-70
70
80
-80
90
-90
100
80
60
40
20
0
20
40
60
80
100
© 2004 Fairchild Semiconductor Corporation
Page 3 of 4
4/2/04
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
© 2004 Fairchild Semiconductor Corporation
Page 4 of 4
4/2/04
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